WO2006100968A1 - 成膜方法及び成膜装置並びに永久磁石及び永久磁石の製造方法 - Google Patents
成膜方法及び成膜装置並びに永久磁石及び永久磁石の製造方法 Download PDFInfo
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- WO2006100968A1 WO2006100968A1 PCT/JP2006/305034 JP2006305034W WO2006100968A1 WO 2006100968 A1 WO2006100968 A1 WO 2006100968A1 JP 2006305034 W JP2006305034 W JP 2006305034W WO 2006100968 A1 WO2006100968 A1 WO 2006100968A1
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/06—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
- C23C14/14—Metallic material, boron or silicon
- C23C14/16—Metallic material, boron or silicon on metallic substrates or on substrates of boron or silicon
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
- C23C14/243—Crucibles for source material
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/541—Heating or cooling of the substrates
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/08—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers
- H01F10/10—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition
- H01F10/12—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being metals or alloys
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F10/00—Thin magnetic films, e.g. of one-domain structure
- H01F10/08—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers
- H01F10/10—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition
- H01F10/12—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being metals or alloys
- H01F10/126—Thin magnetic films, e.g. of one-domain structure characterised by magnetic layers characterised by the composition being metals or alloys containing rare earth metals
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/02—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for manufacturing cores, coils, or magnets
- H01F41/0253—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for manufacturing cores, coils, or magnets for manufacturing permanent magnets
- H01F41/0293—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for manufacturing cores, coils, or magnets for manufacturing permanent magnets diffusion of rare earth elements, e.g. Tb, Dy or Ho, into permanent magnets
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F41/00—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties
- H01F41/14—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates
- H01F41/20—Apparatus or processes specially adapted for manufacturing or assembling magnets, inductances or transformers; Apparatus or processes specially adapted for manufacturing materials characterised by their magnetic properties for applying magnetic films to substrates by evaporation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01F—MAGNETS; INDUCTANCES; TRANSFORMERS; SELECTION OF MATERIALS FOR THEIR MAGNETIC PROPERTIES
- H01F1/00—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties
- H01F1/01—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials
- H01F1/03—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity
- H01F1/032—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of hard-magnetic materials
- H01F1/04—Magnets or magnetic bodies characterised by the magnetic materials therefor; Selection of materials for their magnetic properties of inorganic materials characterised by their coercivity of hard-magnetic materials metals or alloys
- H01F1/047—Alloys characterised by their composition
- H01F1/053—Alloys characterised by their composition containing rare earth metals
- H01F1/055—Alloys characterised by their composition containing rare earth metals and magnetic transition metals, e.g. SmCo5
- H01F1/057—Alloys characterised by their composition containing rare earth metals and magnetic transition metals, e.g. SmCo5 and IIIa elements, e.g. Nd2Fe14B
- H01F1/0571—Alloys characterised by their composition containing rare earth metals and magnetic transition metals, e.g. SmCo5 and IIIa elements, e.g. Nd2Fe14B in the form of particles, e.g. rapid quenched powders or ribbon flakes
Definitions
- the present invention relates to a film forming method, a film forming apparatus, a permanent magnet, and a method for manufacturing a permanent magnet.
- the present invention relates to a film forming method, a film forming apparatus, a permanent magnet, and a method for manufacturing a permanent magnet, and particularly contains at least one of Dy and Tb on the surface of an iron-boron-rare earth sintered magnet.
- the present invention relates to a film forming method and a film forming apparatus suitable for forming a metal evaporation material containing at least one of Dy and Tb on the magnet surface at high speed.
- Nd-Fe-B sintered magnets are inexpensive because they are made of a combination of iron and Nd and B elements that are inexpensive, abundant in resources, and can be stably supplied.
- the maximum energy product is about 10 times that of ferrite magnets
- Nd_Fe_B sintered magnets have a Curie temperature as low as about 300 ° C, so depending on the product used, the temperature may rise above a certain temperature. The problem of demagnetization due to heat occurs.
- Dy and Tb are applied to a predetermined film thickness (3 ⁇ m depending on the volume of the magnet) over the entire surface of the Nd_Fe_B sintered magnet processed into a predetermined shape such as a rectangular parallelepiped. And then heat treatment at a predetermined temperature to diffuse the Dy and Tb deposited on the surface to the grain boundary phase of the magnet and distribute it uniformly.
- a predetermined film thickness 3 ⁇ m depending on the volume of the magnet
- Non-patent ⁇ ffl ⁇ l Improvement of coercivity on thin Nd2Pel4B sintered permanent mag nets Z-Park, Tohoku University Hiroshi thesis March 23, 2000)
- the sputtering method has a poor target utilization efficiency and yield of the metal evaporation material to be deposited, so that it is difficult to achieve a stable supply that is scarce in terms of resources. Is the right one.
- a mechanism for rotating the magnet is provided in the sputtering apparatus. It is necessary to make the sputtering equipment expensive, and in combination with the production of expensive Dy and Tb targets that are scarce in resources, it leads to high magnet manufacturing costs.
- the first object of the present invention is to form a film at a high speed on the surface of an iron boron rare earth magnet having a predetermined shape while effectively using the film forming materials Dy and Tb. Accordingly, it is an object of the present invention to provide a permanent magnet and a method for manufacturing the permanent magnet that can improve the productivity and manufacture the permanent magnet at a low cost.
- the second object of the present invention is that the yield of the metal evaporation material to be deposited is high, and the film can be deposited almost uniformly at high speed over the entire surface of the film-formed object having a predetermined shape.
- An object of the present invention is to provide a film forming method and a film forming apparatus suitable for forming a film of Dy or Tb on a surface of a predetermined shape iron boron rare earth magnet. Means for solving the problem
- the film forming method of the present invention heats a processing chamber and evaporates a metal evaporation material previously disposed in the processing chamber to form a metal vapor atmosphere in the processing chamber.
