JP6602332B2 - 半導体装置の製造方法、基板処理装置およびプログラム - Google Patents
半導体装置の製造方法、基板処理装置およびプログラム Download PDFInfo
- Publication number
- JP6602332B2 JP6602332B2 JP2017062545A JP2017062545A JP6602332B2 JP 6602332 B2 JP6602332 B2 JP 6602332B2 JP 2017062545 A JP2017062545 A JP 2017062545A JP 2017062545 A JP2017062545 A JP 2017062545A JP 6602332 B2 JP6602332 B2 JP 6602332B2
- Authority
- JP
- Japan
- Prior art keywords
- gas
- processing chamber
- substrate
- supplying
- exhausting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H10P14/6339—
-
- H10P14/43—
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
- C23C16/40—Oxides
- C23C16/405—Oxides of refractory metals or yttrium
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4412—Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45578—Elongated nozzles, tubes with holes
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
-
- H10P14/6512—
-
- H10P14/69392—
-
- H10P14/69395—
-
- H10P72/04—
-
- H10P72/0402—
-
- H10P72/12—
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/01—Manufacture or treatment
- H10B12/02—Manufacture or treatment for one transistor one-capacitor [1T-1C] memory cells
- H10B12/03—Making the capacitor or connections thereto
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Inorganic Chemistry (AREA)
- Formation Of Insulating Films (AREA)
- Chemical Vapour Deposition (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017062545A JP6602332B2 (ja) | 2017-03-28 | 2017-03-28 | 半導体装置の製造方法、基板処理装置およびプログラム |
| KR1020180009177A KR102019955B1 (ko) | 2017-03-28 | 2018-01-25 | 반도체 장치의 제조 방법, 기록 매체 및 기판 처리 장치 |
| CN201810166993.8A CN108660437B (zh) | 2017-03-28 | 2018-02-28 | 半导体器件的制造方法、记录介质及衬底处理装置 |
| US15/933,104 US10707074B2 (en) | 2017-03-28 | 2018-03-22 | Method for manufacturing semiconductor device, non-transitory computer-readable recording medium, and substrate processing apparatus |
| US16/887,527 US10910217B2 (en) | 2017-03-28 | 2020-05-29 | Method for manufacturing semiconductor device, non-transitory computer-readable recording medium, and substrate processing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017062545A JP6602332B2 (ja) | 2017-03-28 | 2017-03-28 | 半導体装置の製造方法、基板処理装置およびプログラム |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2018166142A JP2018166142A (ja) | 2018-10-25 |
| JP2018166142A5 JP2018166142A5 (cg-RX-API-DMAC10.html) | 2018-12-13 |
| JP6602332B2 true JP6602332B2 (ja) | 2019-11-06 |
Family
ID=63670766
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2017062545A Active JP6602332B2 (ja) | 2017-03-28 | 2017-03-28 | 半導体装置の製造方法、基板処理装置およびプログラム |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US10707074B2 (cg-RX-API-DMAC10.html) |
| JP (1) | JP6602332B2 (cg-RX-API-DMAC10.html) |
| KR (1) | KR102019955B1 (cg-RX-API-DMAC10.html) |
| CN (1) | CN108660437B (cg-RX-API-DMAC10.html) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10490431B2 (en) * | 2017-03-10 | 2019-11-26 | Yield Engineering Systems, Inc. | Combination vacuum and over-pressure process chamber and methods related thereto |
| JP6602332B2 (ja) * | 2017-03-28 | 2019-11-06 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6965942B2 (ja) * | 2017-12-22 | 2021-11-10 | 株式会社村田製作所 | 成膜装置 |
| JP6988916B2 (ja) | 2017-12-22 | 2022-01-05 | 株式会社村田製作所 | 成膜装置 |
| JP7055075B2 (ja) * | 2018-07-20 | 2022-04-15 | 東京エレクトロン株式会社 | 熱処理装置及び熱処理方法 |
| US11703229B2 (en) * | 2018-12-05 | 2023-07-18 | Yi-Ming Hung | Temperature adjustment apparatus for high temperature oven |
| KR102685903B1 (ko) * | 2019-02-27 | 2024-07-16 | 가부시키가이샤 코쿠사이 엘렉트릭 | 반도체 장치의 제조 방법, 기판 처리 장치 및 기록 매체 |
| CN113519041B (zh) | 2019-03-20 | 2024-04-16 | 株式会社国际电气 | 基板处理装置、反应容器、半导体器件的制造方法以及记录介质 |
| JP7236922B2 (ja) | 2019-04-26 | 2023-03-10 | 東京エレクトロン株式会社 | 熱処理装置、熱処理方法及び成膜方法 |
| CN114207183A (zh) * | 2019-08-20 | 2022-03-18 | 株式会社国际电气 | 基板处理装置、半导体器件的制造方法、程序以及记录介质 |
