KR101108947B1 - 고밀도 3차원 집적 커패시터 - Google Patents

고밀도 3차원 집적 커패시터 Download PDF

Info

Publication number
KR101108947B1
KR101108947B1 KR1020110026686A KR20110026686A KR101108947B1 KR 101108947 B1 KR101108947 B1 KR 101108947B1 KR 1020110026686 A KR1020110026686 A KR 1020110026686A KR 20110026686 A KR20110026686 A KR 20110026686A KR 101108947 B1 KR101108947 B1 KR 101108947B1
Authority
KR
South Korea
Prior art keywords
opening
dielectric layer
metal element
electrode
extending
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020110026686A
Other languages
English (en)
Korean (ko)
Inventor
베이그 오가네시안
벨가셈 하바
일야스 모하메드
피유시 사발리아
Original Assignee
테세라, 인코포레이티드
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 테세라, 인코포레이티드 filed Critical 테세라, 인코포레이티드
Application granted granted Critical
Publication of KR101108947B1 publication Critical patent/KR101108947B1/ko
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00Resistors, capacitors or inductors
    • H10D1/60Capacitors
    • H10D1/68Capacitors having no potential barriers
    • H10D1/692Electrodes
    • H10D1/711Electrodes having non-planar surfaces, e.g. formed by texturisation
    • H10D1/716Electrodes having non-planar surfaces, e.g. formed by texturisation having vertical extensions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/768Applying interconnections to be used for carrying current between separate components within a device comprising conductors and dielectrics
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/481Internal lead connections, e.g. via connections, feedthrough structures
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00Resistors, capacitors or inductors
    • H10D1/01Manufacture or treatment
    • H10D1/041Manufacture or treatment of capacitors having no potential barriers
    • H10D1/042Manufacture or treatment of capacitors having no potential barriers using deposition processes to form electrode extensions
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00Resistors, capacitors or inductors
    • H10D1/60Capacitors
    • H10D1/68Capacitors having no potential barriers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10DINORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D1/00Resistors, capacitors or inductors
    • H10D1/60Capacitors
    • H10D1/68Capacitors having no potential barriers
    • H10D1/692Electrodes
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2223/00Details relating to semiconductor or other solid state devices covered by the group H01L23/00
    • H01L2223/58Structural electrical arrangements for semiconductor devices not otherwise provided for
    • H01L2223/64Impedance arrangements
    • H01L2223/66High-frequency adaptations
    • H01L2223/6605High-frequency electrical connections
    • H01L2223/6616Vertical connections, e.g. vias
    • H01L2223/6622Coaxial feed-throughs in active or passive substrates
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/095Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00 with a principal constituent of the material being a combination of two or more materials provided in the groups H01L2924/013 - H01L2924/0715
    • H01L2924/097Glass-ceramics, e.g. devitrified glass
    • H01L2924/09701Low temperature co-fired ceramic [LTCC]

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Parts Printed On Printed Circuit Boards (AREA)
  • Semiconductor Integrated Circuits (AREA)
  • Internal Circuitry In Semiconductor Integrated Circuit Devices (AREA)
  • Ceramic Capacitors (AREA)
KR1020110026686A 2010-12-09 2011-03-25 고밀도 3차원 집적 커패시터 Expired - Fee Related KR101108947B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/964,049 US8502340B2 (en) 2010-12-09 2010-12-09 High density three-dimensional integrated capacitors
US12/964,049 2010-12-09

Related Child Applications (2)

Application Number Title Priority Date Filing Date
KR1020110104751A Division KR101188918B1 (ko) 2010-12-09 2011-10-13 고밀도 3차원 집적 커패시터
KR1020110104752A Division KR20120064611A (ko) 2010-12-09 2011-10-13 고밀도 3차원 집적 커패시터

Publications (1)

Publication Number Publication Date
KR101108947B1 true KR101108947B1 (ko) 2012-02-08

Family

ID=44509621

Family Applications (4)

