KR101963300B1 - 표시 장치 - Google Patents

표시 장치 Download PDF

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Publication number
KR101963300B1
KR101963300B1 KR1020187012754A KR20187012754A KR101963300B1 KR 101963300 B1 KR101963300 B1 KR 101963300B1 KR 1020187012754 A KR1020187012754 A KR 1020187012754A KR 20187012754 A KR20187012754 A KR 20187012754A KR 101963300 B1 KR101963300 B1 KR 101963300B1
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South Korea
Prior art keywords
oxide semiconductor
film
semiconductor film
electrode
insulating film
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Expired - Fee Related
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KR1020187012754A
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English (en)
Korean (ko)
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KR20180049272A (ko
Inventor
순페이 야마자키
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가부시키가이샤 한도오따이 에네루기 켄큐쇼
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    • H01L29/7869—
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/1368—Active matrix addressed cells in which the switching element is a three-electrode device
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
    • H10D30/673—Thin-film transistors [TFT] characterised by the electrodes characterised by the shapes, relative sizes or dispositions of the gate electrodes
    • H10D30/6733—Multi-gate TFTs
    • H10D30/6734—Multi-gate TFTs having gate electrodes arranged on both top and bottom sides of the channel, e.g. dual-gate TFTs
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1337—Surface-induced orientation of the liquid crystal molecules, e.g. by alignment layers
    • H01L27/1225—
    • H01L27/3262—
    • H01L29/06—
    • H01L29/78606—
    • H01L29/78648—
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/6704—Thin-film transistors [TFT] having supplementary regions or layers in the thin films or in the insulated bulk substrates for controlling properties of the device
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D30/00—Field-effect transistors [FET]
    • H10D30/60—Insulated-gate field-effect transistors [IGFET]
    • H10D30/67—Thin-film transistors [TFT]
    • H10D30/674—Thin-film transistors [TFT] characterised by the active materials
    • H10D30/6755—Oxide semiconductors, e.g. zinc oxide, copper aluminium oxide or cadmium stannate
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/421—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer
    • H10D86/423—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs having a particular composition, shape or crystalline structure of the active layer comprising semiconductor materials not belonging to the Group IV, e.g. InGaZnO
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
    • H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
    • H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Mathematical Physics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Thin Film Transistor (AREA)
  • Electroluminescent Light Sources (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Liquid Crystal (AREA)
  • Electrochromic Elements, Electrophoresis, Or Variable Reflection Or Absorption Elements (AREA)
KR1020187012754A 2009-12-04 2010-11-11 표시 장치 Expired - Fee Related KR101963300B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2009276454 2009-12-04
JPJP-P-2009-276454 2009-12-04
PCT/JP2010/070517 WO2011068032A1 (en) 2009-12-04 2010-11-11 Display device

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
KR1020127016747A Division KR101857693B1 (ko) 2009-12-04 2010-11-11 표시 장치

Publications (2)

Publication Number Publication Date
KR20180049272A KR20180049272A (ko) 2018-05-10
KR101963300B1 true KR101963300B1 (ko) 2019-03-28

Family

ID=44081149

Family Applications (3)

Application Number Title Priority Date Filing Date
KR1020187012754A Expired - Fee Related KR101963300B1 (ko) 2009-12-04 2010-11-11 표시 장치
KR1020127016747A Expired - Fee Related KR101857693B1 (ko) 2009-12-04 2010-11-11 표시 장치
KR1020147002547A Active KR101523358B1 (ko) 2009-12-04 2010-11-11 표시 장치

Family Applications After (2)

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KR1020127016747A Expired - Fee Related KR101857693B1 (ko) 2009-12-04 2010-11-11 표시 장치
KR1020147002547A Active KR101523358B1 (ko) 2009-12-04 2010-11-11 표시 장치

Country Status (6)

Country Link
US (4) US8269218B2 (enExample)
JP (4) JP5739143B2 (enExample)
KR (3) KR101963300B1 (enExample)
CN (3) CN102648525B (enExample)
TW (3) TWI510849B (enExample)
WO (1) WO2011068032A1 (enExample)

Families Citing this family (61)

