CN108181741B - Testing device and method for peeling position of display panel film - Google Patents
Testing device and method for peeling position of display panel film Download PDFInfo
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- CN108181741B CN108181741B CN201810012460.4A CN201810012460A CN108181741B CN 108181741 B CN108181741 B CN 108181741B CN 201810012460 A CN201810012460 A CN 201810012460A CN 108181741 B CN108181741 B CN 108181741B
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- 238000012360 testing method Methods 0.000 title claims abstract description 103
- 238000000034 method Methods 0.000 title claims abstract description 31
- 239000007788 liquid Substances 0.000 claims abstract description 91
- 230000006698 induction Effects 0.000 claims abstract description 42
- 238000002347 injection Methods 0.000 claims abstract description 23
- 239000007924 injection Substances 0.000 claims abstract description 23
- 238000012545 processing Methods 0.000 claims abstract description 22
- 238000005259 measurement Methods 0.000 claims description 24
- 238000001179 sorption measurement Methods 0.000 claims description 15
- 230000005611 electricity Effects 0.000 claims description 6
- 238000010586 diagram Methods 0.000 description 6
- 238000007789 sealing Methods 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- 239000003990 capacitor Substances 0.000 description 3
- 239000004020 conductor Substances 0.000 description 3
- 239000003292 glue Substances 0.000 description 3
- 239000004973 liquid crystal related substance Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 239000000463 material Substances 0.000 description 2
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 2
- 229910052753 mercury Inorganic materials 0.000 description 2
- 230000035515 penetration Effects 0.000 description 2
- 239000012945 sealing adhesive Substances 0.000 description 2
- 238000006467 substitution reaction Methods 0.000 description 2
- 238000012790 confirmation Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000002427 irreversible effect Effects 0.000 description 1
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- 239000000243 solution Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/1306—Details
- G02F1/1309—Repairing; Testing
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Abstract
The embodiment of the invention discloses a testing device and a method for a film peeling position of a display panel, wherein the testing device comprises a testing groove for arranging the display panel to be tested, a plurality of measuring electrodes arranged above the display panel in an array manner, a conductive liquid injection device, a capacitance measuring device and a data processing device; the position of the display panel corresponds to the plurality of measuring electrodes which are arranged in an array mode, wherein the conducting liquid injection device is used for injecting conducting liquid into the test groove, and the liquid level of the conducting liquid is lower than the upper surface of the display panel; the capacitance measuring device is used for measuring the induction capacitance values of the plurality of measuring electrodes after the conductive liquid and the plurality of measuring electrodes are electrified; the data processing device is used for determining the position where the display panel is peeled according to the induction capacitance values of the plurality of measuring electrodes.
Description
Technical Field
The embodiment of the invention relates to the technical field of display, in particular to a device and a method for testing the peeling position of a film layer of a display panel.
Background
In the field of liquid crystal display technology, the sealing performance of the display panel can affect the storage and rotation of liquid crystal in the display panel, so that the sealing performance of the display panel needs to be ensured to be good in order to ensure the display effect, and the frame sealing glue and the upper and lower film layers in the display panel play a role in isolating the liquid crystal from the external space.
At present, the main reason for the failure of the sealing performance of the display panel is that the frame sealing adhesive and the upper and lower film layers thereof are peeled off. In the prior art, the frame sealing adhesive and the peeling positions of the upper film layer and the lower film layer are mainly confirmed by an ink penetration method so as to test the sealing performance of the display panel.
The inventor researches and discovers that the ink penetration method needs to separate the upper substrate from the lower substrate and then confirm the substrates through a microscope, irreversible damage can be caused to the display panel in the confirmation process, and differences can be generated due to the observation level of an analyst in the result, so that the conventional display panel film layer stripping test method has the defects of large damage to the display panel and low measurement precision.
Disclosure of Invention
In order to solve the above technical problem, embodiments of the present invention provide a device and a method for testing a peeling position of a film layer of a display panel, which can not only reduce damage to the display panel, but also ensure measurement accuracy.
