CN110189668A - Detect jig - Google Patents
Detect jig Download PDFInfo
- Publication number
- CN110189668A CN110189668A CN201910505925.4A CN201910505925A CN110189668A CN 110189668 A CN110189668 A CN 110189668A CN 201910505925 A CN201910505925 A CN 201910505925A CN 110189668 A CN110189668 A CN 110189668A
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- CN
- China
- Prior art keywords
- probe
- pedestal
- base
- detection jig
- groove
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Electroluminescent Light Sources (AREA)
Abstract
This announcement provides a kind of detection jig, including pedestal, probe pedestal and probe base, is provided with a groove on the pedestal, probe pedestal is arranged in groove, probe pedestal is fitted on groove inner wall, and probe base is arranged on probe pedestal, and probe base can move on probe pedestal.It is additionally provided with probe in probe base, when being detected, the probe in probe base is produced, is connected with port corresponding on display panel, the detection jig of this announcement can detect top and bottom luminous product, and use scope is wider.
Description
Technical field
This announcement is related to display technology detection field more particularly to a kind of detection jig.
Background technique
With the continuous improvement of display technology, show that the type of screen is also constantly improved, active matrix organic light-emitting two
Pole pipe (Active-matrix Organic Light-Emitting Device, AMOLED) is relative to traditional liquid crystal display
Device has broader visual angle, higher refresh rate and thinner size.
The manufacturing process of display panel is more complex, meanwhile, in manufacturing process flow, characterization processes are accompanied by, to protect
The acceptable performance of card factory product.In characterization processes process, in order to keep characterization processes more easy, display panel can be directed to
Corresponding detection jig is developed with detection method.Detection jig is the detection jig of horizontal mostly, and display panel is being examined
When needing to detect its different zones and different components when survey, and using the detection jig of horizontal, some test sections
Position is difficult to be operated.Especially AMOLED product comprising top shines and two kinds of light-emitting modes of bottom-emission, is carrying out into box
When testing (Cell Text), traditional detection jig can only correspond to the product of one of light-emitting mode, in this way, allowing for
When detection, detection jig is needed to be replaced frequently, the product of all light-emitting modes cannot be matched well.
In conclusion display panel is when test at box, for different display panels, traditional detection jig is not
Can be matching well, so that the problems such as characterization processes become complicated, and detection efficiency is low.
Summary of the invention
This announcement provides a kind of detection jig, to solve when carrying out display panel test, it is often necessary to replace different
Not the problems such as detection jig, detection jig do not adapt to different types of display panel, and detection efficiency is low.
In order to solve the above technical problems, the technical solution that this announcement embodiment provides is as follows:
According to this announcement embodiment in a first aspect, providing a kind of detection jig, comprising:
Pedestal is provided with a groove on the pedestal；
Probe pedestal, in the groove, the probe pedestal is fitted in the groove inner wall for the probe pedestal setting
On；And
An at least probe base, the probe base are arranged on the probe pedestal, and the probe base can be described
It is moved on probe pedestal.
According to one embodiment of this announcement, the pedestal further includes a base seat support, and the base seat support is arranged in the base
Under seat, to support the pedestal.
According to one embodiment of this announcement, the groove is the groove of a perforation.
According to one embodiment of this announcement, the probe base further includes that mounting hole and an at least probe, the mounting hole are set
It sets in the probe base, the probe setting is in the mounting hole.
According to one embodiment of this announcement, the probe is elastic probe, be may be folded in the probe base.
According to one embodiment of this announcement, the probe further includes casing and probe, and described sleeve pipe wraps up the probe, institute
Probe is stated to be connected with the probe.
According to one embodiment of this announcement, the end of the probe is tip-like, hemispherical or flush end shape, the probe
It is in contact with element to be detected.
According to one embodiment of this announcement, the probe base further includes hinge, the hinge connect the probe base and
The probe.
According to one embodiment of this announcement, the adjustable in length of the pedestal.
According to one embodiment of this announcement, the probe base is symmetrical arranged on the two sides inner wall of the groove.
In conclusion this announcement embodiment has the beneficial effect that
This announcement provides a kind of detection jig, by the setting probe pedestal on the groove inner wall of jig pedestal, and
Probe base is set on the probe pedestal, and the probe base can move freely on probe pedestal, the detection jig
For vertical check smelting tool, when detecting, different types of display panel can adapt to, without re-replacing detection jig,
And then improve the efficiency of panel detection.
Detailed description of the invention
It, below will be to embodiment or the prior art in order to illustrate more clearly of embodiment or technical solution in the prior art
Attached drawing needed in description is briefly described, it should be apparent that, the accompanying drawings in the following description is only some of announcement
Embodiment for those of ordinary skill in the art without creative efforts, can also be attached according to these
Figure obtains other attached drawings.
