WO2003089695A1 - Non-polar a-plane gallium nitride thin films grown by metalorganic chemical vapor deposition - Google Patents

Non-polar a-plane gallium nitride thin films grown by metalorganic chemical vapor deposition Download PDF

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WO2003089695A1
WO2003089695A1 PCT/US2003/011176 US0311176W WO03089695A1 WO 2003089695 A1 WO2003089695 A1 WO 2003089695A1 US 0311176 W US0311176 W US 0311176W WO 03089695 A1 WO03089695 A1 WO 03089695A1
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plane
substrate
growth
gan
gallium nitride
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French (fr)
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Michael D. Craven
James S. Speck
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University of California Berkeley
University of California San Diego UCSD
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University of California Berkeley
University of California San Diego UCSD
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Priority to AU2003228497A priority patent/AU2003228497A1/en
Priority to KR1020047016455A priority patent/KR100992960B1/ko
Priority to KR1020107019520A priority patent/KR101167590B1/ko
Publication of WO2003089695A1 publication Critical patent/WO2003089695A1/en
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    • C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
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Definitions

  • the invention is related to semiconductor materials, methods, and devices, and more particularly, to non-polar a-plane gallium nitride (GaN) thin films grown by metalorganic chemical vapor deposition (MOCVD).
  • GaN gallium nitride
  • MOCVD metalorganic chemical vapor deposition
  • Nitride- based optoelectronic and electronic devices are subject to polarization-induced effects because they employ nitride films grown in the polar c-direction [0001], the axis along which the spontaneous and piezoelectric polarization of nitride films are aligned. Since the total polarization of a nitride film depends on the composition and strain state, discontinuities exist at interfaces between adjacent device layers and are associated with fixed sheet charges that give rise to internal electric fields.
  • Polarization-induced electric fields although advantageous for two- dimensional electron gas (2DEG) formation in nitride-based transistor structures, spatially separate electrons and hole wave functions in quantum well (QW) structures, thereby reducing carrier recombination efficiencies in QW based devices, such as laser diodes and light emitting diodes.
  • QW quantum well
  • a potential means of eliminating the effects of these polarization-induced fields is through the growth of structures in directions perpendicular to the GaN c-axis (non-polar) direction.
  • m-plane AlGaN/GaN quantum wells have recently been grown on lithium aluminate substrates via plasma-assisted molecular beam epitaxy (MBE) without the presence of polarization-induced electric fields along the growth direction. See Reference 8.
  • MBE plasma-assisted molecular beam epitaxy
  • Growth of a-plane nitride semiconductors also provides a means of eliminating polarization-induced electric field effects in wurtzite nitride quantum structures.
  • the present invention describes a method for growing device-quality non- polar a-plane GaN thin films via MOCVD on r-plane sapphire substrates.
  • the present invention provides a pathway to nitride-based devices free from polarization-induced effects, since the growth direction of non-polar a-plane GaN thin films is perpendicular to the polar c-axis.
  • Polarization-induced electric fields will have minimal effects, if any, on (Al,B,In,Ga)N device layers grown on non-polar a-plane GaN thin films.
  • FIG. 1 is a flowchart that illustrates the steps of the MOCVD process for the growth of non-polar (1120) a-plane GaN thin films on (1 120) r-plane sapphire, according to the preferred embodiment of the present invention
  • FIG. 2(a) shows a 2 ⁇ - ⁇ diffraction scan that identifies the growth direction of the GaN film as (1120) a-plane GaN
  • FIG. 2(b) is a compilation of off-axis ⁇ scans used to determine the in-plane epitaxial relationship between GaN and r-sapphire, wherein the angle of inclination ⁇ used to access the off-axis reflections is noted for each scan;
  • FIG. 2(c) is a schematic illustration of the epitaxial relationship between the GaN and r-plane sapphire
  • FIGS. 3(a) and 3(b) are cross-sectional and plan- view transmission electron microscopy (TEM) images, respectively, of the defect structure of the a-plane GaN films on r-plane sapphire; and
  • FIGS. 4(a) and 4(b) are atomic force microscopy (AFM) amplitude and height images, respectively, of the surface of the as-grown a-plane GaN films.
  • AFM atomic force microscopy
  • the present invention describes a method for growing device quality non- polar (1120) a-plane GaN thin films via MOCVD on (1 102) r-plane sapphire substrates.
  • the method employs a low-temperature buffer layer grown at atmospheric pressure to initiate the GaN growth on r-plane sapphire. Thereafter, a high temperature growth step is performed at low pressures, e.g., ⁇ 0.1 atmospheres (atm) in order to produce a planar film.
  • Planar growth surfaces have been achieved using the present invention. Specifically, the in-plane orientation of the GaN with respect to the r-plane sapphire substrate has been confirmed to be [OOOl] Ga N II [ HOI] sapp h ire and [ 1 100] GaN
  • the resulting films possess surfaces that are suitable for subsequent growth of (Al,B,In,Ga)N device layers. Specifically, polarization-induced electric fields will have minimal effects, if any, on (Al,B,In,Ga)N device layers grown on non-polar a- plane GaN base layers.
