|
US4049944A
(en)
|
1973-02-28 |
1977-09-20 |
Hughes Aircraft Company |
Process for fabricating small geometry semiconductive devices including integrated components
|
|
US4339528A
(en)
|
1981-05-19 |
1982-07-13 |
Rca Corporation |
Etching method using a hardened PVA stencil
|
|
US4684437A
(en)
|
1985-10-31 |
1987-08-04 |
International Business Machines Corporation |
Selective metal etching in metal/polymer structures
|
|
JPH0416085A
(ja)
|
1990-05-10 |
1992-01-21 |
Tokyo Gas Co Ltd |
画像記録再生装置
|
|
KR100215338B1
(ko)
*
|
1991-03-06 |
1999-08-16 |
가나이 쓰도무 |
반도체 장치의 제조방법
|
|
JP3165304B2
(ja)
*
|
1992-12-04 |
2001-05-14 |
株式会社半導体エネルギー研究所 |
半導体装置の作製方法及び半導体処理装置
|
|
US5691794A
(en)
|
1993-02-01 |
1997-11-25 |
Canon Kabushiki Kaisha |
Liquid crystal display device
|
|
EP0634699A1
(en)
*
|
1993-07-16 |
1995-01-18 |
Semiconductor Systems, Inc. |
Clustered photolithography system
|
|
US5593606A
(en)
|
1994-07-18 |
1997-01-14 |
Electro Scientific Industries, Inc. |
Ultraviolet laser system and method for forming vias in multi-layered targets
|
|
US5632667A
(en)
*
|
1995-06-29 |
1997-05-27 |
Delco Electronics Corporation |
No coat backside wafer grinding process
|
|
JPH09216085A
(ja)
|
1996-02-07 |
1997-08-19 |
Canon Inc |
基板の切断方法及び切断装置
|
|
JPH1027971A
(ja)
|
1996-07-10 |
1998-01-27 |
Nec Corp |
有機薄膜多層配線基板の切断方法
|
|
DE69725245T2
(de)
|
1996-08-01 |
2004-08-12 |
Surface Technoloy Systems Plc |
Verfahren zur Ätzung von Substraten
|
|
US6426484B1
(en)
|
1996-09-10 |
2002-07-30 |
Micron Technology, Inc. |
Circuit and method for heating an adhesive to package or rework a semiconductor die
|
|
US5920973A
(en)
|
1997-03-09 |
1999-07-13 |
Electro Scientific Industries, Inc. |
Hole forming system with multiple spindles per station
|
|
JP3230572B2
(ja)
|
1997-05-19 |
2001-11-19 |
日亜化学工業株式会社 |
窒化物系化合物半導体素子の製造方法及び半導体発光素子
|
|
US6312525B1
(en)
|
1997-07-11 |
2001-11-06 |
Applied Materials, Inc. |
Modular architecture for semiconductor wafer fabrication equipment
|
|
US6057180A
(en)
|
1998-06-05 |
2000-05-02 |
Electro Scientific Industries, Inc. |
Method of severing electrically conductive links with ultraviolet laser output
|
|
US6562698B2
(en)
|
1999-06-08 |
2003-05-13 |
Kulicke & Soffa Investments, Inc. |
Dual laser cutting of wafers
|
|
JP2001044144A
(ja)
|
1999-08-03 |
2001-02-16 |
Tokyo Seimitsu Co Ltd |
半導体チップの製造プロセス
|
|
JP3348700B2
(ja)
|
1999-08-19 |
2002-11-20 |
株式会社東京精密 |
エッチング装置
|
|
JP4318353B2
(ja)
*
|
1999-10-01 |
2009-08-19 |
パナソニック株式会社 |
基板の製造方法
|
|
JP2001110811A
(ja)
|
1999-10-08 |
2001-04-20 |
Oki Electric Ind Co Ltd |
半導体装置の製造方法
|
|
JP4387007B2
(ja)
|
1999-10-26 |
2009-12-16 |
株式会社ディスコ |
半導体ウェーハの分割方法
|
|
JP2001144126A
(ja)
|
1999-11-12 |
2001-05-25 |
Matsushita Electric Ind Co Ltd |
半導体装置の製造方法および半導体装置
|
|
JP2001148358A
(ja)
|
1999-11-19 |
2001-05-29 |
Disco Abrasive Syst Ltd |
半導体ウェーハ及び該半導体ウェーハの分割方法
|
|
US6300593B1
(en)
|
1999-12-07 |
2001-10-09 |
