WO2009119680A1 - プリント配線板及びその製造方法 - Google Patents
プリント配線板及びその製造方法 Download PDFInfo
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- WO2009119680A1 WO2009119680A1 PCT/JP2009/055985 JP2009055985W WO2009119680A1 WO 2009119680 A1 WO2009119680 A1 WO 2009119680A1 JP 2009055985 W JP2009055985 W JP 2009055985W WO 2009119680 A1 WO2009119680 A1 WO 2009119680A1
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- conductor circuit
- conductor
- printed wiring
- wiring board
- opening
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0271—Arrangements for reducing stress or warp in rigid printed circuit boards, e.g. caused by loads, vibrations or differences in thermal expansion
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/02—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding
- H05K3/04—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed mechanically, e.g. by punching
- H05K3/045—Apparatus or processes for manufacturing printed circuits in which the conductive material is applied to the surface of the insulating support and is thereafter removed from such areas of the surface which are not intended for current conducting or shielding the conductive material being removed mechanically, e.g. by punching by making a conductive layer having a relief pattern, followed by abrading of the raised portions
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4644—Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
- H05K3/465—Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits by applying an insulating layer having channels for the next circuit layer
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/46—Manufacturing multilayer circuits
- H05K3/4644—Manufacturing multilayer circuits by building the multilayer layer by layer, i.e. build-up multilayer circuits
- H05K3/4682—Manufacture of core-less build-up multilayer circuits on a temporary carrier or on a metal foil
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/0352—Differences between the conductors of different layers of a multilayer
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0364—Conductor shape
- H05K2201/0373—Conductors having a fine structure, e.g. providing a plurality of contact points with a structured tool
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/095—Conductive through-holes or vias
- H05K2201/096—Vertically aligned vias, holes or stacked vias
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/01—Tools for processing; Objects used during processing
- H05K2203/0147—Carriers and holders
- H05K2203/0156—Temporary polymeric carrier or foil, e.g. for processing or transferring
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/02—Details related to mechanical or acoustic processing, e.g. drilling, punching, cutting, using ultrasound
- H05K2203/0228—Cutting, sawing, milling or shearing
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/15—Position of the PCB during processing
- H05K2203/1536—Temporarily stacked PCBs
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
- H05K3/0026—Etching of the substrate by chemical or physical means by laser ablation
- H05K3/0032—Etching of the substrate by chemical or physical means by laser ablation of organic insulating material
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0011—Working of insulating substrates or insulating layers
- H05K3/0017—Etching of the substrate by chemical or physical means
- H05K3/0026—Etching of the substrate by chemical or physical means by laser ablation
- H05K3/0032—Etching of the substrate by chemical or physical means by laser ablation of organic insulating material
- H05K3/0035—Etching of the substrate by chemical or physical means by laser ablation of organic insulating material of blind holes, i.e. having a metal layer at the bottom
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/007—Manufacture or processing of a substrate for a printed circuit board supported by a temporary or sacrificial carrier
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/0097—Processing two or more printed circuits simultaneously, e.g. made from a common substrate, or temporarily stacked circuit boards
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/107—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by filling grooves in the support with conductive material
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/10—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
- H05K3/20—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by affixing prefabricated conductor pattern
- H05K3/205—Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by affixing prefabricated conductor pattern using a pattern electroplated or electroformed on a metallic carrier
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T29/00—Metal working
- Y10T29/49—Method of mechanical manufacture
- Y10T29/49002—Electrical device making
- Y10T29/49117—Conductor or circuit manufacturing
- Y10T29/49124—On flat or curved insulated base, e.g., printed circuit, etc.
- Y10T29/49155—Manufacturing circuit on or in base
Definitions
- the present invention relates to a printed wiring board capable of ensuring sufficient flatness while reducing the thickness and a method for manufacturing the same.
- PKG substrate package substrate
- such a PKG substrate has a structure in which a reinforcing member such as a glass cloth copper-clad laminate is used as a core substrate, and build-up layers are formed on both sides thereof, and it is necessary to form a through hole also in the core substrate. is there.
- a reinforcing member such as a glass cloth copper-clad laminate
- build-up layers are formed on both sides thereof, and it is necessary to form a through hole also in the core substrate. is there.
- the density of wiring on the PKG substrate cannot be increased because it is difficult to miniaturize the through holes formed in the core substrate.
- the existence of such a core substrate increases the thickness of the entire PKG substrate, and there is also a problem that it cannot meet the demands for thinning and miniaturization as described above.
- Patent Document 1 proposes a multilayer printed wiring board (hereinafter referred to as “conventional example”) manufactured by the following steps (1) to (3). Yes.
- a predetermined portion is removed from the periphery of the buildup layer, and the buildup layer is formed. And a step of peeling the support substrate and the buildup layer so that the metal foil remains on each of the support substrate and (3) a step of etching the metal foil left on the buildup layer to form a BGA pad
- the multilayer printed wiring board described in the conventional example is an excellent technique in terms of reducing the thickness by forming a multilayer printed wiring board having no core substrate.
- Such unevenness of the resin insulating layer generally tends to increase as the resin insulating layer and the wiring are alternately laminated, and the unevenness generated on the surface of the resin insulating layer is further amplified by the density of the wiring. There is a case.
- the height of the solder pad located in the outermost layer (uppermost layer) also varies.
- the variation in the height of the solder pad makes the distance between the solder pad and the electrode of the electronic component uneven, so that stress tends to concentrate on a specific solder bump. Then, the solder bumps in which stress is concentrated tend to cause fatigue deterioration, and as a result, there is a possibility that the mounting yield of electronic parts and the mounting reliability are lowered.
- the entire substrate is convex upward due to the thermal history due to the heat generated by the semiconductor element mounted thereon.
- the distance between the semiconductor element and the outermost solder pad varies.
- a semiconductor element is mounted via an outermost solder pad, but an underfill resin is often filled between the semiconductor element and the multilayer printed wiring board.
- the resin insulating layer forming the printed wiring board is divided into two parts: a part where the underfill resin is not placed and a part where it is placed. Since the semiconductor element having a small thermal expansion coefficient is integrated with the resin insulating layer through the underfill resin as described above, the expansion of the resin insulating layer in this portion is caused by the thermal expansion coefficient of the semiconductor element. It will be constrained.
- the thermal expansion coefficient of the resin insulating layer is different in the above two categories, and it is presumed that this causes internal stress. Such internal stress tends to concentrate on the edge portion of the conductor circuit embedded in the resin insulating layer.
- a resin insulating layer having a first recess for a first conductor circuit and a first opening for a first via conductor provided on the first surface side; A first conductor circuit formed in one recess; a component mounting pad for mounting an electronic component formed on a second surface of the resin insulating layer located on the opposite side of the first surface; A printed wiring board formed in the opening and connecting the component mounting pad and the first conductor circuit; and a side surface of the first conductor circuit is A first printed wiring board having a tapered shape toward a component mounting pad side.
