KR101024566B1 - 세정 장치, 리소그래피 장치 및 리소그래피 장치 세정 방법 - Google Patents
세정 장치, 리소그래피 장치 및 리소그래피 장치 세정 방법 Download PDFInfo
- Publication number
- KR101024566B1 KR101024566B1 KR20080041294A KR20080041294A KR101024566B1 KR 101024566 B1 KR101024566 B1 KR 101024566B1 KR 20080041294 A KR20080041294 A KR 20080041294A KR 20080041294 A KR20080041294 A KR 20080041294A KR 101024566 B1 KR101024566 B1 KR 101024566B1
- Authority
- KR
- South Korea
- Prior art keywords
- liquid
- cleaning
- transducer
- flow
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
- G03F7/70925—Cleaning, i.e. actively freeing apparatus from pollutants, e.g. using plasma cleaning
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
- B08B3/12—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70341—Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Epidemiology (AREA)
- Health & Medical Sciences (AREA)
- Public Health (AREA)
- Environmental & Geological Engineering (AREA)
- Atmospheric Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Plasma & Fusion (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US92424407P | 2007-05-04 | 2007-05-04 | |
| US60/924,244 | 2007-05-04 | ||
| US11/819,949 US9013672B2 (en) | 2007-05-04 | 2007-06-29 | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
| US11/819,949 | 2007-06-29 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020100017706A Division KR20100039311A (ko) | 2007-05-04 | 2010-02-26 | 세정 장치, 리소그래피 장치 및 리소그래피 장치 세정 방법 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20080098324A KR20080098324A (ko) | 2008-11-07 |
| KR101024566B1 true KR101024566B1 (ko) | 2011-03-31 |
Family
ID=39938698
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR20080041294A Expired - Fee Related KR101024566B1 (ko) | 2007-05-04 | 2008-05-02 | 세정 장치, 리소그래피 장치 및 리소그래피 장치 세정 방법 |
| KR1020100017706A Withdrawn KR20100039311A (ko) | 2007-05-04 | 2010-02-26 | 세정 장치, 리소그래피 장치 및 리소그래피 장치 세정 방법 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020100017706A Withdrawn KR20100039311A (ko) | 2007-05-04 | 2010-02-26 | 세정 장치, 리소그래피 장치 및 리소그래피 장치 세정 방법 |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US7841352B2 (enExample) |
| JP (7) | JP4686571B2 (enExample) |
| KR (2) | KR101024566B1 (enExample) |
| CN (1) | CN101299133B (enExample) |
| TW (2) | TWI385711B (enExample) |
Families Citing this family (51)
| Publication number | Priority date | Publication date | Assignee | Title |
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| US7684008B2 (en) | 2003-06-11 | 2010-03-23 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7050146B2 (en) | 2004-02-09 | 2006-05-23 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US7385670B2 (en) * | 2004-10-05 | 2008-06-10 | Asml Netherlands B.V. | Lithographic apparatus, cleaning system and cleaning method for in situ removing contamination from a component in a lithographic apparatus |
| US7880860B2 (en) | 2004-12-20 | 2011-02-01 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US8858805B2 (en) * | 2005-01-25 | 2014-10-14 | Robert Edward Vago | Method and device for removal of ammonia and related contaminants from water |
| US8125610B2 (en) | 2005-12-02 | 2012-02-28 | ASML Metherlands B.V. | Method for preventing or reducing contamination of an immersion type projection apparatus and an immersion type lithographic apparatus |
