TWI575280B - Lc testing platform and the method for the same - Google Patents

Description

Platform and method for liquid crystal panel testing

The present invention relates generally to the field of liquid crystal panel test platforms, and more particularly to smart contact judging devices for liquid crystal panel test platforms.

With the development of display technology, liquid crystal panels have replaced CRT monitors, becoming the mainstream of modern social display devices, and also one of the indispensable devices for every home or company. Liquid crystal panels are beginning to be mass-produced, and liquid crystal panels of different sizes, types, or ultra-high resolutions are correspondingly produced. In general, a liquid crystal panel can be classified into a thin film transistor liquid crystal or a germanium based liquid crystal by a reflective or transmissive type.

矽-based liquid crystal, also known as liquid crystal on silicon (LCOS), has a structure similar to that of thin film transistor liquid crystal (TFT-LCD). TFT-LCD is filled with liquid crystal in the upper and lower glass substrates, while LCOS is A driving circuit formed in a CMOS process is used as the underlying substrate.

The difference between the 矽-based liquid crystal (LCOS) and the conventional liquid crystal panel (transmissive) is that the 矽-based liquid crystal underlying electrode is replaced by a transparent mirror (Indium Tin Oxide, ITO) with a metal mirror, and the single crystal Complementary metal oxide semiconductor (CMOS) is fabricated in a wafer, and the biggest difference from a typical liquid crystal panel structure is the application of reflected light.

The reflective design is that the incident light reaches the reflective electrode of the pixel and is folded back. The transistor and other lines under the electrode do not interfere with the incident light or the reflected light, so the light utilization efficiency of the panel can be greatly improved. On the other hand, the 矽-based liquid crystal is used. The integration of tiny circuits can improve drive efficiency and reliability, and can be mass-produced in large integrated circuit factories, helping to reduce costs. In summary, the low cost and high resolution of germanium-based liquid crystals are the most attractive advantages of such reflective germanium-based liquid crystals in the liquid crystal panel industry.

For 矽-based liquid crystal products, generally, the functionality or image can be detected. For functional detection, the correctness of the internal circuit of LCOS can be tested under a test environment or detection technology. For example, open circuit Test of voltage and current such as (Open), Short and Leakage, or functional test of internal memory; for image detection, the defects of the product inspection may be checked under the detection technology or the detection environment. For example, surface and internal contamination confirmation, as well as product projection work Can test.

In order to test the 矽-based liquid crystal products, a test platform is often used. This product platform includes two parts: functional test and image test. Generally, in a pedestal, after an adapter board is coupled to a 矽-based liquid crystal product, the adapter board can be coupled to the image test board for image testing to detect defects of the silli-based liquid crystal product; After the adapter board is moved, it can be coupled to a functional test board to test the functionality of the silicon-based liquid crystal product.

As described above, in order to perform image testing, the adapter board needs to be effectively coupled to the image test board in a test environment. Further, the pins on the adapter board must be aligned with the metal on the image test board. Pad for effective coupling. When adjusting the test environment, usually the adapter plate is fixed, so align all the metal pads of the image test board with the corresponding pins on the adapter plate. Since the test platform, the adapter board, and the test board base usually form a visual dead angle, it is impossible to directly observe whether the adapter plate and the image test board are effectively aligned when adjusting the position. On the other hand, if one of the axes of the image test board is aligned with the adapter plate and the other axis is slightly offset, causing a deviation angle between the two plates, the image test board and the adapter plate are not effectively aligned.

When the adapter plate and the image test board are coupled and erected, the test test space and the adapter plate are difficult to align because the test space is narrow or the device in the pedestal blocks the line of sight, even if it can be confirmed by camera image. The image test board and the adapter board are properly coupled and effectively aligned, but they are not intuitive enough to be more accurately adjusted by the image. It takes a lot of time to adjust the position of the image test board and the adapter board, thus causing the test. The poor adjustment efficiency of the hardware also causes instability in the test environment.

In view of the above-mentioned lack of the conventional test platform, the present invention solves the above problems. An object of the present invention is to provide a liquid crystal panel test platform, which improves the problem that the conventional test platform cannot be accurately aligned in the image test board and the adapter board. That is, the intelligent contact judging device of the liquid crystal panel test platform of the present invention is convenient for judging whether the image test board and the interposer board can be effectively aligned when adjusting the position of the image test board and the interposer board, and is not in the process of testing the product. It is necessary to constantly adjust the position of the image test board and the adapter board by observing the camera image, and use the intelligent contact judging device of the present invention to make accurate adjustments to meet the requirements of the stability of the test environment.

