KR950034678A - 집적 회로내에 전도성 접속부 형성 방법 및, 그 회로내의 전도성 부재 - Google Patents
집적 회로내에 전도성 접속부 형성 방법 및, 그 회로내의 전도성 부재 Download PDFInfo
- Publication number
- KR950034678A KR950034678A KR1019950010894A KR19950010894A KR950034678A KR 950034678 A KR950034678 A KR 950034678A KR 1019950010894 A KR1019950010894 A KR 1019950010894A KR 19950010894 A KR19950010894 A KR 19950010894A KR 950034678 A KR950034678 A KR 950034678A
- Authority
- KR
- South Korea
- Prior art keywords
- layer
- forming
- patterned
- over
- silicon
- Prior art date
Links
- 238000000034 method Methods 0.000 title claims description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract 13
- 229910052710 silicon Inorganic materials 0.000 claims abstract 13
- 239000010703 silicon Substances 0.000 claims abstract 13
- 230000003667 anti-reflective effect Effects 0.000 claims abstract 10
- 229910021332 silicide Inorganic materials 0.000 claims abstract 6
- FVBUAEGBCNSCDD-UHFFFAOYSA-N silicide(4-) Chemical compound [Si-4] FVBUAEGBCNSCDD-UHFFFAOYSA-N 0.000 claims abstract 6
- WQJQOUPTWCFRMM-UHFFFAOYSA-N tungsten disilicide Chemical compound [Si]#[W]#[Si] WQJQOUPTWCFRMM-UHFFFAOYSA-N 0.000 claims abstract 3
- 229910021342 tungsten silicide Inorganic materials 0.000 claims abstract 3
- 229910052751 metal Inorganic materials 0.000 claims 10
- 239000002184 metal Substances 0.000 claims 10
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims 6
- 238000005530 etching Methods 0.000 claims 6
- 150000004767 nitrides Chemical class 0.000 claims 6
- 239000004065 semiconductor Substances 0.000 claims 6
- 239000000758 substrate Substances 0.000 claims 6
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims 5
- 229920005591 polysilicon Polymers 0.000 claims 5
- 229910052757 nitrogen Inorganic materials 0.000 claims 3
- 229910021417 amorphous silicon Inorganic materials 0.000 claims 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims 1
- 229910052721 tungsten Inorganic materials 0.000 claims 1
- 239000010937 tungsten Substances 0.000 claims 1
- 229910052581 Si3N4 Inorganic materials 0.000 abstract 1
- 238000004299 exfoliation Methods 0.000 abstract 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/70—Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
- H01L21/71—Manufacture of specific parts of devices defined in group H01L21/70
- H01L21/768—Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
- H01L23/53204—Conductive materials
- H01L23/53271—Conductive materials containing semiconductor material, e.g. polysilicon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
- H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
- H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
- H01L21/0274—Photolithographic processes
- H01L21/0276—Photolithographic processes using an anti-reflective coating
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/28008—Making conductor-insulator-semiconductor electrodes
- H01L21/28017—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon
- H01L21/28026—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor
- H01L21/28035—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor the final conductor layer next to the insulator being silicon, e.g. polysilicon, with or without impurities
- H01L21/28044—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor the final conductor layer next to the insulator being silicon, e.g. polysilicon, with or without impurities the conductor comprising at least another non-silicon conductive layer
- H01L21/28061—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor the final conductor layer next to the insulator being silicon, e.g. polysilicon, with or without impurities the conductor comprising at least another non-silicon conductive layer the conductor comprising a metal or metal silicide formed by deposition, e.g. sputter deposition, i.e. without a silicidation reaction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/28008—Making conductor-insulator-semiconductor electrodes
- H01L21/28017—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon
- H01L21/28026—Making conductor-insulator-semiconductor electrodes the insulator being formed after the semiconductor body, the semiconductor being silicon characterised by the conductor
- H01L21/28123—Lithography-related aspects, e.g. sub-lithography lengths; Isolation-related aspects, e.g. to solve problems arising at the crossing with the side of the device isolation; Planarisation aspects
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/3213—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
- H01L21/32133—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only
- H01L21/32135—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only
- H01L21/32136—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only using plasmas
- H01L21/32137—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only using plasmas of silicon-containing layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/3213—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
- H01L21/32139—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer using masks
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/012—Bonding, e.g. electrostatic for strain gauges
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Plasma & Fusion (AREA)
- General Chemical & Material Sciences (AREA)
- Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
Abstract
일 실시예에서, 아래에 놓이는 패턴 형성된 텅스텐 규화물층(32)으로부터 패턴형성된 실리콘 규화물 반사층(26)의 박리는 패턴 형성된 텅스텐 규화물 층(32)과 그 위에 패턴 형성된 실리콘 질화물 무반사층(26) 사이에서 얇은 실리콘 층(30)을 형성하는 단계에 의해 보호된다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도 내지 제5도는 본 발명의 일 실시예에 따른 공정 단계의 단면도.
