CN115308560A

CN115308560A - Diode burn-in test fault elimination method and diode burn-in test system

Info

Publication number: CN115308560A
Application number: CN202211233227.1A
Authority: CN
Inventors: 徐广文; 夏泽平; 丁辰野; 徐感恩; 李凯旗
Original assignee: HANGZHOU SANHAI ELECTRONICS CO Ltd
Current assignee: HANGZHOU SANHAI ELECTRONICS CO Ltd
Priority date: 2022-10-10
Filing date: 2022-10-10
Publication date: 2022-11-08

Abstract

The invention relates to the technical field of element aging tests, in particular to a diode aging test fault removing method and a diode aging test system. The diode burn-in test system is used for realizing a diode burn-in test fault removing method. The method comprises the following steps: connecting a plurality of diodes in series to form a constant current loop, and connecting a plurality of constant current loops in parallel to form an aging test loop; setting aging voltage; and acquiring the actual voltage of each diode and the actual current of each constant current loop, and eliminating the test fault according to the aging voltage, the actual voltage and the actual current. The test failures include: at least one of a mounting error, a contact failure, a voltage error, and a diode damage. The burn-in test device can accurately investigate the test fault of the burn-in device, avoids the blindness of manual inspection, realizes quick prompt of the fault part, greatly reduces the time consumption of the trouble investigation process, and is beneficial to efficient development of the burn-in test.

Description

Diode burn-in test fault elimination method and diode burn-in test system

Technical Field

The invention relates to the technical field of element burn-in tests, in particular to a diode burn-in test fault elimination method and a diode burn-in test system.

Background

The installation inspection of present ageing test panel all carries out the installation back of test panel at the staff, carries out the secondary inspection through the mode of range estimation, appears leaking easily.

Although the condition of wrong installation direction of the aged device is easy to find, the aged device is only packaged in the axial direction and the radial direction, the aged device packaged by a label cannot be subjected to quick visual inspection, when the aging test is started, a series of problems that a constant current loop is not passed, the voltage of the device is too high and the like are found, the aged device needs to be subjected to secondary inspection, and the specific station of the device cannot be quickly known to have problems are solved. These problems directly affect the normal development of the aging test.

In view of this, the present application is specifically made.

Disclosure of Invention

The invention aims to provide a fault elimination method for a diode burn-in test, which can accurately eliminate the test fault of a burn-in device, avoid the blindness of manual inspection, realize the prompt of a fault part quickly, greatly reduce the time consumption of the fault elimination process and contribute to the efficient development of the burn-in test.

The second purpose of the invention is to provide a diode burn-in test system, which can accurately investigate the test faults of burn-in devices, avoid the blindness of manual inspection, realize the prompt of fault parts, greatly reduce the time consumption of the fault investigation process and contribute to the efficient development of burn-in tests.

The embodiment of the invention is realized by the following steps:

a diode burn-in test troubleshooting method comprises the following steps:

connecting a plurality of diodes in series to form a constant current loop, and connecting a plurality of constant current loops in parallel to form an aging test loop;

setting aging voltage;

and acquiring the actual voltage of each diode and the actual current of each constant current loop, and eliminating the test fault according to the aging voltage, the actual voltage and the actual current. The test faults include: at least one of a mounting error, a contact failure, a voltage error, and a diode damage.

Further, the diode burn-in test troubleshooting method further comprises the following steps: a first current threshold and a first voltage threshold are set.

And in the process of eliminating the test fault according to the aging voltage, the actual voltage and the actual current, if the actual current of a constant current loop is less than or equal to a first current threshold value and the actual voltage from a certain diode in the constant current loop is less than or equal to a first voltage threshold value, checking whether the first diode with the actual voltage less than or equal to the first voltage threshold value is installed wrongly.

Further, the diode burn-in test troubleshooting method further comprises the following steps: a second voltage threshold is set.

And in the process of eliminating the test fault according to the aging voltage, the actual voltage and the actual current, if the actual current is normal and the actual voltage of a certain diode in the constant current loop is greater than or equal to a second voltage threshold, checking whether the diode is in poor contact.

Further, the diode burn-in test troubleshooting method further comprises the following steps: a second current threshold and a third voltage threshold are set.

And in the process of eliminating the test fault according to the burn-in voltage, the actual voltage and the actual current, if the actual current of all the constant current loops is less than or equal to the second current threshold value and the actual voltage of all the diodes is greater than or equal to the third voltage threshold value, checking whether the burn-in voltage is set correctly.

Further, the diode burn-in test troubleshooting method further comprises the following steps: a third current threshold and a fourth voltage threshold are set.

And in the process of eliminating the test fault according to the aging voltage, the actual voltage and the actual current, if the actual current of a constant current loop is less than or equal to a third current threshold value and the actual voltage of a certain diode in the constant current loop is greater than or equal to a fourth voltage threshold value, checking whether the diode is in poor contact.

Further, the diode burn-in test troubleshooting method further comprises the following steps:

and a verification circuit is arranged and is connected in series with a standard diode and a control switch, and the standard diode has the same type as the diode for the burn-in test.

When the test fault is detected, the verification circuit is connected in parallel at the diode with the test fault.

And after the control switch is communicated, the test fault is checked. And after the test fault is eliminated, the control switch is switched off, and the verification circuit is detached.

A diode burn-in test system for realizing the diode burn-in test troubleshooting method comprises the following steps: the device comprises a terminal control computer, an MCU circuit, a constant current control loop, a burn-in test loop and a current sampling circuit.

The burn-in test circuit is electrically connected with the constant current control circuit, the constant current control circuit is electrically connected with the current sampling circuit, the constant current control circuit and the current sampling circuit are both electrically connected with the MCU circuit, and the MCU circuit is electrically connected with the terminal control computer.

The aging test loop comprises a plurality of constant current loops connected in parallel, each constant current loop is provided with a plurality of clamps connected in series and used for mounting diodes, and each constant current loop is also provided with a voltage detection module used for detecting the actual voltage of each diode.

Further, in the constant current loop, two ends of each clamp are provided with a first electrical connection part.

The diode burn-in test system further comprises: a circuit is verified.

The verification circuit is connected with a standard diode and a control switch in series, wherein the standard diode has the same type as the diode subjected to the burn-in test. The two ends of the verification circuit are provided with second electrical connection parts used for being connected with the first electrical connection parts.

Further, the control switch includes: the first conducting strip, the second conducting strip, the shell, the elastic component, the first control component and the second control component.

The shell is provided with an inner cavity, a guide rib is arranged in the inner cavity,

the first control piece is provided with a first sliding groove used for being matched with the guide rib. The second control piece is offered and is used for with direction muscle complex second spout, and the circumference distribution setting of second control piece is followed to a plurality of second spouts. The first control piece and the second control piece are slidably matched with the guide rib.

The elastic piece is abutted between the second control piece and the side wall of the inner cavity.

One side of the first control piece, which is close to the second control piece, is provided with a first protrusion and a second protrusion, a concave part is formed between the first protrusion and the second protrusion, and two sides of the first protrusion and the second protrusion are both guide sliding surfaces.

All be provided with cooperation portion between two adjacent second spouts, cooperation portion includes first fitting surface, second fitting surface and third fitting surface.

One end of the first matching surface extends to the second sliding groove, and the other end of the first matching surface extends along the circumferential direction of the second control piece and is gradually far away from the first control piece. One end of the second matching surface and one end of the first matching surface, which is far away from the second sliding groove, are connected and arranged along the length direction of the second sliding groove, and the other end of the second matching surface extends towards the first control piece. One end of the third matching surface is connected with one end, far away from the first matching surface, of the second matching surface, the other end of the third matching surface extends along the circumferential direction of the second control piece and is gradually far away from the first control piece, and one end, far away from the second matching surface, of the third matching surface extends to the other second sliding groove.

The first conducting strip is arranged on one side of the second control piece, which is far away from the first control piece, the first conducting strip is provided with a connecting part used for being connected with a circuit, and the two first conducting strips are respectively arranged on two sides of the inner cavity. The second conducting plate is arranged on one side, close to the first conducting plate, of the second control piece.

