EP0930641B1 - Procédé de formation de motifs et appareil de fabrication de substrats - Google Patents

Procédé de formation de motifs et appareil de fabrication de substrats Download PDF

Info

Publication number
EP0930641B1
EP0930641B1 EP99100893A EP99100893A EP0930641B1 EP 0930641 B1 EP0930641 B1 EP 0930641B1 EP 99100893 A EP99100893 A EP 99100893A EP 99100893 A EP99100893 A EP 99100893A EP 0930641 B1 EP0930641 B1 EP 0930641B1
Authority
EP
European Patent Office
Prior art keywords
fluid
ink
substrate
pattern
print head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
EP99100893A
Other languages
German (de)
English (en)
Other versions
EP0930641A2 (fr
EP0930641A3 (fr
Inventor
Hiroshi c/o SEIKO EPSON CORPORATION Kiguchi
Hitoshi c/o SEIKO EPSON CORPORATION Fukushima
Satoshi c/o SEIKO EPSON CORPORATION Nebashi
Tatsuya c/o SEIKO EPSON CORPORATION Shimoda
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Epson Corp
Original Assignee
Seiko Epson Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Epson Corp filed Critical Seiko Epson Corp
Publication of EP0930641A2 publication Critical patent/EP0930641A2/fr
Publication of EP0930641A3 publication Critical patent/EP0930641A3/fr
Application granted granted Critical
Publication of EP0930641B1 publication Critical patent/EP0930641B1/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/6715Apparatus for applying a liquid, a resin, an ink or the like
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/28Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
    • H01L21/283Deposition of conductive or insulating materials for electrodes conducting electric current
    • H01L21/288Deposition of conductive or insulating materials for electrodes conducting electric current from a liquid, e.g. electrolytic deposition
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • H01L21/76838Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the conductors
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/10Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
    • H05K3/12Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns
    • H05K3/1241Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns by ink-jet printing or drawing by dispensing
    • H05K3/125Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using thick film techniques, e.g. printing techniques to apply the conductive material or similar techniques for applying conductive paste or ink patterns by ink-jet printing or drawing by dispensing by ink-jet printing
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/10Deposition of organic active material
    • H10K71/12Deposition of organic active material using liquid deposition, e.g. spin coating
    • H10K71/13Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing
    • H10K71/135Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing using ink-jet printing
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • H01L27/1259Multistep manufacturing methods
    • H01L27/1292Multistep manufacturing methods using liquid deposition, e.g. printing

Definitions

  • the present invention relates to a commercial use of an ink-jet print head, and more particularly to a manufacturing technique for forming arbitrary patterns with the aid of an ink-jet system.
  • Substrates used in semiconductor processes or the like are formed from silicon and the like. Lithographic techniques and the like have been used in the past for manufacturing integrated circuits and the like from such silicon substrates.
  • a characteristic feature of the lithographic techniques is that a photosensitive material called resist is applied thinly to a silicon wafer, and an integrated circuit pattern produced by photolithography on a dry glass plate is transferred by being printed with the aid of light. Ions or the like are implanted into the transferred resist pattern, gradually forming wiring patterns or elements.
  • fine patterns can only be produced at well-equipped semiconductor plants or the like. It is natural to expect, therefore, that the formation of fine patterns must involve complicated process control and high costs.
  • An ink-jet system uses an ink-jet print head for ink ejection.
  • Such heads are configured in a way that allows the ink to be ejected from nozzles, and printing is performed by discharging the ink from the nozzles onto paper.
  • ink-jet systems have primarily been used in printers for printing purposes.
  • An ink-jet print head can eject any fluid as long as this fluid has low viscosity.
  • such an ink-jet print head has fine resolution (for example, 400 bpi). It is therefore believed that any pattern with a width on the order of micrometers could be formed if it were possible to eject commercially applicable fluids from the individual nozzles of an ink-jet print head.
  • An ink-jet system does not require equipment such as plants.
  • the document JP 06 286162 A discloses an ink-jet recording method in which at least four inks composed of three color inks of cyan, magenta and yellow colors and a colorless ink containing a penetrant are used to record a color image, wherein the recording is conducted so as to overlap the penetrant-containing colorless ink and the color inks each other in a region along boundary lines to be defined by differences in hue of an image to be formed with the color inks, and to form an image with the color inks alone in other regions than the above region.
  • the document EP 0 671 268 A discloses a pattern formation method for discharging a prescribed fluid onto a substrate from an ink-jet print head and forming an arbitrary pattern.
  • the method comprises the steps of: forming a pattern-forming region on the substrate by subjecting said substrate to a surface-modification treatment for modifying the pattern-forming region into an absorption layer for absorbing the fluid; and discharging the fluid onto said treated substrate from said ink-jet print head for forming said arbitrary pattern in said pattern-forming region, wherein the droplets of the fluid are partially absorbed by the absorption layer thereby forming the pattern in the region where the absorption layer has been formed.
  • the inventors of the present application devised a technique whereby a pattern is subjected to the necessary treatments before and after ejection from an ink-jet print head, or the moment the ink is ejected during the formation of patterns with the aid of an ink-jet system.
  • An object of the present invention is to provide a method that allows patterns to be formed by enabling treatments to be performed before a fluid is ejected onto a substrate.
  • fluid refers to a medium that can be used not only for inks but also for other commercial applications, and that has a viscosity level that allows the fluid to be ejected from a nozzle. It is sufficient for the fluid to have a fluidity (viscosity) level that allows it to be ejected from a nozzle or the like; the fluid may be devoid of additives or may contain admixed solid matter.
  • the ink-jet print head may belong to a system in which the fluid is ejected by the volume variations of a piezoelectric element, to a system in which the fluid is ejected as a result of the fact that vapors are rapidly formed by the application of heat, or to a system in which the fluid is ejected by electrostatic forces.
  • the term "specific treatment” may refer to a chemical treatment, physical treatment, or physical-chemical treatment. These definitions are used in a similar manner below.
  • the substrate is subjected to a treatment in which the area of the substrate around the pattern-forming region is surface-modified to eliminate any affinity for the fluid.
  • no affinity refers to the property of having a comparatively large contact angle in relation to the fluid.
  • Fig. 1 is a schematic block diagram of the common components of the substrate manufacturing apparatus used in the example and the embodiment that follow.
  • the substrate manufacturing apparatus 100 itself comprises an ink-jet print head 2, a treatment apparatus 3, a drive mechanism 4, and a control circuit 5.
  • the configuration of the treatment apparatus 3 and the treatment specifics are different in each case, but the rest of the structure is substantially the same in all the cases.
  • An ink tank 26 filled with a fluid 10 is connected to the ink-jet print head 2 with a pipe 27 to allow the fluid 10 to be fed in.
  • Any hydrophilic or hydrohobic fluid can be used as the fluid 10 as long as it has the fluidity that allows it to be ejected from the ink-jet print head.
  • the entire composition may be other than fluid. It is possible, for example, to use a composition obtained by adding an electroconductive metal in the form of fine particles to a solvent.
  • Fig. 7 is an exploded perspective view of the ink-jet print head 2. It is sufficient for the ink-jet print head 2 to be configured as a common ink-jet print head capable of discharging any fluid.
  • the ink-jet print head 2 in Fig. 7 is obtained by fitting into a casing 25 a nozzle plate 21 equipped with nozzles 211, and a pressure chamber substrate 22 equipped with a diaphragm 23.
  • the pressure chamber substrate 22 may, for example, be formed by silicon etching and provided with cavities (pressure chambers) 221, side walls 222, a reservoir 223, and the like.
  • Fig. 8 is a perspective view/partial cross-sectional view of the structure of the main portion of the ink-jet print head 2 obtained by stacking the nozzle plate 21, pressure chamber substrate 22, and diaphragm 23.
  • the main portion of the ink-jet print head 2 is configured such that the pressure chamber substrate 22 is sandwiched between the nozzle plate 21 and the diaphragm 23.
  • the nozzles 211 in the nozzle plate 21 are formed such that their positions correspond to the cavities 221 when the plate is placed on top of the pressure chamber substrate 22.
  • the pressure chamber substrate 22 is provided with a plurality of cavities 221 capable of functioning as individual pressure chambers.
  • the cavities 221 are separated by side walls 222.
  • Each cavity 221 is connected by a supply port 224 to a reservoir 223, which is a common conduit.
  • the diaphragm 23 may, for example, be composed of a thermally oxidized film or the like.
  • Piezoelectric elements 24 are formed at positions corresponding to the cavities 221 on the diaphragm 23.
  • the diaphragm 23 is also provided with an ink tank port 231 to allow any fluid 10 to be fed from the tank 26.
  • the piezoelectric elements 24 may, for example, be configured such that PZT elements or the like are sandwiched between an upper electrode and a lower electrode (not shown).
  • the piezoelectric elements 24 are configured such that volume variations can occur in accordance with the control signals Sh fed from the control circuit 5.
  • ink-jet print head was configured such that piezoelectric elements were caused to change their volume, and a fluid was ejected, it is also possible to use a head structure in which heat is applied to the fluid by a heater, and droplets are ejected by the resulting expansion.
  • the treatment apparatus 3 is configured to allow a prescribed treatment to be performed on a substrate 1.
  • the treatment apparatus 3 performs the treatment in accordance with control signals Sp from the control circuit 5.
  • the functions and structure of the treatment apparatus 3 will become apparent from the example and the embodiment that follow.
  • the drive mechanism 4 which comprises a motor M1, a motor M2, and a mechanism structure (not shown), is configured to allow both the ink-jet print head 2 and the treatment apparatus 3 to be conveyed in the direction of the X-axis (transverse direction in Fig. 1 ) and in the direction of the Y-axis (depth direction in Fig. 1 ).
  • Motor M1 is configured to allow the ink-jet print head 2 and the treatment apparatus 3 to be conveyed in the direction of the X-axis in accordance with drive signals Sx.
  • Motor M2 is configured to allow the ink-jet print head 2 and the treatment apparatus 3 to be conveyed in the direction of the Y-axis in accordance with drive signals Sy.
  • the drive mechanism 4 is provided with a structure that allows the positions of the ink-jet print head 2 and treatment apparatus 3 to be varied relative to the substrate 1. It is therefore possible, in addition to the above-described structure, to use an arrangement in which the substrate 1 is moved in relation to the ink-jet print head 2 or the treatment apparatus 3, or an arrangement in which both the substrate 1 and the ink-jet print head 2 (and the treatment apparatus 3) are moved. Furthermore, certain types of treatment do not require that the treatment apparatus 3 be conveyed together with the ink-jet print head 2, and allow the treatment apparatus 3 to be conveyed or to remain stationary.
  • FIG. 9 This drawing is a cross section along line A-A in Fig. 9 .
  • the fluid 10 is fed from the tank 26 into the reservoir 223 through the ink tank port 231 provided to the diaphragm 23.
  • the fluid 10 flows from this reservoir 223 into each cavity 221 through the supply port 224.
  • the volume of the piezoelectric element 24 varies when voltage is applied between the upper and lower electrodes thereof. This volume change deforms the diaphragm 23 and varies the volume of the cavity 221.
  • the diaphragm 23 remains undeformed in as long as no control signal Sh is provided or voltage applied.
  • a control signal Sh is provided and voltage applied, the diaphragm 23b or the post-deformation piezoelectric element 24b is deformed, reaching the position shown by the broken line in the figure.
  • the internal volume of the cavity 21 changes, the pressure of the fluid 10 in the cavity 21 rises.
  • the fluid 10 is fed to the nozzle 211, and a droplet 11 is ejected.
  • Fig. 2 is a concept diagram of a first arrangement for treating the substrate before the fluid is ejected from the ink-jet print head.
  • the ink-jet print head 2 and the treatment apparatus 3 are conveyed in a relative fashion in the conveyance direction designated by an arrow.
  • the treatment apparatus 3 is disposed in front of the ink-jet print head 2 in the direction of advance.
  • a prescribed treatment 7 is performed on the substrate 1 before droplets 11 of the fluid are ejected from the ink-jet print head 2 onto the substrate 1. Treatment specifics will be described below.
  • Fig. 3 is a concept diagram of a second arrangement for treating the fluid or the substrate after the fluid has been ejected from the ink-jet print head.
  • the ink-jet print head 2 and the treatment apparatus 3 are conveyed in a relative fashion in the conveyance direction designated by an arrow.
  • the treatment apparatus 3 is disposed behind the ink-jet print head 2 in the direction of advance.
  • a prescribed treatment 7 is performed on the substrate 1 after droplets 11 of the fluid have been ejected from the ink-jet print head 2 onto the substrate 1. Treatment specifics will be described below.
  • Fig. 4 is a concept diagram of a third arrangement for directly treating droplets of the fluid ejected from the ink-jet print head.
  • the treatment apparatus 3 is disposed to allow direct treatment of the droplets 11 ejected from the ink-jet print head 2.
  • a prescribed treatment 7 is performed on the droplets 11 of the fluid ejected from the ink-jet print head 2 before these droplets reach the substrate 1. Treatment specifics will be described below.
  • This example relates to a treatment for improving the affinity of the substrate as a physical-chemical action, and is primarily used in the first arrangement described above.
  • Fig. 5 is a plan view illustrating the treatment concept of this example.
  • the treatment apparatus 303 of the example is configured such that the pattern-forming region of the substrate 1 can be surface-modified to achieve affinity for the fluid 10 before this fluid has been ejected onto the substrate.
  • the following methods can be used as surface modification treatments aimed at achieving affinity when the fluid contains polar molecules (moisture and the like): methods for applying silane coupling agents; methods for forming aluminum oxide, silica, and other porous films; and methods for performing reverse sputtering in argon or the like; as well as corona ejection treatments, plasma treatments, ultraviolet irradiation treatments, ozone treatments, degreasing treatments, and various other known methods. Methods for applying paraffin or the like, gas plasma treatments, coupling treatments, and the like may be used when the fluid is devoid of polar molecules.
  • the treatment apparatus 303 is configured such that it is possible to apply organosilicon compounds (silane coupling agents) having alkoxy groups, halogens, and other hydrolyzable substituent groups readily reactive toward inorganic substances, as well as vinyl groups, epoxy groups, and amino groups readily reactive toward organic substances. Ejection of materials from ink-jet print heads, and direct application with application mechanisms resembling ball-point pens can be suggested as an application method.
  • the treatment apparatus 303 is configured to allow application of porous materials such as Al2O3 and silica. The application methods are the same as described above.
  • a sputtering apparatus is used as the treatment apparatus 303 for a method involving reverse sputtering.
  • a cathode an electrode in which the substrate serves as the anode, a mechanism for adjusting the argon atmosphere, a power source, and the like are provided.
  • the substrate surface is activated, replacement with hydrophilic substituent groups is achieved, and the substrate surface is modified.
  • a corona discharge a high-voltage discharge electrode is provided as the treatment apparatus 303, and a structure is set up such that ground voltage can be applied to the substrate 1.
  • Some of the organic molecules of the substrate are replaced with hydrophilic groups, and the substrate surface is modified by the local application of high voltage to the surface.
  • the treatment apparatus 303 is configured such that it is possible to eject a plasma generated by a gas discharge.
  • An ultraviolet irradiation lamp is provided as the treatment apparatus 303 when ultraviolet light is to be used for irradiation.
  • the treatment apparatus 303 is configured such that a prescribed voltage can be applied in an atmosphere of circulating ozone, and the activated ozone can be released onto the substrate.
  • the treatment apparatus 303 is configured to allow permanganic acid, chromic acid, sulfuric acid, nitric acid, or another strong alkali to be fed to the substrate.
  • paraffin or the like is to be applied, an application mechanism resembling an ball-point pen is used for the treatment apparatus 303, and dissolved paraffin or the like is applied to a region centered on the two sides of the pattern-forming region.
  • the presence of the above-described treatment apparatus 303 causes the silane coupling agent, which has been applied to a pattern-forming region 703, to bond with the substrate material, whereas groups readily wettable by water are exposed on the surface. If a porous film has been formed, the aluminum oxide, silica, or other film formed in the pattern-forming region 703 is apt to contain fluid because of its porosity. If reverse sputtering has been performed, the surface temperature of the pattern-forming region rises, making it possible to improve film adhesion and to achieve transformation to a hydrophilic film. If a corona discharge has been generated, hydrophilic properties are achieved because of the formation of OH groups or COOH groups on the substrate surface.
  • the products are a cross-linked layer and unreacted groups of the macromolecules on the substrate surface.
  • ultraviolet light is used to irradiate a substrate or the like obtained using polyester or polypropylene, OH groups or COOH groups are produced and hydrophilic properties afforded.
  • ABS, polypropylene, or the like has been treated with ozone, surface affinity is improved.
  • a degreasing treatment has been performed, the substrate surface is oxidized, replacement with hydrophilic groups is achieved, and hydrophilic properties are afforded.
  • an application treatment involving paraffin or the like has been performed, the coated region has affinity for nonpolar molecules, and is thus readily wettable if the fluid consists of nonpolar molecules.
  • a film having affinity for the surface-modified pattern-forming region 703 is formed prior to the ejection of fluid from the ink-jet print head 2, creating only a slight danger of separation or excessive spreading for the droplets 12 (*8) impinging on the pattern-forming region.
  • the embodiment of the present invention relates to a treatment for forming a region with no affinity on both sides of a pattern as a physical-chemical action, and is primarily used in the first arrangement described above.
  • Fig. 6 is a plan view illustrating the treatment concept of the embodiment of the invention.
  • the treatment apparatus 304 of this embodiment is configured to allow a film 704 with no affinity for the fluid to be formed in a region outside the pattern-forming region of the substrate 1.
  • the above-described methods for applying paraffin or the like can be cited as examples of treatments for forming a zero-affinity film when the fluid contains polar molecules.
  • the following methods, which are described with respect to the example above, can be used when the fluid is devoid of polar molecules: methods for applying silane coupling agents; methods for forming aluminum oxide, silica, and other porous films; and methods for performing reverse sputtering in argon or the like; as well as corona discharge treatments, plasma treatments, ultraviolet irradiation treatments, ozone treatments, degreasing treatments, and various other known methods.
  • a film 704 with no affinity for the fluid is formed on both sides of a pattern-forming region before the fluid is ejected from the ink-jet print head 2 as described above, so the fluid that has overflowed the pattern-forming region is repelled by the zero-affinity film 704, and can thus be confined to the pattern-forming region.
  • a treatment is performed before the fluid is ejected onto the substrate, allowing the formation of patterns by ink-jet systems to be promoted through pretreatments. It is therefore possible to dispense with bulky plant equipment and to form arbitrary patterns on substrates at a low cost.