- the second recessed portion for forming the second conductor circuit is formed on the first surface side and is laminated on the first surface of the resin insulating layer, and for the second via conductor.
- a second via conductor connecting the first conductor circuit with each other, and a side surface of the second conductor circuit has a tapered shape toward the component mounting pad side. preferable.
- the present invention provides a first recess for the first conductor circuit provided on the first surface side and a component mounting provided on the second surface side opposite to the first surface.
- a resin insulating layer having a pad forming recess for a pad for use and a first opening for a first via conductor; a first conductor circuit formed in the first recess; and formed in the pad forming recess.
- a printed wiring board comprising: a component mounting pad; and a first via conductor formed in the opening and connecting the component mounting pad and the first conductor circuit.
- a side surface of the circuit is a second printed wiring board characterized by having a tapered shape toward the component mounting pad side.
- a protective film is formed on the surface of the pad.
- the surface of the first conductor circuit is located on substantially the same plane as the first surface of the resin insulating layer.
- the upper side of the first conductor circuit has an arc shape.
- a second recess for forming a second conductor circuit is formed on the first surface side, and is laminated on the first surface of the resin insulation layer.
- At least one second resin insulating layer having a second opening for two via conductors; a second conductor circuit formed in the second recess; and formed in the second opening, And a second via conductor connecting the first conductor circuit to the interlayer, and a side surface of the second conductor circuit has a tapered shape toward the component mounting pad side. It is preferable.
- the printed wiring boards of the first and second aspects of the present invention described above are laminated on the first surface of the second resin insulation layer, and a third resin insulation layer in which a third opening for a third via conductor is formed.
- a third conductor circuit formed on the first surface of the third resin insulating layer; and a third conductor circuit formed in the third opening and interlayer-connecting the third conductor circuit and the second conductor circuit. It is preferable that three via conductors are further provided.
- the line / space ratio of the first conductor circuit is preferably smaller than the line / space ratio of the third conductor circuit.
- the surface of the resin insulating layer forming the first recess and the first opening is roughened.
- the method further includes a step of forming the first recess and the first opening by a laser.
- the first recess is preferably formed with an excimer laser, and the first opening is preferably formed with a carbon dioxide laser.
- FIG. 1A is a cross-sectional view schematically showing the configuration of the printed wiring board according to the first embodiment of the present invention.
- FIG. 1B is an enlarged view of a part of a cross-sectional view of the printed wiring board according to the first embodiment.
- FIG. 2A is a process diagram (part 1) illustrating a production process of the printed wiring board according to the first embodiment.
- FIG. 2B is a process diagram (part 2) illustrating the production process of the printed wiring board according to the first embodiment.
- FIG. 2C is a process diagram (part 3) illustrating the production process of the printed wiring board according to the first embodiment.
- FIG. 2D is a process diagram (part 4) illustrating a production process of the printed wiring board according to the first embodiment.
- FIG. 3A is a process diagram (part 5) illustrating a production process of the printed wiring board according to the first embodiment.
- FIG. 3B is a process diagram (part 6) illustrating a production process of the printed wiring board according to the first embodiment.
- FIG. 3C is a process diagram (part 7) illustrating the production process of the printed wiring board according to the first embodiment.
- FIG. 3D is a process diagram (part 8) illustrating the production process of the printed wiring board according to the first embodiment.
- FIG. 3E is a process diagram (No. 9) illustrating the production process of the printed wiring board according to the first embodiment.
- FIG. 3F is a process diagram (part 10) illustrating the production process of the printed wiring board according to the first embodiment.
- FIG. 3G is a process diagram (part 11) illustrating a production process of the printed wiring board according to the first embodiment.
- FIG. 4A is a process diagram (part 12) illustrating a production process of the printed wiring board according to the first embodiment.
- FIG. 4B is a process diagram (part 13) illustrating the production process of the printed wiring board according to the first embodiment.
- FIG. 4C is a process diagram (part 14) illustrating a production process of the printed wiring board according to the first embodiment.
- FIG. 4D is a process diagram (part 15) illustrating the production process of the printed wiring board according to the first embodiment.
- FIG. 4E is a process diagram (part 16) illustrating a production process of the printed wiring board according to the first embodiment.
- FIG. 4F is a process diagram (part 17) illustrating the process for producing the printed wiring board according to the first embodiment.
- FIG. 5 is a process diagram (part 18) illustrating a process for producing a printed wiring board according to the first embodiment.
- FIG. 6 is a process diagram (No. 19) showing a process for manufacturing a printed wiring board according to the first embodiment.
- FIG. 7A is a cross-sectional view showing a configuration of a printed wiring board according to another embodiment of the present invention.
- FIG. 7B is an enlarged view of a part of a cross-sectional view of the printed wiring board according to the second embodiment.
- FIG. 8A is a process diagram (part 1) illustrating a production process of a printed wiring board according to the second embodiment.
- FIG. 8B is a process diagram (part 2) illustrating the production process of the printed wiring board according to the second embodiment.
- FIG. 8C is a process diagram (part 3) illustrating the production process of the printed wiring board according to the second embodiment.
- FIG. 8D is a process diagram (part 4) illustrating the production process of the printed wiring board according to the second embodiment.
- FIG. 8E is a process diagram (part 5) illustrating a process for producing a printed wiring board according to the second embodiment.
- FIG. 9A is a process diagram (part 6) illustrating a production process of a printed wiring board according to the second embodiment.
- FIG. 9B is a process diagram (part 7) illustrating the production process of the printed wiring board according to the second embodiment.
- FIG. 9C is a process diagram (part 8) illustrating the production process of the printed wiring board according to the second embodiment.
- FIG. 9D is a process diagram (part 9) illustrating the production process of the printed wiring board according to the second embodiment.
- FIG. 10 is a process diagram (part 10) illustrating a process for producing a printed wiring board according to the second embodiment.
- FIG. 1A shows the positional relationship among the printed wiring board 100 according to the first embodiment of the present invention, the laminated portion 20L constituting the printed wiring board 100, the solder member (solder bump) 46L, the solder resist 30L, and the like.
- FIG. 1A shows the positional relationship among the printed wiring board 100 according to the first embodiment of the present invention, the laminated portion 20L constituting the printed wiring board 100, the solder member (solder bump) 46L, the solder resist 30L, and the like.
- the solder member 46L is formed on the laminated portion 20L of + resin insulating layer in the Z-direction which is formed in the outermost layer 21L on the pad 42L which is provided in one of + Z direction surface.