- the film formation held below the temperature in the processing chamber is carried into this processing chamber, and the metal evaporation occurs on the surface of the film formation due to the temperature difference between the processing chamber and the film formation.
- a second step of selectively depositing material is carried into this processing chamber.
- the metal thin film is selectively deposited on the surface of the deposition object due to the temperature difference between the processing chamber and the deposition object.
- the yield of the metal evaporation material is high, and the film can be formed at high speed over the entire surface of the film-formed object having a predetermined shape.
- the film may be formed at a higher speed.
- the film forming apparatus of the present invention includes a processing chamber configured so that the inside can be heated substantially uniformly by a heating means, a preparation chamber communicating with the processing chamber, a processing chamber, and a preparation chamber.
- Vacuum exhaust means for maintaining a degree of vacuum shielding means movable between an open position where the processing chamber and the preparation chamber communicate with each other and a closed position where the processing chamber is sealed, and a film-forming object in the processing chamber and the preparation chamber
- a transfer means that allows the processing chamber to be sealed when the film formation object is moved to the processing chamber at the open position of the shielding means, and the processing chamber is closed at the closed position of the shielding means.
- the metal evaporation material previously placed in the processing chamber is evaporated to form a metal vapor atmosphere, the shielding means is moved to the open position, and the film formation in the preparation chamber is moved to the processing chamber by the transfer means. Due to the temperature difference between the processing chamber and the film formation object. Characterized by being configured to selectively attach depositing metallic evaporated material.
- the processing chamber and the preparation chamber are evacuated to a predetermined degree of vacuum via the vacuum evacuation means.
- the shielding means after moving the shielding means to the closed position to seal the processing chamber, when the processing chamber is heated, the metal evaporation material previously disposed in the processing chamber evaporates to form a metal vapor atmosphere in the processing chamber.
- the shielding means is moved to the open position, and the film-forming object is moved from the preparation chamber to the processing chamber by the transfer means.
- a film-deposited material that is kept below the temperature in the processing chamber for example, a room-temperature film-forming material
- metal atoms in the metal vapor atmosphere are selectively accelerated only on the surface of the film-forming material. It adheres and is deposited.
- the yield of the metal evaporation material to be deposited is high, and the film can be selectively deposited at high speed over the entire surface of the deposition target having a predetermined shape.
- the processing chamber is disposed in a vacuum chamber provided with other evacuation means, and is defined by a heat equalizing plate formed so that one surface is open. If a heat insulating material is provided so as to surround the plate, a heating means is provided between the heat equalizing plate and the heat insulating material, and the heat equalizing plate is heated by the heating means, the heat insulating material in vacuum
- the treatment chamber may be heated substantially uniformly by heating the soaking plate surrounded by ⁇ with a heating means and indirectly heating the treatment chamber through the soaking plate.
- the preparatory chamber is provided with a gas introduction means that enables the introduction of an inert gas, the inert gas is introduced into the preparatory chamber via the gas introduction means, and the processing chamber has a negative pressure with respect to the preparatory chamber. If the metal evaporation atmosphere is formed in the processing chamber, the processing chamber and the preparation chamber are moved when the shielding means is once moved to the open position in order to carry the deposition object into the processing chamber. The pressure difference between and the metal evaporation material may be prevented from flowing into the preparation chamber.
- the preparation chamber is provided with gas introduction means that enables introduction of He gas, and He gas is introduced into the preparation chamber via the gas introduction means, so that the processing chamber is substantially omitted from the preparation chamber.
- the pressure may be the same.
- the shielding means is once moved to the open position in order to carry the film formation object into the processing chamber, the difference in specific gravity between the processing chamber and the preparation chamber The metal evaporation material can be prevented from flowing into the preparation chamber.
- the processing chamber is disposed below the preparation chamber.
- An arrangement means is provided that enables the metal evaporation material to be arranged in the processing chamber, and when the object to be processed is moved to the processing chamber by the conveying means, the metal evaporation material is surrounded by the periphery of the film formation object. If the arrangement means is formed in an annular shape so that the metal evaporation material is disposed, the metal evaporation material can be uniformly heated at any part of the arrangement means, so that a film can be formed with a more uniform film thickness.
- plasma generation means may be provided in the preparation chamber so that the surface of the film to be deposited can be tallyed by plasma.
- the metal evaporation material is one of Dy and Tb or an alloy containing at least one of Dy and Tb, and the film-formed material is an iron-boron rare earth-based sintered magnet having a predetermined shape. Is desirable.
- Permanent magnets characterized by including Production method.
- the processing chamber is heated to form a metal vapor atmosphere.
- a magnet maintained at a temperature lower than the temperature in the processing chamber for example, a normal temperature magnet, is carried into the processing chamber.
- a normal temperature magnet is carried into a processing chamber heated to a high temperature, metal atoms including Dy and Tb in a metal vapor atmosphere are selectively deposited and deposited only on the magnet surface. In this state, the magnet is held for a predetermined time until it reaches a predetermined temperature, and then evaporation is stopped.
- the metal evaporation material containing at least one of Dy and Tb with a predetermined film thickness can be formed on the magnet surface at a high speed, thereby improving productivity.
- the metal evaporation material containing at least one of Dy and Tb selectively adheres and accumulates only on the magnet surface, so that it is possible to effectively use Dy and Tb which are scarce in resources and expensive, and consequently the production cost of the permanent magnet. Can be reduced.
- the metal evaporating material containing at least one of Dy and Tb may be formed on the magnet surface at high speed.
- the pressure in the processing chamber may contain inert gas in addition to the vapor of the metal evaporation material containing at least one of Dy and Tb, but Dy, in which the total pressure in the processing chamber is saturated,
- the film can be formed at the highest speed.
- the metal evaporation material is Nd, Pr, Al, Cu, Ga, Ta It is desirable to further contain at least one of them. According to this, for example, the coercive force can be further increased as compared with a permanent magnet produced by performing a heat treatment after forming a film of Dy alone.
