JP5856119B2 - 角度分解型のフーリエドメイン光干渉断層撮影法を遂行する方法及びシステム - Google Patents
角度分解型のフーリエドメイン光干渉断層撮影法を遂行する方法及びシステム Download PDFInfo
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Description
本出願は、2006年2月24日付けで出願された米国特許出願第60/776,544号に基づくものである。さらに、本出願は、この米国特許出願の優先権の利益を主張するものであり、この米国特許出願の開示内容は、本願明細書で言及することによって、その全ての内容が本願明細書に包含されている。
(連邦政府による資金提供を受けた研究開発の記載)
本発明は、国立衛生研究所(National Institutes of Health)によって付与された契約第R01 CA103769号の下に、米国政府の支援によって実現したものである。従って、米国政府は、本発明における特定の権利を有している。
上記のような本発明の目的及びその他の目的、特徴、及び利点については、添付の特許請求の請求項との関連において、本発明の実施例に関する以下の詳細な説明を参照することにより、明らかとなるであろう。
以下、フーリエドメインOCTの環境において、角度分解型のFD−OCTについて説明する。例えば、FD−OCTにおいては、混濁媒体、半混濁媒体、又は透明媒体の深さ分解型の反射率を取得するために、基準光と撮像サンプルから後方散乱された光との間の干渉を周波数ドメインにおいて計測することが可能である。入力光源の(例えば、光やレーザービーム等の)電磁波を基準ビームとサンプルビームに分割することが可能である。サンプルビーム光を撮像対象のサンプルに導くことが可能であり、サンプルからの後方散乱光を基準ビーム光と干渉させることができる。角度分解型のFD−OCTの場合には、入射サンプルビームによって範囲が定まるものを上回る後方散乱の角度範囲との干渉を実現させるべく、サンプルビームの断面エリアよりも断面エリアを大きくすることができるように、基準ビームを空間的に拡張することが可能である。基準ビームと後方散乱光との間の干渉は、例えば、検出器アレイを使用して計測することが可能である。この検出器アレイは、(i)単一集積回路要素上に集積化された検出器、及び/又は(ii)空間内に一緒に提供された個別の検出器から構成されることが可能である。入射ビームに対する検出後方散乱光の角度依存性は、空間ドメインにおいて、検出器アレイの少なくとも1つの次元に沿った光強度の分布としてエンコーディング可能である。干渉光の波長依存性を計測することが可能であり、異なる後方散乱角度のレンジに対応するフーリエ分析軸方向反射率プロファイルを取得することが可能である。
後方散乱した波面の歪みの結果としてスペックルが生じるが、これらのスペックルは、恐らく、低角度の多様な前方散乱によって発生したものであり、且つ、互いに接近した値を有する複数の屈折率により生ずる多様な後方散乱を拡散させる。角度合成法は、一般に、上記のような干渉の結果として生成され、且つ、異なる後方散乱角度に由来する複数のフィールドが、相関関係を有していないという観察結果から得られたものである。例えば、再構築された反射率プロファイルの大きさを平均化することによる等のように、異なる散乱角度からの信号をインコヒーレントの状態で平均化することにより、低減されたスペックルを有する反射率信号を得ることができる。
角度分解型のFD−OCT方法及びシステムによって計測することが可能である光の角度別後方散乱パターンは、撮像サンプルの散乱体サイズ及び密度に関する情報を包含することが可能である。この情報は、単一の角度レンジ内において後方散乱する光の反射率を計測する光学的な方法に使用可能で且つ非常に類似した散乱特性を有するような組織の異なる領域の間を互いに弁別するために、例えば、臨床における撮像環境において好適であろう。画像コントラストの尺度は、各々のピクセルにおける角度別後方散乱分布から生成することが可能であり、このような尺度は、空間的にスムージングを行うことが可能であり、且つ/又は、画像コントラストの尺度は、空間的にスムージングがなされた角度別後方散乱分布から生成することが可能である。
SD−OCT及びOFDIシステムとSD−OCT及びOFDI方法におけるFD−OCT法は、離散スペクトル干渉を計測することが可能であり、且つ、この計測の実施において異なるものであってよい。OFDIシステム及び方法は、波長掃引型供給源を使用することにより、時間の関数として干渉を記録することが可能であり、SD−OCTシステム及び方法は、一般に、分光計を使用することにより、干渉スペクトルを検出器アレイ又は検出器アレイの一部上に画像生成することが可能である。
