CN1302542C - 模块部件 - Google Patents

模块部件 Download PDF

Info

Publication number
CN1302542C
CN1302542C CNB038015730A CN03801573A CN1302542C CN 1302542 C CN1302542 C CN 1302542C CN B038015730 A CNB038015730 A CN B038015730A CN 03801573 A CN03801573 A CN 03801573A CN 1302542 C CN1302542 C CN 1302542C
Authority
CN
China
Prior art keywords
circuit substrate
metal film
modular unit
installing component
seal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB038015730A
Other languages
English (en)
Other versions
CN1592966A (zh
Inventor
恒冈道朗
桥本兴二
叶山雅昭
安保武雄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Holdings Corp
Original Assignee
Matsushita Electric Industrial Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Industrial Co Ltd filed Critical Matsushita Electric Industrial Co Ltd
Publication of CN1592966A publication Critical patent/CN1592966A/zh
Application granted granted Critical
Publication of CN1302542C publication Critical patent/CN1302542C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • H01L23/3121Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed a substrate forming part of the encapsulation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/552Protection against radiation, e.g. light or electromagnetic waves
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/0213Electrical arrangements not otherwise provided for
    • H05K1/0216Reduction of cross-talk, noise or electromagnetic interference
    • H05K1/0218Reduction of cross-talk, noise or electromagnetic interference by printed shielding conductors, ground planes or power plane
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/12Mountings, e.g. non-detachable insulating substrates
    • H01L23/13Mountings, e.g. non-detachable insulating substrates characterised by the shape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/19Details of hybrid assemblies other than the semiconductor or other solid state devices to be connected
    • H01L2924/1901Structure
    • H01L2924/1904Component type
    • H01L2924/19041Component type being a capacitor
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3025Electromagnetic shielding
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0044Mechanical working of the substrate, e.g. drilling or punching
    • H05K3/0052Depaneling, i.e. dividing a panel into circuit boards; Working of the edges of circuit boards
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/28Applying non-metallic protective coatings
    • H05K3/284Applying non-metallic protective coatings for encapsulating mounted components
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/40Forming printed elements for providing electric connections to or between printed circuits
    • H05K3/403Edge contacts; Windows or holes in the substrate having plural connections on the walls thereof

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Electromagnetism (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Structure Of Printed Boards (AREA)

Abstract

提供一种具有充分的屏蔽效果以及高度降低的模块部件。电路基板(10)上安装有由电子部件形成的安装部件(30)、用密封体(40)密封该安装部件(30)。在该密封体(40)的表面上形成金属膜(20)。在电路基板(10)的表层面的外周边上形成接地图形(50),将所述金属膜(20)和接地图形(50)导电连接。