First Solar, Llc |
Apparatus and method for laser scribing a coated substrate
|
|
US6887804B2
(en)
|
2000-01-10 |
2005-05-03 |
Electro Scientific Industries, Inc. |
Passivation processing over a memory link
|
|
CN1276495C
(zh)
|
2000-01-10 |
2006-09-20 |
电子科学工业公司 |
以具超短脉冲宽度的激光脉冲的脉冲串处理存储器链路的激光器系统及方法
|
|
US6383931B1
(en)
|
2000-02-11 |
2002-05-07 |
Lam Research Corporation |
Convertible hot edge ring to improve low-K dielectric etch
|
|
US6407363B2
(en)
|
2000-03-30 |
2002-06-18 |
Electro Scientific Industries, Inc. |
Laser system and method for single press micromachining of multilayer workpieces
|
|
US7046679B2
(en)
|
2000-06-09 |
2006-05-16 |
Broadcom Corporation |
Gigabit switch with frame forwarding and address learning
|
|
JP3485525B2
(ja)
*
|
2000-07-06 |
2004-01-13 |
沖電気工業株式会社 |
半導体装置の製造方法
|
|
GB2386184B
(en)
|
2000-07-12 |
2004-05-26 |
Electro Scient Ind Inc |
UV laser system and method for single pulse severing of IC fuses
|
|
US6676878B2
(en)
|
2001-01-31 |
2004-01-13 |
Electro Scientific Industries, Inc. |
Laser segmented cutting
|
|
JP4109823B2
(ja)
|
2000-10-10 |
2008-07-02 |
株式会社東芝 |
半導体装置の製造方法
|
|
US6712983B2
(en)
*
|
2001-04-12 |
2004-03-30 |
Memsic, Inc. |
Method of etching a deep trench in a substrate and method of fabricating on-chip devices and micro-machined structures using the same
|
|
US6759275B1
(en)
|
2001-09-04 |
2004-07-06 |
Megic Corporation |
Method for making high-performance RF integrated circuits
|
|
DE60211728T2
(de)
|
2001-10-01 |
2007-05-03 |
Xsil Technology Ltd. |
Verfahren und vorrichtung zur bearbeitung von substraten
|
|
US6642127B2
(en)
|
2001-10-19 |
2003-11-04 |
Applied Materials, Inc. |
Method for dicing a semiconductor wafer
|
|
JP3910843B2
(ja)
|
2001-12-13 |
2007-04-25 |
東京エレクトロン株式会社 |
半導体素子分離方法及び半導体素子分離装置
|
|
JP4006994B2
(ja)
|
2001-12-18 |
2007-11-14 |
株式会社リコー |
立体構造体の加工方法、立体形状品の製造方法及び立体構造体
|
|
US6706998B2
(en)
|
2002-01-11 |
2004-03-16 |
Electro Scientific Industries, Inc. |
Simulated laser spot enlargement
|
|
KR100451950B1
(ko)
|
2002-02-25 |
2004-10-08 |
삼성전자주식회사 |
이미지 센서 소자 웨이퍼 소잉 방법
|
|
AU2003246348A1
(en)
|
2002-02-25 |
2003-09-09 |
Disco Corporation |
Method for dividing semiconductor wafer
|
|
JP2003257896A
(ja)
|
2002-02-28 |
2003-09-12 |
Disco Abrasive Syst Ltd |
半導体ウェーハの分割方法
|
|
DE60303371T2
(de)
|
2002-04-19 |
2006-08-10 |
Xsil Technology Ltd. |
Laser-behandlung
|
|
JP4354675B2
(ja)
*
|
2002-06-04 |
2009-10-28 |
ローツェ株式会社 |
薄板状電子部品クリーン移載装置および薄板状電子製品製造システム
|
|
JP2004031526A
(ja)
|
2002-06-24 |
2004-01-29 |
Toyoda Gosei Co Ltd |
3族窒化物系化合物半導体素子の製造方法
|
|
US6582983B1
(en)
|
2002-07-12 |
2003-06-24 |
Keteca Singapore Singapore |
Method and wafer for maintaining ultra clean bonding pads on a wafer
|
|
JP4286497B2
(ja)
|
2002-07-17 |
2009-07-01 |
新光電気工業株式会社 |
半導体装置の製造方法
|
|
JP3908148B2
(ja)
|
2002-10-28 |
2007-04-25 |
シャープ株式会社 |
積層型半導体装置
|
|
US20050023260A1
(en)
|
2003-01-10 |