Application Number Title Priority Date Filing Date
KR1020110026686A Expired - Fee Related KR101108947B1 (ko) 2010-12-09 2011-03-25 고밀도 3차원 집적 커패시터
KR1020137017548A Active KR101981149B1 (ko) 2010-12-09 2011-07-14 고밀도 3차원 집적 커패시터
KR1020110104752A Withdrawn KR20120064611A (ko) 2010-12-09 2011-10-13 고밀도 3차원 집적 커패시터
KR1020110104751A Expired - Fee Related KR101188918B1 (ko) 2010-12-09 2011-10-13 고밀도 3차원 집적 커패시터

Family Applications After (3)

Application Number Title Priority Date Filing Date
KR1020137017548A Active KR101981149B1 (ko) 2010-12-09 2011-07-14 고밀도 3차원 집적 커패시터
KR1020110104752A Withdrawn KR20120064611A (ko) 2010-12-09 2011-10-13 고밀도 3차원 집적 커패시터
KR1020110104751A Expired - Fee Related KR101188918B1 (ko) 2010-12-09 2011-10-13 고밀도 3차원 집적 커패시터

Country Status (7)

Country Link
US (5) US8502340B2 (enExample)
EP (3) EP2649639B1 (enExample)
JP (3) JP5895000B2 (enExample)
KR (4) KR101108947B1 (enExample)
CN (3) CN103348442B (enExample)
TW (1) TWI479522B (enExample)
WO (2) WO2012078213A1 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20180119935A (ko) * 2017-04-26 2018-11-05 삼성전기주식회사 커패시터 및 이를 포함하는 실장기판

