KR101655262B1

KR101655262B1 - Needle type pin board

Info

Publication number: KR101655262B1
Application number: KR1020160024470A
Authority: KR
Inventors: 박종현; 이용관
Original assignee: 주식회사 프로이천
Priority date: 2016-02-29
Filing date: 2016-02-29
Publication date: 2016-09-08

Abstract

The present invention relates to a needle type pin board for a panel inspection. The needle type pin board comprises: a base block; a substrate coupled to the base block; and a plurality of probe pins wherein a protrusion portion for contacting a lead line of a panel is formed on one end of each probe pin, and the other end of each probe pin directly contacting the substrate. As such, the needle type pin increases productivity.

Description

[0001] NEEDLE TYPE PIN BOARD [0002]

BACKGROUND OF THE INVENTION 1. Field of the Invention [0001] The present invention relates to a needle type pin board, and more particularly, to a needle type pin board capable of stably performing electrical inspection of a liquid crystal display panel of a communication device such as a cellular phone.

2. Description of the Related Art In general, a flat panel display panel refers to a display device such as an organic light emitting diode (OLED), a liquid crystal display (LCD), and a plasma display panel (PDP) There are two types of panels: one is a film transistor, the other is a twisted nematic (TN), the other is a super twisted nematic (STN), the other is a color super twisted nematic (CSTN) And is employed in a liquid crystal display panel of a communication device such as a cellular phone, for example.

A probe block is used to check whether the liquid crystal display panel operates normally without a pixel error.

2. Description of the Related Art In recent years, the density of pixels has been increasing as a liquid crystal display panel has become higher in quality, and the need for a narrow pitch probe block has increased due to size reduction. Probes developed to date include needle type made of tungsten or rhenium tungsten wire, blade type made of nickel or beryllium copper, copper plate made of polyimide film, A film type produced by etching and etching a conductor, a hybrid type in which a conductive medium is injected into a film type using a semiconductor process technology, and a pogo pin using spring tension. (Pogo type), and MEMS type (MEMS type) using semiconductor MEMS process technology.

The conventional needle type pin board mounted on the probe block for inspecting the liquid crystal display panel is coupled between the main board and the probe pin included in the probe block so as to be in contact with the rear end of the probe pin including the needles, And a flexible printed circuit board (FPCB) serving to transmit a signal inputted to the main board.

Accordingly, in the conventional needle type pin board, since the first contact point of the lead wire and the needle, the second contact point of the needle and the flexible circuit board, and the third contact point of the flexible circuit board and the main board, Since three electrical contacts are generated by the flexible circuit board when the leads and the needles are in contact with each other, electrical characteristics such as noise are reduced and electrical inspection can not be performed stably.

In addition, the conventional needle type pin board has a problem that the economical efficiency of the product and the productivity of the product are deteriorated by forming and arranging the flexible circuit board.

SUMMARY OF THE INVENTION The present invention has been made in order to solve the above-mentioned problems, and it is an object of the present invention to provide a needle type pin board capable of stably performing electrical inspection on a panel by reducing the number of electrical contacts between a lead wire of the panel and the board. There is a purpose.

The present invention relates to a needle type pin board for inspecting a panel, comprising: a base block; a substrate coupled to the base block; and a plurality of protrusions formed at one end for contacting the lead wire of the panel, Probe pins.

The probe pins are fixed to one side of the slit portion mounted on the base block and fixed to the other side by a pressing portion disposed below the base block in contact with the other end of the probe pins, Lt; RTI ID = 0.0 > substrate < / RTI >

The probe pins may include first type probe pins and second type probe pins having different positions of the other ends of the probe pins in contact with the bottom surface of the substrate when the probe pins are aligned with respect to the protrusions.

In addition, the first type probe pins and the second type probe pins may be alternately arranged.

The other end of the first type probe pin that is in contact with the bottom surface of the substrate may be located further from the protrusion than the other end of the second type probe pin that is in contact with the bottom surface of the substrate.

The present invention relates to a needle type pin board, in which a main board and a probe pin are directly contacted with each other and electrically connected to each other without the need for a flexible circuit board, so that electrical contact by the flexible circuit board is reduced, So that the electrical inspection of the panel can be stably performed.

Further, since the present invention does not require a flexible circuit board, it is not necessary to form and arrange a flexible circuit board, thereby improving the economical efficiency of the product and improving the productivity of the product.

1 is a bottom perspective view of a needle type pin board according to an embodiment.
2 is a planar perspective view of a needle type pin board according to an embodiment.
3 is an exploded perspective view of a needle type pin board according to an embodiment.
4 is a perspective view showing a probe pin which is in direct contact with the main substrate of FIG.
5 is a perspective view of the slit portion and the probe pin of FIG. 3;
FIG. 6 is a perspective view showing a pressing portion in contact with the probe pin coupled with the slit portion of FIG. 5;
FIG. 7 is a perspective view showing the probe pin of FIG. 3. FIG.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the accompanying drawings.

Embodiments of the present invention are provided to more fully describe the present invention to those skilled in the art, and the following embodiments may be modified in various other forms, The present invention is not limited to the following embodiments. Rather, these embodiments are provided so that this disclosure will be more thorough and complete, and will fully convey the concept of the invention to those skilled in the art.

The terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the invention. As used herein, the singular forms "a", "an," and "the" include plural forms unless the context clearly dictates otherwise. Also, " comprise " and / or " comprising " as used herein specify the presence of stated shapes, numbers, steps, operations, elements, elements, and / , But does not preclude the presence or addition of one or more other features, integers, operations, elements, elements, and / or groups. As used herein, the term " and / or " includes any and all combinations of any of the listed items.

Although the terms first, second, etc. are used herein to describe various elements, regions and / or regions, it should be understood that these elements, components, regions, layers and / Do. These terms do not imply any particular order, top, bottom, or top row, and are used only to distinguish one member, region, or region from another member, region, or region. Thus, the first member, region or region described below may refer to a second member, region or region without departing from the teachings of the present invention.

Hereinafter, embodiments of the present invention will be described with reference to the drawings schematically showing embodiments of the present invention. In the figures, for example, variations in the shape shown may be expected, depending on manufacturing techniques and / or tolerances. Accordingly, embodiments of the present invention should not be construed as limited to any particular shape of the regions illustrated herein, but should include variations in shape resulting from, for example, manufacture.

FIG. 1 is a bottom perspective view of a needle type pin board according to an embodiment, and FIG. 2 is a plan perspective view of a needle type pin board according to an embodiment. And FIG. 3 is an exploded perspective view of the needle type pin board according to the embodiment.

1 to 3, a needle type pin board according to an embodiment for inspecting a panel includes a base block 10, a main substrate 30, a slit portion 50, a pressing portion 70, And a pin (90). Here, each of the probe pins 90 contacts the main board 30 directly.

The base block 10 includes a housing part 11 having a mounting groove 13 on which the slit part 50 is mounted. The main board 30 is coupled to the upper portion of the base block 10 and the pressing portion 70 is coupled to the lower portion of the base block 10. The base block 10 further includes a hole portion 15 formed to directly contact the main substrate 30 to which the probe pins 90 fixed to the pressing portion 70 are coupled, .

The main board 30 is electrically connected to an external inspection apparatus through a connector C, and inputs and outputs signals from each other. The main board 30 applies an inspection signal for inspecting the panel to the panel through the probe pin 90 so that the inspection of the panel proceeds.

The main substrate 30 includes a control unit, a driving voltage generating unit, and a plurality of electrode lines for transmitting signals received through the probe pins 90 connected to the lead wires of the panel. Here, the controller outputs a control signal, and the driving voltage generator outputs voltages necessary for operation of the display device, for example, a power source voltage, a gate-on voltage, and a gate-off voltage.

4 is a perspective view showing a probe pin which is in direct contact with the main substrate of FIG. Here, FIG. 4 is a diagram in which the slit portion 50 and the pressing portion 70 for fixing the probe pin are omitted.

Each of the probe pins 90 is formed at one end with a second protrusion 111, which will be described later, for contact with each corresponding lead of the panel. In particular, as shown in FIG. 4, The projecting portion 96 directly contacts the main board 30. [

Here, the probe pin 90 is formed of a thin metal plate having a predetermined thickness. When the probe pins 90 are aligned A1 based on a second protrusion 111 described later, the first protrusions 96, which are the other end of the probe pins 90 contacting the bottom surface of the main substrate 30, Type probe pins and second type probe pins. For example, referring to FIG. 4, the first and second type probe pins have the same configuration, but the first protrusion 96-1 of the first type probe pin is connected to the first protrusion 96 of the second type probe pin -2). The first protrusion 96-1 joined to the bottom surface of the main substrate 30 of the first type probe pin includes a first protrusion 96-1 bonded to the bottom surface of the main substrate 30 of the second type probe pin, 2) than the second projections 111. As shown in Fig. The first type probe pin and the second type probe pin may be alternately arranged to contact the main substrate 30. Therefore, the receiving portion B1 for receiving the first protrusion 96-1 of the first type probe pin and the receiving portion B2 for receiving the first protrusion 96-2 of the second type probe pin are also disposed in the first Type probe pin and the second type probe pin. That is, the receiving portions may be arranged in a zigzag form as shown in FIG.

