CN100524632C - 半导体装置的制造方法 - Google Patents
半导体装置的制造方法 Download PDFInfo
- Publication number
- CN100524632C CN100524632C CNB200610063646XA CN200610063646A CN100524632C CN 100524632 C CN100524632 C CN 100524632C CN B200610063646X A CNB200610063646X A CN B200610063646XA CN 200610063646 A CN200610063646 A CN 200610063646A CN 100524632 C CN100524632 C CN 100524632C
- Authority
- CN
- China
- Prior art keywords
- metal layer
- semiconductor wafer
- heat treatment
- semiconductor device
- manufacturing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
- H01L21/285—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation
- H01L21/28506—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers
- H01L21/28512—Deposition of conductive or insulating materials for electrodes conducting electric current from a gas or vapour, e.g. condensation of conductive layers on semiconductor bodies comprising elements of Group IV of the Periodic Table
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D10/00—Bipolar junction transistors [BJT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/482—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of lead-in layers inseparably applied to the semiconductor body (electrodes)
- H01L23/4827—Materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L24/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L24/27—Manufacturing methods
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D48/00—Individual devices not covered by groups H10D1/00 - H10D44/00
- H10D48/30—Devices controlled by electric currents or voltages
- H10D48/32—Devices controlled by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H10D48/34—Bipolar devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/02—Bonding areas; Manufacturing methods related thereto
- H01L2224/04—Structure, shape, material or disposition of the bonding areas prior to the connecting process
- H01L2224/04026—Bonding areas specifically adapted for layer connectors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/27—Manufacturing methods
- H01L2224/274—Manufacturing methods by blanket deposition of the material of the layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
- H01L2224/27—Manufacturing methods
- H01L2224/275—Manufacturing methods by chemical or physical modification of a pre-existing or pre-deposited material
- H01L2224/27505—Sintering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L2224/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
- H01L2224/838—Bonding techniques
- H01L2224/83801—Soldering or alloying
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
- H01L24/80—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
- H01L24/83—Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a layer connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01005—Boron [B]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01006—Carbon [C]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01013—Aluminum [Al]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/0102—Calcium [Ca]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01023—Vanadium [V]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01033—Arsenic [As]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01042—Molybdenum [Mo]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01047—Silver [Ag]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01068—Erbium [Er]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/013—Alloys
- H01L2924/0132—Binary Alloys
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/10—Details of semiconductor or other solid state devices to be connected
- H01L2924/11—Device type
- H01L2924/13—Discrete devices, e.g. 3 terminal devices
- H01L2924/1304—Transistor
- H01L2924/1305—Bipolar Junction Transistor [BJT]
- H01L2924/13055—Insulated gate bipolar transistor [IGBT]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/35—Mechanical effects
- H01L2924/351—Thermal stress
- H01L2924/3511—Warping
