CN112630571A - Dynamic aging test device for power driving module and test method thereof - Google Patents
Dynamic aging test device for power driving module and test method thereof Download PDFInfo
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- 230000001276 controlling effect Effects 0.000 abstract description 7
- 238000012544 monitoring process Methods 0.000 abstract description 7
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
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Abstract
The invention relates to a dynamic burn-in test device for a power driving module and a test method thereof, wherein the test device comprises: the testing station is provided with a locking part for fixing the power driving module to be tested, a waveform generator for controlling frequency and duty ratio in the dynamic ageing testing process and a light emitting diode for displaying the working state of the power driving module to be tested. The frequency and the duty ratio are regulated and controlled through the waveform generator, the problem that the aging effect cannot achieve the expected purpose of an aging test due to the fact that the frequency and the duty ratio are difficult to change in the aging process of the power driving module in the prior art is solved, the monitoring cost of output signals is reduced, the power driving module can be tested in batch through the fact that multiple testing stations in a parallel connection mode are connected into a whole, the testing efficiency is improved, and the testing cost is reduced.
Description
Technical Field
The invention relates to the technical field of electronic products, in particular to a dynamic aging test device for a power driving module and a test method thereof.
Background
The dynamic burn-in test condition of the power driving module is special, besides working voltage, control signals need to be continuously provided in the burn-in test process, in addition, the frequency and the duty ratio of the control signals need to be changed in the process, and the signal change is difficult to realize under the existing burn-in test condition, so that the cost is high. In addition, in the aging process, output signals need to be monitored, an oscilloscope is usually used for monitoring, the cost is high, a device with variable frequency and duty ratio and low state monitoring cost needs to be designed, and the dynamic aging of a typical power driving module is realized.
Therefore, the inventor provides a dynamic burn-in test device for a power driving module and a test method thereof.
Disclosure of Invention
(1) Technical problem to be solved
The embodiment of the invention provides a dynamic burn-in test device for a power driving module and a test method thereof, wherein the dynamic burn-in test device for the power driving module is connected into a whole in a mode of parallel connection of test stations, control signals and light emitting diodes are mutually independent, and the frequency and the duty ratio are adjustable.
(2) Technical scheme
In a first aspect, an embodiment of the present invention provides a dynamic burn-in test apparatus for a power driving module, including: the testing device comprises a base plate, wherein a testing station for dynamic ageing is arranged on the base plate, and a locking part for fixing the power driving module to be tested, a waveform generator for controlling frequency and duty ratio in the dynamic ageing testing process and a light emitting diode for displaying the working state of the power driving module to be tested are arranged on the testing station.
Further, the locking component comprises a second locking seat connected with the light-emitting diode and a first locking seat connected with the waveform generator.
Furthermore, the first locking seat is located between the second locking seat and the waveform generator, and the light emitting diode is arranged on one side, far away from the waveform generator, of the second locking seat.
Further, the distance between the first locking seat and the second locking seat is the same as the width of the pin of the power driving module to be tested, and the heights of the first locking seat and the second locking seat are 2/3 of the height of the pin of the power driving module to be tested.
Furthermore, the bottom plate is a PCB with a cuboid structure, and a positive power line, a negative power line and a ground wire are arranged on the bottom plate.
Furthermore, the plurality of test stations are used for testing the plurality of power driving modules in batch, the test stations are symmetrically distributed on two sides of the ground wire on the bottom plate, and the test stations are mutually arranged on the bottom plate in parallel.
Further, the positive power line is arranged along the upper edge of the bottom plate, the negative power line is arranged along the lower edge of the bottom plate, one end of each test station located between the upper edge of the bottom plate and the ground wire is connected with the positive power line, the other end of each test station located between the lower edge of the bottom plate and the ground wire is connected with the negative power line, and the other end of each test station located between the lower edge of the bottom plate and the ground wire is connected with the ground wire.
Furthermore, a first adjusting button for controlling the frequency and a second adjusting button for controlling the duty ratio are arranged on the waveform generator.
Further, the first adjustment buttons include a high frequency button for adjusting a high frequency and a low frequency button for adjusting a low frequency, and the second adjustment buttons include a high duty button for adjusting a high duty and a low duty button for adjusting a low duty.