Description

模块部件
技术领域
本发明涉及用于各种电子设备、通信设备的模块部件。
背景技术
传统的模块部件如图7所示,由至少在其一侧面上装载一个以上的安装部件23的电路基板21、设置在电路基板21的侧面上的接地电极24、和覆盖安装部件23的金属壳体22构成。如此,该金属壳体22的一端与接地电极24通过软钎料连接而构成电屏蔽。如上所述的模块部件,为了将金属壳体22和电路基板21的侧面通过软钎料进行连接,则就需要具有能够使金属壳体22自支承的电路基板21的厚度。此外,当装载在电路基板21上的安装部件23与金属壳体22接触时,就会发生短路或由于外部应力而造成的电路工作出现问题。为避免所述问题,需要使金属壳体22的高度大于安装部件23的高度。而且,在电路基板21和金属壳体22连接时,不应使金属壳体22和在电路基板21的表面上形成的电路图形和安装部件23接触。因此在电路基板21和金属壳体22之间设置有间隙。
将在金属壳体22上形成的端子与电路基板21的接地电极24连接。这样做的结果是难以进行部件的薄型化并且屏蔽效果不充分。
发明内容
鉴于所述问题,本发明的目的在于使模块部件的低高度化和充分的屏蔽效果得以实现。
本发明提供一种模块部件,它包括安装有由电子部件构成的安装部件的电路基板、具有和所述电路基板相同外形并用第一树脂密封该安装部件的密封体、以及覆盖该密封体的表面和所述电路基板的侧面的金属膜,其中,在所述电路基板的表层面的最外周上形成接地图形,并且使所述金属膜和所述接地图形的侧面端部导通。
此外,提供一种模块部件,它包括安装有由电子部件构成的安装部件的电路基板、具有和所述电路基板相同外形并用第一树脂密封该安装部件的密封体、以及覆盖该密封体的表面和所述电路基板的侧面的金属膜,其中,所述密封体具有与要求的电路块相对应的分割槽,在所述分割槽的底面和侧面中的至少一个中所述金属膜和所述电路基板的接地图形连接。
附图说明
图1是本发明的第一实施例的模块部件的透视图;
图2是本发明的第一实施例的模块部件沿A-A’的剖面图;
图3是本发明的第一实施例的模块部件的另一示例的剖面图;
图4是本发明的第二实施例的模块部件的透视图;
图5是本发明的第二实施例的模块部件沿A-A’的剖面图;
图6是本发明的第二实施例的模块部件的另一示例的剖面图;
图7是传统的模块部件的透视图。
具体实施方式
下面参照附图对本发明的实施例进行说明。
此外,附图作为示意图,并没有以恰当的尺寸表示各位置。
(第一实施例)
使用图1和图2对本发明的第一实施例的模块部件进行说明。电路基板10由多层衬底构成。
在该多层衬底中,经至少2层以上的布线层形成有电源、接地、高频等的电路图形。
在该电路基板10的表面上安装有电阻器、电容器、线圈、软半导体、晶体振荡器等的安装部件30。这些部件的连接通过使用无铅软钎料而进行。此外,也可以使用导电性粘接剂进行连接。可以使用公知的导电性粘接剂。在该电路基板10的背面上形成有用于和母基板(未示出)连接的电极11。将用于覆盖该安装部件30的由作为第1树脂的环氧类树脂形成的密封体40形成为和电路基板10具有相同的外形。此外,在该密封体40的表面和电路基板10的侧面上形成有金属膜20。该金属膜20与形成在电路基板10的表面的最外周的4侧边上的第1接地图形50相连接。通过该构成、电路基板10除了背面上的电极11以外全部由金属膜20覆盖。结果,可以获得可靠的屏蔽效果。如图2所示,可以使形成在电路基板10的表层上的接地图形50和金属膜20连接。如图3所示,还可以使形成在电路基板10的背面的外周部上的接地图形12的侧面端部和金属膜20连接。此外,当金属膜20的厚度为约1μm或1μm以上时就可以获得充分的屏蔽效果。该金属膜20通过在密封体40的表面上形成铜等的无电解镀层之后再在其表面上覆盖一电镀层而形成。如此可以将该金属膜20制成为致密的金属膜。结果,因为可以降低和接地图形50的接触电阻,所以可以通过稳定在密封体40上形成的金属膜20的接地电位而提高屏蔽效果。
如图2和3所示,构成为用金属膜20所覆盖的密封体40的投影面积和电路基板10的投影面积相等。
因为在密封体40和电路基板10之间没有台阶,所以可以使通过无电解镀和电镀所形成的金属膜20均匀地紧密接触。结果可以防止密封体40和接地图形50的剥离。如此,将在电路基板10上形成的接地图形50和形成在密封体40上的金属膜20连接。由此,可以可靠地屏蔽在电路基板10上所形成的由安装部件30所构成的电路。
(第二实施例)
在第二实施例的模块部件中,与第一实施例中相同构成的部件以相同的标号表示。
如图4所示,由金属膜20所覆盖的密封体40被由第二树脂所形成的密封体70分割成3个块。在如图5所示的电路基板10上,经至少2层以上的布线层形成有第一实施例中所述的电源、接地、高频等的电路图形。在电路基板10的表面的外周部上形成有第1接地图形50。此外,在该电路基板10的表面上安装有电阻器、电容器、线圈、半导体、晶体振荡器等的安装部件30。并形成用于覆盖该安装部件30的和电路基板10具有相同的外形的密封体40。此外,在密封体40上形成有用于分割成所希望的电路块的分割槽60。
在密封体40和分割槽60的表面上,将金属膜20形成为和接地图形50的表面连接。
此外,在形成在分割槽60中的金属膜20上,形成有由第2树脂所构成的密封体70。
如此设置将安装部件30分割成所要求的电路块的分割槽60,然后将这些用密封体40覆盖。在各电路块的表面上,设置金属膜20以与第1接地图形50相连接。如此可以在所要求的电路块之间进行电屏蔽。结果,由于在具有多个电路块的模块部件之间没有电噪声干扰,所以可以将模块部件小型化。此外,在分割槽60中形成有由第二树脂所形成的密封体70。结果,即使是通过降低高度而形成的厚度较薄的模块部件,也可以具有足够的弯曲强度以及保持较小的弯曲。而且,由于可以确保在金属膜20和接地图形50之间的连接可靠性,可以提高屏蔽性能。图6示出了其中金属膜20构成为和形成于电路基板10内部的接地图形连接的示例。在该情况下,可以屏蔽在电路基板10内部形成的电路图形的一部分。结果与图5的示例相比可以进一步提高屏蔽效果。
此外,由第三树脂所形成的密封体13设置在电路基板10和由电子元件所构成的安装部件30之间的间隙中。如此,通过排除存在于所述间隙中的空气,可以进一步地提高可靠性。
而且,本发明的由第一树脂、第二树脂、第三树脂所形成的各密封体可以相同也可以不同。作为其组成,除了环氧类的树脂以外,还可以使用包含有各种无机填料的绝缘树脂组成物。特别优选的是具有良好的耐热性以及良好的热传导性的树脂组成物。例如,可以是在硅树脂中包含氧化铝粒子的组成物。
如上所述的本发明提供了一种在电路基板上安装有由电子部件构成的安装部件、用树脂密封该安装部件的密封体、并且用金属膜覆盖该密封体的表面的模块部件,其中,在电路基板的表面的外周上形成接地图形、并且将所述金属膜和接地图形导电连接。
通过该构成,可以提供可提高屏蔽效果以及可以小型化的模块部件。

