KR900008668A - 반도체 장치 - Google Patents
반도체 장치 Download PDFInfo
- Publication number
- KR900008668A KR900008668A KR1019890015796A KR890015796A KR900008668A KR 900008668 A KR900008668 A KR 900008668A KR 1019890015796 A KR1019890015796 A KR 1019890015796A KR 890015796 A KR890015796 A KR 890015796A KR 900008668 A KR900008668 A KR 900008668A
- Authority
- KR
- South Korea
- Prior art keywords
- semiconductor
- electrode
- region
- thin layer
- stop wall
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title claims 13
- 230000004888 barrier function Effects 0.000 claims description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/66007—Multistep manufacturing processes
- H01L29/66075—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials
- H01L29/66083—Multistep manufacturing processes of devices having semiconductor bodies comprising group 14 or group 13/15 materials the devices being controllable only by variation of the electric current supplied or the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched, e.g. two-terminal devices
- H01L29/6609—Diodes
- H01L29/66143—Schottky diodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier
- H01L27/04—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body
- H01L27/08—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind
- H01L27/085—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only
- H01L27/095—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having at least one potential-jump barrier or surface barrier; including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being Schottky barrier gate field-effect transistors
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/47—Schottky barrier electrodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/40—Electrodes ; Multistep manufacturing processes therefor
- H01L29/43—Electrodes ; Multistep manufacturing processes therefor characterised by the materials of which they are formed
- H01L29/47—Schottky barrier electrodes
- H01L29/475—Schottky barrier electrodes on AIII-BV compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/86—Types of semiconductor device ; Multistep manufacturing processes therefor controllable only by variation of the electric current supplied, or only the electric potential applied, to one or more of the electrodes carrying the current to be rectified, amplified, oscillated or switched
- H01L29/861—Diodes
- H01L29/872—Schottky diodes
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/139—Schottky barrier
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S148/00—Metal treatment
- Y10S148/14—Schottky barrier contacts
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S438/00—Semiconductor device manufacturing: process
- Y10S438/934—Sheet resistance, i.e. dopant parameters
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Electrodes Of Semiconductors (AREA)
Abstract
내용 없음.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 받명의 제1의 실시예에 관한 쇼트키배리어 다이오드를 보여주는 단면도,
제2도는 제1도의 접속전극과 실리콘산화막을 생략한 쇼트키배리어다이오드를 보여주는 평면도,
제3도 (A) (B)는 제1도의 쇼트키배리어다이오드의 제조방법을 공정순으로 보여주는 단면도.
Claims (3)
- 반도체영역과, 전극을 구비하여 반도체영역과의 사이에 정류장벽을 형성하기 위한 정류장벽 형성수단과, 전극을 포위하도록 반도체영역상에 배치되고, 또한 전극에 전기적으로 접속되고, 또한 전극의 시트저항보다 큰 10k/□ 이상의 시트저항을 가지며, 그리고 반도체영역과의 사이에 쇼트키배리어가 생기게 하도록 형성되어 있는 제1의 박층영역과, 제1의 박층영역을 포함하도록 반도체영역상에 배치되고, 또한 제1의 박층영역에 전기적으로 접속되고, 또한 제1의 박층영역보다 큰 시트저항을 가지며, 또한 반도체영역과의 사이에 쇼트키배리어가 생기게하도록 형성되어 있는 제2의 박층영역을 구비한 것을 특징으로 하는 반도체장치.
- 제1항에 있어서, 정류장벽형성수단은, 반도체영역(3)과의 사이에 쇼트키배리어를 형성하는 배리어전극(4)인 것을 특징으로 하는 반도체장치.
