KR101655248B1 - Probe block for testing panel - Google Patents

Probe block for testing panel Download PDF

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Publication number
KR101655248B1
KR101655248B1 KR1020160025222A KR20160025222A KR101655248B1 KR 101655248 B1 KR101655248 B1 KR 101655248B1 KR 1020160025222 A KR1020160025222 A KR 1020160025222A KR 20160025222 A KR20160025222 A KR 20160025222A KR 101655248 B1 KR101655248 B1 KR 101655248B1
Authority
KR
South Korea
Prior art keywords
film
attached
block
probe
pressing member
Prior art date
Application number
KR1020160025222A
Other languages
Korean (ko)
Inventor
박종현
이용관
Original Assignee
주식회사 프로이천
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 주식회사 프로이천 filed Critical 주식회사 프로이천
Priority to KR1020160025222A priority Critical patent/KR101655248B1/en
Application granted granted Critical
Publication of KR101655248B1 publication Critical patent/KR101655248B1/en

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
    • G01R1/07371—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate card or back card with apertures through which the probes pass
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

A probe block for a panel test according to the present invention comprises: a body block; A film on which probe lead wires are formed for contact with lead wires of a panel to be tested; And a plate attached to the bottom of the body block and detachable from the bottom of the body block with the film attached.

Description

PROBE BLOCK FOR TESTING PANEL}

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a probe block for panel testing, and more particularly to a film-type probe block for panel testing.

A probe block is used to test whether a display panel, such as an LCD panel, an LED panel, an OLED panel, etc., is operating normally without a pixel error.

In recent years, the density of pixels has increased as the panel has become higher in quality, and the necessity of a probe block having a narrow pitch has been increasing. The probes developed so far include a needle type made of tungsten or rhenium-tungsten wire, a blade type made of nickel or beryllium copper, a copper plate attached to a polyimide film, Film type which is produced by etching other conductive materials, Hybrid type which is made by injecting conductive medium by using semiconductor process technology in film type, Pogo pin by spring tension, (Pogo type), which is manufactured by using a MEMS process technology, and a MEMS type (MEMS type) using a semiconductor MEMS process technology.

The conventional probe block is generally provided with needles in the form of a wire and has a structure in which the needles are bonded and fixed by an epoxy resin to limit the reduction of the outer diameter of the needle. That is, the mounting surface of the needle holder on which the needles are mounted is limited. However, since the display device is highly integrated and the number of terminals is extremely increased, it is difficult to arrange the wire type needles as many as necessary. In addition, it is impossible to precisely make physical contact with the contacts on the panel due to the impact due to the inspection, and there is a problem that the probe pins are deflected or deformed by absorbing the impact generated at the time of contact, .

In order to solve this problem, a film type probe block is attracting attention. The conventional film type probe block has a structure in which a film on which probe lead wires are formed for contacting the lead wires of the test subject panel is attached to the bottom surface of the probe block so that the film of the probe block contacts the lead wires of the panel with appropriate pressure. Mounted manipulator.

In many cases, the film attached to the probe block is worn out or the film is damaged such as the pattern is broken. In such a case, the probe block mounted on the manipulator must be completely replaced. Replacement of such a probe block not only leads to an increase in cost but also causes a decrease in productivity due to the replacement of the probe block.

Also, according to the implementation, the probe block is provided with a pressing member for elastically pressing a portion of the film that is in contact with the panel. If burning or sparking occurs during the test process, the pressing member may be damaged due to the characteristics of the material. In such a case, since the probe block must be replaced entirely, the cost and the productivity are lowered as in the case of the film.

SUMMARY OF THE INVENTION It is an object of the present invention to provide a probe block for a panel test in which a probe block can be replaced with a film or a pressing member while being fixed to a manipulator.

According to an aspect of the present invention, there is provided a probe block for a panel test comprising: a body block; A film on which probe lead wires are formed for contact with lead wires of a panel to be tested; And a plate attached to the bottom of the body block and detachable from the bottom of the body block with the film attached.

The film may be attached to the plate such that the ends where the probe leads are formed protrude from the plate.

