WO2012023792A3 - Probe unit for testing lcd panel - Google Patents

Probe unit for testing lcd panel Download PDF

Info

Publication number
WO2012023792A3
WO2012023792A3 PCT/KR2011/006027 KR2011006027W WO2012023792A3 WO 2012023792 A3 WO2012023792 A3 WO 2012023792A3 KR 2011006027 W KR2011006027 W KR 2011006027W WO 2012023792 A3 WO2012023792 A3 WO 2012023792A3
Authority
WO
WIPO (PCT)
Prior art keywords
tab
film
probe unit
liquid crystal
crystal panel
Prior art date
Application number
PCT/KR2011/006027
Other languages
French (fr)
Other versions
WO2012023792A2 (en
Inventor
Yi Bin Ihm
Nam Jung Her
Jun Soo Cho
Jong Hyun Park
Original Assignee
Pro-2000 Co. Ltd.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pro-2000 Co. Ltd. filed Critical Pro-2000 Co. Ltd.
Priority to CN2011800397701A priority Critical patent/CN103069281A/en
Publication of WO2012023792A2 publication Critical patent/WO2012023792A2/en
Publication of WO2012023792A3 publication Critical patent/WO2012023792A3/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R3/00—Apparatus or processes specially adapted for the manufacture or maintenance of measuring instruments, e.g. of probe tips
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/05—Flexible printed circuits [FPCs]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Liquid Crystal (AREA)
  • Devices For Indicating Variable Information By Combining Individual Elements (AREA)
  • Wire Bonding (AREA)

Abstract

A probe unit is provided. The probe unit for testing a liquid crystal panel includes a body block configured to have a bottom surface to which a tab IC film for use in the liquid crystal panel is attached while one end of the tab IC film is folded, and allow metal lines formed on the tab IC film to be in one-to-one contact with electrode lines formed on the liquid crystal panel; and a flexible printed circuit board configured to be electrically connected to the other end of the tab IC film and provide a test signal to the liquid crystal panel through the tab IC film.
PCT/KR2011/006027 2010-08-18 2011-08-17 Probe unit for testing lcd panel WO2012023792A2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2011800397701A CN103069281A (en) 2010-08-18 2011-08-17 Probe unit for testing LCD panel

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR10-2010-0080004 2010-08-18
KR1020100080004A KR101043818B1 (en) 2010-08-18 2010-08-18 Probe unit for testing lcd panel

Publications (2)

Publication Number Publication Date
WO2012023792A2 WO2012023792A2 (en) 2012-02-23
WO2012023792A3 true WO2012023792A3 (en) 2012-04-12

Family

ID=44405992

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2011/006027 WO2012023792A2 (en) 2010-08-18 2011-08-17 Probe unit for testing lcd panel

Country Status (4)

Country Link
KR (1) KR101043818B1 (en)
CN (1) CN103069281A (en)
TW (1) TW201219792A (en)
WO (1) WO2012023792A2 (en)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101241804B1 (en) 2011-01-21 2013-03-15 주식회사 프로이천 probe block
KR101846010B1 (en) * 2011-07-04 2018-04-05 폭스브레인 주식회사 Manufacturing method of a probe unit for a image display pannel and probe unit manufacturered by the method
KR101830606B1 (en) * 2011-07-05 2018-04-05 엘지디스플레이 주식회사 Auto-probe block of shorting bar type auto-probe apparatus
KR101257250B1 (en) 2012-04-03 2013-05-02 주식회사 마이크로이즈 Connector module for display panel inspection and manufacturing method of the same
KR101255111B1 (en) 2012-10-25 2013-04-19 주식회사 프로이천 Probe block and apparatus for testing panel having the same
KR101255113B1 (en) 2012-10-31 2013-04-19 주식회사 프로이천 Method of manufacturing probe block having an absorber
KR101285166B1 (en) 2013-01-30 2013-07-17 주식회사 프로이천 Film type pin board
KR101258512B1 (en) 2013-03-25 2013-04-30 주식회사 프로이천 Film for testing lcd panel, test device for testing lcd panel and method for manufacturing test device for testing lcd panel
KR20160012764A (en) * 2014-07-25 2016-02-03 주식회사 코디에스 Device and method for testing display panel
TWI575280B (en) * 2016-06-14 2017-03-21 豪威科技股份有限公司 Lc testing platform and the method for the same
KR101744754B1 (en) * 2016-10-12 2017-06-12 주식회사 프로이천 Probe apparatus
KR101835762B1 (en) * 2017-09-29 2018-03-07 (주)위드멤스 Contact film preventing short circuit due to overcurrent and method for manufacturing the same
KR101970782B1 (en) * 2018-07-13 2019-04-19 주식회사 케이피에스 Probing apparatus for testing of organic light-emitting display panel
CN109283368A (en) * 2018-10-29 2019-01-29 大族激光科技产业集团股份有限公司 Flexible display panels test device
KR102193528B1 (en) * 2019-04-17 2020-12-23 주식회사 아이에스시 Test connector applicable at extremely low temperature

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10206464A (en) * 1997-01-24 1998-08-07 Mitsubishi Materials Corp Probe apparatus
KR20060089968A (en) * 2005-02-03 2006-08-10 주식회사 코디에스 Probe unit for inspecting liquid crytal display panel
KR20060108426A (en) * 2005-04-13 2006-10-18 주식회사 코디에스 Probe unit for inspecting liquid crytal display panel
KR20070051245A (en) * 2005-11-14 2007-05-17 주식회사 리뷰텍 Probe unit for liquid crystal display inspection equipments
KR20070051246A (en) * 2005-11-14 2007-05-17 주식회사 리뷰텍 Probe unit for liquid crystal display inspection equipments
KR100972049B1 (en) * 2009-03-10 2010-07-22 주식회사 프로이천 Probe unit for testing panel

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2676206Y (en) * 2003-12-09 2005-02-02 环国科技股份有限公司 Test film probe for display panel

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH10206464A (en) * 1997-01-24 1998-08-07 Mitsubishi Materials Corp Probe apparatus
KR20060089968A (en) * 2005-02-03 2006-08-10 주식회사 코디에스 Probe unit for inspecting liquid crytal display panel
KR20060108426A (en) * 2005-04-13 2006-10-18 주식회사 코디에스 Probe unit for inspecting liquid crytal display panel
KR20070051245A (en) * 2005-11-14 2007-05-17 주식회사 리뷰텍 Probe unit for liquid crystal display inspection equipments
KR20070051246A (en) * 2005-11-14 2007-05-17 주식회사 리뷰텍 Probe unit for liquid crystal display inspection equipments
KR100972049B1 (en) * 2009-03-10 2010-07-22 주식회사 프로이천 Probe unit for testing panel

Also Published As

Publication number Publication date
TW201219792A (en) 2012-05-16
CN103069281A (en) 2013-04-24
KR101043818B1 (en) 2011-06-22
WO2012023792A2 (en) 2012-02-23

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