| EP4075480A4 (en) * | 2019-12-09 | 2024-01-10 | Kokusai Electric Corp. | Semiconductor device manufacturing method, substrate treatment device, and program |
| JP7432373B2 (ja) * | 2020-01-23 | 2024-02-16 | 株式会社Kokusai Electric | 反応管の洗浄方法、半導体装置の製造方法、及び基板処理装置 |
| JP7203070B2 (ja) * | 2020-09-23 | 2023-01-12 | 株式会社Kokusai Electric | 基板処理装置、基板処理方法及び半導体装置の製造方法 |
| JP7271485B2 (ja) | 2020-09-23 | 2023-05-11 | 株式会社Kokusai Electric | 基板処理装置、半導体装置の製造方法およびプログラム |
| JP7284139B2 (ja) * | 2020-11-27 | 2023-05-30 | 株式会社Kokusai Electric | 半導体装置の製造方法、プログラム、基板処理装置および基板処理方法 |
Family Cites Families (108)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5961920A (ja) * | 1982-10-01 | 1984-04-09 | Agency Of Ind Science & Technol | 薄膜製造方法およびその装置 |
| JP2008078448A (ja) * | 2006-09-22 | 2008-04-03 | Hitachi Kokusai Electric Inc | 基板処理装置 |
| WO2009037991A1 (ja) * | 2007-09-19 | 2009-03-26 | Hitachi Kokusai Electric Inc. | クリーニング方法及び基板処理装置 |
| JP2009076590A (ja) * | 2007-09-19 | 2009-04-09 | Hitachi Kokusai Electric Inc | クリーニング方法 |
| JP4994197B2 (ja) * | 2007-11-16 | 2012-08-08 | 株式会社日立国際電気 | 半導体装置の製造方法及び基板処理装置 |
| US20090197424A1 (en) * | 2008-01-31 | 2009-08-06 | Hitachi Kokusai Electric Inc. | Substrate processing apparatus and method for manufacturing semiconductor device |
| JP5284182B2 (ja) * | 2008-07-23 | 2013-09-11 | 株式会社日立国際電気 | 基板処理装置および半導体装置の製造方法 |
| JP5384291B2 (ja) * | 2008-11-26 | 2014-01-08 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法及び基板処理装置 |
| JP4988902B2 (ja) * | 2009-07-31 | 2012-08-01 | 株式会社日立国際電気 | 半導体デバイスの製造方法及び基板処理装置 |
| JP5813303B2 (ja) * | 2009-11-20 | 2015-11-17 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法および基板処理装置 |
| US20120280369A1 (en) * | 2009-12-18 | 2012-11-08 | Hitachi Kokusai Electric Inc. | Method for manufacturing semiconductor device, substrate processing apparatus, and semiconductor device |
| KR101366000B1 (ko) * | 2010-03-08 | 2014-02-21 | 가부시키가이샤 히다치 고쿠사이 덴키 | 반도체 장치의 제조 방법 및 기판 처리 장치 |
| JP5651451B2 (ja) * | 2010-03-16 | 2015-01-14 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法及び基板処理装置 |
| WO2011125395A1 (ja) * | 2010-04-09 | 2011-10-13 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法および基板処理装置 |
| JP5654862B2 (ja) * | 2010-04-12 | 2015-01-14 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法及び基板処理装置 |
| JP5572447B2 (ja) * | 2010-05-25 | 2014-08-13 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法及び基板処理装置 |
| JP5692842B2 (ja) * | 2010-06-04 | 2015-04-01 | 株式会社日立国際電気 | 半導体装置の製造方法及び基板処理装置 |
| JP5751895B2 (ja) * | 2010-06-08 | 2015-07-22 | 株式会社日立国際電気 | 半導体装置の製造方法、クリーニング方法および基板処理装置 |
| JP5545055B2 (ja) * | 2010-06-15 | 2014-07-09 | 東京エレクトロン株式会社 | 支持体構造及び処理装置 |
| JP5687547B2 (ja) * | 2010-06-28 | 2015-03-18 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法および基板処理装置 |
| JP5524785B2 (ja) * | 2010-09-21 | 2014-06-18 | 株式会社日立国際電気 | 半導体装置の製造方法及び基板処理装置 |
| KR101573733B1 (ko) * | 2010-11-29 | 2015-12-04 | 가부시키가이샤 히다치 고쿠사이 덴키 | 반도체 장치의 제조 방법, 기판 처리 방법 및 기판 처리 장치 |
| JP5847566B2 (ja) * | 2011-01-14 | 2016-01-27 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
| US9123530B2 (en) * | 2011-03-23 | 2015-09-01 | Hitachi Kokusai Electric Inc. | Method of manufacturing semiconductor device, substrate processing method and substrate processing apparatus |
| JP5959307B2 (ja) * | 2011-06-22 | 2016-08-02 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
| JP5722450B2 (ja) * | 2011-08-25 | 2015-05-20 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置および記録媒体 |
| JP6022228B2 (ja) * | 2011-09-14 | 2016-11-09 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
| KR101628211B1 (ko) * | 2011-10-14 | 2016-06-08 | 가부시키가이샤 히다치 고쿠사이 덴키 | 반도체 장치의 제조 방법, 기판 처리 방법, 기판 처리 장치 및 기록 매체 |
| JP6043546B2 (ja) * | 2011-10-21 | 2016-12-14 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