The panel test probe block may further include a pressing member for elastically pressing an end portion of the film, on which the probe leads are formed, during a panel test.

The panel test probe block may further include a head block to which the pressing member is attached and detachable from the body block while the pressing member is attached.

The end portion of the film and the pressing member may be in contact without being bonded.

A metal layer integrally formed along the direction of arrangement of the probe leads may be attached to the opposite surface of the end of the film on which the probe leads are formed.

The film may be a film made such that the pitch of the probe leads is smaller than the pitch of the leads of the panel, and the metal layer may be attached to the film while the end portion of the film is stretched.

A step may be formed on the bottom surface of the pressing member to provide a space in which the metal layer is located.

The plate or the main block is provided with a magnet, and the plate can be attached to the body block by a magnetic force.

According to the present invention, it is not necessary to completely replace the probe block when the film or the pressing member is damaged, but only the plate to which the film is attached or the head block to which the pressing member is attached, with the probe block fixed to the manipulator , The cost is reduced, the replacement operation is simple, the component can be quickly damaged, and the productivity can be improved.

1 is a side view of a probe block according to an embodiment of the present invention.
2 is a bottom perspective view of a probe block according to an embodiment of the present invention.
3 is an exploded side view of a probe block according to an embodiment of the present invention.
4 is an exploded bottom perspective view of a probe block according to an embodiment of the present invention.
5 is an exploded perspective view of a probe block according to an embodiment of the present invention.
6 is an enlarged perspective view showing a contact portion between the pressing member 310 and the film 210. Fig.
7 is an enlarged exploded perspective view for explaining a more specific structure of the pressing member 310 and the film 210. As shown in Fig.
8 is a view showing the separation of the plate 200 to which the film 210 is attached from the body block 100.
9 is a view showing that the head block 300 with the pressing member 310 attached thereto is separated from the body block 100. As shown in FIG.

Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the drawings. In the following description and the accompanying drawings, substantially the same components are denoted by the same reference numerals, and redundant description will be omitted. In the following description of the present invention, a detailed description of known functions and configurations incorporated herein will be omitted when it may make the subject matter of the present invention rather unclear.

1 is a side view, FIG. 2 is a bottom side perspective view, FIG. 3 is an exploded side view, FIG. 4 is a bottom side exploded perspective view, and FIG. 5 is a planar side exploded perspective view.

1 to 5, a probe block according to the present embodiment includes a body block 100, a plate 200, a film 210, a flexible circuit board 220, a head block 300, a pressing member 310, .

The body block 100 is fixed to a manipulator (not shown), and is moved up and down by a manipulator during a panel test.

The film 210 has probe leads formed thereon for contacting the leads of the panel to be tested. The film 210 is connected to the flexible circuit board 220 to receive a test signal from the flexible circuit board 220 at the time of testing to output the signal to the panel and output the signal from the panel to the flexible circuit board 220.

The film 210 may be a TIC film or may be a chip on film (COF) type having a driver IC 211 or a type having no driving IC 211.

A film 210 and a flexible circuit board 220 are attached to the bottom of the plate 200. The plate 200 is attached to the body block 100 with the film 210 and the flexible circuit board 220 attached thereto so that the film 210 and the flexible circuit board 220 can be separated from the body block 100. [ And is detachable from the bottom surface.

The pressing member 310 elastically presses the portion of the film 210 that contacts the panel in the panel test, that is, the end portion where the probe leads of the film 210 are formed.

A pressing member 310 is attached to the lower end of the front surface of the head block 300. The head block 300 is also detachable from the lower front surface of the body block 100 with the pressing member 310 attached thereto so that the pressing member 310 can be detached from the body block 100. [

In one embodiment, the plate 200 may be attached to the body block 100 by a magnetic force. To this end, a magnet 120 is provided on the bottom surface of the body block 100, and the plate 200 may be made of a metal material attached to the magnet. On the contrary, a magnet may be provided on the upper surface of the plate 200, and a bottom surface of the body block 100 may be made of a metal material attached to the magnet. The plate 200 can be attached to the body block 100 by magnetic force so that the plate 200 can be easily coupled to the body block 100 or detached from the body block 100 without having to undergo a fastening / There is an advantage.

As another example, the plate 200 may be attached to the body block 100 by fastening means such as screws or the like. For this purpose, the plate 200 and the body block 100 may be formed with corresponding fastening holes for fastening means.

At least two guide pins 110 protrude from the bottom surface of the body block 100 to accurately align the plate 200 with respect to the body block 100. Guide pins 110 are formed on the upper surface of the plate 200, The guide grooves 205 corresponding to the respective guide grooves 205 may be formed. On the other hand, guide pins may protrude from the upper surface of the plate 200, and guide grooves corresponding to the guide pins may be formed on the bottom surface of the body block 100.

The head block 300 may be coupled to the body block 100 by fastening means and may be detached from the body block 100. For this purpose, the head block 300 is formed with fastening holes 330 and the body block 100 may have fastening holes 130 corresponding to the fastening holes 330 of the head block 300 .

At least two guide pins 340 are protruded from the head block 300 to accurately align the head block 300 with respect to the body block 100 and the body block 100 is provided with guide pins 340 Corresponding guide grooves 140 can be formed. On the other hand, guide pins may protrude from the body block 100 and guide grooves may be formed in the head block 300 corresponding to the guide pins.

6 is an enlarged perspective view showing a contact portion between the pressing member 310 and the film 210 in a state where the plate 200 and the head block 300 are coupled to the body block 100, And an enlarged exploded perspective view for explaining a more specific structure of the pressing member 310 and the film 210 with the help of understanding.

The film 210 must be pressed from the pressing member 310 while the probe leads 212 of the end bottom B are in contact with the lead wires of the panel at the time of the panel test so that the film 210 is electrically connected to the probe leads 212 are formed on the bottom surface of the plate 200 so as to protrude from the plate 200. The film 210 is not artificially bonded to the pressing member 310 with an adhesive or the like but the bottom surface of the pressing member 310 is formed to be inclined downward forward so that the film 210 The upper surface A of the end portion of the pressing member 310 comes into contact with the bottom surface R of the end portion of the pressing member 310 and can receive pressure from the pressing member 310. [

The film 210 may be, for example, a taped film that is received from a display device manufacturer in the case of a COF type. In this case, the film 210 may be made such that the pitch of the probe lead wires 212 is smaller than the pitch of the lead wires of the test subject panel. In order to use the film 210 in the probe block, the end portion of the film 210 is pulled to both sides to bond the pitch of the lead wires 212 to the pitch of the lead wires of the panel, can do. That is, the forcefully stretched portion is retained due to the adhesive force to the pressing member 310.

However, in the embodiment of the present invention, since the plate 200 to which the film 210 is attached and the head block 300 to which the pressing member 310 is attached can be detachably attached to the body block 100, The film 210 is not adhered to the member 310. The probe leads 212 are formed on the upper surface of the end portion of the film 210 with the pitch of the lead leads 212 matched with the pitch of the lead wires of the panel by pulling the end portions of the film 210 to both sides, The pitch of the lead wires 212 matched with the pitch of the leads of the panel can be prevented from being reduced again by attaching the metal layer 213 integrally formed along the arrangement direction of the lead wires. That is, the portion of the metal layer 213 that is forcibly stretched due to the rigidity thereof is maintained. 7, the metal layer 213 is pressed against the upper surface of the end portion of the film 210 protruding from the plate 200 (that is, the surface opposite to the surface on which the lead wires 212 are formed) And may be formed adjacent to a portion (A) In other words, the metal layer 213 may be formed on the film 210 immediately behind the portion contacting the panel.

A step 311 is formed on the bottom surface of the pressing member 310 so that the front bottom R of the step 311 is brought into contact with the film 210 while the pressing member 310 is provided behind the step 311, And the metal layer 213 may be provided between the first electrode 210 and the second electrode 210. At the same time, the step 311 can be used to adjust the contact area between the probe lead of the film 210 and the lead of the panel by adjusting the position thereof.

If the film 210 has been fabricated so that the pitch of the probe leads is the same as the pitch of the leads of the test subject panel from the beginning, the metal layer 213 may not be needed since the end portion need not be stretched. In this case, the metal layer 213 may be provided. In this case, the metal layer 213 may serve to prevent deformation of the end portion of the film 210 instead of maintaining the pitch of the lead wires forcibly extended. have.

8 is a view showing the separation of the plate 200 with the film 210 from the body block 100 for replacement of the film 210 when the film 210 is damaged.

According to the embodiment of the present invention, when the film 210 is damaged, the probe block can be replaced with a new plate 200 to which the new film 210 is attached while being fixed to the manipulator. Thus, the cost is reduced and the replacement operation is simple , It can respond quickly to parts damage and improve productivity.

9 shows a state in which the plate 200 with the film 210 attached thereto is separated from the body block 100 and the pressing member 310 is attached to the body block 100 in order to replace the pressing member 310 when the pressing member 310 is damaged. And the head block 300 is separated from the body block 100. As shown in FIG.

According to the embodiment of the present invention, when the pressing member 310 is damaged, the plate 200 is separated while the probe block is fixed to the manipulator, and then the new pressing member 310 is replaced with a new head block 300 The cost is reduced, the replacement operation is simple, the component can be quickly damaged, and productivity can be improved.

The present invention has been described with reference to the preferred embodiments. It will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the invention as defined by the appended claims. Therefore, the disclosed embodiments should be considered in an illustrative rather than a restrictive sense. The scope of the present invention is defined by the appended claims rather than by the foregoing description, and all differences within the scope of equivalents thereof should be construed as being included in the present invention.

Claims (9)

Body block;
A film on which probe lead wires are formed for contact with lead wires of a panel to be tested;
A plate attached to the bottom surface of the body block and detachable from the bottom surface of the body block with the film attached thereto; And
And a pressing member elastically pressing an end portion of the film formed with the probe leads in a panel test,
The film is attached to the plate such that an end of the probe lead is protruded from the plate,
A metal layer integrally formed along an array direction of the probe leads is attached to an opposite surface of the end of the film on which the probe leads are formed,
Wherein the film is a film made so that the pitch of the probe leads is smaller than the pitch of the leads of the panel, and the metal layer is attached to the film while the end portion of the film is stretched. delete delete The method according to claim 1,
Further comprising a head block to which the pressing member is attached and detachable from the body block while the pressing member is attached. The method according to claim 1,
Wherein the end of the film and the pressing member are in contact without being bonded. delete delete The method according to claim 1,
And a step is formed on a bottom surface of the pressing member to provide a space in which the metal layer is located. The method according to claim 1,
Wherein a magnet is provided on the plate or the body block, and the plate is attached to the body block by a magnetic force.
KR1020160025222A 2016-03-02 2016-03-02 Probe block for testing panel KR101655248B1 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
KR1020160025222A KR101655248B1 (en) 2016-03-02 2016-03-02 Probe block for testing panel

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Application Number Priority Date Filing Date Title
KR1020160025222A KR101655248B1 (en) 2016-03-02 2016-03-02 Probe block for testing panel

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KR101655248B1 true KR101655248B1 (en) 2016-09-08

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102098653B1 (en) 2019-09-19 2020-04-10 주식회사 프로이천 Probe block

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20110121064A (en) * 2010-04-30 2011-11-07 티에스씨멤시스(주) Probe unit
KR101175067B1 (en) * 2012-02-07 2012-08-21 주식회사 프로이천 Film type pin board
KR101208337B1 (en) * 2011-06-14 2012-12-05 주식회사 프로이천 Probe block for testing lcd panel
KR101255094B1 (en) * 2013-01-30 2013-04-23 주식회사 프로이천 Separable film type probe block

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20110121064A (en) * 2010-04-30 2011-11-07 티에스씨멤시스(주) Probe unit
KR101208337B1 (en) * 2011-06-14 2012-12-05 주식회사 프로이천 Probe block for testing lcd panel
KR101175067B1 (en) * 2012-02-07 2012-08-21 주식회사 프로이천 Film type pin board
KR101255094B1 (en) * 2013-01-30 2013-04-23 주식회사 프로이천 Separable film type probe block

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102098653B1 (en) 2019-09-19 2020-04-10 주식회사 프로이천 Probe block

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