Each of the probe pins 90 having the above structure is mounted on the slit portion 50 and is fixed by the slit portion 50 and the pressing portion 70 so as to be in direct contact with the main board 30, 6 to FIG.

5 is a perspective view of the slit portion and the probe pin of FIG. 3; And FIG. 6 is a perspective view illustrating a pressing portion in contact with the probe pin coupled with the slit portion of FIG. Here, FIG. 6 is a view in which the base block 10 is omitted.

As shown in Fig. 5, a needle type probe pin 90 is fitted into the slit portion 50 and is seated. At this time, the probe pin 90 is fitted into the slit portion 50 and is seated and fixed in one direction.

That is, the slit portion 50 is composed of the first slit member 51 and the second slit portion 53 formed by bending the first slit portion 51 at a right angle.

The first slit portion 51 has a fitting groove 511 formed as a groove and into which a first latching end 97 of a probe pin 90 to be inserted is inserted and a second locking protrusion 511 of a probe pin 90 And a latching groove 513 is formed at a position corresponding to the position of the latch 171.

The second slit portion 53 is formed with a recess 531 for accommodating the second connection terminal 110 of the probe pin 90, which will be described later. Both the fitting groove 511 and the receiving portion 531 are formed in a slit-like shape in which the respective probe pins 90 can be individually accommodated.

The probe pin 90 is seated in the slit portion 50 configured as described above in a sliding manner in the direction toward the slit portion 50 and fixed in one direction.

When the slit portion 50 on which the probe pin 90 is mounted is mounted on the base block 10 through the mounting groove 13, one surface of the probe pin 90 in one direction is inserted into the slit portion 50, And the other surface of the probe pin 90 in the other direction opposite to the one direction is exposed to the outside.

As shown in Fig. 6, the other surface of the probe pin 90 is in contact with the pressing portion 70. As shown in Fig. At this time, the pressing portion 70 is coupled to the lower portion of the base block 10. The probe pin (90) is fixed in the other direction by the pressing portion (70) which is in contact with the other surface of the probe pin (90).

At this time, the slit portion 50 on which the probe pin 90 is mounted is mounted on the base block 10 through the mounting groove 13, and the probe pin 90 is mounted on the slit portion 50 and the pressing portion 70 The second protrusion 111 which is one end of the probe pin 90 will be in contact with the lead wire of the panel and the first protrusion 96 which is the other end of the probe pin 90 opposite to the one end, (30).

As described above, the needle type pin board according to the embodiment does not require a flexible circuit board, and the main board 30 and the probe pin 90 directly contact each other and are electrically connected to each other.

That is, the flexible circuit board, which is an essential constitution of the prior art, is coupled between the main board and the probe pin so as to be in contact with the rear end of the probe pin, and transmits a signal input at the time of panel inspection to the main board.

Accordingly, the number of the electrical contacts between the lead wire of the panel and the main board 30 is reduced when the panel is inspected, compared to the prior art in which the flexible circuit board is an essential component, The electric characteristics can be improved more than the technology.

The needle type pin board according to the embodiment does not need to form and arrange the flexible circuit board, thereby improving the economical efficiency of the product and improving the productivity of the product.

In the needle type pin board according to the embodiment, the first type probe pins and the second type probe pins are alternately arranged on the bottom surface of the main board 30 so that the probe pins 90 Can be contacted with a smaller pitch, so that it is possible to cope with the trend of high image quality of the liquid crystal display panel.

That is, as the liquid crystal display panel becomes higher in quality, the density of pixels increases and the necessity of a probe block having a narrow pitch due to the reduction in size is increasing. Accordingly, each probe pin 90 ) Are in direct contact with each other, the pitch between the probe pins 90 should be small.

4, the positions of the first protrusions 96-1 and 96-2 contacting the bottom surface of the main substrate 30 are set such that the positions of the first protrusions 96-1 and 96-2 Respectively. Accordingly, the first type probe pins and the second type probe pins, which are formed such that the positions of the first projections 96-1 and 96-2 are different from each other, can be alternately arranged, The second type probe pins may be alternately arranged on the bottom surface of the main substrate 30 so as to be in direct contact therewith.