- the predetermined temperature of the magnet is 250 ° C. or lower or 450 ° C. or higher. At temperatures below 250 ° C, distortion due to abnormal thermal expansion is reduced, and the film deposited on the magnet surface is less likely to peel off.
- part of the magnet melts, improving the adhesion between the magnet and at least one of Dy and Tb deposited on the magnet surface, and deposited on the magnet surface. Peeling of the film is difficult to occur.
- the process further includes a step of cleaning the surface of the magnet held below the temperature in the processing chamber in a vacuum atmosphere prior to carrying the magnet into the processing chamber, for example, an oxide film on the surface of the magnet is formed.
- the adhesion strength of the metal evaporation material containing either Dy or Tb to the magnet surface can be increased, and Dy or Tb deposited on the surface can be removed from the crystal grain boundary in the diffusion process. It may be possible to diffuse the phase and spread it evenly.
- the temperature in the processing chamber is preferably set in a range of 1000 ° C to 1700 ° C.
- the temperature is lower than 1000 ° C, the vapor pressure cannot be reached so that a metal evaporation material containing at least one of Dy and Tb can be formed on the magnet surface at high speed.
- the temperature exceeds 1700 ° C, the magnet film formation time becomes too short to form a uniform film.
- the particle size of the metal evaporation material disposed in the processing chamber is in the range of 10 to 100 Ozm. Below 10 zm, it is difficult to handle ignitable Dy and Tb grains. On the other hand, when it exceeds 1000 zm, the surface area becomes relatively small. Evaporation takes time.
- the permanent magnet of the present invention has an iron-boron rare-earth magnet having a predetermined shape, and a vapor atmosphere is formed by evaporating a metal evaporation material containing at least one of Dy and Tb on the surface of the magnet. Is formed in the processing chamber, and a magnet held at a temperature lower than the temperature in the processing chamber is carried into the processing chamber, and the magnet surface is heated by the temperature difference between the processing chamber and the magnet until the magnet reaches a predetermined temperature. The metal evaporation material is selectively deposited and deposited, and then heat treatment is performed to diffuse at least one of Dy and Tb on the magnet surface into the grain boundary phase of the magnet.
- the conventional neodymium magnet is composed of three phases of the main phase, Nd-rich phase, and B-rich phase. At least one of Dy and Tb is added to the Nd-rich phase at the grain boundary where the corrosion resistance and weather resistance are weak. Due to the presence of the rich phase containing, in combination with the presence of the rich phase on the magnet surface, it becomes a permanent magnet having extremely strong corrosion resistance and weather resistance.
- the surface of the magnet is covered with the rich phase, and the rich phase is included in the range of 1 to 50% at the crystal grain boundary. If the rich phase is included in the grain boundary beyond the range of 50%, the maximum energy product, the residual magnetic flux density and the coercive force showing the magnetic characteristics are remarkably lowered.
- the permanent magnet and the method for manufacturing a permanent magnet according to the present invention effectively utilize the film-forming materials Dy and Tb, and the surface of the iron-boron rare-earth magnet having a predetermined shape.
- the film can be formed at a high speed to improve productivity, and can be manufactured at a low cost.
- it has the effect of having extremely strong corrosion resistance and weather resistance without an additional protective film.
- the film forming method and film forming apparatus of the present invention have a high yield of the metal evaporation material to be formed, and can form a film almost uniformly at high speed over the entire surface of the film-formed object having a predetermined shape.
- it is suitable for depositing a metal evaporation material containing Dy or Tb on the surface of a magnet having a predetermined shape of iron, boron, and rare earth, and has an effect.
- a metal evaporation material such as Dy or Tb is selectively applied to the surface of the workpiece S, which is a sintered magnet of iron-boron rare earth, for example. It is a film forming device suitable for high-speed film formation.
- the film forming apparatus 1 is configured by connecting a processing chamber 2 and a preparation chamber 3 in the vertical direction.
- the processing chamber 2 located on the upper side is arranged in a cylindrical vacuum chamber 11 that can be maintained at a predetermined degree of vacuum via a vacuum exhaust means 11a such as a turbo molecular pump, a cryopump, or a diffusion pump.
- the processing chamber 2 is defined by the soaking plate 21 processed into a cylindrical shape so that the lower surface is opened, and communicates with the preparation chamber 3 through the opening on the lower surface.
- the vacuum chamber 11 is provided with a heat insulating material 22 made of carbon so as to surround the periphery of the heat equalizing plate 21 except for the opened lower surface.
- a plurality of electric heaters 23 using W are provided to constitute heating means.
- the soaking plate 21 surrounded by the heat insulating material 22 in the vacuum is heated by the heating means 23, and the inside of the processing chamber 2 is indirectly heated through the soaking plate 21, thereby Can be heated substantially evenly.
- a tray 24 having a concave cross section in which the metal evaporating material is disposed is provided, and constitutes an arrangement means.
- the saucer 24 is formed in an annular shape so that the metal evaporation material can be placed around the deposition target S that is moved into the processing chamber 2 by a transfer means described later, and is formed on the inner wall surface of the heat equalizing plate 21. Installed.
- the metal evaporating material is appropriately selected according to the film to be deposited on the surface of the deposition target S. For example, granular materials are evenly arranged in the circumferential direction of the tray 24. Note that the trays 24 need not be formed in an annular shape and are arranged at equal intervals in the circumferential direction.
- a first space 4 is formed below the processing chamber 2, and a shielding means 5 is provided in the first space 4.
- the shielding means 5 is composed of a valve body 51 and a drive means 52 such as an air cylinder for driving the valve body 51.
- the drive means 52 allows the valve body 51 to communicate with the processing chamber 2 and the preparation chamber 3. (The state shown in FIG. 1), the valve body 51 is movable between a closed position where the processing chamber 2 is sealed by contacting the peripheral edge of the opening formed in the top plate 41 defining the first space 4 It becomes.
- the valve body 51 is provided with second heating means (not shown).
- a second space 3a is provided below the first space 4, and a gate valve (not shown) is provided on the side wall 30 that defines the second space 3a.
