KR101255111B1 - Probe block and apparatus for testing panel having the same - Google Patents

Abstract

PURPOSE: A probe block and a panel test apparatus having the same are provided to stably perform an electrical test on a panel. CONSTITUTION: A probe block consists of a block body(100), an elastic unit(200), a test unit(300), and a substrate(400). The elastic unit is installed in the lower end of the block body to incline downwardly. The test unit is formed with a plurality of contact lines at a predetermined interval and is installed to have both ends of the elastic unit to be bent. The substrate is arranged in the lower part of the block body and is conducted with the contact lines by elastically contacting the other end of the test unit.

Description

PROBE BLOCK AND APPARATUS FOR TESTING PANEL HAVING THE SAME}

The present invention relates to a probe block, and more particularly, to a probe block and a panel test apparatus having the same that can stably perform an electrical test on a panel.

In general, a flat panel display panel refers to a display device such as an LCD or a PDP, and a liquid crystal display (LCD) is a thin film transistor (TFT), twisted nematic (TN), super twisted nematic (STN), There are Color Super Twisted Nematic (CSTN), Double Super Twisted Nematic (DSTN) types, and Organic Luminescence (EL) types. These panels are employed in liquid crystal display panels of communication devices such as mobile phones, such as mobile phones, in addition to large home appliances.

The probe block is used to check whether the small liquid crystal display panel operates normally without pixel error.

Recently, as the liquid crystal display panel becomes higher in quality, the density of pixels increases, and as a result, the necessity of a narrow pitch probe block increases due to the reduction in size. The probes developed to date have been made of a needle type made of tungsten or rhenium tungsten stainless wire, a blade type made of nickel or beryllium copper, and a copper plate on a polymide film. Film type produced by etching and raising other conductors, Hybrid type in which conductive medium is injected into film type using semiconductor process technology, and Pogo Pin using spring tension Pogo Type, which is manufactured by using, and MEMS Type (MEMS Type) using semiconductor MEMS process technology.

As described above, a conventional probe block for inspecting a liquid crystal display panel is generally provided in the form of a needle and bonded to the needle by an epoxy resin to limit the outer diameter of the needle. There is a problem that can not respond.

That is, the mounting surface of the needle holder on which the needle is mounted is limited, but the flat panel display device is highly integrated, so that the number of terminals is very large, so that it is difficult to arrange an appropriate number thereof with the wire type needle.

In addition, accurate physical contact with the contacts in the liquid crystal display panel is impossible due to the impact during the inspection, and bending or deformation of the probe pins occurs by absorbing the impact generated at the contact multiple times, thereby causing an error as a result of the inspection. There is a problem.

In addition, since a plurality of measuring end points are not formed with the contact portion of the flat panel display panel, when a measurement error occurs in the measurement portion, there is a problem that reliability of inspection cannot be secured.

In addition, since an electrical signal noise problem occurs in the blade type and direct contact with the contact portion of the flat panel display panel does not occur, stable electrical inspection may be performed by physical force due to an increase in the overdrive OD. There is also a problem.

An object of the present invention is to provide a probe block and a panel test apparatus having the same, which can stably perform an electrical test on a panel by forming a predetermined elastic contact with terminals formed on the panel.

Another object of the present invention is to provide a probe block and a panel test apparatus having the same capable of selectively changing the contact pressure between terminals and contact lines formed in the panel.

In one aspect, the invention is a block body; An elastic part installed to be inclined downward at the lower end of the block body; A flexible test unit having a plurality of contact lines formed at predetermined intervals, and having both ends bent to both ends of the elastic part; And a flexible substrate disposed at a lower end of the block body, one end of which is in flexible contact with the other end of the test unit and is energized with the contact lines.

It is preferable that an inclined surface inclined downward is formed at a lower end of the block body.

It is preferable that the elastic portion is a leaf spring having a predetermined elastic force and formed in a plate shape, and both ends protruding at both ends of the block body at a predetermined length.

The test unit includes a film in which the plurality of contact lines are formed.

A first bending part is formed at one end of the film, and a second bending part is formed at the other end of the film.

The first bending part is disposed to surround a lower end of one end of the leaf spring protruding forward of the block body.