In a second aspect, the present invention further provides a dynamic burn-in test method for a power driver module, where the dynamic burn-in test apparatus is used to test the dynamic burn-in of the power driver module to be tested, and the method includes step S1: placing the power driving module to be tested on the testing station, and fixing the power driving module to be tested by using the locking part; step S2: the external power supply equipment is used for electrifying the dynamic aging test device; step S3: checking whether the light emitting diode works normally, if so, entering step S4, and if not, replacing or maintaining the light emitting diode until the light emitting diode works normally; step S4: adjusting a frequency adjusting button of the waveform generator, wherein the frequency adjusting button is used for adjusting the frequency of an input signal of the power driving module to be tested so as to meet the test requirement; step S5: and adjusting a duty ratio adjusting button of the waveform generator, and adjusting the duty ratio of the input signal of the power driving module to be tested to meet the test requirement.
(3) Advantageous effects
In conclusion, the frequency and the duty ratio are regulated and controlled by arranging the waveform generator, the problem that the aging effect cannot achieve the expected purpose of the aging test due to the fact that the frequency and the duty ratio are difficult to change in the aging process of the power driving module in the prior art is solved, the monitoring cost of output signals is reduced, the power driving module can be tested in batch by adopting a parallel connection mode and multiple testing stations are connected into a whole, the testing efficiency is improved, and the testing cost is reduced.
Compared with the prior art, the invention has the advantages of reasonable structure, convenience, practicability, good dynamic ageing effect and effective output signal monitoring. The power driving module is placed on the locking seat, the locking seat is locked, the module and the device are in good contact, dynamic burn-in test under the same batch of different frequencies is realized by adjusting the waveform generator, the burn-in signal frequency and the duty ratio of the power driving module are variable, the burn-in test effect is better, and the burn-in test effectiveness is improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments of the present invention will be briefly described below, and it is obvious that the drawings described below are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1 is a schematic view of the structure of a dynamic aging test apparatus according to the present invention.
FIG. 2 is a schematic diagram of the configuration of the test station of the present invention.
In the figure:
1-a bottom plate; 2-a positive power supply line; 3-testing station; 4-ground wire; 5-a negative power supply line; 7-a light emitting diode; 8-a waveform generator; 9-a first locking seat; 10-a second locking seat; 81-high frequency button; 82-low frequency button; 83-high duty cycle button; 84-Low duty cycle button.
Detailed Description
The embodiments of the present invention will be described in further detail with reference to the drawings and examples. The following detailed description of the embodiments and the accompanying drawings are provided to illustrate the principles of the invention and are not intended to limit the scope of the invention, i.e., the invention is not limited to the embodiments described, but covers any modifications, alterations, and improvements in the parts, components, and connections without departing from the spirit of the invention.
It should be noted that the embodiments and features of the embodiments in the present application may be combined with each other without conflict. The present application will be described in detail below with reference to the embodiments with reference to the attached drawings.
Fig. 1 is a schematic structural diagram of a dynamic burn-in test apparatus according to an embodiment of the present invention, and as shown in fig. 1, the apparatus includes a base plate 1, a test station 3 for dynamic burn-in is disposed on the base plate 1, and a locking component for fixing a power driving module to be tested, a waveform generator 8 for controlling a frequency and a duty ratio during testing the dynamic burn-in, and a light emitting diode 7 for displaying an operating state of the power driving module to be tested are disposed on the test station 3.
According to the invention, the frequency and the duty ratio are regulated and controlled through the waveform generator, so that the problem that the aging effect cannot reach the expected purpose of an aging test due to the difficulty in changing the frequency and the duty ratio in the aging process of the power driving module in the prior art is solved, and meanwhile, the monitoring cost of an output signal is reduced.
As a preferred embodiment, as shown in fig. 2, the locking means comprises a second locking socket 10 connected to the light emitting diode 7 and a first locking socket 9 connected to the wave generator 8.
As another preferred embodiment, as shown in fig. 2, the first locking seat 9 is located between the second locking seat 10 and the waveform generator 8, and the light emitting diode 7 is located on a side of the second locking seat 10 away from the waveform generator 8.
As other alternative embodiments.
Preferably, as shown in fig. 2, the first locking socket 9 and the second locking socket 10 are spaced apart from each other by the same width as the pins (not shown) of the power driving module to be tested, and the heights of the first locking socket 9 and the second locking socket 10 are 2/3 of the height of the pins (not shown) of the power driving module to be tested.