| JP6039996B2 (ja) * | 2011-12-09 | 2016-12-07 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
| JP6049395B2 (ja) * | 2011-12-09 | 2016-12-21 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
| JP5869923B2 (ja) * | 2012-03-09 | 2016-02-24 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
| JP6035161B2 (ja) * | 2012-03-21 | 2016-11-30 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
| JP6105967B2 (ja) * | 2012-03-21 | 2017-03-29 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
| JP6101113B2 (ja) * | 2012-03-30 | 2017-03-22 | 株式会社日立国際電気 | 半導体装置の製造方法、クリーニング方法および基板処理装置並びにプログラム |
| JP6156972B2 (ja) * | 2012-04-06 | 2017-07-05 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置、気化システムおよびミストフィルタ |
| JP5959907B2 (ja) * | 2012-04-12 | 2016-08-02 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
| JP6047039B2 (ja) * | 2012-04-20 | 2016-12-21 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
| JP5920242B2 (ja) * | 2012-06-02 | 2016-05-18 | 東京エレクトロン株式会社 | 成膜方法及び成膜装置 |
| JP6030378B2 (ja) * | 2012-08-14 | 2016-11-24 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
| JP6007031B2 (ja) * | 2012-08-23 | 2016-10-12 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6009870B2 (ja) * | 2012-09-11 | 2016-10-19 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法、基板処理装置およびプログラム |
| JP6022272B2 (ja) * | 2012-09-14 | 2016-11-09 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6022274B2 (ja) * | 2012-09-18 | 2016-11-09 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6055637B2 (ja) * | 2012-09-20 | 2016-12-27 | 株式会社日立国際電気 | クリーニング方法、半導体装置の製造方法、基板処理装置及びプログラム |
| JP6022276B2 (ja) * | 2012-09-20 | 2016-11-09 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6068130B2 (ja) * | 2012-12-25 | 2017-01-25 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6078335B2 (ja) * | 2012-12-27 | 2017-02-08 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法、気化システム、気化器およびプログラム |
| JP6222833B2 (ja) * | 2013-01-30 | 2017-11-01 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法およびプログラム |
| JP6129573B2 (ja) * | 2013-02-13 | 2017-05-17 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6035166B2 (ja) * | 2013-02-26 | 2016-11-30 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6125279B2 (ja) * | 2013-03-05 | 2017-05-10 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6111097B2 (ja) * | 2013-03-12 | 2017-04-05 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6155063B2 (ja) * | 2013-03-19 | 2017-06-28 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置及びプログラム |
| JP6112928B2 (ja) * | 2013-03-19 | 2017-04-12 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置及びプログラム |
| JP6111106B2 (ja) * | 2013-03-19 | 2017-04-05 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP5864637B2 (ja) * | 2013-03-19 | 2016-02-17 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置、プログラム及び記録媒体 |
| JP6245643B2 (ja) * | 2013-03-28 | 2017-12-13 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6159143B2 (ja) * | 2013-05-10 | 2017-07-05 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP5998101B2 (ja) * | 2013-05-24 | 2016-09-28 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置及びプログラム |
| JP6170754B2 (ja) * | 2013-06-18 | 2017-07-26 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6154215B2 (ja) * | 2013-06-28 | 2017-06-28 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6242095B2 (ja) * | 2013-06-28 | 2017-12-06 | 株式会社日立国際電気 | クリーニング方法、半導体装置の製造方法、基板処理装置及びプログラム |
| JP5788448B2 (ja) * | 2013-09-09 | 2015-09-30 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置及びプログラム |
| JP5864503B2 (ja) * | 2013-09-30 | 2016-02-17 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置、プログラム及び記録媒体 |
| JP6068661B2 (ja) * | 2013-09-30 | 2017-01-25 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置、基板処理システム及びプログラム |
