JP2002015565A
(ja)
*
|
2000-06-29 |
2002-01-18 |
Mitsubishi Electric Corp |
半導体記憶装置
|
JP4782937B2
(ja)
*
|
2001-03-27 |
2011-09-28 |
株式会社東芝 |
半導体記憶装置
|
US6515513B2
(en)
*
|
2001-04-30 |
2003-02-04 |
Intel Corporation |
Reducing leakage currents in integrated circuits
|
TWI230392B
(en)
|
2001-06-18 |
2005-04-01 |
Innovative Silicon Sa |
Semiconductor device
|
US7068552B2
(en)
*
|
2001-06-21 |
2006-06-27 |
Kabushiki Kaisha Toshiba |
Sense amplifier
|
JP5119563B2
(ja)
*
|
2001-08-03 |
2013-01-16 |
日本電気株式会社 |
不良メモリセル救済回路を有する半導体記憶装置
|
US6909659B2
(en)
*
|
2001-08-30 |
2005-06-21 |
Micron Technology, Inc. |
Zero power chip standby mode
|
JP3831270B2
(ja)
*
|
2002-01-31 |
2006-10-11 |
株式会社ルネサステクノロジ |
論理回路及び半導体集積回路
|
US20030227320A1
(en)
*
|
2002-06-05 |
2003-12-11 |
Intel Corporation |
Buffer, buffer operation and method of manufacture
|
JP2004021574A
(ja)
*
|
2002-06-17 |
2004-01-22 |
Hitachi Ltd |
半導体装置
|
JP2004031411A
(ja)
*
|
2002-06-21 |
2004-01-29 |
Renesas Technology Corp |
半導体装置
|
KR100482370B1
(ko)
*
|
2002-09-27 |
2005-04-13 |
삼성전자주식회사 |
게이트 산화막의 두께가 다른 반도체장치
|
JP3681063B2
(ja)
*
|
2002-10-04 |
2005-08-10 |
松下電器産業株式会社 |
バイアス電位発生回路
|
JP4052923B2
(ja)
*
|
2002-10-25 |
2008-02-27 |
株式会社ルネサステクノロジ |
半導体装置
|
US6791361B2
(en)
*
|
2002-12-12 |
2004-09-14 |
International Business Machines Corporation |
Technique for mitigating gate leakage during a sleep state
|
US7053692B2
(en)
*
|
2002-12-19 |
2006-05-30 |
United Memories, Inc. |
Powergate control using boosted and negative voltages
|
US6936898B2
(en)
*
|
2002-12-31 |
2005-08-30 |
Transmeta Corporation |
Diagonal deep well region for routing body-bias voltage for MOSFETS in surface well regions
|
JP4184104B2
(ja)
*
|
2003-01-30 |
2008-11-19 |
株式会社ルネサステクノロジ |
半導体装置
|
JP3825756B2
(ja)
*
|
2003-02-17 |
2006-09-27 |
富士通株式会社 |
半導体集積回路
|
JP4363871B2
(ja)
*
|
2003-03-19 |
2009-11-11 |
Okiセミコンダクタ株式会社 |
半導体装置
|
US6853591B2
(en)
|
2003-03-31 |
2005-02-08 |
Micron Technology, Inc. |
Circuit and method for decreasing the required refresh rate of DRAM devices
|
US20040228168A1
(en)
|
2003-05-13 |
2004-11-18 |
Richard Ferrant |
Semiconductor memory device and method of operating same
|
US7335934B2
(en)
|
2003-07-22 |
2008-02-26 |
Innovative Silicon S.A. |
Integrated circuit device, and method of fabricating same
|
US7248522B2
(en)
*
|
2003-09-04 |
2007-07-24 |
United Memories, Inc. |
Sense amplifier power-gating technique for integrated circuit memory devices and those devices incorporating embedded dynamic random access memory (DRAM)
|
US7372765B2
(en)
*
|
2003-09-04 |
2008-05-13 |
United Memories, Inc. |
Power-gating system and method for integrated circuit devices
|
US7359277B2
(en)
*
|
2003-09-04 |
2008-04-15 |
United Memories, Inc. |
High speed power-gating technique for integrated circuit devices incorporating a sleep mode of operation
|
DE10342997A1
(de)
*
|
2003-09-17 |
2005-04-28 |
Infineon Technologies Ag |
