TWI661560B - 半導體裝置及製造半導體裝置的方法 - Google Patents

半導體裝置及製造半導體裝置的方法 Download PDF

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Publication number
TWI661560B
TWI661560B TW106107047A TW106107047A TWI661560B TW I661560 B TWI661560 B TW I661560B TW 106107047 A TW106107047 A TW 106107047A TW 106107047 A TW106107047 A TW 106107047A TW I661560 B TWI661560 B TW I661560B
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TW
Taiwan
Prior art keywords
oxide semiconductor
semiconductor layer
layer
insulating layer
oxygen
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TW106107047A
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English (en)
Chinese (zh)
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TW201735368A (zh
Inventor
山崎舜平
Shunpei Yamazaki
肥塚純一
Junichi Koezuka
岡崎健一
Kenichi Okazaki
池山輝正
Terumasa Ikeyama
栃林克明
Katsuaki Tochibayashi
Original Assignee
日商半導體能源研究所股份有限公司
Semiconductor Energy Laboratory Co., Ltd.
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Publication of TW201735368A publication Critical patent/TW201735368A/zh
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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • H10D30/6704Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • H10D30/6704Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device
    • H10D30/6713Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device characterised by the properties of the source or drain regions, e.g. compositions or sectional shapes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • H10D30/6729Thin-film transistors [TFT] characterised by the electrodes
    • H10D30/6737Thin-film transistors [TFT] characterised by the electrodes characterised by the electrode materials
    • H10D30/6739Conductor-insulator-semiconductor electrodes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00Field-effect transistors [FET]
    • H10D30/60Insulated-gate field-effect transistors [IGFET]
    • H10D30/67Thin-film transistors [TFT]
    • H10D30/674Thin-film transistors [TFT] characterised by the active materials
    • H10D30/6755Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D62/00Semiconductor bodies, or regions thereof, of devices having potential barriers
    • H10D62/40Crystalline structures
    • H10D62/405Orientations of crystalline planes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D99/00Subject matter not provided for in other groups of this subclass
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P32/00Diffusion of dopants within, into or out of wafers, substrates or parts of devices
    • H10P32/10Diffusion of dopants within, into or out of semiconductor bodies or layers
    • H10P32/14Diffusion of dopants within, into or out of semiconductor bodies or layers within a single semiconductor body or layer in a solid phase; between different semiconductor bodies or layers, both in a solid phase
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P32/00Diffusion of dopants within, into or out of wafers, substrates or parts of devices
    • H10P32/10Diffusion of dopants within, into or out of semiconductor bodies or layers
    • H10P32/17Diffusion of dopants within, into or out of semiconductor bodies or layers characterised by the semiconductor material

Landscapes

  • Thin Film Transistor (AREA)
  • Liquid Crystal (AREA)
  • Electroluminescent Light Sources (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Physical Vapour Deposition (AREA)
  • Physical Deposition Of Substances That Are Components Of Semiconductor Devices (AREA)
  • Formation Of Insulating Films (AREA)
  • Dram (AREA)
TW106107047A 2012-01-25 2013-01-23 半導體裝置及製造半導體裝置的方法 TWI661560B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2012013451 2012-01-25
JP2012-013451 2012-01-25

Publications (2)

Publication Number Publication Date
TW201735368A TW201735368A (zh) 2017-10-01
TWI661560B true TWI661560B (zh) 2019-06-01

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TW106107047A TWI661560B (zh) 2012-01-25 2013-01-23 半導體裝置及製造半導體裝置的方法
TW102102480A TWI587514B (zh) 2012-01-25 2013-01-23 半導體裝置及製造半導體裝置的方法

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Country Status (5)

Country Link
US (2) US9293589B2 (https=)
JP (9) JP2013175713A (https=)
KR (6) KR102083380B1 (https=)
TW (2) TWI661560B (https=)
WO (1) WO2013111756A1 (https=)

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TWI614813B (zh) 2013-01-21 2018-02-11 半導體能源研究所股份有限公司 半導體裝置的製造方法
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JP6668455B2 (ja) 2016-04-01 2020-03-18 株式会社半導体エネルギー研究所 酸化物半導体膜の作製方法
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JP7154136B2 (ja) * 2017-02-07 2022-10-17 株式会社半導体エネルギー研究所 半導体装置の作製方法
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CN112397573B (zh) * 2020-11-17 2023-06-27 武汉华星光电半导体显示技术有限公司 一种阵列基板及其制备方法、显示面板
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KR20240011403A (ko) 2022-07-19 2024-01-26 주식회사 엘지에너지솔루션 방폭 전지 모듈 구조
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