Fig. 1 is the structural schematic diagram of the detection jig of this announcement embodiment；
Fig. 2 is the structural schematic diagram of the probe base of this announcement embodiment；
Fig. 3 is the probe structure schematic diagram of this announcement embodiment；
Fig. 4 is display panel in this announcement embodiment into box test schematic diagram.
Specific embodiment
Below in conjunction with the attached drawing in this announcement embodiment, the technical solution in this announcement embodiment is carried out clear, complete
Site preparation description.Obviously, described embodiment is only this announcement a part of the embodiment, instead of all the embodiments.It is based on
Embodiment in this announcement, those skilled in the art's every other implementation obtained without creative efforts
Example belongs to the range of this announcement protection.
In this revealed embodiment, a kind of detection jig is provided.As shown in FIG. 1, FIG. 1 is the detections of this announcement embodiment
The structural schematic diagram of jig.Shown detection jig mainly includes jig pedestal 100, probe pedestal 101 and probe base 102.
A groove is offered on jig pedestal 100, the groove runs through the both ends of jig pedestal 100, and the length of jig pedestal 100 is directed to
Different display panels can be adjusted.Probe pedestal 101 is arranged in the groove, and probe pedestal 101 is fitted in described recessed
On the inner wall of slot, such probe pedestal 101 is stronger.Probe base 102 is arranged in probe pedestal 101, middle probe base
Seat 102 can move in probe pedestal 101, and display panel to be checked can be fixed in probe pedestal 101, while probe base
It is additionally provided with connecting line in frame 101, when display panel is tested at box, each connecting line is connected with port corresponding on display panel
It connects, to conduct detection signal.
Specifically, in the detection jig of this announcement embodiment, settable multiple probe bases 102, institute in probe pedestal 101
Stating multiple probe bases 102 can move in probe pedestal 101, when multiple probe bases 102 are arranged, probe base 102
It can be symmetrical set on the inner wall of the two sides of the groove, in this way, when detecting display panel, two stress surfaces of display panel
Uniform force, display panel are not easy to topple over.Adjacent probe base 102 can be adjusted according to the size of display panel to be checked
Section.
The detection jig of this announcement embodiment further includes jig bracket 103, and the setting of jig bracket 103 is in detection jig
Pedestal 100 is not easy to tilt in the following, so that jig pedestal 100 is more firm.
Meanwhile in the probe base of this announcement embodiment, as shown in Fig. 2, Fig. 2 is the probe base of this announcement embodiment
Structural schematic diagram.Probe base 200 further includes an at least mounting hole 201, and mounting hole 201 is arranged in probe base 200.Institute
State the probe of setting detection in mounting hole 201.
The detection jig of this announcement embodiment further includes probe, specifically, as shown in figure 3, Fig. 3 is this announcement embodiment
Probe structure schematic diagram.Probe 300 includes probe casing 301 and probe 302.Probe 302 is connected with probe 300.
The outside of the probe 300 is arranged in probe casing 301, and probe 300 is wrapped up, and probe casing 301 can be completely or partially
Wrap probe 300.Probe casing 301 can further protect probe 300.Probe 300 is elastic probe, probe 300
It may be folded in probe base, in this way, when being tested at box display panel progress, it only need to be by probe 300 out of probe base
It takes out, it is easy to operate.The cross sectional shape of the end of probe 302 can be tip-like, hemispherical or flush end shape, at box
When test, deflectable stylet 300 makes the probe 302 of probe 300 connect with the port of display panel.
In the embodiment that this announcement provides, in conjunction with Fig. 2 and Fig. 3, probe base 200 further includes hinge, and the hinge is set
It sets in mounting hole 201, hinge one end is connect with probe base 200, and the other end is connected with one end of probe 300.In this way, visiting
Needle 300 can be hinged with probe base 200, can be more convenient when operating probe 300.
When being tested at box display panel, as shown in figure 4, Fig. 4 is that display panel is tested at box in this announcement embodiment
Schematic diagram.Product is shown for AMOLED comprising top light emitting and bottom-emission product, the light of top light emitting product are from covering
The side of epiphragma layer issues, and the light of bottom-emission product is issued from the array substrate of thin film transistor (TFT) side.This implementation
The detection jig that example provides is vertical check jig, and when detecting to display panel, this detection jig can be aobvious to both
Show that product is detected.In Fig. 4, when carrying out top light emitting product testing, display panel 403 is placed on detection jig vertically
Interior, the probe pedestal 401 in jig pedestal 400 and jig pedestal 400 is together by 403 fixation of display panel, in display surface
After 403 fixation of plate, top emitting probe 404 is produced out of probe base, while pressing the probe pedestal 401 of two sides, with
Detection signal is provided and carries out a screen measure of merit.When carrying out bottom-emission product testing, the fixed operation of display panel 403
It is identical as test top light emitting product, after 403 fix stably of display panel, bottom emission probe 402 is turned out of probe base
Out, port connection corresponding with display panel 403, locks display panel and carries out signal testing.To realize top hair
The electric screen of light product and bottom-emission product is tested.