Wherein the first control member and the second control member are configured to: when first spout and second spout all cooperate with the direction muscle, first arch and second are protruding all to cooperate with cooperation portion, and the one end that the second fitting surface was kept away from to first fitting surface is kept away from the bellied sliding surface laminating of leading of second with first arch, and the third fitting surface is protruding to be close to the bellied sliding surface laminating of leading of first arch with the second. And pressing the first control piece to separate the second chute from the guide rib, wherein the end part of the guide rib is propped against the first matching surface. The first control piece is released, the second control piece rotates, the guide rib abuts against the first matching surface and the second matching surface at the same time, the third matching surface is attached to the guide sliding surface of the first protrusion far away from the second protrusion, the other first matching surface is attached to the guide sliding surface of the second protrusion close to the first protrusion, a gap is formed between the other first matching surface and the first protrusion, and the second conducting plate is attached to the first conducting plate to conduct the first conducting plates on the two sides. The first control piece is pressed to separate the second matching surface from the guide rib, the other first matching surface slides along the second protrusion, and the end part of the other first matching surface is abutted against the first protrusion. And releasing the first control piece, rotating the second control piece, matching the guide rib to the other second sliding groove along the third matching surface, matching the first protrusion and the second protrusion with the other matching part, and separating the second conducting strip from the first conducting strip.

Further, the inner wall of casing is provided with the clearance layer, and the circumference setting of second control is followed to the clearance layer to the messenger can be laminated with the second conducting strip intermittently at the in-process of second control motion, in order to clear up the second conducting strip.

The technical scheme of the embodiment of the invention has the beneficial effects that:

in the actual burn-in test process, after the diodes needing burn-in are installed, the input voltage is set according to the set burn-in voltage, and then test faults such as installation errors, poor contact, voltage errors, diode damage and the like can be checked according to the actual voltage of each diode and the actual current of each constant current loop, so that the burn-in test process is very intuitive.

Generally, the method for eliminating the fault of the diode burn-in test provided by the embodiment of the invention can accurately eliminate the test fault of a burn-in device, avoids the blindness of manual inspection, realizes the prompt of the fault part, greatly reduces the time consumption of the fault elimination process and is beneficial to the efficient development of the burn-in test. The diode burn-in test system provided by the embodiment of the invention can accurately investigate the test fault of a burn-in device, avoids the blindness of manual inspection, realizes the prompt of the fault part, greatly reduces the time consumption of the fault investigation process, and is beneficial to the efficient development of the burn-in test.

Drawings

In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings needed to be used in the embodiments will be briefly described below, it should be understood that the following drawings only illustrate some embodiments of the present invention and therefore should not be considered as limiting the scope, and for those skilled in the art, other related drawings can be obtained according to the drawings without inventive efforts.

Fig. 1 is a schematic flow chart of a diode burn-in test troubleshooting method according to an embodiment of the present invention;

FIG. 2 is a schematic diagram of an overall configuration of a diode burn-in test system provided by an embodiment of the invention;

FIG. 3 is a schematic diagram of a burn-in test loop of a diode burn-in test system according to an embodiment of the present invention;

FIG. 4 is a schematic diagram of a verification circuit of a diode burn-in test system according to an embodiment of the present invention;

fig. 5 is a schematic diagram of an internal structure of a control switch of a diode burn-in test system according to an embodiment of the present invention in an off state;

FIG. 6 is a schematic diagram of an internal structure of a diode burn-in test system with a control switch in a connected state according to an embodiment of the present invention;

fig. 7 is a schematic relationship diagram of the first control element, the second control element and the positioning seat;

fig. 8 is a schematic view of the relationship between the first control element, the second control element and the positioning seat from another view angle;

fig. 9 is a schematic perspective view of a first viewing angle of the first control element, the second control element and the positioning seat;

fig. 10 is a schematic perspective view of another view angle of the first control element, the second control element and the positioning seat;

fig. 11 is a schematic view illustrating a first mating state of the first conductive sheet and the conductive pins;

FIG. 12 is a diagram illustrating a second mating state of the first conductive sheet and the conductive pins;

FIG. 13 is a diagram illustrating a third mating state of the first conductive sheet and the conductive pins;

fig. 14 is a schematic structural diagram of a conductive pin.