- the solder resist 30L is provided on the ⁇ Z direction side surface of the outermost layer formed on the ⁇ Z direction side of the stacked portion 20L.
- the solder resist 30L pad 28L which is a part of the wiring pattern (28L is the same as 22L 5) is opening 51LO for exposing the provided.
- the printed wiring board 100 is formed in (a) and a plurality of insulating layers 21L laminate part 20L formed by j, (b) of the resin insulating layer constituting the laminate unit 20L, the outermost layer of the + Z direction surface A pad 42L and (c) a solder resist 30L formed on the ⁇ Z direction side surface of the stacked portion 20L are provided.
- the printed wiring board 100 further includes (iv) a solder member 46L provided on the pad 42L, (V) an opening 51LO provided in the solder resist 30L, and (vi) a pad 28L exposed from the opening 51LO. And.
- the resin recess layer 21L 1 constituting the uppermost layer is provided with a first recess on the ⁇ Z direction side surface (first surface side).
- the first recess is open to the first surface of the resin insulating layer 21L 1.
- the surface of the resin insulating layer 21L 1 that forms the first recess is roughened.
- a conductor circuit 22L 1 is formed in the first recess, and the surface of the conductor circuit 22L 1 and the first surface of the resin insulating layer 21L 1 are located on substantially the same plane.
- the side surface of the conductor circuit 22L 1 tapers toward the pad 42L side. That is, the width of the conductor circuit 22L 1 becomes wider toward the lower side ( ⁇ Z direction), and as shown in FIG.
- the width t corresponding to the opening portion of the first recess in the conductor circuit 22L 1 is increased. It is the widest.
- the conductive circuit 22L 1 + Z direction side edge (upper side) has a arcuate.
- the manufacture of the printed wiring board 100 of the first embodiment will be described by taking as an example the case of using a support member having a conductor layer formed on both sides.
- the support member SM is prepared (see FIG. 2A).
- the support member SM includes an insulating member 10 and conductor layers FU and FL formed on both surfaces of the insulating member 10.
- the conductor layers FU and FL are metal foils having a thickness of about several ⁇ m to several tens of ⁇ m.
- the insulating member 10 examples include a glass substrate bismaleimide triazine resin impregnated laminate, a glass substrate polyphenylene ether resin impregnated laminate, a glass substrate polyimide resin impregnated laminate, and the like.
- the metal foil may be fixed by a known method.
- a commercially available double-sided copper-clad laminate or single-sided copper-clad laminate can also be used as the supporting member SM. Examples of such commercially available products include MCL-E679 FGR (manufactured by Hitachi Chemical Co., Ltd.).
- a metal plate can also be used as the support member SM.
- the first surfaces of the metal foils 11U and 11L are overlaid on the first surface and the second surface of the support member SM, respectively.
- the metal foil to be used include a copper foil, a nickel foil, a titanium foil, and the like.
- the second surface of these metal foils is a mat surface (a surface having irregularities on the surface of the metal foil). It is preferable.
- the 2nd surface of metal foil means the surface on the opposite side to a 1st surface. When a copper foil is used as the metal foil, a thickness of 3 to 35 ⁇ m is preferable.
- these metal foils 11U and 11L are bonded or bonded to the conductor layers FU and FL formed on the insulating member 10 at a desired portion AD (near the end) using ultrasonic waves or an adhesive.
- a desired portion AD near the end
- ultrasonic waves or an adhesive it is preferable from the viewpoint of processing performed later.
- As a method for fixing such a conductor layer (support substrate) and the metal foil it is preferable to use ultrasonic waves from the viewpoint of adhesion strength and simplicity of both.
- etching resists RU1 and RL1 are formed so as to partially overlap the joints AD between the conductor layers FU and FL and the metal foils 11U and 11L.
- the resists RU1 and RL1 can be formed using, for example, a commercially available dry film resist or liquid resist.
- a portion of the conductor layer (metal foil) FU and the metal foil 11U where the resist RU1 is not formed, and a portion of the metal foils FL and 11L where the resist RL1 is not formed are known. This is removed by etching or the like using. Thereafter, the resists RU1 and RL1 are removed by a conventional method.
- a resin insulating layer (resin insulating layer formed on the support member 10) 21U 1 is formed so as to cover the first surface of the insulating member 10 and the metal foils FU and 11U.
- a resin insulating layer (resin insulating layer on the core) 21L 1 is formed so as to cover the second surface of the insulating member 10 and the metal foils FL and 11L. This insulating layer eventually forms the uppermost insulating layer of each multilayer printed wiring board.
- an interlayer insulating film As the resin insulating layer, an interlayer insulating film, a prepreg or other semi-cured resin sheet can be used. Moreover, you may form a resin insulating layer by screen-printing uncured liquid resin on the metal foil mentioned above.
- an ABF series manufactured by Ajinomoto Fine Techno Co., Ltd.
- an interlayer film for build-up wiring boards can be used as such an interlayer insulating film.
- openings 21UV 1 and 21LV 1 for the via conductor for interlayer connections.
- the laser that can be used to form these openings include a carbon dioxide gas laser, an excimer laser, a YAG laser, and a UV laser.
- protective films such as PET (polyethylene terephthalate) film.
- the first recesses 21UO p1 and 21LO p1 for the conductor circuit are formed in a second laser processing step using a UV laser or an excimer laser.
- the surface of the resin insulating layer forming the first recess is inclined inward as the metal foil 11U or 11L on which the pad is formed approaches.
- the upper portions of the via openings 21UV 1 and 21LV 1 are processed with a laser to form 21UV p1 and 21LV p1 as shown in FIG. 3C.
- the bottoms of the via conductor openings 21UV p1 and 21LV p1 are also irradiated with UV laser to simultaneously remove resin residues remaining on these bottoms. It is preferable. Thereby, the connection reliability between the via conductor formed later and the pad formed later can be improved.
- the surface of the resin insulating layer 21U 1 and 21L 1 may be roughened (see Fig. 3D ).
- an electroless plating film (electroless copper plating film) and electroless so as to cover the surfaces of the resin insulating layers 21U 1 and 21L 1 including the via conductor opening and the first recess.
- Plating layers 24UP and 24LP made of an electrolytic plating film (electrolytic copper plating film) formed on the plating film are formed.
- a plating layer 24UP and 24LP above polished to expose the surface of the resin insulating layer 21U 1 and 21L 1, via conductors 24U embedded in the resin insulating layer 1 and the inner layer conductor circuits 22U 1 and 22L 1 (See FIG. 3F).
- polishing technique used here include chemical mechanical polishing (CMP) and buff polishing.
- interlayer insulating films are stacked so as to cover the + Z direction side surface of the build-up part BU 1 formed as described above and the ⁇ Z direction side surface of BL 1 to form resin insulating layers 21U 3 and 21L 3 respectively .