A kind of detection jig provided by this announcement embodiment is described in detail above, the explanation of above embodiments
It is merely used to help understand the technical solution and its core concept of this announcement；Those skilled in the art should understand that: its
It is still possible to modify the technical solutions described in the foregoing embodiments, and these are modified or replaceed, and are not made corresponding
The essence of technical solution is detached from the range for the technical solution that this discloses each embodiment.
Claims (10)
1. a kind of detection jig characterized by comprising
Pedestal is provided with a groove on the pedestal；
Probe pedestal, in the groove, the probe pedestal is fitted on the groove inner wall for the probe pedestal setting；With
And
An at least probe base, the probe base are arranged on the probe pedestal, and the probe base can be in the probe
It is moved on pedestal.
2. detection jig according to claim 1, which is characterized in that the pedestal further includes a base seat support, the base
Seat support is arranged under the pedestal, to support the pedestal.
3. detection jig according to claim 1, which is characterized in that the groove is the groove of a perforation.
4. detection jig according to claim 1, which is characterized in that the probe base further includes mounting hole and at least one
Probe, the mounting hole are arranged in the probe base, and the probe setting is in the mounting hole.
5. detection jig according to claim 4, which is characterized in that the probe is elastic probe, be may be folded in described
In probe base.
6. detection jig according to claim 5, which is characterized in that the probe further includes casing and probe, described
Casing wraps up the probe, and the probe is connected with the probe.
7. detection jig according to claim 6, which is characterized in that the end of the probe is tip-like, hemispherical
Or flush end shape, the probe are configured to be in contact with element to be detected.
8. detection jig according to claim 4, which is characterized in that the probe base further includes hinge, the hinge
Connect the probe base and the probe.
9. detection jig according to claim 1, which is characterized in that the adjustable in length of the pedestal.
10. detection jig according to claim 1, which is characterized in that the probe base is in the two sides of the groove
It is symmetrical arranged on wall.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910505925.4A CN110189668A (en) | 2019-06-12 | 2019-06-12 | Detect jig |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910505925.4A CN110189668A (en) | 2019-06-12 | 2019-06-12 | Detect jig |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN110189668A true CN110189668A (en) | 2019-08-30 |
Family
ID=67721490
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910505925.4A Pending CN110189668A (en) | 2019-06-12 | 2019-06-12 | Detect jig |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110189668A (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011126335A2 (en) * | 2010-04-09 | 2011-10-13 | 주식회사 프로이천 | Probe sheet for inspecting lcd panel, probe unit having same, and method for manufacturing probe sheet for inspecting lcd panel |
| CN103543304A (en) * | 2012-07-13 | 2014-01-29 | 旺矽科技股份有限公司 | High-frequency probe card |
| CN104965323A (en) * | 2015-07-21 | 2015-10-07 | 京东方科技集团股份有限公司 | Test jig |
| CN204966011U (en) * | 2015-08-20 | 2016-01-13 | 昆山龙腾光电有限公司 | Detection apparatus |
| US20170074940A1 (en) * | 2015-09-11 | 2017-03-16 | Boe Technology Group Co., Ltd. | Light-on module testing device, method for testing light-on module and method for testing display panel |
| CN207907784U (en) * | 2017-12-22 | 2018-09-25 | 吉安市优特利科技有限公司 | Battery size detects jig |
| CN108982931A (en) * | 2018-09-21 | 2018-12-11 | 京东方科技集团股份有限公司 | Probe unit, probe jig |
-
2019
- 2019-06-12 CN CN201910505925.4A patent/CN110189668A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2011126335A2 (en) * | 2010-04-09 | 2011-10-13 | 주식회사 프로이천 | Probe sheet for inspecting lcd panel, probe unit having same, and method for manufacturing probe sheet for inspecting lcd panel |
| CN103543304A (en) * | 2012-07-13 | 2014-01-29 | 旺矽科技股份有限公司 | High-frequency probe card |
| CN104965323A (en) * | 2015-07-21 | 2015-10-07 | 京东方科技集团股份有限公司 | Test jig |
| CN204966011U (en) * | 2015-08-20 | 2016-01-13 | 昆山龙腾光电有限公司 | Detection apparatus |
| US20170074940A1 (en) * | 2015-09-11 | 2017-03-16 | Boe Technology Group Co., Ltd. | Light-on module testing device, method for testing light-on module and method for testing display panel |
| CN207907784U (en) * | 2017-12-22 | 2018-09-25 | 吉安市优特利科技有限公司 | Battery size detects jig |
| CN108982931A (en) * | 2018-09-21 | 2018-12-11 | 京东方科技集团股份有限公司 | Probe unit, probe jig |
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