JP2007025700A - 液晶表示パネルとその製造方法及びその検査方法 - Google Patents
液晶表示パネルとその製造方法及びその検査方法 Download PDFInfo
- Publication number
- JP2007025700A JP2007025700A JP2006197367A JP2006197367A JP2007025700A JP 2007025700 A JP2007025700 A JP 2007025700A JP 2006197367 A JP2006197367 A JP 2006197367A JP 2006197367 A JP2006197367 A JP 2006197367A JP 2007025700 A JP2007025700 A JP 2007025700A
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- Prior art keywords
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- data
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3674—Details of drivers for scan electrodes
- G09G3/3677—Details of drivers for scan electrodes suitable for active matrices only
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3685—Details of drivers for data electrodes
- G09G3/3688—Details of drivers for data electrodes suitable for active matrices only
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Theoretical Computer Science (AREA)
- Nonlinear Science (AREA)
- Liquid Crystal (AREA)
- Mathematical Physics (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Optics & Photonics (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020050065284A KR101129618B1 (ko) | 2005-07-19 | 2005-07-19 | 액정 표시 패널 및 이의 검사 방법과 이의 제조방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2007025700A true JP2007025700A (ja) | 2007-02-01 |
| JP2007025700A5 JP2007025700A5 (enExample) | 2009-09-03 |
Family
ID=37656718
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006197367A Pending JP2007025700A (ja) | 2005-07-19 | 2006-07-19 | 液晶表示パネルとその製造方法及びその検査方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (3) | US7456647B2 (enExample) |
| JP (1) | JP2007025700A (enExample) |
| KR (1) | KR101129618B1 (enExample) |
| CN (1) | CN1900802A (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011158707A (ja) * | 2010-02-01 | 2011-08-18 | Casio Computer Co Ltd | アクティブマトリクス型表示パネル用基板とこれを用いた液晶表示パネル |
| JP2012212168A (ja) * | 2008-05-16 | 2012-11-01 | Sharp Corp | アクティブマトリクス基板、表示装置、アクティブマトリクス基板の製造方法または検査方法、および表示装置の製造方法または検査方法 |
| WO2014073483A1 (ja) * | 2012-11-08 | 2014-05-15 | シャープ株式会社 | アクティブマトリクス基板、及びこれを用いた表示装置 |
| CN110189671A (zh) * | 2019-06-26 | 2019-08-30 | 滁州惠科光电科技有限公司 | 成盒测试电路、阵列基板和液晶显示装置 |
Families Citing this family (77)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101129618B1 (ko) * | 2005-07-19 | 2012-03-27 | 삼성전자주식회사 | 액정 표시 패널 및 이의 검사 방법과 이의 제조방법 |
| KR101163603B1 (ko) * | 2005-08-30 | 2012-07-06 | 엘지디스플레이 주식회사 | 액정표시장치용 박막 트랜지스터 기판 및 이를 구비하는액정표시장치 |
| US7298165B2 (en) * | 2006-01-20 | 2007-11-20 | Chunghwa Picture Tubes, Ltd. | Active device array substrate, liquid crystal display panel and examining methods thereof |
| US7479655B2 (en) * | 2006-01-31 | 2009-01-20 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| KR101337459B1 (ko) * | 2006-02-03 | 2013-12-06 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 표시장치 및 그 표시장치를 구비한 전자기기 |
| TW200732808A (en) * | 2006-02-24 | 2007-09-01 | Prime View Int Co Ltd | Thin film transistor array substrate and electronic ink display device |
| KR101253271B1 (ko) * | 2006-08-03 | 2013-04-10 | 삼성디스플레이 주식회사 | 표시 장치와 표시 장치 검사 시스템 및 이를 이용한 표시장치의 검사 방법 |
| JP4860699B2 (ja) * | 2006-08-31 | 2012-01-25 | シャープ株式会社 | 表示パネルおよびそれを備えた表示装置 |
| KR101304415B1 (ko) * | 2007-01-25 | 2013-09-05 | 삼성디스플레이 주식회사 | 표시 장치 |
