CN209486239U - A kind of MBRB15CT aging board - Google Patents
A kind of MBRB15CT aging board Download PDFInfo
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- CN209486239U CN209486239U CN201822064295.5U CN201822064295U CN209486239U CN 209486239 U CN209486239 U CN 209486239U CN 201822064295 U CN201822064295 U CN 201822064295U CN 209486239 U CN209486239 U CN 209486239U
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Abstract
The utility model discloses a kind of MBRB15CT aging boards, including power positive end, power supply negative terminal, protective tube and workspace, external power supply introduces the workspace through protective tube by power positive end and power supply negative terminal, the workspace includes the test loop of multiple parallel connections, each test loop includes a certain number of concatenated test stations, installs MBRB15CT device on the test station；Small lot or large batch of MBRB15CT power aging test can be achieved.
Description
Technical field
The utility model relates to reliability of electronic components the field of test technology, and MBRB15CT can be carried out by particularly relating to one kind
The circuit board of power ageing experiment, i.e. MBRB15CT rectifier bridge power aging board.
Background technique
Aging test can shorten the time of device initial failure, can sufficiently expose the failure mechanism of the device overwhelming majority,
It is the effective measures for improving device use reliability.Since DDPAK encapsulation double diode output electric current is big, packing forms are special,
Therefore larger to MBRB15CT progress power aging test difficulty, traditional method can only realize the MBRB15CT rectification of small lot
The power ageing of bridge is tested, and operating method is cumbersome, poor reliability, is not suitable for the reliable of large batch of MBRB15CT rectifier bridge
Property test, due to no dedicated test fixture, device during the test because electric stress and radiate it is improper due to be easily damaged,
The use reliability of MBRB15CT rectifier bridge is unable to satisfy actual needs.
Utility model content
In view of this, making aging test operation more the purpose of this utility model is that propose a kind of MBRB15CT aging board
Add simple, reliable.
Based on a kind of above-mentioned purpose MBRB15CT aging board provided by the utility model, including power positive end, power supply negative terminal,
Protective tube and workspace, external power supply introduce the workspace, the work through protective tube by power positive end and power supply negative terminal
It include the test loop of multiple parallel connections as area, each test loop includes a certain number of concatenated test stations, described
It tests and MBRB15CT device is installed on station；
The MBRB15CT device includes positive pin a, b of diode and the negative pin c of diode, and power positive end can
The pin a or pin b of first MBRB15CT device for being connected to each test loop of switching；It is adjacent on test loop
Two MBRB15CT devices, the pin c of previous MBRB15CT device it is changeable is connected to the latter MBRB15CT device
Pin a or pin b；The pin c of the last one MBRB15CT device of each test loop is connected to power supply negative terminal；From
And when power positive end is switched to pin a or pin b, two diodes access in MBRB15CT device is tested back respectively
Road.
It further include binding post, Mei Gesuo on the test station of each test loop as a kind of optional embodiment
It states the binding post on first station of test loop and is connected to power positive end, and what be can be switched is connected on the test station
MBRB15CT device pin a or pin b；Binding post on second to the last one station is connected on previous station
The pin c of MBRB15CT device, and the pin a or pin of the changeable MBRB15CT device being connected on the test station
b。
As a kind of optional embodiment, the binding post is switched between pin a and pin b using toggle switch.
As a kind of optional embodiment, may be implemented to carry out certain amount of MBRB15CT device by wire jumper between plate
Power aging test.
As a kind of optional embodiment, the test station is fixedly clamped the MBRB15CT device using embracing a formula reed
Part.
As a kind of optional embodiment, increase the width and thickness of pad, lead.
As a kind of optional embodiment, the arrangement of big spacing is used between adjacent two-way test loop.
As a kind of optional embodiment, the workspace includes 3 test loops in parallel, each test loop
Including 5 concatenated test stations.
From the above it can be seen that MBRB15CT aging board provided by the utility model is, it can be achieved that small lot or big
The MBRB15CT power aging test of batch.
It only needs for MBRB15CT device to be clamped on when practical operation on test station, it is easy to operate, it is reliable for operation, pass through
The mode of wire jumper can be realized the reliable power aging test of any amount device between 1~15 device, substantially increase
Test efficiency in product batch production process.Meanwhile each test station is attached by way of binding post, it can be flexible
Realize that every device inside any two diode is tested.