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Materials Engineering (AREA)
- Electrodes Of Semiconductors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2006013349 | 2006-01-23 | ||
| JP2006013349A JP2007194514A (ja) | 2006-01-23 | 2006-01-23 | 半導体装置の製造方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN101009221A CN101009221A (zh) | 2007-08-01 |
| CN100524632C true CN100524632C (zh) | 2009-08-05 |
Family
ID=38282344
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB200610063646XA Active CN100524632C (zh) | 2006-01-23 | 2006-12-29 | 半导体装置的制造方法 |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8183144B2 (enExample) |
| JP (1) | JP2007194514A (enExample) |
| KR (1) | KR100823648B1 (enExample) |
| CN (1) | CN100524632C (enExample) |
| AT (1) | AT503190B1 (enExample) |
| DE (1) | DE102006062029B4 (enExample) |
| TW (1) | TW200737382A (enExample) |
Families Citing this family (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4221012B2 (ja) * | 2006-06-12 | 2009-02-12 | トヨタ自動車株式会社 | 半導体装置とその製造方法 |
| WO2009141740A2 (en) * | 2008-05-23 | 2009-11-26 | Florian Bieck | Semiconductor wafer and method for producing the same |
| JP2010021171A (ja) * | 2008-07-08 | 2010-01-28 | Renesas Technology Corp | 半導体装置の製造方法およびそれに用いる半導体製造装置 |
| WO2010109572A1 (ja) * | 2009-03-23 | 2010-09-30 | トヨタ自動車株式会社 | 半導体装置 |
| JP5545000B2 (ja) * | 2010-04-14 | 2014-07-09 | 富士電機株式会社 | 半導体装置の製造方法 |
| JP2012248572A (ja) * | 2011-05-25 | 2012-12-13 | Mitsubishi Electric Corp | 半導体装置および半導体装置の製造方法 |
| JP5761354B2 (ja) * | 2011-09-08 | 2015-08-12 | 富士電機株式会社 | 半導体装置および半導体装置の製造方法 |
| JP6289104B2 (ja) * | 2014-01-08 | 2018-03-07 | 日東電工株式会社 | フィルム状接着剤、フィルム状接着剤付きダイシングテープ、半導体装置の製造方法、及び半導体装置 |
| WO2017083037A1 (en) * | 2015-11-09 | 2017-05-18 | Applied Materials, Inc. | Bottom processing |
| JP2023073724A (ja) * | 2021-11-16 | 2023-05-26 | 株式会社フルヤ金属 | 半導体デバイス及びそれに用いる酸化防止用金属材料並びに該金属材料のスパッタリングターゲット及び蒸着源 |
Family Cites Families (34)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1149606A (en) | 1967-02-27 | 1969-04-23 | Motorola Inc | Mounting for a semiconductor wafer which is resistant to fatigue caused by thermal stresses |
| JPS5950090B2 (ja) * | 1977-07-07 | 1984-12-06 | 三菱電機株式会社 | 半導体装置の製造方法 |
| JPS55111140A (en) * | 1979-02-20 | 1980-08-27 | Nec Corp | Metalizing method for back surface of silicon wafer |
| JPS58106825A (ja) * | 1981-12-18 | 1983-06-25 | Matsushita Electric Ind Co Ltd | 半導体装置の製造方法 |
| DE3301666A1 (de) | 1983-01-20 | 1984-07-26 | Brown, Boveri & Cie Ag, 6800 Mannheim | Verfahren zur herstellung einer mehrschichtigen kontaktmetallisierung |
| DD277602A3 (de) | 1987-12-21 | 1990-04-11 | Akad Wissenschaften Ddr | Verfahren zur Herstellung eines weichlötfähigen Mehrschichtkontaktsystems für Halbleiterbauelemente |
| DE3823347A1 (de) | 1988-07-09 | 1990-01-11 | Semikron Elektronik Gmbh | Leistungs-halbleiterelement |
| US5342793A (en) * | 1990-02-20 | 1994-08-30 | Sgs-Thomson Microelectronics, S.R.L. | Process for obtaining multi-layer metallization of the back of a semiconductor substrate |
| JPH0472764A (ja) | 1990-07-13 | 1992-03-06 | Sharp Corp | 半導体装置の裏面電極 |
| DE69223868T2 (de) | 1991-07-17 | 1998-09-03 | Denso Corp | Verfahren zur Herstellung von Elektroden eines Halbleiterbauelements |
| JP3127494B2 (ja) * | 1991-07-17 | 2001-01-22 | 株式会社デンソー | 半導体装置の電極形成方法 |
| KR930017092A (ko) * | 1992-01-15 | 1993-08-30 | 김광호 | 반도체장치 및 그 제조방법 |
| JPH0637301A (ja) * | 1992-07-20 | 1994-02-10 | Toyota Motor Corp | 半導体装置及びその製造方法 |
| US5924002A (en) * | 1994-12-22 | 1999-07-13 | Sony Corporation | Method of manufacturing a semiconductor device having ohmic electrode |
| DE19527209A1 (de) * | 1995-07-27 | 1997-01-30 | Philips Patentverwaltung | Halbleitervorrichtung |
| US6140703A (en) * | 1996-08-05 | 2000-10-31 | Motorola, Inc. | Semiconductor metallization structure |
| DE19734434C1 (de) | 1997-08-08 | 1998-12-10 | Siemens Ag | Halbleiterkörper mit Rückseitenmetallisierung und Verfahren zu deren Herstellung |