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Coating Apparatus (AREA)
  • Ink Jet (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Particle Formation And Scattering Control In Inkjet Printers (AREA)

Claims (3)

  1. Procédé de formation de motifs pour décharger un fluide prescrit sur un substrat (1) à partir d'une tête (2) d'impression à jet d'encre et pour former un motif arbitraire, le procédé comprenant les stades dans lesquels :
    - on forme une région de formation de motifs sur le substrat (1) en soumettant le substrat (1) à un traitement de modification de surface pour éliminer toute affinité pour le fluide sur la zone (704) de substrat (1) autour de la région (703) de formation de motifs ; et
    - on envoie le fluide sur le substrat (1) traité à partir de la tête (2) d'impression à jet d'encre pour former le motif arbitraire dans la région de formation de motifs,
    dans lequel on envoie le fluide de façon à ce qu'une partie du fluide déborde la région (703) de formation de motifs et soit ensuite repoussé par la zone (704) n'ayant pas d'affinité pour le fluide, le fluide étant ainsi confiné à la région de formation de motifs.
  2. Procédé de formation de motifs suivant la revendication 1, dans lequel le fluide est exempt de molécules polaires.
  3. Procédé de formation de motifs suivant la revendication 1, dans lequel le fluide contient des molécules polaires.
EP99100893A 1998-01-19 1999-01-19 Procédé de formation de motifs et appareil de fabrication de substrats Expired - Lifetime EP0930641B1 (fr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP801698 1998-01-19
JP00801698A JP4003273B2 (ja) 1998-01-19 1998-01-19 パターン形成方法および基板製造装置

Publications (3)

Publication Number Publication Date
EP0930641A2 EP0930641A2 (fr) 1999-07-21
EP0930641A3 EP0930641A3 (fr) 2000-02-02
EP0930641B1 true EP0930641B1 (fr) 2008-12-03

Family

ID=11681558

Family Applications (1)

Application Number Title Priority Date Filing Date
EP99100893A Expired - Lifetime EP0930641B1 (fr) 1998-01-19 1999-01-19 Procédé de formation de motifs et appareil de fabrication de substrats

Country Status (6)

Country Link
US (3) US6599582B2 (fr)
EP (1) EP0930641B1 (fr)
JP (1) JP4003273B2 (fr)
KR (1) KR100566730B1 (fr)
DE (1) DE69939995D1 (fr)
TW (1) TW383280B (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7989812B2 (en) 1999-10-12 2011-08-02 Semiconductor Energy Laboratory Co., Ltd. EL display device and a method of manufacturing the same
KR101076116B1 (ko) 2003-09-02 2011-10-21 픽스드로 엘티디. 잉크젯 기술을 이용한 미세 라인을 형성하는 방법 및시스템
US8383014B2 (en) 2010-06-15 2013-02-26 Cabot Corporation Metal nanoparticle compositions

