TW200739071A - Liquid-particle analysis of metal materials - Google Patents

Liquid-particle analysis of metal materials

Info

Publication number
TW200739071A
TW200739071A TW095144461A TW95144461A TW200739071A TW 200739071 A TW200739071 A TW 200739071A TW 095144461 A TW095144461 A TW 095144461A TW 95144461 A TW95144461 A TW 95144461A TW 200739071 A TW200739071 A TW 200739071A
Authority
TW
Taiwan
Prior art keywords
liquid
sample
laser beam
metal
target material
Prior art date
Application number
TW095144461A
Other languages
English (en)
Inventor
Susan D Strothers
Janine K Kardokus
Brett M Clark
Original Assignee
Honeywell Int Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Honeywell Int Inc filed Critical Honeywell Int Inc
Publication of TW200739071A publication Critical patent/TW200739071A/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20Metals
    • G01N33/202Constituents thereof
    • G01N33/2022Non-metallic constituents
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/02Investigating particle size or size distribution
    • G01N15/0205Investigating particle size or size distribution by optical means
    • G01N15/0211Investigating a scatter or diffraction pattern
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/20Metals
    • G01N33/205Metals in liquid state, e.g. molten metals

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Dispersion Chemistry (AREA)
  • Investigating And Analyzing Materials By Characteristic Methods (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
TW095144461A 2006-01-13 2006-11-30 Liquid-particle analysis of metal materials TW200739071A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/331,489 US8030082B2 (en) 2006-01-13 2006-01-13 Liquid-particle analysis of metal materials

Publications (1)

Publication Number Publication Date
TW200739071A true TW200739071A (en) 2007-10-16

Family

ID=37721862

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095144461A TW200739071A (en) 2006-01-13 2006-11-30 Liquid-particle analysis of metal materials

Country Status (7)

Country Link
US (1) US8030082B2 (zh)
EP (1) EP1971847A1 (zh)
JP (2) JP5317703B2 (zh)
KR (1) KR20080093124A (zh)
CN (1) CN101356430A (zh)
TW (1) TW200739071A (zh)
WO (1) WO2007081610A1 (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2270469B1 (en) * 2008-04-25 2020-06-03 Nippon Steel Corporation Method of analyzing particle size distribution of particles in metal material
AT513014A2 (de) * 2012-05-31 2013-12-15 Berndorf Band Gmbh Metallband sowie Verfahren zur Herstellung eines oberflächenpolierten Metallbandes
KR102101350B1 (ko) 2013-03-15 2020-04-17 삼성전자주식회사 파티클 카운터 및 그를 구비한 임멀젼 노광 설비
US11118276B2 (en) 2016-03-09 2021-09-14 Jx Nippon Mining & Metals Corporation High purity tin and method for producing same
CN111198116A (zh) * 2018-11-20 2020-05-26 宁波江丰电子材料股份有限公司 靶材的检测方法
CN111751251A (zh) * 2020-07-01 2020-10-09 宁波江丰电子材料股份有限公司 一种高纯铝合金的测试方法

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Also Published As

Publication number Publication date
JP5317703B2 (ja) 2013-10-16
US8030082B2 (en) 2011-10-04
JP2013167635A (ja) 2013-08-29
EP1971847A1 (en) 2008-09-24
WO2007081610A1 (en) 2007-07-19
JP2009524018A (ja) 2009-06-25
US20070166828A1 (en) 2007-07-19
KR20080093124A (ko) 2008-10-20
CN101356430A (zh) 2009-01-28

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