Elektronischer Schaltkreis, Schaltkreis-Testanordnung und Verfahren zum Ermitteln der Funktionsfähigkeit eines elektronischen Schaltkreises
|
US6850105B1
(en)
|
2003-09-30 |
2005-02-01 |
Starcore, Llc |
Method and circuitry for preserving a logic state
|
JP4435553B2
(ja)
*
|
2003-12-12 |
2010-03-17 |
パナソニック株式会社 |
半導体装置
|
US7109532B1
(en)
*
|
2003-12-23 |
2006-09-19 |
Lee Zachary K |
High Ion/Ioff SOI MOSFET using body voltage control
|
FR2868181B1
(fr)
*
|
2004-03-29 |
2006-05-26 |
Soisic Sa |
Procede de simulation d'un circuit a l'etat stationnaire
|
JP4549711B2
(ja)
*
|
2004-03-29 |
2010-09-22 |
ルネサスエレクトロニクス株式会社 |
半導体回路装置
|
US7365596B2
(en)
*
|
2004-04-06 |
2008-04-29 |
Freescale Semiconductor, Inc. |
State retention within a data processing system
|
US7255476B2
(en)
*
|
2004-04-14 |
2007-08-14 |
International Business Machines Corporation |
On chip temperature measuring and monitoring circuit and method
|
JP2005327862A
(ja)
*
|
2004-05-13 |
2005-11-24 |
Toshiba Corp |
半導体集積回路及び半導体集積回路の設計方法
|
EP1826651A1
(de)
*
|
2004-05-14 |
2007-08-29 |
Zmos Technology, Inc. |
Interner Spannungsregler und Methode zur Leistungs-Management
|
US7292088B2
(en)
*
|
2004-05-19 |
2007-11-06 |
International Rectifier Corporation |
Gate driver output stage with bias circuit for high and wide operating voltage range
|
US7112997B1
(en)
*
|
2004-05-19 |
2006-09-26 |
Altera Corporation |
Apparatus and methods for multi-gate silicon-on-insulator transistors
|
US7084667B2
(en)
*
|
2004-07-13 |
2006-08-01 |
International Business Machines Corporation |
Low leakage monotonic CMOS logic
|
US7203097B2
(en)
*
|
2004-07-27 |
2007-04-10 |
Samsung Electronics Co., Ltd. |
Method of operating a semiconductor device and the semiconductor device
|
CN101036064A
(zh)
*
|
2004-10-12 |
2007-09-12 |
半导体元件工业有限责任公司 |
测试电源控制器的方法及其结构
|
JP4496069B2
(ja)
*
|
2004-12-20 |
2010-07-07 |
株式会社東芝 |
Mos型半導体集積回路装置
|
US7187205B2
(en)
*
|
2005-02-25 |
2007-03-06 |
Freescale Semiconductor, Inc. |
Integrated circuit storage element having low power data retention and method therefor
|
US7394708B1
(en)
*
|
2005-03-18 |
2008-07-01 |
Xilinx, Inc. |
Adjustable global tap voltage to improve memory cell yield
|
KR100744114B1
(ko)
*
|
2005-05-12 |
2007-08-01 |
삼성전자주식회사 |
상 변화 메모리 장치 및 그 워드라인 구동방법
|
CA2608323A1
(en)
*
|
2005-05-13 |
2006-11-23 |
Mosaid Technologies Corporation |
Integrated circuit with signal bus formed by cell abutment of logic cells
|
US8736304B2
(en)
*
|
2005-06-30 |
2014-05-27 |
International Business Machines Corporation |
Self-biased high speed level shifter circuit
|
US20070008004A1
(en)
*
|
2005-07-11 |
2007-01-11 |
Vikram Santurkar |
Apparatus and methods for low-power routing circuitry in programmable logic devices
|
US7236408B2
(en)
*
|
2005-07-19 |
2007-06-26 |
International Business Machines Corporation |
Electronic circuit having variable biasing
|
US7355449B1
(en)
*
|
2005-08-03 |
