KR100587628B1 - 플라즈마 처리 시스템에서 반응 가스 온도를 감소시키는능동-냉각 분배판 - Google Patents
플라즈마 처리 시스템에서 반응 가스 온도를 감소시키는능동-냉각 분배판 Download PDFInfo
- Publication number
- KR100587628B1 KR100587628B1 KR1020010021896A KR20010021896A KR100587628B1 KR 100587628 B1 KR100587628 B1 KR 100587628B1 KR 1020010021896 A KR1020010021896 A KR 1020010021896A KR 20010021896 A KR20010021896 A KR 20010021896A KR 100587628 B1 KR100587628 B1 KR 100587628B1
- Authority
- KR
- South Korea
- Prior art keywords
- baffle plate
- refrigerant
- cooling passage
- gas distribution
- processing system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45565—Shower nozzles
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- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/4411—Cooling of the reaction chamber walls
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/448—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials
- C23C16/452—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for generating reactive gas streams, e.g. by evaporation or sublimation of precursor materials by activating reactive gas streams before their introduction into the reaction chamber, e.g. by ionisation or addition of reactive species
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45561—Gas plumbing upstream of the reaction chamber
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45563—Gas nozzles
- C23C16/45572—Cooled nozzles
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32522—Temperature
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Plasma & Fusion (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Drying Of Semiconductors (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Plasma Technology (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/560,538 US6635117B1 (en) | 2000-04-26 | 2000-04-26 | Actively-cooled distribution plate for reducing reactive gas temperature in a plasma processing system |
| US09/560,538 | 2000-04-26 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20010098812A KR20010098812A (ko) | 2001-11-08 |
| KR100587628B1 true KR100587628B1 (ko) | 2006-06-08 |
Family
ID=24238217
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020010021896A Expired - Lifetime KR100587628B1 (ko) | 2000-04-26 | 2001-04-24 | 플라즈마 처리 시스템에서 반응 가스 온도를 감소시키는능동-냉각 분배판 |
Country Status (6)
| Country | Link |
|---|---|
| US (2) | US6635117B1 (enExample) |
| EP (2) | EP1770753B1 (enExample) |
| JP (1) | JP4793528B2 (enExample) |
| KR (1) | KR100587628B1 (enExample) |
| DE (2) | DE60131695T2 (enExample) |
| TW (1) | TW490705B (enExample) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101313524B1 (ko) * | 2008-07-24 | 2013-10-01 | 가부시키가이샤 뉴플레어 테크놀로지 | 성막 장치와 성막 방법 |
| KR101568363B1 (ko) | 2014-08-27 | 2015-11-12 | 피에스케이 주식회사 | 기판 처리 장치 및 배플 |
| KR20150126789A (ko) * | 2014-05-05 | 2015-11-13 | 램 리써치 코포레이션 | 다공성 베플을 갖는 저 볼륨 샤워헤드 |
| KR20160137404A (ko) * | 2015-05-22 | 2016-11-30 | 램 리써치 코포레이션 | 개선된 흐름 균일성을 위해 대면 플레이트 홀들을 갖는 저 볼륨 샤워헤드 |
| KR20210048901A (ko) * | 2019-10-24 | 2021-05-04 | 피에스케이 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
| US12203168B2 (en) | 2019-08-28 | 2025-01-21 | Lam Research Corporation | Metal deposition |
| US12486574B2 (en) | 2019-08-23 | 2025-12-02 | Lam Research Corporation | Thermally controlled chandelier showerhead |
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| US6635117B1 (en) * | 2000-04-26 | 2003-10-21 | Axcelis Technologies, Inc. | Actively-cooled distribution plate for reducing reactive gas temperature in a plasma processing system |
| US6537419B1 (en) * | 2000-04-26 | 2003-03-25 | David W. Kinnard | Gas distribution plate assembly for providing laminar gas flow across the surface of a substrate |
| US6939434B2 (en) * | 2000-08-11 | 2005-09-06 | Applied Materials, Inc. | Externally excited torroidal plasma source with magnetic control of ion distribution |
| JP2002129334A (ja) * | 2000-10-26 | 2002-05-09 | Applied Materials Inc | 気相堆積装置のクリーニング方法及び気相堆積装置 |
| KR100434487B1 (ko) * | 2001-01-17 | 2004-06-05 | 삼성전자주식회사 | 샤워 헤드 및 이를 포함하는 박막 형성 장비 |
| DE10134513A1 (de) * | 2001-07-16 | 2003-01-30 | Unaxis Balzers Ag | Hebe-und Stützvorichtung |
| KR100476370B1 (ko) * | 2002-07-19 | 2005-03-16 | 주식회사 하이닉스반도체 | 배치형 원자층증착장치 및 그의 인시튜 세정 방법 |
| US6945054B1 (en) | 2002-10-04 | 2005-09-20 | Richard S. Norman | Method and apparatus for cooling microelectronic complexes including multiple discrete functional modules |
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| US6976782B1 (en) | 2003-11-24 | 2005-12-20 | Lam Research Corporation | Methods and apparatus for in situ substrate temperature monitoring |
| US7892357B2 (en) * | 2004-01-12 | 2011-02-22 | Axcelis Technologies, Inc. | Gas distribution plate assembly for plasma reactors |
| US20050221618A1 (en) * | 2004-03-31 | 2005-10-06 | Amrhein Frederick J | System for controlling a plenum output flow geometry |
| US20050241767A1 (en) * | 2004-04-30 | 2005-11-03 | Ferris David S | Multi-piece baffle plate assembly for a plasma processing system |
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| US7988816B2 (en) | 2004-06-21 | 2011-08-02 | Tokyo Electron Limited | Plasma processing apparatus and method |
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| US20050284573A1 (en) * | 2004-06-24 | 2005-12-29 | Egley Fred D | Bare aluminum baffles for resist stripping chambers |
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| KR101313524B1 (ko) * | 2008-07-24 | 2013-10-01 | 가부시키가이샤 뉴플레어 테크놀로지 | 성막 장치와 성막 방법 |
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| KR20150126789A (ko) * | 2014-05-05 | 2015-11-13 | 램 리써치 코포레이션 | 다공성 베플을 갖는 저 볼륨 샤워헤드 |
| KR102333103B1 (ko) | 2014-05-05 | 2021-11-29 | 램 리써치 코포레이션 | 다공성 베플을 갖는 저 볼륨 샤워헤드 |
| KR101568363B1 (ko) | 2014-08-27 | 2015-11-12 | 피에스케이 주식회사 | 기판 처리 장치 및 배플 |
| KR20160137404A (ko) * | 2015-05-22 | 2016-11-30 | 램 리써치 코포레이션 | 개선된 흐름 균일성을 위해 대면 플레이트 홀들을 갖는 저 볼륨 샤워헤드 |
| KR102357417B1 (ko) * | 2015-05-22 | 2022-01-27 | 램 리써치 코포레이션 | 개선된 흐름 균일성을 위해 대면 플레이트 홀들을 갖는 저 볼륨 샤워헤드 |
| US12486574B2 (en) | 2019-08-23 | 2025-12-02 | Lam Research Corporation | Thermally controlled chandelier showerhead |
| US12203168B2 (en) | 2019-08-28 | 2025-01-21 | Lam Research Corporation | Metal deposition |
| KR20210048901A (ko) * | 2019-10-24 | 2021-05-04 | 피에스케이 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
| KR102334531B1 (ko) * | 2019-10-24 | 2021-12-06 | 피에스케이 주식회사 | 기판 처리 장치 및 기판 처리 방법 |
Also Published As
| Publication number | Publication date |
|---|---|
| EP1150330A3 (en) | 2004-12-29 |
| US6782843B2 (en) | 2004-08-31 |
| EP1770753A3 (en) | 2008-02-20 |
| US6635117B1 (en) | 2003-10-21 |
| DE60131695D1 (de) | 2008-01-17 |
| EP1150330A2 (en) | 2001-10-31 |
| DE60143717D1 (de) | 2011-02-03 |
| KR20010098812A (ko) | 2001-11-08 |
| US20030205328A1 (en) | 2003-11-06 |
| JP2002033311A (ja) | 2002-01-31 |
| JP4793528B2 (ja) | 2011-10-12 |
| DE60131695T2 (de) | 2008-11-13 |
| TW490705B (en) | 2002-06-11 |
| EP1770753A2 (en) | 2007-04-04 |
| EP1150330B1 (en) | 2007-12-05 |
| EP1770753B1 (en) | 2010-12-22 |
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