Families Citing this family (233)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE69636960C5 (de) 1996-07-19 2015-07-30 E-Ink Corp. Elektronisch adressierbare mikroverkapselte Tinte
US6338809B1 (en) 1997-02-24 2002-01-15 Superior Micropowders Llc Aerosol method and apparatus, particulate products, and electronic devices made therefrom
CA2306384A1 (fr) * 1997-10-14 1999-04-22 Patterning Technologies Limited Procede de formation d'un dispositif electronique
JP4003273B2 (ja) * 1998-01-19 2007-11-07 セイコーエプソン株式会社 パターン形成方法および基板製造装置
US7075502B1 (en) 1998-04-10 2006-07-11 E Ink Corporation Full color reflective display with multichromatic sub-pixels
EP1105772B1 (fr) 1998-04-10 2004-06-23 E-Ink Corporation Afficheurs electroniques utilisant des transistors a effet de champ a base organique
AU3987299A (en) 1998-05-12 1999-11-29 E-Ink Corporation Microencapsulated electrophoretic electrostatically-addressed media for drawing device applications
US20030148024A1 (en) * 2001-10-05 2003-08-07 Kodas Toivo T. Low viscosity precursor compositons and methods for the depositon of conductive electronic features
US7323634B2 (en) * 1998-10-14 2008-01-29 Patterning Technologies Limited Method of forming an electronic device
US6498114B1 (en) 1999-04-09 2002-12-24 E Ink Corporation Method for forming a patterned semiconductor film
AU5090400A (en) * 1999-05-27 2001-03-05 Jetmask Limited Method of forming a masking pattern on a surface
EP1198852B1 (fr) 1999-07-21 2009-12-02 E Ink Corporation Procedes preferes de production d'elements de circuits electriques utilises pour commander un affichage electronique
EP1208612B1 (fr) * 1999-08-31 2011-01-12 E Ink Corporation Procede de formation d'un film semi-conducteur a motifs
TW471011B (en) * 1999-10-13 2002-01-01 Semiconductor Energy Lab Thin film forming apparatus
JP3622598B2 (ja) 1999-10-25 2005-02-23 セイコーエプソン株式会社 不揮発性メモリ素子の製造方法
US6319735B1 (en) 1999-11-30 2001-11-20 Philips Semiconductor, Inc. Photoresist dispense method by compensation for substrate reflectivity
AU779878B2 (en) * 1999-12-21 2005-02-17 Flexenable Limited Forming interconnects
EP1243032B1 (fr) 1999-12-21 2019-11-20 Flexenable Limited Circuits integres fabriques par jet d'encre
JP2001217245A (ja) * 2000-02-04 2001-08-10 Sharp Corp 電子部品およびその製造方法
TW495808B (en) 2000-02-04 2002-07-21 Semiconductor Energy Lab Thin film formation apparatus and method of manufacturing self-light-emitting device using thin film formation apparatus
GB2360489A (en) 2000-03-23 2001-09-26 Seiko Epson Corp Deposition of soluble materials
DE10016132A1 (de) 2000-03-31 2001-10-18 Infineon Technologies Ag Elektronisches Bauelement mit flexiblen Kontaktierungsstellen und Verfahren zu dessen Herstellung
US20020083858A1 (en) * 2000-05-15 2002-07-04 Macdiarmid Alan G. Spontaneous pattern formation of functional materials
DE10038895B4 (de) * 2000-08-09 2006-04-06 Advanced Photonics Technologies Ag Verfahren und Verwendung einer Vorrichtung zur Herstellung eines halbleitenden und/oder Elektrolumineszenz zeigenden organischen Schichtaufbaus
GB2367788A (en) * 2000-10-16 2002-04-17 Seiko Epson Corp Etching using an ink jet print head
GB0030095D0 (en) * 2000-12-09 2001-01-24 Xaar Technology Ltd Method of ink jet printing
JP2002216636A (ja) * 2001-01-15 2002-08-02 Samsung Sdi Co Ltd プラズマディスプレイ及びその製造方法
JP3958972B2 (ja) * 2001-01-19 2007-08-15 矢崎総業株式会社 回路体の製造方法及び回路体の製造装置
GB2373095A (en) * 2001-03-09 2002-09-11 Seiko Epson Corp Patterning substrates with evaporation residues
US6973710B2 (en) 2001-08-03 2005-12-13 Seiko Epson Corporation Method and apparatus for making devices
US7629017B2 (en) * 2001-10-05 2009-12-08 Cabot Corporation Methods for the deposition of conductive electronic features
JP2003124210A (ja) * 2001-10-15 2003-04-25 Seiko Epson Corp 表面処理方法、半導体デバイス、電気回路、表示体モジュール、カラーフィルタおよび発光素子
JP4039035B2 (ja) 2001-10-31 2008-01-30 セイコーエプソン株式会社 線パターンの形成方法、線パターン、電気光学装置、電子機器、非接触型カード媒体
GB2381665B (en) * 2001-11-02 2005-06-22 Jetmask Ltd Method of forming a mask on a surface
JP4281342B2 (ja) * 2001-12-05 2009-06-17 セイコーエプソン株式会社 パターン形成方法および配線形成方法
ITUD20010220A1 (it) 2001-12-27 2003-06-27 New System Srl Sistema per la realizzazione di una stratificazione di materiale elettronicamente interattivo
JP2003237217A (ja) * 2002-02-19 2003-08-27 Konica Corp インクジェット記録装置及びインクジェット記録方法
JP2003266030A (ja) 2002-03-15 2003-09-24 Seiko Epson Corp 被処理物の洗浄方法および装置並びにデバイスの製造方法およびデバイス
JP2003283103A (ja) 2002-03-22 2003-10-03 Seiko Epson Corp パターン形成方法および装置並びにデバイスの製造方法およびデバイス
JP3976598B2 (ja) * 2002-03-27 2007-09-19 Nec液晶テクノロジー株式会社 レジスト・パターン形成方法
NL1020312C2 (nl) 2002-04-05 2003-10-07 Otb Groep B V Werkwijze en inrichting voor het vervaardigen van een display, zoals bijvoorbeeld een polymere OLED display, een display en een substraat ten gebruike bij de werkwijze.
JP4042497B2 (ja) 2002-04-15 2008-02-06 セイコーエプソン株式会社 導電膜パターンの形成方法、配線基板、電子デバイス、電子機器、並びに非接触型カード媒体
JP4168795B2 (ja) * 2002-04-19 2008-10-22 セイコーエプソン株式会社 製膜方法、製膜装置、デバイス、デバイスの製造方法、及び電子機器
JP4068883B2 (ja) 2002-04-22 2008-03-26 セイコーエプソン株式会社 導電膜配線の形成方法、膜構造体の製造方法、電気光学装置の製造方法、及び電子機器の製造方法
JP2005527954A (ja) * 2002-05-27 2005-09-15 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 基板表面にパターン層を設ける方法
NL1020701C2 (nl) * 2002-05-29 2003-12-02 Stichting Energie Werkwijze en inrichting voor het op een laag van een nanokristallijn eerste materiaal aanbrengen van een laag van een tweede materiaal.
US6858464B2 (en) 2002-06-19 2005-02-22 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing light emitting device
US6972261B2 (en) * 2002-06-27 2005-12-06 Xerox Corporation Method for fabricating fine features by jet-printing and surface treatment
US6951377B2 (en) * 2002-07-24 2005-10-04 Frito-Lay North America, Inc. Inside printing of flexible packages
JP4098039B2 (ja) * 2002-08-30 2008-06-11 シャープ株式会社 パターン形成基材およびパターン形成方法
TWI256732B (en) * 2002-08-30 2006-06-11 Sharp Kk Thin film transistor, liquid crystal display apparatus, manufacturing method of thin film transistor, and manufacturing method of liquid crystal display apparatus
JP4170049B2 (ja) * 2002-08-30 2008-10-22 シャープ株式会社 パターン形成基材およびパターン形成方法
JP4615197B2 (ja) * 2002-08-30 2011-01-19 シャープ株式会社 Tftアレイ基板の製造方法および液晶表示装置の製造方法
US7910469B2 (en) 2002-09-25 2011-03-22 Konica Minolta Holdings, Inc. Electrical circuit, thin film transistor, method for manufacturing electric circuit and method for manufacturing thin film transistor
JP2004146796A (ja) 2002-09-30 2004-05-20 Seiko Epson Corp 膜パターンの形成方法、薄膜製造装置、導電膜配線、電気光学装置、電子機器、並びに非接触型カード媒体
JP4955919B2 (ja) * 2002-09-30 2012-06-20 セイコーエプソン株式会社 配線形成方法
CN100397580C (zh) * 2002-09-30 2008-06-25 精工爱普生株式会社 膜图案的形成方法、薄膜制造装置、导电膜布线
ITUD20020238A1 (it) * 2002-11-11 2004-05-12 New System Srl Metodo per la stesura controllata a getto d'inchiostro di polimeri per isolamento e/o protezione di circuiti stampati
CN100544533C (zh) * 2002-11-11 2009-09-23 株式会社半导体能源研究所 发光装置的制造方法
JP4107198B2 (ja) * 2002-11-20 2008-06-25 セイコーエプソン株式会社 液滴吐出装置、液滴吐出方法および電気光学装置
US6981767B2 (en) * 2003-01-15 2006-01-03 Ssgii, Inc. Printed item having an image with a high durability and/or resolution
US20040135828A1 (en) * 2003-01-15 2004-07-15 Schmitt Stephen E. Printer and method for printing an item with a high durability and/or resolution image
JP4907088B2 (ja) * 2003-02-05 2012-03-28 株式会社半導体エネルギー研究所 表示装置の製造方法
EP1592053B1 (fr) * 2003-02-05 2011-08-24 Semiconductor Energy Laboratory Co., Ltd. Procede de fabrication d'un cablage
WO2004070821A1 (fr) * 2003-02-06 2004-08-19 Semiconductor Energy Laboratory Co., Ltd. Procede de fabrication d'un affichage
JP4748990B2 (ja) 2003-02-06 2011-08-17 株式会社半導体エネルギー研究所 半導体装置の製造方法
KR101186919B1 (ko) * 2003-02-06 2012-10-02 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시장치의 제조 방법
US6932451B2 (en) * 2003-02-18 2005-08-23 T.S.D. Llc System and method for forming a pattern on plain or holographic metallized film and hot stamp foil
JP4244382B2 (ja) * 2003-02-26 2009-03-25 セイコーエプソン株式会社 機能性材料定着方法及びデバイス製造方法
JP3966293B2 (ja) 2003-03-11 2007-08-29 セイコーエプソン株式会社 パターンの形成方法及びデバイスの製造方法
JP3966294B2 (ja) * 2003-03-11 2007-08-29 セイコーエプソン株式会社 パターンの形成方法及びデバイスの製造方法
JP4107248B2 (ja) 2003-03-12 2008-06-25 セイコーエプソン株式会社 膜形成方法、膜形成装置、液晶の配置方法、液晶の配置装置、液晶装置、液晶装置の製造方法、並びに電子機器
JP3966292B2 (ja) * 2003-03-27 2007-08-29 セイコーエプソン株式会社 パターンの形成方法及びパターン形成装置、デバイスの製造方法、導電膜配線、電気光学装置、並びに電子機器
JP3945440B2 (ja) * 2003-03-31 2007-07-18 セイコーエプソン株式会社 燃料電池、その製造方法、電子機器および自動車
JP2004321880A (ja) 2003-04-22 2004-11-18 Seiko Epson Corp 洗浄方法及び保管方法、パターンの形成方法及びデバイスの製造方法、電気光学装置及び電子機器
JP4120455B2 (ja) * 2003-04-22 2008-07-16 セイコーエプソン株式会社 パターンの形成方法及びデバイスの製造方法
JP4675350B2 (ja) * 2003-04-25 2011-04-20 株式会社半導体エネルギー研究所 液滴吐出装置
KR101167534B1 (ko) * 2003-04-25 2012-07-23 가부시키가이샤 한도오따이 에네루기 켄큐쇼 패턴의 제작방법 및 액적 토출장치