Description of reference numerals:

a diode burn-in test system 1000; a burn-in test loop 100; a first electrical connection 110; a verification circuit 200; a standard diode 210; a second electrical connection 220; a control switch 300; a first conductive sheet 310; a connecting portion 311; a conductive pin 320; the ridge portion 321; a sponge layer 322; a housing 330; an inner cavity 331; a diameter expanding section 332; a guide rib 333; a cleaning layer 334; an elastic member 340; a first control member 350; a first chute 351; a first leading and sliding surface 352; a second leading slide surface 353; third leading and sliding surface 354; a fourth leading flank 355; a second control member 360; a second chute 361; a second recessed region 362; a first mating face 363; a second mating surface 364; a third mating surface 365; a button 370; a positioning seat 380; first recessed region 381.

Detailed Description

In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. The components of embodiments of the present invention generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations.

Thus, the following detailed description of the embodiments of the present invention, presented in the figures, is not intended to limit the scope of the invention, as claimed, but is merely representative of selected embodiments of the invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

It should be noted that: like reference numbers and letters refer to like items in the following figures, and thus, once an item is defined in one figure, it need not be further defined and explained in subsequent figures.

In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings or the orientations or positional relationships that the products of the present invention are conventionally placed in use, and are only used for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the devices or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another, and are not to be construed as indicating or implying relative importance.

In the description of the present invention, it should also be noted that, unless otherwise explicitly stated or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly and may be, for example, fixedly connected, detachably connected, or integrally connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.

Example 1

Referring to fig. 1, the present embodiment provides a method for troubleshooting a diode burn-in test, which includes:

setting aging voltage;

and acquiring the actual voltage of each diode and the actual current of each constant current loop, and removing the test fault according to the aging voltage, the actual voltage and the actual current.

Wherein, experimental trouble includes: at least one of a mounting error, a contact failure, a voltage error, and a diode damage. The burn-in voltage refers to the test voltage set for each diode during the normal burn-in test.

In general, the method for troubleshooting the diode burn-in test provided by the embodiment of the invention can accurately troubleshoot the test fault of the burn-in device, avoids the blindness of manual inspection, realizes the prompt of the fault part, greatly reduces the time consumption of the troubleshooting process, and is beneficial to the efficient development of the burn-in test.

Specifically, the test troubleshooting process includes, but is not limited to, the following methods.

The method I comprises the following steps: a first current threshold and a first voltage threshold are set. And in the process of eliminating the test fault according to the aging voltage, the actual voltage and the actual current, if the actual current of a constant current loop is less than or equal to a first current threshold value and the actual voltage from a certain diode in the constant current loop is less than or equal to a first voltage threshold value, checking whether the first diode with the actual voltage less than or equal to the first voltage threshold value is installed wrongly. Installation errors include, but are not limited to, diode inversion, diode not connected to the constant current loop, etc.

The first voltage threshold is lower than the burn-in voltage, and the first current threshold is lower than the current value of the diode under the burn-in voltage in the normal experiment process. The first current threshold and the first voltage threshold may be flexibly set according to actual situations, and generally, in the first mode, both the first current threshold and the first voltage threshold may be set to 0, or may be set to be close to 0, and are not limited thereto.

The second method comprises the following steps: a second voltage threshold is set. And in the process of eliminating the test fault according to the aging voltage, the actual voltage and the actual current, if the actual current is normal and the actual voltage of a certain diode in the constant current loop is greater than or equal to a second voltage threshold, checking whether the diode is in poor contact.

Wherein the second voltage threshold is higher than the burn-in voltage. The second voltage threshold value can be flexibly set according to actual conditions.

The third method comprises the following steps: a second current threshold and a third voltage threshold are set. And in the process of eliminating the test fault according to the burn-in voltage, the actual voltage and the actual current, if the actual current of all the constant current loops is less than or equal to the second current threshold value and the actual voltage of all the diodes is greater than or equal to the third voltage threshold value, checking whether the burn-in voltage is set correctly. Generally, this is due to the low input voltage of the burn-in test.

The second current threshold is lower than the current value of the diode under the aging voltage in the normal experiment process, and the third voltage threshold is higher than the aging voltage. The second current threshold and the third voltage threshold can be flexibly set according to actual conditions.