Detailed description of the invention
Fig. 1 is the utility model embodiment MBRB15CT structural schematic diagram；
Fig. 2 is schematic illustration inside the utility model embodiment MBRB15CT；
Fig. 3 is the utility model embodiment MBRB15CT power ageing schematic illustration；
Fig. 4 is the utility model embodiment MBRB15CT rectifier bridge power aging board structural schematic diagram.
Specific embodiment
For the purpose of this utility model, technical solution and advantage is more clearly understood, below in conjunction with specific embodiment, and
Referring to attached drawing, the utility model is further described.
It should be noted that all statements for using " first " and " second " are for area in the utility model embodiment
Be divided to two non-equal entities of same names or non-equal parameter, it is seen that " first " " second " only for statement convenience,
It should not be construed as the restriction to the utility model embodiment, subsequent embodiment no longer illustrates this one by one.Ai, bi, ci are indicated
The pin of MBRB15CT device, wherein i indicates device serial number.
A kind of MBRB15CT aging board, including power positive end, power supply negative terminal, protective tube and workspace, external power supply pass through
Power positive end and power supply negative terminal introduce the workspace through protective tube, and the workspace includes the test loop of multiple parallel connections,
Each test loop includes a certain number of concatenated test stations, installs MBRB15CT device on the test station.
As shown in Figure 1, being the encapsulating structure of MBRB15CT device, MBRB15CT is a kind of small size, greatly output electric current
Power rectifier device, two rectifier diodes of enclosed inside, as shown in Figures 2 and 3, the MBRB15CT device encapsulated through DDPAK
Part includes altogether 3 external pins, and what the negative pin of first diode and second diode was joined together to form draws
The positive pin b of foot c, the positive pin a of first diode and second diode.
As shown in figure 3, in legend, power supply is just for the utility model embodiment MBRB15CT power ageing schematic illustration
End is connected to binding post A by protective tube, and binding post A can be drawn by the a1 or b1 that lead connects first MBRB15CT device
The c1 pin of foot, first device is connected on binding post B；Binding post B can connect second MBRB15CT device by lead
The c2 pin of part a2 or b2 pin, second MBRB15CT device is connected on binding post C；Binding post C can be connected by lead
Third MBRB15CT device a3 or b3 pin is connect, the c3 pin of third MBRB15CT device is connected to power supply negative terminal, thus
Connect entire electric power loop.
During actual experiment, can it be tested to meet one group of three all internal diode of device (six),
Test should be divided into be carried out twice:
1, when binding post A is connected with a2, C with a3 with a1, B, current direction in test are as follows: power positive end-diode
D1-diode d3-diode d5-power supply negative terminal tries the ageing of three groups of device inside diodes d1, d3, d5 to realize
It tests；
2, when binding post A is connected with b2, C with b3 with b1, B, current direction in test are as follows: power positive end-diode
D2-diode d4-diode d6-power supply negative terminal tries the ageing of three groups of device inside diodes d2, d4, d6 to realize
It tests.
Optionally, A is attached by the way of fixed line+toggle switch, it can be achieved that different circuit is cut with a1, b1
It changes.
By above-mentioned two step, complete real to the ageing of the diode power of each MBRB15CT of an experimental loop
It tests.It can be seen from above-described embodiment that the MBRB15CT quantity in the single circuit of the utility model can be according to power source loads energy
Power carries out adaptation adjustment.
As shown in figure 4, being the utility model embodiment MBRB15CT rectifier bridge power aging board structural schematic diagram, designing
In view of the load capacity, external cooling condition and device inside heat dissipation etc. of testing corresponding testing equipment when aging board, together
When also need to consider that aging board needs meet batch the needs of being tested, to test station carry out rationally, reliable arrangement.
Under the premise of meeting load, in order to improve single test quantity as far as possible, to test station using series-parallel
Combinational circuit, it is contemplated that apparatus of load ability, and to meet the device spacing of radiating requirements setting, using 5 series connection, 3 tunnels
Design method in parallel makes whole plate test station reach 15.Before the test, MBRB15CT rectifier bridge is separately mounted to correspond to
Test station on, if lazy weight 5 of MBRB15CT rectifier bridge in certain primary Ioops, by the pin c of the last one station
It is connected to power cathode by wire jumper, is powered on, is carried out a test；Another way diode is then switched to, is powered on,
It is tested, by above-mentioned two step, is completed real to the ageing of the diode power of each MBRB15CT of three experimental loops
It tests.
