KR100817343B1 - 반도체 집적회로장치 - Google Patents

반도체 집적회로장치 Download PDF

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KR100817343B1
KR100817343B1 KR1020077023259A KR20077023259A KR100817343B1 KR 100817343 B1 KR100817343 B1 KR 100817343B1 KR 1020077023259 A KR1020077023259 A KR 1020077023259A KR 20077023259 A KR20077023259 A KR 20077023259A KR 100817343 B1 KR100817343 B1 KR 100817343B1
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circuit
nonvolatile memory
flash memory
memory cell
data
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Korean (ko)
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KR20070108570A (ko
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코이치로 이시바시
마사나오 야마오카
쇼지 슈쿠리
카즈마사 야나기사와
준이치 니시모토
마사카즈 아오키
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가부시키가이샤 히타치세이사쿠쇼
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    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0408Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors
    • G11C16/0441Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells containing floating gate transistors comprising cells containing multiple floating gate devices, e.g. separate read-and-write FAMOS transistors with connected floating gates
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B82NANOTECHNOLOGY
    • B82YSPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y10/00Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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    • C04B28/00Compositions of mortars, concrete or artificial stone, containing inorganic binders or the reaction product of an inorganic and an organic binder, e.g. polycarboxylate cements
    • C04B28/02Compositions of mortars, concrete or artificial stone, containing inorganic binders or the reaction product of an inorganic and an organic binder, e.g. polycarboxylate cements containing hydraulic cements other than calcium sulfates
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    • G11C29/70Masking faults in memories by using spares or by reconfiguring
    • G11C29/78Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/785Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes
    • G11C29/789Masking faults in memories by using spares or by reconfiguring using programmable devices with redundancy programming schemes using non-volatile cells or latches
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    • G11C29/70Masking faults in memories by using spares or by reconfiguring
    • G11C29/78Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/84Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
    • G11C29/848Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability by adjacent switching
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    • G11C16/00Erasable programmable read-only memories
    • G11C16/02Erasable programmable read-only memories electrically programmable
    • G11C16/04Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
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    • G11C2216/02Structural aspects of erasable programmable read-only memories
    • G11C2216/10Floating gate memory cells with a single polysilicon layer
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KR1020077023259A 2000-02-10 2001-02-08 반도체 집적회로장치 Expired - Lifetime KR100817343B1 (ko)

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JPJP-P-2000-00038167 2000-02-10
JP2000038167A JP4191355B2 (ja) 2000-02-10 2000-02-10 半導体集積回路装置

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HUP0101186A3 (en) * 1997-11-28 2002-03-28 Abb Ab Method and device for controlling the magnetic flux with an auxiliary winding in a rotaing high voltage electric alternating current machine
US6829737B1 (en) 2000-08-30 2004-12-07 Micron Technology, Inc. Method and system for storing device test information on a semiconductor device using on-device logic for determination of test results
JP4043703B2 (ja) * 2000-09-04 2008-02-06 株式会社ルネサステクノロジ 半導体装置、マイクロコンピュータ、及びフラッシュメモリ
DE10120670B4 (de) * 2001-04-27 2008-08-21 Qimonda Ag Verfahren zur Reparatur von Hardwarefehlern in Speicherbausteinen
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