2008-04-08 |
Altera Corporation |
High-speed serial data transmitter architecture
|
US7606066B2
(en)
|
2005-09-07 |
2009-10-20 |
Innovative Silicon Isi Sa |
Memory cell and memory cell array having an electrically floating body transistor, and methods of operating same
|
JP4832841B2
(ja)
*
|
2005-09-22 |
2011-12-07 |
三菱電機株式会社 |
半導体装置
|
US7913141B2
(en)
*
|
2006-08-16 |
2011-03-22 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
Power gating in integrated circuits for leakage reduction
|
US7683430B2
(en)
|
2005-12-19 |
2010-03-23 |
Innovative Silicon Isi Sa |
Electrically floating body memory cell and array, and method of operating or controlling same
|
US7712066B2
(en)
*
|
2005-12-29 |
2010-05-04 |
Agere Systems, Inc. |
Area-efficient power switching cell
|
JP2007227625A
(ja)
*
|
2006-02-23 |
2007-09-06 |
Toshiba Microelectronics Corp |
半導体集積回路及びそのレイアウト設計方法
|
US7911855B2
(en)
|
2006-02-24 |
2011-03-22 |
Renesas Technology Corp. |
Semiconductor device with voltage interconnections
|
JP4936749B2
(ja)
*
|
2006-03-13 |
2012-05-23 |
株式会社東芝 |
半導体記憶装置
|
US7492632B2
(en)
|
2006-04-07 |
2009-02-17 |
Innovative Silicon Isi Sa |
Memory array having a programmable word length, and method of operating same
|
WO2007128738A1
(en)
|
2006-05-02 |
2007-11-15 |
Innovative Silicon Sa |
Semiconductor memory cell and array using punch-through to program and read same
|
KR100886628B1
(ko)
*
|
2006-05-10 |
2009-03-04 |
주식회사 하이닉스반도체 |
반도체 장치의 내부전압 생성회로
|
US7400175B2
(en)
*
|
2006-05-31 |
2008-07-15 |
Fujitsu Limited |
Recycling charge to reduce energy consumption during mode transition in multithreshold complementary metal-oxide-semiconductor (MTCMOS) circuits
|
JP4322888B2
(ja)
*
|
2006-06-01 |
2009-09-02 |
エルピーダメモリ株式会社 |
半導体装置
|
US8069377B2
(en)
|
2006-06-26 |
2011-11-29 |
Micron Technology, Inc. |
Integrated circuit having memory array including ECC and column redundancy and method of operating the same
|
US7542340B2
(en)
|
2006-07-11 |
2009-06-02 |
Innovative Silicon Isi Sa |
Integrated circuit including memory array having a segmented bit line architecture and method of controlling and/or operating same
|
US8384641B2
(en)
*
|
2006-08-25 |
2013-02-26 |
Sharp Kabushiki Kaisha |
Amplifier circuit and display device including same
|
JP5034379B2
(ja)
*
|
2006-08-30 |
2012-09-26 |
富士通セミコンダクター株式会社 |
半導体メモリおよびシステム
|
WO2008036047A1
(en)
*
|
2006-09-21 |
2008-03-27 |
Nanyang Technological University |
Triple well transmit-receive switch transistor
|
JP2008085571A
(ja)
*
|
2006-09-27 |
2008-04-10 |
Nec Electronics Corp |
半導体集積回路
|
US8020018B2
(en)
*
|
2006-09-28 |
2011-09-13 |
Infineon Technologies Ag |
Circuit arrangement and method of operating a circuit arrangement
|
US8294510B2
(en)
*
|
2006-12-26 |
2012-10-23 |
Renesas Electronics Corporation |
CMOS circuit and semiconductor device with multiple operation mode biasing
|
KR101277402B1
(ko)
|
2007-01-26 |
2013-06-20 |