In the third mode, due to the physical characteristics of the diode, when a certain current flows through the diode, the voltage drop of the diode is not controlled by external conditions but determined by the characteristics of the diode, and the problem of insufficient voltage can be quickly judged by the third mode in combination with the characteristics.

The method is as follows: a third current threshold and a fourth voltage threshold are set. And in the process of eliminating the test fault according to the aging voltage, the actual voltage and the actual current, if the actual current of a constant current loop is less than or equal to a third current threshold value and the actual voltage of a certain diode in the constant current loop is greater than or equal to a fourth voltage threshold value, checking whether the diode is in poor contact.

And the third current threshold is smaller than the current value of the diode under the aging voltage in the normal experiment process, and the fourth voltage threshold is larger than the aging voltage. The third current threshold and the fourth voltage threshold can be flexibly set according to actual conditions.

It should be noted that the first mode, the second mode, the third mode and the fourth mode are more suitable for eliminating a test fault just after the burn-in test starts, but if the test fault occurs after a period of time after the burn-in test starts, the test fault can be eliminated by using the first mode, the second mode, the third mode and the fourth mode, but if the corresponding test fault is to be processed immediately, the burn-in test process of other diodes is influenced, and if a certain constant-current loop or the whole burn-in test loop is frequently shut down in the burn-in test process, the normal running of the burn-in test is seriously influenced.

In order to overcome the problem, the fault removing method for the diode aging test further comprises the following steps:

a verification circuit is arranged and is connected with a standard diode and a control switch in series, and the standard diode has the same type as the diode for the burn-in test;

when a test fault is detected, a verification circuit is connected in parallel at a diode with the test fault;

and after the control switch is connected, the test faults are checked. And after the test fault is eliminated, the control switch is switched off, and the verification circuit is detached.

After the burn-in test is started for a period of time, if a test fault occurs, the fault type can be judged according to the first mode, the second mode, the third mode and the fourth mode, and the verification circuit is connected with the diode with the test fault in parallel. At the moment, a control switch of the verification circuit is communicated, the verification circuit is in a normal access state, the diode with the test fault is taken down for fault troubleshooting, and the normal aging process of the constant current loop cannot be influenced.

After the diode after the troubleshooting is installed again correctly, the verification circuit is connected with the diode in parallel, the overall resistance is reduced, the actual current of the constant current loop is increased, the actual voltage of the verification circuit is reduced, and therefore the fact that the original diode fault is successfully debugged is reflected from the side face. At the moment, the control switch is switched off, and if the actual current and the actual voltage of the constant current loop are both recovered to be normal, the verification circuit can be detached.

After the verification circuit is arranged, test faults can be more conveniently checked in the burn-in test process, the burn-in test is ensured to be smoothly and continuously carried out, and meanwhile, the successful check of the faults is indicated.

In conclusion, the method for troubleshooting the diode burn-in test provided by the embodiment of the invention can accurately troubleshoot the test fault of the burn-in device, avoids the blindness of manual inspection, realizes the prompt of the fault part, greatly reduces the time consumption of the troubleshooting process, and is beneficial to the efficient development of the burn-in test.

Example 2

Referring to fig. 2, the present embodiment provides a diode burn-in test system 1000 for implementing the diode burn-in test troubleshooting method in embodiment 1, where the diode burn-in test system 1000 includes: the device comprises a terminal control computer, an MCU circuit, a constant current control loop, a burn-in test loop 100 and a current sampling circuit.

The aging test loop 100 is electrically connected with the constant current control loop, the constant current control loop is electrically connected with the current sampling circuit, the constant current control loop and the current sampling circuit are both electrically connected with the MCU circuit, and the MCU circuit is electrically connected with the terminal control computer.

Referring to fig. 3, the burn-in test circuit 100 includes a plurality of constant current circuits connected in parallel, each of the constant current circuits is provided with a plurality of clamps (not shown) connected in series for mounting diodes, and each of the constant current circuits is further provided with a voltage detection module for detecting an actual voltage of each of the diodes.

