IT1244053B - Dispositivo di memoria a semiconduttore altamente integrato e suo metodo di fabbricazione. - Google Patents

Dispositivo di memoria a semiconduttore altamente integrato e suo metodo di fabbricazione.

Info

Publication number
IT1244053B
IT1244053B IT02185390A IT2185390A IT1244053B IT 1244053 B IT1244053 B IT 1244053B IT 02185390 A IT02185390 A IT 02185390A IT 2185390 A IT2185390 A IT 2185390A IT 1244053 B IT1244053 B IT 1244053B
Authority
IT
Italy
Prior art keywords
manufacturing
memory device
semiconductor memory
highly integrated
integrated semiconductor
Prior art date
Application number
IT02185390A
Other languages
English (en)
Other versions
IT9021853A1 (it
IT9021853A0 (it
Inventor
Kyung-Hun Kim
Seong-Tae Kim
Jae-Hong Ko
Su-Han Choi
Original Assignee
Samsung Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Samsung Electronics Co Ltd filed Critical Samsung Electronics Co Ltd
Publication of IT9021853A0 publication Critical patent/IT9021853A0/it
Publication of IT9021853A1 publication Critical patent/IT9021853A1/it
Application granted granted Critical
Publication of IT1244053B publication Critical patent/IT1244053B/it

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/30DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
    • H10B12/31DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor
    • H10B12/318DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells having a storage electrode stacked over the transistor the storage electrode having multiple segments
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof  ; Multistep manufacturing processes therefor
    • H01L29/66Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76Unipolar devices, e.g. field effect transistors
    • H01L29/772Field effect transistors
    • H01L29/78Field effect transistors with field effect produced by an insulated gate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B12/00Dynamic random access memory [DRAM] devices
    • H10B12/30DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
    • H10B12/37DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells the capacitor being at least partially in a trench in the substrate
    • H10B12/377DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells the capacitor being at least partially in a trench in the substrate having a storage electrode extension located over the transistor
IT02185390A 1990-08-14 1990-10-24 Dispositivo di memoria a semiconduttore altamente integrato e suo metodo di fabbricazione. IT1244053B (it)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1019900012555A KR930007194B1 (ko) 1990-08-14 1990-08-14 반도체 장치 및 그 제조방법

Publications (3)

Publication Number Publication Date
IT9021853A0 IT9021853A0 (it) 1990-10-24
IT9021853A1 IT9021853A1 (it) 1992-04-24
IT1244053B true IT1244053B (it) 1994-07-05

Family

ID=19302368

Family Applications (1)

Application Number Title Priority Date Filing Date
IT02185390A IT1244053B (it) 1990-08-14 1990-10-24 Dispositivo di memoria a semiconduttore altamente integrato e suo metodo di fabbricazione.

Country Status (11)

Country Link
US (1) US5124765A (it)
JP (1) JPH0727978B2 (it)
KR (1) KR930007194B1 (it)
CN (1) CN1030631C (it)
DE (1) DE4034995C2 (it)
FR (1) FR2665982B1 (it)
GB (1) GB2247105B (it)
HK (1) HK189895A (it)
IT (1) IT1244053B (it)
NL (1) NL9002376A (it)
RU (1) RU2127928C1 (it)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE4122038C2 (de) * 1990-07-03 1994-08-25 Mitsubishi Electric Corp Herstellungsverfahren für einen DRAM
ATE137048T1 (de) * 1992-08-10 1996-05-15 Siemens Ag Dram-zellenanordnung
US5739576A (en) * 1995-10-06 1998-04-14 Micron Technology, Inc. Integrated chip multilayer decoupling capacitors
US6150211A (en) 1996-12-11 2000-11-21 Micron Technology, Inc. Methods of forming storage capacitors in integrated circuitry memory cells and integrated circuitry
US6020609A (en) * 1997-10-31 2000-02-01 Texas Instruments - Acer Incorporated DRAM cell with a rugged stacked trench (RST) capacitor
US5942777A (en) * 1998-05-05 1999-08-24 Sun Microsystems, Inc. Memory device including a memory array having a combination of trench capacitor DRAM cells and stacked capacitor DRAM cells
JP4005805B2 (ja) * 2001-12-17 2007-11-14 株式会社東芝 半導体装置
KR20040009383A (ko) * 2002-07-23 2004-01-31 삼성전자주식회사 스택형 커패시터 및 트랜치형 커패시터를 포함하는 반도체메모리 소자 및 그 제조 방법
CN1324671C (zh) * 2002-09-06 2007-07-04 旺宏电子股份有限公司 波浪状电容器及其制造方法
DE102004043857B3 (de) * 2004-09-10 2006-03-30 Infineon Technologies Ag DRAM-Zellenpaar und DRAM-Speicherzellenfeld mit Stack- und Trench-Speicherzellen sowie Verfahren zur Herstellung eines DRAM-Speicherzellenfeldes
KR101128982B1 (ko) * 2008-03-21 2012-03-23 주식회사 하이닉스반도체 레저바 캐패시터 및 그를 갖는 반도체 메모리 장치
JP3197990U (ja) * 2015-03-31 2015-06-11 セイコーエプソン株式会社 電気光学装置、及び電子機器
US11387242B2 (en) 2020-03-03 2022-07-12 Taiwan Semiconductor Manufacturing Company, Ltd. Non-volatile memory (NVM) cell structure to increase reliability
US11152383B2 (en) * 2020-03-03 2021-10-19 Taiwan Semiconductor Manufacturing Company, Ltd. Non-volatile memory (NVM) cell structure to increase reliability