Families Citing this family (85)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8502340B2 (en) 2010-12-09 2013-08-06 Tessera, Inc. High density three-dimensional integrated capacitors
US8492874B2 (en) * 2011-02-04 2013-07-23 Qualcomm Incorporated High density metal-insulator-metal trench capacitor
TWI447764B (zh) * 2012-06-28 2014-08-01 Hon Hai Prec Ind Co Ltd 電容及具有該電容的多層電路板
FR2993397A1 (fr) * 2012-07-16 2014-01-17 St Microelectronics Sa Dispositif semi-conducteur comprenant un condensateur integre et procede de fabrication
CN103578761B (zh) * 2012-07-24 2016-08-03 深圳市耀德科技股份有限公司 电容及具有该电容的多层电路板
US9258907B2 (en) 2012-08-09 2016-02-09 Lockheed Martin Corporation Conformal 3D non-planar multi-layer circuitry
KR101422923B1 (ko) * 2012-09-28 2014-07-23 삼성전기주식회사 커패시터 및 이의 제조 방법
TW201426844A (zh) * 2012-12-28 2014-07-01 Metal Ind Res & Dev Ct 微流道結構的製造方法
JP5401617B1 (ja) * 2013-01-24 2014-01-29 有限会社 ナプラ 受動素子内蔵基板
TWI640428B (zh) * 2013-02-27 2018-11-11 拜耳材料科學股份有限公司 以丙烯酸酯為基底之保護塗層與黏著劑
US8772745B1 (en) 2013-03-14 2014-07-08 Lockheed Martin Corporation X-ray obscuration film and related techniques
US9385177B2 (en) * 2013-10-31 2016-07-05 Stmicroelectronics, Inc. Technique for fabrication of microelectronic capacitors and resistors
CN104733492B (zh) * 2013-12-23 2018-11-13 昆山工研院新型平板显示技术中心有限公司 一种有机发光显示装置及其制备方法
US9548350B2 (en) * 2014-02-10 2017-01-17 Qualcomm Incorporated High quality factor capacitors and methods for fabricating high quality factor capacitors
US9355997B2 (en) 2014-03-12 2016-05-31 Invensas Corporation Integrated circuit assemblies with reinforcement frames, and methods of manufacture
US20150262902A1 (en) 2014-03-12 2015-09-17 Invensas Corporation Integrated circuits protected by substrates with cavities, and methods of manufacture
EP2924730A1 (en) 2014-03-25 2015-09-30 Ipdia Capacitor structure
US9165793B1 (en) 2014-05-02 2015-10-20 Invensas Corporation Making electrical components in handle wafers of integrated circuit packages
EP3920200A1 (en) 2014-05-05 2021-12-08 3D Glass Solutions, Inc. 2d and 3d inductors antenna and transformers fabricating photoactive substrates
US9741649B2 (en) 2014-06-04 2017-08-22 Invensas Corporation Integrated interposer solutions for 2D and 3D IC packaging
US9412806B2 (en) 2014-06-13 2016-08-09 Invensas Corporation Making multilayer 3D capacitors using arrays of upstanding rods or ridges
KR20160000613A (ko) * 2014-06-25 2016-01-05 삼성전기주식회사 박막 커패시터
US9252127B1 (en) 2014-07-10 2016-02-02 Invensas Corporation Microelectronic assemblies with integrated circuits and interposers with cavities, and methods of manufacture
US9693040B2 (en) 2014-09-10 2017-06-27 Faro Technologies, Inc. Method for optically measuring three-dimensional coordinates and calibration of a three-dimensional measuring device
DE102014013677B4 (de) 2014-09-10 2017-06-22 Faro Technologies, Inc. Verfahren zum optischen Abtasten und Vermessen einer Umgebung mit einem Handscanner und unterteiltem Display
US9602811B2 (en) 2014-09-10 2017-03-21 Faro Technologies, Inc. Method for optically measuring three-dimensional coordinates and controlling a three-dimensional measuring device
DE102014013678B3 (de) 2014-09-10 2015-12-03 Faro Technologies, Inc. Verfahren zum optischen Abtasten und Vermessen einer Umgebung mit einem Handscanner und Steuerung durch Gesten
US10123410B2 (en) 2014-10-10 2018-11-06 Lockheed Martin Corporation Fine line 3D non-planar conforming circuit
US9478504B1 (en) 2015-06-19 2016-10-25 Invensas Corporation Microelectronic assemblies with cavities, and methods of fabrication
KR101748949B1 (ko) * 2015-09-18 2017-06-21 서울대학교산학협력단 반도체 메모리 소자 및 이의 제조 방법
CN105118869B (zh) * 2015-09-21 2018-10-16 江苏多维科技有限公司 一种三维立体高密度薄膜积层电容及其制备方法
US9647057B2 (en) 2015-10-08 2017-05-09 Ipdia Capacitor 3D-cell and 3D-capacitor structure
CN105390475A (zh) * 2015-10-20 2016-03-09 北京大学 一种衬底内部的电容集成结构及其制造方法
JP6555084B2 (ja) * 2015-11-02 2019-08-07 富士通株式会社 容量素子及び容量素子の製造方法
WO2017134808A1 (ja) * 2016-02-05 2017-08-10 新電元工業株式会社 半導体装置の製造方法
KR20180134868A (ko) 2016-02-25 2018-12-19 3디 글래스 솔루션즈 인코포레이티드 3d 커패시터 및 커패시터 어레이 제작용 광활성 기재
US12165809B2 (en) 2016-02-25 2024-12-10 3D Glass Solutions, Inc. 3D capacitor and capacitor array fabricating photoactive substrates
US11161773B2 (en) 2016-04-08 2021-11-02 3D Glass Solutions, Inc. Methods of fabricating photosensitive substrates suitable for optical coupler
EP3327806B1 (en) * 2016-11-24 2021-07-21 Murata Integrated Passive Solutions Integrated electronic component suitable for broadband biasing
KR101933419B1 (ko) * 2017-04-25 2018-12-28 삼성전기 주식회사 커패시터 및 그 제조 방법
WO2018200804A1 (en) 2017-04-28 2018-11-01 3D Glass Solutions, Inc. Rf circulator
EP3422417B1 (en) * 2017-06-30 2021-08-04 Murata Manufacturing Co., Ltd. Distributed lc filter structure
JP6995891B2 (ja) 2017-07-07 2022-01-17 スリーディー グラス ソリューションズ,インク パッケージ光活性ガラス基板内のrfシステムのための2d及び3dのrf集中素子デバイス
WO2019107130A1 (ja) * 2017-11-30 2019-06-06 株式会社村田製作所 キャパシタ
US10854946B2 (en) 2017-12-15 2020-12-01 3D Glass Solutions, Inc. Coupled transmission line resonate RF filter
WO2019136024A1 (en) 2018-01-04 2019-07-11 3D Glass Solutions, Inc. Impedance matching conductive structure for high efficiency rf circuits
WO2019171470A1 (ja) * 2018-03-06 2019-09-12 株式会社 東芝 コンデンサ及びその製造方法
KR102626372B1 (ko) 2018-04-10 2024-01-16 3디 글래스 솔루션즈 인코포레이티드 Rf 집적형 전력 조절 커패시터
JP7178187B2 (ja) 2018-06-27 2022-11-25 太陽誘電株式会社 トレンチキャパシタ
JP7021021B2 (ja) * 2018-07-25 2022-02-16 日産自動車株式会社 半導体装置及びその製造方法
JP7160594B2 (ja) * 2018-08-09 2022-10-25 太陽誘電株式会社 キャパシタ
FR3085540B1 (fr) * 2018-08-31 2020-09-25 St Microelectronics Rousset Dispositif integre de mesure temporelle a constante de temps ultra longue et procede de fabrication
CA3112608C (en) 2018-09-17 2021-12-28 3D Glass Solutions, Inc. High efficiency compact slotted antenna with a ground plane
KR102140173B1 (ko) * 2018-10-25 2020-07-31 전자부품연구원 관통홀 구조를 갖는 캐패시터 및 그 제조방법
CA3107812C (en) 2018-12-28 2023-06-27 3D Glass Solutions, Inc. Annular capacitor rf, microwave and mm wave systems
KR102642279B1 (ko) * 2019-02-18 2024-02-28 양쯔 메모리 테크놀로지스 씨오., 엘티디. 새로운 커패시터 구조 및 이를 형성하는 방법
KR102250960B1 (ko) * 2019-02-19 2021-05-11 성균관대학교산학협력단 커패시터 및 커패시터 제조방법
WO2020184517A1 (ja) * 2019-03-13 2020-09-17 パナソニックIpマネジメント株式会社 キャパシタ及びその製造方法
WO2020181527A1 (zh) * 2019-03-13 2020-09-17 深圳市汇顶科技股份有限公司 电容器及其制作方法
US11962057B2 (en) 2019-04-05 2024-04-16 3D Glass Solutions, Inc. Glass based empty substrate integrated waveguide devices
JP7188825B2 (ja) 2019-04-18 2022-12-13 スリーディー グラス ソリューションズ,インク 高効率ダイダイシング及びリリース
US11018169B2 (en) * 2019-08-19 2021-05-25 Taiwan Semiconductor Manufacturing Co., Ltd. Metal-insulator-metal capacitor structure to increase capacitance density
KR102729847B1 (ko) 2020-02-17 2024-11-12 삼성전자주식회사 반도체 메모리 장치 및 이의 제조 방법
CN113451310B (zh) * 2020-03-27 2022-03-22 长鑫存储技术有限公司 半导体器件及半导体器件的形成方法
EP4121988A4 (en) 2020-04-17 2023-08-30 3D Glass Solutions, Inc. BROADBAND INDUCTOR
CN111405747B (zh) * 2020-04-28 2025-07-11 集美大学 一种抑制电路板电磁干扰的结构和电路板
US12266683B2 (en) * 2020-07-30 2025-04-01 Changxin Memory Technologies, Inc. Capacitor structure and method of manufacturing same, and memory
US12218042B2 (en) 2021-03-17 2025-02-04 Intel Corporation Via plug resistor
US12406916B2 (en) * 2021-03-17 2025-09-02 Intel Corporation Via plug capacitor
KR102460449B1 (ko) * 2021-03-31 2022-10-31 한국전자기술연구원 고주파 캐패시터 및 이의 제조방법
JP7751996B2 (ja) * 2021-07-09 2025-10-09 日産自動車株式会社 半導体キャパシタ及びその製造方法
JP2023049959A (ja) * 2021-09-29 2023-04-10 ローム株式会社 チップ部品
KR20230091307A (ko) * 2021-12-16 2023-06-23 삼성전기주식회사 커패시터 부품
US20230319997A1 (en) * 2022-03-31 2023-10-05 Intel Corporation Capacitor in a substrate via
CN114582809B (zh) * 2022-04-29 2022-07-29 长鑫存储技术有限公司 电容器的制作方法、电容器以及存储器
KR20240086344A (ko) * 2022-12-09 2024-06-18 (주)포인트엔지니어링 커패시터 부품 및 이를 구비하는 집적회로 칩 패키지
KR20240109740A (ko) * 2023-01-05 2024-07-12 엘지이노텍 주식회사 캐패시터
CN118412367A (zh) * 2023-01-30 2024-07-30 力特半导体(无锡)有限公司 用于半导体器件制造的玻璃沉积的方法
KR20240172295A (ko) * 2023-05-30 2024-12-10 (주)피코셈 반도체 디바이스
WO2025004618A1 (ja) * 2023-06-30 2025-01-02 太陽誘電株式会社 コンデンサ、実装基板及びコンデンサの製造方法
KR20250036481A (ko) * 2023-09-07 2025-03-14 엘지이노텍 주식회사 캐패시터
KR20250036482A (ko) * 2023-09-07 2025-03-14 엘지이노텍 주식회사 캐패시터
WO2025057931A1 (ja) * 2023-09-11 2025-03-20 株式会社村田製作所 コンデンサおよびその製造方法
KR20250037959A (ko) * 2023-09-11 2025-03-19 엘지이노텍 주식회사 캐패시터
CN117727560B (zh) * 2024-02-18 2024-04-19 成都宏科电子科技有限公司 一种绝缘间距可控的单层穿心瓷介电容器芯片

