JP4472991B2 - 対象の研究方法およびその光学干渉計(変型) - Google Patents
対象の研究方法およびその光学干渉計(変型) Download PDFInfo
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- JP4472991B2 JP4472991B2 JP2003568347A JP2003568347A JP4472991B2 JP 4472991 B2 JP4472991 B2 JP 4472991B2 JP 2003568347 A JP2003568347 A JP 2003568347A JP 2003568347 A JP2003568347 A JP 2003568347A JP 4472991 B2 JP4472991 B2 JP 4472991B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02011—Interferometers characterised by controlling or generating intrinsic radiation properties using temporal polarization variation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
- G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/02015—Interferometers characterised by the beam path configuration
- G01B9/02027—Two or more interferometric channels or interferometers
- G01B9/02028—Two or more reference or object arms in one interferometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B9/00—Measuring instruments characterised by the use of optical techniques
- G01B9/02—Interferometers
- G01B9/0209—Low-coherence interferometers
- G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/45—Multiple detectors for detecting interferometer signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
- G01B2290/70—Using polarization in the interferometer
Description
ν=dΔ/dt,
ν−光学長の差(Δ)の速度
λ−線源(1)の中央の波長
2 第1の光ビームスプリッター
3,22 測定腕
4,23 支持腕
5,21,24 光ビームスプリッター
6,16,25,28 第1ポート
7,11,26,29 第2ポート
8,27 対象
9,10,32,34 第3ポート
12,15,30,31 第4ポート
13,14,33,35 光受信器
17,18,36,37 光学遅延線
19,38 探針
Claims (12)
- 対象(人体を除く)を研究する方法であって、
低干渉性光学放射を形成する段階と、
前記低干渉性光学放射を第1の低干渉性光学放射のビームおよび第2の低干渉性光学放射のビームに分ける段階と、
前記第1の低干渉性光学放射のビームを測定光路に沿って伝える段階と、
前記第2の低干渉性光学放射のビームを支持光路に沿って伝える段階と、
前記測定光路を伝わって通過した低干渉性光学放射を、前記支持光路を伝わって通過した低干渉性光学放射と混合する段階と、
前記混合の結果である光学放射の干渉強度変調の少なくとも一つの信号を利用して、研究する対象についてのインフォメーションを持ち測定光路を伝わって透過した低干渉性光学放射の強度を写像する段階とを備え、
前記支持光路がループ状に形成され、
前記第1の低干渉性光学放射のビームが第3の低干渉性光学放射のビームおよび第4の低干渉性光学放射のビームに分けられ、
前記第3の低干渉性光学放射のビームが前記対象に向けられ、
前記第4の低干渉性光学放射のビームが時計回りに前記支持光路のループに向けられ、
前記第2の低干渉性光学放射のビームが反時計回りに前記支持光路のループに向けられ、
前記第3の低干渉性光学放射のビームが双方向性の測定光路を前向きおよび後ろ向きに前記測定光路に沿って伝わり、
前記対象から戻ってきた低干渉性光学放射が、反時計回りに前記支持光路を通過した前記第2の低干渉性光学放射のビームと混合され、
前記混合の結果である光学放射の部分が時計回りに前記支持光路を通過した前記第4の低干渉性光学放射のビームと混合されることを特徴とする方法。 - 光学放射線源と、第1の光ビームスプリッターと、測定腕と、支持腕と、第2の光ビームスプリッターと、少なくとも一つの光受信器とを備えた光学干渉計であって、
前記測定腕が双方向性であり、前記第2の光ビームスプリッターの一つに接続されていて、
前記支持腕が前記第1の光ビームスプリッターのポートの一つから前記第2の光ビームスプリッターのポートの一つにループ状に接続されていて、
前記第1の光ビームスプリッターが前記第2の光ビームスプリッターのポートを介して対象と光学的に結合され、
