JP5626433B2 - 照明光学系、露光装置、光学素子およびその製造方法、並びにデバイス製造方法 - Google Patents
照明光学系、露光装置、光学素子およびその製造方法、並びにデバイス製造方法 Download PDFInfo
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- JP5626433B2 JP5626433B2 JP2013192079A JP2013192079A JP5626433B2 JP 5626433 B2 JP5626433 B2 JP 5626433B2 JP 2013192079 A JP2013192079 A JP 2013192079A JP 2013192079 A JP2013192079 A JP 2013192079A JP 5626433 B2 JP5626433 B2 JP 5626433B2
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/02—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the intensity of light
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
- G02B27/0927—Systems for changing the beam intensity distribution, e.g. Gaussian to top-hat
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/18—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical projection, e.g. combination of mirror and condenser and objective
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
- G03F7/70108—Off-axis setting using a light-guiding element, e.g. diffractive optical elements [DOEs] or light guides
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
- G03F7/70116—Off-axis setting using a programmable means, e.g. liquid crystal display [LCD], digital micromirror device [DMD] or pupil facets
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70141—Illumination system adjustment, e.g. adjustments during exposure or alignment during assembly of illumination system
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/7015—Details of optical elements
- G03F7/70158—Diffractive optical elements
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Microscoopes, Condenser (AREA)
Description
Claims (16)
- マスクに設けられたパターンを照明光で照明するために前記照明光の光路に配置されたオプティカルインテグレータと該オプティカルインテグレータの入射側における前記光路に配置された第1光学系とを備えた照明光学装置の製造方法であって、
前記第1光学系と異なる第2光学系を、前記第1光学系と交換することを含み、
前記第1光学系は、空間光変調器と回折光学素子との一方を備え、
前記第2光学系は、前記空間光変調器と前記回折光学素子との他方を備えていることを特徴とする製造方法。 - 請求項1に記載の製造方法において、
前記第2光学系を前記光路から退避させることと、
前記第1光学系を前記光路に挿入することと、
を含むことを特徴とする製造方法。 - 請求項1または2に記載の製造方法において、
前記第1光学系の前記空間光変調器または前記回折光学素子を、前記光路のうち前記照明光学装置の照明瞳に対して実質的に光学的な共役位置に配置することを含むことを特徴とする製造方法。 - 請求項1または2に記載の製造方法において、
前記第1光学系の前記空間光変調器または前記回折光学素子を、前記光路のうち前記オプティカルインテグレータの入射面に対して実質的にフーリエ変換の関係にある位置に配置することを含むことを特徴とする製造方法。 - 請求項1〜4のいずれか一項に記載の製造方法において、
前記空間光変調器は、前記光路に交差する平面に沿って配列されて前記光路内に配置される複数のミラー要素と、該複数のミラー要素の姿勢を個別に変更可能な駆動部と、を含み、
前記複数のミラー要素が前記光路に配置される位置は、前記回折光学素子が前記光路に配置される位置と異なることを特徴とする製造方法。 - 請求項5に記載の製造方法において、
前記複数のミラー要素が前記光路に配置される位置は、前記回折光学素子が前記光路に配置される位置に対して光学的に共役な位置であることを特徴とする製造方法。 - 請求項5または6に記載の製造方法において、
前記空間光変調器は、前記照明光を反射して、前記複数のミラー要素の姿勢に対応した光強度分布を前記照明光学装置の照明瞳に形成することを特徴とする製造方法。 - 請求項1〜7のいずれか一項に記載の製造方法において、
前記照明光学装置は、前記空間光変調器への前記照明光の入射角度を45度よりも小さな角度に設定するための反射ミラーを備えていることを特徴とする製造方法。 - 請求項1〜7のいずれか一項に記載の製造方法において、
前記照明光学装置は、前記光路を折り曲げるための反射ミラーを含み、
前記反射ミラーおよび前記空間光変調器は、前記反射ミラーと前記空間光変調器とからなる組に対して入射側の前記光路と射出側の前記光路とが平行になるように配置されていることを特徴とする製造方法。 - 請求項1〜9のいずれか一項に記載の製造方法において、
前記回折光学素子は、前記照明光を回折して前記照明光学装置の照明瞳に所定の光強度分布を形成することを特徴とする製造方法。 - 請求項1〜10のいずれか一項に記載の製造方法を用いて照明光学装置を製造することと、
前記照明光学装置を用いて、マスクに設けられたパターンを照明光で照明することと、
を含む照明方法。 - ステージにより基板を保持することと、
請求項11に記載の照明方法を用いて、マスクに設けられたパターンを照明光で照明することと、
前記ステージに保持された前記基板を、前記パターンを介した前記照明光により露光することと、
を含む露光方法。 - 請求項12に記載の露光方法において、
前記照明光により照明された前記パターンの像を、前記ステージに保持された前記基板上に投影光学系によって投影すること、
を含む露光方法。 - 請求項13に記載の露光方法において、
前記投影光学系と前記ステージに保持された前記基板との間に液体を設けることを含み、
前記パターンの像は前記液体を介して前記基板上に投影される露光方法。 - 請求項11に記載の照明方法を用いて、マスクに設けられたパターンを照明光で照明することと、
前記パターンを介した前記照明光で基板を露光することと、
前記照明光で露光された前記基板を現像することと、
を含むデバイス製造方法。 - 請求項15に記載のデバイス製造方法において、
前記基板上に液体を供給することを含み、
前記基板は、前記パターンを介した前記照明光により、前記液体を介して露光されるデバイス製造方法。
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|---|---|---|---|
| US96008507P | 2007-09-14 | 2007-09-14 | |
| US60/960,085 | 2007-09-14 | ||
| US7194908P | 2008-05-27 | 2008-05-27 | |
| US61/071,949 | 2008-05-27 | ||
| US12/191,821 US8451427B2 (en) | 2007-09-14 | 2008-08-14 | Illumination optical system, exposure apparatus, optical element and manufacturing method thereof, and device manufacturing method |
| US12/191,821 | 2008-08-14 |
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| JP2008226683A Division JP5428250B2 (ja) | 2007-09-14 | 2008-09-04 | 照明光学系、露光装置、光学素子およびその製造方法、並びにデバイス製造方法 |
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| JP2013251583A JP2013251583A (ja) | 2013-12-12 |
| JP5626433B2 true JP5626433B2 (ja) | 2014-11-19 |
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| JP2013192079A Expired - Fee Related JP5626433B2 (ja) | 2007-09-14 | 2013-09-17 | 照明光学系、露光装置、光学素子およびその製造方法、並びにデバイス製造方法 |
| JP2014186426A Pending JP2015046601A (ja) | 2007-09-14 | 2014-09-12 | 照明光学系、露光装置、光学素子およびその製造方法、並びにデバイス製造方法 |
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| US (3) | US8451427B2 (ja) |
| EP (3) | EP2188664B1 (ja) |
| JP (3) | JP5428250B2 (ja) |
| KR (1) | KR101614958B1 (ja) |
| CN (3) | CN102385258B (ja) |
| TW (2) | TWI556064B (ja) |
| WO (1) | WO2009035129A2 (ja) |
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| US9057963B2 (en) | 2015-06-16 |
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| EP2631699A1 (en) | 2013-08-28 |
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| EP2278380A1 (en) | 2011-01-26 |
| TW201439690A (zh) | 2014-10-16 |
| CN103488056A (zh) | 2014-01-01 |
| KR20100057084A (ko) | 2010-05-28 |
| EP2188664A2 (en) | 2010-05-26 |
| CN103488056B (zh) | 2015-11-25 |
| EP2188664B1 (en) | 2014-08-06 |
| US20130229639A1 (en) | 2013-09-05 |
| JP2015046601A (ja) | 2015-03-12 |
| EP2631699B1 (en) | 2016-11-09 |
| US9366970B2 (en) | 2016-06-14 |
| CN102385258B (zh) | 2015-07-01 |
| US8451427B2 (en) | 2013-05-28 |
| HK1191411A1 (zh) | 2014-07-25 |
| KR101614958B1 (ko) | 2016-04-22 |
| WO2009035129A2 (en) | 2009-03-19 |
| JP2013251583A (ja) | 2013-12-12 |
| WO2009035129A3 (en) | 2009-05-07 |
| EP2278380B1 (en) | 2012-05-30 |
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