| JP5847783B2 (ja) * | 2013-10-21 | 2016-01-27 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置、プログラム及び記録媒体 |
| JP2015103729A (ja) * | 2013-11-27 | 2015-06-04 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6247095B2 (ja) * | 2013-12-27 | 2017-12-13 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6254848B2 (ja) * | 2014-01-10 | 2017-12-27 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP5852147B2 (ja) * | 2014-01-23 | 2016-02-03 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置、プログラム及び記録媒体 |
| KR101863477B1 (ko) * | 2014-03-13 | 2018-05-31 | 가부시키가이샤 히다치 고쿠사이 덴키 | 반도체 장치의 제조 방법, 기판 처리 장치 및 기록 매체 |
| JP6123021B2 (ja) * | 2014-03-18 | 2017-04-26 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置及びプログラム |
| JP6307318B2 (ja) * | 2014-03-24 | 2018-04-04 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法及びプログラム |
| JP6320129B2 (ja) * | 2014-04-02 | 2018-05-09 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP5886366B2 (ja) * | 2014-06-04 | 2016-03-16 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置、プログラムおよび記録媒体 |
| JP5886381B2 (ja) * | 2014-07-23 | 2016-03-16 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置、プログラムおよび記録媒体 |
| WO2016027369A1 (ja) * | 2014-08-22 | 2016-02-25 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置および記録媒体 |
| JP5840268B1 (ja) * | 2014-08-25 | 2016-01-06 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法および記録媒体 |
| WO2016042663A1 (ja) * | 2014-09-19 | 2016-03-24 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置および記録媒体 |
| JP5968996B2 (ja) | 2014-12-18 | 2016-08-10 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法およびプログラム |
| CN107112235B (zh) * | 2015-01-07 | 2020-11-20 | 株式会社国际电气 | 半导体器件的制造方法、衬底处理装置及记录介质 |
| US9576811B2 (en) * | 2015-01-12 | 2017-02-21 | Lam Research Corporation | Integrating atomic scale processes: ALD (atomic layer deposition) and ALE (atomic layer etch) |
| JP6470057B2 (ja) * | 2015-01-29 | 2019-02-13 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6470060B2 (ja) * | 2015-01-30 | 2019-02-13 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6109224B2 (ja) * | 2015-03-30 | 2017-04-05 | 株式会社日立国際電気 | 半導体装置の製造方法、プログラムおよび基板処理装置 |
| JP6126155B2 (ja) * | 2015-03-31 | 2017-05-10 | 株式会社日立国際電気 | 半導体装置の製造方法、プログラムおよび基板処理装置 |
| JP6230573B2 (ja) * | 2015-07-06 | 2017-11-15 | 株式会社日立国際電気 | 半導体装置の製造方法、プログラム、基板処理システム及び基板処理装置 |
| WO2017009997A1 (ja) * | 2015-07-16 | 2017-01-19 | 株式会社日立国際電気 | 基板処理装置、半導体装置の製造方法及び気化システム |
| JP6153975B2 (ja) * | 2015-08-07 | 2017-06-28 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理システム、プログラム、記録媒体および基板処理装置 |
| KR102021708B1 (ko) * | 2015-09-17 | 2019-09-16 | 가부시키가이샤 코쿠사이 엘렉트릭 | 반도체 장치의 제조 방법, 기판 처리 장치 및 기록 매체 |
| JP6419982B2 (ja) * | 2015-09-30 | 2018-11-07 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置および記録媒体 |
| JP6163524B2 (ja) * | 2015-09-30 | 2017-07-12 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6329199B2 (ja) * | 2016-03-30 | 2018-05-23 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6318188B2 (ja) * | 2016-03-30 | 2018-04-25 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6529927B2 (ja) * | 2016-04-15 | 2019-06-12 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置、およびプログラム |
| JP6568508B2 (ja) * | 2016-09-14 | 2019-08-28 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置、およびプログラム |
| US10691145B2 (en) * | 2016-10-03 | 2020-06-23 | Applied Materials, Inc. | Multi-channel flow ratio controller and processing chamber |
| JP6689179B2 (ja) * | 2016-11-30 | 2020-04-28 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置、およびプログラム |
| JP6567489B2 (ja) * | 2016-12-27 | 2019-08-28 | 株式会社Kokusai Electric | 基板処理装置、半導体装置の製造方法及びプログラム |
| JP6814057B2 (ja) * | 2017-01-27 | 2021-01-13 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置、およびプログラム |