The second bending part is disposed to surround the other end of the leaf spring protruding to the rear of the block body.

Preferably, the first bending part includes the contact lines exposed at one end of the leaf spring.

Preferably, the first bending part is attached to one lower surface of the leaf spring via a first adhesive member, and the second bending part is attached to one lower surface of the substrate through a second adhesive member.

The leaf spring may be formed of any one of a spring steel, a resin, a plastic, and a stainless material.

An insulating film coating layer may be further formed around the leaf spring.

The leaf spring is preferably manufactured through heat treatment.

The spacing of the contact lines is preferably pitch corrected to match the spacing between the lead wires of the panel under test by applying an external force to the soft film.

When the block body is a detachable type, the block body may include a first block body in which a first installation region in which the leaf spring is disposed is formed, and a rear block of the first block body and in which the substrate is disposed. And a second block body having an installation area.

The second block body is preferably disposed upward so that the second installation region is stepped with the first installation region.

When the block body is integrated, the block body includes a first installation region in which the leaf spring is disposed and a second installation region in which the substrate is disposed.

Preferably, the first installation region and the second installation region are formed in a stepped shape.

In another aspect, the present invention is a probe block; A test device body in which the probe block is disposed at a front end; And an elastic plate block which fixes the probe block, is installed at the front end of the test apparatus body, and forms a predetermined elasticity up and down.

The present invention, by forming a predetermined elastic contact with the terminals formed on the panel, it has the effect that it is possible to stably perform the electrical test for the panel.

In addition, the present invention has the effect of selectively changing the contact pressure between the terminals formed in the panel and the contact lines.

1 is an exploded perspective view showing a probe block according to a first embodiment of the present invention.
2 is a combined perspective view showing a probe block according to the first embodiment of the present invention.
3 is a perspective view showing a leaf spring according to the present invention.
4 is a perspective view illustrating a state in which a test unit is coupled to a first block body.
5 is a perspective view illustrating a state in which a substrate is coupled to a second block body.
6 is a bottom perspective view showing a probe block according to a first embodiment of the invention.
7 is a combined perspective view showing a probe block according to the first embodiment of the present invention.
FIG. 8 is a perspective view illustrating a front end of the probe block of FIG. 7.
FIG. 9 is a perspective view illustrating a state in which the leaf spring of FIG. 8 is bonded to the film. FIG.
10 and 11 are perspective views showing a state in which the protruding length of the leaf spring is different.
12 is a side view showing a probe block according to the first embodiment of the present invention.
13 and 14 are side views illustrating a coupling process of the first and second block bodies.
15 is a perspective view showing a test apparatus of the present invention.
16 is a partially enlarged perspective view illustrating a state in which probe blocks of the present invention are installed.
17 is a combined perspective view showing a probe block according to a second embodiment of the present invention.
18 is a perspective view illustrating that an elastic part is installed in the block body of FIG. 17.
19 is a perspective view illustrating that a substrate is installed in the block body of FIG. 17.
20 is a perspective view illustrating that an elastic part and a substrate are installed in the block body of FIG. 17.
FIG. 21 is a partially enlarged perspective view illustrating a coupling state of the leaf spring and the film in the block body of FIG. 20.

Hereinafter, exemplary embodiments of the present invention will be described in detail with reference to the accompanying drawings.

Embodiments of the present invention are provided to more fully describe the present invention to those skilled in the art, and the following embodiments may be modified in various other forms, The present invention is not limited to the following embodiments. Rather, these embodiments are provided so that this disclosure will be more thorough and complete, and will fully convey the concept of the invention to those skilled in the art.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the singular forms "a", "an," and "the" include plural forms unless the context clearly dictates otherwise. Also, as used herein, "comprise" and / or "comprising" specifies the presence of the mentioned shapes, numbers, steps, actions, members, elements and / or groups of these. It is not intended to exclude the presence or the addition of one or more other shapes, numbers, acts, members, elements and / or groups. As used herein, the term "and / or" includes any and all combinations of one or more of the listed items.

Although the terms first, second, etc. are used herein to describe various elements, regions and / or regions, it should be understood that these elements, components, regions, layers and / Do. These terms do not imply any particular order, top, bottom, or top row, and are used only to distinguish one member, region, or region from another member, region, or region. Thus, the first member, region or region described below may refer to a second member, region or region without departing from the teachings of the present invention.