2005-02-03 |
Shinya Takyu |
Semiconductor wafer dividing apparatus and semiconductor device manufacturing method
|
|
US20040157457A1
(en)
|
2003-02-12 |
2004-08-12 |
Songlin Xu |
Methods of using polymer films to form micro-structures
|
|
JP2004273895A
(ja)
|
2003-03-11 |
2004-09-30 |
Disco Abrasive Syst Ltd |
半導体ウエーハの分割方法
|
|
US7087452B2
(en)
|
2003-04-22 |
2006-08-08 |
Intel Corporation |
Edge arrangements for integrated circuit chips
|
|
JP2004322168A
(ja)
|
2003-04-25 |
2004-11-18 |
Disco Abrasive Syst Ltd |
レーザー加工装置
|
|
JP2004349503A
(ja)
*
|
2003-05-22 |
2004-12-09 |
Tokyo Electron Ltd |
被処理体の処理システム及び処理方法
|
|
JP4231349B2
(ja)
|
2003-07-02 |
2009-02-25 |
株式会社ディスコ |
レーザー加工方法およびレーザー加工装置
|
|
JP3842769B2
(ja)
*
|
2003-09-01 |
2006-11-08 |
株式会社東芝 |
レーザ加工装置、レーザ加工方法、及び半導体装置の製造方法
|
|
JP4080405B2
(ja)
|
2003-09-22 |
2008-04-23 |
大日本スクリーン製造株式会社 |
基板処理装置
|
|
JP4408361B2
(ja)
|
2003-09-26 |
2010-02-03 |
株式会社ディスコ |
ウエーハの分割方法
|
|
JP2005116844A
(ja)
*
|
2003-10-09 |
2005-04-28 |
Matsushita Electric Ind Co Ltd |
半導体装置の製造方法
|
|
US7128806B2
(en)
|
2003-10-21 |
2006-10-31 |
Applied Materials, Inc. |
Mask etch processing apparatus
|
|
JP4471632B2
(ja)
|
2003-11-18 |
2010-06-02 |
株式会社ディスコ |
ウエーハの加工方法
|
|
JP4781634B2
(ja)
*
|
2004-03-30 |
2011-09-28 |
日東電工株式会社 |
レーザー加工品の製造方法及びレーザー加工用保護シート
|
|
JP2005203541A
(ja)
|
2004-01-15 |
2005-07-28 |
Disco Abrasive Syst Ltd |
ウエーハのレーザー加工方法
|
|
JP2005303191A
(ja)
*
|
2004-04-15 |
2005-10-27 |
Renesas Technology Corp |
半導体装置の製造方法
|
|
US7459377B2
(en)
|
2004-06-08 |
2008-12-02 |
Panasonic Corporation |
Method for dividing substrate
|
|
US7804043B2
(en)
*
|
2004-06-15 |
2010-09-28 |
Laserfacturing Inc. |
Method and apparatus for dicing of thin and ultra thin semiconductor wafer using ultrafast pulse laser
|
|
US7687740B2
(en)
|
2004-06-18 |
2010-03-30 |
Electro Scientific Industries, Inc. |
Semiconductor structure processing using multiple laterally spaced laser beam spots delivering multiple blows
|
|
US7507638B2
(en)
|
2004-06-30 |
2009-03-24 |
Freescale Semiconductor, Inc. |
Ultra-thin die and method of fabricating same
|
|
JP4018088B2
(ja)
*
|
2004-08-02 |
2007-12-05 |
松下電器産業株式会社 |
半導体ウェハの分割方法及び半導体素子の製造方法
|
|
US7199050B2
(en)
|
2004-08-24 |
2007-04-03 |
Micron Technology, Inc. |
Pass through via technology for use during the manufacture of a semiconductor device
|
|
JP4018096B2
(ja)
|
2004-10-05 |
2007-12-05 |
松下電器産業株式会社 |
半導体ウェハの分割方法、及び半導体素子の製造方法
|
|
US20060088984A1
(en)
|
2004-10-21 |
2006-04-27 |
Intel Corporation |
Laser ablation method
|
|
US20060086898A1
(en)
|
2004-10-26 |
2006-04-27 |
Matsushita Electric Industrial Co., Ltd. |
Method and apparatus of making highly repetitive micro-pattern using laser writer
|
|
US20060146910A1
(en)
|
2004-11-23 |
2006-07-06 |
Manoochehr Koochesfahani |
Method and apparatus for simultaneous velocity and temperature measurements in fluid flow
|
|
JP4288229B2
(ja)
|
2004-12-24 |