- these resin insulating layer 21U 3, in 21L 3, to form a via conductor openings 21UO 3 and 21LO 3 for interlayer connection see FIG. 4B).
- the via conductor openings 21UO 3 and 21LO 3 can be formed using any laser selected from the group consisting of a carbon dioxide laser, an excimer laser, and a YAG laser (see FIG. 4B).
- a photosensitive resin is used as the resin insulating layers 21U 3 and 21L 3 , exposure and development are performed, and the via conductor openings 21UO 3 and 21LO 3 may be formed in the same manner as described above.
- catalyst nuclei are formed on the surfaces of the resin insulating layers 21U 3 and 21L 3 , and plating films 26UP and 26LP are formed by electroless plating (see FIG. 4C).
- plating films 26UP and 26LP are formed by electroless plating (see FIG. 4C).
- resist patterns RU2 and RL2 are formed on the electroless plating films 26UP and 26LP, respectively (see FIG. 4D).
- an electrolytic plating film is formed in a portion where the resist pattern is not formed, and the via conductor opening is filled by electrolytic plating.
- the surfaces of the resin insulating layers 21U 3 and 21L 3 and the surfaces of the inner layer conductor circuits 22U 3 and 22L 3 are both roughened.
- the resin insulating layer 21U 4 is formed so as to cover the inner conductor layer 22U 3 and the via conductor 24UV 3 formed in this way, and the resin insulating layer 21L 4 is covered so as to cover the inner layer conductor layer 22L 3 and the via conductor 24LV 3. (Not shown). Thereafter, the procedure from the formation of the via conductor openings 24UO 4 and 24LO 4 using a laser to the formation of the inner conductor layers 22U 4 and 22L 4 is repeated a desired number of times, and build-up is performed by the semi-additive method described above. Portions BU 2 and BL 2 are formed (see FIG. 4F). FIG. 4F shows a case where 21U 5 and 21L 5 are the outermost layers.
- a via hole is formed in the outermost layer using a laser, and, similarly to the above, after coating with a plating resist and patterning using a laser, an electrode serving as a ground pattern is formed. Thereafter, the plating resist is removed, and pads 28U and 28L are formed.
- solder resists 30U and 30L are formed on the surfaces of the build-up portions BU 2 and BL 2 , respectively.
- Such solder resists 30U and 30L can be formed, for example, by applying a commercially available solder resist composition and performing a drying process. Thereafter, exposure and development are performed using a mask to form openings 51UO and 51LO in the solder resists 30U and 30L, respectively, exposing a part of the conductor circuit (see FIG. 5).
- the conductor circuits 28U and 28L exposed by the openings 51UO and 51LO formed in the solder resist function as pads, and solder members (solder bumps) and pins are formed on the pads. And this printed wiring board will be electrically connected to another board
- the opening provided in the solder resist may be formed so as to expose the surface of the via conductor and a part of the conductor circuit (via land) connected to the via conductor. Also in this case, the portion of the conductor exposed by the opening of the solder resist functions as a pad.
- the laminated body 40 manufactured as described above is cut at predetermined positions A1-A1 'and B1-B1' inside the joint portion AD. Thereby, the intermediate substrate 20U ′ having the metal foil 11U and the laminate 20U and the intermediate substrate 20L ′ having the metal foil 11L and the laminate 20L are separated from the support member BS (see FIG. 5).
- a resist pattern is formed on the metal foils 11U and 11L provided on the surfaces of the stacked bodies 20U ′ and 20L ′, and the resist pattern is formed using an etching solution containing cupric chloride or ferric chloride.
- the metal foil 11U or 11L is removed from other than the formed portion.
- the pad 42L on which the electronic component on the surface on the + Z direction side of the stacked body 20L 'is mounted is formed.
- a protective film 44L is formed on the surface of the pad 42L.
- the protective film 44L may be formed of one layer or a plurality of layers.
- a pad and a protective film for the pad are formed on the ⁇ Z direction side surface of the stacked body 20U ′ in the same manner as described above.
- the protective film 44L is a single layer, for example, an electroless Au plating film or an electroless Pd plating film is formed on the pad, and this is used as the protective film.
- the protective film 44L has two layers, for example, an electroless Ni plating film and then an electroless Au plating film are sequentially formed on the pad to form a protective film.
- the protective film 44L has three layers, each plating film is formed in the order of an electroless Ni plating film, an electroless palladium plating film, and an electroless Au plating film to form a protective film.
- a protective film is similarly formed on the pad 28L (see FIG. 6).
- solder member (solder bump) 46L is formed by printing and reflowing a solder paste.
- the angle of the edge portion E becomes gentle (obtuse angle) when the conductor circuit is viewed in cross section. For this reason, for example, even if internal stress is generated in the outermost resin insulation layer as described above in accordance with heat generation of the semiconductor element, the stress concentrated on the edge portion of the conductor circuit is different from the conventional angle. It will be relaxed. As a result, it is possible to effectively suppress the occurrence of cracks in the resin insulating layer with the edge portion of the conductor circuit as a base point. Furthermore, by making the upper side of the conductor circuit embedded in the outermost resin insulation layer like an arc as in the present invention, such an effect can be more easily obtained.
- the surfaces of the conductor circuit 22L k , the resin insulating layer 21L k , and the via conductor 24L k are located on substantially the same plane, and the flatness of the buildup portion is ensured.
- the height of the pad 42L becomes substantially uniform, the mounting yield of electronic components can be improved.
- the distances between these pads and the electrodes of the electronic component can be made substantially uniform. As a result, it is possible to avoid stress concentration on specific bumps and to improve connection reliability.
- the wiring that requires fine routing corresponding to the reduction in the terminal interval of the electronic component is placed inside the resin insulating layer on the upper layer side (+ Z direction side) of the build-up portion. It is formed by embedding. On the other hand, wiring by the semi-additive method is formed on the lower layer side ( ⁇ Z direction side) of the build-up portion where rough routing is sufficient compared to these wirings.
- omit the roughening process after forming a recessed part in a resin insulating layer For example, using any metal selected from the group consisting of Ti, W, Ta and Cu on the surface of the resin insulating layer including the recess for the conductor circuit, After forming a thin film by sputtering, electrolytic plating is performed using this thin film as a power feeding layer. Next, polishing is performed so that the surface of the resin insulating layer is exposed. Thereby, a conductor circuit is formed, and excellent adhesion between the conductor circuit and the resin insulating layer can be ensured.
- two conductor layers having embedded wirings are formed in the laminated portion, but the number of layers is not particularly limited. That is, all the conductor layers constituting the laminated portion may be constituted by embedded wiring. At this time, the wiring by the semi-additive method is not formed.