  • FIG. 1 is a flowchart that illustrates the steps of the MOCVD process for the growth of non-polar (1 120) a-plane GaN thin films on a (1 120) r-plane sapphire substrate, according to the preferred embodiment of the present invention.
  • the growth process was modeled after the two-step process that has become the standard for the growth of c-GaN on c-sapphire. See Reference 16.
  • Block 100 represents loading of a sapphire substrate into a vertical, close- spaced, rotating disk, MOCVD reactor.
  • epi-ready sapphire substrates with surfaces crystallographically oriented within +/- 2° of the sapphire r-plane (1 120) may be obtained from commercial vendors. No ex-situ preparations need be performed prior to loading the sapphire substrate into the MOCVD reactor, although ex-situ cleaning of the sapphire substrate could be used as a precautionary measure.
  • Block 102 represents annealing the sapphire substrate in-situ at a high temperature (>1000°C), which improves the quality of the substrate surface on the atomic scale. After annealing, the substrate temperature is reduced for the subsequent low temperature nucleation layer deposition.
  • Block 104 represents depositing a thin, low temperature, low pressure, nitride- based nucleation layer as a buffer layer on the sapphire substrate.
  • the nucleation layer is comprised of, but is not limited to, 1-100 nanometers (nm) of GaN and is deposited at low temperature, low pressure depositing conditions of approximately 400-900°C and 1 atm.
  • Such layers are commonly used in the heteroepitaxial growth of c-plane (0001) nitride semiconductors. Specifically, this depositing step initiates GaN growth on the r-plane sapphire substrate.
  • Block 106 represents growing the non-polar (1120) a-plane GaN thin films on the substrate.
  • the high temperature growth conditions comprise, but are not limited to, approximately 1100°C growth temperature, approximately 0.2 atm or less growth pressure, 30 ⁇ mol per minute Ga flow, and 40,000 ⁇ mol per minute N flow, thereby providing a V/III ratio of approximately 1300).
  • the precursors used as the group III and group V sources are trimethylgallium and ammonia, respectively, although alternative precursors could be used as well.
  • Non-polar GaN approximately 1.5 ⁇ m thick have been grown and characterized.
  • Block 108 represents cooling the non-polar (1120) a-plane GaN thin films under a nitrogen overpressure.
  • Block 110 represents the end result of the processing steps, which is a non-polar (1120) a-plane GaN film on an r-plane sapphire substrate.
  • Potential device layers to be manufactured using these process steps to form a non-polar (1120) a-plane GaN base layer for subsequent device growth include laser diodes (LDs), light emitting diodes (LEDs), resonant cavity LEDs (RC-LEDs), vertical cavity surface emitting lasers (VCSELs), high electron mobility transistors (HEMTs), heteroj unction bipolar transistors (HBTs), heteroj unction field effect transistors (HFETs), and UV and near-UV photodetectors.
  • LDs laser diodes
  • LEDs light emitting diodes
  • RC-LEDs resonant cavity LEDs
  • VCSELs vertical cavity surface emitting lasers
  • HEMTs high electron mobility transistors
  • HBTs heteroj unction bipolar transistors
  • HFETs heteroj unction field effect transistors
  • the crystallographic orientation and structural quality of the as-grown GaN films and r-plane sapphire were determined using a PhilipsTM four-circle, high- resolution, x-ray diffractometer (HR-XRD) operating in receiving slit mode with four bounce Ge(220)-monochromated Cu K ⁇ radiation and a 1.2 mm slit on the detector arm.
  • Convergent beam electron diffraction (CBED) was used to determine the polarity of the a-GaN films with respect to the sapphire substrate.
  • a Digital Instruments D3000 Atomic Force Microscope (AFM) in tapping mode produced images of the surface morphology.
  • FIG. 2(a) shows a 2 ⁇ - ⁇ diffraction scan that identifies the growth direction of the GaN film as (1120) a-plane GaN.
  • the scan detected sapphire (1 ⁇ 02),(2204) , and GaN (1120) reflections. Within the sensitivity of these measurements, no GaN
  • FIG. 2(b) is a compilation of off-axis ⁇ scans used to determine the in-plane epitaxial relationship between GaN and r-sapphire, wherein the angle of inclination ⁇ used to access the off-axis reflections is noted for each scan. Having confirmed the a- plane growth surface, off-axis diffraction peaks were used to determine the in- epitaxial relationship between the GaN and the r-sapphire. Two sample rotations ⁇ and ⁇ were adjusted in order to bring off-axis reflections into the scattering plane of the diffractometer, wherein ⁇ is the angle of rotation about the sample surface normal and ⁇ is the angle of sample tilt about the axis formed by the intersection of the Bragg and scattering planes.
  • ⁇ scans detected GaN (10 10), (1011) , and sapphire (0006) peaks, as shown in FIG. 2(b).
