CN105242415B - Probe substrate and display panel testing - Google Patents
Probe substrate and display panel testing Download PDFInfo
- Publication number
- CN105242415B CN105242415B CN201510587282.4A CN201510587282A CN105242415B CN 105242415 B CN105242415 B CN 105242415B CN 201510587282 A CN201510587282 A CN 201510587282A CN 105242415 B CN105242415 B CN 105242415B
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- Prior art keywords
- probe
- unit
- driving unit
- probe module
- driving
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Classifications
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
Abstract
A kind of probe substrate of present invention offer and display panel testing, the probe substrate are used for the detection device of display panel, and the probe substrate includes：Plummer, the first probe module, the second probe module, the first driving unit group, the second driving unit group, angle adjusting mechanism；Wherein, when the first drive section tuple drives the first probe module to be moved along the second direction, first driving unit drives the first end, and second driving unit synchronizes and drives the second end so that the first end of the first probe module is identical as the second end synchronizing moving and displacement.The probe substrate and display panel testing can make probe contraposition accurate when carrying out display panel detection, ensure that the testing result of display panel is reliable and stablizes, improve accuracy of detection.
Description
Technical field
The present invention relates to a kind of probe substrate and display panel testings more particularly to one kind can accurately adjusting contraposition essence
The probe substrate of degree and the automatic detection device of display panel.
Background technology
General display panel such as liquid crystal display (Liquid Crystal Display, LCD), OLED (Organic
Light-Emitting Diode) etc. display panels to be manufactured by the manufacturing process in multiple stages.In general, display panel
Processing procedure includes the preparation of array substrate (TFT), the preparation of colored filter (Color Filter) substrate, array substrate and colour
Filter sheet base plate forms group the assembling etc. of display panel and display panel and backlight module.
Display panel needs to carry out lighting detection after the completion of to group, and lighting detection is generally by detection device and display
The detection pad of panel connects, to convey R, G, B drive signal to the pixel unit of display panel, to show detection picture,
It such as detects that picture is abnormal, then can find the bad of display panel in advance.
Display panel production firm would generally produce the display panel of sizes, to meet the needs of different user.No
Position setting with the detection pad of the display panel of size may be also different, results in the need for using different lightings in this way
Detection device carries out lighting detection to various sizes of display panel, or is carried out using the detection device that probe location is adjusted
Lighting detects.
Inventor has found that at least there are the following problems in the prior art：As shown in FIG. 1, FIG. 1 is existing probe substrate knots
Structure schematic diagram.Probe substrate 100 includes first side 11 disposed in parallel and third side 13 and the second side disposed in parallel
The first probe module 101 and probe module are respectively arranged on side 12 and four side 14, first side 11 and third side 13
103, probe module 101,103 can be moved along first direction, and first direction is X-direction and the direction in contrast to X in figure；It is identical
Probe module 102 and probe module 104, probe module 102,104 are respectively arranged on ground second side 12 and four side 14
It can move in a second direction, second direction is Y-direction and the direction in contrast to Y in figure.The both ends of four side 14 are right respectively
Answer probe module 101 and probe module 103 that first driving unit 21 and the second driving unit 23 be set, the first driving unit 21 and
Second driving unit 23 is respectively used to driving probe module 101 and is moved along first direction with probe module 103, driving unit 21 and
The first end 101b connections of probe module 101, driving unit 21 drive first end 101b to be moved along first direction, and second
End 101a is then moved under the drive of first end 101b with the second end 101a, therefore will appear 101 position of probe module
After adjustment, first end 101b is bigger than the distance that second end 101a is moved, i.e. the first end 101b of probe module 101 and
The displacement of two end 101a is asynchronous, leads to 101 deflection of probe module, similarly, when driving unit 23 drives probe module 103
Also the nonsynchronous problem of both ends 103a and 103b that will appear probe module 103, causes probe module 103 also to generate deflection, most
Cause probe module 101,103 to be aligned with display panel eventually bad, influences the testing result and accuracy of detection of detection device.
Invention content
Therefore, one of the objects of the present invention is to provide a kind of probe substrate and display panel testings, existing to solve
There is technology middle probe module to align the skill of the bad testing result and accuracy of detection etc. for leading to influence detection device with display panel
Art problem.The present invention provides a kind of probe substrate, is used for the detection device of display panel, and the probe substrate includes：Plummer,
For rectangular box, which has two second sides along two first sides of first direction and in a second direction, this
One direction is the length direction of first side, and the length direction that the second direction is second side；First probe module, along
One direction is arranged, and the first probe module has opposite first end and second end；And the first driving unit group, including
One driving unit and the second driving unit, first driving unit are individually fixed in two the second side with second driving unit
Side, and first driving unit connects the first end of the first probe module, which connects first probe
The second end of module；The first driving unit group is for driving the first probe module to be moved along the second direction；
Wherein, when which drives the first probe module to be moved along the second direction, first driving
Unit drives the first end, and second driving unit synchronizes and drives the second end so that the first probe module this first
End is identical as the second end synchronizing moving and displacement.