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6498381B2 (en) * 2001-02-22 2002-12-24 Tru-Si Technologies, Inc. Semiconductor structures having multiple conductive layers in an opening, and methods for fabricating same
US6565730B2 (en) * 1999-12-29 2003-05-20 Intel Corporation Self-aligned coaxial via capacitors
KR20060079207A (ko) * 2003-09-05 2006-07-05 산미나-에스씨아이 코포레이션 적층가능한 전자 어셈블리
KR20060105797A (ko) * 2003-12-23 2006-10-11 인텔 코오퍼레이션 박막 커패시터 구조를 갖는 집적 회로 패키지 기판

Family Cites Families (65)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4017885A (en) 1973-10-25 1977-04-12 Texas Instruments Incorporated Large value capacitor
US4827323A (en) * 1986-01-07 1989-05-02 Texas Instruments Incorporated Stacked capacitor
US5256587A (en) 1991-03-20 1993-10-26 Goldstar Electron Co., Ltd. Methods of patterning and manufacturing semiconductor devices
RU2082258C1 (ru) 1991-08-14 1997-06-20 Сименс АГ Схемная структура с по меньшей мере одним конденсатором и способ ее изготовления
DE4418430C1 (de) * 1994-05-26 1995-05-11 Siemens Ag Verfahren zur Herstellung eines Siliziumkondensators
DE4428195C1 (de) 1994-08-09 1995-04-20 Siemens Ag Verfahren zur Herstellung eines Siliziumkondensators
US5745333A (en) 1994-11-21 1998-04-28 International Business Machines Corporation Laminar stackable circuit board structure with capacitor
US5652170A (en) 1996-01-22 1997-07-29 Micron Technology, Inc. Method for etching sloped contact openings in polysilicon
JP2001233669A (ja) * 2000-02-24 2001-08-28 Ngk Spark Plug Co Ltd 高誘電率複合材料及びそれを用いたプリント配線板並びに多層プリント配線板
US6437385B1 (en) * 2000-06-29 2002-08-20 International Business Machines Corporation Integrated circuit capacitor
JP2002299462A (ja) * 2001-01-26 2002-10-11 Nokia Mobile Phones Ltd 半導体装置
DE10127950B4 (de) 2001-06-08 2007-04-12 Infineon Technologies Ag Verfahren zur Herstellung eines Halbleiterbauelements und Halbleiterbauelement
KR100531419B1 (ko) * 2001-06-12 2005-11-28 주식회사 하이닉스반도체 반도체소자 및 그의 제조방법
DE10138981B4 (de) 2001-08-08 2005-09-08 Infineon Technologies Ag Verfahren zur Bildung von Siliziumoxid durch elektrochemische Oxidation eines Halbleiter-Substrats mit Vertiefungen
US6740922B2 (en) 2001-08-14 2004-05-25 Agere Systems Inc. Interdigitated capacitor and method of manufacturing thereof
US6559004B1 (en) 2001-12-11 2003-05-06 United Microelectronics Corp. Method for forming three dimensional semiconductor structure and three dimensional capacitor
JP4305808B2 (ja) 2002-07-03 2009-07-29 太陽誘電株式会社 積層コンデンサ
US7030481B2 (en) 2002-12-09 2006-04-18 Internation Business Machines Corporation High density chip carrier with integrated passive devices
KR101086520B1 (ko) * 2003-06-20 2011-11-23 엔엑스피 비 브이 전자 장치, 조립체 및 전자 장치 제조 방법
US7105403B2 (en) * 2003-07-28 2006-09-12 Micron Technology, Inc. Double sided container capacitor for a semiconductor device and method for forming same
US7345350B2 (en) 2003-09-23 2008-03-18 Micron Technology, Inc. Process and integration scheme for fabricating conductive components, through-vias and semiconductor components including conductive through-wafer vias
US7186625B2 (en) 2004-05-27 2007-03-06 International Business Machines Corporation High density MIMCAP with a unit repeatable structure
JP2006019455A (ja) 2004-06-30 2006-01-19 Nec Electronics Corp 半導体装置およびその製造方法
JP4615962B2 (ja) * 2004-10-22 2011-01-19 ルネサスエレクトロニクス株式会社 半導体装置
US7312131B2 (en) * 2004-11-30 2007-12-25 Promos Technologies Inc. Method for forming multilayer electrode capacitor
US7429529B2 (en) * 2005-08-05 2008-09-30 Farnworth Warren M Methods of forming through-wafer interconnects and structures resulting therefrom
US7435627B2 (en) 2005-08-11 2008-10-14 International Business Machines Corporation Techniques for providing decoupling capacitance
EP1949419A1 (en) 2005-11-08 2008-07-30 Nxp B.V. Trench capacitor device suitable for decoupling applications in high-frequency operation
JP4833650B2 (ja) * 2005-12-08 2011-12-07 パナソニック株式会社 半導体装置及びその製造方法
US7626257B2 (en) 2006-01-18 2009-12-01 Infineon Technologies Ag Semiconductor devices and methods of manufacture thereof
