JPH0558266B2 - - Google Patents
Info
- Publication number
- JPH0558266B2 JPH0558266B2 JP58044179A JP4417983A JPH0558266B2 JP H0558266 B2 JPH0558266 B2 JP H0558266B2 JP 58044179 A JP58044179 A JP 58044179A JP 4417983 A JP4417983 A JP 4417983A JP H0558266 B2 JPH0558266 B2 JP H0558266B2
- Authority
- JP
- Japan
- Prior art keywords
- electrode
- layer
- capacitor
- insulating film
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/201—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits
- H10D84/204—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of only components covered by H10D1/00 or H10D8/00, e.g. RLC circuits of combinations of diodes or capacitors or resistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B10/00—Static random access memory [SRAM] devices
- H10B10/10—SRAM devices comprising bipolar components
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
- Static Random-Access Memory (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58044179A JPS59171157A (ja) | 1983-03-18 | 1983-03-18 | 半導体装置 |
KR1019840001232A KR910002813B1 (ko) | 1983-03-18 | 1984-03-12 | 반도체 장치 |
EP84102739A EP0122459A3 (en) | 1983-03-18 | 1984-03-13 | Semiconductor device comprising a diode and a capacitor |
US06/590,870 US4636833A (en) | 1983-03-18 | 1984-03-19 | Semiconductor device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP58044179A JPS59171157A (ja) | 1983-03-18 | 1983-03-18 | 半導体装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS59171157A JPS59171157A (ja) | 1984-09-27 |
JPH0558266B2 true JPH0558266B2 (GUID-C5D7CC26-194C-43D0-91A1-9AE8C70A9BFF.html) | 1993-08-26 |
Family
ID=12684348
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP58044179A Granted JPS59171157A (ja) | 1983-03-18 | 1983-03-18 | 半導体装置 |
Country Status (4)
Families Citing this family (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4809052A (en) * | 1985-05-10 | 1989-02-28 | Hitachi, Ltd. | Semiconductor memory device |
JP2617457B2 (ja) * | 1985-11-29 | 1997-06-04 | 株式会社日立製作所 | 半導体装置およびその製造方法 |
JPS6379373A (ja) * | 1986-09-24 | 1988-04-09 | Hitachi Ltd | 半導体装置およびその製造方法 |
US4803363A (en) * | 1987-04-27 | 1989-02-07 | Hughes Aircraft Company | Infrared detector with integral feedback capacitance |
US5189503A (en) * | 1988-03-04 | 1993-02-23 | Kabushiki Kaisha Toshiba | High dielectric capacitor having low current leakage |
JPH0817229B2 (ja) * | 1988-03-31 | 1996-02-21 | サンケン電気株式会社 | 半導体装置 |
US5025304A (en) * | 1988-11-29 | 1991-06-18 | Mcnc | High density semiconductor structure and method of making the same |
US5168078A (en) * | 1988-11-29 | 1992-12-01 | Mcnc | Method of making high density semiconductor structure |
JPH0677402A (ja) * | 1992-07-02 | 1994-03-18 | Natl Semiconductor Corp <Ns> | 半導体デバイス用誘電体構造及びその製造方法 |
US5569487A (en) * | 1995-01-23 | 1996-10-29 | General Electric Company | Capacitor dielectrics of silicon-doped amorphous hydrogenated carbon |
JP2630292B2 (ja) * | 1995-02-27 | 1997-07-16 | 日本電気株式会社 | 半導体装置の製造方法 |
US5708559A (en) * | 1995-10-27 | 1998-01-13 | International Business Machines Corporation | Precision analog metal-metal capacitor |
US6218260B1 (en) | 1997-04-22 | 2001-04-17 | Samsung Electronics Co., Ltd. | Methods of forming integrated circuit capacitors having improved electrode and dielectric layer characteristics and capacitors formed thereby |