The present invention provides a liquid crystal panel test platform, comprising at least: an image test board having at least one detecting stitch; and an adapter board. The device is disposed on the opposite side of the image test board and has at least one metal pad; and an intelligent contact judging device coupled to the image test board and the interposer, the smart contact judging device comprising: at least one light emitting diode, coupled Connecting at least one metal pad; and at least one circuit coupled to the at least one detecting pin, wherein the circuit has a resistor, and wherein the light emitting diode is electrically coupled to the circuit when the at least one metal pad contacts the at least one detecting pin Connect to determine if the adapter plate and the image test board are aligned.

For all of the above purposes, the liquid crystal panel is a germanium based liquid crystal (LCOS).

For all of the above purposes, the at least one detection pin is shorter than the at least one signal pin of the image test board to facilitate contact determination of the image test board.

For all of the above purposes, the length of the at least one detection pin is shorter than 80% of the length of the at least one signal pin.

For all of the above purposes, the at least one detection pin is located at four corners of all the pins of the image test board to facilitate determining the alignment of the image test board with the three-dimensional direction of the adapter plate.

For all of the above purposes, the supply voltage of the circuit is 3.3V.

Another object of the present invention is to provide a smart contact method for a germanium-based liquid crystal test platform, which improves the problem that the conventional test platform cannot be accurately aligned in the image test board and the adapter board. That is, the intelligent contact method of the 矽-based liquid crystal test platform of the present invention facilitates judging whether the image test board and the adapter board can be effectively aligned when adjusting the position of the image test board and the adapter board, and does not during the test of the product. The position of the image test board and the adapter board needs to be constantly adjusted by observing the camera image, and the intelligent contact judging device of the present invention is viewed to make accurate adjustments to meet the requirements of the test environment.

In order to achieve the above object and other objects, the present invention provides an intelligent contact judging method for a liquid crystal panel test platform. The smart contact judging method includes: coupling at least one light emitting diode to at least one metal pad of an interposer At least one circuit is coupled to at least one detecting pin of an image test board; and when at least one metal pad contacts the detecting pin such that at least one circuit is electrically coupled to the at least one light emitting diode, the adapter plate is aligned Image test board.

For all of the above purposes, the steps include: using the shorter pins of the image test board as the detection pins.

For all of the above purposes, the steps include: using the pin of the image test board that is 20% shorter than the signal pin as the detection pin.

For all of the above purposes, the method includes the steps of: the at least one detection pin is located in the shadow The four corners of the test board are used to determine whether the adapter board is aligned with the image test board by using the number of illuminations of the at least one LED.

For all of the above purposes, the method includes the steps of: setting a resistance of the circuit to enhance the determination accuracy of whether the at least one detection pin is aligned with the at least one metal pad.

Compared with the prior art, the smart contact judging device and method for the sputum-based liquid crystal test platform according to the present invention can achieve the positional configuration of the interposer and the image test board without viewing the image. Effective and rapid alignment.

The above is to clarify the purpose, technical means and achievable effects of the present invention, and those skilled in the relevant art can clarify the present invention through the following examples and accompanying drawings and patent claims. invention.

100‧‧‧Intelligent contact judgment device

110, 210, 310, 410‧‧‧ image test board

112, 312, 412‧‧‧ detection stitches

120, 220, 320, 420‧‧‧ adapter plates

122, 322, 422‧‧‧ metal pads

130, 330, 430‧‧‧Lighting diodes

140, 340, 440‧‧‧ circuits

142‧‧‧resistance

216‧‧‧Test board base

250, 350‧‧‧ test carrier

260‧‧‧ functional test board

313‧‧‧Signal pins

500‧‧‧Intelligent contact judgment method for silicon-based liquid crystal test platform

510‧‧‧Connecting the light-emitting diode to the metal pad of the adapter plate

520‧‧‧Connecting the circuit to the detection pin of the image test board

530‧‧‧ When the metal pad contacts the detection pin so that the circuit is electrically coupled to the LED, the adapter plate is aligned with the image test board

540‧‧‧Use the shorter pins in the image test board as the detection pin

550‧‧‧Use the pin of the image test board that is 80% longer than the signal pin length as the detection pin

560‧‧‧ At least one detection pin is located at four corners of the image test board, and the number of illuminations of at least one of the light-emitting diodes is used to determine whether the adapter plate is aligned with the image test board

570‧‧‧Set the resistance of the circuit to enhance the accuracy of at least one detection pin alignment with at least one metal pad

900‧‧‧Test platform

The present invention will be more fully understood from the following detailed description of the embodiments of the invention, and In the example.

1A is a schematic diagram showing the basic structure of an intelligent contact judging device for a liquid crystal panel test platform according to an embodiment of the present invention.

FIG. 1B is a schematic diagram showing the basic structure of an intelligent contact judging device for a liquid crystal panel test platform according to an embodiment of the invention.

2 is a schematic structural diagram of a liquid crystal panel detection platform according to an embodiment of the invention.

FIG. 3 is a schematic diagram showing the detection pin of the smart contact judging device of the liquid crystal panel test platform according to an embodiment of the invention.

4 is a schematic diagram showing the detection pin of the smart contact judging device of the liquid crystal panel test platform according to an embodiment of the invention.

FIG. 5 is a flow chart illustrating a method for intelligent contact determination of a liquid crystal panel test platform according to an embodiment of the invention.

The embodiments of the present invention will be described below by way of specific embodiments. Those skilled in the art will appreciate the multimedia signal transmission device and its transmission method, and can easily understand the efficacy of the present invention. And advantages. However, those skilled in the field must understand this Creation can also be carried out without these details. In addition, some well-known structures or functions may be described or described in detail to avoid obscuring the description of the various embodiments. The terms used in the following description will be interpreted in the broadest sense, even if A detailed description of a particular embodiment of the present work is used together.

The present invention will be described in terms of the preferred embodiments and the aspects of the present invention, which are intended to illustrate and not to limit the scope of the invention. It is widely practiced in other embodiments.

The liquid crystal panel test platform of the present invention is suitable for the detection of liquid crystal products, and may include a transmissive liquid crystal, for example, a thin film transistor liquid crystal (TFT-LCD), or a reflective liquid crystal, for example, a germanium-based liquid crystal (LCOS), which should be noted. It is to be noted that the liquid crystal (liquid crystal panel) herein is merely an example and not intended to be limiting, and other kinds of liquid crystals (panels) may be used without departing from the scope of the invention. The following various embodiments are based on the explanation and examples of the quinone-based liquid crystal (LCOS), and are not intended to limit the structure of the present invention and the different types of the present invention.

First embodiment

1A is a schematic diagram showing the basic structure of an intelligent contact judging device for a silli-based liquid crystal test platform according to an embodiment of the present invention. As shown in FIG. 1A, in an embodiment, the 矽-based liquid crystal test platform 900 of the present invention comprises at least one image test board 110 having at least one detecting pin 112, and an adapter board 120 disposed on the image test board. Opposite the 110, having at least one metal pad 122; and a smart contact determining device 100 coupled to the image test board 110 and the adapter plate 120, the smart contact determining device 100 includes at least one light emitting diode 130 coupled At least one metal pad 122; and at least one circuit 140 coupled to the at least one detecting pin 112, wherein the circuit 140 has a resistor 142, and wherein the at least one metal pad 122 contacts the at least one detecting pin 112, the light emitting diode The 130 is electrically coupled to the circuit 140 to facilitate determining whether the adapter plate 120 and the image test board 112 are aligned.

As shown in FIG. 1A, in an embodiment, an adapter plate 120 is coupled to the silicon-based liquid crystal product 500 (not shown in FIG. 1), and after being in contact with and effectively aligned with the image test panel 110, The germanium based liquid crystal product 500 was tested with a plurality of metal pads 122 on the adapter plate 120 and a plurality of pins on the image test board 110. In an embodiment, the user of the test platform can set up a smart contact judging device 100 for correct coupling and effective alignment of the image test board 110 and the interposer 120. For an intelligent contact judging device, One or more detection pins 112 are set by themselves in a plurality of pins. The test pin 112 is connected to a circuit 140, and the circuit 140 has a resistor 142. The resistor 142 It can be a variable resistor or a fixed resistor, and the user can adjust the resistance. The components of the circuit are not limited thereto, and may include a power source and other electronic components without departing from the scope of the present invention. The polar body 130 operates normally. On the other hand, the metal pad 122 of the interposer 120 is coupled to the at least one LED 130, for example, four LEDs 130.

FIG. 1B is a schematic diagram showing the basic structure of an intelligent contact judging device for a silli-based liquid crystal test platform according to an embodiment of the present invention. Referring to FIG. 1B, in an embodiment, the test platform user adjusts the position of the image test board and the adapter board in order to make the image test board 110 and the adapter board 120 contact each other. It should be noted that the adjustment of the position of the image test board 110 and the adapter board 120 may include fine adjustment of the three-dimensional direction of the two boards. For example, the image test board 110 may be fine-tuned up and down, and fine-tuned before and after, but Without limitation, depending on the needs of the test environment, for example, the image test board 110 may be fixed and only move the adapter plate 120 for contact. In one embodiment, the position of the image test board 110 and the adapter board 120 can be adjusted by viewing whether the image of the liquid crystal based product 500 is correct.

As shown in FIG. 1B , in an embodiment, when the image test board 110 is coupled to the adapter board 120 and the metal pad 122 is in contact with the detecting pin 112 and achieves effective alignment, the LED and the circuit are electrically connected. The electrical coupling is 140 to form a path. Under this condition, the LED 130 will emit light to prompt the user, and it is convenient to determine whether the adapter plate 120 and the image test board 112 are aligned.

As shown in FIG. 1B, in an embodiment, a user of the test platform 900 can configure or adjust the light-emitting circuit of the LED 130. For example, when there are two or more LEDs, one is configured. The series circuit is such that the different light-emitting diodes have the same current, and at this time, the total forward bias is equal to the sum of the forward bias of each of the light-emitting diodes 130 in series. In addition, a plurality of current limiting resistors can be set to perform current control on individual LED strings. In addition, the circuit 140 can be a parallel circuit to maintain the independence of the illumination of the plurality of LEDs 130. It should be noted that the embodiment of the light-emitting diode 130 achieved by the image test board 110 and the adapter board 120 being aligned with each other is limited by way of example, without departing from the scope of the invention. The number of the light-emitting diodes 130, the type of the light-emitting diode 130, the power supply voltage, the resistance value, the series-parallel method, and the arrangement of the light-emitting diodes are all convenient for the user to test the platform or the test environment. Or the stability is set; based on the above-mentioned electronic circuits are generally known architecture, so no further details are provided here.

Second embodiment

2 is a schematic diagram showing the architecture of a germanium-based liquid crystal detection platform according to an embodiment of the present invention. Referring to FIG. 2, in an embodiment, the test platform 900 includes an adapter plate 220, an adapter plate. 220 is connected to a test carrier 250, the test carrier 250 is placed on the silicon-based liquid crystal product 500, the image test board 210 is fixed by a test board base 216, and the test board base 216 has a screw position on the image test board 210. Make fine adjustments. For example, the test board base 216 is finely adjusted toward the adapter plate 220. As shown in FIG. 1A and FIG. 2, the smart contact judging device 100 is coupled to the image test board 210 and the interposer 220. The smart contact judging device 100 includes at least one light emitting diode 130 coupled to the interposer board. a metal pad 122; and a circuit 140 coupled to the detecting pin 212 of the image test board 210, wherein the circuit 140 has a resistor 142, and wherein the at least one metal pad 122 contacts the at least one detecting pin 112, the light emitting diode The body 130 is electrically coupled to the circuit 140 to facilitate determining whether the adapter plate 120 and the image test board 112 are aligned.

Referring to FIG. 2, in an embodiment, the position of the image transfer board 210 can be vertically and frontally adjusted, and the adapter board 220 can be moved back and forth by the design of the test carrier 250 by connecting the test carrier 250. Or slide to approach or away from the image test board 210. Since the test platform 900, the adapter plate and the test board base 216 will form a visual dead angle, it is impossible to directly observe whether the adapter plate 220 and the image test board 210 are effectively aligned when adjusting the position, and therefore, a smart contact is configured. After the judging device 100 passes the smart contact judging device 100, the user can easily and intuitively achieve the image test board 210 and the interposer board by prompting the LEDs 130 and adjusting the position of the image test board 210 and the adapter board 220. 220 effective alignment.

Referring to FIG. 2, in an embodiment, the smart contact judging device 100 can be configured on the function test board 260 and the adapter board 220, and the smart contact judging device 100 and the function test board 260 and the interposer board. The coupling pin 112 is disposed on the function test board 260, and the detecting pin 113 is coupled to the circuit 140. On the other hand, one or more LEDs 130 are coupled to the metal pad 122 on the adapter board 220. The user of the test platform 900 can adjust the position of the board 220 or the function test board 260. When the adapter board 220 is in contact with the function test board 260, if the function test board 260 and the adapter board 200 are effectively aligned, the LEDs are illuminated. The body 130 is electrically coupled to the circuit 140 to form a via, and the LED 230 emits light, prompting the user to determine the effective alignment of the adapter plate 220 and the functional test board 260.