- the first surface of the resin insulating layer 21U 3, on the second surface of 21L 3, at least one of the conductor circuit 22U 3 or 22L 3 and power source plane layer or ground plane layer in the same layer is not formed Also good. In this case, including these plane layer and the conductor circuit 22L j located directly above the microstrip structure is formed.
- a multilayer printed wiring board can also be manufactured by forming a buildup part on one side of a support member according to the above-described procedure using a support member having a conductor layer formed on one side.
- the structure of the multilayer portion 20A is the same as the laminated portion 20U mentioned above, the resin insulating layer 21A j in place of (i) the resin insulating layer 21L j, the conductor circuit 22A in place of (ii) 22L j And (iii) via conductors 24A j that perform interlayer connection between conductor circuits in place of 24L j .
- the pad 42A is provided inside the second recess provided in the outermost of the second surface of the resin insulating layer 21A 1 (+ Z direction side surface) side of the laminate 20A.
- a protective film is formed on the pad 42A. The surface of the protective film, located on the second surface and on approximately the same plane of the resin insulating layer 21A 1 (see FIG. 7B).
- a metal plate such as a copper plate is used as the support member 10A, for example.
- a seed layer 11A composed of a plurality of different metals is formed on the support member 10A.
- a chromium layer is formed on the first surface (+ Z direction side surface) of the copper plate, and a copper layer is formed on the first surface of the chromium layer to form the seed layer 11A.
- methods such as electroless plating, sputtering, and vapor deposition can be used.
- it replaces with chromium and it etches with the etching liquid which etches the metal which comprises 10 A of support members you may use the metal whose etching rate is remarkably slow.
- a resist pattern R ′ is formed on the first surface of the seed layer 11A (see FIG. 8B).
- a metal layer P1 is formed on the surface of the seed layer 11A exposed from the resist pattern R ′ (see FIG. 8C).
- the metal layer P1 can be formed as having a gold (Au) plating film, a palladium (Pd) plating film, and a nickel (Ni) plating film in this order from the surface of the seed layer 11A toward the + Z direction. These plating films are formed by, for example, electrolytic plating.
- an Au—Ni composite layer may be formed as the metal layer P1.
- Such a metal layer P1 functions as a protective film that suppresses oxidation of a component mounting pad, which will be described later, and has an effect of improving the wettability of solder.
- a metal layer P2 made of, for example, copper is formed on the metal layer P1 by, for example, electrolytic plating (see FIG. 8C).
- the metal layers P1 and P2 also function as pads 42A for mounting electronic components.
- the resist is removed according to methods well known (see FIG. 8D), then in the same manner as in the first embodiment to form a resin insulating layer 21A 1 (see FIG. 8E).
- the formation of such a resin insulating layer 21A 1 may be used the above-mentioned resin.
- a buildup layer is formed according to the procedure shown in FIGS. 3B to 4F described above, and thereafter, the support member 10A is removed by etching or the like (see FIG. 9A). At that time, the etching of copper constituting the support member 10A stops at the chromium layer constituting the seed layer 11A.
- the above-described seed layer 11A is removed (see FIG. 9A).
- the seed layer 11A is first removed in the order of the chromium layer and then the copper layer.
- the chromium layer is removed using an etchant that etches the chromium layer but does not etch the copper layer, and then removes the copper layer with an etchant that etches the copper layer that forms the seed layer.
- the protective film P1 formed on the mounting pads 42A are exposed on the first surface of the resin insulating layer 21A 1 (-Z direction side surface) (see FIG. 9B). In this case, it is located on substantially the same plane as the first surface and the surface of the protective film P1 of the resin insulating layer 21A 1.
- the pad 42A is formed inside the outermost resin insulating layer 21A 1. Further, the surface of the pad 42A protective film is formed, a surface composed of a resin insulating layer 21A 1 of the protective layer and the outermost is a schematic plan. For this reason, when the solder resist 30B is not formed, the filling property of the underfill resin can be improved. Further, since the surface formed by the protective film and the outermost resin insulating layer 21A 1 is a schematic plan, it becomes easy to unify the height of the solder members, thereby improving the mounting of the electronic component.
- the conductor layer having the embedded wiring is two layers in the laminated portion, but the number of layers is not particularly limited. That is, all the conductor layers constituting the laminated portion may be constituted by embedded wiring. At this time, the wiring by the semi-additive method is not formed.
- Example 1 Production of printed wiring board (1)
- Base material BS As a support member SM, double-sided copper-clad laminate (SM) in which 18 ⁇ m-thick copper foils FU and FL are stretched on both sides of a 0.4 mm-thick glass epoxy plate (product number: MCL-E679 FGR Hitachi Chemical Co., Ltd.) Made) (see FIG. 2A).
- SM double-sided copper-clad laminate
- the 1st surface of 18-micrometer-thick copper foil 11U and 11L was piled up on the copper clad laminated board on both surfaces of the double-sided copper clad laminated board (SM).
- One surface of each of the copper foils 11U and 11L is a mat surface (an uneven surface), and the second surface is a mat surface.
- set the horn of the ultrasonic bonding device so that the copper foil and the double-sided copper-clad laminate are joined at a position 20 mm inside from each end, and the copper-clad laminate and the copper foil are attached under the following conditions: Joined (see FIG. 2B).
- an etching resist was formed on the copper foil using a commercially available resist. Thereafter, exposure / development processing was performed, and the etching resist was patterned so as to cover the bonding portion (AD) as shown in FIG. 2C.
- the copper foils FU and 11U and FL and 11L where the etching resist is not formed are removed by a tenting process using an etchant containing cupric chloride or the like. Thereafter, the etching resist was peeled off according to a conventional method to produce a support member BS (see FIG. 2D).
- Laminate formation (2-1) Embedded wiring formation
- a build-up wiring interlayer film (ABF series, manufactured by Ajinomoto Fine Techno Co., Ltd.) is pasted on both sides of the base material BS manufactured as described above.
- the resin insulation layer (the uppermost resin insulation layer) was formed by thermosetting at about 170 ° C. for 180 minutes (see FIG. 3A).
- an opening for a via conductor was formed using a carbon dioxide laser under the conditions of a wavelength of 10.4 ⁇ m, a beam diameter of 4.0 mm, a single mode, a pulse width of 8.0 ⁇ sec, and 1 to 3 shots (FIG. 3B). reference).
- a recess for a conductor circuit was formed under the conditions of a wavelength of 308 nm or 355 nm, and the residue remaining at the bottom of the via conductor opening was removed (see FIG. 3C).
- Electroless copper plating was performed using a commercially available plating bath to form an electroless copper plating film having a thickness of about 0.3 to 1 ⁇ m.
- electrolytic copper plating was performed using the electroless copper plating film as a power feeding layer to form an electrolytic copper plating film having a thickness of 10 to 30 ⁇ m on the surface of the resin insulating layer (see FIG. 3E).
