TWI232543B - Method of forming contact holes and electronic device formed thereby - Google Patents
Method of forming contact holes and electronic device formed thereby Download PDFInfo
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- TWI232543B TWI232543B TW093106725A TW93106725A TWI232543B TW I232543 B TWI232543 B TW I232543B TW 093106725 A TW093106725 A TW 093106725A TW 93106725 A TW93106725 A TW 93106725A TW I232543 B TWI232543 B TW I232543B
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- forming
- photomask
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- contact plug
- insulating film
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- 238000000034 method Methods 0.000 title abstract description 20
- 239000000758 substrate Substances 0.000 abstract description 14
- 239000011810 insulating material Substances 0.000 abstract description 7
- 239000007788 liquid Substances 0.000 abstract description 4
- 238000004380 ashing Methods 0.000 abstract 1
- 239000011521 glass Substances 0.000 abstract 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 abstract 1
- 229920005591 polysilicon Polymers 0.000 abstract 1
- 239000000463 material Substances 0.000 description 66
- 239000010408 film Substances 0.000 description 52
- 230000015572 biosynthetic process Effects 0.000 description 30
- 239000004065 semiconductor Substances 0.000 description 24
- 239000011344 liquid material Substances 0.000 description 18
- 239000010409 thin film Substances 0.000 description 14
- 238000004519 manufacturing process Methods 0.000 description 9
- 238000009413 insulation Methods 0.000 description 8
- 239000011229 interlayer Substances 0.000 description 5
- 229910010272 inorganic material Inorganic materials 0.000 description 4
- 239000011147 inorganic material Substances 0.000 description 4
- 239000010410 layer Substances 0.000 description 4
- 230000000873 masking effect Effects 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 238000000151 deposition Methods 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 230000002209 hydrophobic effect Effects 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66227—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by the electric current supplied or the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched, e.g. three-terminal devices
- H01L29/66409—Unipolar field-effect transistors
- H01L29/66477—Unipolar field-effect transistors with an insulated gate, i.e. MISFET
- H01L29/66742—Thin film unipolar transistors
- H01L29/6675—Amorphous silicon or polysilicon transistors
- H01L29/66757—Lateral single gate single channel transistors with non-inverted structure, i.e. the channel layer is formed before the gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
- H01L21/76801—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing
- H01L21/76802—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics characterised by the formation and the after-treatment of the dielectrics, e.g. smoothing by forming openings in dielectrics
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/417—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions carrying the current to be rectified, amplified or switched
- H01L29/41725—Source or drain electrodes for field effect devices