US20040224541A1 (en) * 2003-05-09 2004-11-11 Murata Co., Ltd. Apparatus and method for forming solder wicking prevention zone and electronic part
JP2004363560A (ja) * 2003-05-09 2004-12-24 Seiko Epson Corp 基板、デバイス、デバイス製造方法、アクティブマトリクス基板の製造方法及び電気光学装置並びに電子機器
JP3823981B2 (ja) * 2003-05-12 2006-09-20 セイコーエプソン株式会社 パターンと配線パターン形成方法、デバイスとその製造方法、電気光学装置、電子機器及びアクティブマトリクス基板の製造方法
US7192859B2 (en) 2003-05-16 2007-03-20 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing semiconductor device and display device
JP2004342935A (ja) * 2003-05-16 2004-12-02 Semiconductor Energy Lab Co Ltd 配線の作製方法及び半導体装置の作製方法
JP2005012179A (ja) 2003-05-16 2005-01-13 Seiko Epson Corp 薄膜パターン形成方法、デバイスとその製造方法及び電気光学装置並びに電子機器、アクティブマトリクス基板の製造方法
JP4593969B2 (ja) * 2003-05-16 2010-12-08 株式会社半導体エネルギー研究所 配線の作製方法及び表示装置の作製方法
JP3861854B2 (ja) * 2003-05-28 2006-12-27 セイコーエプソン株式会社 電気回路の製造方法
JP2005012173A (ja) 2003-05-28 2005-01-13 Seiko Epson Corp 膜パターン形成方法、デバイス及びデバイスの製造方法、電気光学装置、並びに電子機器
JP2005019955A (ja) * 2003-05-30 2005-01-20 Seiko Epson Corp 薄膜パターンの形成方法及びデバイスの製造方法、電気光学装置及び電子機器
TWI319776B (en) * 2003-07-23 2010-01-21 Silver alloy material, circuit substrate, electronic device, and method for manufacturing circuit substrate
JP4498835B2 (ja) * 2003-07-23 2010-07-07 シャープ株式会社 回路基板及びその製造方法並びに電子装置
CN100435358C (zh) 2003-09-09 2008-11-19 Csg索拉尔有限公司 通过回流调节掩模
EP1665346A4 (fr) 2003-09-09 2006-11-15 Csg Solar Ag Procede ameliore de formation d'ouvertures dans une matiere de resine organique
JP2007505485A (ja) 2003-09-09 2007-03-08 シーエスジー ソーラー アクチェンゲゼルシャフト シリコンをエッチングする方法の改良
TWI234842B (en) * 2003-09-09 2005-06-21 Ind Tech Res Inst Manufacturing method of chemical sensors
JP2005118769A (ja) * 2003-10-15 2005-05-12 Rohm & Haas Electronic Materials Llc パターン形成
EP1529648A1 (fr) * 2003-11-08 2005-05-11 Atlantic ZeiserGmbH Procédé pour produire des supports d'information, par exemple des cartes, et installation de sa réalisation
WO2005047966A1 (fr) 2003-11-14 2005-05-26 Semiconductor Energy Laboratory Co., Ltd. Dispositif d'affichage a cristaux liquides et sa methode de fabrication
JP4096868B2 (ja) * 2003-11-25 2008-06-04 セイコーエプソン株式会社 膜形成方法、デバイス製造方法および電気光学装置
JP4583904B2 (ja) * 2003-12-17 2010-11-17 株式会社半導体エネルギー研究所 表示装置の作製方法
JP2005268693A (ja) * 2004-03-22 2005-09-29 Seiko Epson Corp パターン形成方法、回路基板および電子機器
EP1735852A1 (fr) * 2004-04-05 2006-12-27 Koninklijke Philips Electronics N.V. Procede permettant d'obtenir un substrat avec un motif imprime comprenant plusieurs elements de motif separes
JP4400290B2 (ja) * 2004-04-06 2010-01-20 セイコーエプソン株式会社 膜パターンの形成方法及びデバイスの製造方法、アクティブマトリクス基板の製造方法
US7354845B2 (en) 2004-08-24 2008-04-08 Otb Group B.V. In-line process for making thin film electronic devices
NL1026013C2 (nl) * 2004-04-23 2005-10-25 Otb Group Bv Werkwijze en inrichting voor het nauwkeurig aanbrengen van structuren op een substraat.
JP4652120B2 (ja) * 2004-05-21 2011-03-16 株式会社半導体エネルギー研究所 半導体装置の製造装置、およびパターン形成方法
US20050257738A1 (en) * 2004-05-21 2005-11-24 Semiconductor Energy Laboratory Co., Ltd. Manufacturing apparatus of semiconductor device and pattern-forming method
US20050276911A1 (en) * 2004-06-15 2005-12-15 Qiong Chen Printing of organometallic compounds to form conductive traces
EP1613136A1 (fr) * 2004-07-02 2006-01-04 Nederlandse Organisatie voor toegepast-natuurwetenschappelijk Onderzoek TNO Procédé pour appliquer un matériau sur un substrat en utilisant une technique d'impression à gouttelettes
US7547647B2 (en) * 2004-07-06 2009-06-16 Hewlett-Packard Development Company, L.P. Method of making a structure
EP1622435A1 (fr) * 2004-07-28 2006-02-01 ATOTECH Deutschland GmbH Méthode de fabrication d'un dispositif par des techniques d'écriture directe
JP2006035173A (ja) * 2004-07-29 2006-02-09 Sharp Corp インクジェット装置およびパターン修正装置
JP3807425B2 (ja) 2004-08-27 2006-08-09 セイコーエプソン株式会社 配線パターン形成方法およびtft用ゲート電極の形成方法
JP3922280B2 (ja) * 2004-09-30 2007-05-30 セイコーエプソン株式会社 配線パターンの形成方法及びデバイスの製造方法
JP4096933B2 (ja) * 2004-09-30 2008-06-04 セイコーエプソン株式会社 パターンの形成方法
US20060073337A1 (en) * 2004-10-01 2006-04-06 Krzysztof Nauka Conductive path made of metallic nanoparticles and conductive organic material
JP4389747B2 (ja) * 2004-10-12 2009-12-24 セイコーエプソン株式会社 パターン形成方法および配線形成方法
JP4155257B2 (ja) * 2004-10-21 2008-09-24 セイコーエプソン株式会社 パターン形成方法および機能性膜
JP3992038B2 (ja) * 2004-11-16 2007-10-17 セイコーエプソン株式会社 電子素子の実装方法、電子装置の製造方法、回路基板、電子機器
JP2006150179A (ja) 2004-11-26 2006-06-15 Seiko Epson Corp 成膜装置及び成膜方法
US20060128165A1 (en) * 2004-12-13 2006-06-15 3M Innovative Properties Company Method for patterning surface modification
EP1836001A4 (fr) * 2004-12-30 2009-08-05 Du Pont Dispositifs electroniques organiques et procedes associes
US8167393B2 (en) 2005-01-14 2012-05-01 Cabot Corporation Printable electronic features on non-uniform substrate and processes for making same
WO2006076606A2 (fr) 2005-01-14 2006-07-20 Cabot Corporation Impression multicouches optimisee de dispositifs electroniques et d'afficheurs
WO2006076610A2 (fr) * 2005-01-14 2006-07-20 Cabot Corporation Controle de la migration d'encre lors de la formation d'elements electroniques imprimables
US7824466B2 (en) 2005-01-14 2010-11-02 Cabot Corporation Production of metal nanoparticles
US7749299B2 (en) * 2005-01-14 2010-07-06 Cabot Corporation Production of metal nanoparticles
DE102005008574A1 (de) * 2005-02-24 2006-09-07 Pötz, Thomas Verfahren und Vorrichtung zum digitalen Bedrucken von flächigen Materialien wie Textilien, Papier etc.
JP4337746B2 (ja) 2005-03-09 2009-09-30 セイコーエプソン株式会社 フォトマスクおよびその製造方法、電子機器の製造方法
JP2006289355A (ja) * 2005-03-18 2006-10-26 Ran Technical Service Kk 薄膜形成装置及び薄膜形成方法
US20060214004A1 (en) * 2005-03-24 2006-09-28 Tsujiden Co., Ltd. Person-verifying medium using a luminous body, and process for producing the same
US7691280B2 (en) * 2005-03-25 2010-04-06 E. I. Du Pont De Nemours And Company Ink jet printing of etchants and modifiers
JP4232753B2 (ja) * 2005-03-28 2009-03-04 セイコーエプソン株式会社 液滴吐出装置
JP2006272297A (ja) 2005-03-30 2006-10-12 Seiko Epson Corp 液滴吐出装置
JP2006293148A (ja) * 2005-04-13 2006-10-26 Ulvac Japan Ltd スペーサ塗布装置、スペーサ塗布方法
US7906722B2 (en) 2005-04-19 2011-03-15 Palo Alto Research Center Incorporated Concentrating solar collector with solid optical element
US7858415B2 (en) 2005-04-28 2010-12-28 Sharp Kabushiki Kaisha Production methods of pattern thin film, semiconductor element, and circuit substrate, and resist material, semiconductor element, and circuit substrate
JP2006343450A (ja) * 2005-06-08 2006-12-21 Seiko Epson Corp 光学シート、バックライトユニット、電気光学装置及び電子機器、並びに光学シートの製造方法
US20070020395A1 (en) * 2005-06-27 2007-01-25 Lang Charles D Process for making an electronic device
JP4935153B2 (ja) * 2005-06-30 2012-05-23 セイコーエプソン株式会社 液滴吐出方法
US7972650B1 (en) * 2005-07-13 2011-07-05 Nscrypt, Inc. Method for manufacturing 3D circuits from bare die or packaged IC chips by microdispensed interconnections
JP4914589B2 (ja) 2005-08-26 2012-04-11 三菱電機株式会社 半導体製造装置、半導体製造方法および半導体装置
TWI297513B (en) * 2005-10-06 2008-06-01 Ind Tech Res Inst Electrode and method for forming the same
KR100649445B1 (ko) * 2005-10-17 2006-11-27 삼성전기주식회사 배선형성 방법 및 장치
US7765949B2 (en) * 2005-11-17 2010-08-03 Palo Alto Research Center Incorporated Extrusion/dispensing systems and methods
US7799371B2 (en) * 2005-11-17 2010-09-21 Palo Alto Research Center Incorporated Extruding/dispensing multiple materials to form high-aspect ratio extruded structures
US20070107773A1 (en) * 2005-11-17 2007-05-17 Palo Alto Research Center Incorporated Bifacial cell with extruded gridline metallization
US20070169806A1 (en) * 2006-01-20 2007-07-26 Palo Alto Research Center Incorporated Solar cell production using non-contact patterning and direct-write metallization
WO2007106699A1 (fr) * 2006-03-14 2007-09-20 Cabot Corporation Fabrication de rouleau à rouleau de matériaux électroniques et optiques
WO2007108364A1 (fr) * 2006-03-16 2007-09-27 Lan Technical Service Co., Ltd. Dispositif de formation d'un film mince et procédé de formation d'un film mince
JP2007289837A (ja) 2006-04-24 2007-11-08 Seiko Epson Corp 液滴吐出装置及び識別コード
US7855335B2 (en) * 2006-04-26 2010-12-21 Palo Alto Research Center Incorporated Beam integration for concentrating solar collector
JP4961162B2 (ja) * 2006-05-01 2012-06-27 有限会社 エスアイジェイテクノロジ 電気接続体及びカートリッジ
US7851693B2 (en) * 2006-05-05 2010-12-14 Palo Alto Research Center Incorporated Passively cooled solar concentrating photovoltaic device
US7638708B2 (en) * 2006-05-05 2009-12-29 Palo Alto Research Center Incorporated Laminated solar concentrating photovoltaic device
US8105643B2 (en) * 2006-05-31 2012-01-31 Cabot Corporation Process for printing features with smaller dimensions
JP5217122B2 (ja) * 2006-07-11 2013-06-19 株式会社日立製作所 パターン形成装置および有機薄膜トランジスタの製造方法ならびに有機薄膜トランジスタ
US9615463B2 (en) 2006-09-22 2017-04-04 Oscar Khaselev Method for producing a high-aspect ratio conductive pattern on a substrate