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KR101396096B1 (ko) 2009-10-09 2014-05-15 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 그 제조 방법
KR20250075719A (ko) * 2009-10-30 2025-05-28 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
CN102598282B (zh) 2009-11-06 2015-09-23 株式会社半导体能源研究所 半导体装置及其制造方法
DE112011102837B4 (de) 2010-08-27 2021-03-11 Semiconductor Energy Laboratory Co., Ltd. Speichereinrichtung und Halbleitereinrichtung mit Doppelgate und Oxidhalbleiter
US8592261B2 (en) * 2010-08-27 2013-11-26 Semiconductor Energy Laboratory Co., Ltd. Method for designing semiconductor device
US8829512B2 (en) 2010-12-28 2014-09-09 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device and method for manufacturing the same
US9553195B2 (en) * 2011-06-30 2017-01-24 Applied Materials, Inc. Method of IGZO and ZNO TFT fabrication with PECVD SiO2 passivation
CN108425090A (zh) 2011-08-10 2018-08-21 恩特格里斯公司 具有视需要氧化钇覆盖层的经AlON涂布的基质
JP6099336B2 (ja) 2011-09-14 2017-03-22 株式会社半導体エネルギー研究所 発光装置
JP5832399B2 (ja) 2011-09-16 2015-12-16 株式会社半導体エネルギー研究所 発光装置
KR20130043063A (ko) * 2011-10-19 2013-04-29 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 반도체 장치의 제작 방법
JP6035195B2 (ja) * 2012-05-01 2016-11-30 株式会社半導体エネルギー研究所 半導体装置の作製方法
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KR102226090B1 (ko) 2012-10-12 2021-03-09 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치의 제작 방법 및 반도체 장치의 제조 장치
JP6219562B2 (ja) 2012-10-30 2017-10-25 株式会社半導体エネルギー研究所 表示装置及び電子機器
CN105734493B (zh) 2012-11-08 2018-11-16 株式会社半导体能源研究所 金属氧化物膜及金属氧化物膜的形成方法
TWI538220B (zh) * 2012-11-21 2016-06-11 元太科技工業股份有限公司 薄膜電晶體與其製造方法
KR102798241B1 (ko) * 2012-12-25 2025-04-22 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
KR102196949B1 (ko) 2013-03-29 2020-12-30 엘지디스플레이 주식회사 박막 트랜지스터, 박막 트랜지스터 제조 방법 및 박막 트랜지스터를 포함하는 표시 장치
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TWI742574B (zh) * 2013-05-16 2021-10-11 日商半導體能源研究所股份有限公司 半導體裝置
JP6475424B2 (ja) * 2013-06-05 2019-02-27 株式会社半導体エネルギー研究所 半導体装置
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JP6448311B2 (ja) * 2014-10-30 2019-01-09 株式会社ジャパンディスプレイ 半導体装置
JP2016111040A (ja) * 2014-12-02 2016-06-20 株式会社ジャパンディスプレイ 半導体装置
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CN104821339B (zh) * 2015-05-11 2018-01-30 京东方科技集团股份有限公司 Tft及制作方法、阵列基板及制作驱动方法、显示装置
CN106298883B (zh) * 2015-06-04 2020-09-15 昆山工研院新型平板显示技术中心有限公司 一种薄膜晶体管及其制备方法
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CN108346620A (zh) * 2017-01-23 2018-07-31 京东方科技集团股份有限公司 阵列基板及其制作方法、显示装置
CN110730984B (zh) * 2017-06-08 2021-12-03 夏普株式会社 有源矩阵基板和显示装置
CN107799570A (zh) * 2017-10-09 2018-03-13 深圳市华星光电半导体显示技术有限公司 顶栅自对准金属氧化物半导体tft及其制作方法
CN110741428B (zh) * 2018-02-28 2021-12-21 京瓷株式会社 显示装置、玻璃基板及玻璃基板的制造方法
KR102053331B1 (ko) * 2018-06-19 2019-12-06 한국과학기술연구원 얇은 게이트 산화막을 통과하는 터널링에 대한 유효 게이트 산화막 두께 및 임계 게이트 산화막 두께 결정 방법
US20220293764A1 (en) * 2019-07-17 2022-09-15 Semiconductor Energy Laboratory Co., Ltd Semiconductor Device and Manufacturing Method of the Semiconductor Device
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JP6918386B1 (ja) * 2020-12-09 2021-08-11 株式会社アビット・テクノロジーズ 絶縁膜の製造方法
KR20220092393A (ko) 2020-12-24 2022-07-01 가부시키가이샤 한도오따이 에네루기 켄큐쇼 표시 장치
GB2604025B (en) 2020-12-29 2023-06-21 Lg Display Co Ltd Thin film transistor, method for manufacturing the thin film transistor and display device comprising the thin film transistor
CN114695561A (zh) * 2022-04-02 2022-07-01 中国科学院微电子研究所 一种平面晶体管及制造方法

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