- the gate valve is opened and closed. Then, the deposition object S is carried in and out.
- the deposition target S is held by the holding means 6.
- the holding means 6 includes three struts 61 provided in the vertical direction at predetermined intervals on the same circumference, and each strut 61 with a predetermined distance above the lower end force of the strut 61. It is composed of two mounting tables 62 that are horizontally supported and supported by. Each strut 61 is configured such that the diameter of the strut 61 is small so that the heat conduction is small. This is to make it difficult for heat from the pressing member 74 described later to be transmitted to the sintered magnet through the support 61.
- the mounting table 62 is formed of a wire rod having a diameter of ⁇ ⁇ . 1 to 10 mm so that a film can be formed on the surface of the deposition object S mounted on the mounting table 62 on the mounting table 62 side. They are arranged in a grid pattern. Further, the interval between the mounting tables 62 is set in consideration of the height of the film formation target S to be mounted.
- the holding means 6 is provided in the second space 3a, and is installed on a disk 63 having an opening 63a through which a support base, which will be described later, can be inserted.
- the disk 63 is provided in the processing chamber 2. It is placed on the ring-shaped support member 64 and is mounted.
- a third space 3b is formed below the second space 3a, and the second spaces 3a and 3b constitute the preparation chamber 3.
- a vacuum exhaust means 31 such as a turbo molecular pump, a cryopump or a diffusion pump is connected to the preparation chamber 3, and the processing chamber 2 communicated with the preparation chamber 3 via the first space 4 by the vacuum exhaust means 31.
- the inside can be maintained at a predetermined degree of vacuum.
- Driving means 71 such as an air cylinder is provided at the bottom of the preparation chamber 3, and a circular support base 73 is attached to the tip of the shaft 72 projecting into the preparation chamber 3.
- the driving means 71 and the support base 73 This constitutes the transfer means 7, and the support base 73 can be raised and lowered between a predetermined position (lowering position) in the preparation chamber 3 and a predetermined position (upward position) in the processing chamber 2.
- a pressing member 74 having a reverse T-shaped cross section is provided, which is positioned below the support base 73.
- the pressing member 74 lifts the disc 63 upward when the transport means 7 is moved to the raised position, and seals (not shown) such as a metal seal provided on the outer peripheral edge of the disc 63 2) is pressed against the peripheral edge of the opening formed in the top plate 41 to serve to seal the processing chamber 2.
- the pressing member 74 is provided with third heating means (not shown).
- the second space 3a constituting the preparation chamber 3 is provided with plasma generating means having a coil (not shown) connected to a high-frequency power source and gas introducing means 32 for introducing an inert gas.
- the inert gas is a rare gas such as He or Ar.
- a plasma is generated in the preparation chamber 3, and a pretreatment for cleaning the surface of the film formation target S by plasma is performed prior to film formation in the processing chamber 2.
- an electric heater (not shown) using W, for example, is provided in the preparation chamber 3, and the film formation is completed together with the pretreatment for cleaning the surface of the film formation S by heat treatment.
- the S may be configured to be heat-treated in a vacuum atmosphere.
- an iron-boron-monolithic sintered magnet which is an object to be deposited, is obtained by a known method.
- Fe, B, and Nd are blended at a predetermined composition ratio and melted at a high frequency, and then forged to obtain an ingot.
- the sintered magnet see Fig. 3 (a)
- the sintered magnet S having a predetermined shape is set on the mounting table 61 of the holding means 6. In this case, it is preferable to place the magnet so that the direction of easy magnetization is parallel to the mounting table 73.
- Dy which is an evaporation metal evaporation material
- the particle size of Dy is in the range of 10 to 1000 zm. Below 10 zm, it is difficult to handle ignitable Dy and Tb grains. On the other hand, if it exceeds 1000 ⁇ m, it takes time to evaporate.
- the total amount of Dy installed in the veg saucer 24, which increases the yield of the evaporated metal evaporation material Dy is determined by the magnet at a predetermined temperature (the metal evaporation material diffuses not only in the crystal grains of the sintered magnet but also in the crystal grain boundaries Required to continue the Dy vapor atmosphere in the processing chamber 2 until the temperature reaches
- the gate valve provided on the side wall 30 is opened, and the holding means in which the sintered magnet is installed 6 is loaded into the second space 3a and installed on the disk 63a, then the gate vano lev is closed and the vacuum exhaust means l la and 31 are operated to evacuate the vacuum chamber 11, and the preparation chamber 3 and through the first space 4 treatment chamber 2 and a predetermined pressure (e.g., 10 X 10_ 6 Pa) vacuum evacuation until arrival reached.
- a predetermined pressure e.g. 10 X 10_ 6 Pa
- the shielding means 5 is moved to the closed position by the driving means 52, the processing chamber 2 is sealed by the valve body 51, and the heating means 23 Then, the second heating means of the valve body 51 in the shielding means 5 is operated to heat the temperature in the processing chamber 2 until the temperature reaches a predetermined temperature.
- the temperature in the processing chamber should be set in the range of 1000 ° C to 170 ° C. If the temperature is lower than 1000 ° C, the vapor pressure will not reach that which allows Dy to be deposited on the surface of the sintered magnet S at high speed.
- the film formation time of the sintered magnet S may become too short to form a film uniformly.
- the temperature of the processing chamber 2 is 12 00. 0-1500. A range of ⁇ is preferable, and a range of 1200 ° C to 1400 ° C is more preferable. In these temperature ranges, a desired film thickness can be formed at high speed.
- lOPa since convection occurs in the processing chamber 2, as will be described later, when the room-temperature sintered magnet S is carried into the processing chamber, a film is formed over the entire surface.
- a general vacuum apparatus may be used as a material for the soaking plate 21 that defines the processing chamber 2.