Third embodiment

FIG. 3 is a schematic diagram showing the detection pin of the smart contact judging device of the 矽-based liquid crystal test platform according to an embodiment of the invention. Referring to FIG. 3, in an embodiment, the image test board 310 has a certain number of signal pins 313, and the adapter board 320 has a metal pad 322 corresponding to the signal pins 313. The detecting pin 312 is coupled to a circuit 340; the metal pad 322 is coupled to the LED. The user can select one or more pins on the image test board 310 as the detection pin 312, wherein the detection pin 312 is shorter than the at least one signal pin 313 of the image test board 310, so that the adapter plate 320 is When the image test board 310 is in contact, the shorter detection pin 312 is designed to ensure that all the signal pins 313 are in contact with the corresponding metal pad 322, and the detection pin 312 is in contact with the metal pad 322. At this time, the LEDs 330 are electrically coupled to the circuit 340 to form a via and emit light to facilitate contact determination of the image test board 310.

Referring to FIG. 3, in an embodiment, the shorter detection pin 312 can be 70%-90% of the length of the signal pin 313. In a preferred embodiment, the shorter detection pin 312 can be a signal. The length of the stitch 313 is 80%. It should be noted that the length of the stitches herein is merely an example and not a limitation, and the alignment sensitivity of the actual test environment or the image test board 310 and the adapter board 320 should be finely adjusted, so that the user can still detect the stitches. 312 and signal pin 313 are length adjusted.

Referring to FIG. 3, in one embodiment, the supply voltage of circuit 340 is 3.0V-3.5V. In a preferred embodiment, the supply voltage of circuit 340 is 3.3V. It should be noted that the embodiment of the LED diode 330 achieved by the image test board 310 and the interposer 320 being aligned with each other is limited by way of example only, without departing from the scope of the invention. Next, the number of the light-emitting diodes 330, the type of the light-emitting diode 330, the power supply voltage, the resistance value, the circuit-parallel connection method, and the light-emitting diode placement manner are all available for the user to test the platform or test. The convenience or stability of the environment is controlled, and the above-mentioned electronic circuits are generally known structures, and thus will not be described herein.

Fourth embodiment

FIG. 4 is a schematic diagram showing the detection pin of the smart contact judging device of the 矽-based liquid crystal test platform according to an embodiment of the invention. As shown in FIG. 4, in one embodiment, the user can configure four detection pins 412 to be respectively placed at four corners of the image test board 410, and the detection pin 412 is coupled to the circuit 440. The four detection pins are connected. The 412 is respectively corresponding to the four metal pads 422 on the adapter board 420. The four metal pads 422 are respectively coupled to the LEDs 430. When the detection pins 412 are effectively aligned with the metal pads 422, the circuit 440 and the LEDs are illuminated. The body 430 is electrically coupled to form a via such that the light emitting diode 430 emits light.

Referring to FIG. 4, in an embodiment, if the image test board 410 has an angle with the adapter board 420, in other words, two of the four LEDs 430 and 432 are image test boards. The 410 is closer to one side of the adapter plate 420 to form a path illumination, and the other two LEDs 433 and 434 are not in contact with each other because the image test board 410 is far from the adapter plate 420 and is not illuminated. in At this time, when the user observes that the light-emitting diodes 431, 432 are bright and the light-emitting diodes 433, 434 are not bright, the user can know that the image test board 410 and the adapter plate 420 are not effectively aligned. And making a judgment, the user can also infer that the image test board 410 and the adapter board 420 are bound to have an angle and simultaneously adjust the side of the light-emitting diode 431, 432 that is being illuminated or the unlit light-emitting diode 433, One side of the 434 facilitates effective alignment of the image test board 410 with the adapter plate 420.

Referring to FIG. 4, in an embodiment, the angle between the image test board 410 and the adapter board 420 may also cause the LEDs 431, 433 to illuminate; the LEDs 432, 434 are not illuminated, the same For example, the user can also determine which side is offset or skewed by the prompt of the LEDs 431-434, and adjust the position of the image test board 410 and the adapter board 420 to achieve the image. The test board 410 is effectively aligned with the adapter plate 420.

Referring to FIG. 4, in an embodiment, it should be noted that the position of the LED 430 is for illustrative purposes only and is not intended to be limiting. The user may operate the LEDs without departing from the scope of the present invention. The number or position is configured according to the experience of use, the convenience of the test environment, or the stability of the test platform. For example, the light emitting diode is coupled to the middle of the adapter plate 420.

