CN108660437B - 半导体器件的制造方法、记录介质及衬底处理装置 - Google Patents
半导体器件的制造方法、记录介质及衬底处理装置 Download PDFInfo
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- CN108660437B CN108660437B CN201810166993.8A CN201810166993A CN108660437B CN 108660437 B CN108660437 B CN 108660437B CN 201810166993 A CN201810166993 A CN 201810166993A CN 108660437 B CN108660437 B CN 108660437B
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
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- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6328—Deposition from the gas or vapour phase
- H10P14/6334—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H10P14/6339—Deposition from the gas or vapour phase using decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition deposition by cyclic CVD, e.g. ALD, ALE or pulsed CVD
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- H10P14/42—Formation of materials, e.g. in the shape of layers or pillars of conductive or resistive materials using a gas or vapour
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C16/30—Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4412—Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45523—Pulsed gas flow or change of composition over time
- C23C16/45525—Atomic layer deposition [ALD]
- C23C16/45527—Atomic layer deposition [ALD] characterized by the ALD cycle, e.g. different flows or temperatures during half-reactions, unusual pulsing sequence, use of precursor mixtures or auxiliary reactants or activations
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45578—Elongated nozzles, tubes with holes
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
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- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/65—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials
- H10P14/6502—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by treatments performed before or after the formation of the materials of treatments performed before formation of the materials
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- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/69—Inorganic materials
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- H10P14/69392—Inorganic materials composed of oxides, glassy oxides or oxide-based glasses the material containing at least one metal element, e.g. metal oxides, metal oxynitrides or metal oxycarbides characterised by the metal the material containing hafnium, e.g. HfO2
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- H10B—ELECTRONIC MEMORY DEVICES
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- H10B12/03—Making the capacitor or connections thereto
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Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2017062545A JP6602332B2 (ja) | 2017-03-28 | 2017-03-28 | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP2017-062545 | 2017-03-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN108660437A CN108660437A (zh) | 2018-10-16 |
| CN108660437B true CN108660437B (zh) | 2021-04-09 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201810166993.8A Active CN108660437B (zh) | 2017-03-28 | 2018-02-28 | 半导体器件的制造方法、记录介质及衬底处理装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US10707074B2 (enExample) |
| JP (1) | JP6602332B2 (enExample) |
| KR (1) | KR102019955B1 (enExample) |
| CN (1) | CN108660437B (enExample) |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10490431B2 (en) * | 2017-03-10 | 2019-11-26 | Yield Engineering Systems, Inc. | Combination vacuum and over-pressure process chamber and methods related thereto |
| JP6602332B2 (ja) * | 2017-03-28 | 2019-11-06 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置およびプログラム |
| JP6965942B2 (ja) * | 2017-12-22 | 2021-11-10 | 株式会社村田製作所 | 成膜装置 |
| JP6988916B2 (ja) | 2017-12-22 | 2022-01-05 | 株式会社村田製作所 | 成膜装置 |
| JP7055075B2 (ja) * | 2018-07-20 | 2022-04-15 | 東京エレクトロン株式会社 | 熱処理装置及び熱処理方法 |
| US11703229B2 (en) * | 2018-12-05 | 2023-07-18 | Yi-Ming Hung | Temperature adjustment apparatus for high temperature oven |
| WO2020175427A1 (ja) * | 2019-02-27 | 2020-09-03 | 株式会社Kokusai Electric | 半導体装置の製造方法、基板処理装置およびプログラム |
| CN113519041B (zh) | 2019-03-20 | 2024-04-16 | 株式会社国际电气 | 基板处理装置、反应容器、半导体器件的制造方法以及记录介质 |
| JP7236922B2 (ja) * | 2019-04-26 | 2023-03-10 | 東京エレクトロン株式会社 | 熱処理装置、熱処理方法及び成膜方法 |
| CN114207183A (zh) | 2019-08-20 | 2022-03-18 | 株式会社国际电气 | 基板处理装置、半导体器件的制造方法、程序以及记录介质 |
| EP4075480A4 (en) * | 2019-12-09 | 2024-01-10 | Kokusai Electric Corp. | Semiconductor device manufacturing method, substrate treatment device, and program |
| JP7432373B2 (ja) * | 2020-01-23 | 2024-02-16 | 株式会社Kokusai Electric | 反応管の洗浄方法、半導体装置の製造方法、及び基板処理装置 |
| JP7203070B2 (ja) * | 2020-09-23 | 2023-01-12 | 株式会社Kokusai Electric | 基板処理装置、基板処理方法及び半導体装置の製造方法 |
| JP7271485B2 (ja) | 2020-09-23 | 2023-05-11 | 株式会社Kokusai Electric | 基板処理装置、半導体装置の製造方法およびプログラム |
| JP7284139B2 (ja) * | 2020-11-27 | 2023-05-30 | 株式会社Kokusai Electric | 半導体装置の製造方法、プログラム、基板処理装置および基板処理方法 |
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| CN103966576A (zh) * | 2013-01-30 | 2014-08-06 | 株式会社日立国际电气 | 基板处理装置、半导体器件的制造方法及程序 |
| CN105714275A (zh) * | 2014-12-18 | 2016-06-29 | 株式会社日立国际电气 | 衬底处理装置及半导体器件的制造方法 |
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| JPS5961920A (ja) * | 1982-10-01 | 1984-04-09 | Agency Of Ind Science & Technol | 薄膜製造方法およびその装置 |
| JP2008078448A (ja) * | 2006-09-22 | 2008-04-03 | Hitachi Kokusai Electric Inc | 基板処理装置 |
| JP2009076590A (ja) * | 2007-09-19 | 2009-04-09 | Hitachi Kokusai Electric Inc | クリーニング方法 |
| JP5213868B2 (ja) * | 2007-09-19 | 2013-06-19 | 株式会社日立国際電気 | クリーニング方法及び基板処理装置 |
| JP4994197B2 (ja) * | 2007-11-16 | 2012-08-08 | 株式会社日立国際電気 | 半導体装置の製造方法及び基板処理装置 |
| US20090197424A1 (en) * | 2008-01-31 | 2009-08-06 | Hitachi Kokusai Electric Inc. | Substrate processing apparatus and method for manufacturing semiconductor device |
| JP5284182B2 (ja) * | 2008-07-23 | 2013-09-11 | 株式会社日立国際電気 | 基板処理装置および半導体装置の製造方法 |
| JP5384291B2 (ja) * | 2008-11-26 | 2014-01-08 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法及び基板処理装置 |
| JP4988902B2 (ja) * | 2009-07-31 | 2012-08-01 | 株式会社日立国際電気 | 半導体デバイスの製造方法及び基板処理装置 |
| JP5813303B2 (ja) * | 2009-11-20 | 2015-11-17 | 株式会社日立国際電気 | 半導体装置の製造方法、基板処理方法および基板処理装置 |
| JP5462885B2 (ja) * | 2009-12-18 | 2014-04-02 | 株式会社日立国際電気 | 半導体装置の製造方法および基板処理装置 |
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| US10707074B2 (en) | 2020-07-07 |
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