- the plating films (electroless copper plating film and electrolytic copper plating film) of the resin insulating layer were polished by buffing to expose and planarize the surface of the resin insulating layer (see FIG. 3F).
- # 400, 600, or 800 was used as the buff count.
- the via conductor 24U 1 and the inner layer conductor circuit 22U 1 were formed.
- the inner layer is formed a conductor circuit 22U 1 line / space (L / S) was about 5 [mu] m / 5 [mu] m.
- electroless copper plating was performed using a commercially available plating bath to form an electroless copper plating film having a thickness of about 0.3 to 1 ⁇ m (see FIG. 4C).
- a commercially available dry film for plating resist was laminated, and as shown in FIG. 4D, the dry film was patterned by a photographic method.
- electrolytic copper plating is performed using the electroless copper plating film formed on the resin insulating layer as an electrode, and an electrolytic copper plating film having a thickness of 5 to 20 ⁇ m is formed on the portion of the electroless copper plating film where the plating resist is not formed. Formed. Thereafter, the plating resist was removed.
- the electroless copper plating film existing under the plating resist was removed to form an inner layer conductor circuit 22U 3 and a via conductor 24UV 3 (see FIG. 4E).
- the inner side conductor circuit 22L 3 and the via conductor 24LV 3 were formed on the opposite side.
- the via conductor formed here fills the opening formed in the resin insulating layer 21U 3 , and the upper surface thereof is the upper surface (+ Z direction) of the inner layer conductor circuit 22U 3 formed on the same resin insulating layer 21U 3. (Side surface) and substantially on the same plane.
- the surface on the ⁇ Z direction side of the inner layer conductor circuit 22L 3 and the via conductor 24LV 3 are located on substantially the same plane.
- the steps from the formation of the resin insulating layer to the formation of the conductor circuit and the via conductor were repeated twice to form the stacked bodies BU 2 and BL 2 (see FIG. 4F).
- solder resist 30U a commercially available product on the conductor circuits 28U formed on the resin insulation layer 21U 5 of the top layer.
- a mask was overlaid on the solder resist 30U, and an opening was formed in the solder resist 30U by photolithography. The surface portion of the conductor circuit exposed by this opening functioned as a pad (see FIG. 5).
- the laminated member is cut just inside the joint, and the support member BS and the laminated bodies 20U ′ and 20L ′ are peeled off.
- the etching resist was patterned by a photographic method.
- the laminated body 20U ′ was processed in the same process. In this state, etching was performed using an etchant containing cupric chloride as a main component, and a portion of the copper foil where the etching resist was not formed was removed to form the pad 42L.
- Example 1 an electroless Ni plating film and an electroless Au plating film were sequentially formed on the surface of the pad 42L to form a protective film 44L. Then, solder bumps 46L were formed on the pads 42L on which the protective film was formed (see FIG. 6).
- the side surface of the outermost conductor circuit is inclined, and the edge portion has a gentle obtuse angle. For this reason, the semiconductor element mounted on the printed wiring board via the solder bumps generates heat, for example, and the internal stress generated in the outermost resin insulation layer is concentrated on the edge portion of the conductor circuit. However, the internal stress was relieved by the gentle edge. As a result, the occurrence of cracks in the resin insulating layer with the edge portion of the conductor circuit as a base point was effectively suppressed.