| US7969548B2 (en) * | 2006-05-22 | 2011-06-28 | Asml Netherlands B.V. | Lithographic apparatus and lithographic apparatus cleaning method |
| JP5029611B2 (ja) * | 2006-09-08 | 2012-09-19 | 株式会社ニコン | クリーニング用部材、クリーニング方法、露光装置、並びにデバイス製造方法 |
| US8654305B2 (en) | 2007-02-15 | 2014-02-18 | Asml Holding N.V. | Systems and methods for insitu lens cleaning in immersion lithography |
| US8817226B2 (en) | 2007-02-15 | 2014-08-26 | Asml Holding N.V. | Systems and methods for insitu lens cleaning using ozone in immersion lithography |
| US7841352B2 (en) | 2007-05-04 | 2010-11-30 | Asml Netherlands B.V. | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
| US7866330B2 (en) | 2007-05-04 | 2011-01-11 | Asml Netherlands B.V. | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
| US8947629B2 (en) | 2007-05-04 | 2015-02-03 | Asml Netherlands B.V. | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
| US8011377B2 (en) | 2007-05-04 | 2011-09-06 | Asml Netherlands B.V. | Cleaning device and a lithographic apparatus cleaning method |
| KR20100031694A (ko) * | 2007-05-28 | 2010-03-24 | 가부시키가이샤 니콘 | 노광 장치, 디바이스 제조 방법, 세정 장치, 및 클리닝 방법 그리고 노광 방법 |
| US7916269B2 (en) | 2007-07-24 | 2011-03-29 | Asml Netherlands B.V. | Lithographic apparatus and contamination removal or prevention method |
| US20090025753A1 (en) * | 2007-07-24 | 2009-01-29 | Asml Netherlands B.V. | Lithographic Apparatus And Contamination Removal Or Prevention Method |
| JP4961299B2 (ja) * | 2007-08-08 | 2012-06-27 | キヤノン株式会社 | 露光装置およびデバイス製造方法 |
| NL1035942A1 (nl) * | 2007-09-27 | 2009-03-30 | Asml Netherlands Bv | Lithographic Apparatus and Method of Cleaning a Lithographic Apparatus. |
| SG151198A1 (en) * | 2007-09-27 | 2009-04-30 | Asml Netherlands Bv | Methods relating to immersion lithography and an immersion lithographic apparatus |
| JP5017232B2 (ja) * | 2007-10-31 | 2012-09-05 | エーエスエムエル ネザーランズ ビー.ブイ. | クリーニング装置および液浸リソグラフィ装置 |
| NL1036186A1 (nl) * | 2007-12-03 | 2009-06-04 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method. |
| NL1036273A1 (nl) * | 2007-12-18 | 2009-06-19 | Asml Netherlands Bv | Lithographic apparatus and method of cleaning a surface of an immersion lithographic apparatus. |
| NL1036306A1 (nl) * | 2007-12-20 | 2009-06-23 | Asml Netherlands Bv | Lithographic apparatus and in-line cleaning apparatus. |
| KR101423611B1 (ko) * | 2008-01-16 | 2014-07-30 | 삼성전자주식회사 | 기판 처리 장치, 노광 장치 및 클리닝 툴의 세정 방법 |
| US8339572B2 (en) | 2008-01-25 | 2012-12-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| NL1036709A1 (nl) | 2008-04-24 | 2009-10-27 | Asml Netherlands Bv | Lithographic apparatus and a method of operating the apparatus. |
| WO2010088194A2 (en) | 2009-01-28 | 2010-08-05 | Advanced Technology Materials, Inc. | Lithographic tool in situ clean formulations |
| NL2004540A (en) * | 2009-05-14 | 2010-11-18 | Asml Netherlands Bv | Lithographic apparatus and a method of operating the apparatus. |
| US8619231B2 (en) * | 2009-05-21 | 2013-12-31 | Nikon Corporation | Cleaning method, exposure method, and device manufacturing method |
| NL2004907A (en) * | 2009-06-19 | 2010-12-20 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method. |
| JP2011003759A (ja) * | 2009-06-19 | 2011-01-06 | Nikon Corp | 部材の洗浄方法、露光方法、デバイス製造方法、および洗浄液 |
| NL2005167A (en) * | 2009-10-02 | 2011-04-05 | Asml Netherlands Bv | Lithographic apparatus and a method of operating the apparatus. |
| NL2005610A (en) * | 2009-12-02 | 2011-06-06 | Asml Netherlands Bv | Lithographic apparatus and surface cleaning method. |
| US20120019804A1 (en) | 2010-07-23 | 2012-01-26 | Nikon Corporation | Cleaning method, cleaning apparatus, device fabricating method, program, and storage medium |
| US20120019803A1 (en) | 2010-07-23 | 2012-01-26 | Nikon Corporation | Cleaning method, liquid immersion member, immersion exposure apparatus, device fabricating method, program, and storage medium |
| US20120160264A1 (en) * | 2010-12-23 | 2012-06-28 | Richard Endo | Wet Processing Tool with Site Isolation |
| US8926762B2 (en) | 2011-09-06 | 2015-01-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Apparatus and methods for movable megasonic wafer probe |
| US9953847B2 (en) * | 2013-09-10 | 2018-04-24 | Taiwan Semiconductor Manufacturing Company Ltd. | Apparatus and method for cleaning |
| CN104216236B (zh) * | 2014-08-22 | 2016-08-17 | 深圳市大川光电设备有限公司 | 适合影像转移曝光机的菲林与工件密着方法 |
| TWI626506B (zh) * | 2016-07-28 | 2018-06-11 | 非接觸式光罩/晶圓潔淨裝置 | |
| EP3447581A1 (en) * | 2017-08-23 | 2019-02-27 | ASML Netherlands B.V. | A clear-out tool, a lithographic apparatus and a device manufacturing method |
| CN110560424A (zh) * | 2019-09-18 | 2019-12-13 | 宁波南大光电材料有限公司 | 一种用于光刻设备的非接触式超声清洗装置 |
| FR3100998B1 (fr) * | 2019-09-25 | 2022-06-03 | Lille Ecole Centrale | Dispositif pour nettoyer un support recouvert d’un liquide |
| EP3919978A1 (en) * | 2020-06-05 | 2021-12-08 | Taiwan Semiconductor Manufacturing Co., Ltd. | Apparatus and a method of forming a particle shield |
| EP4129566A4 (en) * | 2020-08-24 | 2024-08-07 | DMG Mori Co., Ltd. | Information processing device and machine tool |
| CN112684675B (zh) * | 2020-12-30 | 2023-02-21 | 浙江启尔机电技术有限公司 | 真空系统及使用该真空系统的浸没式光刻机 |
| CN113083530B (zh) * | 2021-03-01 | 2022-08-16 | 武汉大学 | 一种中心体位置可连续调节的空化喷嘴 |
| CN115818565A (zh) * | 2022-11-17 | 2023-03-21 | 浙江大学医学院附属第四医院 | 一种对微纳米颗粒进行富集、分选的装置和方法 |
| CN116586370A (zh) * | 2023-06-07 | 2023-08-15 | 山东省计量科学研究院 | 一种高准确度砝码自动清洗装置及其工作方法 |
| CN119608675B (zh) * | 2025-02-13 | 2025-04-18 | 厦门银科启瑞半导体科技有限公司 | 一种晶圆清洗设备及其清洗方法 |
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| EP2043134A4 (en) | 2006-06-30 | 2012-01-25 | Nikon Corp | MAINTENANCE METHOD, EXPOSURE METHOD, AND DEVICE AND DEVICE MANUFACTURING METHOD |
| US7841352B2 (en) | 2007-05-04 | 2010-11-30 | Asml Netherlands B.V. | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
| US8011377B2 (en) * | 2007-05-04 | 2011-09-06 | Asml Netherlands B.V. | Cleaning device and a lithographic apparatus cleaning method |
| US7866330B2 (en) | 2007-05-04 | 2011-01-11 | Asml Netherlands B.V. | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
| US8947629B2 (en) * | 2007-05-04 | 2015-02-03 | Asml Netherlands B.V. | Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method |
| US20090025753A1 (en) * | 2007-07-24 | 2009-01-29 | Asml Netherlands B.V. | Lithographic Apparatus And Contamination Removal Or Prevention Method |
| US7916269B2 (en) * | 2007-07-24 | 2011-03-29 | Asml Netherlands B.V. | Lithographic apparatus and contamination removal or prevention method |
| SG151198A1 (en) * | 2007-09-27 | 2009-04-30 | Asml Netherlands Bv | Methods relating to immersion lithography and an immersion lithographic apparatus |
| NL1035942A1 (nl) * | 2007-09-27 | 2009-03-30 | Asml Netherlands Bv | Lithographic Apparatus and Method of Cleaning a Lithographic Apparatus. |
| JP5017232B2 (ja) * | 2007-10-31 | 2012-09-05 | エーエスエムエル ネザーランズ ビー.ブイ. | クリーニング装置および液浸リソグラフィ装置 |
| NL1036273A1 (nl) * | 2007-12-18 | 2009-06-19 | Asml Netherlands Bv | Lithographic apparatus and method of cleaning a surface of an immersion lithographic apparatus. |
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| US8339572B2 (en) * | 2008-01-25 | 2012-12-25 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
| US8654306B2 (en) | 2008-04-14 | 2014-02-18 | Nikon Corporation | Exposure apparatus, cleaning method, and device fabricating method |
| NL2005610A (en) | 2009-12-02 | 2011-06-06 | Asml Netherlands Bv | Lithographic apparatus and surface cleaning method. |
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2007
- 2007-06-29 US US11/819,954 patent/US7841352B2/en active Active
- 2007-06-29 US US11/819,949 patent/US9013672B2/en not_active Expired - Fee Related
- 2007-06-29 US US11/819,959 patent/US7900641B2/en not_active Expired - Fee Related
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2008
- 2008-04-22 TW TW97114672A patent/TWI385711B/zh not_active IP Right Cessation
- 2008-04-22 TW TW101110471A patent/TW201234414A/zh unknown
- 2008-04-24 JP JP2008114096A patent/JP4686571B2/ja active Active
- 2008-04-30 CN CN2008100949783A patent/CN101299133B/zh active Active
- 2008-05-02 JP JP2008120654A patent/JP4908454B2/ja not_active Expired - Fee Related
- 2008-05-02 JP JP2008120668A patent/JP4912352B2/ja not_active Expired - Fee Related
- 2008-05-02 KR KR20080041294A patent/KR101024566B1/ko not_active Expired - Fee Related
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2010
- 2010-02-26 KR KR1020100017706A patent/KR20100039311A/ko not_active Withdrawn
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2011
- 2011-02-14 JP JP2011028118A patent/JP5036885B2/ja active Active
- 2011-04-20 JP JP2011093700A patent/JP5097843B2/ja not_active Expired - Fee Related
- 2011-06-16 JP JP2011134159A patent/JP5323894B2/ja not_active Expired - Fee Related
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Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR20070044377A (ko) * | 2005-10-24 | 2007-04-27 | 타이완 세미콘덕터 매뉴팩쳐링 컴퍼니 리미티드 | 이머션 리소그래피 장치 및 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN101299133A (zh) | 2008-11-05 |
| JP5198624B2 (ja) | 2013-05-15 |
| JP4686571B2 (ja) | 2011-05-25 |
| JP5036885B2 (ja) | 2012-09-26 |
| TW200845129A (en) | 2008-11-16 |
| KR20080098324A (ko) | 2008-11-07 |
| CN101299133B (zh) | 2012-07-25 |
| JP5097843B2 (ja) | 2012-12-12 |
| JP4912352B2 (ja) | 2012-04-11 |
| JP4908454B2 (ja) | 2012-04-04 |
| JP2008294439A (ja) | 2008-12-04 |
| JP2011238940A (ja) | 2011-11-24 |
| US9013672B2 (en) | 2015-04-21 |
| US20080271750A1 (en) | 2008-11-06 |
| TWI385711B (zh) | 2013-02-11 |
| JP2011238939A (ja) | 2011-11-24 |
| KR20100039311A (ko) | 2010-04-15 |
| JP2008277819A (ja) | 2008-11-13 |
| JP2011187971A (ja) | 2011-09-22 |
| TW201234414A (en) | 2012-08-16 |
| US7841352B2 (en) | 2010-11-30 |
| US7900641B2 (en) | 2011-03-08 |
| JP2008300824A (ja) | 2008-12-11 |
| JP5323894B2 (ja) | 2013-10-23 |
| US20080273181A1 (en) | 2008-11-06 |
| US20080271747A1 (en) | 2008-11-06 |
| JP2011097108A (ja) | 2011-05-12 |
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