JP5702049B2 - 位相分解光学周波数領域画像化を行うための装置、方法及びシステム - Google Patents
位相分解光学周波数領域画像化を行うための装置、方法及びシステム Download PDFInfo
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Images
Classifications
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
- A61B5/0073—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence by tomography, i.e. reconstruction of 3D images from 2D projections
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B5/00—Measuring for diagnostic purposes; Identification of persons
- A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
- A61B5/0062—Arrangements for scanning
- A61B5/0066—Optical coherence imaging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/41—Refractivity; Phase-affecting properties, e.g. optical path length
- G01N21/45—Refractivity; Phase-affecting properties, e.g. optical path length using interferometric methods; using Schlieren methods
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/4795—Scattering, i.e. diffuse reflection spatially resolved investigating of object in scattering medium
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
- G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B2560/00—Constructional details of operational features of apparatus; Accessories for medical measuring apparatus
- A61B2560/02—Operational features
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- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
Description
と書き、正規化した深さ因子Γz=z/zNyを用いると、タイミング起因性の位相誤差は下式で記述できる。
(1)各測定AラインのDFT、ai,j=DFT(Si,j)の測定及び計算 −ステップ370。
(2)角度φi,j=unwrap(angle(ai,j))の測定及び計算、ここでunwarp(位相接続)は、ディメンジョンjに沿って行う標準的な位相接続法のアルゴリズムである。―ステップ375。
(3)隣接Aライン間の位相差、Δφi,j=φi,j−φi,j−1の測定及び計算 ―ステップ380。
(4)補正済み位相差Δφ’i,jについての、Δφ’i,j=Δφi,j−(i/k)Δφk,j(ここで、「k」は較正ミラー信号の深度指数である)による決定/計算 −ステップ385。
Claims (5)
- 放射を提供する1つ以上の第1装置であって、該放射がサンプルに向かう少なくとも1つの第1電磁放射及び参照部に向かう少なくとも1つの第2電磁放射を含み、時間経過につれて周波数が変化する前記放射を提供する第1装置と、
前記少なくとも1つの第1電磁放射に関連した1つ以上の第3電磁放射と、前記少なくとも1つの第2電磁放射に関連した1つ以上の第4電磁放射との間の干渉を検出するように構成された1つ以上の第2装置と、を備え、
前記1つ以上の第2装置が、前記干渉における少なくとも1つの周波数成分の1つ以上の位相に関連した特定の信号を得るように構成されて、該特定の信号を、少なくとも1つの特定の情報と比較する機能を有し、
前記1つ以上の第2装置は、前記干渉における少なくとも1つの別の周波数成分についての1つ以上の別位相と関連した前記特定の情報を較正信号から得るように構成され、
前記特定の信号は、前記サンプルについての連続したAライン間での位相差に基づくものであり、
前記特定の情報は、前記較正信号から得られた連続したAライン間での位相差である装置。 - 放射を提供する1つ以上の第1装置であって、該放射がサンプルに向かう少なくとも1つの第1電磁放射及び参照部に向かう少なくとも1つの第2電磁放射を含み、時間経過につれて周波数が変化する前記放射を提供する第1装置と、
前記少なくとも1つの第1電磁放射に関連した1つ以上の第3電磁放射と、前記少なくとも1つの第2電磁放射に関連した1つ以上の第4電磁放射との間の干渉を検出するように構成された1つ以上の第2装置と、を備え、
前記1つ以上の第2装置が、前記干渉における少なくとも1つの周波数成分の1つ以上の位相に関連した特定の信号を得るように構成されて、該特定の信号を、少なくとも1つの特定の情報と比較する機能を有し、
前記1つ以上の第2装置が、前記第3電磁放射と前記第4電磁放射との間の別の干渉における少なくとも1つの別の周波数成分についての1つ以上の別位相と関連した前記特定の情報を較正信号から得るように構成され、前記別の干渉が前記干渉とは異なり、
前記干渉及び前記別の干渉が異なる時間に得られ、
前記特定の信号は、前記サンプルについての連続したAライン間での位相差に基づくものであり、
前記特定の情報は、前記較正信号から得られた連続したAライン間での位相差である装置。 - サンプルに向かう少なくとも1つの第1電磁放射及び参照部に向かう少なくとも1つの第2電磁放射を含む放射であって、時間経過につれて周波数が変化する放射を提供し、
前記少なくとも1つの第1電磁放射に関連した1つ以上の第3電磁放射と、前記少なくとも1つの第2電磁放射に関連した1つ以上の第4電磁放射との間の干渉を検出し、
前記干渉における少なくとも1つの周波数成分の1つ以上の位相に関連した特定の信号を取得し、
前記特定の信号を、少なくとも1つの特定の情報と比較し、
前記干渉における少なくとも1つの別の周波数成分についての1つ以上の別位相と関連した前記特定の情報を較正信号から得て、
前記特定の信号は、前記サンプルについての連続したAライン間での位相差に基づくものであり、
前記特定の情報は、前記較正信号から得られた連続したAライン間での位相差である方法。 - サンプルに向かう少なくとも1つの第1電磁放射及び参照部に向かう少なくとも1つの第2電磁放射を含む放射であって、時間経過につれて周波数が変化する放射を提供し、
前記少なくとも1つの第1電磁放射に関連した1つ以上の第3電磁放射と、前記少なくとも1つの第2電磁放射に関連した1つ以上の第4電磁放射との間の干渉を検出し、
前記干渉における少なくとも1つの周波数成分の1つ以上の位相に関連した特定の信号を取得し、
前記特定の信号を、少なくとも1つの特定の情報と比較し、
前記第3電磁放射と前記第4電磁放射との間の別の干渉における少なくとも1つの別の周波数成分についての1つ以上の別位相と関連した前記特定の情報を較正信号から得て、前記別の干渉が前記干渉とは異なり、
前記干渉及び前記別の干渉が異なる時間に得られ、
前記特定の信号は、前記サンプルについての連続したAライン間での位相差に基づくものであり、
前記特定の情報は、前記較正信号から得られた連続したAライン間での位相差である方法。 - サンプルから受けた放射の第1分割部と関連した少なくとも1つの第1電磁放射と、参照部から受けた放射の第2分割部との間の干渉を検出するように構成された1つ以上の装置を備え、
前記放射の周波数が時間経過につれて変化し、前記1つ以上の装置が、前記干渉における少なくとも1つの周波数成分についての1つ以上の位相に関連した特定の信号を得るように構成され、該特定の信号を少なくとも1つの特定の情報と比較する機能を有し、
前記1つ以上の装置は、前記放射の前記第1分割部と前記第2分割部との間の前記干渉に対応する前記特定の情報を較正信号から得るように構成され、前記特定の信号が、前記特定の情報の少なくとも1つの周波数成分の少なくとも1つの位相に関連し、
前記特定の信号は、前記サンプルについての連続したAライン間での位相差に基づくものであり、
前記特定の情報は、前記較正信号から得られた連続したAライン間での位相差であるシステム。
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PCT/US2006/021375 WO2006130802A2 (en) | 2005-06-01 | 2006-06-01 | Apparatus, method and system for performing phase-resolved optical frequency domain imaging |
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