- H01L29/41733—Source or drain electrodes for field effect devices for thin film transistors with insulated gate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/41—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions
- H01L29/423—Electrodes ; Multistep manufacturing processes therefor characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
- H01L29/42312—Gate electrodes for field effect devices
- H01L29/42316—Gate electrodes for field effect devices for field-effect transistors
- H01L29/4232—Gate electrodes for field effect devices for field-effect transistors with insulated gate
- H01L29/42384—Gate electrodes for field effect devices for field-effect transistors with insulated gate for thin film field effect transistors, e.g. characterised by the thickness or the shape of the insulator or the dimensions, the shape or the lay-out of the conductor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/45—Ohmic electrodes
- H01L29/456—Ohmic electrodes on silicon
- H01L29/458—Ohmic electrodes on silicon for thin film silicon, e.g. source or drain electrode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/49—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET
- H01L29/4908—Metal-insulator-semiconductor electrodes, e.g. gates of MOSFET for thin film semiconductor, e.g. gate of TFT
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
- Thin Film Transistor (AREA)
- Electrodes Of Semiconductors (AREA)
Description
1232543 射光罩材料。 1 0 ·如申請專利範圍第8項之形成接觸孔之方法,其 中熟化步驟具有熱處理步驟,在紫外線照射後,加熱光罩 · 材料到預定溫度以上。 . 1 1 ·如申請專利範圍第6項之形成接觸孔之方法,其 中光罩材料經過疏水處理。 12·如申請專利範圍第2項之形成接觸孔之方法,其 中 · 光罩材料包括無機材料, 膜形成步驟在整個基底表面上形成無機材料而形成光 罩材料膜, 布線步驟定出包括無機材料的光罩材料膜。 1 3 ·如申請專利範圍第2項之形成接觸孔之方法,其 中 光罩材料包括無機材料, Μ开彡成步驟涉及在基底上沉積或濺射光罩材料而形成 · 無機光罩材料膜, 布線步驟涉及光蝕刻光罩材料膜。 1 4 ·如申請專利範圍第1至丨3項中任一項之形成接 觸孔之方法,其中 · @ ®形成步驟具有在基底上塗布液體絕緣材料的絕 ’ _材料· Μ布步騾和固化已塗布之液體絕緣材料的絕緣材料 固化步驟。 1 5 ·如申請專利範圍第1 4項之形成接觸孔之方法, -3- 1232543 其中 絕緣材料固化步驟涉及加熱液體絕緣材料*。 16. 如申請專利範圍第1項之形成接觸孔之方法,其 中絕緣膜含有第一和第二絕緣膜,該方法包括: 第一光罩材料形成步騾,在第一導電區上的接觸孔形 成區上提供第一光罩材料; 第一絕緣膜形成步驟,在第一光罩材料除外的整個基 底表面上形成第一絕緣膜; 第一光罩材料除去步驟,除去第一光罩材料,在第一 絕緣膜形成第一通孔; 第一光罩材料形成步驟,在形成於第一絕緣膜的第一 通孔上提供第二光罩材料; 第一絕緣膜形成步驟,在第二光罩材料除外的第一絕 緣膜整個表面上形成第二絕緣膜; 第一光罩材料除去步驟,除去第二光罩材料,在第二 絕緣膜形成與第一通孔同軸的第二通孔。 17, 如申δ靑專利範圍第1項之形成接觸孔之方法,其 中絕緣膜形成多層,該方法包括: 第一光罩材料形成步驟,在第一導電區上的接觸孔形 成區提供第一光罩材料; 弟一絕緣膜形成步驟,在第一光罩材料除外的整個基 底表面上形成第一絕緣膜; 弟一光罩材料形成步驟,在第一光罩材料上提供第二 光罩材料; 1232543 弟一*絕緣膜形成步驟’在弟一先罩材料除外的第一絕 緣膜整個表面上形成第二絕緣膜; 光罩材料除去步驟,除去第一光罩材料和第二光罩材 料’在第一絕緣膜和第二絕緣膜形成通孔。 18· —種薄膜半導體裝置的製造方法,在基底上形成 薄膜半導體裝置,包括下列步驟: 在該基底上形成含有源極和汲極區的半導體膜; 在該源極和該汲極區上的接觸插塞形成區上提供第一· 光罩材料; 在該接觸插塞形成區除外的該半導體膜上塗布液體材 料,形成閘極絕緣膜; 除去該第一'光罩材料; 提供包含開口的第二光罩材料,該開口在閘電極形成 區的該閘極絕緣膜上; 將該液體材料塗在已打開的該閘電極形成區而形成閘 電極; Φ 除去該第二光罩材料; 在該源極和該汲極區的接觸插塞形成區上及閘電極的 接觸插塞形成區提供第三光罩材料; 在該接觸插塞形成區除外的該閘電極和該閘極絕緣膜· 塗布液體材料而形成中間層絕緣膜; 除去該第三光罩材料; 在除去該第三光罩材料後,將液體材料塗在該接觸插 塞形成區而形成接觸插塞。 -5- 1232543 19.如申請專利範圍第18項之薄膜半導體裝置的製 造方法,另包括下列步驟: 在中間層絕緣膜和接觸插塞上提供第四光罩材料,其 中電極形成區打開; 將液體材料塗在已打開的電極形成區而形成電極。 20· —種薄膜半導體裝置的製造方法,在基底上形成 薄膜半導體裝置,包括下列步驟: 在該基底上形成含有源極和汲極區的半導體膜; 鲁 在該源極和該汲極區上的接觸插塞形成區上提供第一 光罩材料; 在該接觸插塞形成區除外的該半導體膜上塗布液體材 料而形成閘極絕緣膜; 除去該第一光罩材料; 提供包含開口的第二光罩材料,該開口在閘電極形成 區的該閘極絕緣膜上; 將液體材料塗在已打開的該閘電極形成區而形成閘電· 極; 除去該第二光罩材料; 在該源極和該汲極區的接觸插塞形成區上及閘電極的 接觸插塞形成區上提供第三光罩材料; · 在該接觸插塞形成區除外的該閘電極和該閘極絕緣膜 · 塗布液體材料而形成中間層絕緣膜; 除去該第三光罩材料; 在除去該弟二光罩材料後,在該中間層絕緣膜上提供 -6 - 1232543 第四光罩材料,其中電極形成區打開; 將液體材料塗在該接觸插塞形成區和已打開的電極形 成區而形成接觸插塞。 