Hereinafter, the structure of the probe pin 90 will be described in detail.

FIG. 7 is a perspective view showing the probe pin of FIG. 3. FIG. Referring to FIG. 7, the probe pin 90 of the present invention includes a pin body 91 on a plate.

The probe pin 90 includes an extension 93 extending upward from the upper end of the pin body 91 and spaced apart from the pin body 91 and extending from the other end of the extension 93 in the other direction And a first connecting end 95 which is shorter than the pin body 51 and has a first protrusion 96 for contacting the main board 30 directly at an end thereof.

Here, the first projecting portion 96 is formed at the end of the first connecting end 95 and is bent at a right angle in the upward direction. The first projecting portion 96 is brought into pressure contact with the main board 30 by the elastic force formed by the first connecting end 95.

And a first latching end 97 formed to extend from the extension 93 between the pin body 91 and the first connection end 95 in the other direction so as to be shorter than the first connection end 95. At this time, the slit portion 50 is closely accommodated in the inner space between the pin body 91 and the first engaging end 97.

The probe pin 90 includes a bending portion 99. The bending portion 99 has a structure in which the bending portion 99 is bent while a certain curvature is formed from a lower portion of one side of the pin body 91. That is, the bending part 99 may have a ring-like shape as a whole, and one or more holes may be formed in the bending part 99 to easily absorb impact from the outside.

The probe pin 90 includes a second connection terminal 110. The second connection terminal 110 is connected to the other end of the bending portion 99, And the first latching end 97 extend in the same direction as the direction extending from the extending portion 93. [ The second protrusion 111 is formed at the end of the second connection terminal 110 in a downward direction, that is, in a direction opposite to the protrusion direction of the first protrusion 96. The second protrusion 111 is formed on the lead wires of the panel Contact.

The probe pin 90 includes a second latching end 130. The second latching end 130 surrounds the upper portion of the bending portion 99 from one end of the pin body 91, (110), and a first locking protrusion (131) is formed at an end thereof.

The probe pin 90 is inserted into the groove 150 and extends from one end of the pin body 91 to the other end of the third latching end 130. [ (170). A second latching protrusion 171 is formed at the end of the third latching end 170 to be fixed to the latching groove 513 formed in the first slit portion 51.

The second engaging projection 171 is formed in an arc shape and protrudes from the engaging groove 513 partly. The horizontal plane on the upper side of the third locking end 170 is configured to coincide with the upper horizontal plane of the second locking end 130, and only the second locking projection 171 protrudes from the upper horizontal plane. Of course, this is merely an example, and it is also possible to form the third locking step 170 so as to go up to the end so that the third locking step 170 can be engaged and fixed to the slit part 50 with a stronger force.

Although the embodiments of the needle type pin board according to the embodiment of the present invention have been described above, it is apparent that various modifications can be made without departing from the scope of the present invention.

Therefore, the scope of the present invention should not be construed as being limited to the embodiments described, but should be determined by equivalents to the appended claims, as well as the following claims.

It is to be understood that the foregoing embodiments are illustrative and not restrictive in all respects and that the scope of the present invention is indicated by the appended claims rather than the foregoing description, It is intended that all changes and modifications derived from the equivalent concept be included within the scope of the present invention.

10: base block 11: housing part
13: mounting groove 15:
30: main substrate 50: slit part
70: pressing portion 90: probe pin

Claims

A needle type pin board for panel inspection,
A base block having at least one hole portion;
A substrate coupled to the base block;
A plurality of probe pins having protrusions for contacting the lead wires of the panel at one end and directly contacting the substrate at the other end;
A slit portion mounted on the base block such that the probe pins are fitted so that the probe pins are fixed in one direction; And
A pressing portion disposed at a lower portion of the base block so as to contact the other end of the probe pins so that the probe pins are fixed in the other direction; / RTI >
The probe pins positioned at a lower portion of the base block are fixed in one direction by the slit portion and fixed in the other direction by the pressing portion so as to be in direct contact with the bottom surface of the substrate coupled to the upper portion of the base block through the hole portion Needle type pin board.

delete

The probe of claim 1,
Type probe pins and second type probe pins having different positions of the other end thereof in contact with the bottom surface of the substrate when the protrusions are aligned with respect to the protrusions,
Wherein the first type probe pins and the second type probe pins are alternately arranged.

The method of claim 3,
And the other end of the first type probe pin that is in contact with the bottom surface of the substrate is located farther from the protrusion than the other end of the second type probe pin that is in contact with the bottom surface of the substrate.