In one aspect, an embodiment of the present invention provides a testing device for a film peeling position of a display panel, including a test slot for setting the display panel to be tested, a plurality of measuring electrodes arranged in an array above the display panel, a conductive liquid injection device, a capacitance measuring device, and a data processing device; the position of the display panel corresponds to the plurality of measuring electrodes arranged in the array, wherein,
the conductive liquid injection device is used for injecting conductive liquid into the test slot, and the liquid level of the conductive liquid is lower than the upper surface of the display panel;
the capacitance measuring device is used for measuring the induction capacitance values of the plurality of measuring electrodes after the conducting liquid and the plurality of measuring electrodes are electrified;
and the data processing device is used for determining the position of the display panel which is peeled according to the induction capacitance values of the plurality of measuring electrodes.
Optionally, the data processing device is further configured to determine a film layer of the display panel that is peeled off according to the measured induced capacitance value.
Optionally, the method further comprises: an electrode plate;
the electrode plate is connected with the plurality of measuring electrodes through leads.
Optionally, the method further comprises: a power supply device and a power supply electrode disposed in the test slot;
the power supply device is connected with the electrode plate and the power supply electrode, is used for electrifying the conductive liquid through the power supply electrode, and is also used for electrifying the plurality of measuring electrodes through the electrode plate.
Optionally, the method further comprises: a height measuring device;
the height measuring device is arranged in the test groove and used for measuring the height of the conducting liquid injected into the test groove.
Optionally, the method further comprises: an adsorption device;
and the adsorption device is used for fixing the display panel at the bottom end of the test slot.
On the other hand, an embodiment of the present invention provides a method for testing a peeling position of a film layer of a display panel, which is applied to the testing apparatus for testing a peeling position of a film layer of a display panel, and the method includes:
injecting a conductive liquid into the test slot, wherein the liquid level of the conductive liquid is lower than the upper surface of the display panel;
applying electricity to the conducting liquid and the plurality of measuring electrodes;
measuring the values of the induced capacitances of the plurality of measuring electrodes;
and determining the position of the display panel which is peeled according to the induction capacitance values of the plurality of measuring electrodes.
Optionally, the determining the position where the display panel is peeled according to the sensing capacitance values of the plurality of measurement electrodes includes:
determining the position of a measuring electrode generating induction capacitance according to the induction capacitance values of the plurality of measuring electrodes;
and determining the position of the display panel which is stripped according to the position of the measuring electrode which generates the induction capacitance.
Optionally, the method further comprises: and determining the film layer stripped from the display panel according to the measured induction capacitance value.
Optionally, the determining, according to the measured value of the sensing capacitance, a film layer where the display panel is peeled off includes:
according to the measured value of the induction capacitance, a formula is adopted
Determining a film layer stripped from the display panel;
wherein C is the measured induction capacitance value; epsilon0The measurement electrode is a vacuum dielectric constant, S is a response area of the measurement electrode, D is a distance between the measurement electrode and the upper surface of the display panel, epsilon is a dielectric constant between the upper surface of the display panel and a stripping film layer of the display panel, and D is a distance between the upper surface of the display panel and the stripping film layer of the display panel.
The embodiment of the invention discloses a testing device and a method for a film peeling position of a display panel, wherein the testing device comprises a testing groove for arranging the display panel to be tested, a plurality of measuring electrodes arranged above the display panel in an array manner, a conductive liquid injection device, a capacitance measuring device and a data processing device; the position of the display panel corresponds to the plurality of measuring electrodes which are arranged in an array mode, wherein the conducting liquid injection device is used for injecting conducting liquid into the test groove, and the liquid level of the conducting liquid is lower than the upper surface of the display panel; the capacitance measuring device is used for measuring the induction capacitance values of the plurality of measuring electrodes after the conductive liquid and the plurality of measuring electrodes are electrified; the data processing device is used for determining the position where the display panel is peeled according to the induction capacitance values of the plurality of measuring electrodes.
Of course, not all of the advantages described above need to be achieved at the same time in the practice of any one product or method of the invention. Additional features and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention. The objectives and other advantages of the embodiments of the invention will be realized and attained by the structure particularly pointed out in the written description and claims hereof as well as the appended drawings.
Drawings
The accompanying drawings are included to provide a further understanding of the embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the examples of the application do not constitute a limitation of the embodiments of the invention.