마이크론 테크놀로지, 인코포레이티드 |
게이트형 바디 영역으로부터 격리되는 소스/드레인 영역을 포함하는 플로팅-바디 dram 트랜지스터
|
US20080211568A1
(en)
*
|
2007-03-01 |
2008-09-04 |
Infineon Technologies Ag |
MuGFET POWER SWITCH
|
WO2009031052A2
(en)
|
2007-03-29 |
2009-03-12 |
Innovative Silicon S.A. |
Zero-capacitor (floating body) random access memory circuits with polycide word lines and manufacturing methods therefor
|
KR100884603B1
(ko)
*
|
2007-05-09 |
2009-02-19 |
주식회사 하이닉스반도체 |
반도체소자의 버퍼장치
|
JP5162956B2
(ja)
*
|
2007-05-11 |
2013-03-13 |
ソニー株式会社 |
半導体集積回路およびその動作方法
|
US8064274B2
(en)
|
2007-05-30 |
2011-11-22 |
Micron Technology, Inc. |
Integrated circuit having voltage generation circuitry for memory cell array, and method of operating and/or controlling same
|
US8085594B2
(en)
|
2007-06-01 |
2011-12-27 |
Micron Technology, Inc. |
Reading technique for memory cell with electrically floating body transistor
|
JP4967889B2
(ja)
*
|
2007-07-24 |
2012-07-04 |
ソニー株式会社 |
半導体集積回路およびその起動方法
|
US8194487B2
(en)
|
2007-09-17 |
2012-06-05 |
Micron Technology, Inc. |
Refreshing data of memory cells with electrically floating body transistors
|
JP5215622B2
(ja)
*
|
2007-09-19 |
2013-06-19 |
ルネサスエレクトロニクス株式会社 |
半導体集積回路、および、半導体集積回路の制御方法
|
KR100906059B1
(ko)
*
|
2007-11-05 |
2009-07-03 |
주식회사 동부하이텍 |
Mtcmos셀 제조 방법
|
US8536628B2
(en)
|
2007-11-29 |
2013-09-17 |
Micron Technology, Inc. |
Integrated circuit having memory cell array including barriers, and method of manufacturing same
|
US8349662B2
(en)
|
2007-12-11 |
2013-01-08 |
Micron Technology, Inc. |
Integrated circuit having memory cell array, and method of manufacturing same
|
US20090179664A1
(en)
*
|
2008-01-10 |
2009-07-16 |
Janet Wang |
Method and Apparatus for Controlling Leakage in a Circuit
|
US8773933B2
(en)
|
2012-03-16 |
2014-07-08 |
Micron Technology, Inc. |
Techniques for accessing memory cells
|
US8014195B2
(en)
|
2008-02-06 |
2011-09-06 |
Micron Technology, Inc. |
Single transistor memory cell
|
US8189376B2
(en)
|
2008-02-08 |
2012-05-29 |
Micron Technology, Inc. |
Integrated circuit having memory cells including gate material having high work function, and method of manufacturing same
|
TWI386950B
(zh)
*
|
2008-03-21 |
2013-02-21 |
Vanguard Int Semiconduct Corp |
記憶體系統
|
US7957206B2
(en)
|
2008-04-04 |
2011-06-07 |
Micron Technology, Inc. |
Read circuitry for an integrated circuit having memory cells and/or a memory cell array, and method of operating same
|
JP2010098081A
(ja)
*
|
2008-09-16 |
2010-04-30 |
Hitachi Ltd |
半導体装置
|
US7947543B2
(en)
|
2008-09-25 |
2011-05-24 |
Micron Technology, Inc. |
Recessed gate silicon-on-insulator floating body device with self-aligned lateral isolation
|
US7978001B2
(en)
*
|
2008-09-25 |
2011-07-12 |
Via Technologies, Inc. |
Microprocessor with selective substrate biasing for clock-gated functional blocks
|
TWI405297B
(zh)
*
|
2008-09-25 |
2013-08-11 |
Via Tech Inc |
微處理器、積體電路以及晶片雜訊減少方法
|
US7920019B2
(en)
*