- the soaking plate 21 defining the processing chamber 2 the holding means 6 held by the sintered magnet S, and the support base 73 of the transfer means 7 are made of materials that do not react with the metal evaporation material to be deposited, for example, Forces made from Mo, W, V, Ta or their alloys, CaO, YO, or rare earth oxides,
- these materials may be formed as a lining film on the surface of another heat insulating material.
- an oxide film on the surface of the sintered magnet S is subjected to a pretreatment for surface cleaning.
- an inert gas such as Ar
- the gas introduction means 32 for example, lO X lO ⁇ Pa
- the high frequency power supply is operated. If the plasma is generated in the preparation chamber 3 and the surface of the sintered magnet is cleaned with the plasma, Good.
- the sintered magnet is brought to a temperature of room temperature to 200 ° C.
- the driving means 71 of the conveying means 7 is operated to convey the holding means 6 holding the sintered magnet S into the processing chamber 2.
- the processing chamber 2 is sealed by a sealing material such as a metal seal provided on the outer peripheral edge of the disc 63 coming into contact with the peripheral edge of the opening formed in the top plate 41.
- an 1OPa Dy saturated steam atmosphere is formed in the processing chamber 2 at 1300 ° C., and this state is maintained for a predetermined time.
- the sintered magnet S having a temperature lower than that in the processing chamber 3 is carried into the high-temperature processing chamber 2, the sintered magnet S is caused by the temperature difference between the processing chamber 2 and the sintered magnet S.
- Dy in the vapor selectively adheres to the surface and deposits (film formation process).
- Dy is deposited at high speed only on the surface of the sintered magnet S (see Fig. 3 (b)).
- the pressing member 74 of the support base 73 is heated to approximately the same temperature as the heat equalizing plate 21 by the third heating means (not shown), so that Dy in the vapor adheres to the pressing member 74. There is no.
- the sintered magnet S at room temperature is carried into the processing chamber 2 heated to a high temperature, the sintered magnet S itself is also heated by radiant heat, and therefore, in the processing chamber 2 where a saturated vapor atmosphere is formed.
- the time required for the sintered magnet S to reach 900 ° C and the required amount on the surface of the sintered magnet S (the “necessary amount” means that Dy diffuses only within the grain boundaries. Improves the magnetic properties of sintered magnets It is the amount to do. ) Is the time until Dy is deposited.
- Dy enters the grains (the main phase crystal grains) of the sintered magnet S and eventually adds Dy when obtaining a permanent magnet. In the same manner, the magnetic field strength, and hence the maximum energy product indicating the magnetic characteristics, may be greatly reduced.
- the holding time is preferably set to a time until the maximum temperature force of the sintered magnet S reaches -50 ° C or lower, or 450 ° C or higher. At temperatures below 250 ° C, the strain due to abnormal thermal expansion is reduced, so that the Dy film deposited on the surface of the sintered magnet S does not easily peel off.
- an inert gas such as Ar is introduced into the preparation chamber 3 through the gas introduction means 32 until the pressure in the preparation chamber 3 reaches a predetermined value (for example, lOOOPa).
- a predetermined value for example, lOOOPa
- the driving means 71 moves the support base 73 to the rising position force in the processing chamber 2 to the lowered position in the preparation chamber 3, thereby blocking the shielding means.
- the valve main body 51 of the shielding means 5 is heated to substantially the same temperature as the soaking plate 21 by a second heating means (not shown), Dy in the vapor will not adhere to the valve main body 51. Les.
- the pressure in the preparation chamber 3 isolated from the processing chamber 2 via the vacuum exhaust means 31 is a predetermined value.
- a predetermined temperature e.g., 700 ° C ⁇ 950 ° C
- a predetermined time for example, 30 minutes
- a predetermined temperature for example, 500 ° C to 600 ° C
- Dy was formed over the entire surface of the sintered magnet S, and heat treatment was applied to the surface. Permanent magnets can be obtained by diffusing the deposited Dy into the grain boundary phase of the magnet and spreading it uniformly (see Fig. 3 (c)). In this case, since conventional neodymium magnets tend to crack, the strength of forming a protective film by applying a resin coating such as epoxy resin or PPS resin or surface treatment such as nickel plating is extremely high compared to Nd. Since Dy having weather resistance is present at least on the surface of the sintered magnet S, Dy also serves as a protective film, and becomes a permanent magnet having strong corrosion resistance without an additional protective film. Further, by omitting an additional surface treatment step, coupled with the fact that Dy can be formed on the surface of the magnet at a high speed with a predetermined film thickness, the productivity can be further improved and the cost can be further reduced.
- a resin coating such as epoxy resin or PPS resin or surface treatment such as nickel plating
- the surface of the sintered magnet S and the crystal grain boundary have a Dy rich phase (a phase containing Dy in a range of 5 to 80%).
- the conventional neodymium magnet has a Dy-rich phase in the Nd-rich phase at the grain boundary where the corrosion resistance and weather resistance are weak, consisting of three phases of the main phase, Nd-rich phase, and B-rich phase.
- the surface of the sintered magnet S is covered with a Dy rich phase, and the grain boundary contains the Dy rich phase in a range of 1 to 50%. If the grain boundary contains a Dy-rich phase exceeding 50%, the maximum energy product, residual magnetic flux density, and coercive force, which exhibit magnetic properties, are significantly reduced.
- the present invention is not limited to this, and the film-forming method of the present invention and The film deposition apparatus 1 can also be used when depositing other metal evaporation materials.
- conditions such as the heating temperature and holding time of the processing chamber 2 are appropriately set according to the characteristics of the film formation target and the metal evaporation material to be formed.
- Tb can be used instead of Dy, and an iron-boron-rare earth sintered magnet can be used by using the film forming method and film forming apparatus of the present invention.
- Tb metal thin film can be deposited on the surface at high speed and selectively.
- the diffusion step may be performed in the processing chamber 2.
- a metal evaporation material that is a film forming material
- An alloy containing may be used. According to this, after depositing Dy on the surface of the sintered magnet, In particular, the coercive force can be further increased as compared with the permanent magnet obtained by the treatment.