Claims (10)

1.一种模块部件,包括安装有由电子部件构成的安装部件的电路基板、具有和所述电路基板相同外形用第一树脂密封该安装部件的密封体、以及覆盖该密封体的表面和所述电路基板的侧面的金属膜,在所述电路基板的表层面的最外周上形成有接地图形,并且将所述金属膜和所述接地图形的侧面端部导电连接。
2.根据权利要求1所述的模块部件,其特征在于,在所述电路基板的外部连接面侧的最外周上形成有所述接地图形,所述金属膜和所述接地图形的侧面端部导电连接。
3.根据权利要求1所述的模块部件,其特征在于,所述金属膜具有在所述密封体上形成无电解镀层之后再在该无电解镀层上形成电镀层的结构。
4.根据权利要求1所述的模块部件,其特征在于,所述电路基板和由电子部件形成的所述安装部件通过无铅软钎料而连接。
5.根据权利要求1所述的模块部件,其特征在于,所述电路基板和由电子部件构成的所述安装部件通过导电性粘接剂而连接。
6.根据权利要求1所述的模块部件,其特征在于,所述电路基板和由电子部件构成的所述安装部件之间的间隙用第三树脂密封。
7.一种模块部件,包括安装有由电子部件构成的安装部件的电路基板、具有和所述电路基板相同外形用第一树脂密封该安装部件的密封体、以及覆盖该密封体的表面和所述电路基板的侧面的金属膜,所述密封体具有用于分割成期望的电路块的分割槽,以所述分割槽的底面和侧面中的至少一方使所述金属膜和所述电路基板的接地图形连接。
8.根据权利要求7所述的模块部件,其特征在于,所述电路块间电屏蔽。
9.根据权利要求7所述的模块部件,其特征在于,具有将所述分割槽用第二树脂密封的结构。
10.根据权利要求7所述的模块部件,其特征在于,所述金属膜具有在所述密封体上形成无电解镀层之后再在该无电解镀层上形成电镀层的结构。
CNB038015730A 2002-08-29 2003-08-25 模块部件 Expired - Fee Related CN1302542C (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2002250900A JP4178880B2 (ja) 2002-08-29 2002-08-29 モジュール部品
JP250900/2002 2002-08-29