|
2008-09-25 |
2011-04-05 |
Via Technologies, Inc. |
Microprocessor with substrate bias clamps
|
US7933140B2
(en)
|
2008-10-02 |
2011-04-26 |
Micron Technology, Inc. |
Techniques for reducing a voltage swing
|
US7924630B2
(en)
|
2008-10-15 |
2011-04-12 |
Micron Technology, Inc. |
Techniques for simultaneously driving a plurality of source lines
|
TWI423256B
(zh)
*
|
2008-10-29 |
2014-01-11 |
Etron Technology Inc |
資料感測裝置與方法
|
US8223574B2
(en)
|
2008-11-05 |
2012-07-17 |
Micron Technology, Inc. |
Techniques for block refreshing a semiconductor memory device
|
KR101140347B1
(ko)
|
2008-11-19 |
2012-05-03 |
한국전자통신연구원 |
동적 문턱 전압 소자를 이용한 스위칭 회로 및 이를 포함하는 휴대기기용 dc-dc 변환기
|
US9886389B2
(en)
*
|
2008-11-21 |
2018-02-06 |
International Business Machines Corporation |
Cache memory bypass in a multi-core processor (MCP)
|
US8806129B2
(en)
*
|
2008-11-21 |
2014-08-12 |
International Business Machines Corporation |
Mounted cache memory in a multi-core processor (MCP)
|
US9824008B2
(en)
*
|
2008-11-21 |
2017-11-21 |
International Business Machines Corporation |
Cache memory sharing in a multi-core processor (MCP)
|
US7804329B2
(en)
*
|
2008-11-21 |
2010-09-28 |
International Business Machines Corporation |
Internal charge transfer for circuits
|
US9122617B2
(en)
*
|
2008-11-21 |
2015-09-01 |
International Business Machines Corporation |
Pseudo cache memory in a multi-core processor (MCP)
|
US8213226B2
(en)
|
2008-12-05 |
2012-07-03 |
Micron Technology, Inc. |
Vertical transistor memory cell and array
|
JP2010146620A
(ja)
*
|
2008-12-17 |
2010-07-01 |
Elpida Memory Inc |
半導体記憶装置
|
US7940580B2
(en)
*
|
2008-12-19 |
2011-05-10 |
Advanced Micro Devices, Inc. |
Voltage shifting word-line driver and method therefor
|
US8319294B2
(en)
|
2009-02-18 |
2012-11-27 |
Micron Technology, Inc. |
Techniques for providing a source line plane
|
WO2010102106A2
(en)
|
2009-03-04 |
2010-09-10 |
Innovative Silicon Isi Sa |
Techniques for forming a contact to a buried diffusion layer in a semiconductor memory device
|
WO2010114890A1
(en)
|
2009-03-31 |
2010-10-07 |
Innovative Silicon Isi Sa |
Techniques for providing a semiconductor memory device
|
US8406075B2
(en)
*
|
2009-04-03 |
2013-03-26 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
Ultra-low leakage memory architecture
|
JP5599984B2
(ja)
*
|
2009-04-06 |
2014-10-01 |
ピーエスフォー ルクスコ エスエイアールエル |
半導体装置
|
US8139418B2
(en)
|
2009-04-27 |
2012-03-20 |
Micron Technology, Inc. |
Techniques for controlling a direct injection semiconductor memory device
|
US8508994B2
(en)
|
2009-04-30 |
2013-08-13 |
Micron Technology, Inc. |
Semiconductor device with floating gate and electrically floating body
|
US8498157B2
(en)
|
2009-05-22 |
2013-07-30 |
Micron Technology, Inc. |
Techniques for providing a direct injection semiconductor memory device
|
US8537610B2
(en)
|
2009-07-10 |
2013-09-17 |
Micron Technology, Inc. |
