JP2002305304A5 - - Google Patents
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- Publication number
- JP2002305304A5 JP2002305304A5 JP2001107252A JP2001107252A JP2002305304A5 JP 2002305304 A5 JP2002305304 A5 JP 2002305304A5 JP 2001107252 A JP2001107252 A JP 2001107252A JP 2001107252 A JP2001107252 A JP 2001107252A JP 2002305304 A5 JP2002305304 A5 JP 2002305304A5
- Authority
- JP
- Japan
- Prior art keywords
- conductivity type
- base layer
- type base
- layer
- power semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims 7
- 239000012535 impurity Substances 0.000 claims 6
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001107252A JP2002305304A (ja) | 2001-04-05 | 2001-04-05 | 電力用半導体装置 |
| TW091106614A TW567615B (en) | 2001-04-05 | 2002-04-02 | Power semiconductor device and its manufacturing method |
| KR10-2002-0018534A KR100449182B1 (ko) | 2001-04-05 | 2002-04-04 | 전력용 반도체장치 |
| US10/115,030 US6605858B2 (en) | 2001-04-05 | 2002-04-04 | Semiconductor power device |
| EP02007318A EP1248299A3 (en) | 2001-04-05 | 2002-04-04 | Insulated gate bipolar transistor and method of making the same |
| CNB021061475A CN1228858C (zh) | 2001-04-05 | 2002-04-05 | 电力半导体器件 |
| US10/457,544 US7056779B2 (en) | 2001-04-05 | 2003-06-10 | Semiconductor power device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2001107252A JP2002305304A (ja) | 2001-04-05 | 2001-04-05 | 電力用半導体装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2002305304A JP2002305304A (ja) | 2002-10-18 |
| JP2002305304A5 true JP2002305304A5 (enExample) | 2005-07-21 |
Family
ID=18959602
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001107252A Pending JP2002305304A (ja) | 2001-04-05 | 2001-04-05 | 電力用半導体装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US6605858B2 (enExample) |
| EP (1) | EP1248299A3 (enExample) |
| JP (1) | JP2002305304A (enExample) |
| KR (1) | KR100449182B1 (enExample) |
| CN (1) | CN1228858C (enExample) |
| TW (1) | TW567615B (enExample) |
Families Citing this family (46)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002305304A (ja) * | 2001-04-05 | 2002-10-18 | Toshiba Corp | 電力用半導体装置 |
| JP3732814B2 (ja) * | 2002-08-15 | 2006-01-11 | 株式会社東芝 | 半導体装置 |
| JP4166102B2 (ja) * | 2003-02-26 | 2008-10-15 | トヨタ自動車株式会社 | 高耐圧電界効果型半導体装置 |
| CN101308870B (zh) * | 2003-08-27 | 2011-05-18 | 三菱电机株式会社 | 绝缘栅型晶体管以及逆变器电路 |
| JP4768231B2 (ja) * | 2004-03-18 | 2011-09-07 | ルネサスエレクトロニクス株式会社 | 半導体装置の製造方法 |
| WO2005109521A1 (ja) * | 2004-05-12 | 2005-11-17 | Kabushiki Kaisha Toyota Chuo Kenkyusho | 半導体装置 |
| JP2005354031A (ja) * | 2004-05-13 | 2005-12-22 | Mitsubishi Electric Corp | 半導体装置 |
| JP4575713B2 (ja) * | 2004-05-31 | 2010-11-04 | 三菱電機株式会社 | 絶縁ゲート型半導体装置 |
| DE102005040624A1 (de) * | 2004-09-02 | 2006-03-09 | Fuji Electric Holdings Co., Ltd., Kawasaki | Halbleiterbauteil und Verfahren zu seiner Herstellung |
| US20060049464A1 (en) | 2004-09-03 | 2006-03-09 | Rao G R Mohan | Semiconductor devices with graded dopant regions |
| JP4791723B2 (ja) * | 2004-10-18 | 2011-10-12 | 株式会社東芝 | 半導体装置及びその製造方法 |
| US7723803B2 (en) * | 2005-03-07 | 2010-05-25 | Taiwan Semiconductor Manufacturing Co., Ltd. | Bipolar device compatible with CMOS process technology |