US8322025B2 (en) * 2006-11-01 2012-12-04 Solarworld Innovations Gmbh Apparatus for forming a plurality of high-aspect ratio gridline structures
US7922471B2 (en) * 2006-11-01 2011-04-12 Palo Alto Research Center Incorporated Extruded structure with equilibrium shape
US7780812B2 (en) * 2006-11-01 2010-08-24 Palo Alto Research Center Incorporated Extrusion head with planarized edge surface
US8226391B2 (en) * 2006-11-01 2012-07-24 Solarworld Innovations Gmbh Micro-extrusion printhead nozzle with tapered cross-section
JP4519120B2 (ja) * 2006-11-08 2010-08-04 大日本スクリーン製造株式会社 パターン形成装置
US20080119011A1 (en) * 2006-11-20 2008-05-22 Industrial Technology Research Institute Method of film coating and device manufactured thereby
US20080116183A1 (en) * 2006-11-21 2008-05-22 Palo Alto Research Center Incorporated Light Scanning Mechanism For Scan Displacement Invariant Laser Ablation Apparatus
US20080116182A1 (en) * 2006-11-21 2008-05-22 Palo Alto Research Center Incorporated Multiple Station Scan Displacement Invariant Laser Ablation Apparatus
US20080136887A1 (en) * 2006-12-11 2008-06-12 Schmitt Stephen E Printed item having an image with a high durability and/or resolution
US7638438B2 (en) * 2006-12-12 2009-12-29 Palo Alto Research Center Incorporated Solar cell fabrication using extrusion mask
US7928015B2 (en) * 2006-12-12 2011-04-19 Palo Alto Research Center Incorporated Solar cell fabrication using extruded dopant-bearing materials
JP2008176009A (ja) * 2007-01-18 2008-07-31 Seiko Epson Corp パターン形成方法
JP4470945B2 (ja) * 2007-02-05 2010-06-02 セイコーエプソン株式会社 成膜方法及び配向膜形成方法
US7954449B2 (en) * 2007-05-08 2011-06-07 Palo Alto Research Center Incorporated Wiring-free, plumbing-free, cooled, vacuum chuck
JP4748108B2 (ja) * 2007-05-25 2011-08-17 セイコーエプソン株式会社 膜パターンの形成方法、膜パターン形成装置、導電膜配線、電気光学装置、電子機器、非接触型カード媒体
US8058195B2 (en) * 2007-06-19 2011-11-15 Cabot Corporation Nanoglass and flame spray processes for producing nanoglass
JP2009000600A (ja) * 2007-06-20 2009-01-08 Seiko Epson Corp パターン形成方法及び電気光学装置製造方法並びに電子機器製造方法
JP5216261B2 (ja) * 2007-07-03 2013-06-19 株式会社日本マイクロニクス 配線形成装置、配線形成方法及び噴出制御装置
CA2665219C (fr) * 2007-08-03 2018-07-10 Fry's Metals, Inc. Motifs conducteurs et procedes d'utilisation associes
US8039052B2 (en) * 2007-09-06 2011-10-18 Intermolecular, Inc. Multi-region processing system and heads
JP4375466B2 (ja) * 2007-09-21 2009-12-02 セイコーエプソン株式会社 導電ポスト形成方法、多層配線基板の製造方法及び電子機器の製造方法
JP4442677B2 (ja) * 2007-10-11 2010-03-31 セイコーエプソン株式会社 液滴吐出装置の液滴乾燥方法及び液滴吐出装置
US8356894B2 (en) * 2007-10-16 2013-01-22 Seiko Epson Corporation Recording apparatus and liquid ejecting apparatus
US8967784B2 (en) * 2007-11-19 2015-03-03 Hewlett-Packard Development Company, L.P. Method and apparatus for improving printed image density
US8101231B2 (en) * 2007-12-07 2012-01-24 Cabot Corporation Processes for forming photovoltaic conductive features from multiple inks
US8287116B2 (en) * 2008-02-14 2012-10-16 Hewlett-Packard Development Company, L.P. Printing apparatus and method
JP4924526B2 (ja) * 2008-04-25 2012-04-25 セイコーエプソン株式会社 液滴付与方法、液滴吐出装置および電気光学装置の製造方法
KR20090117249A (ko) * 2008-05-09 2009-11-12 삼성전기주식회사 인쇄회로기판 및 그 제조방법
WO2009139060A1 (fr) * 2008-05-15 2009-11-19 株式会社島津製作所 Procédé de fabrication de dispositif à matrice optique et appareil de fabrication de dispositif à matrice optique
US8272254B2 (en) * 2008-08-04 2012-09-25 Brighton Technologies Group, Inc Device and method to measure wetting characteristics
JP5228715B2 (ja) * 2008-09-04 2013-07-03 株式会社リコー インク塗布ユニット、インクジェット記録装置ならびにインクジェット記録方法
US7999175B2 (en) * 2008-09-09 2011-08-16 Palo Alto Research Center Incorporated Interdigitated back contact silicon solar cells with laser ablated grooves
US20100105125A1 (en) * 2008-10-24 2010-04-29 Bioprocessh20 Llc Systems, apparatuses and methods for cultivating microorganisms and mitigation of gases
US20100117254A1 (en) * 2008-11-07 2010-05-13 Palo Alto Research Center Incorporated Micro-Extrusion System With Airjet Assisted Bead Deflection
US20100221435A1 (en) * 2008-11-07 2010-09-02 Palo Alto Research Center Incorporated Micro-Extrusion System With Airjet Assisted Bead Deflection
US8117983B2 (en) * 2008-11-07 2012-02-21 Solarworld Innovations Gmbh Directional extruded bead control
US20100118081A1 (en) * 2008-11-07 2010-05-13 Palo Alto Research Center Incorporated Dead Volume Removal From An Extrusion Printhead
US9150966B2 (en) * 2008-11-14 2015-10-06 Palo Alto Research Center Incorporated Solar cell metallization using inline electroless plating
US8080729B2 (en) * 2008-11-24 2011-12-20 Palo Alto Research Center Incorporated Melt planarization of solar cell bus bars
US20100130014A1 (en) * 2008-11-26 2010-05-27 Palo Alto Research Center Incorporated Texturing multicrystalline silicon
US20100139754A1 (en) * 2008-12-09 2010-06-10 Palo Alto Research Center Incorporated Solar Cell With Co-Planar Backside Metallization
US8960120B2 (en) * 2008-12-09 2015-02-24 Palo Alto Research Center Incorporated Micro-extrusion printhead with nozzle valves
US8089216B2 (en) * 2008-12-10 2012-01-03 Linear Technology Corporation Linearity in LED dimmer control
JP5453793B2 (ja) * 2008-12-10 2014-03-26 株式会社リコー 積層構造体の製造方法、有機薄膜トランジスタの製造方法及び有機薄膜トランジスタアレイの製造方法
US20100178433A1 (en) * 2009-01-14 2010-07-15 Gm Global Technology Operations, Inc. Method and apparatus for applying bonding adhesive
US20100206357A1 (en) * 2009-02-18 2010-08-19 Palo Alto Research Center Incorporated Two-Part Solar Energy Collection System With Replaceable Solar Collector Component
US20100206356A1 (en) * 2009-02-18 2010-08-19 Palo Alto Research Center Incorporated Rotational Trough Reflector Array For Solar-Electricity Generation
US20100206379A1 (en) * 2009-02-18 2010-08-19 Palo Alto Research Center Incorporated Rotational Trough Reflector Array With Solid Optical Element For Solar-Electricity Generation
US20100206302A1 (en) * 2009-02-18 2010-08-19 Palo Alto Research Center Incorporated Rotational Trough Reflector Array For Solar-Electricity Generation
JP5467855B2 (ja) * 2009-03-09 2014-04-09 富士フイルム株式会社 ラインパターン形成方法
US20110083728A1 (en) * 2009-10-14 2011-04-14 Palo Alto Research Center Incorporated Disordered Nanowire Solar Cell
US20110100419A1 (en) * 2009-11-03 2011-05-05 Palo Alto Research Center Incorporated Linear Concentrating Solar Collector With Decentered Trough-Type Relectors
KR101678670B1 (ko) * 2010-01-22 2016-12-07 삼성전자주식회사 박막트랜지스터 및 어레이 박막트랜지스터의 제조방법
US20110216401A1 (en) * 2010-03-03 2011-09-08 Palo Alto Research Center Incorporated Scanning System With Orbiting Objective
JP5462036B2 (ja) * 2010-03-15 2014-04-02 株式会社フジクラ 回路基板の製造方法、およびその回路基板
JP5462039B2 (ja) * 2010-03-18 2014-04-02 株式会社フジクラ 回路基板の製造方法、その回路基板、及び回路基板の製造方法
JP5685467B2 (ja) * 2010-09-16 2015-03-18 富士フイルム株式会社 パターン形成方法及びパターン形成装置
KR20120052043A (ko) * 2010-11-15 2012-05-23 삼성전자주식회사 잉크젯 프린트용 기판의 표면 개질 방법
US8677929B2 (en) * 2010-12-29 2014-03-25 Intevac, Inc. Method and apparatus for masking solar cell substrates for deposition
US8962424B2 (en) 2011-03-03 2015-02-24 Palo Alto Research Center Incorporated N-type silicon solar cell with contact/protection structures
US9132667B2 (en) 2011-06-15 2015-09-15 Hewlett-Packard Development Company, L.P. Printing system
JP2013008851A (ja) * 2011-06-24 2013-01-10 Fujifilm Corp 機能性液体パターン形成方法、導電性パターン形成方法、機能性液体パターン形成システム、導電性パターン形成システム、機能性液体パターン構造体製造方法、及び導電性パターン構造体製造方法
US9855769B2 (en) * 2011-07-01 2018-01-02 Hewlett-Packard Development Company, L.P. Curing apparatus, image forming apparatus, and articles of manufacture
JP6011962B2 (ja) * 2012-08-30 2016-10-25 国立研究開発法人産業技術総合研究所 パターン印刷装置、パターン印刷方法、および試験装置
EP2946400A4 (fr) * 2013-01-21 2016-09-07 Camtek Ltd Prétraitement de surface et commande de diffusion de gouttes sur des surfaces à composants multiples
CN105188957B (zh) * 2013-03-15 2018-04-06 麦克罗尼克迈达塔有限责任公司 用于将粘性介质喷射在工件上的方法和装置
US9808822B2 (en) 2013-03-15 2017-11-07 Mycronic AB Methods and devices for jetting viscous medium on workpieces
JP6538649B2 (ja) * 2014-03-10 2019-07-03 武蔵エンジニアリング株式会社 塗布装置および塗布方法
JP6476990B2 (ja) * 2014-06-05 2019-03-06 大日本印刷株式会社 印刷版、印刷版の製造方法、機能性素子の製造方法および印刷装置
KR101636453B1 (ko) * 2015-01-29 2016-07-05 한림대학교 산학협력단 유기 박막 트랜지스터 및 그 제조 방법
CN107340178B (zh) * 2017-07-24 2019-12-03 中国民用航空飞行学院 一种单液滴撞击织物机理研究实验装置
WO2019151975A1 (fr) * 2018-01-30 2019-08-08 Hewlett-Packard Development Company, L.P. Dispositifs d'alignement
KR102652755B1 (ko) * 2018-04-09 2024-04-01 세메스 주식회사 액적 토출 방법 및 장치
US11255715B2 (en) 2018-07-20 2022-02-22 Brighton technologies, LLC Method and apparatus for determining a mass of a droplet from sample data collected from a liquid droplet dispensation system
KR102199011B1 (ko) * 2018-12-20 2021-01-08 충남대학교산학협력단 역전압 전기수력학적 3d 패터닝 방법
CN113274856B (zh) * 2021-04-21 2022-08-05 西安交通大学 一种面向微重力环境的太空舱内3d打印装置