Fifth embodiment

Referring to FIG. 5, the smart contact judging device corresponding to the above-mentioned 矽-based liquid crystal test platform and related illustrations, FIGS. 1 to 4, the steps 510 to 530 of the smart contact method 500 for the silli-based liquid crystal test platform are described in detail below.

FIG. 5 is a flow chart illustrating a method for intelligent contact determination of a germanium-based liquid crystal test platform according to an embodiment of the invention. Referring to FIG. 1A and FIG. 1B , in the embodiment, the smart contact determination method 500 includes: coupling at least one LED assembly 130 to at least one metal pad 122 of an interposer 120; coupling at least one circuit 140 At least one detection pin 112 of an image test board 110; and when at least one metal pad 122 contacts the detection pin 112 such that at least one circuit 140 is electrically coupled to at least one of the light emitting diodes 130, the adapter plate 120 is aligned Image test board 110.

Referring to FIG. 5 and FIG. 1A, in step 510, the LEDs 130 are coupled to the metal pads 122 of the interposer 120. In step 520, the circuit 140 is coupled to the detection pins 112 of the image test board 110. . In steps 510 and 520, in one embodiment, the adapter plate 120 has a plurality of metal pads 122 thereon, and the image test board 110 has a plurality of pins. In an embodiment, the user of the test platform can set up a smart contact determining device 100 for contacting and effectively aligning the image test board 110 with the adapter board 120. For a smart contact judging device, many pins can be used. Set one by yourself More than one detection pin 112, the test pin 112 will be connected to a circuit 140, and the circuit 140 has a resistor 142, but is not limited thereto, and may include a power source and other electronic components without departing from the scope of the present invention. Under normal conditions, the LEDs 130 can operate normally. On the other hand, the metal pad 122 of the interposer 120 is coupled to the at least one LED 130, for example, four LEDs 130.

Referring to FIG. 5 and FIG. 1B, in step 510 and step 520, in an embodiment, the test platform user adjusts the position of the image test board and the adapter board for the purpose of the image test board 110 and the adapter board 120. Can be in contact with each other. It should be noted that the adjustment of the position of the image test board 110 and the adapter board 120 may include fine adjustment of the three-dimensional direction of the two boards. For example, the image test board 110 may be fine-tuned up and down, and fine-tuned before and after, but Without limitation, depending on the needs of the test environment, for example, the image test board 110 may be fixed and only move the adapter plate 120 for contact. In one embodiment, the position of the image test board 110 and the adapter board 120 can be adjusted by the image of the 矽-based liquid crystal product 500.

Referring to FIG. 5 and FIG. 1B, in step 530, in an embodiment, when the image test board 110 is in contact with the adapter board 120, the metal pad 122 contacts the detecting pin 112 and achieves effective alignment. The LEDs 130 are electrically coupled to the circuit 140 to form a via. Under these conditions, the LEDs 130 will emit light to prompt the user to determine whether the adapter plate 120 and the image test panel 112 are aligned.

Referring to FIG. 5 and FIG. 1B, in step 530, in an embodiment, the user of the test platform 900 can configure or adjust the light-emitting circuit of the light-emitting diode 130, for example, when there are two or more In the case of a light-emitting diode, a series circuit is arranged such that different light-emitting diodes have the same current, and at this time, the total forward bias is equal to the sum of the forward bias of each of the light-emitting diodes 130 in series. . In addition, a plurality of current limiting resistors can be set to perform current control on individual LED strings. It should be noted that the embodiment of the light-emitting diode 130 achieved by the image test board 110 and the adapter board 120 being aligned with each other is limited by way of example, without departing from the scope of the invention. The number of the light-emitting diodes 130, the type of the light-emitting diode 130, the power supply voltage, the resistance value, the series-parallel method, and the arrangement of the light-emitting diodes are all convenient for the user to test the platform or the test environment. Or the stability is set; based on the above-mentioned electronic circuits are generally known architecture, so no further details are provided here.

Referring to FIG. 5 and FIG. 3, in method 500, step 540 is included: using a shorter pin in the image test board as the detecting pin. In step 540, in an embodiment, the image test The board 310 has a number of signal pins 313 thereon, and the adapter board 320 has a metal pad 322 corresponding to the signal pins 313. The detecting pin 312 is coupled to a circuit 340; the metal pad 322 is coupled to the LED. The user can select one or more pins on the image test board 310 as the detection pin 312, wherein the detection pin 312 is shorter than the at least one signal pin 313 of the image test board 310, so that the adapter plate 320 is When the image test board 310 is in contact, the shorter detection pin 312 is designed to ensure that all the signal pins 313 are in contact with the corresponding metal pad 322, and the detection pin 312 is in contact with the metal pad 322. At this time, the LEDs 330 are electrically coupled to the circuit 340 to form a via and emit light to facilitate contact determination of the image test board 310.