| JP5033335B2 (ja) * | 2006-02-21 | 2012-09-26 | ルネサスエレクトロニクス株式会社 | 半導体装置およびそれを用いたインバータ装置 |
| JP5112648B2 (ja) * | 2006-05-29 | 2013-01-09 | セイコーインスツル株式会社 | 半導体装置 |
| JP5128100B2 (ja) * | 2006-09-29 | 2013-01-23 | 三菱電機株式会社 | 電力用半導体装置 |
| US8093621B2 (en) | 2008-12-23 | 2012-01-10 | Power Integrations, Inc. | VTS insulated gate bipolar transistor |
| DE102007020657B4 (de) * | 2007-04-30 | 2012-10-04 | Infineon Technologies Austria Ag | Halbleiterbauelement mit einem Halbleiterkörper und Verfahren zur Herstellung desselben |
| JP5261982B2 (ja) * | 2007-05-18 | 2013-08-14 | 富士電機株式会社 | 半導体装置及び半導体装置の製造方法 |
| JP2008305998A (ja) * | 2007-06-07 | 2008-12-18 | Fuji Electric Device Technology Co Ltd | 半導体装置 |
| JP5564763B2 (ja) * | 2008-06-05 | 2014-08-06 | 富士電機株式会社 | Mos型半導体装置の製造方法 |
| US7964912B2 (en) | 2008-09-18 | 2011-06-21 | Power Integrations, Inc. | High-voltage vertical transistor with a varied width silicon pillar |
| US7871882B2 (en) * | 2008-12-20 | 2011-01-18 | Power Integrations, Inc. | Method of fabricating a deep trench insulated gate bipolar transistor |
| US20100155831A1 (en) * | 2008-12-20 | 2010-06-24 | Power Integrations, Inc. | Deep trench insulated gate bipolar transistor |
| JP2010232335A (ja) * | 2009-03-26 | 2010-10-14 | Sanyo Electric Co Ltd | 絶縁ゲートバイポーラトランジスタ |
| US8330214B2 (en) * | 2009-05-28 | 2012-12-11 | Maxpower Semiconductor, Inc. | Power semiconductor device |
| JP2010283132A (ja) * | 2009-06-04 | 2010-12-16 | Mitsubishi Electric Corp | 半導体装置 |
| EP2317553B1 (en) * | 2009-10-28 | 2012-12-26 | STMicroelectronics Srl | Double-sided semiconductor structure and method for manufacturing the same |
| CN102893402B (zh) * | 2010-03-23 | 2015-09-30 | Abb技术有限公司 | 功率半导体装置 |
| JP6006918B2 (ja) | 2011-06-06 | 2016-10-12 | ルネサスエレクトロニクス株式会社 | 半導体装置、半導体装置の製造方法、及び電子装置 |
| CN103151251B (zh) * | 2011-12-07 | 2016-06-01 | 无锡华润华晶微电子有限公司 | 沟槽型绝缘栅双极型晶体管及其制备方法 |
| JP5644793B2 (ja) * | 2012-03-02 | 2014-12-24 | 株式会社デンソー | 半導体装置 |
| CN103367436B (zh) * | 2012-04-03 | 2017-08-08 | 朱江 | 一种沟槽肖特基mos半导体装置及其制造方法 |
| US8653600B2 (en) | 2012-06-01 | 2014-02-18 | Power Integrations, Inc. | High-voltage monolithic schottky device structure |
| JP5880311B2 (ja) * | 2012-06-26 | 2016-03-09 | 住友電気工業株式会社 | 炭化珪素半導体装置 |
| CN103151371A (zh) * | 2013-03-05 | 2013-06-12 | 矽力杰半导体技术(杭州)有限公司 | 一种晶圆结构以及应用其的功率器件 |
| JP2015023118A (ja) * | 2013-07-18 | 2015-02-02 | 株式会社東芝 | 半導体装置 |
| US9543396B2 (en) | 2013-12-13 | 2017-01-10 | Power Integrations, Inc. | Vertical transistor device structure with cylindrically-shaped regions |
| US10325988B2 (en) | 2013-12-13 | 2019-06-18 | Power Integrations, Inc. | Vertical transistor device structure with cylindrically-shaped field plates |
| CN103855206A (zh) * | 2014-02-18 | 2014-06-11 | 宁波达新半导体有限公司 | 绝缘栅双极晶体管及其制造方法 |
| JP6287407B2 (ja) * | 2014-03-19 | 2018-03-07 | サンケン電気株式会社 | 半導体装置 |
| JP6126150B2 (ja) * | 2015-03-06 | 2017-05-10 | トヨタ自動車株式会社 | 半導体装置 |
| US10002870B2 (en) | 2016-08-16 | 2018-06-19 | Texas Instruments Incorporated | Process enhancement using double sided epitaxial on substrate |
| JP6880669B2 (ja) * | 2016-11-16 | 2021-06-02 | 富士電機株式会社 | 炭化珪素半導体装置および炭化珪素半導体装置の製造方法 |
| CN107464842A (zh) * | 2017-08-03 | 2017-12-12 | 电子科技大学 | 一种具有集电极槽的超结逆导型igbt |