2009-07-01 |
パナソニック株式会社 |
半導体チップの製造方法
|
|
US7875898B2
(en)
|
2005-01-24 |
2011-01-25 |
Panasonic Corporation |
Semiconductor device
|
|
JP2006253402A
(ja)
*
|
2005-03-10 |
2006-09-21 |
Nec Electronics Corp |
半導体装置の製造方法
|
|
JP2006254302A
(ja)
|
2005-03-14 |
2006-09-21 |
Canon Inc |
画像処理装置、画像処理方法及びプログラム
|
|
JP2006248191A
(ja)
*
|
2005-03-14 |
2006-09-21 |
Asahi Kasei Chemicals Corp |
シート状あるいは円筒状の樹脂製印刷基材の製造方法
|
|
US7361990B2
(en)
|
2005-03-17 |
2008-04-22 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
Reducing cracking of high-lead or lead-free bumps by matching sizes of contact pads and bump pads
|
|
JP4478053B2
(ja)
|
2005-03-29 |
2010-06-09 |
株式会社ディスコ |
半導体ウエーハ処理方法
|
|
JP4285455B2
(ja)
|
2005-07-11 |
2009-06-24 |
パナソニック株式会社 |
半導体チップの製造方法
|
|
JP4599243B2
(ja)
|
2005-07-12 |
2010-12-15 |
株式会社ディスコ |
レーザー加工装置
|
|
TWI295816B
(en)
*
|
2005-07-19 |
2008-04-11 |
Applied Materials Inc |
Hybrid pvd-cvd system
|
|
JP2007073670A
(ja)
*
|
2005-09-06 |
2007-03-22 |
Disco Abrasive Syst Ltd |
水溶性樹脂被覆方法
|
|
US9138913B2
(en)
|
2005-09-08 |
2015-09-22 |
Imra America, Inc. |
Transparent material processing with an ultrashort pulse laser
|
|
US20070079866A1
(en)
*
|
2005-10-07 |
2007-04-12 |
Applied Materials, Inc. |
System and method for making an improved thin film solar cell interconnect
|
|
JP4769560B2
(ja)
|
2005-12-06 |
2011-09-07 |
株式会社ディスコ |
ウエーハの分割方法
|
|
CN101064245A
(zh)
*
|
2006-04-25 |
2007-10-31 |
力晶半导体股份有限公司 |
硬掩模层与半导体元件的制造方法
|
|
JP4372115B2
(ja)
|
2006-05-12 |
2009-11-25 |
パナソニック株式会社 |
半導体装置の製造方法、および半導体モジュールの製造方法
|
|
US20070262051A1
(en)
*
|
2006-05-12 |
2007-11-15 |
Advanced Chip Engineering Technology Inc. |
Method of plasma etching with pattern mask
|
|
US8198566B2
(en)
|
2006-05-24 |
2012-06-12 |
Electro Scientific Industries, Inc. |
Laser processing of workpieces containing low-k dielectric material
|
|
US20070272666A1
(en)
|
2006-05-25 |
2007-11-29 |
O'brien James N |
Infrared laser wafer scribing using short pulses
|
|
JP4480728B2
(ja)
|
2006-06-09 |
2010-06-16 |
パナソニック株式会社 |
Memsマイクの製造方法
|
|
JP5134795B2
(ja)
*
|
2006-08-23 |
2013-01-30 |
日本写真印刷株式会社 |
成形同時加飾成形品の製法
|
|
KR101262386B1
(ko)
|
2006-09-25 |
2013-05-08 |
엘지이노텍 주식회사 |
질화물 반도체 발광소자의 제조 방법
|
|
JP4544231B2
(ja)
|
2006-10-06 |
2010-09-15 |
パナソニック株式会社 |
半導体チップの製造方法
|
|
JP4840174B2
(ja)
*
|
2007-02-08 |
2011-12-21 |
パナソニック株式会社 |
半導体チップの製造方法
|
|
JP4840200B2
(ja)
|
2007-03-09 |
2011-12-21 |
パナソニック株式会社 |
半導体チップの製造方法
|
|
JP4840872B2
(ja)
*
|
2007-03-29 |
2011-12-21 |
東京エレクトロン株式会社 |
基板処理装置及びその大気搬送ユニット
|
|
US7926410B2
(en)
|
2007-05-01 |
2011-04-19 |
J.R. Automation Technologies, L.L.C. |
Hydraulic circuit for synchronized horizontal extension of cylinders
|
|
WO2008142911A1
(en)
|
2007-05-18 |
2008-11-27 |
Semiconductor Energy Laboratory Co., Ltd. |
Semiconductor device and method for manufacturing the same
|
|
US7851272B2
(en)
*
|
2007-05-30 |