- 제1항에 있어서, 정류장벽형성수단은, 반도체영역(23)과 반대의 도전형을 가지며, 또한 반도체영역(23)보다도 낮은 저항율을 가지고 있는 반대도전형 반도체영역(24)과, 반대도전형 반도체영역(24)상에 형성된 오오믹전극(26)으로 이루어지는 것을 특징으로 하는 반도체장치.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP88-285048 | 1988-11-11 | ||
JP63285048A JPH0618276B2 (ja) | 1988-11-11 | 1988-11-11 | 半導体装置 |
JP63-285048 | 1988-11-11 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR900008668A true KR900008668A (ko) | 1990-06-04 |
KR930004717B1 KR930004717B1 (ko) | 1993-06-03 |
Family
ID=17686493
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019890015796A KR930004717B1 (ko) | 1988-11-11 | 1989-11-01 | 반도체 장치 |
Country Status (5)
Country | Link |
---|---|
US (2) | US5081510A (ko) |
EP (2) | EP0368127B1 (ko) |
JP (1) | JPH0618276B2 (ko) |
KR (1) | KR930004717B1 (ko) |
DE (1) | DE68917558T2 (ko) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5221638A (en) * | 1991-09-10 | 1993-06-22 | Sanken Electric Co., Ltd. | Method of manufacturing a Schottky barrier semiconductor device |
JPH05335489A (ja) * | 1992-06-02 | 1993-12-17 | Nec Corp | 半導体装置 |
US5622877A (en) * | 1993-03-02 | 1997-04-22 | Ramot University Authority For Applied Research & Industrial Development Ltd. | Method for making high-voltage high-speed gallium arsenide power Schottky diode |
US5594237A (en) * | 1995-02-24 | 1997-01-14 | The Whitaker Corporation | PIN detector having improved linear response |
JP3123452B2 (ja) * | 1996-12-10 | 2001-01-09 | 富士電機株式会社 | ショットキーバリアダイオード |
JP3287269B2 (ja) | 1997-06-02 | 2002-06-04 | 富士電機株式会社 | ダイオードとその製造方法 |
US6379509B2 (en) * | 1998-01-20 | 2002-04-30 | 3M Innovative Properties Company | Process for forming electrodes |
US6229193B1 (en) * | 1998-04-06 | 2001-05-08 | California Institute Of Technology | Multiple stage high power diode |
EP1145298A3 (de) | 1998-05-26 | 2002-11-20 | Infineon Technologies AG | Verfahren zur herstellung von schottky-dioden |
US7135718B2 (en) * | 2002-02-20 | 2006-11-14 | Shindengen Electric Manufacturing Co., Ltd. | Diode device and transistor device |
US8901699B2 (en) | 2005-05-11 | 2014-12-02 | Cree, Inc. | Silicon carbide junction barrier Schottky diodes with suppressed minority carrier injection |
JP4730529B2 (ja) * | 2005-07-13 | 2011-07-20 | サンケン電気株式会社 | 電界効果トランジスタ |
US7662698B2 (en) * | 2006-11-07 | 2010-02-16 | Raytheon Company | Transistor having field plate |
US9893192B2 (en) * | 2013-04-24 | 2018-02-13 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
JP6544264B2 (ja) * | 2016-02-23 | 2019-07-17 | サンケン電気株式会社 | 半導体装置 |
DE102016013540A1 (de) * | 2016-11-14 | 2018-05-17 | 3 - 5 Power Electronics GmbH | lll-V-Halbleiterdiode |
JP6558385B2 (ja) * | 2017-02-23 | 2019-08-14 | トヨタ自動車株式会社 | 半導体装置の製造方法 |
Family Cites Families (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3616380A (en) * | 1968-11-22 | 1971-10-26 | Bell Telephone Labor Inc | Barrier layer devices and methods for their manufacture |
US3599054A (en) * | 1968-11-22 | 1971-08-10 | Bell Telephone Labor Inc | Barrier layer devices and methods for their manufacture |
US3652905A (en) * | 1970-05-26 | 1972-03-28 | Westinghouse Electric Corp | Schottky barrier power rectifier |
US4157563A (en) * | 1971-07-02 | 1979-06-05 | U.S. Philips Corporation | Semiconductor device |
US3907617A (en) * | 1971-10-22 | 1975-09-23 | Motorola Inc | Manufacture of a high voltage Schottky barrier device |