| CN115148601A (zh) * | 2021-03-30 | 2022-10-04 | 无锡华润华晶微电子有限公司 | 半导体结构及其制备方法 |
| JP7607538B2 (ja) * | 2021-09-14 | 2024-12-27 | 三菱電機株式会社 | 半導体装置 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5942989B2 (ja) * | 1977-01-24 | 1984-10-18 | 株式会社日立製作所 | 高耐圧半導体素子およびその製造方法 |
| US5173435A (en) * | 1987-11-11 | 1992-12-22 | Mitsubishi Denki Kabushiki Kaisha | Insulated gate bipolar transistor |
| JPH01140808A (ja) * | 1987-11-26 | 1989-06-02 | Nec Corp | 伝達ゲートスイッチング回路 |
| US5004705A (en) * | 1989-01-06 | 1991-04-02 | Unitrode Corporation | Inverted epitaxial process |
| US5466951A (en) * | 1993-12-08 | 1995-11-14 | Siemens Aktiengesellschaft | Controllable power semiconductor element with buffer zone and method for the manufacture thereof |
| US5643821A (en) * | 1994-11-09 | 1997-07-01 | Harris Corporation | Method for making ohmic contact to lightly doped islands from a silicide buried layer and applications |
| US6001678A (en) * | 1995-03-14 | 1999-12-14 | Mitsubishi Denki Kabushiki Kaisha | Insulated gate semiconductor device |
| US5714775A (en) * | 1995-04-20 | 1998-02-03 | Kabushiki Kaisha Toshiba | Power semiconductor device |
| US6693310B1 (en) * | 1995-07-19 | 2004-02-17 | Mitsubishi Denki Kabushiki Kaisha | Semiconductor device and manufacturing method thereof |
| JP3352592B2 (ja) * | 1996-05-16 | 2002-12-03 | 三菱電機株式会社 | 半導体装置およびその製造方法 |
| KR100228719B1 (ko) * | 1996-05-27 | 1999-11-01 | 윤덕용 | 전기 화학적 식각방법을 이용하는 soi형 반도체 소자 및 이를 이용한 능동구동 액정표시장치의 제조방법 |
| US5807783A (en) * | 1996-10-07 | 1998-09-15 | Harris Corporation | Surface mount die by handle replacement |
| JPH1140808A (ja) | 1997-05-21 | 1999-02-12 | Toyota Motor Corp | 半導体装置およびその製造方法 |
| ATE263433T1 (de) * | 1998-07-17 | 2004-04-15 | Infineon Technologies Ag | Leistungshalbleiterbauelement für hohe sperrspannungen |
| JP3924975B2 (ja) * | 1999-02-05 | 2007-06-06 | 富士電機デバイステクノロジー株式会社 | トレンチ型絶縁ゲートバイポーラトランジスタ |
| JP2001024184A (ja) * | 1999-07-05 | 2001-01-26 | Fuji Electric Co Ltd | 絶縁ゲートトランジスタおよびその製造方法 |
| US6140170A (en) * | 1999-08-27 | 2000-10-31 | Lucent Technologies Inc. | Manufacture of complementary MOS and bipolar integrated circuits |
| JP2001237249A (ja) * | 2000-02-21 | 2001-08-31 | Hitachi Ltd | 半導体装置およびその製造方法 |
| JP4371521B2 (ja) * | 2000-03-06 | 2009-11-25 | 株式会社東芝 | 電力用半導体素子およびその製造方法 |
| JP2001338930A (ja) * | 2000-05-29 | 2001-12-07 | Nec Corp | 半導体装置および半導体製造方法 |
| JP3764343B2 (ja) * | 2001-02-28 | 2006-04-05 | 株式会社東芝 | 半導体装置の製造方法 |
| US20020137264A1 (en) * | 2001-03-23 | 2002-09-26 | Ming-Jer Kao | Method of fabrication thin wafer IGBT |
| JP2002305304A (ja) * | 2001-04-05 | 2002-10-18 | Toshiba Corp | 電力用半導体装置 |
-
2001
- 2001-04-05 JP JP2001107252A patent/JP2002305304A/ja active Pending
-
2002
- 2002-04-02 TW TW091106614A patent/TW567615B/zh not_active IP Right Cessation
- 2002-04-04 KR KR10-2002-0018534A patent/KR100449182B1/ko not_active Expired - Fee Related
- 2002-04-04 US US10/115,030 patent/US6605858B2/en not_active Expired - Lifetime
- 2002-04-04 EP EP02007318A patent/EP1248299A3/en not_active Withdrawn
- 2002-04-05 CN CNB021061475A patent/CN1228858C/zh not_active Expired - Fee Related
-
2003
- 2003-06-10 US US10/457,544 patent/US7056779B2/en not_active Expired - Lifetime