- Example 2 the printed wiring board 100A (see FIG. 10) described in the second embodiment was manufactured. That is, the pad 42A was first formed on the insulating member 10A (see FIGS. 8A to 8D), and then the buildup portion and the solder resist were formed on the support member in the same procedure as in the first embodiment.
- Example 3 A printed wiring board 100A was manufactured in the same manner as in Example 1 except that the first recess for the conductor circuit and the opening for the via conductor were formed by imprinting.
- the printed wiring board according to the present invention is useful as a thin printed wiring board and is suitable for use in reducing the size of the apparatus.
- the method for manufacturing a printed wiring board according to the present invention is suitable for manufacturing with high yield by suppressing the occurrence of cracks in the resin insulating layer.
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- Manufacturing Of Printed Wiring (AREA)
Abstract
Description
しかしながら、コア基板に形成されるスルーホールの微細化が難しいことに起因して、PKG基板の配線の高密度化が図れないといった問題がある。また、こうしたコア基板の存在により、PKG基板全体の厚みが増加し、上記のような薄型化・小型化の要求に応えられていないという問題もある。
(2)ビルドアップ層の周囲から所定の部分を除去し、ビルドアップ層と支持基板それぞれに金属箔が残るように、支持基板とビルドアップ層とを剥離させる工程
(3)ビルドアップ層に残された金属箔をエッチングし、BGAパッドを形成する工程
さらに、前記第1及び第2のプリント配線板においては、前記樹脂絶縁層の第1面上に積層され、第2導体回路形成用の第2凹部が第1面側に形成されるとともに、第2ビア導体用の第2開口部が形成された、少なくとも1層の第2樹脂絶縁層と;前記第2凹部に形成されている第2導体回路と;前記第2開口部に形成され、前記第2導体回路と、前記第1導体回路とを層間接続する第2ビア導体と;をさらに備え、前記第2導体回路の側面は、前記部品搭載用パッド側に向かって先細りの形状を有していることが好ましい。
また、前記第1導体回路のライン/スペース比は、前記第3導体回路のライン/スペース比よりも小さいことが好ましい。
図1Aは、本発明の第1実施形態に係るプリント配線板100と、前記プリント配線板100を構成する積層部20Lと、半田部材(半田バンプ)46Lと、ソルダレジスト30L等の位置関係を示す図である。
プリント配線板100は、(a)複数の絶縁層21Ljで形成された積層部20Lと、(b)積層部20Lを構成する樹脂絶縁層のうち、最外層の+Z方向側表面に形成されたパッド42Lと、(c)積層部20Lの-Z方向側表面上に形成されたソルダレジスト30Lとを備えている。
ここで、導体回路22L1の側面は、パッド42L側に向かってテーパしている。すなわち、下方(-Z方向)に向かうに連れて導体回路22L1の幅が広くなっており、図1Bに示すように、導体回路22L1のうち第1凹部の開口部分に相当する幅tが最も広くなっている。なお、このとき、導体回路22L1の+Z方向側の辺(上辺)は、弧状となっている。
さらに、最上層を構成する樹脂絶縁層21L1の直下に位置する樹脂絶縁層21L2及び、その樹脂絶縁層21L2の内部に形成されたビア導体24L1を介して導体回路22L1に接続される22L2に関しても上記と同様の構成を有する(図1A、図1B参照)。
プリント配線板100の製造に際しては、まず、支持部材SMを用意する(図2A参照)。支持部材SMは、絶縁部材10と、絶縁部材10の両面に形成されている導体層FU及びFLとからなる。導体層FU及びFLは、約数μmから数十μm程度の厚みの金属箔である。
また、支持部材SMとしては、市販されている両面銅張積層板や片面銅張積層板を使用することもできる。このような市販品としては、例えばMCL-E679 FGR(日立化成工業(株)社製)等が挙げられる。なお、支持部材SMとして金属板を使用することもできる。
また、樹脂絶縁層21U3及び21L3として感光性樹脂を使用した場合には、露光・現像を行い、上記と同様にして、ビア導体用開口部21UO3及び21LO3を形成すればよい。
ついで、無電解めっき膜26UP及び26LP上に、それぞれレジストパターンRU2及びRL2を形成する(図4D参照)。その後、レジストパターンを形成していない部分に電解めっき膜を形成し、ビア導体用開口部を電解めっきにより充填する。
図4Fには、21U5及び21L5が最外層となっている場合を示す。上記最外層に、レーザーを用いてビアホールを形成し、上記と同様に、めっきレジストによる被覆とレーザーによるパターニングを行った後に、グランドパターンとなる電極を形成する。その後、めっきレジストを除去し、パッド28U及び28Lを形成する。
この後、マスクを用いて露光・現像を行い、導体回路の一部を露出させる、開口部51UO及び51LOを、ソルダレジスト30U及び30Lにそれぞれ形成する(図5参照)。
なお、ソルダレジストに設けられる開口部は、ビア導体の表面及びそのビア導体と接続している導体回路(ビアランド)の一部を露出するように形成してもよい。この場合にも、ソルダレジストの開口部により露出された導体の部分がパッドとして機能する。
さらに、本願発明のように最外層の樹脂絶縁層の内部に埋め込まれる導体回路の上辺を弧状にすることで、そのような効果が一層得られやすくなる。
なお、片面に導体層が形成されている支持部材を用いて、上述した手順に従い、ビルドアップ部を支持部材の片面に形成し、多層プリント配線板を製造することもできる。
次に、本願発明の第2実施形態を図7Aに示す。
図7Aにおいては、プリント配線板100Aは、(a’)複数の絶縁層21Aj(j=1~5)で形成された積層部20Aと、(b’)電子部品搭載用のパッド42Aと、(c’)積層部20Aの-Z方向側表面上に形成されたソルダレジスト30Aと、(d’)積層部20Aの+Z方向側表面上に形成されたソルダレジスト30Bとを備えている。なお、ソルダレジスト30A及び30Bは省略されていてもよい。
また、上記パッド42Aは、積層部20Aの最外の樹脂絶縁層21A1の第2面(+Z方向側表面)側に設けられた第2凹部の内部に設けられている。そして、このパッド42A上には保護膜が形成されている。この保護膜の表面は、樹脂絶縁層21A1の第2面と略同一平面上に位置する(図7B参照)。
なお、クロムに代えて、支持部材10Aを構成する金属をエッチングするエッチング液によってエッチングされるが、エッチング速度が著しく遅い金属を使用してもよい。
また、金属層P1として、Au-Niの複合層を形成することとしてもよい。こうした金属層P1は、後述する部品実装用のパッドの酸化を抑制する保護膜として機能するとともに、半田の濡れ性を高める効果を有するものである。
引き続き、部品実装用パッド42Aの上に半田部材(半田バンプ)50Aを形成し(図9D参照)、プリント配線板100Aを製造する(図10参照)。
すなわち、第2実施形態の多層プリント配線板100Aは、パッド42Aが最外の樹脂絶縁層21A1の内部に形成されている。さらに、パッド42Aの表面には保護膜が形成されており、この保護膜と最外の樹脂絶縁層21A1とで構成される表面は略平面である。このため、ソルダレジスト30Bを形成しない場合には、アンダーフィル樹脂の充填性を向上させることができる。さらに、保護膜と最外の樹脂絶縁層21A1とで構成される表面は略平面であるため、半田部材の高さを統一させることが容易となり、電子部品の実装性が向上する。
ここで、樹脂絶縁層21A3は、導体回路22A2と樹脂絶縁層21A2とで構成される略平面上にそれぞれ形成されているため、平坦で厚みも均一なものとなる。その結果、特性インピーダンスを効果的に整合でき、信号の伝搬を安定化させることが容易となる。
