CN108982931A - Probe unit, probe jig - Google Patents
Probe unit, probe jig Download PDFInfo
- Publication number
- CN108982931A CN108982931A CN201811116876.7A CN201811116876A CN108982931A CN 108982931 A CN108982931 A CN 108982931A CN 201811116876 A CN201811116876 A CN 201811116876A CN 108982931 A CN108982931 A CN 108982931A
- Authority
- CN
- China
- Prior art keywords
- probe
- signal
- drive module
- assembly
- jig
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06705—Apparatus for holding or moving single probes
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The present invention provides a kind of probe unit, probe jig, belongs to the detection technique field of display base plate.Probe unit of the invention, including probe and multiple probe assemblies, the probe are detachably connected with the probe assembly；Wherein, each probe assembly includes multiple probes being arranged according to predetermined way；In the different probe assemblies, the set-up mode of the probe is different.
Description
Technical field
The invention belongs to the detection technique fields of display base plate, and in particular to a kind of probe unit, probe jig.
Background technique
Display panel test (Cell Test, abbreviation CT) is in display panel manufacturing process, to being completed mutually to box
Display panel carry out be powered light, to the test process judged bad present on display panel.To display panel
The capital equipment tested is lighting machine.
Lighting machine is mainly used for measuring CIE, the brightness etc. of display panel, while can be by observing the display surface after lighting
The subtle anomaly of plate is bad, and can carry out undesirable analysis accordingly.But a kind of lighting machine of current model can only needle
The display panel of corresponding model is lighted.
Summary of the invention
The present invention is directed at least solve one of the technical problems existing in the prior art, one kind is provided and is able to detect a variety of show
Show the probe unit of panel.
Solving technical solution used by present invention problem is a kind of probe unit, including probe and multiple probes
Component, the probe are detachably connected with the probe assembly；Wherein,
Each probe assembly includes multiple probes being arranged according to predetermined way；In the different probe assemblies,
The set-up mode of the probe is different.
Preferably, the set-up mode includes at least one of the quantity of probe, setting interval, arranging rule, size.
Preferably, the probe includes main part and drive module；The drive module setting in the main part,
Detection signal is inputted for being electrically connected with the probe in the probe assembly, and to the probe.
It is further preferred that the main part has recessed portion；The probe assembly includes connector and is set to described
Multiple probes of the first side of connector；The second side of the connector is provided with protrusion compatible with the recessed portion
Portion, the recessed portion are detachably connected with the protrusion.
Preferably, the recessed portion surface is provided with multiple openings, and the drive module includes multiple signal output points, institute
Signal output point is stated to expose by the opening；
The cam surface is provided with multiple signal access points, and the signal access point is electrically connected with the probe；
When the probe is connect with the probe assembly, the signal access point and the corresponding signal output point are electric
Connection.
It is further preferred that the probe unit further include: signal controller is used for the drive module input control
Signal, to control the output of the detection signal of the drive module.
Solving technical solution used by present invention problem is a kind of probe jig, including any one of the above probe
Unit.
Preferably, the probe jig further include:
Component is aligned, for after the probe assembly is connect with the probe, to the probe unit and to be detected
Display panel is aligned.
Preferably, the probe jig further include: carrying board, for carrying display panel to be detected.
Preferably, the probe jig further include: fixation kit, for display panel to be fixed on the carrying board
On.
Detailed description of the invention
Fig. 1 is the structural schematic diagram of the probe unit of the embodiment of the present invention；
Fig. 2 is the structural schematic diagram of the probe jig of the embodiment of the present invention；
Wherein appended drawing reference are as follows: 1, probe；21, connector；22, probe；23, protrusion；3, board is carried；4, it presses
Piece；5, display panel.
Specific embodiment
Technical solution in order to enable those skilled in the art to better understand the present invention, with reference to the accompanying drawing and specific embodiment party
Present invention is further described in detail for formula.
Embodiment 1:
As shown in Figure 1, the present embodiment provides a kind of probe units comprising probe 1 and multiple probe assemblies, probe
1 is detachably connected with probe assembly；Wherein, each probe assembly includes multiple probes 22 being arranged according to predetermined way；It is different
Probe assembly in, the set-up mode of probe 22 is different.
Probe unit provided in this embodiment can be used in lighting machine carrying out energization point to the display panel 5 of box to completion
It is bright, to be detected to problem bad present on display panel 5.Specifically, probe assembly and probe 1 can be connected and fixed
Afterwards, using the probe of probe unit 22 it is corresponding with the pin at the end IC on display panel 5 electrical connection, thus to display panel 5 into
Row detection.