JP5198741B2 (ja) 2006-05-23 2013-05-15 Jx日鉱日石金属株式会社 転炉排ガスの処理装置
KR100778865B1 (ko) * 2006-05-25 2007-11-22 동부일렉트로닉스 주식회사 엠아이엠 구조의 커패시터의 제조 방법
US7633112B2 (en) 2006-08-24 2009-12-15 Samsung Electronics Co., Ltd. Metal-insulator-metal capacitor and method of manufacturing the same
US7629249B2 (en) 2006-08-28 2009-12-08 Micron Technology, Inc. Microfeature workpieces having conductive interconnect structures formed by chemically reactive processes, and associated systems and methods
KR100957763B1 (ko) 2006-11-13 2010-05-12 재단법인서울대학교산학협력재단 박막형 다층 세라믹 커패시터 및 그 제조 방법
US7645669B2 (en) 2007-02-16 2010-01-12 Sharp Laboratories Of America, Inc. Nanotip capacitor
DE102007009383A1 (de) * 2007-02-20 2008-08-21 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Halbleiteranordnung und Verfahren zu deren Herstellung
JP5584474B2 (ja) 2007-03-05 2014-09-03 インヴェンサス・コーポレイション 貫通ビアによって前面接点に接続された後面接点を有するチップ
JP4877017B2 (ja) * 2007-03-30 2012-02-15 Tdk株式会社 薄膜コンデンサ
JP4907594B2 (ja) * 2007-06-14 2012-03-28 太陽誘電株式会社 コンデンサ及びその製造方法
US8085522B2 (en) 2007-06-26 2011-12-27 Headway Technologies, Inc. Capacitor and method of manufacturing the same and capacitor unit
US7927990B2 (en) 2007-06-29 2011-04-19 Sandisk Corporation Forming complimentary metal features using conformal insulator layer
JP4956405B2 (ja) * 2007-07-30 2012-06-20 太陽誘電株式会社 コンデンサ素子及びコンデンサ素子の製造方法
JP4382841B2 (ja) * 2007-08-20 2009-12-16 太陽誘電株式会社 コンデンサ及びその製造方法
US20090267183A1 (en) 2008-04-28 2009-10-29 Research Triangle Institute Through-substrate power-conducting via with embedded capacitance
US8816474B2 (en) * 2008-08-07 2014-08-26 Infineon Technologies Ag Capacitor structure
TWI400731B (zh) 2008-08-29 2013-07-01 財團法人工業技術研究院 電容元件及其製造方法
US7906404B2 (en) * 2008-11-21 2011-03-15 Teledyne Scientific & Imaging, Llc Power distribution for CMOS circuits using in-substrate decoupling capacitors and back side metal layers
US8288240B2 (en) * 2009-02-13 2012-10-16 International Business Machines Corporation Method of making an MIM capacitor and MIM capacitor structure formed thereby
US8330272B2 (en) 2010-07-08 2012-12-11 Tessera, Inc. Microelectronic packages with dual or multiple-etched flip-chip connectors
US8722503B2 (en) 2010-07-16 2014-05-13 Texas Instruments Incorporated Capacitors and methods of forming
US8598695B2 (en) 2010-07-23 2013-12-03 Tessera, Inc. Active chip on carrier or laminated chip having microelectronic element embedded therein
US8796135B2 (en) 2010-07-23 2014-08-05 Tessera, Inc. Microelectronic elements with rear contacts connected with via first or via middle structures
US8697569B2 (en) 2010-07-23 2014-04-15 Tessera, Inc. Non-lithographic formation of three-dimensional conductive elements
US8847376B2 (en) 2010-07-23 2014-09-30 Tessera, Inc. Microelectronic elements with post-assembly planarization
US9640437B2 (en) 2010-07-23 2017-05-02 Tessera, Inc. Methods of forming semiconductor elements using micro-abrasive particle stream
US8791575B2 (en) 2010-07-23 2014-07-29 Tessera, Inc. Microelectronic elements having metallic pads overlying vias
US8492818B2 (en) * 2010-09-14 2013-07-23 International Business Machines Corporation High capacitance trench capacitor
US8610259B2 (en) * 2010-09-17 2013-12-17 Tessera, Inc. Multi-function and shielded 3D interconnects
US8722505B2 (en) * 2010-11-02 2014-05-13 National Semiconductor Corporation Semiconductor capacitor with large area plates and a small footprint that is formed with shadow masks and only two lithography steps
US8502340B2 (en) * 2010-12-09 2013-08-06 Tessera, Inc. High density three-dimensional integrated capacitors
US8742541B2 (en) * 2010-12-09 2014-06-03 Tessera, Inc. High density three-dimensional integrated capacitors
US9196672B2 (en) * 2012-01-06 2015-11-24 Maxim Integrated Products, Inc. Semiconductor device having capacitor integrated therein
FR3002685B1 (fr) * 2013-02-28 2016-06-24 Commissariat Energie Atomique Procede de realisation d'un dispositif microelectronique
US20150102464A1 (en) * 2013-10-11 2015-04-16 Samsung Electro-Mechanics Co., Ltd. Capacitor with hole structure and manufacturing method thereof