Publications (2)

Publication Number Publication Date
CN1592966A CN1592966A (zh) 2005-03-09
CN1302542C true CN1302542C (zh) 2007-02-28

Family

ID=31972651

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB038015730A Expired - Fee Related CN1302542C (zh) 2002-08-29 2003-08-25 模块部件

Country Status (5)

Country Link
US (1) US7180012B2 (zh)
EP (1) EP1450400A4 (zh)
JP (1) JP4178880B2 (zh)
CN (1) CN1302542C (zh)
WO (1) WO2004021435A1 (zh)

Families Citing this family (87)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005317935A (ja) * 2004-03-30 2005-11-10 Matsushita Electric Ind Co Ltd モジュール部品およびその製造方法
WO2005099331A1 (ja) * 2004-03-30 2005-10-20 Matsushita Electric Industrial Co., Ltd. モジュール部品およびその製造方法
JP4552524B2 (ja) * 2004-06-10 2010-09-29 パナソニック株式会社 複合型電子部品
WO2006011320A1 (ja) * 2004-07-30 2006-02-02 Murata Manufacturing Co., Ltd. 複合型電子部品及びその製造方法
JP4494175B2 (ja) * 2004-11-30 2010-06-30 新光電気工業株式会社 半導体装置
JP4743764B2 (ja) * 2005-02-02 2011-08-10 セイコーインスツル株式会社 半導体パッケージの製造方法
JP4614278B2 (ja) * 2005-05-25 2011-01-19 アルプス電気株式会社 電子回路ユニット、及びその製造方法
JP4686304B2 (ja) * 2005-08-25 2011-05-25 日信工業株式会社 電子装置および電子装置の製造方法
US7595468B2 (en) * 2005-11-07 2009-09-29 Intel Corporation Passive thermal solution for hand-held devices
US20070163802A1 (en) * 2006-01-19 2007-07-19 Triquint Semiconductors, Inc. Electronic package including an electromagnetic shield
WO2007127348A2 (en) * 2006-04-26 2007-11-08 Ems Technologies, Inc. Planar mixed-signal circuit board
KR101349504B1 (ko) * 2007-01-30 2014-01-08 엘지이노텍 주식회사 고주파 모듈과 그 제조방법
WO2008093957A1 (en) * 2007-01-30 2008-08-07 Lg Innotek Co., Ltd High frequency module and manufacturing method thereof
KR101338563B1 (ko) 2007-01-30 2013-12-06 엘지이노텍 주식회사 고주파 모듈 제조방법
EP2043149A1 (en) * 2007-09-27 2009-04-01 Oticon A/S Assembly comprising an electromagnetically screened smd component, method of manufacturing the same and use
US7989928B2 (en) * 2008-02-05 2011-08-02 Advanced Semiconductor Engineering Inc. Semiconductor device packages with electromagnetic interference shielding
US8350367B2 (en) * 2008-02-05 2013-01-08 Advanced Semiconductor Engineering, Inc. Semiconductor device packages with electromagnetic interference shielding
US8022511B2 (en) * 2008-02-05 2011-09-20 Advanced Semiconductor Engineering, Inc. Semiconductor device packages with electromagnetic interference shielding
US8212339B2 (en) 2008-02-05 2012-07-03 Advanced Semiconductor Engineering, Inc. Semiconductor device packages with electromagnetic interference shielding
US20100308468A1 (en) * 2008-03-14 2010-12-09 Noriyuki Yoshikawa Semiconductor device and semiconductor device fabrication method
US8410584B2 (en) 2008-08-08 2013-04-02 Advanced Semiconductor Engineering, Inc. Semiconductor device packages with electromagnetic interference shielding
US20100110656A1 (en) * 2008-10-31 2010-05-06 Advanced Semiconductor Engineering, Inc. Chip package and manufacturing method thereof
US20100207257A1 (en) * 2009-02-17 2010-08-19 Advanced Semiconductor Engineering, Inc. Semiconductor package and manufacturing method thereof
US8110902B2 (en) 2009-02-19 2012-02-07 Advanced Semiconductor Engineering, Inc. Chip package and manufacturing method thereof