- Dy and Tb have high melting points, if a material having a lower melting point than Dy and Tb is used, a metal evaporation atmosphere may be formed in a shorter time.
- the preparation chamber 3 is provided below the processing chamber 2, but the processing chamber 2 may be provided below the preparation chamber 3.
- the processing chamber 2 when measuring the density of Ar, He, and Dy for a certain pressure and temperature, for example, the density of Ar and the pressure of lOPa at room temperature (about 27 ° C) under the pressure of lOPa. Like the density of Dy at high temperature (about 1300 degrees) below, the density of Dy and Ar under constant pressure is close to each other. Therefore, when the processing chamber 2 is provided below the preparation chamber 3, He gas having a large density difference for a certain pressure is introduced into the preparation chamber 3, and the processing chamber 2 is substantially the same as the preparation chamber 3. If the pressure is increased, the difference in specific gravity between the processing chamber 2 and the preparation chamber 3 ensures that Dy vapor leaks from the processing chamber 2 to the preparation chamber 3 when the sintered magnet S is taken out from the processing chamber 2. Can be prevented.
- the temperature rise of the sintered magnet S is not limited to this.
- Cooling means may be provided to positively suppress it.
- a refrigerant cooling water
- a normal temperature magnet is carried into the processing chamber 3 heated to a high temperature, the heat is applied by radiant heat. What is necessary is a cooling means for suppressing the temperature rise of the sintered magnet S.
- Dy was formed on the surface of the sintered magnet S using the film forming apparatus 1 by the film forming method.
- the film-forming material was Dy, and the purity was 99.9%, and the total amount of 500 g was placed in the pan 24.
- the wire constituting the grid-like mounting table 62 of the holding means 6 is made of Mo and has a diameter of lmm.
- On each mounting table 62 four sintered magnets S cleaned as described above are ⁇ 80. When placed on the circumference (a total of 8), each sintered magnet S is paired with each other along the radial line. It was placed to face. In this case, the interval between the mounting tables 62 was set to 60 mm.
- the processing chamber 2 was sealed at the closed position of the shielding means 5, the inside of the processing chamber 2 was heated to 1350 ° C, and Dy was evaporated to fill the processing chamber 2 with Dy vapor. Further, the pressure in the treatment chamber 2 and the preparatory chamber 3 when loading the baked formed magnets S in Dy vapor atmosphere is set to 10 X 10- 2 Pa, or, after transporting the firing magnet S into the processing chamber 2 was set to 40 seconds. Further, as a condition for the heat treatment in the preparatory chamber 3, to set the pressure of the preparatory chamber 3 to 10 X 10- 3 Pa, 5 minutes at a temperature of 800 ° C, was 30 minutes at a temperature of 600 ° C.
- FIG. 5 is a table showing the magnetic properties as average values when eight permanent magnets were obtained under the above conditions.
- the magnetic properties of the Dy film not formed are also shown.
- the maximum energy product is 50.3MGOe
- the residual magnetic flux density is 14.4
- the coercive force is 23.5KOe. It can be seen that a permanent magnet was obtained.
- the temperature of the sintered magnet S when held for 40 seconds is measured, it is about 600 ° C, and when the film thickness is measured, it is about 100 / m, and the film is almost uniformly formed on the surface of the sintered magnet. It was.
- Example 2 a permanent magnet was manufactured under the same conditions as in Example 1 except that there was no heat treatment, but the retention time of the permanent magnet in the Dy vapor atmosphere was set to 1 minute, The temperature was changed.
- Fig. 6 is a table showing the average values of the Dy film thickness and the magnetic characteristics of the manufactured permanent magnet when the film is formed under these conditions. According to this, it can be seen that almost no film can be formed at a temperature of 1000 ° C. or lower, but it can be formed at a high film formation speed of 20 zmZsec or higher at a temperature exceeding 1200 ° C.
- the maximum energy product was about 50MG0e, which was hardly damaged, and a permanent magnet having a high coercive force of 17KOe or more was obtained. I understand.
- Example 3 the same conditions as in Example 1 above, except that there was no pretreatment (cleaning treatment) A permanent magnet was manufactured, but the retention time of the sintered magnet in the Dy vapor atmosphere was changed.
- Fig. 7 is a table showing the average values of the Dy film thickness, maximum temperature, and magnetic characteristics of the manufactured permanent magnet when the holding time is changed. According to this, a deposition rate of 17 Aim / s or more can be obtained, and it can be seen that even when held for 60 seconds, the temperature of the sintered magnet itself can only rise to 743 ° C.
- the film thickness is 17 xm or more
- the maximum energy product is about 50M GOe
- the residual magnetic flux density is about 14.5kG
- the coercive force is 15. 4-21. It turns out that the permanent magnet which has is obtained.
- Example 4 a permanent magnet was manufactured under the same conditions as in Example 1 except that there was no pretreatment (cleaning process).
- the wire constituting the grid-like mounting table 62 of the holding means 6 was The diameter is 3mm.
- Fig. 8 is a table showing the average magnetic properties of permanent magnets when the wire is made of Mo and the diameter is 3 mm. According to this, by thickening the wire, there is a part that is not deposited in a lattice pattern on the surface of the sintered magnet S facing the mounting table 62, but the maximum energy product is 50.
- a permanent magnet with high magnetic properties of a density of 14.4 kG and a coercive force of 3 ⁇ 4 1. Koe can be obtained.
- FIG. 9 (a) is a table showing the change in film thickness as an average value at each measurement point (measurement points (1) to (15)) on the surface of the permanent magnet shown in FIG. 9 (b). According to this, it can be seen that the film is formed almost uniformly.
- Example 6 an iron-boron-rare earth sintered magnet having a composition of 22Nd — 5Dy — 0.9B-4Co-bal. Fe was used and processed into a 3 ⁇ 50 ⁇ 40 mm rectangular parallelepiped shape. . In this case, the surface of the sintered magnet S was finished so as to have a surface roughness of 50 zm or less.