Further, the first probe module includes adjustment plate and the first probe unit being set in the adjustment plate,
The first driving unit group also includes micro-move device unit, which is set in the adjustment plate and connects first probe
Unit, the micro-move device unit is for driving first probe unit so that first probe unit is moved along the first direction.
In the technical program, the probe substrate also includes an at least angle adjusting mechanism, and angle adjusting mechanism includes the
One adjustment unit and second adjustment unit, what which connected first driving unit and the first probe module should
First end, the second adjustment unit are fixed in the first end and are folded between the adjustment unit and the first end；Wherein,
When first driving unit drives the first end to be moved along the second direction, which generates along the first direction of rotation
The first displacement, the second adjustment unit and the first adjustment unit relative rotation so that the first end of the first probe module
The second displacement along first direction of rotation is generated, and the second displacement is less than first displacement.
Optionally, the probe substrate also includes an at least angle adjusting mechanism, and angle adjusting mechanism includes the first adjustment
Unit and second adjustment unit, the first adjustment unit connect the second end of second driving unit and the probe module, should
Second adjustment unit is fixed in the second end and is folded between the first adjustment unit and the second end；Wherein, when this
When two driving units drive the second end to be moved along the second direction, which generates the along the second direction of rotation
One displacement, the second adjustment unit and the first adjustment unit relative rotation so that the second end of the first probe module generates
Second displacement along second direction of rotation, and the second displacement is less than first displacement.
Further, the first adjustment unit is square structure part and has pivot end, the pivot end and second tune
Whole unit pivot joint.
Further, the second adjustment unit includes first part and second part, wherein the first part with this
One adjustment unit connects, which connect with the first probe module, and the first part can be opposite with the second part
Rotation.
Further, the probe substrate also includes the second probe module, which is arranged in a second direction,
And there is the second probe module opposite third end and the 4th end, the third end to be separately connected two first side with the 4th end
Side.
Further, the probe substrate also includes the second driving unit group, and the second driving unit group is for driving this
The third end of second probe module is with the 4th end along the first direction synchronizing moving.
Further, the probe substrate, which is characterized in that first driving unit and/or second driving unit
For motor.
The present invention also provides a kind of display panel testing, which includes any one as described above
Probe substrate described in kind, the probe substrate will be for that will detect signal transmission to panel to be detected.
Compared with prior art, usefulness of the present invention is：Due to substrate the right and left side probe unit driving part
Top and the bottom be assembled with driving unit so that the both ends of probe module can synchronizing moving and displacement it is equal, improve spy
The adjustment accuracy of needle mould group, and then the aligning accuracy of probe is improved, it ensure that the testing result of display panel is reliably and steady
It is fixed, substantially increase the detection result and accuracy of detection of display panel testing.
Description of the drawings
Fig. 1 is existing probe substrate structural schematic diagram；
Fig. 2 is the structural schematic diagram of the probe substrate of one embodiment of the invention；
Fig. 3 A to Fig. 3 B are the schematic diagram of the angle adjusting mechanism of one embodiment of the invention；
Specific implementation mode
To make to have further understanding to the purpose of the present invention, construction, feature and its function, hereby coordinate embodiment detailed
It is described as follows.
The present invention provides a kind of display panel testing, and display panel testing includes probe substrate, the probe
Substrate will be for that will detect signal transmission to panel to be detected.
Fig. 2 is the structural schematic diagram of the probe substrate of one embodiment of the invention.As shown in Fig. 2, probe substrate 100 includes：
Plummer 110, the first probe module 120 and the first driving unit group.Plummer 110 is rectangular box, and rectangular box has
Two second sides 112,114 along two first sides 111,113 of first direction and in a second direction, wherein first direction is
The length direction of first side 111,113, i.e., Y direction shown in Fig. 2, and second direction are the length of second side 112,114
Spend direction, i.e., X-direction shown in Fig. 2；First probe module 120 is arranged along first direction, and the first probe module 120 has
There are opposite first end 120a and second end 120b；First driving unit group includes that the driving of the first driving unit 131 and second is single
Member 132, the first driving unit 131 and the second driving unit 132 are individually fixed on two second sides 112,114, i.e., first drives
Moving cell 131 is fixed on second side 112, and the second driving unit 132 is fixed on second side 114, and the first driving is single
Member 131 connects the first end 120a of the first probe module 120, and the second driving unit 132 connects the second of the first probe module 120
Hold 120b；First driving unit group is for driving the first probe module 120 to move in a second direction.Wherein, the first driving unit
When group the first probe module 120 of driving moves in a second direction, the first driving unit 131 drives first end 12a, and the second driving
Unit 132 synchronizes driving second end 120b so that the first end 120a of the first probe module 120 and second end 120b synchronizing movings
And displacement is identical, i.e., under the driving synchronous with the second driving unit 132 of the first driving unit 131, the first probe module 120
First end 120a and second end 120b synchronizing movings, and the displacement in same time is identical.Therefore, by the first probe
The first end 120a and second end 120b while the first driving unit 131 of setting of module 120 and the second driving unit 132, and the
The one driving unit 131 driving first end 120a and second end 120b synchronous with the second driving unit 132 so that the first probe
The first end 120a when moving in a second direction of module 120 is identical as the displacement of second end 120b, i.e. the first probe module 120
It will not be glanced off in moving process, ensure that the displacement of the first probe module 120 through determination, and then ensure that probe substrate
100 with the aligning accuracy of display panel.
Further, the first probe module 120 includes adjustment plate 121 and the first spy being set in adjustment plate 121
Needle unit 122, the first driving unit group also include micro-move device unit 133, micro-move device unit 133 be set in adjustment plate 121 and
The first probe unit 122 is connected, micro-move device unit 133 is for driving the first probe unit 122 so that the first probe unit 122
It is mobile along first direction (Y direction), to realize to the first probe unit 122 along the fine tuning of first direction, to further carry
The aligning accuracy of high probe substrate 100.
In an embodiment, the probe substrate 100 also includes an at least angle adjusting mechanism.A is please referred to Fig.3 to figure
3B, Fig. 3 A to Fig. 3 B are the schematic diagram of the angle adjusting mechanism of one embodiment of the invention.As shown in Fig. 3 A to Fig. 3 B, angular adjustment
Mechanism includes the first adjustment unit 141 and second adjustment unit 142, first driving unit of the connection of the first adjustment unit 141 131 with
The first end 120a of first probe module 120, second adjustment unit 142 are fixed on first end 120a, and second adjustment unit
142 are folded between the first adjustment unit 141 and first end 120a, as shown in Fig. 3 A and Fig. 3 B, i.e., second adjustment unit 142,
The first adjustment unit 141 is set in turn in from the bottom to top on first end 120a, when the first adjustment unit 141 and second adjustment unit
After 142 are assembled on first end 120a, second adjustment unit 142 is then capped on 141 lower section of the first adjustment unit, such as Fig. 3 A institutes
Show；Wherein, when the first driving unit 131 driving first end 120a is moved in a second direction, the first adjustment unit 141 is generated along the
The first displacement of one direction of rotation ω 1 (in figure shown in rotation arrows direction), second adjustment unit 142 and the first adjustment unit
141 relative rotation so that the first end 120a of the first probe module 120 generates the second displacement of ω 1 along the first direction of rotation, and
Second displacement is less than the first displacement.In this way, when the first driving unit 131 drives the first probe module 120 to produce first end 120a
Raw larger driving force leads to the first probe module 120 there may be when larger angular deflection, due to the first adjustment unit 141
Can be with relative rotation with second adjustment unit 142, the first end 120a of the first probe module 120 can't be with the first adjustment unit
141 generate larger rotation, to realize the fine tuning of angle.Meanwhile first driving unit 131 will not be to the first probe module
120 generate excessive torsion and the first probe module 120 are caused to damage, and on the other hand, the first probe module 120 also will not be to first
Driving unit 131 generates excessive reaction force and the first driving unit 131 is caused to damage.
In a specific embodiment, second adjustment unit 142 includes first part 142a and second part 142b, first
142a is divided to be connect with the first adjustment unit 131, second part 142b is connect with the first end 120a of the first probe module 120, and
First part 142a and second part 142b can relative rotation.When the first adjustment unit 141 is in the driving of the first driving unit 131
Lower generation along the first direction of rotation the first displacement of ω 1 when, second adjustment unit 142 connect with the first adjustment unit 141 the
A part of 142a generates the first displacement of ω 1 along the first direction of rotation with the first adjustment unit 141, but second part 142b and the
A part of 142a can mutually rotate, so that the rotation opposite with the first end 120a of the first probe module 120 of the first adjustment unit 141
Turn, causes first end 120a to generate the second displacement along 1 directions ω, and second displacement is less than the first displacement.