JPH1154706A (ja) * | 1997-08-06 | 1999-02-26 | Nec Corp | Mimキャパシタ及びその製造方法 |
US6303969B1 (en) | 1998-05-01 | 2001-10-16 | Allen Tan | Schottky diode with dielectric trench |
KR100363083B1 (ko) | 1999-01-20 | 2002-11-30 | 삼성전자 주식회사 | 반구형 그레인 커패시터 및 그 형성방법 |
KR100317042B1 (ko) | 1999-03-18 | 2001-12-22 | 윤종용 | 반구형 알갱이 실리콘을 가지는 실린더형 커패시터 및 그 제조방법 |
JP2003101036A (ja) * | 2001-09-25 | 2003-04-04 | Sanyo Electric Co Ltd | ショットキーバリアダイオードおよびその製造方法 |
KR20020043815A (ko) | 2000-12-04 | 2002-06-12 | 윤종용 | 반구형 그레인 커패시터의 제조방법 |
US6921702B2 (en) * | 2002-07-30 | 2005-07-26 | Micron Technology Inc. | Atomic layer deposited nanolaminates of HfO2/ZrO2 films as gate dielectrics |
KR100552704B1 (ko) * | 2003-12-17 | 2006-02-20 | 삼성전자주식회사 | 반도체 장치의 불휘발성 커패시터, 이를 포함하는 반도체메모리 소자 및 그 동작방법 |
US8513634B2 (en) * | 2003-12-17 | 2013-08-20 | Samsung Electronics Co., Ltd. | Nonvolatile data storage, semicoductor memory device including nonvolatile data storage and method of forming the same |
US7927948B2 (en) | 2005-07-20 | 2011-04-19 | Micron Technology, Inc. | Devices with nanocrystals and methods of formation |
US7592251B2 (en) * | 2005-12-08 | 2009-09-22 | Micron Technology, Inc. | Hafnium tantalum titanium oxide films |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3506893A (en) * | 1968-06-27 | 1970-04-14 | Ibm | Integrated circuits with surface barrier diodes |
DE2508553C3 (de) * | 1975-02-27 | 1981-06-25 | Siemens AG, 1000 Berlin und 8000 München | Integrierte Halbleiterschaltungsanordnung |
JPS5325383A (en) * | 1976-08-23 | 1978-03-09 | Hitachi Ltd | Compound type capacitor in bipolar ic |
JPS6058593B2 (ja) * | 1976-10-01 | 1985-12-20 | 株式会社日立製作所 | 半導体メモリ |
US4112314A (en) * | 1977-08-26 | 1978-09-05 | International Business Machines Corporation | Logical current switch |
US4211941A (en) * | 1978-08-03 | 1980-07-08 | Rca Corporation | Integrated circuitry including low-leakage capacitance |
US4245231A (en) * | 1978-12-26 | 1981-01-13 | Motorola Inc. | Combination capacitor and transistor structure for use in monolithic circuits |
JPS5685848A (en) * | 1979-12-15 | 1981-07-13 | Toshiba Corp | Manufacture of bipolar integrated circuit |
JPS5788774A (en) * | 1980-11-25 | 1982-06-02 | Hitachi Ltd | Semiconductor device |
JPS57206062A (en) * | 1981-06-12 | 1982-12-17 | Mitsubishi Electric Corp | Semiconductor integrated circuit |
JPS5823470A (ja) * | 1981-08-06 | 1983-02-12 | Oki Electric Ind Co Ltd | 半導体装置 |
JPS5864062A (ja) * | 1981-10-13 | 1983-04-16 | Nec Corp | 半導体記憶装置 |
JPS58127359A (ja) * | 1982-01-25 | 1983-07-29 | Hitachi Ltd | 半導体接合容量装置 |
-
1983
- 1983-03-18 JP JP58044179A patent/JPS59171157A/ja active Granted
-
1984
- 1984-03-12 KR KR1019840001232A patent/KR910002813B1/ko not_active Expired
- 1984-03-13 EP EP84102739A patent/EP0122459A3/en not_active Withdrawn
- 1984-03-19 US US06/590,870 patent/US4636833A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
KR910002813B1 (ko) | 1991-05-04 |
KR840008217A (ko) | 1984-12-13 |
JPS59171157A (ja) | 1984-09-27 |
US4636833A (en) | 1987-01-13 |
EP0122459A2 (en) | 1984-10-24 |
EP0122459A3 (en) | 1986-02-05 |
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