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6565730B2 (en) * 1999-12-29 2003-05-20 Intel Corporation Self-aligned coaxial via capacitors
US6498381B2 (en) * 2001-02-22 2002-12-24 Tru-Si Technologies, Inc. Semiconductor structures having multiple conductive layers in an opening, and methods for fabricating same
KR20060079207A (ko) * 2003-09-05 2006-07-05 산미나-에스씨아이 코포레이션 적층가능한 전자 어셈블리
KR20060105797A (ko) * 2003-12-23 2006-10-11 인텔 코오퍼레이션 박막 커패시터 구조를 갖는 집적 회로 패키지 기판

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20180119935A (ko) * 2017-04-26 2018-11-05 삼성전기주식회사 커패시터 및 이를 포함하는 실장기판
KR101963285B1 (ko) * 2017-04-26 2019-03-28 삼성전기주식회사 커패시터 및 이를 포함하는 실장기판
US10665393B2 (en) 2017-04-26 2020-05-26 Samsung Electro-Mechanics Co., Ltd. Capacitor and board having the same

Also Published As

Publication number Publication date
US9431475B2 (en) 2016-08-30
TWI479522B (zh) 2015-04-01
KR20130132519A (ko) 2013-12-04
WO2012079013A1 (en) 2012-06-14
CN103348442B (zh) 2017-03-22
JP2014505354A (ja) 2014-02-27
US20120146182A1 (en) 2012-06-14
US11004930B2 (en) 2021-05-11
EP4102585A2 (en) 2022-12-14
CN103348442A (zh) 2013-10-09
TW201232580A (en) 2012-08-01
WO2012078213A1 (en) 2012-06-14
CN103348443A (zh) 2013-10-09
KR101981149B1 (ko) 2019-05-22
JP5895000B2 (ja) 2016-03-30
US20130313680A1 (en) 2013-11-28
EP2649639B1 (en) 2021-09-01
EP2649639A1 (en) 2013-10-16
US20210265460A1 (en) 2021-08-26
US20190131387A1 (en) 2019-05-02
JP6329977B2 (ja) 2018-05-23
US10157978B2 (en) 2018-12-18
CN103348443B (zh) 2017-03-22
EP2649640B1 (en) 2022-08-17
EP2649640A1 (en) 2013-10-16
CN107045972B (zh) 2020-05-05
US8502340B2 (en) 2013-08-06
CN107045972A (zh) 2017-08-15
US20160315139A1 (en) 2016-10-27
EP4102585A3 (en) 2023-03-22
KR20120064610A (ko) 2012-06-19
JP2016157946A (ja) 2016-09-01
KR101188918B1 (ko) 2012-10-08
KR20120064611A (ko) 2012-06-19
JP2014506001A (ja) 2014-03-06

Similar Documents

Publication Publication Date Title
KR101108947B1 (ko) 고밀도 3차원 집적 커패시터
US9437557B2 (en) High density three-dimensional integrated capacitors
EP2859582B1 (en) Reduced stress tsv
EP2700092B1 (en) Vias in porous substrates
US8959759B2 (en) Method for assembling computer modules small in thickness
US12456668B2 (en) Package structure, antenna module and probe card
TW202312411A (zh) 封裝結構、天線模組以及探針卡

Legal Events

Date Code Title Description
A201 Request for examination
A302 Request for accelerated examination
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

PA0302 Request for accelerated examination

St.27 status event code: A-1-2-D10-D17-exm-PA0302

St.27 status event code: A-1-2-D10-D16-exm-PA0302

D13-X000 Search requested

St.27 status event code: A-1-2-D10-D13-srh-X000

D14-X000 Search report completed

St.27 status event code: A-1-2-D10-D14-srh-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

N231 Notification of change of applicant
PN2301 Change of applicant

St.27 status event code: A-3-3-R10-R13-asn-PN2301

St.27 status event code: A-3-3-R10-R11-asn-PN2301

A107 Divisional application of patent
E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0107 Divisional application

St.27 status event code: A-0-1-A10-A18-div-PA0107

St.27 status event code: A-0-1-A10-A16-div-PA0107

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

FPAY Annual fee payment

Payment date: 20150106

Year of fee payment: 4

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

FPAY Annual fee payment

Payment date: 20160108

Year of fee payment: 5

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 5

FPAY Annual fee payment

Payment date: 20170111

Year of fee payment: 6

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 6

FPAY Annual fee payment

Payment date: 20180105

Year of fee payment: 7

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 7

FPAY Annual fee payment

Payment date: 20190108

Year of fee payment: 8

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 8

PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20200118

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20200118

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000