JP2010225620A (ja) * 2009-03-19 2010-10-07 Panasonic Corp 回路モジュール
US8212340B2 (en) 2009-07-13 2012-07-03 Advanced Semiconductor Engineering, Inc. Chip package and manufacturing method thereof
US8030750B2 (en) 2009-11-19 2011-10-04 Advanced Semiconductor Engineering, Inc. Semiconductor device packages with electromagnetic interference shielding
US8368185B2 (en) 2009-11-19 2013-02-05 Advanced Semiconductor Engineering, Inc. Semiconductor device packages with electromagnetic interference shielding
US8378466B2 (en) 2009-11-19 2013-02-19 Advanced Semiconductor Engineering, Inc. Wafer-level semiconductor device packages with electromagnetic interference shielding
TWI497679B (zh) * 2009-11-27 2015-08-21 Advanced Semiconductor Eng 半導體封裝件及其製造方法
US8569894B2 (en) 2010-01-13 2013-10-29 Advanced Semiconductor Engineering, Inc. Semiconductor package with single sided substrate design and manufacturing methods thereof
TWI411075B (zh) 2010-03-22 2013-10-01 Advanced Semiconductor Eng 半導體封裝件及其製造方法
KR101153536B1 (ko) * 2010-06-07 2012-06-11 삼성전기주식회사 고주파 패키지
TWI540698B (zh) 2010-08-02 2016-07-01 日月光半導體製造股份有限公司 半導體封裝件與其製造方法
JP5636497B2 (ja) * 2010-08-05 2014-12-03 エプコス アーゲーEpcos Ag 電磁シールド及び放熱部を有する電子デバイス集合体の製造方法,並びに電磁シールド及び放熱部を有する電子デバイス
US9007273B2 (en) 2010-09-09 2015-04-14 Advances Semiconductor Engineering, Inc. Semiconductor package integrated with conformal shield and antenna
US8822844B1 (en) * 2010-09-27 2014-09-02 Rockwell Collins, Inc. Shielding and potting for electrical circuits
KR101179399B1 (ko) * 2010-10-04 2012-09-04 삼성전기주식회사 크로스토크를 저감하기 위한 인쇄회로기판
TWI491009B (zh) * 2010-10-08 2015-07-01 晶片級電磁干擾屏蔽結構及製造方法
JP5646948B2 (ja) * 2010-10-19 2014-12-24 ローム株式会社 半導体装置
US8654537B2 (en) * 2010-12-01 2014-02-18 Apple Inc. Printed circuit board with integral radio-frequency shields
US8279625B2 (en) 2010-12-14 2012-10-02 Apple Inc. Printed circuit board radio-frequency shielding structures
US9406658B2 (en) 2010-12-17 2016-08-02 Advanced Semiconductor Engineering, Inc. Embedded component device and manufacturing methods thereof
TWI525782B (zh) * 2011-01-05 2016-03-11 矽品精密工業股份有限公司 半導體封裝件及其製法
JP5512566B2 (ja) 2011-01-31 2014-06-04 株式会社東芝 半導体装置
US9179538B2 (en) 2011-06-09 2015-11-03 Apple Inc. Electromagnetic shielding structures for selectively shielding components on a substrate
CN103025137A (zh) * 2011-09-26 2013-04-03 新科实业有限公司 电子部件模块及其制造方法
US8541883B2 (en) 2011-11-29 2013-09-24 Advanced Semiconductor Engineering, Inc. Semiconductor device having shielded conductive vias
US9620430B2 (en) 2012-01-23 2017-04-11 Taiwan Semiconductor Manufacturing Company, Ltd. Sawing underfill in packaging processes
JP2013161831A (ja) * 2012-02-01 2013-08-19 Mitsumi Electric Co Ltd 電子モジュール及びその製造方法
US9030841B2 (en) * 2012-02-23 2015-05-12 Apple Inc. Low profile, space efficient circuit shields
JP5703245B2 (ja) 2012-02-28 2015-04-15 株式会社東芝 無線装置、それを備えた情報処理装置および記憶装置
US8937376B2 (en) 2012-04-16 2015-01-20 Advanced Semiconductor Engineering, Inc. Semiconductor packages with heat dissipation structures and related methods
US8786060B2 (en) 2012-05-04 2014-07-22 Advanced Semiconductor Engineering, Inc. Semiconductor package integrated with conformal shield and antenna