| KR101076446B1 (ko) * | 2007-04-13 | 2011-10-25 | 엘지디스플레이 주식회사 | 박막 트랜지스터 기판 및 그를 구비하는 평판 표시장치 |
| TWI402594B (zh) * | 2007-04-27 | 2013-07-21 | Chunghwa Picture Tubes Ltd | 主動元件陣列基板 |
| CN101452123B (zh) * | 2007-12-07 | 2010-09-22 | 北京京东方光电科技有限公司 | 基板测试电路 |
| US8425109B2 (en) * | 2008-03-28 | 2013-04-23 | Daniel V. Foss | Ice fishing hole maintenance system |
| KR100950514B1 (ko) * | 2008-04-30 | 2010-03-30 | 엘지디스플레이 주식회사 | 액정표시장치 |
| KR20090126052A (ko) * | 2008-06-03 | 2009-12-08 | 삼성전자주식회사 | 박막 트랜지스터 기판 및 이를 표함하는 표시 장치 |
| CN101825782B (zh) * | 2009-03-06 | 2012-02-29 | 北京京东方光电科技有限公司 | 基板测试电路及基板 |
| TWI412766B (zh) * | 2009-09-04 | 2013-10-21 | Wintek Corp | 主動元件陣列以及檢測方法 |
| JP5351268B2 (ja) * | 2010-01-06 | 2013-11-27 | パナソニック株式会社 | アクティブマトリクス基板、表示パネル及びそれらの検査方法 |
| KR101113340B1 (ko) | 2010-05-13 | 2012-02-29 | 삼성모바일디스플레이주식회사 | 액정 표시장치 및 그의 검사방법 |
| KR101697503B1 (ko) * | 2010-07-13 | 2017-01-18 | 엘지디스플레이 주식회사 | 디스플레이 장치 |
| KR20120037053A (ko) * | 2010-10-11 | 2012-04-19 | 삼성전자주식회사 | 집적 회로, 이의 테스트 동작 방법, 및 이를 포함하는 장치들 |
| CN102455554B (zh) * | 2010-10-22 | 2016-06-22 | 北京京东方光电科技有限公司 | 阵列基板、液晶显示面板及其检测方法 |
| CN102096256B (zh) * | 2010-11-09 | 2012-06-27 | 华映视讯(吴江)有限公司 | 主动组件阵列基板 |
| KR101783953B1 (ko) * | 2010-12-27 | 2017-10-11 | 삼성디스플레이 주식회사 | 표시 장치 및 그 검사 방법 |
| TWI421849B (zh) | 2010-12-30 | 2014-01-01 | Au Optronics Corp | 液晶顯示裝置 |
| TWI480655B (zh) * | 2011-04-14 | 2015-04-11 | Au Optronics Corp | 顯示面板及其測試方法 |
| CN102402031B (zh) * | 2011-12-14 | 2014-01-22 | 深圳市华星光电技术有限公司 | 测试系统 |
| CN103376191A (zh) * | 2012-04-20 | 2013-10-30 | 上海华虹Nec电子有限公司 | 多通道智能漏液及断线检测系统 |
| CN104246860B (zh) * | 2012-04-25 | 2016-08-17 | 夏普株式会社 | 矩阵基板和显示装置 |
| CN103513477B (zh) * | 2012-06-26 | 2018-03-09 | 富泰华工业(深圳)有限公司 | 液晶显示器及其检测方法 |
| CN102788946B (zh) * | 2012-07-20 | 2015-02-18 | 京东方科技集团股份有限公司 | 晶体管特性测试结构及采用该结构的测试方法 |
| KR101992273B1 (ko) * | 2012-10-22 | 2019-10-01 | 삼성디스플레이 주식회사 | 유기전계발광 표시장치 및 그 검사방법 |
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| CN105607316B (zh) * | 2016-03-22 | 2018-12-18 | 京东方科技集团股份有限公司 | 一种阵列基板母板和显示面板母板 |
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| US10643511B2 (en) * | 2016-08-19 | 2020-05-05 | Apple Inc. | Electronic device display with monitoring circuitry |
| CN106652870A (zh) * | 2016-11-24 | 2017-05-10 | 厦门天马微电子有限公司 | 一种显示装置、显示面板及其驱动方法 |
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| CN110580869A (zh) * | 2018-06-11 | 2019-12-17 | 深超光电(深圳)有限公司 | 线路检测系统 |
| KR102456696B1 (ko) * | 2018-08-07 | 2022-10-19 | 삼성디스플레이 주식회사 | 표시 패널 및 그 제조 방법 |
| CN109119043A (zh) * | 2018-09-30 | 2019-01-01 | 惠科股份有限公司 | 显示面板及其驱动方法、显示装置 |
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| CN109697937A (zh) * | 2018-12-19 | 2019-04-30 | 武汉华星光电半导体显示技术有限公司 | 柔性显示面板 |
| TWI748645B (zh) * | 2019-09-11 | 2021-12-01 | 矽創電子股份有限公司 | 顯示面板驅動晶片、顯示面板驅動架構及其顯示裝置 |
| KR20210045567A (ko) * | 2019-10-16 | 2021-04-27 | 삼성디스플레이 주식회사 | 표시 장치 |
| CN110599936B (zh) * | 2019-10-31 | 2022-11-25 | 厦门天马微电子有限公司 | 一种显示面板、其显示检测方法及显示装置 |
| CN110910804B (zh) * | 2019-12-26 | 2022-08-12 | 厦门天马微电子有限公司 | 一种显示面板及显示装置 |
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| US11508274B2 (en) * | 2020-06-30 | 2022-11-22 | Silicon Works Co., Ltd. | Display panel driving device |
| WO2022051929A1 (en) * | 2020-09-09 | 2022-03-17 | Boe Technology Group Co., Ltd. | Method of fabricating array substrate, array substrate, display apparatus, and probe unit |