Fig. 1 is a first schematic structural diagram of a device for testing a position of peeling a film layer of a display panel according to an embodiment of the present invention;
fig. 2 is a schematic structural diagram of a second testing apparatus for testing a position of peeling a film layer of a display panel according to an embodiment of the present invention;
FIG. 3 is a plan view of a measurement electrode provided in an embodiment of the present invention;
fig. 4 is a third schematic structural diagram of a device for testing a position of peeling a film layer of a display panel according to an embodiment of the present invention;
FIG. 5 is a bottom view of a testing apparatus for testing a peeling position of a film layer of a display panel according to an embodiment of the present invention;
fig. 6 is a flowchart of a method for testing a peeling position of a film layer of a display panel according to an embodiment of the present invention.
Description of reference numerals:
100: a display panel;
10: a test slot;
11: an injection hole;
12: an adsorption hole;
20: a measuring electrode;
21: an electrode plate;
22: a wire;
30: a conductive liquid injection device;
31: injecting a conductive liquid into the pipeline;
32: a conductive liquid pump;
40: a capacitance measuring device;
50: a data processing device;
60: a power supply device;
61: a power supply electrode;
70: a height measuring device;
81: an adsorption pipeline;
82: a vacuum adsorption pump;
110-140: and (5) carrying out the following steps.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention more apparent, the embodiments of the present invention will be described in detail below with reference to the accompanying drawings. It should be noted that the embodiments and features of the embodiments in the present application may be arbitrarily combined with each other without conflict.
Unless defined otherwise, technical or scientific terms used in the disclosure of the embodiments of the present invention should have the same meaning as commonly understood by one of ordinary skill in the art to which the present invention belongs. The use of the terms "comprising" or "including" or similar terms in embodiments of the invention, whether or not such terms precede the term encompasses the presence of the listed element or item following the term and the equivalents thereof, without excluding other elements or items. The terms "connected" or "coupled" and the like are not restricted to physical or mechanical connections, but may include electrical connections, whether direct or indirect. "upper", "lower", "left", "right", and the like are used merely to indicate relative positional relationships, and when the absolute position of the object being described is changed, the relative positional relationships may also be changed accordingly.
Example one
Fig. 1 is a schematic structural diagram of a first testing device for a peeling position of a film layer of a display panel according to an embodiment of the present invention, as shown in fig. 1, the testing device for a peeling position of a display panel according to an embodiment of the present invention includes a test slot 10 for disposing a display panel 100 to be tested, a plurality of measurement electrodes 20 disposed above the display panel 100 in an array arrangement, a conductive liquid injection device 30, a capacitance measurement device 40, and a data processing device 50, where the position of the display panel 100 corresponds to the plurality of measurement electrodes 20 in the array arrangement.
In the present embodiment, the conductive liquid injection device 30 is used for injecting the conductive liquid into the test slot 10. And the capacitance measuring device 40 is used for measuring the induction capacitance values of the plurality of measuring electrodes 20 after the conductive liquid and the plurality of measuring electrodes 20 are electrified. And the data processing device 50 is used for determining the position of the display panel peeling according to the induction capacitance values of the plurality of measuring electrodes 20.
It should be noted that, in order to avoid affecting the accuracy of the measured value of the sensing capacitor, the display panel 100 disposed in the test slot needs to cover the exposed circuit elements on the display panel 100 with an insulating glue.
Optionally, the test slot 10 may be closed, may not be closed, may be square, or may have other shapes, which is not limited in this respect, and specifically, fig. 1 illustrates an example in which the test slot is a closed square.
Optionally, the conductive liquid is a liquid capable of conducting electricity, and includes: liquid mercury.
In this embodiment, the liquid level of the conductive liquid is lower than the upper surface of the display panel and needs to be higher than the film layer of the display panel, and specifically, the height of the conductive liquid is greater than or equal to the difference between the height of the display panel and the threshold distance and is smaller than the height of the display panel.
It should be noted that, generally, the thickness of the upper substrate of the display panel is greater than 0.25mm, and when the height of the conductive liquid is greater than or equal to the difference between the height of the display panel and the threshold distance, the conductive liquid covers the contact points of all the film layers of the display panel.
