JP2014146840A5 - - Google Patents
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- JP2014146840A5 JP2014146840A5 JP2014085714A JP2014085714A JP2014146840A5 JP 2014146840 A5 JP2014146840 A5 JP 2014146840A5 JP 2014085714 A JP2014085714 A JP 2014085714A JP 2014085714 A JP2014085714 A JP 2014085714A JP 2014146840 A5 JP2014146840 A5 JP 2014146840A5
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- electrode
- free layer
- surface area
- tunnel barrier
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Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/423,298 | 2009-04-14 | ||
| US12/423,298 US8344433B2 (en) | 2009-04-14 | 2009-04-14 | Magnetic tunnel junction (MTJ) and methods, and magnetic random access memory (MRAM) employing same |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012506175A Division JP5584754B2 (ja) | 2009-04-14 | 2010-04-14 | 磁気トンネル接合(mtj)および方法、およびこれらを使用する磁気ランダムアクセスメモリ(mram) |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015042183A Division JP6196250B2 (ja) | 2009-04-14 | 2015-03-04 | 磁気トンネル接合(mtj)および方法、およびこれらを使用する磁気ランダムアクセスメモリ(mram) |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2014146840A JP2014146840A (ja) | 2014-08-14 |
| JP2014146840A5 true JP2014146840A5 (enExample) | 2014-09-25 |
| JP5710821B2 JP5710821B2 (ja) | 2015-04-30 |
Family
ID=42933702
Family Applications (3)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012506175A Expired - Fee Related JP5584754B2 (ja) | 2009-04-14 | 2010-04-14 | 磁気トンネル接合(mtj)および方法、およびこれらを使用する磁気ランダムアクセスメモリ(mram) |
| JP2014085714A Expired - Fee Related JP5710821B2 (ja) | 2009-04-14 | 2014-04-17 | 磁気トンネル接合(mtj)および方法、およびこれらを使用する磁気ランダムアクセスメモリ(mram) |
| JP2015042183A Expired - Fee Related JP6196250B2 (ja) | 2009-04-14 | 2015-03-04 | 磁気トンネル接合(mtj)および方法、およびこれらを使用する磁気ランダムアクセスメモリ(mram) |
Family Applications Before (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2012506175A Expired - Fee Related JP5584754B2 (ja) | 2009-04-14 | 2010-04-14 | 磁気トンネル接合(mtj)および方法、およびこれらを使用する磁気ランダムアクセスメモリ(mram) |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2015042183A Expired - Fee Related JP6196250B2 (ja) | 2009-04-14 | 2015-03-04 | 磁気トンネル接合(mtj)および方法、およびこれらを使用する磁気ランダムアクセスメモリ(mram) |
Country Status (9)
| Country | Link |
|---|---|
| US (2) | US8344433B2 (enExample) |
| EP (1) | EP2419933B1 (enExample) |
| JP (3) | JP5584754B2 (enExample) |
| KR (1) | KR101390940B1 (enExample) |
| CN (2) | CN107093449B (enExample) |
| BR (1) | BRPI1013772B1 (enExample) |
| ES (1) | ES2487627T3 (enExample) |
| TW (1) | TWI474472B (enExample) |
| WO (1) | WO2010120918A2 (enExample) |
Families Citing this family (33)
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| US8295082B2 (en) * | 2008-08-15 | 2012-10-23 | Qualcomm Incorporated | Gate level reconfigurable magnetic logic |
| JP2010212661A (ja) * | 2009-02-13 | 2010-09-24 | Fujitsu Ltd | 磁気ランダムアクセスメモリ |
| US8344433B2 (en) | 2009-04-14 | 2013-01-01 | Qualcomm Incorporated | Magnetic tunnel junction (MTJ) and methods, and magnetic random access memory (MRAM) employing same |
| US8450818B2 (en) | 2009-06-18 | 2013-05-28 | Dmitri E. Nikonov | Methods of forming spin torque devices and structures formed thereby |
| US8796794B2 (en) * | 2010-12-17 | 2014-08-05 | Intel Corporation | Write current reduction in spin transfer torque memory devices |
| KR101617113B1 (ko) * | 2011-12-20 | 2016-04-29 | 인텔 코포레이션 | 자기 메모리 소자 콘택의 크기 감소 및 중심 배치 방법 |
| US10192217B1 (en) | 2012-04-25 | 2019-01-29 | Wells Fargo Bank, N.A. | System and method for receipt tracking in a mobile wallet |
| US10235668B1 (en) | 2012-04-25 | 2019-03-19 | Wells Fargo Bank, N.A. | System and method for a mobile wallet |
| US9047964B2 (en) | 2012-08-20 | 2015-06-02 | Qualcomm Incorporated | Multi-level memory cell using multiple magnetic tunnel junctions with varying MGO thickness |
| US8982613B2 (en) | 2013-06-17 | 2015-03-17 | New York University | Scalable orthogonal spin transfer magnetic random access memory devices with reduced write error rates |
| WO2014209402A1 (en) * | 2013-06-29 | 2014-12-31 | Intel Corporation | Magnetic element for memory and logic |
| US9203017B2 (en) | 2013-08-02 | 2015-12-01 | Samsung Electronics Co., Ltd. | Method and system for providing magnetic junctions including a package structure usable in spin transfer torque memories |
| US9042060B2 (en) | 2013-09-25 | 2015-05-26 | HGST Netherlands B.V. | Magnetic head having a long throat height pinned layer with a short height hard bias layer |
| KR20150095187A (ko) * | 2014-02-11 | 2015-08-20 | 한양대학교 산학협력단 | 수직자기이방성을 갖는 mtj 구조 |
| WO2016007126A1 (en) | 2014-07-07 | 2016-01-14 | Intel Corporation | Spin-transfer torque memory (sttm) devices having magnetic contacts |
| US10026888B2 (en) * | 2014-08-06 | 2018-07-17 | Toshiba Memory Corporation | Magnetoresistive effect element and magnetic memory |
| KR102276541B1 (ko) * | 2014-11-27 | 2021-07-13 | 삼성전자주식회사 | 자기 메모리 장치 및 이의 제조 방법 |
| KR101705962B1 (ko) | 2015-01-19 | 2017-02-14 | 한양대학교 산학협력단 | 수직자기이방성을 갖는 mtj 구조 및 이를 포함하는 자성소자 |
| US9583170B2 (en) | 2015-02-12 | 2017-02-28 | Qualcomm Incorporated | Adjusting resistive memory write driver strength based on a mimic resistive memory write operation |
| US9813049B2 (en) * | 2015-08-12 | 2017-11-07 | Qualcomm Incorporated | Comparator including a magnetic tunnel junction (MTJ) device and a transistor |
| US9666792B2 (en) | 2015-08-12 | 2017-05-30 | Qualcomm Incorporated | Shadow-effect compensated fabrication of magnetic tunnel junction (MTJ) elements |
| CN106229004B (zh) * | 2016-07-11 | 2018-08-28 | 北京航空航天大学 | 一种光写入的非易失性磁存储器 |
| US9853205B1 (en) * | 2016-10-01 | 2017-12-26 | International Business Machines Corporation | Spin transfer torque magnetic tunnel junction with off-centered current flow |
| CN109952662B (zh) * | 2016-10-25 | 2023-04-18 | 三星电子株式会社 | 自旋器件及其操作方法和制造方法 |
| WO2018125634A1 (en) * | 2016-12-27 | 2018-07-05 | Everspin Technologies, Inc. | Data storage in synthetic antiferromagnets included in magnetic tunnel junctions |
| US9985199B1 (en) * | 2017-03-15 | 2018-05-29 | International Business Machines Corporation | Prevention of switching of spins in magnetic tunnel junctions by on-chip parasitic magnetic shield |
| JP7023637B2 (ja) | 2017-08-08 | 2022-02-22 | 株式会社日立ハイテク | 磁気トンネル接合素子の製造方法 |
| US10790016B2 (en) | 2018-03-02 | 2020-09-29 | Western Digital Technologies, Inc. | Probabilistic neuron circuits |
| US10200058B1 (en) | 2018-04-24 | 2019-02-05 | Sandisk Technologies Llc | Analog-to-digital conversion with magnetic tunnel junctions |
| US10732933B2 (en) | 2018-05-10 | 2020-08-04 | Sandisk Technologies Llc | Generating random bitstreams with magnetic tunnel junctions |
| CN113809117B (zh) * | 2020-06-16 | 2023-12-22 | 联华电子股份有限公司 | 半导体元件及其制作方法 |
| CN115497977B (zh) * | 2022-09-19 | 2025-10-03 | 长江存储科技有限责任公司 | 半导体结构及其制备方法、三维存储器、存储系统 |
| US20240130244A1 (en) * | 2022-10-13 | 2024-04-18 | International Business Machines Corporation | Chamfered mram device structure |
Family Cites Families (31)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2002170377A (ja) * | 2000-09-22 | 2002-06-14 | Mitsubishi Electric Corp | 薄膜磁性体記憶装置 |
| FR2817999B1 (fr) * | 2000-12-07 | 2003-01-10 | Commissariat Energie Atomique | Dispositif magnetique a polarisation de spin et a empilement(s) tri-couche(s) et memoire utilisant ce dispositif |
| JP3813914B2 (ja) * | 2002-09-27 | 2006-08-23 | Tdk株式会社 | 薄膜磁気ヘッド |
| JP3766380B2 (ja) * | 2002-12-25 | 2006-04-12 | 株式会社東芝 | 磁気ランダムアクセスメモリ及びその磁気ランダムアクセスメモリのデータ読み出し方法 |
| US7397071B2 (en) | 2003-03-31 | 2008-07-08 | Japan Science And Technology Agency | Tunnel transistor having spin-dependent transfer characteristics and non-volatile memory using the same |
| JP2005109263A (ja) * | 2003-09-30 | 2005-04-21 | Toshiba Corp | 磁性体素子及磁気メモリ |
| US6946697B2 (en) * | 2003-12-18 | 2005-09-20 | Freescale Semiconductor, Inc. | Synthetic antiferromagnet structures for use in MTJs in MRAM technology |
| JP4031451B2 (ja) * | 2004-03-18 | 2008-01-09 | 株式会社東芝 | 半導体集積回路装置 |
| WO2005101378A1 (en) * | 2004-04-02 | 2005-10-27 | Tdk Corporation | Composite free layer for stabilizing magnetoresistive head |
| US7449345B2 (en) | 2004-06-15 | 2008-11-11 | Headway Technologies, Inc. | Capping structure for enhancing dR/R of the MTJ device |
| JP2006049436A (ja) * | 2004-08-02 | 2006-02-16 | Sony Corp | 記憶素子及びメモリ |
| JP2006156685A (ja) * | 2004-11-29 | 2006-06-15 | Sony Corp | 記憶素子及びメモリ |
| US7241631B2 (en) | 2004-12-29 | 2007-07-10 | Grandis, Inc. | MTJ elements with high spin polarization layers configured for spin-transfer switching and spintronics devices using the magnetic elements |
| US7170775B2 (en) * | 2005-01-06 | 2007-01-30 | Taiwan Semiconductor Manufacturing Company, Ltd. | MRAM cell with reduced write current |
| US7173848B2 (en) * | 2005-02-01 | 2007-02-06 | Meglabs, Inc. | Magnetic random access memory with memory cell stacks having more than two magnetic states |
| US7777261B2 (en) | 2005-09-20 | 2010-08-17 | Grandis Inc. | Magnetic device having stabilized free ferromagnetic layer |
| WO2007040189A1 (ja) * | 2005-10-03 | 2007-04-12 | Nec Corporation | 磁気ランダムアクセスメモリ及びその動作方法 |
| JP2007273493A (ja) * | 2006-03-30 | 2007-10-18 | Fujitsu Ltd | 磁気メモリ装置及びその製造方法 |
| JP5076361B2 (ja) * | 2006-05-18 | 2012-11-21 | 株式会社日立製作所 | 半導体装置 |
| JP2008098523A (ja) * | 2006-10-13 | 2008-04-24 | Toshiba Corp | 磁気抵抗効果素子および磁気メモリ |
| JP4384183B2 (ja) * | 2007-01-26 | 2009-12-16 | 株式会社東芝 | 磁気抵抗素子および磁気メモリ |
| JP2008192916A (ja) * | 2007-02-06 | 2008-08-21 | Toshiba Corp | 磁気ランダムアクセスメモリ及びその書き込み方法 |
| JP2008198311A (ja) * | 2007-02-15 | 2008-08-28 | Renesas Technology Corp | 磁気記憶集積回路装置 |
| JP2008218829A (ja) * | 2007-03-06 | 2008-09-18 | Toshiba Corp | 磁気抵抗素子及びその製造方法 |
| US7573736B2 (en) * | 2007-05-22 | 2009-08-11 | Taiwan Semiconductor Manufacturing Company | Spin torque transfer MRAM device |
| JP2009081315A (ja) | 2007-09-26 | 2009-04-16 | Toshiba Corp | 磁気抵抗素子及び磁気メモリ |
| JP2009094104A (ja) * | 2007-10-03 | 2009-04-30 | Toshiba Corp | 磁気抵抗素子 |
| US8004881B2 (en) * | 2007-12-19 | 2011-08-23 | Qualcomm Incorporated | Magnetic tunnel junction device with separate read and write paths |
| US7948044B2 (en) | 2008-04-09 | 2011-05-24 | Magic Technologies, Inc. | Low switching current MTJ element for ultra-high STT-RAM and a method for making the same |
| JP2010225783A (ja) | 2009-03-23 | 2010-10-07 | Toshiba Corp | 半導体記憶装置 |
| US8344433B2 (en) | 2009-04-14 | 2013-01-01 | Qualcomm Incorporated | Magnetic tunnel junction (MTJ) and methods, and magnetic random access memory (MRAM) employing same |
-
2009
- 2009-04-14 US US12/423,298 patent/US8344433B2/en active Active
-
2010
- 2010-04-14 BR BRPI1013772-6A patent/BRPI1013772B1/pt active IP Right Grant
- 2010-04-14 CN CN201610957985.6A patent/CN107093449B/zh active Active
- 2010-04-14 ES ES10765114.3T patent/ES2487627T3/es active Active
- 2010-04-14 TW TW99111863A patent/TWI474472B/zh active
- 2010-04-14 EP EP10765114.3A patent/EP2419933B1/en active Active
- 2010-04-14 JP JP2012506175A patent/JP5584754B2/ja not_active Expired - Fee Related
- 2010-04-14 CN CN201080016318.9A patent/CN102388454B/zh active Active
- 2010-04-14 KR KR1020117027104A patent/KR101390940B1/ko active Active
- 2010-04-14 WO PCT/US2010/031080 patent/WO2010120918A2/en not_active Ceased
-
2012
- 2012-11-21 US US13/683,783 patent/US8889431B2/en active Active
-
2014
- 2014-04-17 JP JP2014085714A patent/JP5710821B2/ja not_active Expired - Fee Related
-
2015
- 2015-03-04 JP JP2015042183A patent/JP6196250B2/ja not_active Expired - Fee Related
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