JP2012519867A - パネルテストのためのプローブユニット - Google Patents

パネルテストのためのプローブユニット Download PDF

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Publication number
JP2012519867A
JP2012519867A JP2011553939A JP2011553939A JP2012519867A JP 2012519867 A JP2012519867 A JP 2012519867A JP 2011553939 A JP2011553939 A JP 2011553939A JP 2011553939 A JP2011553939 A JP 2011553939A JP 2012519867 A JP2012519867 A JP 2012519867A
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JP
Japan
Prior art keywords
panel
tab
lead wire
probe
block
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2011553939A
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English (en)
Japanese (ja)
Inventor
イ・ビン・イム
ナン・ジュン・ホ
ジュン・シュ・ジョ
Original Assignee
プロ−２０００・カンパニー・リミテッド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Family has litigation
First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=42645952&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=JP2012519867(A) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by プロ−２０００・カンパニー・リミテッド filed Critical プロ−２０００・カンパニー・リミテッド
Publication of JP2012519867A publication Critical patent/JP2012519867A/ja
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2855—Environmental, reliability or burn-in testing
    • G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
    • G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Toxicology (AREA)
  • Health & Medical Sciences (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
JP2011553939A 2009-03-10 2010-03-05 パネルテストのためのプローブユニット Pending JP2012519867A (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
KR20090020494 2009-03-10
KR10-2009-0020494 2009-03-10
KR10-2009-0097521 2009-10-14
KR1020090097521A KR100972049B1 (ko) 2009-03-10 2009-10-14 패널 테스트를 위한 프로브 유닛
PCT/KR2010/001399 WO2010104289A2 (en) 2009-03-10 2010-03-05 Probe unit for testing panel

Publications (1)

Publication Number Publication Date
JP2012519867A true JP2012519867A (ja) 2012-08-30

Family

ID=42645952

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2011553939A Pending JP2012519867A (ja) 2009-03-10 2010-03-05 パネルテストのためのプローブユニット
JP2011553943A Expired - Fee Related JP5746060B2 (ja) 2009-03-10 2010-03-08 パネルテストのためのプローブユニット

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2011553943A Expired - Fee Related JP5746060B2 (ja) 2009-03-10 2010-03-08 パネルテストのためのプローブユニット

Country Status (5)

Country Link
JP (2) JP2012519867A (zh)
KR (1) KR100972049B1 (zh)
CN (2) CN102348990A (zh)
TW (2) TWI482972B (zh)
WO (2) WO2010104289A2 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101970782B1 (ko) * 2018-07-13 2019-04-19 주식회사 케이피에스 유기 발광 다이오드 패널 검사용 프로브 장치

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100972049B1 (ko) * 2009-03-10 2010-07-22 주식회사 프로이천 패널 테스트를 위한 프로브 유닛
KR101039338B1 (ko) 2010-01-25 2011-06-08 주식회사 코디에스 극 미세피치 검사용 프로브유닛
KR101020624B1 (ko) 2010-07-20 2011-03-09 주식회사 코디에스 가압부재를 구비한 프로브 유닛의 제조방법
KR101043818B1 (ko) * 2010-08-18 2011-06-22 주식회사 프로이천 액정패널 테스트를 위한 프로브 유닛
KR101020625B1 (ko) 2010-10-07 2011-03-09 주식회사 코디에스 필름타입 프로브유닛 및 그의 제조방법
KR101039336B1 (ko) 2010-10-08 2011-06-08 주식회사 코디에스 필름타입 프로브유닛
KR101158762B1 (ko) 2010-10-19 2012-06-22 주식회사 코디에스 필름타입 프로브유닛 및 그의 제조방법
KR101177514B1 (ko) 2010-11-26 2012-08-27 주식회사 코디에스 Ｃｏｇ패널 검사용 프로브유닛
KR101063184B1 (ko) 2010-11-26 2011-09-07 주식회사 코디에스 Ｃｏｇ패널 검사용 프로브유닛
KR101057594B1 (ko) 2010-11-26 2011-08-18 주식회사 코디에스 Ｆｐｄ 검사용 프로브유닛
KR101242372B1 (ko) 2012-08-28 2013-03-25 (주)메리테크 패널 테스트용 글라스 범프 타입 프로브 블록
CN109283368A (zh) * 2018-10-29 2019-01-29 大族激光科技产业集团股份有限公司 柔性显示面板测试装置
KR102098653B1 (ko) * 2019-09-19 2020-04-10 주식회사 프로이천 프로브 블록
JP7217293B2 (ja) 2019-12-18 2023-02-02 株式会社アドバンテスト １または複数の被テストデバイスをテストするための自動テスト装置、および、自動テスト装置を操作するための方法
TWI797552B (zh) * 2020-02-06 2023-04-01 日商愛德萬測試股份有限公司 用於測試一或多個受測裝置之自動測試設備及用於操作自動測試設備的方法

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02108974A (ja) * 1988-10-18 1990-04-20 Nippon Maikuronikusu:Kk 基板用プローブ
JPH04184264A (ja) * 1990-11-20 1992-07-01 Nippon Maikuronikusu:Kk 表示パネル用プローバ
JPH04297876A (ja) * 1991-03-27 1992-10-21 Nippon Maikuronikusu:Kk 表示パネル用プローバ
JPH06347483A (ja) * 1993-06-04 1994-12-22 Tokyo Kasoode Kenkyusho:Kk 多ピン接触子およびその製造方法
JPH07312254A (ja) * 1994-05-17 1995-11-28 Nitto Seiko Co Ltd 導通接触端子
JPH09166622A (ja) * 1995-12-14 1997-06-24 Nippon Maikuronikusu:Kk プローブユニット
JP2000214184A (ja) * 1999-01-26 2000-08-04 Micronics Japan Co Ltd プロ―ブ装置
JP2007003207A (ja) * 2005-06-21 2007-01-11 Yamaha Corp プローブユニット及びその製造方法
JP2007139712A (ja) * 2005-11-22 2007-06-07 Nhk Spring Co Ltd プローブホルダおよびプローブユニット
JP2007278799A (ja) * 2006-04-05 2007-10-25 Tokyo Cathode Laboratory Co Ltd マイクロプローブガイドの製造方法、マイクロプローブガイドを用いるマイクロプローブユニット及び千鳥配置型マイクロプローブユニット

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH09127542A (ja) * 1995-10-27 1997-05-16 Nec Corp 液晶表示装置及びその検査方法
KR100212276B1 (ko) * 1996-06-13 1999-08-02 윤종용 정전기 방전 수단을 가지는 액정 패널, 액정 패널검사용 프루브장치 및 검사방법
JPH10221371A (ja) * 1997-02-07 1998-08-21 Mitsubishi Materials Corp コンタクトプローブおよびその製造方法と前記コンタクトプローブを備えたプローブ装置
JPH10221137A (ja) * 1997-02-10 1998-08-21 Tokimec Inc 極低温用超音波流量計プローブ取付治具
JPH1164382A (ja) * 1997-08-12 1999-03-05 Mitsubishi Materials Corp プローブヘッド
JP3035275B2 (ja) * 1997-10-13 2000-04-24 松下電器産業株式会社 集積回路素子のプローブ装置
JP2006284362A (ja) * 2005-03-31 2006-10-19 Nhk Spring Co Ltd コンタクトプローブ
KR100720378B1 (ko) * 2005-04-13 2007-05-22 주식회사 코디에스 액정 디스플레이 패널 검사용 프로브 유니트
KR100972049B1 (ko) * 2009-03-10 2010-07-22 주식회사 프로이천 패널 테스트를 위한 프로브 유닛

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02108974A (ja) * 1988-10-18 1990-04-20 Nippon Maikuronikusu:Kk 基板用プローブ
JPH04184264A (ja) * 1990-11-20 1992-07-01 Nippon Maikuronikusu:Kk 表示パネル用プローバ
JPH04297876A (ja) * 1991-03-27 1992-10-21 Nippon Maikuronikusu:Kk 表示パネル用プローバ
JPH06347483A (ja) * 1993-06-04 1994-12-22 Tokyo Kasoode Kenkyusho:Kk 多ピン接触子およびその製造方法
JPH07312254A (ja) * 1994-05-17 1995-11-28 Nitto Seiko Co Ltd 導通接触端子
JPH09166622A (ja) * 1995-12-14 1997-06-24 Nippon Maikuronikusu:Kk プローブユニット
JP2000214184A (ja) * 1999-01-26 2000-08-04 Micronics Japan Co Ltd プロ―ブ装置
JP2007003207A (ja) * 2005-06-21 2007-01-11 Yamaha Corp プローブユニット及びその製造方法
JP2007139712A (ja) * 2005-11-22 2007-06-07 Nhk Spring Co Ltd プローブホルダおよびプローブユニット
JP2007278799A (ja) * 2006-04-05 2007-10-25 Tokyo Cathode Laboratory Co Ltd マイクロプローブガイドの製造方法、マイクロプローブガイドを用いるマイクロプローブユニット及び千鳥配置型マイクロプローブユニット

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101970782B1 (ko) * 2018-07-13 2019-04-19 주식회사 케이피에스 유기 발광 다이오드 패널 검사용 프로브 장치

Also Published As

Publication number Publication date
TWI482972B (zh) 2015-05-01
WO2010104289A2 (en) 2010-09-16
JP5746060B2 (ja) 2015-07-08
WO2010104289A3 (en) 2011-01-06
CN102348991B (zh) 2014-05-07
WO2010104303A3 (en) 2011-01-06
CN102348991A (zh) 2012-02-08
JP2012519868A (ja) 2012-08-30
KR100972049B1 (ko) 2010-07-22
TW201037321A (en) 2010-10-16
WO2010104303A2 (en) 2010-09-16
TW201100810A (en) 2011-01-01
CN102348990A (zh) 2012-02-08

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