Wherein, the probe unit of the present embodiment may include a variety of probe assemblies, the setting of different probe component middle probe 22
Mode is different, with the different pin set-up modes of the different types of display panel 5 of correspondence.Specifically, set-up mode may include visiting
At least one of interval, arranging rule, size is arranged in the quantity of needle 22.That is, corresponding to the difference of different display panels 5
In probe assembly, the arrangement of setting spacing distance, multiple probes 22 between the setting quantity of probe 22, probe 22 and probe 22
Rule (such as being specifically uniformly arrangement or non-homogeneous arrangement), the size of each probe 22 (should be with the rulers of the pin of display panel 5
It is very little to adaptation) etc. one of parameters or more persons it is different.To meet different display surfaces using different probe assembly correspondences
The pin set-up mode of plate 5, and then meet the detection demand of a variety of display panels 5.
It, can be according to display surface to be detected when being detected using probe unit provided in this embodiment to display panel 5
The concrete type of plate 5 selects matching probe assembly to be attached with probe 1, and utilizes selected probe assembly
Probe 22 and the pin of display panel 5 be correspondingly connected with, to carry out the detection of display panel 5.
That is, when being detected using probe unit provided in this embodiment to different display panels 5, it is only necessary to
One probe 1, the different probe assembly of corresponding replacement are attached.Probe 1 and probe compared to the prior art
The case where component is fixedly connected, and the type of probe unit and display panel 5 to be detected can only correspond, by probe in this implementation
Probe 1 and the probe assembly of unit separate, and are detachably connected the two, thus using a probe 1, multiple probe groups
The detection to a variety of display panels 5 to be detected can be realized in part, and then improves the utilization rate of probe unit, save the cost.
In the probe unit of the present embodiment, probe 1 includes main part and drive module；Drive module setting is in main part
It is interior, for being electrically connected with the probe 22 in probe assembly, and the input detection signal into probe 22.Wherein, drive module is specific
It can be chip, be provided with driving circuit, to input detection signal to the probe 22 of probe assembly, to make probe unit
The detection to display panel 5 can be realized by the pin of probe 22 and the display panel being electrically connected with probe 22 5.
The main part of probe 1 is that probe assembly provides a supporting role, and makes the position of probe assembly during the work time
It is able to maintain fixation.Wherein, as shown in Figure 1, main part has recessed portion (black region in Fig. 1)；Probe assembly includes connection
Multiple probes 22 of part 21 and the first side for being set to connector 21；The second side of connector 21 is provided with and recessed portion phase
The protrusion 23 of adaptation；The recessed portion can be detachably connected with protrusion 23, so that realizes probe 1 and probe assembly can
Dismantling connection.Specifically, recessed portion and protrusion 23 can keep the stabilization of connection by being set to the clamping and holding assembly on the two surface
Property, to guarantee that probe 1 will not relatively move at work with probe assembly.
In the present embodiment, it is preferred that recessed portion surface is provided with multiple openings, and drive module includes multiple signal outputs
Point, signal output point are exposed by the opening on recessed portion surface；23 surface of protrusion of probe assembly is provided with multiple letters
Number access point, signal access point are electrically connected with 22 electricity of probe；When probe 1 is connect with probe assembly, the protrusion of probe assembly
23 are inserted into the recessed portion of probes 1, at least partly signal exposed in the signal access point and recessed portion on protrusion 23
Output point electrical connection, so that the detection signal for exporting driving assembly is conveyed into each probe through signal output point, signal access point
In 22.
It is understood that 22 set-up mode of probe due to different probe component is different, therefore on different probe component
The quantity of signal access point and arrangement etc. may also be different.And the present embodiment middle probe head 1 can correspond to a variety of different spies
Needle assemblies, the setting of the signal output point on probe 1 should be able to meet the signal access point of corresponding all probe assemblies, therefore visit
The quantity of the signal output point of syringe needle 1 should be equal to or more than the quantity of the signal access point of each probe assembly.That is, probe groups
When part is that probe 1 connects, the signal access point of probe assembly is practical only defeated with the part signal of probe 1 under normal conditions
Point is correspondingly connected with out.