Claims (5)
- 집적회로내에 전도성 접속부를 형성하는 방법에 있어서, 반도체 기판을 제공하는 단계와, 상기 반도체 기판위에 유전체층을 형성하는 단계와, 상기 유전체층 위에 금속층을 형성하는 단계, 상기 금속층 위에 실리콘층을 형성하는 단계와, 상기 실리콘층 위에 무반사 층을 형성하는 단계와, 상기 무반사 층의 나머지 부분을 형성하기 위해 상기 무반사 층을 에칭하는 단계 및, 상기 전도성 접속부를 형성하기 위해 상기 금속층을 에칭하는 단계를 포함하되, 상기 무반사층의 나머지 부분이 상기 전도성 접속부 위에 놓이는 것을 특징으로 하는 집적 회로내에 전도성 접속부 형성방법.
- 집적회로내에 전도성 접속부를 형성하는 방법에 있어서, 반도체 기판을 제공하는 단계와, 상기 반도체 기판위에 유전체층을 형성하는 단계와, 상기 유전체 층 위에 금속 규화물층을 형성하는 단계와, 상기 금속 규화물 층 위에 실리콘 층을 형성하는 단계와, 상기 실리콘 층위에 실리콘 및 질소를 함유하는 질화물층을 형성하는 단계와, 상기 질화물층의 나머지 부분을 형성하기 위해 상기 질화물층을 에칭하는 단계 및, 상기 전도성 접속부를 형성하기 위해 상기 금속 질화물층을 에칭하는 단계를 포함하되, 상기 질화물층의 나머지 부분이 상기 전도성 접속부 위에 놓이는 것을 특징으로 하는 집적 회로내에 전도성 접속부 형성방법.
- 집적회로내에 전도성 접속부를 형성하는 방법에 있어서, 반도체 기판을 제공하는 단계와, 상기 반도체 기판위에 유전체층을 형성하는 단계와, 상기 유전체 층 위에 폴리실리콘 층을 형성하는 단계와, 상기 폴리실리콘 층 위에 텅스텐 규화물 층을 형성하는 단계와, 상기 텅스턴 규화물 층위에 비정실 실리콘 층을 형성하는 단계와, 상기 비정질 실리콘 층위에 실리콘 및 질소를 함유한 무반사층을 형성하는 단계와; 상기 무반사층의 나머지 부분을 형성하기 위해 상기 무반사 층을 에칭하는 단계 및, 상기 전도성 접속부를 형성하기 위해 상기 폴리실리콘층을 에칭하는 단계를 포함하되, 상기 무반사층의 나머지 부분은 상기 전도성 접속부 위에 놓이는 것을 특징으로 하는 집적 회로내에 전도성 접속부 형성방법.
- 집적 회로내의 전도성 부재에 있어서, 패턴 형성된 금속층과, 상기 패턴 형성된 금속층 위에 놓이면서 접촉되는 패턴 형성된 실리콘층 및, 상기 패턴 형성된 실리콘 층위에 놓이면서 접촉되는 패턴 형성된 무반사층을 포함하는 것을 특징으로 하는 집적 회로내의 전도성 부재.
- 집적 회로내의 전도성 부재에 있어서, 패턴형성된 폴리실리콘 층과, 상기 패턴 형성된 폴리실리콘 층 위에 놓이면서 접촉되는 패턴 형성된 금속 규화물층과, 상기 패턴 형성된 금속 규화물층 위에 놓이면서 접촉되는 패턴형성된 실리콘 층 및, 상기 패턴형성된 실리콘 층위에 놓이면서 접촉되는 실리콘 및 질소를 함유한 패턴형성된 질화물 층을 포함하는 것을 특징으로 하는 집적 회로내의 전도성 부재.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/236,076 US5441914A (en) | 1994-05-02 | 1994-05-02 | Method of forming conductive interconnect structure |
US236076 | 1994-05-02 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR950034678A true KR950034678A (ko) | 1995-12-28 |
KR100376628B1 KR100376628B1 (ko) | 2003-06-25 |
Family
ID=22888042
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019950010894A KR100376628B1 (ko) | 1994-05-02 | 1995-04-29 | 집적회로내의전도성상호접속구조및전도성상호접속형성방법 |
Country Status (3)
Country | Link |
---|---|
US (2) | US5441914A (ko) |
KR (1) | KR100376628B1 (ko) |
TW (1) | TW303494B (ko) |
Families Citing this family (73)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06302539A (ja) * | 1993-04-15 | 1994-10-28 | Toshiba Corp | 半導体装置及び半導体装置の製造方法 |
JP3284687B2 (ja) * | 1993-08-31 | 2002-05-20 | ソニー株式会社 | 配線パターンの製造方法 |
US5891784A (en) * | 1993-11-05 | 1999-04-06 | Lucent Technologies, Inc. | Transistor fabrication method |
US5854132A (en) * | 1994-11-29 | 1998-12-29 | Advanced Micro Devices, Inc. | Method for exposing photoresist |
US5604157A (en) * | 1995-05-25 | 1997-02-18 | Industrial Technology Research Institute | Reduced notching of polycide gates using silicon anti reflection layer |
JP2638573B2 (ja) * | 1995-06-26 | 1997-08-06 | 日本電気株式会社 | 半導体装置の製造方法 |
JPH0982687A (ja) * | 1995-09-19 | 1997-03-28 | Mitsubishi Electric Corp | 半導体装置の製造方法 |
US5767018A (en) * | 1995-11-08 | 1998-06-16 | Advanced Micro Devices, Inc. | Method of etching a polysilicon pattern |
US6114716A (en) * | 1996-03-22 | 2000-09-05 | The Whitaker Corporation | Heterolithic microwave integrated circuits |
US5804499A (en) * | 1996-05-03 | 1998-09-08 | Siemens Aktiengesellschaft | Prevention of abnormal WSix oxidation by in-situ amorphous silicon deposition |
US5899724A (en) * | 1996-05-09 | 1999-05-04 | International Business Machines Corporation | Method for fabricating a titanium resistor |
US5753418A (en) * | 1996-09-03 | 1998-05-19 | Taiwan Semiconductor Manufacturing Company Ltd | 0.3 Micron aperture width patterning process |
TW316326B (en) * | 1996-09-21 | 1997-09-21 | United Microelectronics Corp | Manufacturing method of word line |
US5948598A (en) * | 1996-10-31 | 1999-09-07 | Taiwan Semiconductor Manufacturing Company Ltd. | Anti-reflective silicon nitride film using in-situ deposition |
JP3409984B2 (ja) * | 1996-11-14 | 2003-05-26 | 東京エレクトロン株式会社 | 半導体装置及び半導体装置の製造方法 |
US5872057A (en) * | 1996-11-22 | 1999-02-16 | Taiwan Semiconductor Manufacturing Co., Ltd. | Method of forming oxide dielectric layer on refractory metal silicide gate |
US5908659A (en) * | 1997-01-03 | 1999-06-01 | Mosel Vitelic Inc. | Method for reducing the reflectivity of a silicide layer |
US6153452A (en) * | 1997-01-07 | 2000-11-28 | Lucent Technologies Inc. | Method of manufacturing semiconductor devices having improved polycide integrity through introduction of a silicon layer within the polycide structure |
US5958508A (en) * | 1997-03-31 | 1999-09-28 | Motorlola, Inc. | Process for forming a semiconductor device |
TW322608B (en) * | 1997-07-31 | 1997-12-11 | United Microelectronics Corp | Manufacturing method of self-aligned salicide |
JPH1168095A (ja) * | 1997-08-11 | 1999-03-09 | Fujitsu Ltd | 半導体装置の製造方法 |
US6121133A (en) | 1997-08-22 | 2000-09-19 | Micron Technology, Inc. | Isolation using an antireflective coating |
US5851927A (en) * | 1997-08-29 | 1998-12-22 | Motorola, Inc. | Method of forming a semiconductor device by DUV resist patterning |
US6103632A (en) * | 1997-10-22 | 2000-08-15 | Applied Material Inc. | In situ Etching of inorganic dielectric anti-reflective coating from a substrate |
US6541164B1 (en) | 1997-10-22 | 2003-04-01 | Applied Materials, Inc. | Method for etching an anti-reflective coating |
US6291356B1 (en) | 1997-12-08 | 2001-09-18 | Applied Materials, Inc. | Method for etching silicon oxynitride and dielectric antireflection coatings |
US6013582A (en) * | 1997-12-08 | 2000-01-11 | Applied Materials, Inc. | Method for etching silicon oxynitride and inorganic antireflection coatings |
US7804115B2 (en) * | 1998-02-25 | 2010-09-28 | Micron Technology, Inc. | Semiconductor constructions having antireflective portions |
US6274292B1 (en) * | 1998-02-25 | 2001-08-14 | Micron Technology, Inc. | Semiconductor processing methods |
US6995097B1 (en) * | 1998-05-27 | 2006-02-07 | Texas Instruments Incorporated | Method for thermal nitridation and oxidation of semiconductor surface |
KR100294637B1 (ko) * | 1998-06-29 | 2001-10-19 | 박종섭 | 모스펫의폴리사이드게이트형성방법 |
KR100269330B1 (ko) * | 1998-06-29 | 2000-12-01 | 윤종용 | 반사 방지 캡 및 스페이서를 구비하는 반도체장치, 이의 제조방법 및 이를 이용한 포토레지스트 패턴의 제조방법 |
DE19828969A1 (de) * | 1998-06-29 | 1999-12-30 | Siemens Ag | Verfahren zur Herstellung von Halbleiterbauelementen |
US6268282B1 (en) * | 1998-09-03 | 2001-07-31 | Micron Technology, Inc. | Semiconductor processing methods of forming and utilizing antireflective material layers, and methods of forming transistor gate stacks |
US6281100B1 (en) | 1998-09-03 | 2001-08-28 | Micron Technology, Inc. | Semiconductor processing methods |
US6294459B1 (en) | 1998-09-03 | 2001-09-25 | Micron Technology, Inc. | Anti-reflective coatings and methods for forming and using same |
US6806154B1 (en) * | 1998-10-08 | 2004-10-19 | Integrated Device Technology, Inc. | Method for forming a salicided MOSFET structure with tunable oxynitride spacer |
US6326231B1 (en) * | 1998-12-08 | 2001-12-04 | Advanced Micro Devices, Inc. | Use of silicon oxynitride ARC for metal layers |
US6828683B2 (en) | 1998-12-23 | 2004-12-07 | Micron Technology, Inc. | Semiconductor devices, and semiconductor processing methods |
US6191016B1 (en) * | 1999-01-05 | 2001-02-20 | Intel Corporation | Method of patterning a layer for a gate electrode of a MOS transistor |
US7235499B1 (en) | 1999-01-20 | 2007-06-26 | Micron Technology, Inc. | Semiconductor processing methods |
JP3257533B2 (ja) | 1999-01-25 | 2002-02-18 | 日本電気株式会社 | 無機反射防止膜を使った配線形成方法 |
JP3059150B1 (ja) * | 1999-02-02 | 2000-07-04 | 沖電気工業株式会社 | ゲ―ト電極構造及びその製造方法 |
US6274445B1 (en) * | 1999-02-03 | 2001-08-14 | Philips Semi-Conductor, Inc. | Method of manufacturing shallow source/drain junctions in a salicide process |
KR100881472B1 (ko) | 1999-02-04 | 2009-02-05 | 어플라이드 머티어리얼스, 인코포레이티드 | 소정 기판 상에 놓여져 있는 패턴화된 마스크 표면 위로 적층 구조물을 증착하기 위한 방법 |
US6291363B1 (en) * | 1999-03-01 | 2001-09-18 | Micron Technology, Inc. | Surface treatment of DARC films to reduce defects in subsequent cap layers |
US6444588B1 (en) | 1999-04-26 | 2002-09-03 | Micron Technology, Inc. | Anti-reflective coatings and methods regarding same |
US6110812A (en) * | 1999-05-11 | 2000-08-29 | Promos Technologies, Inc. | Method for forming polycide gate |
US6342452B1 (en) * | 1999-05-20 | 2002-01-29 | International Business Machines Corporation | Method of fabricating a Si3N4/polycide structure using a dielectric sacrificial layer as a mask |
US6451642B1 (en) * | 1999-07-14 | 2002-09-17 | Texas Instruments Incorporated | Method to implant NMOS polycrystalline silicon in embedded FLASH memory applications |
US6630718B1 (en) | 1999-07-26 | 2003-10-07 | Micron Technology, Inc. | Transistor gate and local interconnect |
US6107167A (en) * | 1999-08-02 | 2000-08-22 | Advanced Micro Devices, Inc. | Simplified method of patterning polysilicon gate in a semiconductor device |
US6124178A (en) * | 1999-08-26 | 2000-09-26 | Mosel Vitelic, Inc. | Method of manufacturing MOSFET devices |
US7067414B1 (en) | 1999-09-01 | 2006-06-27 | Micron Technology, Inc. | Low k interlevel dielectric layer fabrication methods |
US6395644B1 (en) * | 2000-01-18 | 2002-05-28 | Advanced Micro Devices, Inc. | Process for fabricating a semiconductor device using a silicon-rich silicon nitride ARC |
US6440860B1 (en) | 2000-01-18 | 2002-08-27 | Micron Technology, Inc. | Semiconductor processing methods of transferring patterns from patterned photoresists to materials, and structures comprising silicon nitride |
US6261967B1 (en) * | 2000-02-09 | 2001-07-17 | Infineon Technologies North America Corp. | Easy to remove hard mask layer for semiconductor device fabrication |
DE10021098C1 (de) * | 2000-04-20 | 2001-09-20 | Infineon Technologies Ag | Verfahren zum Herstellen einer Verdrahtungsebene auf einem Halbleiterchip mit einer Antifuse |
US6475922B1 (en) * | 2000-04-25 | 2002-11-05 | Koninklijke Philips Electronics N.V. | Hard mask process to control etch profiles in a gate stack |
US6797604B2 (en) * | 2000-05-08 | 2004-09-28 | International Business Machines Corporation | Method for manufacturing device substrate with metal back-gate and structure formed thereby |
DE10030442B4 (de) * | 2000-06-22 | 2006-01-12 | Infineon Technologies Ag | Verbindungselement in einem integrierten Schaltkreis |
US6387785B1 (en) * | 2000-07-22 | 2002-05-14 | United Microelectronics Corp. | Lithography and etching process |
JP2002050742A (ja) * | 2000-07-31 | 2002-02-15 | Nec Corp | 半導体装置およびその製造方法 |
US6465889B1 (en) * | 2001-02-07 | 2002-10-15 | Advanced Micro Devices, Inc. | Silicon carbide barc in dual damascene processing |