In the embodiment, four clamps which are connected in series and used for installing the diodes are arranged in each constant current loop, and the diodes are installed in the constant current loops through the clamps, so that the diodes are connected in series in the constant current loops. 20 constant current circuits are connected in parallel to form a burn-in test circuit 100, and the burn-in test circuit 100 can carry out a burn-in test on 80 diodes (D1, D2, D3, D80).

It is understood that the number of the constant current circuits in the burn-in test circuit 100 and the number of the diodes that can be installed in each constant current circuit can be flexibly set according to actual needs, and is not limited to this.

The terminal control computer is electrically connected with the MCU circuit, the MCU circuit is electrically connected with the constant current control loop, the constant current control loop is 20, and an operational amplifier circuit is arranged between the constant current control loop and the current sampling circuit.

The actual voltage of each diode can be obtained by calculation, and the calculation process comprises the following steps: the input voltage Vin is determined according to the set aging voltage, detecting the tail end voltage (V1, V2, V3, · · · · · ·, V80) of each diode, the actual voltage of each diode can be calculated from the input voltage Vin and the tail voltage (V1, V2, V3, V80).

In order to more clearly illustrate the first mode, the second mode, the third mode and the fourth mode of the diode burn-in test troubleshooting method in embodiment 1, an exemplary description is made in conjunction with the diode burn-in test system 1000 in this example. Here, the aging voltage of each diode is set to 1V, and the aging current is set to 500mA as an example. It can be understood that the actual aging voltage and aging current can be flexibly adjusted according to the occasion, and are not limited to the above.

One example of the first method: and if the actual current of one constant current loop is displayed as 0, checking whether the actual voltage of 4 diodes of the constant current loop is normal. If the actual current of the second constant current loop is indicated as "0", and the actual voltages of the diodes D5 and D6 are indicated as "1.00V", V7 and V8 are indicated as "0", vin is indicated as "5.08V", V5 is indicated as "4.08V", V6 is indicated as "3.08V", and V7 and V8 are indicated as "0", it is prioritized that the diode D7 is not correctly installed, for example, the diode is inversely installed or not installed at all, which causes a problem similar to open circuit, resulting in the current loop not being turned on. If there is no problem in mounting the diode D7, it is considered that the diode D7 itself is broken or damaged.

Regarding one example of the second mode: if the actual current of one constant current loop is displayed as "500mA", for example, the actual current of the third constant current loop is displayed as "500mA", the actual voltages of the diode D9 and the diode D10 are displayed as "1.00V", the voltage of the diode D11 is displayed as "1.53V", the voltage of the diode D10 is displayed as "1.00V", vin is displayed as "5.08V", the voltage of the diode D9 is displayed as "4.08V", the voltage of the diode D10 is displayed as "3.08V", the voltage of the diode D11 is displayed as "1.55V", and the voltage of the diode D12 is displayed as "0.55V", the clamp contact failure of the diode D11 can be basically determined.

Regarding one example of the third mode: if the actual current of all the constant current loops is lower than 500mA required by the burn-in current, the actual voltage of 4 diodes of all the constant current loops is higher than the burn-in voltage through examination, and the burn-in test voltage is preferably set to be too low. Due to the physical characteristics of the diode, when a certain current passes through the diode, the tube voltage drop of the diode device is not controlled by external conditions, but is determined by the characteristics of the diode; for example, the actual current is in the range of "350mA to 400mA" and the actual voltage of all diodes is "1.30V to 1.60V", it can be determined that the input voltage is set insufficiently.

Regarding one example of the fourth mode: the actual current of the third constant current loop is shown as "380mA", the actual voltage of the diode D9 and the diode D10 is shown as "1.00V", the voltage of the diode D11 is shown as "1.68V", the voltage of the diode D10 is shown as "1.00V", vin is shown as "5.08V", V9 is shown as "4.08V", V10 is shown as "3.08V", V11 is shown as "1.40V", and V12 is shown as "0.40V", so that the poor contact of the clamp of the diode D11 can be basically determined.

Further, referring to fig. 3, in each constant current loop, two ends of each clamp are provided with a first electrical connection portion 311110. In this embodiment, each constant current loop is provided with 5 first electrical connection portions 311110, and the total of 100 first electrical connection portions 311110 is provided in the whole aging test loop 100, which are respectively: q1, Q2, Q3,. Cndot. Q100.