Referring to FIG. 5 and FIG. 3, in the method 500, the method includes the following steps: 550: using a pin of the image test board that is 80% longer than the signal pin as the detecting pin. In step 550, in a preferred embodiment, the shorter detection pin 312 can be 70%-90% of the length of the signal pin 313. In a preferred embodiment, the shorter detection pin 312 can be a signal pin. 80% of the length of 313.

Referring to FIG. 5 and FIG. 4, in method 500, step 560 is included: at least one detection pin is located at four corners of the image test board, and the number of illuminations of the at least one light-emitting diode is used to determine whether the adapter board is aligned The image test board. In step 560, in an embodiment, if the image test board 410 has an angle with the adapter board 420, in other words, two of the four light-emitting diodes 430 are 431, 432 due to the image test board 410. The path light is formed closer to one side of the adapter plate 420, and the other two LEDs 433 and 434 are not in contact with each other because the image test board 410 is far apart from the adapter plate 420. At this time, when the user observes that the light-emitting diodes 431, 432 are bright and the light-emitting diodes 433, 434 are not bright, the user can know that the image test board 410 and the adapter plate 420 are not valid for this phenomenon. The user can also infer that the image test board 410 and the adapter board 420 are necessarily at an angle and simultaneously adjust the side of the light-emitting diode 431, 432 that is being illuminated or the unlit light-emitting diode 433. One side of the 434 facilitates effective alignment of the image test board 410 with the adapter plate 420.

Referring to FIG. 5 and FIG. 4, in step 560, in an embodiment, the angle between the image test board 410 and the adapter board 420 may also cause the LEDs 431, 433 to illuminate; the LEDs 432, 434 are not illuminated. Similarly, the user can also determine which side is offset or skewed by the prompt of the LEDs 431-434, thereby adjusting the image test board 410 and the transfer. The position of the board 420 is such that effective alignment of the image test board 410 with the interposer board 420 is achieved.

Referring to FIG. 5 and FIG. 1 , in the method 500, the method includes the step 570: setting the resistance of the circuit 140 to enhance the determination of whether at least one of the detecting pins 112 is aligned with the at least one metal pad 122. degree. In step 570, in an embodiment, the user can set the supply voltage of circuit 340 to be 3.0V-3.5V. In a preferred embodiment, the supply voltage of circuit 140 is 3.3V. In an embodiment, the user can also set the resistance of the resistor 142 to increase the sensitivity of the LED 130, and increase the alignment accuracy of the image test board 110 and the adapter board 120. It should be noted that the embodiment of the LED diode 130, the circuit 140, the resistor 142 and the power supply voltage achieved by the image test board 110 and the interposer 120 being aligned with each other is merely an example instead of The limitation is that, without departing from the scope of the present invention, the number of the light-emitting diodes 330, the type of the light-emitting diode 330, the power supply voltage, the variable resistance, the circuit-parallel connection, and the arrangement of the light-emitting diodes are All users can control the convenience or stability of their test platform or test environment. Based on the above-mentioned electronic circuits, the architecture is generally known, so it will not be described here.

In summary, the present invention provides an intelligent contact judging device for a silli-based liquid crystal semi-automatic test platform and a method thereof, and it takes a lot of time and cannot be performed to improve the position of the adapter board and the image test board after the conventional test platform is improved. The lack of effective adjustment means that the intelligent contact judging device and the method thereof of the 矽-based liquid crystal test platform of the present invention do not need to watch the image of the camera during the setting process of the detection environment, and even spend more time adjusting the adapter plate and The position of the image test board is to use the intelligent contact judging device to align the adapter plate and the image test board with the illumination of the LED, which can save time and achieve the test environment under the condition of simple operation and judgment. Claim.

According to the above, the present invention has the following advantages: 1. The intelligent contact judging device is advantageous for adjusting the position of the image test board and the interposer; second, the stability of the detecting environment is improved; and third, the adjusting efficiency of the detecting hardware is improved.

The above description is intended to be illustrative of specific details of the invention. Those skilled in the art of the invention will be able to practice the invention without some specific details. In other embodiments, conventional structures and devices are not shown in the block diagram. Intermediate structures may be included between the schematic elements. The elements described may include additional inputs and outputs, which are not depicted in detail in the drawings.