In one embodiment of the utility model, for clamping the device clamp of single MBRB15CT device on aging board
Using formula reed clamped design is embraced, wherein device clamp refers to fixture shown in each test station；Embrace formula reed clamping mode
The thermal conductive contact area and pressure of MBRB15CT device Yu device clamp reed can be increased.
In one embodiment of the utility model, increase the width and thickness of pad, lead to increase heat dissipation area.
It increases the spacing between station and guarantees that heat dissipation is smooth.Pad refers to the pad of device clamp and aging board；Lead refers to all examinations
Test the connecting line on aging board in circuit.
It should be understood by those ordinary skilled in the art that: the discussion of any of the above embodiment is exemplary only, not
It is intended to imply that the scope of the present disclosure (including claim) is limited to these examples；Under the thinking of the utility model, the above reality
Applying can also be combined between the technical characteristic in example or different embodiments, and there are the utility model as described above
Many other variations of different aspect, for simplicity, they are not provided in details.Therefore, all spirit in the utility model
Within principle, any omission, modification, equivalent replacement, improvement for being made etc. should be included in the protection scope of the utility model
Within.
Claims (8)
1. a kind of MBRB15CT aging board, which is characterized in that external including power positive end, power supply negative terminal, protective tube and workspace
Power supply introduces the workspace through protective tube by power positive end and power supply negative terminal, and the workspace includes the examination of multiple parallel connections
Circuit is tested, each test loop includes a certain number of concatenated test stations, is installed on the test station
MBRB15CT device；
The MBRB15CT device includes positive pin a, b of diode and the negative pin c of diode, and power positive end is changeable
First MBRB15CT device for being connected to each test loop pin a or pin b；Adjacent two on test loop
A MBRB15CT device, what the pin c of previous MBRB15CT device can be switched is connected to drawing for the latter MBRB15CT device
Foot a or pin b；The pin c of the last one MBRB15CT device of each test loop is connected to power supply negative terminal；Thus
When power positive end is switched to pin a or pin b, two diodes in MBRB15CT device are accessed into test loop respectively.
2. MBRB15CT aging board according to claim 1, which is characterized in that the test station of each test loop
On further include binding post, the binding post on first station of each test loop is connected to power positive end, and can cut
The pin a or pin b of the MBRB15CT device being connected on the test station changed；Wiring on second to the last one station
Column is connected to the pin c of MBRB15CT device on previous station, and what be can be switched is connected on the test station
The pin a or pin b of MBRB15CT device.
3. MBRB15CT aging board according to claim 2, which is characterized in that the binding post is being drawn using toggle switch
Switch between foot a and pin b.
4. MBRB15CT aging board according to claim 1, which is characterized in that may be implemented by wire jumper between plate to specific
The MBRB15CT device of quantity carries out power aging test.
5. MBRB15CT aging board according to claim 1, which is characterized in that the test station is using an armful formula Spring clip
Fasten the MBRB15CT device.
6. MBRB15CT aging board according to claim 1, which is characterized in that increase the width and thickness of pad, lead.
7. MBRB15CT aging board according to claim 1, which is characterized in that used between adjacent two-way test loop
The arrangement of big spacing.
8. according to claim 1 to aging board described in 7 any one, which is characterized in that the workspace includes 3 in parallel
Test loop, each test loop include 5 concatenated test stations.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822064295.5U CN209486239U (en) | 2018-12-10 | 2018-12-10 | A kind of MBRB15CT aging board |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201822064295.5U CN209486239U (en) | 2018-12-10 | 2018-12-10 | A kind of MBRB15CT aging board |
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| CN209486239U true CN209486239U (en) | 2019-10-11 |
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112630571A (en) * | 2020-12-24 | 2021-04-09 | 贵州航天计量测试技术研究所 | Dynamic aging test device for power driving module and test method thereof |
| CN115308560A (en) * | 2022-10-10 | 2022-11-08 | 杭州三海电子有限公司 | Diode burn-in test fault elimination method and diode burn-in test system |
-
2018
- 2018-12-10 CN CN201822064295.5U patent/CN209486239U/en active Active
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112630571A (en) * | 2020-12-24 | 2021-04-09 | 贵州航天计量测试技术研究所 | Dynamic aging test device for power driving module and test method thereof |
| CN115308560A (en) * | 2022-10-10 | 2022-11-08 | 杭州三海电子有限公司 | Diode burn-in test fault elimination method and diode burn-in test system |
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