WO2008142919A1 - 可変抵抗素子とその製造方法及び不揮発性半導体記憶装置 - Google Patents

可変抵抗素子とその製造方法及び不揮発性半導体記憶装置 Download PDF

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Publication number
WO2008142919A1
WO2008142919A1 PCT/JP2008/056859 JP2008056859W WO2008142919A1 WO 2008142919 A1 WO2008142919 A1 WO 2008142919A1 JP 2008056859 W JP2008056859 W JP 2008056859W WO 2008142919 A1 WO2008142919 A1 WO 2008142919A1
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WIPO (PCT)
Prior art keywords
resistive element
variable resistive
electrode
metal oxide
oxide layer
Prior art date
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PCT/JP2008/056859
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English (en)
French (fr)
Inventor
Yukio Tamai
Hisashi Shima
Hiroyuki Akinaga
Fumiyoshi Takano
Yasunari Hosoi
Nobuyoshi Awaya
Shigeo Ohnishi
Kazuya Ishihara
Original Assignee
Sharp Kabushiki Kaisha
National Institute Of Advanced Industrial Science And Technology
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Publication date
Application filed by Sharp Kabushiki Kaisha, National Institute Of Advanced Industrial Science And Technology filed Critical Sharp Kabushiki Kaisha
Priority to CN2008800154498A priority Critical patent/CN101681913B/zh
Priority to US12/598,642 priority patent/US8054674B2/en
Publication of WO2008142919A1 publication Critical patent/WO2008142919A1/ja

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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0009—RRAM elements whose operation depends upon chemical change
    • G11C13/0011—RRAM elements whose operation depends upon chemical change comprising conductive bridging RAM [CBRAM] or programming metallization cells [PMCs]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5614—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using conductive bridging RAM [CBRAM] or programming metallization cells [PMC]
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5685—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using storage elements comprising metal oxide memory material, e.g. perovskites
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0007—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising metal oxide memory material, e.g. perovskites
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/0069—Writing or programming circuits or methods
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B63/00—Resistance change memory devices, e.g. resistive RAM [ReRAM] devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/20—Multistable switching devices, e.g. memristors
    • H10N70/24—Multistable switching devices, e.g. memristors based on migration or redistribution of ionic species, e.g. anions, vacancies
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801—Constructional details of multistable switching devices
    • H10N70/821—Device geometry
    • H10N70/826—Device geometry adapted for essentially vertical current flow, e.g. sandwich or pillar type devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N70/00—Solid-state devices having no potential barriers, and specially adapted for rectifying, amplifying, oscillating or switching
    • H10N70/801—Constructional details of multistable switching devices
    • H10N70/881—Switching materials
    • H10N70/883—Oxides or nitrides
    • H10N70/8833—Binary metal oxides, e.g. TaOx
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/0069—Writing or programming circuits or methods
    • G11C2013/0073—Write using bi-directional cell biasing
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/0069—Writing or programming circuits or methods
    • G11C2013/0083—Write to perform initialising, forming process, electro forming or conditioning
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/0069—Writing or programming circuits or methods
    • G11C2013/009—Write using potential difference applied between cell electrodes
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/30—Resistive cell, memory material aspects
    • G11C2213/32—Material having simple binary metal oxide structure
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/30—Resistive cell, memory material aspects
    • G11C2213/34—Material includes an oxide or a nitride
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/50—Resistive cell structure aspects
    • G11C2213/51—Structure including a barrier layer preventing or limiting migration, diffusion of ions or charges or formation of electrolytes near an electrode
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/50—Resistive cell structure aspects
    • G11C2213/56—Structure including two electrodes, a memory active layer and a so called passive or source or reservoir layer which is NOT an electrode, wherein the passive or source or reservoir layer is a source of ions which migrate afterwards in the memory active layer to be only trapped there, to form conductive filaments there or to react with the material of the memory active layer in redox way
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2213/00—Indexing scheme relating to G11C13/00 for features not covered by this group
    • G11C2213/70—Resistive array aspects
    • G11C2213/77—Array wherein the memory element being directly connected to the bit lines and word lines without any access device being used

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  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Materials Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Memories (AREA)

Abstract

　高速且つ低消費電力動作が可能な可変抵抗素子を提供する。第１電極１１と第２電極１２の間に金属酸化物層１０を有し、第１及び第２電極間への電気的ストレスの印加に応じて、第１及び第２電極間の電気抵抗が可逆的に変化する可変抵抗素子であって、金属酸化物層１０が第１及び第２電極間を流れる電流の電流密度が局所的に高くなる電流経路であるフィラメント１３を有し、第１電極と第２電極の内の少なくとも何れか一方の特定電極１１と金属酸化物層１０の界面であって、少なくとも特定電極１１とフィラメント１３の界面近傍を含む一部に、特定電極１１に含まれる少なくとも１つの元素の酸化物であって、金属酸化物層１０の酸化物とは異なる界面酸化物１５を備える。
PCT/JP2008/056859 2007-05-10 2008-04-07 可変抵抗素子とその製造方法及び不揮発性半導体記憶装置 WO2008142919A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN2008800154498A CN101681913B (zh) 2007-05-10 2008-04-07 可变电阻元件及其制造方法和非易失性半导体存储装置
US12/598,642 US8054674B2 (en) 2007-05-10 2008-04-07 Variable resistive element, manufacturing method for same, and non-volatile semiconductor memory device

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
JP2007126016 2007-05-10
JP2007-126016 2007-05-10
JP2007292763A JP4967176B2 (ja) 2007-05-10 2007-11-12 可変抵抗素子とその製造方法及び不揮発性半導体記憶装置
JP2007-292763 2007-11-12

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US (1) US8054674B2 (ja)
JP (1) JP4967176B2 (ja)
CN (1) CN101681913B (ja)
TW (1) TW200908295A (ja)
WO (1) WO2008142919A1 (ja)

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WO2010119671A1 (ja) * 2009-04-15 2010-10-21 パナソニック株式会社 抵抗変化型不揮発性記憶装置
JP4642942B2 (ja) * 2009-04-27 2011-03-02 パナソニック株式会社 抵抗変化型不揮発性記憶素子の書き込み方法及び抵抗変化型不揮発性記憶装置
JP4653260B2 (ja) * 2009-04-10 2011-03-16 パナソニック株式会社 不揮発性記憶素子の駆動方法
CN102365746A (zh) * 2009-08-14 2012-02-29 4D-S有限公司 异质结氧化物非易失性存储器装置
US8279657B2 (en) 2008-12-04 2012-10-02 Panasonic Corporation Nonvolatile memory element and nonvolatile memory device
US8675393B2 (en) 2010-03-25 2014-03-18 Panasonic Corporation Method for driving non-volatile memory element, and non-volatile memory device
US8957399B2 (en) 2011-10-24 2015-02-17 Panasonic Intellectual Property Management Co., Ltd. Nonvolatile memory element and nonvolatile memory device
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