Optionally, the material of the measuring electrode 20 is a conductive material including a metal, the shape of the measuring electrode 20 may be a circle, a square, a triangle, or other shapes, and the shape of the measuring electrode is not limited in the embodiment of the present invention, as illustrated in fig. 1 by taking the measuring electrode as a circle.
Optionally, the plurality of measurement electrodes 20 are parallel to the bottom of the test slot 10.
Alternatively, when the measuring electrode 20 is a disc, the diameter of the disc is 1 mm.
In this embodiment, in order to accurately test the peeling position of the film layer of the display panel, the plurality of measurement electrodes 20 arranged in an array are required to correspond to the position of the display panel 100.
Alternatively, the number of the measuring electrodes 20 is plural, and the number of the testing electrodes 20 is related to the size of the display panel, and the number of the testing electrodes 20 is not particularly limited in the embodiment of the present invention.
Specifically, when the display panel is not stripped by the film, the induction capacitance values of the measuring electrodes are all 0, when the display panel is stripped by the film, the conductive liquid can be filled in gaps of the film due to the flowability, the conductivity and the uniformity of the conductive liquid, and the conductive liquid filled in the gaps of the film and the measuring electrodes form parallel capacitance plates, so that the induction capacitance values of the measuring electrodes can be measured.
Alternatively, the data processing device may be a microprocessor or the like, and specifically, the data processing device determines the position of the test electrode for generating the film peeling according to the sensing capacitance values of the plurality of measurement electrodes, and determines the position of the display panel for generating the peeling according to the position of the test electrode for generating the film peeling.
The embodiment of the invention discloses a testing device for a film peeling position of a display panel, which comprises a test slot for arranging the display panel to be tested, a plurality of measuring electrodes arranged above the display panel in an array manner, a conductive liquid injection device, a capacitance measuring device and a data processing device, wherein the measuring electrodes are arranged on the display panel in an array manner; the position of the display panel corresponds to the plurality of measuring electrodes which are arranged in an array mode, wherein the conducting liquid injection device is used for injecting conducting liquid into the test groove, and the liquid level of the conducting liquid is lower than the upper surface of the display panel; the capacitance measuring device is used for measuring the induction capacitance values of the plurality of measuring electrodes after the conductive liquid and the plurality of measuring electrodes are electrified; the data processing device is used for determining the position of the display panel which is stripped according to the induction capacitance values of the plurality of measuring electrodes.
Optionally, the data processing device 50 is further configured to determine a film layer of the display panel peeled according to the measured induced capacitance value.
Specifically, the data processing device 50 uses a formula according to the measured value of the induction capacitance
And determining the film layer of the display panel which is stripped.
Specifically, C is a measured value of the induction capacitance; epsilon0Is the vacuum dielectric constant, S is the response area of the measurement electrode, D is the distance between the measurement electrode and the upper surface of the display panel, e is the dielectric constant between the upper surface of the display panel and the lift-off film layer of the display panel, and D is the distance between the upper surface of the display panel and the lift-off film layer of the display panel.
Wherein D ═ D1+D2+D3+…；DiThe thickness of each film layer of the display panel.
Wherein, epsilon is equal to epsilon1+ε2+ε3+…；εiIs the dielectric constant of each film layer of the display panel.
And the data processing device calculates the film layer stripped from the display panel by adopting a substitution method according to the thickness of each film layer in the display panel and the dielectric constant of each film layer and the formula.
Fig. 2 is a second schematic structural diagram of the device for testing the peeling position of the film layer of the display panel according to the embodiment of the present invention, and fig. 3 is a plan view of the measurement electrode according to the embodiment of the present invention, as shown in fig. 2 and fig. 3, optionally, in order to reduce the number of wires, the device for testing the peeling position of the film layer of the display panel according to the embodiment of the present invention further includes: an electrode plate 21.
In the present embodiment, the electrode plate 21 is connected to the plurality of measuring electrodes 20 via wires 22.
Specifically, the electrode plate 21 is disposed in the test slot 10, and the material of the electrode plate is a conductive material, such as metal, which is not limited in this embodiment of the present invention, and the lengths of all the leads 22 are identical.