Preferably, it may also include that signal controller in the probe unit of the present embodiment, be used for drive module input control
Signal, to control the output of the detection signal of drive module.Signal controller may be disposed in the main part of probe 1, can also
It is attached to outside probe 1.When the probe unit using the present embodiment detects display panel 5, for different displays
Panel 5 can input different control signals, into driving assembly by signal controller to control drive module to probe assembly
Corresponding detection signal is exported, and the pin through connecting with probe 22 realizes the detection to display panel 5.
In summary, it in the probe unit provided using embodiment itself when being detected to display panel 5, may be selected
With the matched probe assembly of the display panel 5 to be detected, it is attached with probe 1, fixes the two position, circuit
Conducting.Later by traveling probe head 1, it is allowed to drive probe assembly mobile, thus by the pin and fixed placement of probe assembly
The pin at the end display panel 5IC to be detected fit.Finally, inputting suitable control to driving element using signal controller
Signal, so that driving element inputs detection signal to display base plate by probe 22, to detect to display base plate.
Embodiment 2:
As shown in Fig. 2, the present embodiment provides a kind of probe jig, such as lighting machine, provided in embodiment 1 any one
Probe unit.
Preferably, as shown in Fig. 2, in the probe jig of the present embodiment further include: carrying board 3, it is to be detected for carrying
Display panel 5.Further, the probe jig of the present embodiment may also include fixation kit, such as tabletting 4, to will be to be detected
Display panel 5 be fixed on carrying board 3 on.
Preferably, in the probe jig of the present embodiment further include: contraposition component (being not shown in Fig. 2), for working as probe groups
After part is connect with probe 1, probe unit and display panel to be detected 5 are aligned.Specifically, contraposition component may include swashing
Optical device and fine tuning device carry out three-dimensional adjustment by position of the fine tuning device to probe unit, and utilize laser positioning device
Contraposition judgement is carried out, to realize the exactitude position of probe unit Yu display panel 5 to be detected.
Since the probe jig of the present embodiment includes the probe unit in embodiment 1, therefore the probe jig of the present embodiment can
Realize that single probe jig detects the display panel 5 of different size by replaceable probe assembly, to improve spy
The utilization rate of needle therapeutical apparatus reduces production cost.
It is understood that the principle that embodiment of above is intended to be merely illustrative of the present and the exemplary implementation that uses
Mode, however the present invention is not limited thereto.For those skilled in the art, essence of the invention is not being departed from
In the case where mind and essence, various changes and modifications can be made therein, these variations and modifications are also considered as protection scope of the present invention.
Claims (10)
1. a kind of probe unit, which is characterized in that including probe and multiple probe assemblies, the probe and the probe groups
Part is detachably connected；Wherein,
Each probe assembly includes multiple probes being arranged according to predetermined way；It is described in the different probe assemblies
The set-up mode of probe is different.
2. probe unit according to claim 1, which is characterized in that
The set-up mode includes at least one of the quantity of probe, setting interval, arranging rule, size.
3. probe unit according to claim 1, which is characterized in that
The probe includes main part and drive module；The drive module setting in the main part, for it is described
Probe electrical connection in probe assembly, and detection signal is inputted to the probe.
4. probe unit according to claim 3, which is characterized in that
The main part has recessed portion；The probe assembly includes connector and the first side for being set to the connector
Multiple probes；The second side of the connector is provided with protrusion compatible with the recessed portion, the recessed portion and institute
Protrusion is stated to be detachably connected.
5. probe unit according to claim 4, which is characterized in that
The recessed portion surface is provided with multiple openings, and the drive module includes multiple signal output points, the signal output
Point is exposed by the opening；
The cam surface is provided with multiple signal access points, and the signal access point is electrically connected with the probe；
When the probe is connect with the probe assembly, the signal access point is electrically connected with the corresponding signal output point
It connects.
6. probe unit according to claim 3, which is characterized in that
Further include: signal controller is used for the drive module input control signal, to control the detection of the drive module
The output of signal.
7. a kind of probe jig, which is characterized in that including probe unit described in any one of claim 1-6.
8. probe jig according to claim 7, which is characterized in that further include:
Component is aligned, is used for after the probe assembly is connect with the probe, to the probe unit and display to be detected
Panel is aligned.
9. probe jig according to claim 7, which is characterized in that further include: carrying board, it is to be detected aobvious for carrying
Show panel.