Techniques for providing a semiconductor memory device
|
US9076543B2
(en)
|
2009-07-27 |
2015-07-07 |
Micron Technology, Inc. |
Techniques for providing a direct injection semiconductor memory device
|
US8199595B2
(en)
|
2009-09-04 |
2012-06-12 |
Micron Technology, Inc. |
Techniques for sensing a semiconductor memory device
|
GB2473257B
(en)
*
|
2009-09-07 |
2016-11-02 |
Broadcom Innovision Ltd |
NFC communicators and NFC communications enabled devices
|
US8174881B2
(en)
|
2009-11-24 |
2012-05-08 |
Micron Technology, Inc. |
Techniques for reducing disturbance in a semiconductor device
|
JP5458850B2
(ja)
*
|
2009-12-09 |
2014-04-02 |
富士通株式会社 |
半導体装置
|
KR102046308B1
(ko)
*
|
2009-12-11 |
2019-11-19 |
가부시키가이샤 한도오따이 에네루기 켄큐쇼 |
반도체 장치
|
US8310893B2
(en)
|
2009-12-16 |
2012-11-13 |
Micron Technology, Inc. |
Techniques for reducing impact of array disturbs in a semiconductor memory device
|
US20110157140A1
(en)
*
|
2009-12-31 |
2011-06-30 |
Silicon Laboratories Inc. |
Voltage control on n-wells in multi-voltage environments
|
US8258861B2
(en)
|
2010-01-08 |
2012-09-04 |
Analog Devices, Inc. |
Systems and methods for minimizing power consumption
|
US7986166B1
(en)
*
|
2010-01-12 |
2011-07-26 |
Freescale Semiconductor, Inc. |
Clock buffer circuit
|
US8416636B2
(en)
|
2010-02-12 |
2013-04-09 |
Micron Technology, Inc. |
Techniques for controlling a semiconductor memory device
|
US8411513B2
(en)
|
2010-03-04 |
2013-04-02 |
Micron Technology, Inc. |
Techniques for providing a semiconductor memory device having hierarchical bit lines
|
US8576631B2
(en)
|
2010-03-04 |
2013-11-05 |
Micron Technology, Inc. |
Techniques for sensing a semiconductor memory device
|
US8369177B2
(en)
|
2010-03-05 |
2013-02-05 |
Micron Technology, Inc. |
Techniques for reading from and/or writing to a semiconductor memory device
|
CN102812552B
(zh)
|
2010-03-15 |
2015-11-25 |
美光科技公司 |
半导体存储器装置及用于对半导体存储器装置进行偏置的方法
|
US8411524B2
(en)
|
2010-05-06 |
2013-04-02 |
Micron Technology, Inc. |
Techniques for refreshing a semiconductor memory device
|
US8473793B2
(en)
*
|
2010-06-10 |
2013-06-25 |
Global Unichip Corporation |
Low leakage boundary scan device design and implementation
|
US8278977B2
(en)
*
|
2010-06-25 |
2012-10-02 |
Freescale Semiconductor, Inc. |
Refresh operation during low power mode configuration
|
KR101681287B1
(ko)
|
2010-12-10 |
2016-11-29 |
엘지디스플레이 주식회사 |
공핍형 박막 트랜지스터의 측정방법
|
US8713388B2
(en)
|
2011-02-23 |
2014-04-29 |
Qualcomm Incorporated |
Integrated circuit testing with power collapsed
|
US8531878B2
(en)
|
2011-05-17 |
2013-09-10 |
Micron Technology, Inc. |
Techniques for providing a semiconductor memory device
|
US9559216B2
(en)
|
2011-06-06 |
2017-01-31 |
Micron Technology, Inc. |
Semiconductor memory device and method for biasing same
|
JP5707634B2
(ja)
*
|
2011-06-12 |
2015-04-30 |
光俊 菅原 |
トンネル電流回路
|
US8654562B2
(en)
*
|
2012-01-17 |
2014-02-18 |
Texas Instruments Incorporated |