According to the embodiment of the invention, the plurality of measuring electrodes can be powered by only powering up the electrode plate through the electrode plate, so that the wiring is reduced, and the structure of the device is simplified.
Optionally, as shown in fig. 2, the test apparatus provided in the embodiment of the present invention further includes: a power supply device 60 and power supply electrodes 61 disposed in the test slot 10.
And a power supply unit 60 connected to the electrode plate 21 and the power supply electrode 61, for supplying power to the conducting liquid through the power supply electrode, and for supplying power to the plurality of measuring electrodes through the electrode plate.
Optionally, the power supply electrode 61 may be fixedly disposed on a sidewall of the test slot, or may be embedded in the sidewall of the test slot, as long as the power supply electrode can contact with the conductive liquid and can supply power to the conductive liquid.
Alternatively, as shown in fig. 2, the conductive liquid injection device 30 provided in the embodiment of the present invention includes: a conductive liquid injection pipe 31 and a conductive liquid pump 32.
Specifically, the conductive liquid injection duct 31 communicates with the test slot 10 through an injection hole 11 provided in the test slot 10. The conductive liquid pump 32 injects the conductive liquid into the test slot 10 through the conductive liquid injection conduit 31.
Optionally, the number of the injection holes 11 on the test slot 10 is multiple, and the injection holes 11 may be disposed at the bottom of the test slot, at the side of the test slot, or at the top of the test slot. Fig. 2 illustrates an example in which the injection hole 11 is provided in the bottom of the test slot 10.
Fig. 4 is a third schematic structural diagram of the testing apparatus for the peeling position of the display panel film layer provided in the embodiment of the present invention, and fig. 5 is a bottom view of the testing apparatus for the peeling position of the display panel film layer provided in the embodiment of the present invention, as shown in fig. 4 and fig. 5, optionally, in order to accurately measure the height of the conductive liquid, the testing apparatus for the peeling position of the display panel film layer provided in the embodiment of the present invention further includes: a height measuring device 70.
In the present embodiment, a height measuring device 70 is provided in the test slot 10 for measuring the height of the electrically conductive liquid poured into the test slot 10.
Optionally, the height measuring device comprises: a height sensor.
Alternatively, the number of the height measuring devices 70 is plural, and fig. 5 illustrates an example of 4 height measuring devices.
Alternatively, the height measuring devices 70 may be disposed in the measuring groove, and may also be disposed in four corners of the measuring groove, and fig. 5 illustrates an example in which the height measuring devices are disposed in the four corners of the measuring groove.
Optionally, as shown in fig. 4, the apparatus for testing a peeling position of a film layer of a display panel according to an embodiment of the present invention further includes: and (4) an adsorption device.
In the present embodiment, the suction device is used to fix the display panel 100 to the bottom end of the test slot 10.
Optionally, the adsorption device comprises: the vacuum adsorption pump 82 fixes the display panel 100 at the bottom end of the test slot 10 through the adsorption pipeline 81, and the adsorption pipeline 81 and the vacuum adsorption pump 82 are arranged in the adsorption hole 12 at the bottom end of the test slot.
Optionally, the number of the suction holes 12 on the test slot 10 is multiple, and the suction holes 12 are disposed at the bottom of the test slot, but the number and the positions of the suction holes 12 are not particularly limited in the embodiments of the present invention, and the greater the number of the suction holes 12, the more firmly the display panel 100 is fixed.
The working principle of the device for testing the peeling position of the film layer of the display panel provided by the embodiment of the invention is further explained below.
The display panel is placed in the test groove, the display panel is fixed at the bottom end of the test groove 10 through the adsorption device, the conducting liquid is injected into the test groove through the conducting liquid injection device until the height of the conducting liquid is larger than or equal to the difference value between the height of the display panel and the threshold distance, the conducting liquid is smaller than the height of the display panel, the power supply device supplies electricity to the conducting liquid and the measuring electrodes through the power supply electrodes and the electrode plates respectively, the capacitance measuring device measures the induction capacitance of the measuring electrodes, and the positions where the display panel is peeled off and the film layers where the display panel is peeled off are determined by the induction capacitance values of the measuring electrodes of the data processing.