Preferably, as shown in fig. 1, the bottom plate 1 is a PCB of a rectangular parallelepiped structure, the bottom plate 1 is provided with a positive power line 2, a negative power line 5 and a ground line 4, the test stations 3 are provided with a plurality of power driver modules for batch testing, the test stations 3 are symmetrically distributed on the bottom plate 1 on two sides of the ground line 4, the test stations 3 are arranged on the bottom plate 1 in parallel, the positive power line 2 is arranged along the upper edge of the bottom plate 1, the negative power line 5 is arranged along the lower edge of the bottom plate 1, one end of each test station 3 located between the upper edge of the bottom plate 1 and the ground line 4 is connected with the positive power line 2, the other end of each test station 3 located between the lower edge of the bottom plate 1 and the ground line 4 is connected with the negative power line 5, and the other end of each test station 3 located. The power driving module is integrally connected through the multiple testing stations in a parallel connection mode, the power driving module can be tested in batches, the testing efficiency is improved, the testing cost is reduced, dynamic burn-in test under the same batch of different frequencies is realized by adjusting the waveform generator, the burn-in signal frequency and the duty ratio of the power driving module are variable, the burn-in test effect is better, and the burn-in test effectiveness is improved.
Preferably, as shown in fig. 2, the waveform generator 8 is provided with a first adjustment button for controlling the frequency magnitude and a second adjustment button for controlling the duty ratio magnitude, the first adjustment button comprises a high frequency button 81 for adjusting the frequency and a low frequency button 82 for adjusting the frequency, and the second adjustment button comprises a high duty ratio button 83 for adjusting the duty ratio and a low duty ratio button 84 for adjusting the duty ratio. Through the physical operation mode of manual rotation button for this test power drive module's developments are always good and more convenient, and through the display screen on the waveform generator to the demonstration of real-time frequency and duty ratio numerical value, can make the accommodation process more accurate.
The invention also provides a dynamic burn-in test method for the power driving module, which is used for testing the dynamic burn-in of the power driving module to be tested by utilizing the dynamic burn-in test device and comprises the following steps:
step S1: placing the power driving module to be tested on the testing station 3, and fixing the power driving module to be tested by using a locking part; as shown in fig. 2, the tested power driving module is locked and fixed in the space between the first locking seat 9 and the second locking seat 10 by the mutual matching of the first locking seat 9 and the second locking seat 10.
Step S2: the external power supply equipment is used for electrifying the dynamic aging test device; as shown in fig. 2, after the positive power line 2, the negative power line 5 and the ground line 4 are connected to each other, the positive power line and the negative power line are respectively connected to the positive electrode and the negative electrode of an external power supply device, and the external power supply device, such as commercial power, is used for supplying electric energy to the dynamic aging test device, so that the dynamic aging test device can normally work.
Step S3: checking whether the light emitting diode 7 works normally, if so, entering step S4, and if not, replacing or maintaining the light emitting diode 7 until the light emitting diode works normally.
Step S4: and a frequency adjusting button of the waveform generator 8 is adjusted to adjust the frequency of the input signal of the power driving module to be tested so as to meet the test requirement, as shown in fig. 2, according to the display of the current input signal frequency by the light emitting diode 7, in order to achieve the test expected frequency, if the current input signal frequency is lower than the test expected frequency, a high frequency button 81 is manually adjusted, and if the current input signal frequency is higher than the test expected frequency, a low frequency button 82 is manually adjusted.
Step S5: and a duty ratio adjusting button of the adjusting waveform generator 8 is used for adjusting the duty ratio of the input signal of the power driving module to be tested so as to meet the test requirement. As shown in fig. 2, in accordance with the display of the current input signal duty cycle by the light emitting diode 7, to achieve the experimentally expected duty cycle, the high duty cycle button 83 is manually adjusted if the current input signal duty cycle is lower than the experimentally expected duty cycle, and the low duty cycle button 84 is manually adjusted if the current input signal duty cycle is higher than the experimentally expected duty cycle. It should be noted here that the tentative expected frequency and the tentative expected duty cycle are set according to actual requirements for dynamic burn-in of the power driving module to be tested in the batch before formal testing. Frequency and duty ratio are regulated and controlled through the waveform generator, the problem that the aging effect cannot reach the expected purpose of an aging test due to the fact that the frequency and the duty ratio are difficult to change in the aging process of the power driving module in the prior art is solved, and meanwhile the monitoring cost of output signals is reduced.
