WO2008139644A1 - 固体撮像装置とその製造方法および撮像装置 - Google Patents
固体撮像装置とその製造方法および撮像装置 Download PDFInfo
- Publication number
- WO2008139644A1 WO2008139644A1 PCT/JP2007/066116 JP2007066116W WO2008139644A1 WO 2008139644 A1 WO2008139644 A1 WO 2008139644A1 JP 2007066116 W JP2007066116 W JP 2007066116W WO 2008139644 A1 WO2008139644 A1 WO 2008139644A1
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- WO
- WIPO (PCT)
- Prior art keywords
- imaging device
- light reception
- solid state
- state imaging
- film
- Prior art date
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- 238000003384 imaging method Methods 0.000 title abstract 4
- 239000007787 solid Substances 0.000 title abstract 3
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000009825 accumulation Methods 0.000 abstract 2
- 238000006243 chemical reaction Methods 0.000 abstract 1
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14601—Structural or functional details thereof
- H01L27/14636—Interconnect structures
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- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/08—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors
- H01L31/10—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof in which radiation controls flow of current through the device, e.g. photoresistors characterised by potential barriers, e.g. phototransistors
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- H01L27/144—Devices controlled by radiation
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- H01L27/14609—Pixel-elements with integrated switching, control, storage or amplification elements
- H01L27/1461—Pixel-elements with integrated switching, control, storage or amplification elements characterised by the photosensitive area
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- H01L27/14683—Processes or apparatus peculiar to the manufacture or treatment of these devices or parts thereof
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- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
- H01L27/146—Imager structures
- H01L27/14643—Photodiode arrays; MOS imagers
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- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Electromagnetism (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Light Receiving Elements (AREA)
Abstract
Priority Applications (6)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2007800529013A CN101669205B (zh) | 2007-05-07 | 2007-08-20 | 固态成像装置及其制造方法以及成像设备 |
US12/598,691 US8410418B2 (en) | 2007-05-07 | 2007-08-20 | Solid-state imaging device, method for manufacturing the same, and imaging apparatus |
EP07792729.1A EP2146376B1 (en) | 2007-05-07 | 2007-08-20 | Solid state imaging device, its manufacturing method, and imaging device |
KR1020147021003A KR101558120B1 (ko) | 2007-05-07 | 2007-08-20 | 고체 촬상 장치와 그 제조 방법 및 촬상 장치 |
US13/792,654 US9496306B2 (en) | 2007-05-07 | 2013-03-11 | Solid-state imaging device, method for manufacturing the same, and imaging apparatus |
US15/299,819 US9954021B2 (en) | 2007-05-07 | 2016-10-21 | Solid-state imaging device, method for manufacturing the same, and imaging apparatus |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2007122370 | 2007-05-07 | ||
JP2007-122370 | 2007-05-07 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US12/598,691 A-371-Of-International US8410418B2 (en) | 2007-05-07 | 2007-08-20 | Solid-state imaging device, method for manufacturing the same, and imaging apparatus |
US13/792,654 Division US9496306B2 (en) | 2007-05-07 | 2013-03-11 | Solid-state imaging device, method for manufacturing the same, and imaging apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2008139644A1 true WO2008139644A1 (ja) | 2008-11-20 |
Family
ID=40001873
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2007/066116 WO2008139644A1 (ja) | 2007-05-07 | 2007-08-20 | 固体撮像装置とその製造方法および撮像装置 |
Country Status (7)
Country | Link |
---|---|
US (14) | US8410418B2 (ja) |
EP (1) | EP2146376B1 (ja) |
JP (5) | JP4803153B2 (ja) |
KR (2) | KR101558120B1 (ja) |
CN (6) | CN102280463A (ja) |
TW (5) | TWI426602B (ja) |
WO (1) | WO2008139644A1 (ja) |
Cited By (7)
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WO2010098223A1 (ja) * | 2009-02-24 | 2010-09-02 | 浜松ホトニクス株式会社 | フォトダイオードの製造方法及びフォトダイオード |
WO2010098221A1 (ja) * | 2009-02-24 | 2010-09-02 | 浜松ホトニクス株式会社 | フォトダイオード及びフォトダイオードアレイ |
WO2010098224A1 (ja) * | 2009-02-24 | 2010-09-02 | 浜松ホトニクス株式会社 | 半導体光検出素子 |
GB2475086A (en) * | 2009-11-05 | 2011-05-11 | Cmosis Nv | Backside illuminated image sensor |
US8629485B2 (en) | 2009-02-24 | 2014-01-14 | Hamamatsu Photonics K.K. | Semiconductor photodetection element |
US8742528B2 (en) | 2009-02-24 | 2014-06-03 | Hamamatsu Photonics K.K. | Photodiode and photodiode array |
US10536659B2 (en) | 2013-11-29 | 2020-01-14 | Sony Semiconductor Solutions Corporation | Solid-state image capturing element, manufacturing method therefor, and electronic device |
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US7057256B2 (en) | 2001-05-25 | 2006-06-06 | President & Fellows Of Harvard College | Silicon-based visible and near-infrared optoelectric devices |
US7442629B2 (en) | 2004-09-24 | 2008-10-28 | President & Fellows Of Harvard College | Femtosecond laser-induced formation of submicrometer spikes on a semiconductor substrate |
TWI426602B (zh) * | 2007-05-07 | 2014-02-11 | Sony Corp | A solid-state image pickup apparatus, a manufacturing method thereof, and an image pickup apparatus |
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US8257997B2 (en) * | 2007-10-17 | 2012-09-04 | Sifotonics Technologies (Usa) Inc. | Semiconductor photodetectors |
JP5374980B2 (ja) * | 2008-09-10 | 2013-12-25 | ソニー株式会社 | 固体撮像装置 |
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JP4924634B2 (ja) * | 2009-03-04 | 2012-04-25 | ソニー株式会社 | 固体撮像素子及びその製造方法、撮像装置 |
JP5347999B2 (ja) | 2009-03-12 | 2013-11-20 | ソニー株式会社 | 固体撮像素子及びその製造方法、撮像装置 |
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