The present invention includes various processing programs that are executable by hard disk components or embedded in computer readable instructions that form a general or special purpose processor or logic circuit with programmed instructions to execute the program. In addition, the program must be executed by a combination of hardware and software.

The method is described in a basic form, and any method or message may be added or deleted from the program without departing from the scope of the invention, and those skilled in the art should be able to further improve or modify the invention. It is intended to illustrate and not to limit the invention.

The components mentioned in the different embodiments are separate circuits, but some or all of the components may be integrated into a single circuit, and thus the different components described in the appended claims may correspond to one or more portions of the circuit. Features.

If a component "A" is coupled (or coupled) to component "B", component A may be directly coupled (or coupled) to B, or indirectly coupled (or coupled) to B via component C. If the specification states that a component, feature, structure, program, or characteristic A will result in a component, feature, structure, procedure, or characteristic B, it indicates that A is at least part of B, or indicates that there are other components, features, or structures. , program or feature assists in causing B. The word "may" as used in the specification, its elements, features, procedures or characteristics are not limited to the description; the number mentioned in the specification is not limited to the words "a" or "an".

The present invention is a major breakthrough in terms of its purpose, means, and efficacy, both of which are distinguished from the characteristics of conventional techniques. It is to be noted that the above-described embodiments are merely illustrative of the principles of the invention and its advantages, and are not intended to limit the scope of the invention. Although the specific embodiments and the disclosed applications have been illustrated and described herein, the embodiments are not intended to be limited to the precise explanation, and those skilled in the art can do without departing from the technical principles and spirit of the invention. The examples are subject to modification and variation. It is also to be understood that the present invention is not limited by the spirit and scope of the invention, and the various modifications, changes, and permutations, operations, and methods of the present invention will be apparent to those skilled in the art. The details, as well as the devices and methods disclosed herein, are not intended to be limiting, and are included in the scope of the following patent applications.

110‧‧‧Image Test Board

112‧‧‧Detecting stitches

120‧‧‧Adapter plate

122‧‧‧Metal pad

130‧‧‧Lighting diode

140‧‧‧ Circuitry

142‧‧‧resistance

Claims (11)

A liquid crystal panel test platform includes at least: an image test board having at least one detection pin; an adapter plate disposed opposite the image test board, having at least one metal pad; and a smart contact judging device, and the The image sensor board and the adapter board are coupled to each other, the smart contact determining device includes: at least one light emitting diode coupled to the at least one metal pad; and at least one circuit coupled to the at least one detecting pin, wherein the The circuit has a resistor, and when the at least one metal pad contacts the at least one detecting pin, the LED is electrically coupled to the circuit to facilitate determining whether the interposer is aligned with the image test board . The liquid crystal panel test platform of claim 1, wherein the at least one detection pin is shorter than the at least one signal pin of the image test board to facilitate contact determination of the image test board. The liquid crystal panel test platform of claim 2, wherein the length of the at least one detecting pin is shorter than 80% of the length of the at least one signal pin. The liquid crystal panel test platform of claim 2, wherein the at least one detecting pin is located at four corners of all the stitches of the image test board, so as to determine the three-dimensional direction of the image test board and the adapter board. Align the situation. For example, the liquid crystal panel test platform described in claim 2, wherein the circuit has a supply voltage of 3.3V. The liquid crystal panel test platform of claim 1, wherein the liquid crystal panel is a germanium-based liquid crystal. An intelligent contact judging method for a liquid crystal panel test platform, the smart contact judging method comprising: coupling at least one light emitting diode to at least one metal pad of an interposer; coupling at least one circuit to an image test board At least one detecting pin; and when the at least one metal pad contacts the detecting pin, the at least one circuit and the at least one light emitting diode Electrically coupled, the adapter plate is aligned with the image test board. The method for judging the smart contact for a liquid crystal panel test platform according to claim 7, wherein the method comprises the steps of: using the shorter stitch in the image test board as the detecting pin. The smart contact judging method for a liquid crystal panel test platform according to claim 8, wherein the method comprises the steps of: using a pin of the image test board that is more than 80% of the length of at least one signal pin as the detecting pin. The smart contact judging method for a liquid crystal panel test platform according to claim 7, wherein the method comprises the steps of: the at least one detecting pin is located at four corners of the image testing board, and the at least one light emitting diode is utilized The number of illuminations is used to determine whether the adapter board is aligned with the image test board. The smart contact judging method for a liquid crystal panel test platform according to claim 7, wherein the method comprises the steps of: setting a resistance value of the circuit to enhance whether the at least one detecting pin is aligned with the at least one metal pad; Determine the accuracy.