Above-described embodiment is illustrated so that angle adjusting mechanism is set to the first end 120a of the first probe module 120 as an example
Embodiments of the present invention.Optionally, angle adjusting mechanism can also be set to the second end 120b of the first probe module 120,
Second adjustment unit 142 is fixed on second end 120b and is folded between the first adjustment unit 141 and second end 120b；Its
In, when the second driving unit 132 driving second end 120b is moved in a second direction, the first adjustment unit 141 is generated along second
First displacement of direction of rotation (not being painted), second adjustment unit 142 and 141 relative rotation of the first adjustment unit so that first
The second end 120b of probe module 120 generates the second displacement along second direction of rotation, and second displacement is less than the first displacement.
Further, as shown in Figure 3A, the first adjustment unit 141 is square structure part and has pivot end, pivot joint
End is pivotally connected with the second adjustment unit 142.
Further, as shown in Figure 3B, the second adjustment unit 142 can be bearing, bearing and the first adjustment unit 141
Pivot joint.
It is worth noting that above-described embodiment is all shown with the first probe module 120 for being set to 111 side of first side
Meaning explanation, in other embodiments, the first probe module 120, and the first driving unit can also be arranged in 113 side of first side
Group, the setting of angle adjusting mechanism are similar with the first driving unit group of 111 side of first side, the setting of angle adjusting mechanism,
Details are not described herein again.
Further, the probe substrate 100 includes also the second probe module 160, and the second probe module 160 is along second party
To setting, as shown in Fig. 2, and the second probe module 160 have opposite third end 160a and the 4th end 160b, third end 160a
It is separately connected two first sides 111,113 with the 4th end 160b.The present embodiment be also only be arranged along second side 112 second
Probe module 160 is illustrated, and in other embodiment, the second probe module 160. can also be provided with along second side 114
Further, as shown in Fig. 2, the probe substrate also includes the second driving unit group (not being painted), the second driving
Unit group is used to drive the third end 160a and the 4th end 160b of the second probe module 160 along first direction synchronizing moving.
Further, the first driving unit 131 and/or the second driving unit 132 are motor.
In conclusion the present invention probe module both ends can synchronizing moving and displacement it is equal, improve probe mould
The adjustment accuracy of group, and then the aligning accuracy of probe is improved, it ensure that the testing result of display panel is reliable and stablizes, greatly
The big detection result and accuracy of detection for improving display panel testing.The present invention is retouched by above-mentioned related embodiment
It states, however above-described embodiment is only the example for implementing the present invention.It must be noted that the embodiment disclosed is not limiting as this hair
Bright range.On the contrary, being changed and retouched made by without departing from the spirit and scope of the present invention, belong to the patent of the present invention
Protection domain.
Claims (8)
1. a kind of probe substrate, it to be used for the detection device of display panel, which is characterized in that the probe substrate includes：
Plummer, is rectangular box, which has two the along two first sides of first direction and in a second direction
Dual side-edge, the first direction are the length direction of first side, and the length direction that the second direction is second side；
First probe module is arranged along first direction, and the first probe module has opposite first end and second end；
First driving unit group, including the first driving unit and the second driving unit, first driving unit and second driving
Unit is individually fixed in two second side, and first driving unit connects the first end of the first probe module, this
Two driving units connect the second end of the first probe module；The first driving unit group is for driving the first probe module
It is moved along the second direction；And
Two angle adjusting mechanisms, each angle adjusting mechanism include the first adjustment unit and second adjustment unit, and one first adjusts
Whole unit connects the first end of first driving unit and the first probe module, another the first adjustment unit connect this second
The second end of driving unit and the first probe module, a second adjustment unit be fixed in the first end and be folded in this
Between one adjustment unit and the first end, another second adjustment unit is fixed in the second end and is folded in the first adjustment list
Between member and the second end；
Wherein, when which drives the first probe module to be moved along the second direction, first driving unit
The first end is driven, and second driving unit synchronizes and drives the second end, the first adjustment unit generates along the first direction of rotation
The first displacement, the second adjustment unit and the first adjustment unit relative rotation, the first end of the first probe module and/or
Second end generates the second displacement along first direction of rotation, and the second displacement is less than first displacement so that first spy
The first end of needle mould group is identical as the second end synchronizing moving and displacement.