Hereinafter, embodiments of the present invention will be described with reference to the drawings schematically showing embodiments of the present invention. In the figures, for example, variations in the shape shown may be expected, depending on manufacturing techniques and / or tolerances. Accordingly, embodiments of the present invention should not be construed as limited to any particular shape of the regions illustrated herein, including, for example, variations in shape resulting from manufacturing.

First embodiment

1, 2 and 12, the probe probe block of the present invention is largely composed of a block body 100, an elastic portion 200, a test unit 300, a substrate 400.

The block body 100 includes a first block body 110 and a second block body 120 disposed at a rear end of the first block body 110. Therefore, the block body 100 is configured in a separate type.

An inclined surface S inclined downward along the front end is formed at a lower end of the first block body 110.

A first installation region A1 is formed at the lower end of the first block body 110, that is, the inclined surface S. FIG. The first installation area A1 is an area in which the elastic part 200 to be described later is disposed.

A lower end of the second block body 120 is formed to form a horizontal plane S ', and a second installation area A2 is formed on the horizontal plane S'. The second installation area A2 is an area where the substrate 400 is disposed.

In addition, the first block body 110 is formed with a plurality of alignment holes (H) penetrating up and down. Alignment pins P are inserted into the plurality of alignment holes H, respectively.

In addition, a plurality of fastening holes (not shown) are formed at the lower end of the first block body 110.

The plurality of fastening holes are holes for fastening the fastening member 220 to be described later, and are used for fixing the elastic part 200.

As described above, the elastic part 200 disposed on the inclined surface S of the first block body 110 includes a leaf spring 210 as shown in FIG. 3.

The leaf spring 210 is formed of a spring steel having a certain thickness, width and area.

The plate spring 210 is formed with a through hole 211 corresponding to the fastening hole. The fastening member 220 fastened to the fastening hole may pass through the through hole 211.

According to the thickness and the material of the leaf spring 210 has a unique elastic force.

Material and type of the leaf spring 210 will be described later.

One end of the leaf spring 210 is arranged to protrude to the first length from the front end of the first block body 110, the other end is arranged to protrude to the second length from the rear end of the first block body (110).

Here, the first length and the second length may be the same or different from each other.

In the case of the first length, the first bending part 311 of the film 310 attached to one end of the leaf spring 210 may be inversely proportional to the contact pressure generated when the first bending part 311 contacts the panel (not shown). The length may be inversely proportional to the contact pressure between the second bending part 312 of the film 310 attached to the other end of the leaf spring 210 and the substrate 400.

Therefore, the leaf spring 210 is fixed to the inclined surface (S) of the first block body 110 in a state inclined through the fastening member 220.

The leaf spring 210 is provided with a test unit 300 according to the present invention.

The test unit 300 may include a film 310 and contact lines 320.

The film 310 is a flexible circuit board formed of a flexible dielectric and has a predetermined thickness, width, and area. The length of the film 310 is formed longer than the length of the leaf spring (210).

The contact lines 320 are formed to form a predetermined interval on the lower surface of the film 310.

The contact lines 320 are formed of a conductor and are electrically contacted with test terminals formed on a panel (not shown).

The contact lines 320 are manufactured to form the same spacing at one end and the other end of the film 310.

In addition, the spacing of the contact lines 320 is variably adjustable prior to installation in the leaf spring (210). In other words, the interval between the contact lines 320, the test terminal formed on the lead wires of the panel to be tested by applying an external force to the flexible film 310, that is, the test terminal formed on the panel prior to installation on the leaf spring 210 The pitch is corrected to match the spacing between them.

For example, when high temperature heat is applied to the soft film 310, the film 310 forms a stretchable state.

In addition, when the film 310 is widened along the width direction by using an external force, the distance between the contact lines 320 may be varied.

In this manner, in the present invention, the pitch of the contact lines 320 is pitch-corrected to match the gap between the test terminals formed in the panel, and after the pitch is corrected, it may be installed on the leaf spring 210. .

One end of the film 310 forms a first bending part 311 having a shape that is rolled upward.