本発明の第2の代表的な実施例によれば、両方の次元が後方散乱光の角度別分布に対応している検出器の二次元アレイを使用して干渉光の検出を遂行することが可能である。サンプルに入射する光は、波長の調節が可能な狭いライン幅の供給源によって供給することが可能である。撮像サンプルから後方散乱した光は、2つの空間的次元に沿って拡張された基準ビームと干渉する。各々の検出器アレイ要素は、後方散乱光の極角及び方位角の固有のレンジに対応することが可能である。検出器アレイの読み取り値を取得しつつ、レーザーをその調節されたレンジにわたって掃引することにより、各々の離散した方位角及び極角の対毎のベクトルを取得することが可能である。フーリエドメイン光干渉断層撮影再構築法をベクトルに対して適用することが可能であり、これにより、深さ分解型の反射率プロファイルを生成することが可能である。アレイの読み取り値を取得しつつ、サンプルにわたってビームを走査することにより、又は、ビームに対してサンプルを移動させることにより、組織上の異なる場所における角度分解型の反射率プロファイルを取得することが可能である。これらのプロファイルを合成することにより、二次元又は三次元の断面反射率画像を形成することが可能である。
本発明の代表的な第3の実施例によれば、例えば、図9の動作図及びブロック図に示されているように、一方の次元が波長に対応しており、他方の次元が後方散乱光の角度に対応している検出器の二次元アレイを使用することにより、干渉光の検出を遂行することが可能である。サンプル上に入射する光は、広帯域供給源によって供給することが可能である。サンプルから後方散乱した光は、1つの空間次元に沿って拡張された基準ビームと干渉することが可能であり、この空間次元は、後方散乱光の角度に対応可能である。干渉光900は、回折格子905に入射することが可能であり、これにより、波長に対応する別の次元に沿って光を分離することが可能である。次いで、この分離された光910は、二次元検出器アレイ915に入射することが可能である。特定の後方散乱角度レンジに対応する検出器アレイの読み取りの各々の一次元部分に沿って、フーリエドメイン光干渉断層撮影再構築法を干渉スペクトルに対して適用することにより、深さ分解型の反射率プロファイルを提供することが可能である。アレイの読み取り値を取得しつつ、サンプルにわたってビームを走査することにより、又は、ビームに対してサンプルを移動させることにより、組織上の異なる地点における角度分解型の反射率プロファイルを取得することが可能である。これらのプロファイルを合成することにより、二次元又は三次元の断面反射率画像を形成することが可能である。
本発明に係る小さなプローブ形状を使用したアプリケーションに好適な第4の代表的な実施例は、図10の動作図及びブロック図に示されているように、ファイバ束と共に使用可能である。この代表的な実施例によれば、光ファイバのアレイ1025を使用することにより、撮像サンプル1000との間において光を送受信することが可能である。アレイ1025内の1つ又は複数のファイバは、「供給ファイバ(Delivery Fiber)」と呼ばれており、これらのファイバを通して、サンプル1000との間で光1010を送受信することが可能である。アレイ1025内の各々のファイバは、角度別後方散乱の固有の狭い角度レンジに対応可能である。ファイバの前に配置されているレンズ1020は、各々のファイバによって収集される光の量を増強するべく機能することが可能である。レンズ1020の前に配置されているレンズ1015は、サンプル1000上に光の焦点を合わせると共に、レンズ1020による収集の前にサンプル1000から後方散乱した光をコリメートするべく、機能している。
光干渉断層撮影法の環境における偏光計測は、生物学的な組織における複屈折の空間的な分解に有用であろう。本発明に係る第5の代表的な実施例によれば、次の各段階の中の1つ又は複数の段階を実行することにより、偏光計測を遂行することが可能である。
b)時間の関数としてサンプルビームのみの偏光を変化させる段階
c)時間の関数として基準ビームのみの偏光を変化させる段階
d)偏光状態が異なる基準ビームの少なくとも2つの特徴的な部分が存在可能なように、空間の関数として基準ビームの1つ又は複数の部分の偏光状態を変化させる段階
e)偏光状態が異なるサンプルビームの少なくとも2つの特徴的な部分が存在可能なように、基準ビームとの干渉の前に、空間の関数として後方散乱光の1つ又は複数の部分の偏光状態を変化させる段階
f)偏光状態が異なる少なくとも2つの特徴的な部分が存在可能なように、空間の関数として干渉光の1つ又は複数の部分の偏光状態を変化させる段階
平面波からのビームの逸脱を分析によって補償することができる場合には、ミー(Mie)散乱の演算フレームワークを使用し、角度分解型のFD−OCTシステム及び/又は方法から得られた角周波数コンテンツを分析することが可能である。具体的には、ミー(Mie)理論を使用して球面誘電散乱体から発生し得る角度別散乱分布を判定することが可能であることから、角度別散乱分布から散乱体のサイズ分布を判定するという逆の問題を遂行することが可能である。角度別後方散乱分布のミー散乱分析により、上皮組織内の散乱体分布の計測を実現させることが可能であり、この上皮組織内の散乱体分布を、癌病変に先行する形成不全遷移と相互に関連させることが可能である。