- a metal film was formed on the surface of the sintered magnet S using the film forming apparatus 1 by the film forming method.
- a film-forming material having a composition of 10Dy — 5Tb — 50Nd — 35Pr was placed on the tray 24.
- the wire constituting the grid-like mounting table 62 of the holding means 6 is Made of Mo and having a diameter of lmm, 100 sintered magnets S cleaned as described above were placed on each mounting table 62 with each sintered magnet S facing each other along a radial line. .
- the processing chamber 2 is sealed at the closed position of the shielding means 5, the inside of the processing chamber 2 is heated to 1250 ° C., the film-forming material having the above composition is evaporated, and a metal vapor atmosphere is formed in the processing chamber 2. Formed.
- the pressure in the processing chamber 2 and the preparatory chamber 3 when loading the sintered magnets S in the metal vapor atmosphere set at 10 X 10_ 2 Pa, substantially the same as the processing chamber 2 a pressure by introducing He gas preparatory chamber 3 Pressure.
- the holding time after the sintered magnet S was transferred to the processing chamber 2 was set to 10 to 300 seconds so that the maximum temperature force S of each sintered magnet was 100 ° C to 1050 ° C.
- each support 61 of the holding means 6 was appropriately cooled by a water cooling method.
- FIG. 10 is a table showing the magnetic characteristics when 100 permanent magnets were obtained under the above conditions, and the adhesion failure rate after performing the tape peeling method (tape test). According to this, when the maximum temperature force S of the sintered magnet S does not reach 100 ° C., the film forming material does not adhere and accumulate on the surface of the sintered magnet S, and a high coercive force is not obtained. On the other hand, when the maximum temperature is in the range of 100 ° C or higher to 1050 ° C or lower, film deposition materials of 10 / m or more adhere and deposit.
- the maximum energy product force S44MG It can be seen that a permanent magnet with a high magnetic property having a residual magnetic flux density of about 13.8 (kG) or more and a coercive force of 28 KOe or more was obtained. However, when the magnet temperature of the sintered magnet S is higher than 250 ° C and lower than 450 ° C, it can be seen that adhesion failure occurred at a ratio of 10% or less.
- Example 6 since the surface of the sintered magnet is not cleaned prior to the film formation of Dy, the entry of Dy into the grains of the sintered magnet is suppressed during film formation, and as a result, each sintered magnet It can be seen that even if the maximum temperature of the glass exceeds 900 ° C, the maximum energy product showing magnetic properties does not decrease.
- Example 7 as an iron-boron rare earth-based sintered magnet, the composition was 28Nd-1B-0.
- Dy was formed on the surface of the sintered magnet S using the film forming apparatus 1 by the film forming method.
- Dy having a purity of 99.9% was used as the film forming material and placed in the tray 24.
- 100 sintered magnets S cleaned as described above were arranged with each sintered magnet S facing each other along a radial line.
- the processing chamber 2 was sealed at the closed position of the shielding means 5, the inside of the processing chamber 2 was heated to 1200 ° C., and Dy was evaporated to form a metal vapor atmosphere in the processing chamber 2.
- the pressure of processing chamber 2 and preparation chamber 3 when loading sintered magnet S into the Dy vapor atmosphere is set to 10 X 10 _2 Pa, and after transferring sintered magnet S to processing chamber 2, an average of 20 ⁇ m
- the holding time was set so that the Dy film was formed with a thickness of.
- the pressure in the preparation chamber 3 is set to 10 X 10 _3 Pa, 1 hour at the temperature of 950 ° C (diffusion process), 30 minutes at the temperature of 500 ° C (Annealing process). Thereafter, the preparation chamber 3 was returned to the atmosphere, and each magnet was taken out.
- Comparative Example 1 to Comparative Example 3 sintered magnets S were manufactured under the same conditions as in Example 7 above, but instead of forming a Dy film and performing heat treatment, Comparative Example 1
- the surface of 100 sintered magnets S was coated with a resin made of an epoxy resin with an average film thickness of 20 / m by a known method to obtain permanent magnets.
- Ni plating was performed on the surface of 100 sintered magnets S by a known plating method with an average film thickness of 20 / im.
- A1 was deposited on the surface of 100 sintered magnets S with an average thickness of 20 ⁇ m by a known deposition method.
- FIG. 11 shows the magnetic characteristics, corrosion resistance, and weather resistance of the permanent magnets of Example 7 and Comparative Examples 1 to 3, together with the magnetic characteristics, corrosion resistance, and weather resistance of the sintered magnet S as Comparative Example 4. It is a table.
- tests to show the corrosion resistance and weather resistance a test of whether or not the occurrence of glaze can be visually confirmed after spraying salt water on the surface of the permanent magnet or sintered magnet S and leaving it for 100 hours, a saturated steam pressure test (PCT: Pressure tacker test) Test whether the occurrence of glazing can be visually confirmed after standing for 1000 hours at a temperature of 80 ° C and humidity of 90% for 100 hours. went.
- PCT Pressure tacker test
- Example 8 an iron-boron-rare earth sintered magnet having a composition of 31Nd-ICo-1 B-0. LCu-bal. Fe (NEOMAX-50 / manufactured by NEOMAX Co., Ltd.) Used, processed into a rectangular parallelepiped shape of 50 X 50 X 8 mm. In this case, the surface of the sintered magnet S was finished so as to have a surface roughness of 20 ⁇ m or less, and then washed with acetone.
- a metal evaporation material was formed on the surface of the sintered magnet S by the film forming method.
- the pressure of 10 X 10 _ 1 Pa, and set the high-frequency voltage to 800 V, Shoyui ⁇ stones by 60 seconds the plasma treatment The surface was cleaned. In this case, the temperature of the fired magnet after cleaning was 60 ° C.
- the processing chamber 2 was sealed at the closed position of the shielding means 5, the inside of the processing chamber 2 was heated to 1350 ° C., and the metal evaporation material was evaporated to fill the processing chamber 2 with metal vapor.