Static random access memory cell with single-sided buffer and asymmetric construction
|
WO2013125163A1
(ja)
*
|
2012-02-24 |
2013-08-29 |
パナソニック株式会社 |
基準電圧源回路
|
US9112495B1
(en)
*
|
2013-03-15 |
2015-08-18 |
Mie Fujitsu Semiconductor Limited |
Integrated circuit device body bias circuits and methods
|
WO2014188514A1
(ja)
*
|
2013-05-21 |
2014-11-27 |
ルネサスエレクトロニクス株式会社 |
半導体集積回路装置
|
KR102021572B1
(ko)
*
|
2013-10-01 |
2019-09-16 |
에스케이하이닉스 주식회사 |
반도체 장치
|
WO2015175427A1
(en)
*
|
2014-05-11 |
2015-11-19 |
The Regents Of The University Of California |
Self-organized critical cmos circuits and methods for computation and information processing
|
JP2016092536A
(ja)
|
2014-10-31 |
2016-05-23 |
ルネサスエレクトロニクス株式会社 |
半導体装置
|
JP6346100B2
(ja)
*
|
2015-01-16 |
2018-06-20 |
株式会社東芝 |
半導体記憶装置
|
US9780786B2
(en)
*
|
2016-01-26 |
2017-10-03 |
Micron Technology, Inc. |
Apparatus and method for standby current control of signal path
|
US9666266B1
(en)
*
|
2016-05-09 |
2017-05-30 |
Xilinx, Inc. |
Power control over memory cell arrays
|
US9990986B1
(en)
*
|
2016-12-06 |
2018-06-05 |
Samsung Electronics Co., Ltd. |
Static random access memory device having uniform write characteristics
|
US9906224B1
(en)
*
|
2017-01-24 |
2018-02-27 |
Taiwan Semiconductor Manufacturing Co., Ltd. |
Semiconductor device to dispel charges and method forming the same
|
KR20180127776A
(ko)
*
|
2017-05-22 |
2018-11-30 |
에스케이하이닉스 주식회사 |
전원 게이팅 회로를 포함하는 반도체 장치 및 이의 리페어 방법
|
US10332582B2
(en)
|
2017-08-02 |
2019-06-25 |
Qualcomm Incorporated |
Partial refresh technique to save memory refresh power
|
JP6921780B2
(ja)
*
|
2018-04-13 |
2021-08-18 |
ルネサスエレクトロニクス株式会社 |
半導体装置
|
US10355694B1
(en)
*
|
2018-04-24 |
2019-07-16 |
Stmicroelectronics International N.V. |
Level shifting circuit with conditional body biasing of transistors
|
US10504563B1
(en)
*
|
2018-06-06 |
2019-12-10 |
Micron Technology, Inc. |
Methods and apparatuses of driver circuits without voltage level shifters
|
KR102573270B1
(ko)
*
|
2018-10-08 |
2023-08-31 |
삼성전자주식회사 |
반도체 메모리 장치 및 이의 구동 방법
|
US10826498B2
(en)
*
|
2019-03-07 |
2020-11-03 |
Purdue Research Foundation |
Low power logic family
|
US10790809B1
(en)
|
2019-09-04 |
2020-09-29 |
Semtech Corporation |
Feed-forward current compensation for CMOS signal path
|
US20210175171A1
(en)
*
|
2019-12-10 |
2021-06-10 |
Samsung Electronics Co., Ltd. |
Semiconductor device including power gating switches
|
JP2021097317A
(ja)
*
|
2019-12-17 |
2021-06-24 |
セイコーエプソン株式会社 |
フリップフロップ回路および発振器
|
KR20210150914A
(ko)
*
|
2020-06-04 |
2021-12-13 |
에스케이하이닉스 주식회사 |
리프레쉬동작에서 공급되는 액티브전압의 레벨을 조절하는 장치
|
US11676897B2
(en)
*
|
2021-05-26 |
2023-06-13 |
Qualcomm Incorporated |
Power gating switch tree structure for reduced wake-up time and power leakage
|
TWI797821B
(zh)
*
|
2021-11-08 |
2023-04-01 |
美商矽成積體電路股份有限公司 |
電源開關電晶體之尺寸設定方法及其系統
|
CN116027842B
(zh)
*
|
2023-03-24 |
2023-06-23 |
长鑫存储技术有限公司 |
功率控制电路、存储器及电子设备
|