Family Cites Families (38)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3982251A (en) * 1974-08-23 1976-09-21 Ibm Corporation Method and apparatus for recording information on a recording medium
US4509057A (en) * 1983-03-28 1985-04-02 Xerox Corporation Automatic calibration of drop-on-demand ink jet ejector
JPH0797696B2 (ja) * 1986-07-05 1995-10-18 株式会社豊田自動織機製作所 ハイブリツドic基板と回路パタ−ン形成方法
FR2602462A1 (fr) * 1986-08-11 1988-02-12 Millet Jean Claude Procede et dispositif d'impression par jet d'encre
CH673290A5 (fr) 1987-04-15 1990-02-28 Galipag
CH673920A5 (fr) * 1987-05-19 1990-04-12 Rino Doriguzzi
DK648187D0 (da) 1987-12-09 1987-12-09 Linkease Test Systems A S Fremgangsmaade og apparat til fremstilling af kredsloebsdel
US5132248A (en) * 1988-05-31 1992-07-21 The United States Of America As Represented By The United States Department Of Energy Direct write with microelectronic circuit fabrication
JP2805504B2 (ja) 1989-08-07 1998-09-30 近畿配管株式会社 管路内壁面のライニング方法
US5006862A (en) 1989-10-27 1991-04-09 Hewlett-Packard Company Fixation of reactive dyes to paper by ink-jet printing
GB2273506B (en) * 1992-11-20 1996-03-13 Kodak Ltd Method of ink jet printing a continuous tone colour image using electrolysis
GB2273507A (en) 1992-12-21 1994-06-22 Hollingsworth On Wheels John D Sliver autolevelling method and apparatus
JP3332465B2 (ja) * 1993-04-05 2002-10-07 キヤノン株式会社 インクジェット記録方法、インクジェット記録装置
JPH0796603A (ja) 1993-07-31 1995-04-11 Sony Corp インクジェット記録装置
JPH07156534A (ja) 1993-12-08 1995-06-20 Taiho Ind Co Ltd インクジェット記録方法
US5483265A (en) * 1994-01-03 1996-01-09 Xerox Corporation Minimization of missing droplets in a thermal ink jet printer by drop volume control
US5429860A (en) * 1994-02-28 1995-07-04 E. I. Du Pont De Nemours And Company Reactive media-ink system for ink jet printing
FR2718142B1 (fr) * 1994-03-31 1996-12-20 Toxot Science & Appl Encres pour de dépôt de couches diélectriques par la technique d'impression par jet continu d'encre.
JPH0852868A (ja) 1994-08-10 1996-02-27 Canon Inc インクジェット記録方法および記録装置
JP3419105B2 (ja) * 1994-09-19 2003-06-23 セイコーエプソン株式会社 インクジェット記録方法
JP2767691B2 (ja) 1995-01-20 1998-06-18 株式会社健正堂 材料の複数面の必要部分のみにレジスト層を迅速に形成する方法
JPH0929955A (ja) 1995-07-18 1997-02-04 Seiko Epson Corp インクジェット記録装置
US5518534A (en) * 1995-08-04 1996-05-21 E. I. Du Pont De Nemours And Company Ink set and process for alleviating bleed in printed elements
JPH09109381A (ja) 1995-10-20 1997-04-28 Canon Inc インクジェットプリント装置およびインクジェットプリント方法
US6080229A (en) * 1996-04-16 2000-06-27 Seiko Epson Corporation Reaction solution for ink jet recording method using two liquids
JP3904120B2 (ja) * 1996-04-16 2007-04-11 セイコーエプソン株式会社 二液を用いたインクジェット記録方法に用いられる反応液およびそれを用いたインクジェット記録方法
JPH09279069A (ja) 1996-04-16 1997-10-28 Seiko Epson Corp インクジェット記録用インクセット
DE69725374T2 (de) 1996-04-19 2004-08-12 Canon K.K. Tintenstrahldruckverfahren und -gerät unter Verwendung einer Druckqualität verbessernden Flüssigkeit
JPH108016A (ja) 1996-06-25 1998-01-13 Nippon Paint Co Ltd ポリプロピレン被覆金属板用接着剤組成物及びこれを用いた製造方法
JPH1085504A (ja) 1996-09-18 1998-04-07 Yazaki Corp 塩化ビニル樹脂組成物中の有機発泡剤の分離方法、及び分析方法
JP3181850B2 (ja) * 1997-02-14 2001-07-03 キヤノン株式会社 インクジェット記録装置および記録方法
JPH10272827A (ja) 1997-03-28 1998-10-13 Canon Inc 画像形成方法、インクジェット記録方法及び機器
JPH10278379A (ja) 1997-04-09 1998-10-20 Seiko Epson Corp 印刷装置、印刷方法および記録媒体
US6092890A (en) * 1997-09-19 2000-07-25 Eastman Kodak Company Producing durable ink images
JP4003273B2 (ja) * 1998-01-19 2007-11-07 セイコーエプソン株式会社 パターン形成方法および基板製造装置
US6328408B1 (en) * 1998-06-19 2001-12-11 Creo S.R.L. Multiple pass ink jet recording
JP2000037936A (ja) * 1998-07-21 2000-02-08 Canon Inc プリント位置合わせ方法およびプリント装置
KR100475162B1 (ko) * 2002-05-09 2005-03-08 엘지.필립스 엘시디 주식회사 액정표시장치 및 그 제조방법