JPS4941463A (ko) * | 1972-07-26 | 1974-04-18 | ||
JPS51126761A (en) * | 1975-04-25 | 1976-11-05 | Sony Corp | Schottky barrier type semi-conductor unit |
US4408216A (en) * | 1978-06-02 | 1983-10-04 | International Rectifier Corporation | Schottky device and method of manufacture using palladium and platinum intermetallic alloys and titanium barrier for low reverse leakage over wide temperature range |
US4312113A (en) * | 1978-10-23 | 1982-01-26 | Eaton Corporation | Method of making field-effect transistors with micron and submicron gate lengths |
US4312112A (en) * | 1978-10-23 | 1982-01-26 | Eaton Corporation | Method of making field-effect transistors with micron and submicron gate lengths |
US4310570A (en) * | 1979-12-20 | 1982-01-12 | Eaton Corporation | Field-effect transistors with micron and submicron gate lengths |
JPS57208178A (en) * | 1981-06-18 | 1982-12-21 | Fujitsu Ltd | Semiconductor device |
JPS5846631A (ja) * | 1981-09-16 | 1983-03-18 | Nippon Telegr & Teleph Corp <Ntt> | 半導体装置及びその製造方法 |
JPS5861763A (ja) * | 1981-10-09 | 1983-04-12 | 武笠 均 | 触感知器消化装置 |
JPS59110173A (ja) * | 1982-12-15 | 1984-06-26 | Fuji Electric Corp Res & Dev Ltd | シヨツトキバリアダイオ−ド |
JPS59132661A (ja) * | 1983-01-20 | 1984-07-30 | Matsushita Electronics Corp | シヨツトキ・バリア形半導体装置 |
JPS59220976A (ja) * | 1983-05-31 | 1984-12-12 | Nec Home Electronics Ltd | シヨツトキバリアダイオ−ド |
JPS59232467A (ja) * | 1983-06-16 | 1984-12-27 | Toshiba Corp | ガ−ドリング付きシヨツトキ−バリヤ−ダイオ−ド |
JPS6020585A (ja) * | 1983-07-14 | 1985-02-01 | Sanyo Electric Co Ltd | シヨツトキ−バリア・ダイオ−ド |
US4899199A (en) * | 1983-09-30 | 1990-02-06 | International Rectifier Corporation | Schottky diode with titanium or like layer contacting the dielectric layer |
JPS60157268A (ja) * | 1984-01-26 | 1985-08-17 | Rohm Co Ltd | シヨツトキバリアダイオ−ド |
JPS60178670A (ja) * | 1984-02-24 | 1985-09-12 | Nec Corp | シヨツトキ−バリアダイオ−ド |
JPS61166164A (ja) * | 1985-01-18 | 1986-07-26 | Sanyo Electric Co Ltd | シヨツトキバリア半導体装置 |
GB2176339A (en) * | 1985-06-10 | 1986-12-17 | Philips Electronic Associated | Semiconductor device with schottky junctions |
JPS6394674A (ja) * | 1986-10-09 | 1988-04-25 | Sanken Electric Co Ltd | シヨツトキバリア半導体装置 |
JPS6394673A (ja) * | 1986-10-09 | 1988-04-25 | Sanken Electric Co Ltd | シヨツトキバリア半導体装置の製造方法 |
JPH0817229B2 (ja) * | 1988-03-31 | 1996-02-21 | サンケン電気株式会社 | 半導体装置 |
-
1988
- 1988-11-11 JP JP63285048A patent/JPH0618276B2/ja not_active Expired - Lifetime
-
1989
- 1989-10-26 US US07/427,734 patent/US5081510A/en not_active Expired - Lifetime
- 1989-10-31 DE DE68917558T patent/DE68917558T2/de not_active Expired - Fee Related
- 1989-10-31 EP EP89120211A patent/EP0368127B1/en not_active Expired - Lifetime
- 1989-10-31 EP EP19930115576 patent/EP0579286A3/en not_active Withdrawn
- 1989-11-01 KR KR1019890015796A patent/KR930004717B1/ko not_active IP Right Cessation
-
1991
- 1991-02-15 US US07/640,032 patent/US5112774A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
US5081510A (en) | 1992-01-14 |
JPH0618276B2 (ja) | 1994-03-09 |
DE68917558D1 (de) | 1994-09-22 |
JPH02130959A (ja) | 1990-05-18 |
DE68917558T2 (de) | 1995-04-20 |
EP0579286A3 (en) | 1994-09-07 |
EP0579286A2 (en) | 1994-01-19 |
US5112774A (en) | 1992-05-12 |
EP0368127A3 (en) | 1990-09-19 |
EP0368127B1 (en) | 1994-08-17 |
EP0368127A2 (en) | 1990-05-16 |
KR930004717B1 (ko) | 1993-06-03 |
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