In addition, the other end of the film 310 forms a second bending part 312 having a shape that is rolled upward.

One end of the film 310 is attached to and fixed to one bottom surface of the leaf spring 210. The method of attachment may be attached using an adhesive or a release paper.

In addition, contact lines 320 are positioned on an outer surface of the first bending part 311.

In addition, the other end of the film 310 is fitted to the other end of the leaf spring 210 is fixed. That is, the second bending part 312 may be fixed by being fitted to the other end of the leaf spring 210. The fixing may be performed by using an adhesive or a release paper as described above.

Here, contact lines 320 are positioned on the outer surface of the second bending part 312.

Therefore, by fixing both ends to the leaf spring 210 so that the upper surface of the film 310 is in close contact with the lower surface of the leaf spring 210, the film 310 can be installed.

Therefore, as shown in FIG. 4, the leaf spring 210 provided with the film 310 is installed on the inclined surface S of the first block body 110 in a state of forming a predetermined inclination along the inclined surface S. FIG. .

Referring to FIG. 5, the substrate 400 is formed to be soft, and at one end thereof, the connection terminals 410 are formed to have a predetermined interval.

An interval between the connection terminals 410 may be substantially the same as an interval between the contact lines 320 formed on the film 310.

The substrate 400 as described above is attached to the horizontal surface (S ') formed at the lower end of the second block body 120 is installed.

Here, one end of the substrate 400, that is, one end where the connection terminals 410 are formed, is positioned at the rear side of the second block body 120 and fixed to the rear side.

The distance located to the rear side is determined by the position in contact with the second bending portion 312 of the film 310 is fixed to the other end of the leaf spring (210).

Referring to FIG. 6, as described above, the assembled second block body 120 may be coupled to the first block body 110 by moving along the lower portion from the upper side of the rear end side of the first block body 110.

Therefore, the inclined surface S of the first block body 110 and the horizontal surface S ′ of the second block body 120 are formed with an angle between the obtuse angles.

Subsequently, the second bending part 312 of the film 310 fixed to the other end of the leaf spring 210 protruding toward the rear side of the first block body 110 is elastically in close contact with one end of the substrate 400.

Therefore, the contact lines 320 exposed on the outer surface of the second bending part 312 and the connection terminals 410 formed at one end of the substrate 400 are elastically and physically contacted with each other.

That is, the leaf spring 210 may press one end of the substrate 400 at the other end thereof.

Here, the first and second block bodies 110 and 120 may be fixed to both sides by a bracket 190 as shown in FIG. 7.

Meanwhile, referring to FIGS. 8 and 9, one end of the leaf spring 210 protrudes a predetermined distance toward the front of the first block body 110.

Here, the elastic force generated when the first bending part 311 is pressed to contact the panel may vary according to the protruding distance.

In addition, since the first bending part 311 of the film 310 is fixedly attached to the lower surface of one end of the leaf spring 210 in a state of being rolled upward, a buffer space may be formed therein.

Meanwhile, referring to FIGS. 10 and 11, the protruding length of the leaf spring 210 according to the present invention can be adjusted.

The protruding length of the leaf spring 210 may be performed by changing the installation position of the leaf spring 210 at the lower end of the first block body 110.

The leaf spring 210 having the first protruding length L1 as shown in FIG. 10 may have a larger elastic force than the leaf spring 210 having the second protruding length L2 shown in FIG. 11.

Here, the first protrusion length L1 is formed longer than the second protrusion length L2.

This is an element that absorbs the impact force generated when the first bending part 311 of the film 310 fixed to one lower surface of the leaf spring 210 contacts the test terminal of the panel.

Meanwhile, the leaf spring 210 according to the present invention may be formed of various materials.

The leaf spring 210 may be formed of any one of a spring steel series, a resin series, a plastic series, and a stainless series.

Therefore, the material of the leaf spring 210 may be manufactured differently according to the contact pressure between the contact lines 320 of the first bending part 311 and the panel.

In addition, the leaf spring 210 according to the present invention may further form an insulating film coating layer (not shown) on the outer surface. As the insulating film coating layer, it is preferable to use an insulating film.

In this case, it has high thermal stability and effective mechanical properties, and can protect the outer surface of the leaf spring 210 to prevent rust and corrosion.