角度分解型のFD−OCTから取得した角度別後方散乱分布を処理する別の方法は、それらの角周波数コンテンツの分析を含んでいる。画像コントラストの尺度は、最大電力を有する角周波数ビン(Angular Frequency Bin)と、最大電力を有するピークの幅とを含む。角度別後方散乱分布の電力−スペクトル密度の分析は、ウィーナー・ヒンチン(Wiener-Kinchine)の定理による自動相関関数の分析と等価である。正規化された自動相関関数Cは、次の式(5)によって提供され得る。
スペックルを低減させるべく使用可能な本発明に係るシステム及び方法の代表的な実施例を以下の実験によって検証した。水溶性寒天ゲル(0.5重量%(パーセント)の寒天)及び直径0.3mmのポリマーミクロスフィア(Polymer Microsphere)(デューク サイアンティフィック(Duke Scientific)から入手)によって、2つのレイヤの組織ファントム(Phantom)を形成した。この組織ファントムをシリコーンアイソレータ(Silicone Isolator)(シグマ(Sigma)から入手)内に収容した。2mmの適切な深さを有する最初の散乱レイヤ(第1散乱レイヤ)を形成した。第1散乱レイヤよりも小さな散乱係数を有するように設計された第2散乱レイヤを第1散乱レイヤの上に形成した。この第2散乱レイヤは、約450mmの深さを有していた。深さとの関係において指数的な信号減衰を分析することにより、合計散乱係数は、第1レイヤ及び第2レイヤについて、それぞれ、24cm−1及び12cm−1と推定された。
Claims (19)
- 少なくとも1つの第1電磁波を受信し、且つ、立体角内の合焦された少なくとも1つの第2電磁波をサンプルに対して転送するべく構成された少なくとも1つの第1構成部であって、この場合に、前記合焦された少なくとも1つの第2電磁波は、前記少なくとも1つの第1電磁波と関連付けられており、この場合に、前記少なくとも1つの第1構成部は、前記合焦された少なくとも1つの第2電磁波と関連付けられた前記サンプルから複数の第3電磁波を受信するべく構成されており、且つ、この場合に、前記第3電磁波の少なくとも1つの部分は、前記立体角の外縁の外において提供されている、少なくとも1つの第1構成部と、
前記第3電磁波の各々と関連付けられた信号を同時に検出して組み合わせるべく構成された少なくとも1つの第2構成部であって、この場合に、前記信号は、前記サンプル内の複数の深さにおける少なくとも1つのサンプルの情報と関連付けられており、且つ、この場合に、前記少なくとも1つの第2構成部は、前記第3電磁波の中の前記少なくとも1つの部分を使用することにより、前記サンプル内の複数の深さを判定するべく構成されている、少なくとも1つの第2構成部とを有することを特徴とする装置。 - 前記第3電磁波の前記少なくとも1つの部分と、前記少なくとも1つの第1電磁波と関連付けられた少なくとも1つの第4電磁波との間の干渉を検出するべく構成され、且つ、前記干渉に基づいて前記サンプル内の深さの関数として、前記サンプルと関連付けられた情報を取得するべく構成された少なくとも1つの第3構成部を更に有する請求項1記載の装置。
- 前記信号の関数として、前記サンプルの少なくとも1つの部分の複屈折特性、分光特性、モーション、角度別後方散乱特性、又は弾性特性の少なくとも1つのものと関連付けられたデータを提供するべく構成された少なくとも1つの第3構成部を更に有する請求項1記載の装置。
- 前記信号の関数として、前記サンプルの少なくとも1つの部分の少なくとも1つの画像を生成することが可能である少なくとも1つの第3構成部を更に有する請求項1記載の装置。
- 前記少なくとも1つの第3構成部は、前記信号の関数として、前記サンプルの少なくとも1つの部分の複屈折特性、分光特性、モーション、角度別後方散乱特性、又は弾性特性の少なくとも1つのものと関連付けられたデータを提供するべく更に構成されている請求項4記載の装置。
- 前記データは、前記少なくとも1つの画像と関連付けられたコントラストデータである請求項5記載の装置。
- 前記信号の組み合わせの関数として、前記サンプルの少なくとも1つの部分の散乱特性と関連付けられたデータを提供するべく構成された少なくとも1つの第3構成部を更に有する請求項1記載の装置。
- 前記少なくとも1つの第2構成部は、前記第3電磁波の中の単一のものを使用して前記サンプル内の複数の深さを判定することが可能である請求項1記載の装置。
- 信号を検出する装置の作動方法であって、
前記装置の第1構成部が、少なくとも1つの第1電磁波を受信する段階と、
