CN201449400U - Test fixture for SOT series patch product of semi-conductor triode - Google Patents

Test fixture for SOT series patch product of semi-conductor triode Download PDF

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Publication number
CN201449400U
CN201449400U CN2009200622216U CN200920062221U CN201449400U CN 201449400 U CN201449400 U CN 201449400U CN 2009200622216 U CN2009200622216 U CN 2009200622216U CN 200920062221 U CN200920062221 U CN 200920062221U CN 201449400 U CN201449400 U CN 201449400U
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CN
China
Prior art keywords
test
test fixture
testing
utility
model
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Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN2009200622216U
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Chinese (zh)
Inventor
黎应杰
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guangdong Fenghua Semiconductor Technology Co., Ltd.
Original Assignee
GUANGZHOU YUEJING HIGH TECHNOLOGY Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Priority to CN2009200622216U priority Critical patent/CN201449400U/en
Application granted granted Critical
Publication of CN201449400U publication Critical patent/CN201449400U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The utility model provides a test fixture for SOT series patch products of a semi-conductor triode, and belongs to a test tool. The test fixture is provided with a bakelite plate, a plurality of testing electrodes, a plurality of soldering terminals and a retaining clip, wherein the testing electrodes, the soldering terminals and the retaining clip are all fixed on the bakelite plate; the testing electrodes are respectively and correspondingly communicated with the soldering terminals through conducting wires; and the soldering terminals are selectively connected with a testing instrument through conducting wires. The utility model ensures that only one test fixture is used when products with different packaging modes are tested, thereby conveniently solving the problems that test fixtures with different packaging models are required to be purchased and the accuracy of electrical parameters is influenced due to heat energy caused during the testing. The utility model has the characteristics of simple structure, simple and convenient operation, high testing efficiency and strong practicability.

Description

Transistor SOT series patch products test fixture
Technical field
The utility model relates to a kind of proving installation, specifically refers to a kind of multifunctional testing anchor clamps of transistor SOT series patch products.
Background technology
At present, the test fixture of known triode SOT patch products, the product of each model all needs a specific anchor clamps, also needs the location simultaneously, uses difficulty, and cost is higher.Special-purpose test machine, every money model all will be equipped with special test board and test procedure, be applicable to the test of typical products in mass production, and price is higher.At product test wide in variety, that quantity is few, the practicality of these test machines is just not strong.And the situation that these a lot of just companies face at present, when Incoming Quality Control, quality selective examination, failure analysis, conveniently test fixture just can meet demand.
Summary of the invention
For solving the deficiencies in the prior art, the utility model proposes the serial patch products test fixture of a kind of transistor SOT rational in infrastructure, that operation is easy, overcome existing triode SOT test machine, test fixture needs the location in use, and a kind of anchor clamps can only be tested a kind of deficiency of product of profile.Simultaneously, product of the present invention also has excellent contact, can provide heat radiation for the product in the test.
For achieving the above object, the utility model is achieved by the following technical programs: transistor SOT series patch products test fixture, have a bakelite plate and several test electrodes, several binding posts, geometrical clamp, its several test electrodes, several binding posts, geometrical clamp are separately fixed on the bakelite plate, described several test electrodes are by lead and the corresponding connection respectively of several binding posts, and described several binding posts optionally are connected by lead with testing tool.
The further technical measures of the utility model are that the geometrical clamp in stating is fixed on the bakelite plate by copperclad plate.
Described geometrical clamp is provided with the convenient handle that test products is fixed to the enterprising line operate of corresponding test electrode.
Triode SOT series patch products test fixture of the present utility model, a test fixture goes for the product of all SOT series, in use, only needs to change the connection of binding post, just can test the product of multiple encapsulation pattern (as SOT23, SOT323, SOT89, SOT223, SOT252), because test fixture does not need the location, test product pin and anchor clamps have excellent contact, can provide good heat radiation to test product, read the accuracy of electrical quantity when effectively improving test.Simultaneously, the present invention makes simply, and is with low cost, has good practicality.
Compared with prior art, the utlity model has following substantive distinguishing features and progress: can be when the product of the different encapsulation of test pattern, only with 1 test fixture, solved the problem that needs different test fixture, the products that encapsulate models of purchase when tested, to produce heat energy and influence the electrical quantity accuracy easily, have simple in structure, easy and simple to handle, testing efficiency height, practical technical characterstic.
Description of drawings
The utility model is described in further detail below in conjunction with drawings and Examples.
Fig. 1 is the Facad structure synoptic diagram of the utility model test fixture;
Fig. 2 is the structure synoptic diagram of the utility model test fixture.
Among the figure: 1, test electrode, 2, test electrode, 3, test electrode, 4, test electrode, 5, binding post, 6, binding post, 7, binding post, 8, binding post, 9, geometrical clamp, 10, bakelite plate, 11, lead, 12, copperclad plate, 13, fixed screw, 14, handle.
Embodiment
With reference to Fig. 1, shown in Figure 2, transistor SOT series patch products test fixture of the present utility model, four test electrodes with anchor clamps: test electrode 1, test electrode 2, test electrode 3, test electrode 4, four binding posts: binding post 5, binding post 6, binding post 7, binding post 8, and geometrical clamp 9 is separately fixed on the bakelite plate 10, with lead 11 four test electrodes are communicated with respectively with four binding posts then, by lead 11 binding post is connected with testing tool again, geometrical clamp 9 is fixed on the bakelite plate 10 and with fixed screw 13 by copperclad plate 12 and locks, and the end of geometrical clamp 9 is provided with handle 14.When the test difference encapsulates the product of pattern, as long as change the wiring position between binding post and the testing tool, as binding post 5, binding post 6, binding post 7 being connected with testing tool by lead 11, perhaps binding post 6, binding post 7, binding post 8 are connected with testing tool by lead 11, just can easily the switch test electrode.
Fixedly the method for tested product is as follows during the utility model operation: with pointing the handle 14 of geometrical clamp 9 to pressing down, geometrical clamp 9 has just unclamped, afterwards product is put on the corresponding test electrode, unclamp the handle 14 of geometrical clamp 9 then, tested product is good clamped being fixed on the anchor clamps of energy just, thereby can carry out the test of related electrical parameters.Test pin so easily and switch and fixing means, just can reach the purpose that a test fixture is used more.Four test electrodes are selected the brass sheet of 25mm * 25mm * 2mm respectively for use, can provide good heat radiation to test product, read the accuracy (HFE) of electrical quantity when effectively improving test.In addition, spacing between the brass sheet, because this test fixture is that four test electrodes are arranged, form two groups of test electrodes respectively, test electrode 1,2,3 form one group of test electrode, be used to test SOT89, SOT223, SOT252, test electrode 2,3,4 form another group test electrode, be used to test SOT23, SOT323 because in the product of five kinds of packing forms, has only the pin of SOT89 not have moulding, so spacing in two groups of test electrodes between the brass sheet, as long as wherein one group of test electrode meets the product design of SOT89, other one group of test electrode meets the product design of SOT323, just can adapt to the product test of different profiles.
The utility model includes but not limited to that the foregoing description lifts, and the structure of any effects equivalent based on the conversion of the technical program institute all belongs to protection domain of the present utility model.