US6777171B2 (en) * | 2001-04-20 | 2004-08-17 | Applied Materials, Inc. | Fluorine-containing layers for damascene structures |
US6664191B1 (en) * | 2001-10-09 | 2003-12-16 | Advanced Micro Devices, Inc. | Non self-aligned shallow trench isolation process with disposable space to define sub-lithographic poly space |
US7473377B2 (en) * | 2002-06-27 | 2009-01-06 | Tokyo Electron Limited | Plasma processing method |
US7022625B2 (en) * | 2002-07-25 | 2006-04-04 | Chartered Semiconductor Manufacturing Ltd. | Method of fabricating a gate dielectric layer with reduced gate tunnelling current and reduced boron penetration |
US20040018739A1 (en) * | 2002-07-26 | 2004-01-29 | Applied Materials, Inc. | Methods for etching using building blocks |
KR100459725B1 (ko) * | 2002-09-19 | 2004-12-03 | 삼성전자주식회사 | 금속 게이트 패턴을 갖는 반도체소자의 제조방법 |
US7163880B2 (en) * | 2004-06-02 | 2007-01-16 | Texas Instruments Incorporated | Gate stack and gate stack etch sequence for metal gate integration |
US8268712B2 (en) * | 2010-05-27 | 2012-09-18 | United Microelectronics Corporation | Method of forming metal gate structure and method of forming metal gate transistor |
US8888879B1 (en) | 2010-10-20 | 2014-11-18 | Us Synthetic Corporation | Detection of one or more interstitial constituents in a polycrystalline diamond element by neutron radiographic imaging |
Family Cites Families (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4065730A (en) * | 1976-06-10 | 1977-12-27 | Sperry Rand Corporation | Laser optical coupler |
US4128670A (en) * | 1977-11-11 | 1978-12-05 | International Business Machines Corporation | Fabrication method for integrated circuits with polysilicon lines having low sheet resistance |
NL8004139A (nl) * | 1980-07-18 | 1982-02-16 | Philips Nv | Halfgeleiderinrichting. |
US4398335A (en) * | 1980-12-09 | 1983-08-16 | Fairchild Camera & Instrument Corporation | Multilayer metal silicide interconnections for integrated circuits |
US4488166A (en) * | 1980-12-09 | 1984-12-11 | Fairchild Camera & Instrument Corp. | Multilayer metal silicide interconnections for integrated circuits |
US4569122A (en) * | 1983-03-09 | 1986-02-11 | Advanced Micro Devices, Inc. | Method of forming a low resistance quasi-buried contact |
US4617252A (en) * | 1983-07-01 | 1986-10-14 | Philip A. Hunt Chemical Corporation | Antireflective coatings for use in the manufacture of semi-conductor devices, methods and solutions for making such coatings, and the method for using such coatings to absorb light in ultraviolet photolithography processes |
US4495222A (en) * | 1983-11-07 | 1985-01-22 | Motorola, Inc. | Metallization means and method for high temperature applications |
JPS61139067A (ja) * | 1984-12-11 | 1986-06-26 | Seiko Epson Corp | 半導体装置 |
JPS6286865A (ja) * | 1985-10-14 | 1987-04-21 | Mitsubishi Electric Corp | Mos型トランジスタ |
US4935380A (en) * | 1987-08-04 | 1990-06-19 | Mitsubishi Denki Kabushiki Kaisha | Method for manufacturing semiconductor device |
JPH01241125A (ja) * | 1988-03-23 | 1989-09-26 | Sony Corp | 半導体装置の製造方法 |