In addition, the leaf spring 210 may be post-processed.

The post-treatment is preferably a heat treatment step of washing with water, recovering, drying, chromate treatment, rust prevention liquid deposition, and hydrogen embrittlement prevention in order to compensate for the weak point of each material.

Next, referring to FIGS. 12 to 14, the operation through the overall configuration of the probe block according to the first embodiment of the present invention will be described.

Referring to FIG. 12, the leaf spring 210 on which the film 310 is fixed is fixedly installed on the inclined surface S at the bottom inclined surface S of the first block body 110. And both ends protrude forward and backward of the first block body 110. The protruding length is the same as described above.

The second block body 120 is disposed at the rear end of the first block body 110. The horizontal surface S ′ of the second block body 120 is formed to be stepped upward with the lower end of the first block body 110.

A substrate 400, which is a flexible circuit board, is fixedly installed at a lower end of the second block body 120.

Referring to FIGS. 13 and 14, the second bending part 312 of the film 310 inserted into and fixed to the other end of the leaf spring 210 may include connection terminals 410 and the leaf spring formed at one end of the substrate 400. It has elastic force by 210 and is in physical contact.

Thus, a state in which an electrical signal can flow is formed between them.

In addition, since the elastic force is brought into contact with each other, the adhesion force can be improved to maintain an easy electrical contact state.

The probe block having the above-described configuration forms a predetermined elasticity with the test terminals formed on the panel of the first bending part 311 of the film, which forms an inclined space and forms its own buffer space in a state of being attached to one end of the leaf spring. By making the contact, the contact pressure can be stably formed and the shock generated during the allergic contact can be alleviated, and further, the electrical test for the panel can be stably performed.

In addition, the probe block of the present invention can selectively change the contact pressure between the terminals formed in the panel and the contact lines by variably adjusting the material of the leaf spring or the protruding length of the leaf spring.

On the other hand, as shown in Figure 15 and 16, the test apparatus of the present invention is fixed to the test device body 500, the probe block 500, the probe block 1 is disposed in the front end, the test device, It is installed at the front end of the body 500, it may be composed of an elastic plate block 600 to form a predetermined elasticity up and down.

In the present invention, by changing the material, thickness, material, etc. of the elastic plate block 600, it is also possible to manufacture by implementing a variety of contact pressure in the required panel test.

Thus, the test apparatus of the present invention can increase the service life of the film and reduce the damage of the film even when the plurality of probe blocks are independently contacted with the panel without the need of using a separate device providing a conventional auxiliary elasticity.

In the above, the first embodiment of the probe block of the present invention has been described with reference to FIGS. 1 to 16.

Second Embodiment

Next, a second embodiment of a probe block of the present invention will be described with reference to FIGS. 17 to 21.

In describing the second embodiment, description of the same configuration as that of the first embodiment will be omitted.

The probe block according to the present invention includes a block body 101, an elastic part 200, a test part 300, and a substrate 400.

Here, the configuration of the elastic unit 200, the test unit 300 and the substrate 400 is substantially the same as the configuration of the first embodiment.

However, it may be different that the block body 101 is integrally configured.

The block body 101 is formed of one body.

An inclined surface S is formed at a lower end of the block body 101, and a horizontal surface S ′ is formed to be horizontal at a position stepped upward from an end of the inclined surface S.

Therefore, as shown in FIG. 18, the leaf spring 210 to which the film 310 is fixed is fixedly installed on the inclined surface S, and both ends of the leaf spring 210 are front and rear of the inclined surface S. FIG. Protrudes.

In addition, referring to FIG. 19, the substrate 400 is fixedly installed on the horizontal surface S ′.

Here, the auxiliary block 102 of a predetermined thickness may be installed on the horizontal surface S '. The thickness of the auxiliary block 102 may be replaced to have a different thickness.

Subsequently, as shown in FIG. 20, the second bending part 312 of the film 310 fixed to the other end of the leaf spring 210 is connected to the connection terminals 410 and the plate formed at one end of the substrate 400. While forming the elastic force of the spring 210 is in close contact and contact.

In addition, referring to FIG. 21, one end of the leaf spring 210 protrudes a predetermined length toward the front of the block body 101, and a first bending part 311 of the film 310 is disposed on one lower surface of the leaf spring 210. Is fixed to be attached.