前記第1構成部が、立体角内の少なくとも1つの第2電磁波をサンプルに対して転送する段階であって、この場合に、前記少なくとも1つの第2電磁波は、前記少なくとも1つの第1電磁波と関連付けられている段階と、
前記第1構成部が、前記少なくとも1つの合焦された第2電磁波と関連付けられた前記サンプルから複数の第3電磁波を受信する段階であって、この場合に、前記第3電磁波の少なくとも1つの部分は、前記立体角の外縁の外において提供されている段階と、
前記装置の第2構成部が、前記第3電磁波の各々と関連付けられた前記信号を同時に検出して組み合わせる段階であって、この場合に、前記信号は、前記サンプル内の複数の深さにおける前記少なくとも1つのサンプルの情報と関連付けられている段階と、
前記第2構成部が、前記第3電磁波の中の前記少なくとも1つの部分を使用することにより、前記サンプル内の複数の深さを判定する段階とを有することを特徴とする方法。 - 少なくとも1つの第1電磁波を受信し、且つ、立体角内の少なくとも1つの合焦された第2電磁波をサンプルに転送するべく構成された少なくとも1つの第1構成部であって、この場合に、前記少なくとも1つの合焦された第2電磁波は、前記少なくとも1つの第1電磁波と関連付けられており、この場合に、前記少なくとも1つの第1構成部は、前記少なくとも1つの第2電磁波と関連付けられた前記サンプルから複数の第3電磁波の中の少なくとも2つのものを同時に受信するべく構成されており、且つ、この場合に、前記第3電磁波の少なくとも1つの部分は、前記立体角の外縁の外において提供されている、少なくとも1つの第1構成部と、
(i)前記第3電磁波と関連付けられた信号を同時に検出して組み合わせ(ii)前記第3電磁波に基づいて前記サンプル内の少なくとも1つの深さの関数として、前記サンプルと関連付けられた情報を取得するべく構成された少なくとも1つの第2構成部とを有することを特徴とする装置。 - 前記少なくとも1つの第2構成部は、前記第3電磁波に基づいて前記少なくとも1つの深さを判定するべく構成されている請求項10記載の装置。
- 前記少なくとも1つの第2構成部は、前記第3電磁波の各々と関連付けられた前記信号を同時に検出するべく構成されている請求項10記載の装置。
- 前記信号の関数として、前記サンプルの少なくとも1つの部分の複屈折特性、分光特性、モーション、又は弾性特性の少なくとも1つのものと関連付けられたデータを提供するべく構成された少なくとも1つの第3構成部を更に有する請求項12記載の装置。
- 前記信号の関数として、前記サンプルの少なくとも1つの部分の少なくとも1つの断面画像を生成するよう構成されている少なくとも1つの第3構成部を更に有する請求項10記載の装置。
- 前記少なくとも1つの第3構成部は、前記信号の関数として、前記サンプルの少なくとも1つの部分の複屈折特性、分光特性、モーション、又は弾性特性の少なくとも1つのものと関連付けられたデータを提供するべく更に構成されている請求項14記載の装置。
- 前記データは、前記少なくとも1つの断面画像と関連付けられたコントラストデータである請求項15記載の装置。
- 前記信号の前記組み合わせの関数として、前記サンプルの少なくとも1つの部分の散乱特性と関連付けられたデータを提供するべく構成された少なくとも1つの第3構成部を更に有する請求項12記載の装置。
- 前記少なくとも1つの第2構成部は、前記第3電磁波の中の単一のものを使用して前記少なくとも1つの深さを判定するよう構成されている請求項11記載の装置。
- 信号を検出する装置の作動方法であって、
前記装置の第1構成部が、少なくとも1つの第1電磁波を受信する段階と、
前記第1構成部が、立体角内の少なくとも1つの合焦された第2電磁波をサンプルに対して転送する段階であって、この場合に、前記少なくとも1つの合焦された第2電磁波は、前記少なくとも1つの第1電磁波と関連付けられている段階と、
前記第1構成部が、前記少なくとも1つの第2電磁波と関連付けられた前記サンプルから複数の第3電磁波の中の少なくとも2つのものを同時に受信する段階であって、前記第3電磁波の少なくとも1つの部分は、前記立体角の外縁の外において提供されている段階と、
前記装置の第2構成部が、前記第3電磁波と関連付けられた信号を同時に検出して組み合わせる段階と、
前記第2構成部が、前記第3電磁波に基づいて前記サンプル内の少なくとも1つの深さの関数として、前記サンプルと関連付けられた情報を取得する段階とを有することを特徴とする方法。
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US20070201033A1 (en) | 2007-08-30 |
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EP1987318B1 (en) | 2015-08-12 |
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