JPH02155273A (ja) * | 1988-12-07 | 1990-06-14 | Nec Corp | Mos電界効果トランジスタ |
GB9009059D0 (en) * | 1990-04-23 | 1990-06-20 | De Beers Ind Diamond | Diamond window |
DE4112148A1 (de) * | 1991-04-13 | 1992-10-15 | Philips Patentverwaltung | Lithotripsie-arbeitsplatz |
JPH0555130A (ja) * | 1991-08-25 | 1993-03-05 | Sony Corp | 半導体装置の製造方法 |
DE4130930A1 (de) * | 1991-09-13 | 1993-03-25 | Flachglas Ag | Vorsatzaggregat fuer bildschirme oder dergleichen |
US5341014A (en) * | 1992-01-07 | 1994-08-23 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device and a method of fabricating the same |
US5428244A (en) * | 1992-06-29 | 1995-06-27 | Matsushita Electric Industrial Co., Ltd. | Semiconductor device having a silicon rich dielectric layer |
US5264076A (en) * | 1992-12-17 | 1993-11-23 | At&T Bell Laboratories | Integrated circuit process using a "hard mask" |
US5346586A (en) * | 1992-12-23 | 1994-09-13 | Micron Semiconductor, Inc. | Method for selectively etching polysilicon to gate oxide using an insitu ozone photoresist strip |
US5378659A (en) * | 1993-07-06 | 1995-01-03 | Motorola Inc. | Method and structure for forming an integrated circuit pattern on a semiconductor substrate |
JP3043325B2 (ja) * | 1997-12-18 | 2000-05-22 | 株式会社神戸製鋼所 | 還元鉄ペレットの製造方法およびこの方法で製造した還元鉄ペレット |
-
1994
- 1994-05-02 US US08/236,076 patent/US5441914A/en not_active Expired - Lifetime
-
1995
- 1995-03-08 TW TW084102209A patent/TW303494B/zh not_active IP Right Cessation
- 1995-04-29 KR KR1019950010894A patent/KR100376628B1/ko not_active IP Right Cessation
-
1996
- 1996-06-18 US US08/666,722 patent/US5872385A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5441914A (en) | 1995-08-15 |
TW303494B (ko) | 1997-04-21 |
US5872385A (en) | 1999-02-16 |
KR100376628B1 (ko) | 2003-06-25 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR950034678A (ko) | 집적 회로내에 전도성 접속부 형성 방법 및, 그 회로내의 전도성 부재 | |
KR920015465A (ko) | 집적 회로용 국부 상호접속부 | |
KR940020531A (ko) | 콘택홀에 금속플러그 제조방법 | |
KR970051844A (ko) | 반도체 장치의 얼라인 키 패턴 형성방법 | |
KR960039285A (ko) | 반도체 소자 제조방법 | |
KR930003254A (ko) | 반도체 장치의 금속배선 방법 | |
KR970077345A (ko) | 반도체장치의 제조방법 | |
KR980005596A (ko) | 반도체 장치의 금속콘택 형성방법 | |
KR970077456A (ko) | 반도체 소자의 콘택 홀 형성 방법 | |
KR980005514A (ko) | 반도체 소자의 미세 콘택홀 형성방법 | |
KR970013032A (ko) | 고집적 반도체장치의 콘택트 형성방법 | |
KR970003479A (ko) | 반도체 장치의 매복접촉 형성방법 | |
KR960035809A (ko) | 반도체 장치의 콘택 형성 방법 | |
KR970072079A (ko) | 살리사이드 공정을 이용한 반도체 장치 및 그 제조 방법 | |
KR970018072A (ko) | 미세 접촉창을 형성할 수 있는 반도체 장치의 제조 방법 | |
KR980005838A (ko) | 반도체 소자의 패시베이션 방법 | |
KR970023737A (ko) | 반도체장치의 금속배선 형성방법 | |
KR950021285A (ko) | 금속배선층 형성방법 | |
KR970072411A (ko) | 반도체 소자 제조방법 | |
KR960012324A (ko) | 반도체소자의 게이트전극 콘택 및 그 제조방법 | |
KR970052299A (ko) | 반도체 소자의 비아콘택 형성방법 | |
KR970018033A (ko) | 반도체장치의 콘택홀 형성방법 | |
KR970052537A (ko) | 반도체장치의 제조방법 | |
KR970077519A (ko) | 다층 금속배선 형성방법 | |
KR960005957A (ko) | 다층배선 형성방법 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20130225 Year of fee payment: 11 |
|
FPAY | Annual fee payment |
Payment date: 20140224 Year of fee payment: 12 |
|
EXPY | Expiration of term |