US8704341B2 (en) 2012-05-15 2014-04-22 Advanced Semiconductor Engineering, Inc. Semiconductor packages with thermal dissipation structures and EMI shielding
US8653634B2 (en) 2012-06-11 2014-02-18 Advanced Semiconductor Engineering, Inc. EMI-shielded semiconductor devices and methods of making
US9153542B2 (en) 2012-08-01 2015-10-06 Advanced Semiconductor Engineering, Inc. Semiconductor package having an antenna and manufacturing method thereof
JP5710558B2 (ja) 2012-08-24 2015-04-30 株式会社東芝 無線装置、それを備えた情報処理装置及び記憶装置
TWI448224B (zh) 2012-09-24 2014-08-01 Universal Scient Ind Shanghai 電子模組以及其製造方法
US9978688B2 (en) 2013-02-28 2018-05-22 Advanced Semiconductor Engineering, Inc. Semiconductor package having a waveguide antenna and manufacturing method thereof
US9837701B2 (en) 2013-03-04 2017-12-05 Advanced Semiconductor Engineering, Inc. Semiconductor package including antenna substrate and manufacturing method thereof
US9129954B2 (en) 2013-03-07 2015-09-08 Advanced Semiconductor Engineering, Inc. Semiconductor package including antenna layer and manufacturing method thereof
US9172131B2 (en) 2013-03-15 2015-10-27 Advanced Semiconductor Engineering, Inc. Semiconductor structure having aperture antenna
JP5576548B1 (ja) * 2013-07-10 2014-08-20 太陽誘電株式会社 回路モジュール及びその製造方法
CN103400825B (zh) 2013-07-31 2016-05-18 日月光半导体制造股份有限公司 半导体封装件及其制造方法
TWI554196B (zh) * 2013-07-31 2016-10-11 環旭電子股份有限公司 電子封裝模組及其製造方法
JP5756500B2 (ja) * 2013-08-07 2015-07-29 太陽誘電株式会社 回路モジュール
JP5517379B1 (ja) * 2013-08-19 2014-06-11 太陽誘電株式会社 回路モジュール
JP5549769B1 (ja) 2013-08-26 2014-07-16 Tdk株式会社 モジュール部品の製造方法
JP5576543B1 (ja) 2013-09-12 2014-08-20 太陽誘電株式会社 回路モジュール
US9564937B2 (en) 2013-11-05 2017-02-07 Skyworks Solutions, Inc. Devices and methods related to packaging of radio-frequency devices on ceramic substrates
JP5779265B2 (ja) * 2014-03-25 2015-09-16 株式会社東芝 半導体装置
US9232686B2 (en) * 2014-03-27 2016-01-05 Intel Corporation Thin film based electromagnetic interference shielding with BBUL/coreless packages
US10729001B2 (en) 2014-08-31 2020-07-28 Skyworks Solutions, Inc. Devices and methods related to metallization of ceramic substrates for shielding applications
TWI611533B (zh) * 2014-09-30 2018-01-11 矽品精密工業股份有限公司 半導體封裝件及其製法
WO2016121491A1 (ja) * 2015-01-30 2016-08-04 株式会社村田製作所 電子回路モジュール
CN204632754U (zh) 2015-03-18 2015-09-09 新科实业有限公司 电子部件模块
US9437576B1 (en) * 2015-03-23 2016-09-06 Advanced Semiconductor Engineering, Inc. Semiconductor device package and method of manufacturing the same
CN107710406B (zh) * 2015-06-04 2020-10-16 株式会社村田制作所 高频模块
US9907179B2 (en) * 2016-04-25 2018-02-27 Tdk Corporation Electronic circuit package
KR102530753B1 (ko) * 2017-08-11 2023-05-10 삼성전자주식회사 전자기파를 차폐하는 반도체 패키지 및 이를 포함하는 전자 시스템
WO2020116240A1 (ja) * 2018-12-06 2020-06-11 株式会社村田製作所 モジュールおよびその製造方法
US20210045227A1 (en) * 2019-08-08 2021-02-11 At&S Austria Technologie & Systemtechnik Aktiengesellschaft Component Carrier, Method of Manufacturing the Same and Method of Shielding a Structural Feature in a Component Carrier
JP7456830B2 (ja) * 2020-03-30 2024-03-27 加賀Fei株式会社 回路モジュール
KR20220020018A (ko) * 2020-08-11 2022-02-18 삼성전기주식회사 부품 패키지 및 이에 이용되는 인쇄회로기판
US12048088B2 (en) * 2021-11-17 2024-07-23 Gn Hearing A/S Circuit board
EP4185077A1 (en) * 2021-11-17 2023-05-24 GN Hearing A/S Circuit board