2. probe substrate as described in claim 1, which is characterized in that the first probe module includes adjustment plate and is set to this
The first probe unit in adjustment plate, the first driving unit group also include micro-move device unit, which is set to this
In adjustment plate and first probe unit is connected, the micro-move device unit is for driving first probe unit so that first spy
Needle unit is moved along the first direction.
3. probe substrate as described in claim 1, which is characterized in that the first adjustment unit is square structure part and has pivot
End is connect, which is pivotally connected with the second adjustment unit.
4. probe substrate as described in claim 1, which is characterized in that the second adjustment unit includes first part and second
Point, wherein the first part connect with the first adjustment unit, which connect with the first probe module, and this first
Part can relative rotation with the second part.
5. probe substrate as described in claim 1, which is characterized in that the probe substrate also includes the second probe module, this
Two probe modules are arranged in a second direction, and the second probe module has opposite third end and the 4th end, the third end with
4th end is separately connected two first side.
6. probe substrate as claimed in claim 5, which is characterized in that the probe substrate also includes the second driving unit group, should
The third end and the 4th end of second driving unit group for driving the second probe module are along the first direction synchronizing moving.
7. probe substrate as described in claim 1, which is characterized in that first driving unit and/or second driving unit
For motor.
8. a kind of display panel testing, which is characterized in that the display panel testing includes as claim 1-7 is arbitrary
Probe substrate described in one, the probe substrate will be for that will detect signal transmission to panel to be detected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510587282.4A CN105242415B (en) | 2015-09-16 | 2015-09-16 | Probe substrate and display panel testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510587282.4A CN105242415B (en) | 2015-09-16 | 2015-09-16 | Probe substrate and display panel testing |
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| Publication Number | Publication Date |
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| CN105242415A CN105242415A (en) | 2016-01-13 |
| CN105242415B true CN105242415B (en) | 2018-10-02 |
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| CN201510587282.4A Active CN105242415B (en) | 2015-09-16 | 2015-09-16 | Probe substrate and display panel testing |
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Families Citing this family (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR101588856B1 (en) * | 2015-09-04 | 2016-01-27 | 주식회사 디이엔티 | Probe Unit Centering Apparatus of Liquid Crystal Display Panel Examination Apparatus |
| CN107966271A (en) * | 2017-12-08 | 2018-04-27 | 昆山精讯电子技术有限公司 | A kind of display panel measurement jig |
| CN108982931A (en) * | 2018-09-21 | 2018-12-11 | 京东方科技集团股份有限公司 | Probe unit, probe jig |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2828831Y (en) * | 2005-04-14 | 2006-10-18 | 均豪精密工业股份有限公司 | Automatic size regulator of liquid crystal panel detector |
| KR100533193B1 (en) * | 2005-07-12 | 2005-12-08 | 프롬써어티 주식회사 | Probe unit for testing plat display pannel |
| JP5104633B2 (en) * | 2008-08-04 | 2012-12-19 | 株式会社豊田中央研究所 | Stage equipment |
| KR100999936B1 (en) * | 2008-08-08 | 2010-12-13 | 주식회사 탑 엔지니어링 | Dispenser with device reducing stress of gantry |
| CN104515914A (en) * | 2013-10-08 | 2015-04-15 | 全研科技有限公司 | Testing mechanism and testing method of alignment and conductivity of bed type optical components |
| CN204360055U (en) * | 2014-12-09 | 2015-05-27 | 昆山国显光电有限公司 | A kind of tester substrate device |
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Address after: 430070 Hubei City, Hongshan Province, South Lake Road, No. 53, Hongshan Venture Center, building on the 4 floor, No. Applicant after: Wuhan fine test electronics group Limited by Share Ltd Address before: 430070 Hubei City, Hongshan Province, South Lake Road, No. 53, Hongshan Venture Center, building on the 4 floor, No. Applicant before: Wuhan Jingce Electronic Technology Co., Ltd. |
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Effective date of registration: 20220422 Address after: 430205 1st floor, No.3 workshop, No.22, South liufangyuan Road, Donghu New Technology Development Zone, Wuhan City, Hubei Province Patentee after: WUHAN JINGYITONG ELECTRONIC TECHNOLOGY Co.,Ltd. Patentee after: Wuhan jingce Electronics Group Co., Ltd Address before: 430070 Hongshan building center 4, Nanhu Avenue, Hongshan District, Wuhan, Hubei, 4 Patentee before: WUHAN JINGCE ELECTRONIC GROUP Co.,Ltd. |