| KR100365436B1 (ko) * | 1998-12-15 | 2003-04-10 | 주식회사 하이닉스반도체 | 반도체장치의배리어층형성방법 |
| JP3960739B2 (ja) | 2000-07-11 | 2007-08-15 | シャープ株式会社 | 半導体装置とその製造方法 |
| KR100724143B1 (ko) * | 2001-01-17 | 2007-06-04 | 매그나칩 반도체 유한회사 | 반도체장치의 배리어층 형성방법 |
| JP2003059860A (ja) * | 2001-08-13 | 2003-02-28 | Mitsubishi Electric Corp | 半導体装置 |
| JP2003282845A (ja) * | 2002-03-20 | 2003-10-03 | Mitsubishi Electric Corp | 炭化ケイ素基板の製造方法およびその製造方法により製造された炭化ケイ素基板、ならびに、ショットキーバリアダイオードおよび炭化ケイ素薄膜の製造方法 |
| JP2003338620A (ja) * | 2002-05-22 | 2003-11-28 | Mitsubishi Electric Corp | 半導体装置およびその製造方法 |
| CN100454492C (zh) | 2002-06-13 | 2009-01-21 | 衡阳科晶微电子有限公司 | 共晶焊背面金属化工艺 |
| JP2004153081A (ja) * | 2002-10-31 | 2004-05-27 | Shin Etsu Handotai Co Ltd | Soiウエーハ及びsoiウエーハの製造方法 |
| KR100477396B1 (ko) * | 2002-09-04 | 2005-03-28 | 한국전기연구원 | 금속 게이트 전극을 갖는 탄화규소 모스펫 소자 및 그제조방법 |
| WO2004040648A1 (ja) * | 2002-10-30 | 2004-05-13 | Semiconductor Energy Laboratory Co., Ltd. | 半導体装置および半導体装置の作製方法 |
| TWI247576B (en) * | 2003-03-28 | 2006-01-11 | Hon Hai Prec Ind Co Ltd | Method of manufacturing electromagnetic interference shield |
| JP4049035B2 (ja) * | 2003-06-27 | 2008-02-20 | 株式会社デンソー | 半導体装置の製造方法 |
| JP3767585B2 (ja) | 2003-07-11 | 2006-04-19 | 株式会社デンソー | 半導体装置 |
| US7214620B2 (en) * | 2003-10-28 | 2007-05-08 | Samsung Electronics Co., Ltd. | Methods of forming silicide films with metal films in semiconductor devices and contacts including the same |
| JP4792694B2 (ja) * | 2003-11-13 | 2011-10-12 | セイコーエプソン株式会社 | 電気光学装置用基板の製造方法、電気光学装置用基板、電気光学装置、電子機器 |
| WO2005083799A1 (en) * | 2004-02-24 | 2005-09-09 | Bp Corporation North America Inc | Process for manufacturing photovoltaic cells |
| JP4788390B2 (ja) * | 2005-06-07 | 2011-10-05 | 株式会社デンソー | 半導体装置の製造方法 |
-
2006
- 2006-01-23 JP JP2006013349A patent/JP2007194514A/ja active Pending
- 2006-11-17 US US11/561,038 patent/US8183144B2/en active Active
- 2006-11-24 TW TW095143544A patent/TW200737382A/zh unknown
- 2006-12-29 DE DE102006062029A patent/DE102006062029B4/de active Active
- 2006-12-29 CN CNB200610063646XA patent/CN100524632C/zh active Active
-
2007
- 2007-01-19 KR KR1020070005893A patent/KR100823648B1/ko active Active
- 2007-01-22 AT AT0010207A patent/AT503190B1/de not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| KR100823648B1 (ko) | 2008-04-21 |
| CN101009221A (zh) | 2007-08-01 |
| TW200737382A (en) | 2007-10-01 |
| US20070173045A1 (en) | 2007-07-26 |
| JP2007194514A (ja) | 2007-08-02 |
| US8183144B2 (en) | 2012-05-22 |
| AT503190A2 (de) | 2007-08-15 |
| AT503190B1 (de) | 2010-03-15 |
| KR20070077450A (ko) | 2007-07-26 |
| DE102006062029A1 (de) | 2007-08-09 |
| DE102006062029B4 (de) | 2010-04-08 |
| AT503190A3 (de) | 2008-05-15 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100823648B1 (ko) | 반도체장치의 제조 방법 | |
| KR101262551B1 (ko) | 롤 형상의 모기판을 이용한 플렉서블 전자소자의 제조방법 | |
| CN104718604B (zh) | 半导体装置的制造方法 | |
| CN105518829B (zh) | 半导体装置的制造方法 | |
| JP6037083B2 (ja) | 半導体装置の製造方法 | |
| JP7604798B2 (ja) | 半導体装置の製造方法 | |
| JP4604641B2 (ja) | 半導体装置 | |
| JP2006332358A (ja) | 炭化珪素半導体装置およびその製造方法 | |
| WO2019008860A1 (ja) | 半導体装置、及び半導体装置の製造方法 | |
| JP7283053B2 (ja) | 炭化珪素半導体装置、炭化珪素半導体組立体および炭化珪素半導体装置の製造方法 | |
| US10796918B2 (en) | Integrated circuits with backside metalization and production method thereof | |
| JP4973046B2 (ja) | 半導体装置の製造方法 | |
| JPH06252091A (ja) | 半導体装置およびその製造方法 | |
| CN102668040B (zh) | 半导体装置以及半导体装置的制造方法 | |
| JP2006032456A (ja) | 半導体素子および半導体素子の製造方法 | |
| CN106575610B (zh) | 碳化硅半导体装置的制造方法以及碳化硅半导体装置 | |
| JP2009049144A (ja) | 半導体基板及び半導体基板の製造方法 | |
| CN113539800B (zh) | 半导体结构的制备方法 | |
| CN101536184B (zh) | 焊盘结构和制造该焊盘结构的方法 | |
| JP2007109858A (ja) | 配線基板及びその作製方法 | |
| JP6708087B2 (ja) | 半導体装置の製造方法 | |
| JP2006073923A (ja) | SiC半導体装置およびSiC半導体装置の製造方法 | |
| JP2012109418A (ja) | 半導体装置の製造方法 | |
| JPH03154332A (ja) | 半導体装置の製造方法 | |
| JP5180802B2 (ja) | 積層電極形成方法とその積層電極を備える半導体装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |