TW200710415A - Probe for testing flat display panel - Google Patents

Probe for testing flat display panel

Info

Publication number
TW200710415A
TW200710415A TW095125232A TW95125232A TW200710415A TW 200710415 A TW200710415 A TW 200710415A TW 095125232 A TW095125232 A TW 095125232A TW 95125232 A TW95125232 A TW 95125232A TW 200710415 A TW200710415 A TW 200710415A
Authority
TW
Taiwan
Prior art keywords
driving
probe
block
contact portion
display panel
Prior art date
Application number
TW095125232A
Other languages
Chinese (zh)
Inventor
Kyu-Sam Han
Myeong-Ja Yoo
Original Assignee
From 30 Co Ltd
Mct Korea Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by From 30 Co Ltd, Mct Korea Co Ltd filed Critical From 30 Co Ltd
Publication of TW200710415A publication Critical patent/TW200710415A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Abstract

Provided is a probe for testing a flat display panel. The probe includes a probe block, a plurality of needles, a driving IC block. Each of the needles is attached on one end of the probe block and includes a first contact portion and a second contact portion. The first contact portion contacts an electrode pad of the flat display panel. The driving IC block includes a driving IC, which transmits a driving signal to the second contact portion of each of the needles. The connection pad of the driving IC arranged on one side of the driving IC block is located on the second contact portion of each of the needles, and the other side of the driving IC block is fixedly coupled to a fixing part formed in the other end of the probe block. The connection pad of the driving IC contacts the second contact portion of each of the needles when one side of the driving IC block is spaced a predetermined distance from the probe block.
TW095125232A 2005-07-12 2006-07-11 Probe for testing flat display panel TW200710415A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050062573A KR100533193B1 (en) 2005-07-12 2005-07-12 Probe unit for testing plat display pannel

Publications (1)

Publication Number Publication Date
TW200710415A true TW200710415A (en) 2007-03-16

Family

ID=37306519

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095125232A TW200710415A (en) 2005-07-12 2006-07-11 Probe for testing flat display panel

Country Status (2)

Country Link
KR (1) KR100533193B1 (en)
TW (1) TW200710415A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102236183A (en) * 2010-05-06 2011-11-09 迪普劳布株式会社 Probe block and probe unit for display panel check

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100696416B1 (en) * 2006-11-20 2007-03-19 주식회사 리뷰텍 Probe assembly for testing flat display panel
KR100781379B1 (en) 2007-01-30 2007-11-30 안재일 Probe apparatus
CN105242415B (en) * 2015-09-16 2018-10-02 武汉精测电子集团股份有限公司 Probe substrate and display panel testing
KR102117023B1 (en) * 2018-08-30 2020-05-29 대한민국 Eddy Current Testing Device For Aircraft Fuselage Skin Crack Detection
KR102377600B1 (en) * 2020-08-06 2022-03-24 (주)티에스이 Probe card
KR102409030B1 (en) * 2022-05-09 2022-06-14 이시훈 Blade type probe block

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102236183A (en) * 2010-05-06 2011-11-09 迪普劳布株式会社 Probe block and probe unit for display panel check

Also Published As

Publication number Publication date
KR100533193B1 (en) 2005-12-08

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