21· —種薄膜半導體裝置的製造方法,在基底上形成 薄膜半導體裝置,包括下列步驟: 在該基底上形成含有源極和汲極區的半導體膜; 在該源極和該汲極區上的接觸插塞形成區上提供第一 光罩材料; φ 將液體材料塗在該接觸插塞形成區除外的該半導體膜 而形成閘極絕緣膜; 提供包含開口的第二光罩材料,該開口在閘電極形成 區的該閘極絕緣膜上; 將液體材料塗在已打開的該閘電極形成區而形成閘電 極, 除去該第二光罩材料; 在該第一光罩材料上和閘電極的接觸插塞形成區提供 Φ 第三光罩材料; 將液體材料塗在該接觸插塞形成區除外的該閘電極和 該閘極絕緣膜而形成中間層絕緣膜; 除去該第一光罩材料和該第三光罩材料; 在除去該第一光罩材料和該第三光罩材料後,將液體 材料塗在該接觸插塞形成區而形成接觸插塞。 2 2 ·如申δΡ3專利範圍第2 i項之薄膜半導體裝置的製 造方法,另包括下列步驟: -7- 1232543 在中間層絕緣膜和接觸插塞上提供第四光罩材料,其 中電極形成區打開; 將液體材料塗在已打開的電極形成區而形成電極。 23. 一種薄膜半導體裝置的製造方法,在基底上形成 薄膜半導體裝置,包括下列步驟: 在該基底上形成含有源極和汲極區的半導體膜; 在該源極和該汲極區上的接觸插塞形成區上提供第一 光罩材料; 在該接觸插塞形成區除外的該半導體膜上塗布液體材 料而形成閘極絕緣膜; 提供包含開口的第二光罩材料,該開口在閘電極形成 區的該閘極絕緣膜上; 將液體材料塗在已打開的該閘電極形成區而形成閘電 極; 除去該第二光罩材料; 在該第一光罩材料和閘電極的接觸插塞形成區上提供 第三光罩材料; 在該接觸插塞形成區除外的該閘電極和該閘極絕緣膜 塗布液體材料而形成中間層絕緣膜; 除去該第一光罩材料和該第三光罩材料; 在除去該第一光罩材料和該第三光罩材料後,在該中 間層絕緣膜和該接觸插塞上提供第四光罩材料,其中電極 形成區打開; 將液體材料塗在該接觸插塞形成區和已打開的該電極 1232543 形成區而形成接觸插塞。 24. 一種電子裝置的製造方法,使用如申請專利範圍 第1至1 7項中任一項之形成接觸孔之方法,包括下列步 驟: 將導電材料塡入形成的接觸孔; 在充塡的導電材料上形成預定圖型的接線。 25. 一種電子裝置的製造方法,使用如申請專利範圍 第1至1 7項中任一項之形成接觸孔之方法,包括下列步 驟:在絕緣層和接觸孔上形成預定圖型的接線,同時將導 電材料塡入形成的接觸孔。 2 6· —種具有接觸孔的電子裝置,接觸孔使用如申請 專利範圍第1至1 7項中任一項之形成接觸孔之方法所形 成。 27· ~種具有薄膜半導體裝置的電子裝置,薄膜半導 體裝置使用如申請專利範圍第1 8至2 3項中任一項之薄膜 半導體裝置的製造方法所形成。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
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JP2003072498 | 2003-03-17 | ||
JP2004013228A JP2004304162A (ja) | 2003-03-17 | 2004-01-21 | コンタクトホール形成方法、薄膜半導体装置の製造方法、電子デバイスの製造方法、電子デバイス |
Publications (2)
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TW200425405A TW200425405A (en) | 2004-11-16 |
TWI232543B true TWI232543B (en) | 2005-05-11 |
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TW093106725A TWI232543B (en) | 2003-03-17 | 2004-03-12 | Method of forming contact holes and electronic device formed thereby |
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US (1) | US7179733B2 (zh) |
JP (1) | JP2004304162A (zh) |
KR (1) | KR100606947B1 (zh) |
CN (1) | CN100380626C (zh) |
TW (1) | TWI232543B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
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TWI470811B (zh) * | 2011-08-03 | 2015-01-21 |
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JP3948472B2 (ja) * | 2004-11-09 | 2007-07-25 | セイコーエプソン株式会社 | 半導体装置の製造方法 |
US7696625B2 (en) * | 2004-11-30 | 2010-04-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
JP2006184136A (ja) * | 2004-12-28 | 2006-07-13 | Aitesu:Kk | 半導体解析装置およびその方法 |
WO2006085634A1 (en) * | 2005-02-10 | 2006-08-17 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and manufacturing method of the same |
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- 2004-01-21 JP JP2004013228A patent/JP2004304162A/ja not_active Withdrawn
- 2004-03-08 KR KR1020040015390A patent/KR100606947B1/ko not_active IP Right Cessation
- 2004-03-09 US US10/795,366 patent/US7179733B2/en not_active Expired - Fee Related
- 2004-03-12 TW TW093106725A patent/TWI232543B/zh not_active IP Right Cessation
- 2004-03-12 CN CNB2004100396490A patent/CN100380626C/zh not_active Expired - Fee Related
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TWI470811B (zh) * | 2011-08-03 | 2015-01-21 |
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TW200425405A (en) | 2004-11-16 |
KR20040082280A (ko) | 2004-09-24 |
US20040242008A1 (en) | 2004-12-02 |
CN1531061A (zh) | 2004-09-22 |
CN100380626C (zh) | 2008-04-09 |
KR100606947B1 (ko) | 2006-08-01 |
JP2004304162A (ja) | 2004-10-28 |
US7179733B2 (en) | 2007-02-20 |
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