10. probe jig according to claim 9, which is characterized in that further include: fixation kit is used for display panel
It is fixed on the carrying board.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811116876.7A CN108982931A (en) | 2018-09-21 | 2018-09-21 | Probe unit, probe jig |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201811116876.7A CN108982931A (en) | 2018-09-21 | 2018-09-21 | Probe unit, probe jig |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108982931A true CN108982931A (en) | 2018-12-11 |
Family
ID=64543882
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201811116876.7A Pending CN108982931A (en) | 2018-09-21 | 2018-09-21 | Probe unit, probe jig |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108982931A (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110189668A (en) * | 2019-06-12 | 2019-08-30 | 深圳市华星光电半导体显示技术有限公司 | Detect jig |
| CN111968556A (en) * | 2020-08-28 | 2020-11-20 | 合肥维信诺科技有限公司 | Detection apparatus for display panel |
Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09292439A (en) * | 1996-03-01 | 1997-11-11 | Yamaha Corp | Inspecting device for circuit element |
| CN200986566Y (en) * | 2006-11-24 | 2007-12-05 | 耀华电子股份有限公司 | Universal device for testing combined circuit board |
| CN101082637A (en) * | 2006-05-31 | 2007-12-05 | 应用材料股份有限公司 | Prober for electronic device testing on large area substrates |
| CN101173960A (en) * | 2006-10-20 | 2008-05-07 | 台湾积体电路制造股份有限公司 | Universal array type probe card design for semiconductor device testing |
| CN101213463A (en) * | 2005-07-08 | 2008-07-02 | 佛姆法克特股份有限公司 | Probe card assembly with an interchangeable probe insert |
| CN102368827A (en) * | 2011-10-19 | 2012-03-07 | 东莞宏威数码机械有限公司 | Device for detecting performance of panel display screen |
| CN105242415A (en) * | 2015-09-16 | 2016-01-13 | 武汉精测电子技术股份有限公司 | Probe substrate and display panel detection device |
| CN105403826A (en) * | 2016-01-04 | 2016-03-16 | 京东方科技集团股份有限公司 | Test tool |
| CN105445500A (en) * | 2014-06-20 | 2016-03-30 | 上海和辉光电有限公司 | Lighting tool for display panel |
| CN105675929A (en) * | 2016-02-26 | 2016-06-15 | 上海华力微电子有限公司 | Probe card compatible with probes with different specifications |
| CN107015035A (en) * | 2016-01-27 | 2017-08-04 | 旺矽科技股份有限公司 | Probe card with replaceable daughter board and using method thereof |
-
2018
- 2018-09-21 CN CN201811116876.7A patent/CN108982931A/en active Pending
Patent Citations (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH09292439A (en) * | 1996-03-01 | 1997-11-11 | Yamaha Corp | Inspecting device for circuit element |
| CN101213463A (en) * | 2005-07-08 | 2008-07-02 | 佛姆法克特股份有限公司 | Probe card assembly with an interchangeable probe insert |
| CN101082637A (en) * | 2006-05-31 | 2007-12-05 | 应用材料股份有限公司 | Prober for electronic device testing on large area substrates |
| CN101173960A (en) * | 2006-10-20 | 2008-05-07 | 台湾积体电路制造股份有限公司 | Universal array type probe card design for semiconductor device testing |
| CN200986566Y (en) * | 2006-11-24 | 2007-12-05 | 耀华电子股份有限公司 | Universal device for testing combined circuit board |
| CN102368827A (en) * | 2011-10-19 | 2012-03-07 | 东莞宏威数码机械有限公司 | Device for detecting performance of panel display screen |
| CN105445500A (en) * | 2014-06-20 | 2016-03-30 | 上海和辉光电有限公司 | Lighting tool for display panel |
| CN105242415A (en) * | 2015-09-16 | 2016-01-13 | 武汉精测电子技术股份有限公司 | Probe substrate and display panel detection device |
| CN105403826A (en) * | 2016-01-04 | 2016-03-16 | 京东方科技集团股份有限公司 | Test tool |
| CN107015035A (en) * | 2016-01-27 | 2017-08-04 | 旺矽科技股份有限公司 | Probe card with replaceable daughter board and using method thereof |
| CN105675929A (en) * | 2016-02-26 | 2016-06-15 | 上海华力微电子有限公司 | Probe card compatible with probes with different specifications |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN110189668A (en) * | 2019-06-12 | 2019-08-30 | 深圳市华星光电半导体显示技术有限公司 | Detect jig |
| CN111968556A (en) * | 2020-08-28 | 2020-11-20 | 合肥维信诺科技有限公司 | Detection apparatus for display panel |
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