CN204131500U - D and D/A converter ageing testboard - Google Patents
D and D/A converter ageing testboard Download PDFInfo
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- CN204131500U CN204131500U CN201420463036.9U CN201420463036U CN204131500U CN 204131500 U CN204131500 U CN 204131500U CN 201420463036 U CN201420463036 U CN 201420463036U CN 204131500 U CN204131500 U CN 204131500U
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Abstract
The utility model discloses a kind of D and D/A converter ageing testboard, comprise high-temperature test chamber, be positioned at high-temperature test chamber for installing the burn-in board of ageing device, ageing power supply, drive plate and detector, described drive plate is positioned on driving arm, and described burn-in board is connected with ageing power supply with described drive plate, detector respectively.Described burn-in board is connected with described drive plate by butt joint base.Described drive plate is also provided with for editing the device edited that high frequency ageing test signal occurs.The utility model is applied to the design of high speed analog-digital conversion/digital to analog converter, manufacture, test, screening, life test, environmental test, mainly rated frequency and voltage conditions aging test are added to 100MPS high speed analog-digital conversion/digital to analog converter, Real-Time Monitoring can be carried out to by the parameter such as output pin control signal, voltage, power consumption of ageing device in ageing process, and describe corresponding curve.
Description
Technical field
The utility model relates to a kind of D and D/A converter ageing testboard.
Background technology
The D and D/A converter of high-speed, high precision is widely used among the modernization military equipment of nearly all advanced person, comprises space defense, electronic warfare, radar, military communication, high-speed computer signal transacting, smart weapon and light-operated field.The AD57212 precedence approach type analog to digital converter of such as Analogic Corp. of the U.S. not only can be used for the data acquisition and processing (DAP) of radar, but also can be used for the Detection & Controling of guided missile and rocket, aerospace and communication system, artificial intelligence and Process Control System etc.High performance D and D/A converter is device very crucial in various field, and the special D and D/A converter of the wide dynamic range especially needed for military affairs, high-speed sampling is that commercial kitchen area cannot provide.
In order to improve the quality level of the D and D/A converter of the domestic high-speed, high precision being applied to weapon system-of-systems, require to screen according to army's mark to the D and D/A converter of high-speed, high precision and aging test is all very necessary to device production unit or complete machine applying unit, even the D and D/A converter of the high-speed, high precision of import, postsearch screening is carried out to it and is very important equally.But existing D and D/A converter ageing cannot realize the parameter such as voltage, electric current, frequency, observable index of multistation on-line real time monitoring ageing device, device poor compatibility, test operation more complicated and there is potential safety hazard.
Summary of the invention
The parameter such as voltage, electric current, frequency, observable index of multistation on-line real time monitoring ageing device cannot be realized in order to overcome existing D and D/A converter ageing, the shortcoming of the inconvenience of device poor compatibility, test operation, uneasy congruence, the utility model provide a kind of easy to operate, automaticity is high, fail safe is high, be applicable to multiband, the high speed analog-digital conversion/digital to analog converter ageing testboard of different components encapsulation.
The technical solution adopted in the utility model is:
D and D/A converter ageing testboard, it is characterized in that: comprise high-temperature test chamber, be positioned at high-temperature test chamber for installing the burn-in board of ageing device, ageing power supply, drive plate and detector, described drive plate is positioned on driving arm, and described burn-in board is connected with ageing power supply with described drive plate, detector respectively.
Further, described burn-in board is connected with described drive plate by butt joint base.
Further, described drive plate is also provided with for editing the device edited that high frequency ageing test signal occurs.Frequency, the amplitude of every road signal are able to programme, can require to edit according to the application of different components, considerably increase the compatibility of ageing device, return inspection module by signal simultaneously and read operation is carried out to the content register of ageing device, the ageing information of real-time understanding device, ensures the effectively reliable of device ageing.
Further, described burn-in board is provided with the aging seat installing ageing device, described burn-in board is arranged on aging grillage support, and described aging grillage support is positioned at described high-temperature test chamber.
Whole aging grillage stentplacement is in high-temperature test chamber, and object is heated to device when facilitating ageing.The rear of high-temperature test chamber is driving arm, the effect of drive plate is the ageing signal producing programmable different frequency, amplitude, duty ratio, for ageing device provides high-frequency digital signal, test parameter comprises device voltage, electric current, converter output signal etc., and describes parameter curve.Be lay various ageing power supply below high-temperature test chamber, ageing power supply is powered to tested ageing device.The data that detector detects can be transferred on external computer by address card.
The beneficial effects of the utility model are embodied in: this D and D/A converter ageing testboard is applied to the design of high speed analog-digital conversion/digital to analog converter, manufacture, test, screening, life test, environmental test; Mainly rated frequency and voltage conditions aging test are added to 100MPS high speed analog-digital conversion/digital to analog converter, Real-Time Monitoring can be carried out to by the parameter such as output pin control signal, voltage, power consumption of ageing device in ageing process, and describe corresponding curve.
Accompanying drawing explanation
Fig. 1 is the utility model overall structure schematic diagram A.
Fig. 2 is the utility model overall structure schematic diagram B.