The diode burn-in test system 1000 further comprises: the verification circuit 200 is shown in FIG. 4. The verification circuit 200 is connected in series with a standard diode 210 and a control switch 300, wherein the standard diode 210 is the same as the type of the diode subjected to the burn-in test. The two ends of the verification circuit 200 have a second electrical connection portion 311220 for connecting with the first electrical connection portion 311110.

The electrical connection between the first connection portion 311 and the second connection portion 311 includes, but is not limited to, a contact connection, a magnetic-attraction connection, and a snap-in connection.

For convenience of operation, the control switch 300 is a push switch.

Referring to fig. 5 to 10, in detail, the control switch 300 includes: the first conductive sheet 310, the second conductive sheet, the housing 330, the pressing control assembly and the positioning seat 380. The press control assembly includes: an elastic member 340, a first check member 350, a second check member 360, and a button 370.

The housing 330 has an inner cavity 331, a guide rib 333 is disposed in the inner cavity 331, the guide rib 333 is disposed along a length direction of the inner cavity 331, one end of the guide rib 333 extends to an end wall of one end of the inner cavity 331, and a gap is left between the other end of the guide rib 333 and an end of the other end of the inner cavity 331.

In this embodiment, the inner cavity 331 has a cylindrical shape, and the guide rib 333 is provided along the axial direction of the inner cavity 331. Four guide ribs 333 are provided, and the four guide ribs 333 are arranged at even intervals along the circumferential direction of the inner cavity 331.

The end of the inner cavity 331 far away from the guide rib 333 is an expanded diameter section 332 of the inner cavity 331, which reserves a space for installing the first conductive sheet 310. The positioning seat 380 is fixedly connected to an end wall of the inner cavity 331, which is far away from the guiding rib 333, the positioning seat 380 is cylindrical, the positioning seat 380 and the inner cavity 331 are coaxially arranged, and the diameter of the positioning seat 380 is smaller than that of the inner cavity 331. The two first conductive sheets 310 are respectively disposed on two opposite sides of the positioning seat 380, an end portion of the first conductive sheet 310 close to the positioning seat 380 is curled into an arc shape and abuts against a side wall of the positioning seat 380, the other end of the first conductive sheet 310 extends into the diameter expanding section 332 and penetrates to the outside of the housing 330, and a connecting portion 311 for connecting with a circuit is disposed at an outer end of the first conductive sheet 310.

The first control element 350 and the second control element 360 are disposed in the inner cavity 331, and the second control element 360 is located on a side of the first control element 350 close to the positioning seat 380.

First control member 350 is provided with first spout 351 that is used for cooperating with direction muscle 333, and first spout 351 is four, and four first spouts 351 evenly spaced along the circumference of first control member 350 sets up, and first control member 350 cooperates with direction muscle 333 through first spout 351 slidable to make first control member 350 can carry out the motion along the circumference of inner chamber 331.

The second control member 360 is provided with four second sliding grooves 361 used for being matched with the guide ribs 333, the four second sliding grooves 361 are uniformly arranged along the circumferential direction of the second control member 360 at intervals, and the second control member 360 can be matched with the guide ribs 333 in a sliding mode through the second sliding grooves 361, so that the second control member 360 can move along the axial direction of the inner cavity 331.

The sidewalls of both the first and

second control members

350, 360 are attached to the sidewalls of the internal cavity 331.

The elastic member 340 abuts between the second control member 360 and the positioning seat 380. In order to improve the installation stability of the elastic element 340, a first recessed area 381 for matching with one end of the elastic element 340 is formed on one side of the positioning seat 380 close to the second control element 360, and a second recessed area 362 for matching with the other end of the elastic element 340 is formed on one side of the second control element 360 close to the positioning seat 380. The elastic member 340 includes, but is not limited to, a spring.

The button 370 is connected to a side of the first control member 350 away from the second control member 360, the button 370 penetrates through an end wall of the inner cavity 331 away from the positioning seat 380 and extends out of the outer shell 330, and the first control member 350 and the second control member 360 can be pushed towards the positioning seat 380 by pressing the button 370.