Configuration number '10' illustrated in FIG. 21 is a release paper for attaching and fixing the first bending part 311 to one bottom surface of the leaf spring 210.

The release paper is the first and second adhesive members. The first adhesive member may attach the first bending part 311 to one lower surface of the leaf spring 210, and the second adhesive member may be fitted to the other end of the leaf spring 210. To the other end of the leaf spring 210 can be fixed.

The effect and advantage when the first bending part 311 shown in FIG. 21 is in contact with the test terminal of the panel may be substantially the same as in the first embodiment.

That is, the probe block according to the second embodiment forms a predetermined elasticity with the test terminals formed on the panel to form the first bending part of the film which forms the self cushioning space in a state inclined and attached to one end of the leaf spring. By making the contact, the contact pressure can be stably formed and the shock generated during the allergic contact can be alleviated, and further, the electrical test for the panel can be stably performed.

While specific embodiments of the probe block and the panel test apparatus having the same have been described above, it is obvious that various embodiments can be modified without departing from the scope of the present invention.

Therefore, the scope of the present invention should not be limited to the above-described embodiments, but should be determined by the scope of the appended claims and equivalents thereof.

It is to be understood that the foregoing embodiments are illustrative and not restrictive in all respects and that the scope of the present invention is indicated by the appended claims rather than the foregoing description, It is intended that all changes and modifications derived from the equivalent concept be included within the scope of the present invention.

1: probe block 100, 101: block body
110: first block body 120: second block body
200: elastic portion 210: leaf spring
220: fastening member 300: test part
310: film 311: first bending part
312: second bending portion 320: contact line
400: board 410: connection terminal

Claims (13)

Block body;
An elastic part installed to be inclined downward at a lower end of the block body;
A flexible test unit having a plurality of contact lines formed at predetermined intervals, and having both ends bent to both ends of the elastic part; And
Probe block is disposed on the lower end of the block body, characterized in that it comprises a flexible substrate that one end is in elastic contact with the other end of the test unit and is in electrical communication with the contact lines. The method of claim 1,
At the bottom of the block body,
Probe block characterized in that the inclined surface is inclined downward. The method of claim 1,
The elastic portion
Probe block having a predetermined elastic force, is formed in a plate shape, both ends protruding to make a predetermined length on both ends of the block body. The method of claim 3,
The test section,
Including a film in which the plurality of contact lines are formed,
A first bending part is formed at one end of the film, and a second bending part is formed at the other end of the film,
The first bending part is disposed to surround the lower end of one end of the leaf spring protruding forward of the block body,
And the second bending part is arranged to surround the other end of the leaf spring protruding to the rear of the block body. 5. The method of claim 4,
In the first bending part,
And the contact lines exposed at one end of the leaf spring. 5. The method of claim 4,
The first bending part is attached to one lower surface of the leaf spring through the first adhesive member,
And the second bending part is attached to one bottom surface of the substrate via a second adhesive member. The method of claim 3,
The leaf spring is,
A probe block formed of any one of spring steel, resin, plastic, and stainless steel. The method of claim 3,
Around the leaf spring,
Probe block, characterized in that the insulating film coating layer is further formed. The method of claim 3,
Probe block is characterized in that the leaf spring is manufactured by heat treatment. 5. The method of claim 4,
The spacing of the contact lines,
The probe block is characterized in that the pitch (Pitch) correction to match the gap between the lead wires of the panel to be tested by applying an external force to the flexible film. The method of claim 3,
The block body,
A first block body having a first installation region in which the leaf spring is disposed;
A second block body disposed at a rear end of the first block body and having a second installation area in which the substrate is disposed;
The second block body,
And the second installation region is disposed upwardly to be stepped with the first installation region. The method of claim 3,
The block body,
A first installation region in which the leaf spring is disposed;
A second installation region on which the substrate is disposed;
And the first mounting region and the second mounting region are formed in a stepped shape. The probe block of any one of claims 1 to 12;
A test device body in which the probe block is disposed at a front end; And
And an elastic plate block fixed to the probe block and installed at a front end of the test apparatus body to form a predetermined elasticity up and down.

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