(1)母材BS
支持部材SMとして、厚み0.4mmのガラスエポキシ板の両面に、厚み18μmの銅箔FU及びFLが張られている両面銅張積層板(SM)(商品番号:MCL-E679 FGR 日立化成株式会社製)を使用した(図2A参照)。
次に、銅箔と両面銅張積層板とが各端部から20mm内側の位置で接合されるように、超音波接合装置のホーンをセットし、下記の条件で銅張積層板と銅箔を接合した(図2B参照)。
ホーンの振動数:f=28kHz/sec
ホーンの銅箔に対する圧力:p=約0~12kgf
ホーンの銅箔に対する送り速度:v=約10mm/sec
固定部分は、金属箔の端部からその中心部に向かって20mm内側の位置とし、両者の固定幅は、2mmの幅とした。
(2-1)埋め込み配線の形成
以上のようにして製造した母材BSの両面に、ビルドアップ配線用層間フィルム(ABFシリーズ、味の素ファインテクノ株式会社製)を貼り付け、約170℃で180分間熱硬化し、樹脂絶縁層(最上層の樹脂絶縁層)を形成した(図3A参照)。
次いで、炭酸ガスレーザーを用いて、波長10.4μm、ビーム径4.0mm、シングルモード、パルス幅8.0μ秒、1~3ショットの条件で、ビア導体用の開口部を形成した(図3B参照)。
次に、ビルドアップ配線用層間フィルム(ABFシリーズ、味の素ファインテクノ株式会社製)を、この上に貼り付け、約170℃で180分間熱硬化し、樹脂絶縁層21U3を形成した(図4A参照)。
そして、炭酸ガスレーザーを用いて、波長10.4μm、ビーム径4.0mm、シングルモード、パルス幅8.0μ秒、1ショットの条件で、ビア導体用の開口部を形成した(図4B参照)。
そして、樹脂絶縁層の形成から、導体回路及びビア導体の形成までの工程を2回繰り返し、積層体BU2及びBL2を形成した(図4F参照)。
その状態で、塩化第二銅を主成分とするエッチング液を用いてエッチングし、エッチングレジストが形成されていない部分の銅箔を除去することでパッド42Lを形成した。
この実施例1では、最外層の導体回路の側面が傾斜していて、そのエッジ部分が緩やかな鈍角となっていた。このため、半田バンプを介してプリント配線板上に実装された半導体素子が、例えば、発熱し、これに伴って最外層の樹脂絶縁層に生じた内部応力が導体回路のエッジ部分に集中するとしても、その内部応力は緩やかなエッジ部分により緩和された。その結果、導体回路のエッジ部分を基点として、樹脂絶縁層にクラックが生じることが効果的に抑制された。
ここでは、第2実施形態に記載のプリント配線板100A(図10参照)を製造した。
すなわち、絶縁部材10A上に先にパッド42Aを形成し(図8A~8D参照)、その後、支持部材上に第1実施形態と同様の手順でビルドアップ部及びソルダレジストを形成した。
導体回路用の第1凹部、及びビア導体用の開口部をインプリントにより形成することとした以外は、実施例1と同様にして、プリント配線板100Aを製造した。
Claims (15)
- 第1面側に設けられた第1導体回路用の第1凹部と、第1ビア導体用の第1開口部とを有する樹脂絶縁層と;
前記第1凹部に形成されている第1導体回路と;
前記樹脂絶縁層において前記第1面と反対側に位置する第2面上に形成されていて、電子部品を搭載するための部品搭載用パッドと;
前記開口部に形成されており、前記部品搭載用パッドと前記第1導体回路とを接続する第1ビア導体と;を備えるプリント配線板であって、
前記第1導体回路の側面は、前記部品搭載用パッド側に向かって先細りの形状を有していることを特徴とするプリント配線板。 - 第1面側に設けられた第1導体回路用の第1凹部と、前記第1面と反対側に位置する第2面側に設けられた部品搭載用パッド用のパッド形成凹部と、第1ビア導体用の第1開口部とを有する樹脂絶縁層と;
前記第1凹部に形成されている第1導体回路と;
前記パッド形成凹部に形成されている部品搭載用パッドと;
前記開口部に形成されており、前記部品搭載用パッドと前記第1導体回路とを接続する第1ビア導体と;を備えるプリント配線板であって、
前記第1導体回路の側面は、前記部品搭載用パッド側に向かって先細りの形状を有していることを特徴とするプリント配線板。 - 前記パッドの表面には保護膜が形成されていることを特徴とする、請求項2に記載のプリント配線板。
- 前記保護膜は前記樹脂絶縁層の第2面と略同一平面上に位置する表面を有することを特徴とする、請求項3に記載のプリント配線板。
- 前記第1導体回路の上辺が弧状をなしていることを特徴とする、請求項1又は2に記載のプリント配線板。
- 前記第1導体回路の表面は、前記樹脂絶縁層の第1面と略同一平面上に位置する、請求項1又は2に記載のプリント配線板。
- 前記樹脂絶縁層の第1面上に積層され、第2導体回路形成用の第2凹部が第1面側に形成されるとともに、第2ビア導体用の第2開口部が形成された、少なくとも1層の第2樹脂絶縁層と;
前記第2凹部に形成されている第2導体回路と;
前記第2開口部に形成され、前記第2導体回路と、前記第1導体回路とを層間接続する第2ビア導体と;をさらに備え、
前記第2導体回路の側面は、前記部品搭載用パッド側に向かって先細りの形状を有していることを特徴とする、請求項1又は2に記載のプリント配線板。 - 前記第2樹脂絶縁層の第1面上に積層され、第3ビア導体用の第3開口部が形成された第3樹脂絶縁層と;
前記第3樹脂絶縁層の第1面上に形成された第3導体回路と;
前記第3開口部に形成され、前記第3導体回路と、前記第2導体回路とを層間接続する第3ビア導体と;をさらに備える、請求項7に記載のプリント配線板。 - 前記第1導体回路のライン/スペース比は、前記第3導体回路のライン/スペース比よりも小さいことを特徴とする、請求項8に記載のプリント配線板。
- 前記第1凹部及び前記第1開口部を形成する前記樹脂絶縁層の表面は粗化されていることを特徴とする、請求項1~9のいずれかに記載のプリント配線板。
- 最外の樹脂絶縁層である、第1樹脂絶縁層の第2面側に、電子部品搭載用パッドとなる導体部を形成する工程と;
前記第1樹脂絶縁層を貫通する第1ビア導体用の第1開口部を形成するとともに、前記第1樹脂絶縁層の第1面側に第1導体回路用の第1凹部を形成する工程と;
前記導体部に向かって先細りの形状を有する側面を有する第1導体回路を、その表面が前記第1樹脂絶縁層の第1面と略同一平面上に露出するように前記第1凹部内に形成する工程と;
前記第1開口部に、前記第1導体回路と前記導体部とを電気的に接続する第1ビア導体を形成する工程と;
を有するプリント配線板の製造方法。 - 前記第1凹部及び前記第1開口部がレーザーによって形成される工程をさらに有することを特徴とする、請求項11に記載のプリント配線板の製造方法。
- 前記第1凹部及び前記第1開口部をレーザーによって形成する工程において、前記第1凹部はエキシマレーザーによって形成され、前記第1開口部は炭酸ガスレーザーによって形成されることを特徴とする、請求項12に記載のプリント配線板の製造方法。
- 前記第1樹脂絶縁層の第1面に、少なくとも1層の第2樹脂絶縁層を積層する工程と;
前記第2樹脂絶縁層を貫通する第2ビア導体用の第2開口部を形成するとともに、前記第2樹脂絶縁層の第1面側に第2導体回路用の第2凹部を形成する工程と;
前記導体部に向かって先細りの形状を有する側面を有する第2導体回路を、その表面が前記第2樹脂絶縁層の第1面と略同一平面上に露出するように、前記第2凹部内に形成する工程と;
前記第2開口部に、前記第1導体回路と前記第2導体回路とを電気的に接続する第2ビア導体を形成する工程と;
をさらに備えることを特徴とする、請求項11に記載のプリント配線板の製造方法。 - 前記第2樹脂絶縁層の第1面に、少なくとも1層の第3樹脂絶縁層を積層する工程と;
前記第3樹脂絶縁層を貫通する第3ビア導体用の第3開口部を形成する工程と;
前記第3樹脂絶縁層の第1面上に第3導体回路を形成する工程と;
前記第3開口部に、前記第3導体回路と前記第2導体回路とを層間接続する第3ビア導体を形成する工程と;
をさらに備えることを特徴とする、請求項14に記載のプリント配線板の製造方法。
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KR101160498B1 (ko) | 2012-06-28 |
US8263878B2 (en) | 2012-09-11 |
CN101978799A (zh) | 2011-02-16 |
US20090242261A1 (en) | 2009-10-01 |
JP5238801B2 (ja) | 2013-07-17 |
CN101978799B (zh) | 2013-03-20 |
JPWO2009119680A1 (ja) | 2011-07-28 |
KR20100090806A (ko) | 2010-08-17 |
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