  • the correlation between the ⁇ positions of these peaks determined the following epitaxial relationship: [0001]c a N
  • FIG. 2(c) is a schematic illustration of the epitaxial relationship between the GaN and r-plane sapphire.
  • the a-GaN polarity was determined using CBED.
  • the polarity's sign is defined by the direction of the polar Ga-N bonds aligned along the GaN c-axis; the positive c-axis [0001] points from a gallium atom to a nitrogen atom. Consequently, a gallium-face c-GaN film has a [0001] growth direction, while a nitrogen- face c-GaN crystal has a [000 1] growth direction.
  • 3(a) and 3(b) are cross-sectional and plan-view TEM images, respectively, of the defect structure of the a-plane GaN films on an r-plane sapphire substrate. These images reveal the presence of line and planar defects, respectively.
  • the cross-sectional TEM image in FIG. 3(a) reveals a large density of threading dislocations (TD's) originating at the sapphire/GaN interface with line directions parallel to the growth direction [1120] .
  • the TD density determined by plan view TEM, was 2.6 x 10 10 cm "2 .
  • [1120] directions cannot be treated as the family ⁇ 1120 > .
  • plan view TEM image in FIG. 3(b) reveals the planar defects observed in the a-GaN films.
  • Stacking faults aligned perpendicular to the c-axis with a density of 3.8 x 10 5 cm "1 were observed in the plan-view TEM images.
  • Stacking faults with similar characteristics were observed in a-plane A1N films grown on r-plane sapphire substrates. See Reference 17.
  • the stacking faults have a common faulting plane parallel to the close-packed (0001) and a density of -3.8 x 10 5 cm "1 .
  • Omega rocking curves were measured for both the GaN on-axis (1120) and off-axis (1011) reflections to characterize the a-plane GaN crystal quality.
  • the full- width half-maximum (FWHM) of the on-axis peak was 0.29° (1037"), while the off- axis peak exhibited a larger orientational spread with a FWHM of 0.46° (1659").
  • the large FWHM values are expected since the micro structure contains a substantial dislocation density. According to the analysis presented by Heying et al.
  • on-axis peak widths are broadened by screw and mixed dislocations, while off-axis widths are broadened by edge-component TD's (assuming the TD line is parallel to the film normal). See Reference 18.
  • edge-component TD's assuming the TD line is parallel to the film normal.
  • FIGS. 4(a) and 4(b) are AFM amplitude and height images, respectively, of the surface of the as-grown a-plane GaN film.
  • the surface pits in the AFM amplitude image of FIG. 4(a) are uniformly aligned parallel to the GaN c-axis, while the terraces visible in the AFM height image of FIG. 4(b) are aligned perpendicular to the c-axis.
  • optically specular with a surface RMS roughness of 2.6 nm the a- GaN growth surface is pitted on a sub-micron scale, as can be clearly observed in the AFM amplitude image shown in FIG. 4(a). It has been proposed that the surface pits are decorating dislocation terminations with the surface; the dislocation density determined by plan view TEM correlates with the surface pit density within an order of magnitude.
  • the AFM height image in FIG. 4(b) reveals faint terraces pe ⁇ endicular to the c-axis.
  • these crystallographic features could be the early signs of the surface growth mode. At this early point in the development of the a-plane growth process, neither the pits nor the terraces have been correlated to particular defect structures.
  • the specific crystallographic orientation of the r-plane sapphire substrate might be changed in order to optimize the subsequent epitaxial GaN growth.
  • r-plane sapphire substrates with a particular degree of miscut in a particular crystallographic direction might be optimal for growth.
  • the nucleation layer deposition is crucial to achieving epitaxial
  • GaN films with smooth growth surfaces and minimal crystalline defects Other than optimizing the fundamental MOCVD parameters, use of A1N or AlGaN nucleation layers in place of GaN could prove useful in obtaining high quality a-plane GaN films.
  • non-polar a-plan GaN thin films are described herein, the same techniques are applicable to non-polar m-plane GaN thin films.
  • non-polar InN, A1N, and AlInGaN thin films could be created instead of GaN thin films.
  • substrates other than sapphire substrate could be employed for non- polar GaN growth. These substrates include silicon carbide, gallium nitride, silicon, zinc oxide, boron nitride, lithium aluminate, lithium niobate, germanium, aluminum nitride, and lithium gallate.
  • the present invention describes the growth of non-polar (1120) a-plane GaN thin films on r-plane (1 102) sapphire substrates by employing a low temperature nucleation layer as a buffer layer prior to a high temperature growth of the epitaxial (1120) a-plane GaN films.
  • the epitaxial relationship is [0001]caN

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  • Recrystallisation Techniques (AREA)
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US8882935B2 (en) 2004-05-10 2014-11-11 The Regents Of The University Of California Fabrication of nonpolar indium gallium nitride thin films, heterostructures, and devices by metalorganic chemical vapor deposition
JP2006279025A (ja) * 2005-03-25 2006-10-12 Univ Of Tokushima 非極性ａ面窒化ガリウム単結晶の製造方法
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