前記光ビームスプリッターのうちの少なくとも一方が前記光受信器に光学的に結合されていることを特徴とする光学干渉計。 - 該光学干渉計の少なくとも一方の腕が光学遅延線を備えることを特徴とする請求項2に記載の光学干渉計。
- 該光学干渉計の少なくとも一方の腕が位相変調器を備えることを特徴とする請求項2に記載の光学干渉計。
- 前記測定腕の端部に探針が設置されていることを特徴とする請求項2から4のいずれか一項に記載の光学干渉計。
- 前記探針を備えた測定腕の少なくとも一部が光ファイバで作られていることを特徴とする請求項5に記載の光学干渉計。
- 該光学干渉計の少なくとも一方の腕が光ファイバで作られていることを特徴とする請求項2から4のいずれか一項に記載の光学干渉計。
- 前記光ビームスプリッターの少なくとも一方が光ファイバで作られていることを特徴とする請求項2から7のいずれか一項に記載の光学干渉計。
- 前記探針が着脱式に作られていて、該光学干渉計の別の部分とコネクタを使って接続されていることを特徴とする請求項5または6に記載の光学干渉計。
- 前記第1の光ビームスプリッターがノンレシプロカルに作られていることを特徴とする請求項2から9のいずれか一項に記載の光学干渉計。
- 前記第1の光ビームスプリッターが偏光感度性に作られていて、前記測定腕に偏光スイッチが加入されていることを特徴とする請求項2から10のいずれか一項に記載の光学干渉計。
- 光学放射源と、
低干渉性光学放射を第1の低干渉性光学放射のビームおよび第2の低干渉性光学放射のビームに分けるための第1の光ビームスプリッターと、
双方向性の測定腕と、
支持腕であって、低干渉性光学放射が第1及び第2の双方向に該支持腕に沿って伝播するようにループ状に形成された支持腕と、
前記第1の低干渉性光学放射のビームを第3の低干渉性光学放射のビームおよび第4の低干渉性光学放射のビームに分けて、前向きおよび後ろ向きに前記双方向性の測定腕に沿って伝わった前記第3の低干渉性光学放射のビームを、前記第1の方向に前記支持腕のループに沿って伝わった前記第2の低干渉性光学放射のビームと混合することによって第1の混合光学放射を形成するための第2の光ビームスプリッターと、
少なくとも一つの光受信器とを備えた光学干渉計であって、
前記第1の光ビームスプリッターが、前記第2の光ビームスプリッターのポートを介して対象と光学的に結合され、前記第1の光ビームスプリッターが、第1の低干渉性光学放射のビームの一部を、前記第2の方向に前記支持腕のループに沿って伝わった前記第4の低干渉性光学放射のビームと混合することによって、第2の混合光学放射を形成し、
前記光ビームスプリッターのうちの少なくも一方が、前記少なくとも一つの光受信器に接続されている、光学干渉計。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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US35679802P | 2002-02-14 | 2002-02-14 | |
PCT/RU2003/000041 WO2003069272A1 (fr) | 2002-02-14 | 2003-02-10 | Procede d'examen d'objet et interferometre optique permettant la mise en oeuvre dudit procede |
Publications (3)
Publication Number | Publication Date |
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JP2005517912A JP2005517912A (ja) | 2005-06-16 |
JP2005517912A5 JP2005517912A5 (ja) | 2009-08-13 |
JP4472991B2 true JP4472991B2 (ja) | 2010-06-02 |
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JP2003568347A Expired - Fee Related JP4472991B2 (ja) | 2002-02-14 | 2003-02-10 | 対象の研究方法およびその光学干渉計(変型) |
Country Status (6)
Country | Link |
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US (1) | US6992776B2 (ja) |
EP (1) | EP1475606A4 (ja) |
JP (1) | JP4472991B2 (ja) |
CA (1) | CA2474631A1 (ja) |
RU (1) | RU2240502C1 (ja) |
WO (1) | WO2003069272A1 (ja) |
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RU2240502C1 (ru) | 2004-11-20 |
JP2005517912A (ja) | 2005-06-16 |
WO2003069272A1 (fr) | 2003-08-21 |
US6992776B2 (en) | 2006-01-31 |
CA2474631A1 (en) | 2003-08-21 |
EP1475606A1 (en) | 2004-11-10 |
US20030174339A1 (en) | 2003-09-18 |
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