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08264671A (ja) * 1995-03-27 1996-10-11 Sumise Device:Kk パッケージの防湿装置
JPH11163583A (ja) * 1997-11-25 1999-06-18 Citizen Electronics Co Ltd 電子部品パッケージ及びその製造方法
JP2002033419A (ja) * 2000-07-14 2002-01-31 Sharp Corp 高周波モジュールおよび高周波モジュールの製造方法

Family Cites Families (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6020538A (ja) * 1983-07-15 1985-02-01 Hitachi Ltd 半導体装置
JPH0773123B2 (ja) * 1986-09-26 1995-08-02 富士通株式会社 半導体装置
JPH0720003B2 (ja) * 1987-12-07 1995-03-06 富士通株式会社 回路装置
JPH03179796A (ja) * 1989-12-07 1991-08-05 Matsushita Electric Ind Co Ltd ハイブリッド集積回路
FR2666190B1 (fr) * 1990-08-24 1996-07-12 Thomson Csf Procede et dispositif d'encapsulation hermetique de composants electroniques.
JPH07114317B2 (ja) * 1991-07-05 1995-12-06 株式会社東芝 電子機器のシールド構造
US5541448A (en) * 1991-10-16 1996-07-30 Texas Instruments Inc. Electronic circuit card
US5311059A (en) * 1992-01-24 1994-05-10 Motorola, Inc. Backplane grounding for flip-chip integrated circuit
US5355016A (en) * 1993-05-03 1994-10-11 Motorola, Inc. Shielded EPROM package
US5601675A (en) * 1994-12-06 1997-02-11 International Business Machines Corporation Reworkable electronic apparatus having a fusible layer for adhesively attached components, and method therefor
JPH08264871A (ja) 1995-03-20 1996-10-11 Fujitsu Ltd 多波長一括光増幅装置
JPH08288686A (ja) * 1995-04-20 1996-11-01 Nec Corp 半導体装置
US5600181A (en) * 1995-05-24 1997-02-04 Lockheed Martin Corporation Hermetically sealed high density multi-chip package
US5694300A (en) * 1996-04-01 1997-12-02 Northrop Grumman Corporation Electromagnetically channelized microwave integrated circuit
JP3082905B2 (ja) * 1997-01-28 2000-09-04 富士通電装株式会社 チップ・オン・ボード遮蔽構造およびその製造方法
JP2001244688A (ja) * 2000-02-28 2001-09-07 Kyocera Corp 高周波モジュール部品及びその製造方法
JP2001339016A (ja) * 2000-05-30 2001-12-07 Alps Electric Co Ltd 面実装型電子回路ユニット
US6518089B2 (en) * 2001-02-02 2003-02-11 Texas Instruments Incorporated Flip chip semiconductor device in a molded chip scale package (CSP) and method of assembly
JP4662324B2 (ja) * 2002-11-18 2011-03-30 太陽誘電株式会社 回路モジュール