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7989812B2 (en) 1999-10-12 2011-08-02 Semiconductor Energy Laboratory Co., Ltd. EL display device and a method of manufacturing the same
KR101076116B1 (ko) 2003-09-02 2011-10-21 픽스드로 엘티디. 잉크젯 기술을 이용한 미세 라인을 형성하는 방법 및시스템
US8668848B2 (en) 2005-01-14 2014-03-11 Cabot Corporation Metal nanoparticle compositions for reflective features
US8383014B2 (en) 2010-06-15 2013-02-26 Cabot Corporation Metal nanoparticle compositions

Also Published As

Publication number Publication date
US20050146588A1 (en) 2005-07-07
DE69939995D1 (de) 2009-01-15
KR19990067996A (ko) 1999-08-25
EP0930641A2 (fr) 1999-07-21
JP4003273B2 (ja) 2007-11-07
US6599582B2 (en) 2003-07-29
EP0930641A3 (fr) 2000-02-02
US6877853B2 (en) 2005-04-12
US7114802B2 (en) 2006-10-03
KR100566730B1 (ko) 2006-04-03
JPH11204529A (ja) 1999-07-30
US20030003231A1 (en) 2003-01-02
TW383280B (en) 2000-03-01
US20040048001A1 (en) 2004-03-11

Similar Documents

Publication Publication Date Title
EP0930641B1 (fr) Procédé de formation de motifs et appareil de fabrication de substrats
US8028649B2 (en) Liquid ejection apparatus and resist pattern forming method
US5198834A (en) Ink jet print head having two cured photoimaged barrier layers
US5949454A (en) Ink jet head, ink jet head cartridge, ink jet recording apparatus and method for making ink jet head
US6696225B1 (en) Substrate and manufacturing method thereof
EP2979867B1 (fr) Appareil d'impression et procédé d'impression
US20130057619A1 (en) Liquid discharge head and method of manufacturing the same
JPH11157082A (ja) インクジェット記録ヘッドの製造方法
JPH11334048A (ja) パターン形成方法、パターン形成装置、パターン形成用版およびパターン形成用版の製造方法
EP0612621B1 (fr) Tete d'impression a jet liquide amelioree et imprimante a jet liquide equipee de cette tete
JPH11207959A (ja) 基板、その製造方法およびパターン形成方法
CN102802954B (zh) 一种用于喷墨打印机的微流致动器
CN1517216A (zh) 用于流体喷射装置的基片和形成基片的方法
JP2008105231A (ja) 撥液膜形成方法、インクジェットヘッドの製造方法、インクジェットヘッドおよび電子機器
US6161923A (en) Fine detail photoresist barrier
US6199972B1 (en) Liquid discharging method, liquid discharging head, and head cartridge and liquid discharging apparatus using said liquid discharging head
EP0495649B1 (fr) Méthode pour la production d'une tête d'enregistrement à jet d'encre
EP0747222B1 (fr) Tête d'impression à jet d'encre, procédé de fabrication de la tête et appareil d'enregistrement à jet d'encre
US20180290449A1 (en) Adhesion and insulating layer
KR20030083616A (ko) 액체 사출 장치, 프린터 헤드, 및 액체 사출 장치 제조 방법
KR100665928B1 (ko) 나노 잉크젯 프린터 헤드와 그 제조방법
US20020145646A1 (en) Imageable support matrix for pinthead nozzle plates and method of manufacture
CN1109604C (zh) 喷墨列印装置的喷墨头的制造方法及其装置
CN114516229A (zh) 喷墨头及喷墨打印机
JP2005001347A (ja) 液体吐出ヘッド及びその製造方法

Legal Events

Date Code Title Description
PUAI Public reference made under article 153(3) epc to a published international application that has entered the european phase

Free format text: ORIGINAL CODE: 0009012

AK Designated contracting states

Kind code of ref document: A2

Designated state(s): DE FR GB NL

AX Request for extension of the european patent

Free format text: AL;LT;LV;MK;RO;SI

PUAL Search report despatched

Free format text: ORIGINAL CODE: 0009013

AK Designated contracting states

Kind code of ref document: A3

Designated state(s): AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE

AX Request for extension of the european patent

Free format text: AL;LT;LV;MK;RO;SI

RIC1 Information provided on ipc code assigned before grant

Free format text: 7H 01L 21/00 A, 7B 41J 2/01 B, 7B 41J 3/407 B, 7H 05K 3/10 B

17P Request for examination filed

Effective date: 20000704

AKX Designation fees paid

Free format text: DE FR GB NL

17Q First examination report despatched

Effective date: 20030819

17Q First examination report despatched

Effective date: 20030819

GRAP Despatch of communication of intention to grant a patent

Free format text: ORIGINAL CODE: EPIDOSNIGR1

GRAS Grant fee paid

Free format text: ORIGINAL CODE: EPIDOSNIGR3

GRAA (expected) grant

Free format text: ORIGINAL CODE: 0009210

AK Designated contracting states

Kind code of ref document: B1

Designated state(s): DE FR GB NL

REG Reference to a national code

Ref country code: GB

Ref legal event code: FG4D

REF Corresponds to:

Ref document number: 69939995

Country of ref document: DE

Date of ref document: 20090115

Kind code of ref document: P

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: NL

Payment date: 20090125

Year of fee payment: 11

PLBE No opposition filed within time limit

Free format text: ORIGINAL CODE: 0009261

STAA Information on the status of an ep patent application or granted ep patent

Free format text: STATUS: NO OPPOSITION FILED WITHIN TIME LIMIT

26N No opposition filed

Effective date: 20090904

REG Reference to a national code

Ref country code: NL

Ref legal event code: V1

Effective date: 20100801

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: NL

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20100801

REG Reference to a national code

Ref country code: FR

Ref legal event code: PLFP

Year of fee payment: 17

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: DE

Payment date: 20150113

Year of fee payment: 17

PGFP Annual fee paid to national office [announced via postgrant information from national office to epo]

Ref country code: GB

Payment date: 20150114

Year of fee payment: 17

Ref country code: FR

Payment date: 20150108

Year of fee payment: 17

REG Reference to a national code

Ref country code: DE

Ref legal event code: R119

Ref document number: 69939995

Country of ref document: DE

GBPC Gb: european patent ceased through non-payment of renewal fee

Effective date: 20160119

REG Reference to a national code

Ref country code: FR

Ref legal event code: ST

Effective date: 20160930

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: DE

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20160802

Ref country code: GB

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20160119

PG25 Lapsed in a contracting state [announced via postgrant information from national office to epo]

Ref country code: FR

Free format text: LAPSE BECAUSE OF NON-PAYMENT OF DUE FEES

Effective date: 20160201