JP2018150617A - 原子層堆積による多層耐プラズマ性コーティング - Google Patents
原子層堆積による多層耐プラズマ性コーティング Download PDFInfo
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- JP2018150617A JP2018150617A JP2018000888A JP2018000888A JP2018150617A JP 2018150617 A JP2018150617 A JP 2018150617A JP 2018000888 A JP2018000888 A JP 2018000888A JP 2018000888 A JP2018000888 A JP 2018000888A JP 2018150617 A JP2018150617 A JP 2018150617A
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- layer
- rare earth
- earth metal
- stress relaxation
- resistant coating
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- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32458—Vessel
- H01J37/32477—Vessel characterised by the means for protecting vessels or internal parts, e.g. coatings
- H01J37/32495—Means for protecting the vessel against plasma
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- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02225—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer
- H01L21/0226—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process
- H01L21/02263—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase
- H01L21/02271—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition
- H01L21/0228—Forming insulating materials on a substrate characterised by the process for the formation of the insulating layer formation by a deposition process deposition from the gas or vapour phase deposition by decomposition or reaction of gaseous or vapour phase compounds, i.e. chemical vapour deposition deposition by cyclic CVD, e.g. ALD, ALE, pulsed CVD
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- C23C16/04—Coating on selected surface areas, e.g. using masks
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- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
- Other Surface Treatments For Metallic Materials (AREA)
- Coating By Spraying Or Casting (AREA)
- Formation Of Insulating Films (AREA)
- Physical Vapour Deposition (AREA)
- Medical Preparation Storing Or Oral Administration Devices (AREA)
Abstract
Description
Claims (15)
- 物品であって、
約3:1〜約300:1のアスペクト比を有する部分と、
物品の前記部分の表面上の耐プラズマ性コーティングであって、耐プラズマ性コーティングは、
約10nm〜約1.5μmの厚さを有する応力緩和層と、
約10nm〜約1.5μmの厚さを有し、応力緩和層を覆っている希土類金属含有酸化物層とを含む耐プラズマ性コーティングとを含み、耐プラズマ性コーティングは、前記部分を均一に覆い、最高350℃の温度で割れ及び層間剥離に対して耐性があり、空孔が無い物品。 - 物品は、チャンバ壁、プラズマ生成ユニット、シャワーヘッド、ディフューザ、ノズル、ガス分配ハブアセンブリ、及びガスラインからなる群から選択されるチャンバコンポーネントである、請求項1記載の物品。
- 応力緩和層はアモルファスAl2O3を含み、応力緩和層は、物品からの不純物の拡散を防止するためのバリア層として作用する、請求項1記載の物品。
- 希土類金属含有酸化物層は、Y2O3、Y3Al5O12(YAG)、Er2O3、Er3Al5O12(EAG)、ZrO2、Gd2O3、Y2O3−ZrO2の固溶体、又はY4Al2O9とY2O3−ZrO2固溶体とを含むセラミックス化合物からなる群から選択された材料を含む、請求項1記載の物品。
- 希土類金属含有酸化物層は多結晶構造を有する、請求項1記載の物品。
- 希土類金属含有酸化物と第2の酸化物との交互層のスタックであって、
交互層のスタック内の第1の層は希土類金属含有酸化物層であり、
希土類金属含有酸化物層は、それぞれ約5〜100オングストロームの厚さを有し、
第2の酸化物の層は、それぞれ約1〜20オングストロームの厚さを有する交互層のスタックを含み、第2の酸化物の層は、希土類金属含有酸化物層内の結晶形成を防止する、請求項1記載の物品。 - 第2の酸化物の層は、応力緩和層と同じ材料組成を有し、
応力緩和層は、約10nm〜1.5μmの厚さを有し、
交互層のスタックは、約10nm〜1.5μmの合計厚さを有する、請求項6記載の物品。 - 原子層堆積プロセスを使用してチャンバコンポーネントの表面上に耐プラズマ性コーティングを堆積させるステップであって、
原子層堆積を用いて表面上に応力緩和層を約10nm〜約1.5μmの厚さまで堆積させるステップと、
原子層堆積を用いて応力緩和層上に希土類金属含有酸化物層を約10nm〜約1.5μmの厚さまで堆積させるステップとを含むステップを含み、
耐プラズマ性コーティングは、チャンバコンポーネントの表面を均一に覆い、最高350℃の温度で割れ及び層間剥離に対して耐性があり、空孔が無い方法。 - 応力緩和層を堆積させるステップは、アモルファス酸化アルミニウムを堆積させるステップを含む、請求項8記載の方法。
- 希土類金属含有酸化物層を堆積させるステップは、
チャンバコンポーネントを含む堆積チャンバ内にイットリウム含有前駆体を注入して、イットリウム含有前駆体を応力緩和層の表面上に吸着させて第1の半反応を形成させるステップと、
堆積チャンバ内に酸素含有反応物質を注入して、第2の半反応を形成するステップと、
目標厚さが達成されるまで堆積サイクルを1回以上繰り返すステップとを含む堆積サイクルを実行することによってイットリウム含有酸化物を堆積させるステップを含む、請求項8記載の方法。 - 希土類金属含有酸化物層を堆積させるステップは、
チャンバコンポーネントを含む堆積チャンバ内にイットリウム含有前駆体を注入して、イットリウム含有前駆体を応力緩和層の表面上に吸着させて第1の半反応を形成させるステップと、
堆積チャンバ内に酸素含有反応物質を注入して、第2の半反応及び第1の層を形成するステップと、
堆積チャンバ内に金属含有前駆体を注入して、金属含有前駆体を第1の層の表面上に吸着させて第3の半反応を形成するステップと、
堆積チャンバ内に酸素含有反応物質又は代替の酸素含有反応物質を注入して、第4の半反応を形成するステップと、
目標厚さが到達されるまで堆積サイクルを1回以上繰り返すステップとを含む堆積サイクルを実行することによって、イットリウム含有酸化物と1以上の追加の金属酸化物とを交互に堆積させて、単相又は多相イットリウム含有酸化物層を形成するステップを含む、請求項8記載の方法。 - 希土類金属含有酸化物層を堆積させるステップは、
イットリウム含有酸化物のための第1の前駆体と追加の金属酸化物のための第2の前駆体との混合物を、チャンバコンポーネントを含む堆積チャンバ内に同時注入して、第1の前駆体及び第2の前駆体を応力緩和層の表面上に吸着させて第1の半反応を形成するステップと、
堆積チャンバ内に酸素含有反応物質を注入して、第2の半反応を形成するステップと、
目標厚さが到達されるまで堆積サイクルを1回以上繰り返すステップとを含む堆積サイクルを実行することによって、イットリウム含有酸化物及び追加の金属酸化物を同時堆積させて、単相又は多相イットリウム含有酸化物層を形成するステップを含む、請求項8記載の方法。 - 追加の金属酸化物は、Er2O3、Al2O3、及びZrO2からなる群から選択される、請求項12記載の方法。
- 希土類金属含有酸化物層は、Y3Al5O12(YAG)、Y2O3−ZrO2の固溶体、及びY4Al2O9とY2O3−ZrO2固溶体とを含むセラミックス化合物からなる群から選択される、請求項8記載の方法。
- 原子層堆積(ALD)プロセスを使用してチャンバコンポーネントの表面上に耐プラズマ性コーティングを堆積させるステップであって、
ALDプロセスの複数のサイクルを使用して、約10nm〜約1.5μmの厚さまで前記表面上にアモルファス応力緩和層を堆積させるステップと、
希土類金属含有酸化物と第2の酸化物の交互層のスタックを約10nm〜約1.5μmの厚さまで堆積させるステップとを含み、希土類金属含有酸化物の層の各々は、約1〜30サイクルのALDプロセスを実行することによって形成され、第2の酸化物の層の各々は、1〜2サイクルのALDプロセスを実行することによって形成され、第2の酸化物の層は、希土類金属含有層酸化物の層内の結晶形成を防止する耐プラズマ性コーティングを堆積するステップを含む方法。
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