2010-12-14 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
Multi-project wafer and method of making same
|
|
JP4488037B2
(ja)
|
2007-07-24 |
2010-06-23 |
パナソニック株式会社 |
半導体ウェハの処理方法
|
|
JP2009034694A
(ja)
|
2007-07-31 |
2009-02-19 |
Disco Abrasive Syst Ltd |
レーザ加工方法
|
|
US7989319B2
(en)
|
2007-08-07 |
2011-08-02 |
Semiconductor Components Industries, Llc |
Semiconductor die singulation method
|
|
US8012857B2
(en)
|
2007-08-07 |
2011-09-06 |
Semiconductor Components Industries, Llc |
Semiconductor die singulation method
|
|
JP5205012B2
(ja)
|
2007-08-29 |
2013-06-05 |
株式会社半導体エネルギー研究所 |
表示装置及び当該表示装置を具備する電子機器
|
|
TW200935506A
(en)
|
2007-11-16 |
2009-08-16 |
Panasonic Corp |
Plasma dicing apparatus and semiconductor chip manufacturing method
|
|
US8614151B2
(en)
|
2008-01-04 |
2013-12-24 |
Micron Technology, Inc. |
Method of etching a high aspect ratio contact
|
|
US7859084B2
(en)
|
2008-02-28 |
2010-12-28 |
Panasonic Corporation |
Semiconductor substrate
|
|
JP5826027B2
(ja)
*
|
2008-03-21 |
2015-12-02 |
イムラ アメリカ インコーポレイテッド |
レーザベースの材料加工方法及びシステム
|
|
JP5163358B2
(ja)
*
|
2008-03-26 |
2013-03-13 |
日立化成株式会社 |
半導体ウエハのダイシング方法
|
|
CN101990480A
(zh)
|
2008-04-10 |
2011-03-23 |
应用材料股份有限公司 |
激光刻划平台与杂合书写策略
|
|
US20100013036A1
(en)
|
2008-07-16 |
2010-01-21 |
Carey James E |
Thin Sacrificial Masking Films for Protecting Semiconductors From Pulsed Laser Process
|
|
KR101026010B1
(ko)
|
2008-08-13 |
2011-03-30 |
삼성전기주식회사 |
레이저 가공장치 및 레이저 가공방법
|
|
US8426250B2
(en)
*
|
2008-10-22 |
2013-04-23 |
Intel Corporation |
Laser-assisted chemical singulation of a wafer
|
|
JP2010165963A
(ja)
|
2009-01-19 |
2010-07-29 |
Furukawa Electric Co Ltd:The |
半導体ウェハの処理方法
|
|
US10307862B2
(en)
|
2009-03-27 |
2019-06-04 |
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Laser micromachining with tailored bursts of short laser pulses
|
|
US8609512B2
(en)
|
2009-03-27 |
2013-12-17 |
Electro Scientific Industries, Inc. |
Method for laser singulation of chip scale packages on glass substrates
|
|
KR101094450B1
(ko)
*
|
2009-06-05 |
2011-12-15 |
에스티에스반도체통신 주식회사 |
플라즈마를 이용한 다이싱 방법
|
|
US8642448B2
(en)
|
2010-06-22 |
2014-02-04 |
Applied Materials, Inc. |
Wafer dicing using femtosecond-based laser and plasma etch
|
|
US8802545B2
(en)
|
2011-03-14 |
2014-08-12 |
Plasma-Therm Llc |
Method and apparatus for plasma dicing a semi-conductor wafer
|
|
US8598016B2
(en)
|
2011-06-15 |
2013-12-03 |
Applied Materials, Inc. |
In-situ deposited mask layer for device singulation by laser scribing and plasma etch
|
|
US8557683B2
(en)
|
2011-06-15 |
2013-10-15 |
Applied Materials, Inc. |
Multi-step and asymmetrically shaped laser beam scribing
|
|
US8557682B2
(en)
|
2011-06-15 |
2013-10-15 |
Applied Materials, Inc. |
Multi-layer mask for substrate dicing by laser and plasma etch
|
|
US8703581B2
(en)
|
2011-06-15 |
2014-04-22 |
Applied Materials, Inc. |
Water soluble mask for substrate dicing by laser and plasma etch
|