Claims (3)

1. transistor SOT series patch products test fixture, have a bakelite plate and several test electrodes, several binding posts, geometrical clamp, it is characterized in that: several test electrodes wherein, several binding posts, geometrical clamp are separately fixed on the bakelite plate, described several test electrodes are by lead and the corresponding connection respectively of several binding posts, and described several binding posts optionally are connected by lead with testing tool.
2. transistor SOT series patch products test fixture according to claim 1, it is characterized in that: described geometrical clamp is fixed on the bakelite plate by copperclad plate.
3. transistor SOT series patch products test fixture according to claim 1, it is characterized in that: the end of described geometrical clamp is provided with handle.
CN2009200622216U 2009-08-12 2009-08-12 Test fixture for SOT series patch product of semi-conductor triode Expired - Fee Related CN201449400U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN2009200622216U CN201449400U (en) 2009-08-12 2009-08-12 Test fixture for SOT series patch product of semi-conductor triode

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN2009200622216U CN201449400U (en) 2009-08-12 2009-08-12 Test fixture for SOT series patch product of semi-conductor triode

Publications (1)

Publication Number Publication Date
CN201449400U true CN201449400U (en) 2010-05-05

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN2009200622216U Expired - Fee Related CN201449400U (en) 2009-08-12 2009-08-12 Test fixture for SOT series patch product of semi-conductor triode

Country Status (1)

Country Link
CN (1) CN201449400U (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103033724A (en) * 2011-10-10 2013-04-10 汕头市宇信科技有限公司 Insulated testing mechanism used for testing separator
CN103472380A (en) * 2013-09-17 2013-12-25 中国振华集团永光电子有限公司 Burn-in device of ceramic surface mount type encapsulating semiconductor power element
CN112285480A (en) * 2020-12-29 2021-01-29 南京亚尔软件测试有限公司 Universal test box for mutual inductor

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103033724A (en) * 2011-10-10 2013-04-10 汕头市宇信科技有限公司 Insulated testing mechanism used for testing separator
CN103472380A (en) * 2013-09-17 2013-12-25 中国振华集团永光电子有限公司 Burn-in device of ceramic surface mount type encapsulating semiconductor power element
CN103472380B (en) * 2013-09-17 2015-10-28 中国振华集团永光电子有限公司 The ageing device of ceramic paster formula encapsulated semiconductor power device
CN112285480A (en) * 2020-12-29 2021-01-29 南京亚尔软件测试有限公司 Universal test box for mutual inductor
CN112285480B (en) * 2020-12-29 2021-04-13 南京亚尔软件测试有限公司 Universal test box for mutual inductor

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Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C56 Change in the name or address of the patentee

Owner name: GUANGZHOU FENGHUA SEMICONDUCTOR TECHNOLOGY CO., LT

Free format text: FORMER NAME: GUANGZHOU YUEJING HIGH TECHNOLOGY CO., LTD.

CP01 Change in the name or title of a patent holder

Address after: 510000 Guangdong city of Guangzhou province Luogang District Science City Nanxiang Road No. 10 two

Patentee after: Guangdong Fenghua Semiconductor Technology Co., Ltd.

Address before: 510000 Guangdong city of Guangzhou province Luogang District Science City Nanxiang Road No. 10 two

Patentee before: Guangzhou Yuejing High Technology Co., Ltd.

CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20100505

Termination date: 20160812

CF01 Termination of patent right due to non-payment of annual fee