| KR102804495B1 (ko) * | 2020-12-28 | 2025-05-09 | 삼성디스플레이 주식회사 | 표시 패널 및 이를 구비한 표시 장치 |
| CN113570990B (zh) * | 2021-07-30 | 2024-02-09 | 北京京东方光电科技有限公司 | 信号检测装置、方法及显示面板 |
| US12300133B2 (en) * | 2021-11-29 | 2025-05-13 | Beijing Boe Optoelectronics Technology Co., Ltd. | Display panel and display device |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004101863A (ja) * | 2002-09-10 | 2004-04-02 | Hitachi Displays Ltd | 液晶表示装置 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100628440B1 (ko) | 1999-05-26 | 2006-09-27 | 삼성전자주식회사 | 액정표시장치 |
| JP2003050380A (ja) * | 2001-08-07 | 2003-02-21 | Toshiba Corp | アレイ基板の検査方法 |
| KR100816336B1 (ko) * | 2001-10-11 | 2008-03-24 | 삼성전자주식회사 | 박막 트랜지스터 기판 및 그 제조 방법 |
| US7265572B2 (en) * | 2002-12-06 | 2007-09-04 | Semicondcutor Energy Laboratory Co., Ltd. | Image display device and method of testing the same |
| KR100491560B1 (ko) * | 2003-05-06 | 2005-05-27 | 엘지.필립스 엘시디 주식회사 | 액정표시소자의 검사방법 및 장치 |
| KR100528697B1 (ko) * | 2003-05-06 | 2005-11-16 | 엘지.필립스 엘시디 주식회사 | 액정표시장치의 검사방법 및 장치 |
| JP3760411B2 (ja) * | 2003-05-21 | 2006-03-29 | インターナショナル・ビジネス・マシーンズ・コーポレーション | アクティブマトリックスパネルの検査装置、検査方法、およびアクティブマトリックスoledパネルの製造方法 |
| JP3909526B2 (ja) | 2003-08-07 | 2007-04-25 | エーユー オプトロニクス コーポレイション | アクティブ・マトリックス表示装置の検査方法 |
| TWI239403B (en) * | 2003-08-26 | 2005-09-11 | Chunghwa Picture Tubes Ltd | A combining detection circuit for a display panel |
| KR101129618B1 (ko) * | 2005-07-19 | 2012-03-27 | 삼성전자주식회사 | 액정 표시 패널 및 이의 검사 방법과 이의 제조방법 |
| US7298165B2 (en) * | 2006-01-20 | 2007-11-20 | Chunghwa Picture Tubes, Ltd. | Active device array substrate, liquid crystal display panel and examining methods thereof |
| KR101142993B1 (ko) * | 2006-02-20 | 2012-05-08 | 삼성전자주식회사 | 표시 장치 및 그의 감지부 검사 방법 |
-
2005
- 2005-07-19 KR KR1020050065284A patent/KR101129618B1/ko not_active Expired - Lifetime
-
2006
- 2006-06-16 US US11/454,463 patent/US7456647B2/en active Active
- 2006-07-17 CN CNA2006101056620A patent/CN1900802A/zh active Pending
- 2006-07-19 JP JP2006197367A patent/JP2007025700A/ja active Pending
-
2008
- 2008-11-24 US US12/276,936 patent/US7622941B2/en active Active
-
2009
- 2009-11-03 US US12/611,505 patent/US7816939B2/en active Active
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004101863A (ja) * | 2002-09-10 | 2004-04-02 | Hitachi Displays Ltd | 液晶表示装置 |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2012212168A (ja) * | 2008-05-16 | 2012-11-01 | Sharp Corp | アクティブマトリクス基板、表示装置、アクティブマトリクス基板の製造方法または検査方法、および表示装置の製造方法または検査方法 |
| JP2011158707A (ja) * | 2010-02-01 | 2011-08-18 | Casio Computer Co Ltd | アクティブマトリクス型表示パネル用基板とこれを用いた液晶表示パネル |
| WO2014073483A1 (ja) * | 2012-11-08 | 2014-05-15 | シャープ株式会社 | アクティブマトリクス基板、及びこれを用いた表示装置 |
| US9536905B2 (en) | 2012-11-08 | 2017-01-03 | Sharp Kabushiki Kaisha | Active matrix substrate and display device using same |
| CN110189671A (zh) * | 2019-06-26 | 2019-08-30 | 滁州惠科光电科技有限公司 | 成盒测试电路、阵列基板和液晶显示装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR20070010567A (ko) | 2007-01-24 |
| CN1900802A (zh) | 2007-01-24 |
| US20100045639A1 (en) | 2010-02-25 |
| US20070018680A1 (en) | 2007-01-25 |
| US7622941B2 (en) | 2009-11-24 |
| KR101129618B1 (ko) | 2012-03-27 |
| US20090072854A1 (en) | 2009-03-19 |
| US7816939B2 (en) | 2010-10-19 |
| US7456647B2 (en) | 2008-11-25 |
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