Embodiment
See figures.1.and.2, D and D/A converter ageing testboard, comprise high-temperature test chamber 1, be positioned at high-temperature test chamber 1 for installing the burn-in board 2 of ageing device, ageing power supply 4, drive plate 5 and detector, described drive plate 5 is positioned on driving arm, and described burn-in board 2 is connected with ageing power supply 4 with described drive plate 5, detector respectively.
Further, described burn-in board 2 is connected with described drive plate 5 by butt joint base.
Further, described drive plate 5 is also provided with for editing the device edited that high frequency ageing test signal occurs.Frequency, the amplitude of every road signal are able to programme, can require to edit according to the application of different components, considerably increase the compatibility of ageing device, return inspection module by signal simultaneously and read operation is carried out to the content register of ageing device, the ageing information of real-time understanding device, ensures the effectively reliable of device ageing.
Further, described burn-in board 2 is provided with the aging seat installing ageing device, described burn-in board 2 is arranged on aging grillage support 3, and described aging grillage support 3 is positioned at described high-temperature test chamber 1.
Whole aging grillage support 3 is placed on high-temperature test 1 li, and object is heated to device when facilitating ageing.The rear of high-temperature test chamber is driving arm, the effect of drive plate is the ageing signal producing programmable different frequency, amplitude, duty ratio, for ageing device provides high-frequency digital signal, test parameter comprises device voltage, electric current, converter output signal etc., and describes parameter curve.Be lay various ageing power supply below high-temperature test chamber, ageing power supply is powered to tested ageing device.The data that detector detects can be transferred on external computer by address card.
Ageing power supply 4 also has program control ability, and system of being convenient to uses software control to during device ageing, facilitates the applying of electric stress.
Content described in this specification embodiment is only enumerating the way of realization of inventive concept; protection range of the present utility model should not be regarded as being only limitted to the concrete form that embodiment is stated, protection range of the present utility model also and conceive the equivalent technologies means that can expect according to the utility model in those skilled in the art.
Claims (4)
1. D and D/A converter ageing testboard, it is characterized in that: comprise high-temperature test chamber, be positioned at high-temperature test chamber for installing the burn-in board of ageing device, ageing power supply, drive plate and detector, described drive plate is positioned on driving arm, and described burn-in board is connected with ageing power supply with described drive plate, detector respectively.
2. D and D/A converter ageing testboard as claimed in claim 1, is characterized in that: described burn-in board is connected with described drive plate by butt joint base.
3. D and D/A converter ageing testboard as claimed in claim 2, is characterized in that: described drive plate is also provided with for editing the device edited that high frequency ageing test signal occurs.
4. D and D/A converter ageing testboard as claimed in claim 3, it is characterized in that: described burn-in board is provided with the aging seat installing ageing device, described burn-in board is arranged on aging grillage support, and described aging grillage support is positioned at described high-temperature test chamber.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420463036.9U CN204131500U (en) | 2014-08-15 | 2014-08-15 | D and D/A converter ageing testboard |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420463036.9U CN204131500U (en) | 2014-08-15 | 2014-08-15 | D and D/A converter ageing testboard |
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| Publication Number | Publication Date |
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| CN204131500U true CN204131500U (en) | 2015-01-28 |
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| CN201420463036.9U Active CN204131500U (en) | 2014-08-15 | 2014-08-15 | D and D/A converter ageing testboard |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107094018A (en) * | 2017-05-26 | 2017-08-25 | 浙江杭可科技股份有限公司 | D and D/A converter ageing testboard |
| CN108519548A (en) * | 2018-03-21 | 2018-09-11 | 杭州可靠性仪器厂 | Aging of integrated circuit experimental rig |
| RU2717316C1 (en) * | 2019-05-28 | 2020-03-20 | Публичное акционерное общество "Научно-производственное объединение "Алмаз" имени академика А.А. Расплетина" (ПАО "НПО "Алмаз") | Device for monitoring and diagnostics of adc radar |
| CN112630571A (en) * | 2020-12-24 | 2021-04-09 | 贵州航天计量测试技术研究所 | Dynamic aging test device for power driving module and test method thereof |
| CN113489490A (en) * | 2021-07-09 | 2021-10-08 | 江苏七维测试技术有限公司 | Testing device of multi-channel digital-to-analog converter |
-
2014
- 2014-08-15 CN CN201420463036.9U patent/CN204131500U/en active Active
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107094018A (en) * | 2017-05-26 | 2017-08-25 | 浙江杭可科技股份有限公司 | D and D/A converter ageing testboard |
| CN108519548A (en) * | 2018-03-21 | 2018-09-11 | 杭州可靠性仪器厂 | Aging of integrated circuit experimental rig |
| RU2717316C1 (en) * | 2019-05-28 | 2020-03-20 | Публичное акционерное общество "Научно-производственное объединение "Алмаз" имени академика А.А. Расплетина" (ПАО "НПО "Алмаз") | Device for monitoring and diagnostics of adc radar |
| CN112630571A (en) * | 2020-12-24 | 2021-04-09 | 贵州航天计量测试技术研究所 | Dynamic aging test device for power driving module and test method thereof |
| CN113489490A (en) * | 2021-07-09 | 2021-10-08 | 江苏七维测试技术有限公司 | Testing device of multi-channel digital-to-analog converter |
| CN113489490B (en) * | 2021-07-09 | 2024-05-14 | 江苏七维测试技术有限公司 | Testing device of multichannel digital-to-analog converter |
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