It should be clear that the embodiments in this specification are described in a progressive manner, and the same or similar parts in the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. The present invention is not limited to the specific steps and structures described above and shown in the drawings. Also, a detailed description of known process techniques is omitted herein for the sake of brevity.
The above description is only an example of the present application and is not limited to the present application. Various modifications and alterations to this application will become apparent to those skilled in the art without departing from the scope of this invention. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.
Claims (10)
1. A dynamic burn-in test apparatus for a power driver module, comprising: the testing device comprises a base plate (1), wherein a testing station (3) used for dynamic ageing is arranged on the base plate (1), a locking part used for fixing the power driving module to be tested, a waveform generator (8) used for controlling frequency and duty ratio in the testing dynamic ageing process and a light emitting diode (7) used for displaying the working state of the power driving module to be tested are arranged on the testing station (3).
2. The dynamic burn-in test device for a power driving module according to claim 1, wherein the locking means comprises a second locking socket (10) connected to the light emitting diode (7) and a first locking socket (9) connected to the waveform generator (8).
3. The dynamic burn-in test device for a power drive module according to claim 2, characterized in that the first locking seat (9) is located between the second locking seat (10) and the waveform generator (8), and the light emitting diode (7) is arranged on the side of the second locking seat (10) away from the waveform generator (8).
4. The dynamic burn-in test device for the power driving module according to claim 3, wherein the distance between the first locking seat (9) and the second locking seat (10) is the same as the pin width of the power driving module to be tested, and the height of the first locking seat (9) and the second locking seat (10) is 2/3 of the pin height of the power driving module to be tested.
5. The dynamic burn-in test device for the power driving module according to any one of claims 1-4, wherein the bottom plate (1) is a PCB (printed circuit board) with a rectangular parallelepiped structure, and a positive power supply line (2), a negative power supply line (5) and a ground line (4) are arranged on the bottom plate (1).
6. The dynamic burn-in test device for the power driving module according to claim 5, wherein the test stations (3) are provided in plurality for batch testing a plurality of the power driving modules, each of the test stations (3) is symmetrically distributed on the bottom plate (1) at two sides of the ground wire (4), and each of the test stations (3) is arranged on the bottom plate (1) in parallel with each other.
7. The dynamic burn-in test device for the power driving module according to claim 6, wherein the positive power supply line (2) is arranged along an upper edge of the base plate (1), the negative power supply line (5) is arranged along a lower edge of the base plate (1), one end of each test station (3) between the upper edge of the base plate (1) and the ground wire (4) is connected with the positive power supply line (2), the other end is connected with the ground wire (4), one end of each test station (3) between the lower edge of the base plate (1) and the ground wire (4) is connected with the negative power supply line (5), and the other end is connected with the ground wire (4).
8. The dynamic burn-in test device for a power driving module according to any one of claims 1 to 4, wherein the waveform generator (8) is provided with a first adjustment button for controlling the magnitude of the frequency and a second adjustment button for controlling the magnitude of the duty ratio.
9. The dynamic burn-in test apparatus for a power driving module according to claim 8, wherein the first adjustment buttons include a high frequency button (81) for adjusting a high frequency and a low frequency button (82) for adjusting a low frequency, and the second adjustment buttons include a high duty button (83) for adjusting a high duty and a low duty button (84) for adjusting a low duty.
10. A dynamic burn-in test method for a power driving module, wherein the dynamic burn-in test of the power driving module to be tested is performed by using the dynamic burn-in test apparatus of any one of claims 1 to 9, comprising:
step S1: and placing the power driving module to be tested on the testing station (3), and fixing the power driving module to be tested by using the locking part.
Step S2: and the external power supply equipment is used for electrifying the dynamic aging test device.
Step S3: checking whether the light emitting diode (7) works normally, if so, entering step S4, and if not, replacing or maintaining the light emitting diode (7) until the light emitting diode works normally.
Step S4: and adjusting a frequency adjusting button of the waveform generator (8) to adjust the frequency of the input signal of the power driving module to be tested so as to meet the test requirement.
Step S5: and adjusting a duty ratio adjusting button of the waveform generator (8) to adjust the duty ratio of the input signal of the power driving module to be tested so as to meet the test requirement.
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| CN202011547196.8A CN112630571A (en) | 2020-12-24 | 2020-12-24 | Dynamic aging test device for power driving module and test method thereof |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN113644012A (en) * | 2021-08-10 | 2021-11-12 | 上海音特电子有限公司 | Screening device and screening method for semiconductor discharge tube |
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