Example two
Based on the inventive concept of the foregoing embodiment, an embodiment of the present invention further provides a method for testing a peeling position of a film layer of a display panel, where the embodiment is applied to a device for testing a peeling position of a film layer of a display panel, and fig. 6 is a flowchart of a method for testing a peeling position of a film layer of a display panel provided in an embodiment of the present invention, and as shown in fig. 6, the method specifically includes the following steps:
Optionally, the test slot may be enclosed, may not be enclosed, may be square, or may have other shapes, which is not limited in this respect.
Optionally, the conductive liquid is a liquid capable of conducting electricity, and includes: liquid mercury.
In this embodiment, the liquid level of the conductive liquid is lower than the upper surface of the display panel and needs to be higher than the film layer of the display panel, and specifically, the height of the conductive liquid is greater than or equal to the difference between the height of the display panel and the threshold distance and is smaller than the height of the display panel.
Specifically, the placing of the display panel in the test slot may occur before step 110 or after step 110, which is not limited in this embodiment of the invention.
It should be noted that, in order to avoid affecting the accuracy of the measured value of the sensing capacitor, the display panel disposed in the test slot needs to cover the exposed circuit elements on the display panel with an insulating glue.
Optionally, the measuring electrode is made of a conductive material including a metal, and the measuring electrode may be circular, square, triangular or other shapes.
Alternatively, when the measuring electrode is a wafer, the diameter of the wafer is 1 mm.
Optionally, the number of the measuring electrodes is plural, and the number of the testing electrodes is related to the size of the display panel, and the number of the testing electrodes is not particularly limited in the embodiments of the present invention.
And step 140, determining the position of the display panel where the display panel is peeled off according to the induction capacitance values of the plurality of measuring electrodes.
Specifically, step 140 specifically includes: determining the position of a measuring electrode generating induction capacitance according to the induction capacitance values of the plurality of measuring electrodes; and determining the position of the display panel which is stripped according to the position of the measuring electrode which generates the induction capacitance.
The embodiment of the invention discloses a method for testing the peeling position of a film layer of a display panel, which is applied to a testing device for the peeling position of the film layer of the display panel and comprises the following steps: injecting a conductive liquid into the test slot, wherein the liquid level of the conductive liquid is lower than the upper surface of the display panel; applying electricity to the conducting liquid and the plurality of measuring electrodes; measuring the values of the induced capacitances of the plurality of measuring electrodes; and determining the position of the display panel which is peeled according to the induction capacitance values of the plurality of measuring electrodes. According to the embodiment of the invention, the conductive liquid is injected into the test slot, when the film layer of the display panel is stripped, the conductive liquid is filled into the stripping gap and forms a capacitance plate with the plurality of measuring electrodes, and the stripping position of the display panel is determined according to the measured induction capacitance values of the plurality of measuring electrodes, so that no personnel is required to contact in the whole test process, the damage to the display panel can be reduced, and the measurement precision can be ensured.
Optionally, the method for testing the peeling position of the film layer of the display panel provided by the embodiment of the invention further includes: and determining the film layer stripped from the display panel according to the measured induction capacitance value.
Optionally, determining the film layer peeled off from the display panel according to the measured value of the sensing capacitor includes:
according to the measured value of the induction capacitance, a formula is adopted
Determining a film layer stripped from the display panel;
wherein C is the measured induction capacitance value; epsilon0The measurement electrode is a vacuum dielectric constant, S is a response area of the measurement electrode, D is a distance between the measurement electrode and the upper surface of the display panel, epsilon is a dielectric constant between the upper surface of the display panel and a stripping film layer of the display panel, and D is a distance between the upper surface of the display panel and the stripping film layer of the display panel.
Wherein D ═ D1+D2+D3+…；DiThe thickness of each film layer of the display panel.
Wherein, epsilon is equal to epsilon1+ε2+ε3+…；εiIs the dielectric constant of each film layer of the display panel.
And the data processing device calculates the film layer stripped from the display panel by adopting a substitution method according to the thickness of each film layer in the display panel and the dielectric constant of each film layer and the formula.