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61177771A (ja) * 1985-02-04 1986-08-09 Mitsubishi Electric Corp 半導体装置の製造方法
JPH0795566B2 (ja) * 1985-12-12 1995-10-11 松下電子工業株式会社 半導体メモリ装置
JPH0815207B2 (ja) * 1986-02-04 1996-02-14 富士通株式会社 半導体記憶装置
JPS63146461A (ja) * 1986-12-10 1988-06-18 Mitsubishi Electric Corp 半導体記憶装置
JPS63239969A (ja) * 1987-03-27 1988-10-05 Sony Corp メモリ装置
DE3856143T2 (de) * 1987-06-17 1998-10-29 Fujitsu Ltd Verfahren zum Herstellen einer dynamischen Speicherzelle mit wahlfreiem Zugriff
KR900019227A (ko) * 1988-05-18 1990-12-24 아오이 죠이치 적층형 캐피시터를 갖춘 반도체기억장치 및 그 제조방법
JP2674085B2 (ja) * 1988-05-18 1997-11-05 富士通株式会社 ダイナミック型半導体記憶装置及びその製造方法
JPH0276258A (ja) * 1988-09-13 1990-03-15 Fujitsu Ltd 半導体記憶装置
JPH0294471A (ja) * 1988-09-30 1990-04-05 Toshiba Corp 半導体記憶装置およびその製造方法
JPH02106958A (ja) * 1988-10-17 1990-04-19 Hitachi Ltd 半導体装置
EP0370407A1 (en) * 1988-11-18 1990-05-30 Nec Corporation Semiconductor memory device of one transistor - one capacitor memory cell type
KR920010695B1 (ko) * 1989-05-19 1992-12-12 삼성전자 주식회사 디램셀 및 그 제조방법
KR910013554A (ko) * 1989-12-08 1991-08-08 김광호 반도체 장치 및 그 제조방법
KR950000500B1 (ko) * 1989-08-31 1995-01-24 금성일렉트론 주식회사 디램셀 커패시터 제조방법 및 구조

Also Published As

Publication number Publication date
NL9002376A (nl) 1992-03-02
GB2247105A (en) 1992-02-19
CN1030631C (zh) 1996-01-03
GB2247105B (en) 1995-04-05
FR2665982A1 (fr) 1992-02-21
RU2127928C1 (ru) 1999-03-20
FR2665982B1 (fr) 1992-10-30
JPH0727978B2 (ja) 1995-03-29
GB9023987D0 (en) 1990-12-19
JPH0496272A (ja) 1992-03-27
DE4034995A1 (de) 1992-02-20
CN1059050A (zh) 1992-02-26
HK189895A (en) 1995-12-29
IT9021853A1 (it) 1992-04-24
IT9021853A0 (it) 1990-10-24
DE4034995C2 (de) 1995-11-23
US5124765A (en) 1992-06-23
KR930007194B1 (ko) 1993-07-31
KR920005349A (ko) 1992-03-28

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Legal Events

Date Code Title Description
0001 Granted
TA Fee payment date (situation as of event date), data collected since 19931001

Effective date: 19971029