JP2014050954A - 化学機械平坦化パッドコンディショナとして使用するための研磨工具 - Google Patents
化学機械平坦化パッドコンディショナとして使用するための研磨工具 Download PDFInfo
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/12—Dressing tools; Holders therefor
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- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Grinding-Machine Dressing And Accessory Apparatuses (AREA)
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- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
【解決手段】研磨物品200は、第1の主面202と、第1の主面202に対向する第2の面204とを有する基板201を含み、第1の主面202および第2の主面204は側面206によって接合されている。第1の接着層203は第1の主面202を覆ってそれに当接しており、かつ砥粒が基板201に固定されるように第1の砥粒層221を含む。基板201の第2の主面204に取り付けられかつそれに当接する接着層205には第2の砥粒層223が含まれる。研磨物品200は、CMPパッドのコンディショニング作業中に基板201をプレートに取り外し可能に結合するための結合構造を、基板201の内部に横方向に延在する凹部207および208として側面206内に含む。
【選択図】図2A
Description
Claims (30)
- プレート;と
研磨物品であって、
第1の主面と、前記第1の主面に対向する第2の主面とを有する基板;
前記第1の主面に取り付けられた第1の砥粒層;
前記第2の主面に取り付けられた第2の砥粒層;および
前記プレートの一部分に係合し、かつ前記研磨物品と前記プレートを取り外し可能に結合するように構成される係合構造
を含む研磨物品と
を含む、CMPパッドコンディショナとして用いるための研磨工具。 - 前記プレートが、前記研磨物品の前記基板と同じ材料を含む、請求項1に記載の研磨工具。
- 前記プレートが、前記研磨物品の前記係合構造と相補的に係合するための結合面を含む、請求項1または2に記載の研磨工具。
- 前記研磨物品が、前記プレートの凹部内に収容される、請求項1または2に記載の研磨工具。
- 前記第2の砥粒層が、前記プレート内の前記凹部を規定する底面から離間している、請求項1または2に記載の研磨工具。
- 前記係合構造が、締結具、締り嵌め接続、クランプ、ラッチ、またはそれらの組み合わせのうちの1つを含む、請求項1または2に記載の研磨工具。
- 前記研磨物品とプレートが、偏倚係合構造によって取り外し可能に結合されている、請求項1または2に記載の研磨工具。
- 前記研磨物品が、前記第1の砥粒層を覆う第1の保護層を含む、請求項1に記載の研磨工具。
- プレートと、
研磨物品であって、
第1の主面と、前記第1の主面に対向する第2の主面とを有する基板;
前記第1の主面に取り付けられた第1の砥粒層;
前記第2の主面に取り付けられた第2の砥粒層;
を含む研磨物品と
を含む、CMPパッドコンディショナとして用いるための研磨工具であって、前記プレートと研磨物品が、結合機構によって取り外し可能に結合されている、研磨工具。 - 前記結合機構が、前記研磨物品に取り付けられた係合構造を含み、前記係合構造が、ラッチ、締結具、クランプ、締り嵌め接続、およびそれらの組み合わせからなる構造の群から選択される構造を含む、請求項9に記載の研磨工具。
- 前記結合機構が磁石を含む、請求項9に記載の研磨工具。
- 前記磁石が前記プレート内に含まれている、請求項11に記載の研磨工具。
- 前記磁石が、前記研磨物品内に含まれている、請求項12に記載の研磨工具。
- 前記磁石が前記基板内に含まれている、請求項13に記載の研磨工具。
- 基板の第1の主面上に第1の接着層材料を配置するステップであって、前記基板が、前記基板をプレートに取り外し可能に結合するように構成された係合構造を含むステップ;
前記第1の接着層材料内に第1の砥粒層を配置するステップ;
前記基板の第2の主面上に第2の接着層材料を配置するステップであって、前記第2の主面が前記第1の主面に対向しているステップ;
前記第2の接着層材料内に第2の砥粒層を配置するステップ;および
前記第1の主面上の前記第1の砥粒層によって規定された第1の研磨面と、前記第2の主面上の前記第2の砥粒層によって規定された第2の研磨面とを含むCMPパッドコンディショナを形成するステップ
を含む、研磨物品の形成方法。 - 形成するステップが前記基板の加熱を含む、請求項15に記載の方法。
- 加熱中、前記基板が前記第1の砥粒層から吊り下げられ、および第2の砥粒層が接触面から離間している、請求項16に記載の方法。
- 加熱中、前記基板が開始位置および停止位置に対して位置を変更する、請求項16に記載の方法。