- the pressure in the processing chamber 2 and the preparation chamber 3 when the sintered magnet S is carried into the metal vapor atmosphere is set to 10 ⁇ 10 ” 2 Pa, and the sintered magnet S is transported to the processing chamber 2 and about 30 zm
- the holding time was set so that the film was formed with a film thickness, and the pressure in the preparation chamber 3 was set to 10 X 10 _3 Pa as a condition for the heat treatment in the preparation chamber 3.
- the temperature was 5 minutes (diffusion process), and the temperature was 600 ° C. for 30 minutes (anniere process).
- FIG. 12 is a table showing magnetic characteristics when a permanent magnet is obtained under the above conditions.
- a permanent magnet was fabricated under the same conditions as above, but Dy alone was used as the metal evaporation material. It also shows the magnetic properties when used, and when using Dy with alloys that mix Ni, Co, Fe, Au, Pt, and Ag at a stoichiometric ratio of 1: 1.
- the coercive force is particularly lowered compared to the permanent magnet obtained by depositing Dy alone, and the maximum energy product is also reduced.
- the coercive force can be particularly increased as compared with the permanent magnet obtained by depositing Dy alone, the maximum energy product is 50. OMGOe or more, and the residual magnetic flux density is about 14. It can be seen that a permanent magnet having a high magnetic property of 0 (kG) or more and a coercive force of 24. lK0e or more was obtained.
- FIG. 1 is a diagram schematically illustrating a configuration of a film forming apparatus of the present invention.
- FIG. 2 is a diagram for explaining the holding of a sintered magnet that is an object to be processed in a processing chamber.
- FIG. 3 is a view for explaining a manufacturing procedure of the permanent magnet of the present invention.
- FIG. 4 A graph showing the relationship between the temperature and density of Ar, He, and Dy.
- FIG. 5 is a table showing average values of magnetic properties of the permanent magnets manufactured in Example 1.
- FIG. 6 is a table showing an average value of the film thickness when the film is formed in Example 2 and the magnetic characteristics of the permanent magnet manufactured in Example 2.
- FIG. 7 is a table showing average values of the Dy film thickness, the maximum temperature, and the magnetic properties of the manufactured permanent magnet when the film was formed in Example 3.
- FIG. 8 is a table showing the magnetic properties of the permanent magnets manufactured in Example 4 as average values.
- FIG. 9 is a table showing the average film thickness on the magnet surface when the film is formed in Example 5.
- FIG. 10 is a table showing magnetic characteristics and adhesion failure rate when a permanent magnet is obtained in Example 6.
- FIG. 11 is a table showing magnetic properties, corrosion resistance, and weather resistance of Example 7 and Comparative Examples 1 to 4.
- FIG. 12 is a table showing the magnetic properties of the permanent magnet manufactured in Example 8.
Abstract
Description
Claims
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KR1020077019699A KR101316803B1 (ko) | 2005-03-18 | 2006-03-14 | 성막 방법, 성막 장치, 영구자석 및 영구자석의 제조 방법 |
KR1020137015412A KR20130070657A (ko) | 2005-03-18 | 2006-03-14 | 성막 방법, 성막 장치, 영구자석 및 영구자석의 제조 방법 |
JP2007509212A JP5339722B2 (ja) | 2005-03-18 | 2006-03-14 | 成膜方法及び成膜装置並びに永久磁石及び永久磁石の製造方法 |
US11/886,629 US20080257716A1 (en) | 2005-03-18 | 2006-03-14 | Coating Method and Apparatus, a Permanent Magnet, and Manufacturing Method Thereof |
US12/710,949 US8075954B2 (en) | 2005-03-18 | 2010-02-23 | Coating method and apparatus, a permanent magnet, and manufacturing method thereof |
US13/163,881 US8771422B2 (en) | 2005-03-18 | 2011-06-20 | Coating method and apparatus, a permanent magnet, and manufacturing method thereof |
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US11/886,629 A-371-Of-International US20080257716A1 (en) | 2005-03-18 | 2006-03-14 | Coating Method and Apparatus, a Permanent Magnet, and Manufacturing Method Thereof |
US12/710,949 Division US8075954B2 (en) | 2005-03-18 | 2010-02-23 | Coating method and apparatus, a permanent magnet, and manufacturing method thereof |
US13/163,881 Division US8771422B2 (en) | 2005-03-18 | 2011-06-20 | Coating method and apparatus, a permanent magnet, and manufacturing method thereof |
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Also Published As
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TW200643996A (en) | 2006-12-16 |
CN101660126A (zh) | 2010-03-03 |
JP5433732B2 (ja) | 2014-03-05 |
JP2012188761A (ja) | 2012-10-04 |
US20110293829A1 (en) | 2011-12-01 |
JPWO2006100968A1 (ja) | 2008-09-04 |
RU2010125813A (ru) | 2011-12-27 |
KR20130070657A (ko) | 2013-06-27 |
KR20080019199A (ko) | 2008-03-03 |
CN102242342B (zh) | 2014-10-01 |
RU2447189C2 (ru) | 2012-04-10 |
CN101660127A (zh) | 2010-03-03 |
US8771422B2 (en) | 2014-07-08 |
US20100159129A1 (en) | 2010-06-24 |
US20080257716A1 (en) | 2008-10-23 |
CN102242342A (zh) | 2011-11-16 |
US8075954B2 (en) | 2011-12-13 |
TWI430294B (zh) | 2014-03-11 |
JP5339722B2 (ja) | 2013-11-13 |
CN101660127B (zh) | 2012-05-23 |
RU2007138551A (ru) | 2009-04-27 |
KR101316803B1 (ko) | 2013-10-11 |
RU2010125811A (ru) | 2011-12-27 |
CN101163814A (zh) | 2008-04-16 |
JP2012211395A (ja) | 2012-11-01 |
CN101660126B (zh) | 2012-10-10 |
RU2401881C2 (ru) | 2010-10-20 |
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