The following points need to be explained:
the drawings of the embodiments of the invention only relate to the structures related to the embodiments of the invention, and other structures can refer to common designs.
In the drawings used to describe embodiments of the invention, the thickness and dimensions of layers or microstructures are exaggerated for clarity. It will be understood that when an element such as a layer, film, region, or substrate is referred to as being "on" or "under" another element, it can be "directly on" or "under" the other element or intervening elements may be present.
Without conflict, features of embodiments of the present invention, that is, embodiments, may be combined with each other to arrive at new embodiments.
Although the embodiments of the present invention have been described above, the descriptions are only used for understanding the embodiments of the present invention, and are not intended to limit the embodiments of the present invention. It will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the embodiments of the invention as defined by the appended claims.
Claims (10)
1. A testing device for a film peeling position of a display panel is characterized by comprising a testing groove for arranging the display panel to be tested, a plurality of measuring electrodes arranged above the display panel in an array manner, a conductive liquid injection device, a capacitance measuring device and a data processing device; the position of the display panel corresponds to the plurality of measuring electrodes arranged in the array, wherein,
the conductive liquid injection device is used for injecting conductive liquid into the test slot, and the liquid level of the conductive liquid is lower than the upper surface of the display panel;
the capacitance measuring device is used for measuring the induction capacitance values of the plurality of measuring electrodes after the conducting liquid and the plurality of measuring electrodes are electrified;
and the data processing device is used for determining the position of the display panel which is peeled according to the induction capacitance values of the plurality of measuring electrodes.
2. The apparatus of claim 1, wherein the data processing apparatus is further configured to determine a film layer of the display panel peeled off according to the measured induced capacitance value.
3. The apparatus of claim 1, further comprising: an electrode plate;
the electrode plate is connected with the plurality of measuring electrodes through leads.
4. The apparatus of claim 3, further comprising: a power supply device and a power supply electrode disposed in the test slot;
the power supply device is connected with the electrode plate and the power supply electrode, is used for electrifying the conductive liquid through the power supply electrode, and is also used for electrifying the plurality of measuring electrodes through the electrode plate.
5. The apparatus of claim 1, further comprising: a height measuring device;
the height measuring device is arranged in the test groove and used for measuring the height of the conducting liquid injected into the test groove.
6. The apparatus of claim 1, further comprising: an adsorption device;
and the adsorption device is used for fixing the display panel at the bottom end of the test slot.
7. A method for testing a peeling position of a film layer of a display panel, which is applied to the testing device for a peeling position of a film layer of a display panel according to any one of claims 1 to 6, the method comprising:
injecting a conductive liquid into the test slot, wherein the liquid level of the conductive liquid is lower than the upper surface of the display panel;
applying electricity to the conducting liquid and the plurality of measuring electrodes;
measuring the values of the induced capacitances of the plurality of measuring electrodes;
and determining the position of the display panel which is peeled according to the induction capacitance values of the plurality of measuring electrodes.
8. The method of claim 7, wherein determining the position of the display panel peeling according to the sensing capacitance values of the plurality of measuring electrodes comprises:
determining the position of a measuring electrode generating induction capacitance according to the induction capacitance values of the plurality of measuring electrodes;
and determining the position of the display panel which is stripped according to the position of the measuring electrode which generates the induction capacitance.
9. The method of claim 7, further comprising: and determining the film layer stripped from the display panel according to the measured induction capacitance value.
10. The method of claim 9, wherein determining the film layer of the display panel that is peeled off based on the measured value of the sensing capacitance comprises:
according to the measured value of the induction capacitance, a formula is adopted
Determining a film layer stripped from the display panel;
wherein C is the measured induction capacitance value; epsilon0The measurement electrode is a vacuum dielectric constant, S is a response area of the measurement electrode, D is a distance between the measurement electrode and the upper surface of the display panel, epsilon is a dielectric constant between the upper surface of the display panel and a stripping film layer of the display panel, and D is a distance between the upper surface of the display panel and the stripping film layer of the display panel.
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| CN112415419A (en) * | 2020-11-02 | 2021-02-26 | 深圳市洲明科技股份有限公司 | LED module protective adhesive layer detection tool and method |
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