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH08264671A (ja) * 1995-03-27 1996-10-11 Sumise Device:Kk パッケージの防湿装置
JPH11163583A (ja) * 1997-11-25 1999-06-18 Citizen Electronics Co Ltd 電子部品パッケージ及びその製造方法
JP2002033419A (ja) * 2000-07-14 2002-01-31 Sharp Corp 高周波モジュールおよび高周波モジュールの製造方法

Also Published As

Publication number Publication date
JP2004095607A (ja) 2004-03-25
WO2004021435A1 (ja) 2004-03-11
EP1450400A1 (en) 2004-08-25
US20040252475A1 (en) 2004-12-16
US7180012B2 (en) 2007-02-20
EP1450400A4 (en) 2005-08-17
CN1592966A (zh) 2005-03-09
JP4178880B2 (ja) 2008-11-12

Similar Documents

Publication Publication Date Title
CN1302542C (zh) 模块部件
US7161252B2 (en) Module component
US5414220A (en) Flexible wiring cable
KR100455015B1 (ko) 전자기장애/고주파간섭방해로부터전자소자를차폐하는리드어셈블리
CN100454533C (zh) 用于电子元件封装的emi屏蔽
CN1659942A (zh) 具有增强热耗散的板级emi屏蔽
CN1926682A (zh) 具有集成emi和rfi屏蔽的包覆成型半导体封装
KR20060134998A (ko) 제어 장치
US20020075630A1 (en) Capacitor with extended surface lands and method of fabrication therefor
KR100605453B1 (ko) 전자파 장애 차단 필터
JPH08279667A (ja) フレキシブル基板
CN1694601A (zh) 电子设备内部的电子元件组装装置
KR100698570B1 (ko) 전자파 간섭을 감소시키는 패키지 디바이스
JP3070262B2 (ja) 多層フレキシブル実装基板
JP2004056155A (ja) モジュール部品
WO2022168478A1 (ja) モジュール
JP2598344B2 (ja) 両面実装基板用リードレスパッケージケース
JPH06224528A (ja) 両面フィルム基板及びその製造方法
JPH06125191A (ja) シールド部品
JPH02135764A (ja) 電子部品搭載用基板
KR20060018545A (ko) 전자기파 차폐된 연성인쇄회로기판
JPH05136593A (ja) シールド構造
KR200157893Y1 (ko) 경연성 다층 인쇄회로기판
JPH08316592A (ja) 回路基板及びその製造方法
JP2827950B2 (ja) 混成集積回路装置

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20070228

Termination date: 20150825

EXPY Termination of patent right or utility model