- 研磨物品をドレッシング機に結合させるステップであって、前記研磨物品が、第1の主面と、前記第1の主面に対向する第2の主面とを有する基板を含み、前記研磨物品が、前記基板の前記第1の主面に第1の研磨面と、前記基板の前記第2の主面に第2の研磨面とを含み、および前記研磨物品が、前記ドレッシング機に装着されて前記第1の研磨面を露出するステップ;
前記第1の研磨面を第1のCMPパッドの表面に接触させ、前記第1の研磨面に対して前記第1のCMPパッドを動かして、前記第1のCMPパッドのコンディションを整えるステップ;
前記研磨物品を裏返して前記第2の研磨面を露出させるステップ;および
前記第2の研磨面を第2のCMPパッドの表面に接触させ、前記第2の研磨面に対して前記第2のCMPパッドを動かして、前記第2のCMPパッドのコンディションを整えるステップ
を含む、CMPパッドのドレッシング方法。 - 前記第1のCMPパッドおよび前記第2のCMPパッドが、異なるCMPパッドである、請求項19に記載の方法。
- 前記第1のCMPパッドを動かすステップが、前記第1の研磨面に対して前記CMPパッドを回転させることを含む、請求項19または20に記載の方法。
- 前記研磨物品をドレッシング機に結合させるステップが、前記研磨物品をプレートに取り外し可能に結合することを含み、前記プレートは、前記ドレッシング機に直接結合されている、請求項19または20に記載の方法。
- 前記研磨物品を裏返すステップが、
前記プレートから前記研磨物品を取り外すこと;
前記研磨物品を裏返すこと;および
前記研磨物品を前記プレートに結合させることであって、前記第2の研磨面が、コンディショニング作業を実施するように露出されること
を含む、請求項19または20に記載の方法。 - CMPパッドコンディショナを含む研磨工具であって、前記CMPパッドコンディショナが、
第1の主面、前記第1の主面に対向する第2の主面、および前記第1の主面と前記第2の主面との間に延在する側面を有する基板;
前記第1の主面に取り付けられた第1の砥粒層;
前記第2の主面に取り付けられた第2の砥粒層;および
前記基板の側面の外周の周りに延在する溝
を含む、研磨工具。 - 前記溝が、半径方向内向きに延在する凸形状を画成する、請求項24に記載の研磨工具。
- 前記CMPパッドコンディショナに取り外し可能に結合するように構成されたプレート本体を有するプレートをさらに含む、請求項24に記載の研磨工具。
- 前記プレートが、前面から前記プレート本体に半径方向内向きに延在しかつ前記CMPパッドコンディショナを収容するように構成された空洞部を含む、請求項26に記載の研磨工具。
- 前記空洞部が第1の空洞部分および第2の空洞部分を含み、前記CMPパッドコンディショナが、前記第1の空洞部分内に係合するように構成されている、請求項27に記載の研磨工具。
- 前記第2の空洞部分の幅が、前記第1の空洞部分よりも小さい、請求項28に記載の研磨工具。
- 前記空洞部内に収容されるように構成されたパッドをさらに含む、請求項27に記載の研磨工具。
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US16289309P | 2009-03-24 | 2009-03-24 | |
US61/162,893 | 2009-03-24 | ||
US23598009P | 2009-08-21 | 2009-08-21 | |
US61/235,980 | 2009-08-21 |
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CN102341215B (zh) | 2014-06-18 |
JP5667268B2 (ja) | 2015-02-12 |
CN102341215A (zh) | 2012-02-01 |
EP2411181A1 (en) | 2012-02-01 |
WO2010110834A1 (en) | 2010-09-30 |
US9022840B2 (en) | 2015-05-05 |
IL215146A0 (en) | 2011-12-29 |
JP2015071224A (ja) | 2015-04-16 |
JP5502987B2 (ja) | 2014-05-28 |
KR20110124370A (ko) | 2011-11-16 |
SG174351A1 (en) | 2011-10-28 |
JP2012521309A (ja) | 2012-09-13 |
CN103962943A (zh) | 2014-08-06 |
KR101413030B1 (ko) | 2014-07-02 |
US20100248595A1 (en) | 2010-09-30 |
US8342910B2 (en) | 2013-01-01 |
KR101293517B1 (ko) | 2013-08-07 |
US20130078895A1 (en) | 2013-03-28 |
KR20130028793A (ko) | 2013-03-19 |
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