| JP6857503B2 (ja) * | 2017-02-01 | 2021-04-14 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6817845B2 (ja) * | 2017-02-22 | 2021-01-20 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6703496B2 (ja) * | 2017-03-27 | 2020-06-03 | 株式会社Kokusai Electric | 基板処理装置、半導体装置の製造方法およびプログラム |
| JP6602332B2 (ja) * | 2017-03-28 | 2019-11-06 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置およびプログラム |
| CN108695138A (zh) * | 2017-03-29 | 2018-10-23 | 株式会社日立国际电气 | 衬底支承件、衬底处理装置及半导体器件的制造方法 |
| JP6842988B2 (ja) * | 2017-05-19 | 2021-03-17 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6830878B2 (ja) * | 2017-09-28 | 2021-02-17 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置、プログラム |
-
2017
- 2017-03-28 JP JP2017062545A patent/JP6602332B2/ja active Active
-
2018
- 2018-01-25 KR KR1020180009177A patent/KR102019955B1/ko active Active
- 2018-02-28 CN CN201810166993.8A patent/CN108660437B/zh active Active
- 2018-03-22 US US15/933,104 patent/US10707074B2/en active Active
-
2020
- 2020-05-29 US US16/887,527 patent/US10910217B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US10910217B2 (en) | 2021-02-02 |
| KR20190049334A (ko) | 2019-05-09 |
| US10707074B2 (en) | 2020-07-07 |
| KR102019955B1 (ko) | 2019-09-09 |
| CN108660437B (zh) | 2021-04-09 |
| US20200294790A1 (en) | 2020-09-17 |
| JP2018166142A (ja) | 2018-10-25 |
| CN108660437A (zh) | 2018-10-16 |
| US20180286662A1 (en) | 2018-10-04 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP6602332B2 (ja) | 半導体装置の製造方法、基板処理装置およびプログラム | |
| JP6222833B2 (ja) | 基板処理装置、半導体装置の製造方法およびプログラム | |
| US12365987B2 (en) | Method of processing substrate, method of manufacturing semiconductor device, substrate processing apparatus, and recording medium | |
| US20170047227A1 (en) | Method of Manufacturing Semiconductor Device | |
| US10388512B2 (en) | Method of manufacturing semiconductor device, substrate processing apparatus, and recording medium | |
| WO2013054652A1 (ja) | 基板処理装置、基板処理方法、半導体装置の製造方法、および記録媒体 | |
| JP6147480B2 (ja) | 半導体装置の製造方法、基板処理装置およびプログラム | |
| JP2017005016A (ja) | 半導体装置の製造方法、基板処理装置およびプログラム | |
| TWI788683B (zh) | 基板處理裝置、基板支撐具、半導體裝置的製造方法及程式 | |
| US20200411330A1 (en) | Method of manufacturing semiconductor device, substrate processing apparatus, and recording medium | |
| JP7079340B2 (ja) | 半導体装置の製造方法、基板処理装置、及びプログラム | |
| US12424437B2 (en) | Processing method, method of manufacturing semiconductor device, processing apparatus, and recording medium | |
| JPWO2018055674A1 (ja) | 半導体装置の製造方法、基板処理装置およびプログラム | |
| US20250305143A1 (en) | Method of processing substrate, method of manufacturing semiconductor device, recording medium, and substrate processing apparatus | |
| US20250104998A1 (en) | Processing method, method of manufacturing semiconductor device, processing apparatus, and recording medium | |
| US20250011925A1 (en) | Substrate processing apparatus, processing vessel, and method of manufacturing semiconductor device | |
| CN116779534A (zh) | 衬底处理方法、半导体器件的制造方法、记录介质及衬底处理装置 | |
| JPWO2020175427A1 (ja) | 半導体装置の製造方法、基板処理装置およびプログラム |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A712 Effective date: 20180727 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20180820 |
|
| RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20180829 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20180912 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20180912 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20190718 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20190723 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20190904 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20190913 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20191008 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 6602332 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |