WO2010104303A3 - Probe unit for testing panel - Google Patents
Probe unit for testing panel Download PDFInfo
- Publication number
- WO2010104303A3 WO2010104303A3 PCT/KR2010/001438 KR2010001438W WO2010104303A3 WO 2010104303 A3 WO2010104303 A3 WO 2010104303A3 KR 2010001438 W KR2010001438 W KR 2010001438W WO 2010104303 A3 WO2010104303 A3 WO 2010104303A3
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- panel
- tab
- probe unit
- fpcb
- testing panel
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06772—High frequency probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2879—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to electrical aspects, e.g. to voltage or current supply or stimuli or to electrical loads
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
-
- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Toxicology (AREA)
- Health & Medical Sciences (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Liquid Crystal (AREA)
- Devices For Indicating Variable Information By Combining Individual Elements (AREA)
- Coupling Device And Connection With Printed Circuit (AREA)
Abstract
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201080011466.1A CN102348991B (en) | 2009-03-10 | 2010-03-08 | Probe unit for testing panel |
JP2011553943A JP5746060B2 (en) | 2009-03-10 | 2010-03-08 | Probe unit for panel testing |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR20090020494 | 2009-03-10 | ||
KR10-2009-0020494 | 2009-03-10 | ||
KR1020090097521A KR100972049B1 (en) | 2009-03-10 | 2009-10-14 | Probe unit for testing panel |
KR10-2009-0097521 | 2009-10-14 |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2010104303A2 WO2010104303A2 (en) | 2010-09-16 |
WO2010104303A3 true WO2010104303A3 (en) | 2011-01-06 |
Family
ID=42645952
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2010/001399 WO2010104289A2 (en) | 2009-03-10 | 2010-03-05 | Probe unit for testing panel |
PCT/KR2010/001438 WO2010104303A2 (en) | 2009-03-10 | 2010-03-08 | Probe unit for testing panel |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/KR2010/001399 WO2010104289A2 (en) | 2009-03-10 | 2010-03-05 | Probe unit for testing panel |
Country Status (5)
Country | Link |
---|---|
JP (2) | JP2012519867A (en) |
KR (1) | KR100972049B1 (en) |
CN (2) | CN102348990A (en) |
TW (2) | TWI482972B (en) |
WO (2) | WO2010104289A2 (en) |
Families Citing this family (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100972049B1 (en) * | 2009-03-10 | 2010-07-22 | 주식회사 프로이천 | Probe unit for testing panel |
KR101039338B1 (en) | 2010-01-25 | 2011-06-08 | 주식회사 코디에스 | Probe unit testing micro pitch array |
KR101020624B1 (en) | 2010-07-20 | 2011-03-09 | 주식회사 코디에스 | Menufacturing method of probe unit having pressure member |
KR101043818B1 (en) * | 2010-08-18 | 2011-06-22 | 주식회사 프로이천 | Probe unit for testing lcd panel |
KR101020625B1 (en) | 2010-10-07 | 2011-03-09 | 주식회사 코디에스 | Film type probe unit and manufacturing method of the same |
KR101039336B1 (en) | 2010-10-08 | 2011-06-08 | 주식회사 코디에스 | Film type probe unit |
KR101158762B1 (en) | 2010-10-19 | 2012-06-22 | 주식회사 코디에스 | Film type probe unit and manufacturing method of the same |
KR101177514B1 (en) | 2010-11-26 | 2012-08-27 | 주식회사 코디에스 | Probe unit for testing chip on glass panel |
KR101063184B1 (en) | 2010-11-26 | 2011-09-07 | 주식회사 코디에스 | Probe unit for testing chip on glass panel |
KR101057594B1 (en) | 2010-11-26 | 2011-08-18 | 주식회사 코디에스 | Probe unit for testing flat panel display |
KR101242372B1 (en) | 2012-08-28 | 2013-03-25 | (주)메리테크 | Bump-type probe, glass block panels for testing |
KR101970782B1 (en) * | 2018-07-13 | 2019-04-19 | 주식회사 케이피에스 | Probing apparatus for testing of organic light-emitting display panel |
CN109283368A (en) * | 2018-10-29 | 2019-01-29 | 大族激光科技产业集团股份有限公司 | Flexible display panels test device |
KR102098653B1 (en) * | 2019-09-19 | 2020-04-10 | 주식회사 프로이천 | Probe block |
DE112020000048T5 (en) | 2019-12-18 | 2022-06-02 | Advantest Corporation | AUTOMATED TEST EQUIPMENT FOR TESTING ONE OR MORE TEST OBJECTS AND METHOD OF OPERATING AN AUTOMATED TEST EQUIPMENT |
TWI797552B (en) * | 2020-02-06 | 2023-04-01 | 日商愛德萬測試股份有限公司 | Automated test equipment for testing one or more devices-under-test and method for operating an automated test equipment |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09127542A (en) * | 1995-10-27 | 1997-05-16 | Nec Corp | Liquid crystal display device and its inspecting method |
JPH10221371A (en) * | 1997-02-07 | 1998-08-21 | Mitsubishi Materials Corp | Contact probe and its manufacture and probe apparatus having the contact probe |
JPH1164382A (en) * | 1997-08-12 | 1999-03-05 | Mitsubishi Materials Corp | Probe head |
KR100212276B1 (en) * | 1996-06-13 | 1999-08-02 | 윤종용 | Electrostatic protected lcd panel, probing apparatus and monitoring method |
KR100314874B1 (en) * | 1999-01-26 | 2001-11-23 | 가부시키가이샤 니혼 마이크로닉스 | Probing apparatus |
KR100720378B1 (en) * | 2005-04-13 | 2007-05-22 | 주식회사 코디에스 | Probe unit for inspecting liquid crytal display panel |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2707119B2 (en) * | 1988-10-18 | 1998-01-28 | 株式会社日本マイクロニクス | Probe for board |
JP3076600B2 (en) * | 1990-11-20 | 2000-08-14 | 株式会社日本マイクロニクス | Display panel prober |
JP3187855B2 (en) * | 1991-03-27 | 2001-07-16 | 株式会社日本マイクロニクス | Display panel prober |
JP2617080B2 (en) * | 1993-06-04 | 1997-06-04 | 株式会社東京カソード研究所 | Multi-pin contact and manufacturing method thereof |
JP2668653B2 (en) * | 1994-05-17 | 1997-10-27 | 日東精工株式会社 | Conductive contact terminal |
JP3602630B2 (en) * | 1995-12-14 | 2004-12-15 | 株式会社日本マイクロニクス | Probe unit |
JPH10221137A (en) * | 1997-02-10 | 1998-08-21 | Tokimec Inc | Jig for fitting probe of cryogenic ultrasonic flowmeter |
JP3035275B2 (en) * | 1997-10-13 | 2000-04-24 | 松下電器産業株式会社 | Probe device for integrated circuit devices |
JP2006284362A (en) * | 2005-03-31 | 2006-10-19 | Nhk Spring Co Ltd | Contact probe |
JP2007003207A (en) * | 2005-06-21 | 2007-01-11 | Yamaha Corp | Probe unit and its manufacturing method |
JP2007139712A (en) * | 2005-11-22 | 2007-06-07 | Nhk Spring Co Ltd | Probe holder and probe unit |
JP4789686B2 (en) * | 2006-04-05 | 2011-10-12 | 株式会社ユニオンアロー・テクノロジー | Microprobe unit using microprobe guide and staggered microprobe unit |
KR100972049B1 (en) * | 2009-03-10 | 2010-07-22 | 주식회사 프로이천 | Probe unit for testing panel |
-
2009
- 2009-10-14 KR KR1020090097521A patent/KR100972049B1/en active IP Right Review Request
-
2010
- 2010-03-05 TW TW099106532A patent/TWI482972B/en not_active IP Right Cessation
- 2010-03-05 JP JP2011553939A patent/JP2012519867A/en active Pending
- 2010-03-05 WO PCT/KR2010/001399 patent/WO2010104289A2/en active Application Filing
- 2010-03-05 CN CN2010800114318A patent/CN102348990A/en active Pending
- 2010-03-05 TW TW99106531A patent/TW201100810A/en unknown
- 2010-03-08 JP JP2011553943A patent/JP5746060B2/en not_active Expired - Fee Related
- 2010-03-08 CN CN201080011466.1A patent/CN102348991B/en active Active
- 2010-03-08 WO PCT/KR2010/001438 patent/WO2010104303A2/en active Application Filing
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09127542A (en) * | 1995-10-27 | 1997-05-16 | Nec Corp | Liquid crystal display device and its inspecting method |
KR100212276B1 (en) * | 1996-06-13 | 1999-08-02 | 윤종용 | Electrostatic protected lcd panel, probing apparatus and monitoring method |
JPH10221371A (en) * | 1997-02-07 | 1998-08-21 | Mitsubishi Materials Corp | Contact probe and its manufacture and probe apparatus having the contact probe |
JPH1164382A (en) * | 1997-08-12 | 1999-03-05 | Mitsubishi Materials Corp | Probe head |
KR100314874B1 (en) * | 1999-01-26 | 2001-11-23 | 가부시키가이샤 니혼 마이크로닉스 | Probing apparatus |
KR100720378B1 (en) * | 2005-04-13 | 2007-05-22 | 주식회사 코디에스 | Probe unit for inspecting liquid crytal display panel |
Also Published As
Publication number | Publication date |
---|---|
WO2010104303A2 (en) | 2010-09-16 |
TW201100810A (en) | 2011-01-01 |
JP5746060B2 (en) | 2015-07-08 |
JP2012519867A (en) | 2012-08-30 |
WO2010104289A2 (en) | 2010-09-16 |
CN102348990A (en) | 2012-02-08 |
TW201037321A (en) | 2010-10-16 |
TWI482972B (en) | 2015-05-01 |
JP2012519868A (en) | 2012-08-30 |
CN102348991B (en) | 2014-05-07 |
CN102348991A (en) | 2012-02-08 |
KR100972049B1 (en) | 2010-07-22 |
WO2010104289A3 (en) | 2011-01-06 |
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