A first protrusion and a second protrusion are arranged on one side of the first control part 350 close to the second control part 360, the first protrusion and the second protrusion are both arranged close to the edge of the first control part 350, the first protrusion and the second protrusion are arranged along the circumferential direction of the first control part 350, and a recess is formed between the first protrusion and the second protrusion. In the first controller 350, first chutes 351 adjacent to each other in the circumferential direction of the first controller 350

Both sides of the first protrusion and the second protrusion are sliding guide surfaces, specifically, the sliding guide surface of the first protrusion far from the second protrusion is a first sliding guide surface 352, the sliding guide surface of the first protrusion near the second protrusion is a second sliding guide surface 353, the sliding guide surface of the second protrusion near the first protrusion is a third sliding guide surface 354, and the sliding guide surface of the second protrusion far from the first protrusion is a fourth sliding guide surface 355. One end of the first guiding and sliding surface 352, which is far away from the second guiding and sliding surface 353, extends to the end of the first sliding groove 351, one end of the second guiding and sliding surface 353, which is far away from the first guiding and sliding surface 352, is in contact with one end of the third guiding and sliding surface 354, which is far away from the fourth guiding and sliding surface 355, and one end of the fourth guiding and sliding surface 355, which is far away from the third guiding and sliding surface 354, extends to the end of the other first sliding groove 351.

The second control member 360 is provided with a matching portion adapted to the first control member 350, and specifically, the matching portion includes a first matching surface 363, a second matching surface 364 and a third matching surface 365. The first engagement surface 363, the second engagement surface 364, and the third engagement surface 365 can be seen as being formed by a recess of the second control member 360 adjacent to the side of the first control member 350, but are not limited thereto.

The first matching surface 363, the second matching surface 364 and the third matching surface 365 are connected in sequence, the first matching surface 363, the second matching surface 364 and the third matching surface 365 are uniformly distributed on the edge of the second control member 360 and distributed along the circumferential direction of the second control member 360, and a matching part is arranged between every two adjacent second sliding grooves 361.

One end of the first engagement surface 363 away from the second engagement surface 364 extends to an end of the second sliding groove 361, and the other end extends along the circumferential direction of the second control member 360 and gradually gets away from the first control member 350. The second mating surface 364 is disposed along the length direction of the second sliding groove 361, and an end of the second mating surface 364 away from the first control member 350 is connected to an end of the first mating surface 363 away from the second sliding groove 361. One end of the third mating surface 365 is connected to one end of the second mating surface 364 away from the first mating surface 363, the third mating surface 365 extends along the circumference of the second control member 360 and gradually moves away from the first control member 350, and one end of the third mating surface 365 moving away from the second mating surface 364 extends to another second sliding groove 361.

The second conductive plate is disposed on a side of the second controller 360 close to the first conductive plate 310. Specifically, the main body portion of the second conductive sheet is embedded in the second control element 360, the second conductive sheet has four conductive pins 320 in a sheet shape, the four conductive pins 320 are exposed outside the second control element 360 and located on one side of the second control element 360 close to the first conductive sheet 310, the four conductive pins 320 are uniformly spaced along the circumferential direction of the second control element 360, and the four conductive pins 320 are electrically connected to each other. Under the elastic force of the elastic member 340, the second control member 360 always has a tendency to move away from the positioning seat 380. When the second control element 360 is pushed toward the positioning seat 380, the four conductive pins 320 may contact with the side wall of the positioning seat 380, that is, the four conductive pins 320 may move to a state of "surrounding" the positioning seat 380, at this time, the four conductive pins 320 are all attached to the side wall of the positioning seat 380, and the positioning seat 380 may support the conductive pins 320.

In the present embodiment, one side surface of the sidewall of the four conductive pins 320 close to the inner cavity 331 and the sidewall of the second control element 360 are located on the same curved surface. One side surface of the four conductive pins 320 near the sidewall of the inner cavity 331 is used for contacting and electrically conducting with the first conductive sheet 310.

Wherein the first and

second controls

350 and 360 are configured to:

(1) When the first and second sliding

grooves

351 and 361 are both engaged with the guide rib 333, the first and second protrusions are both engaged with the engaging portions. The end of the first mating surface 363 away from the second mating surface 364 is attached to the first guiding-sliding surface 352, and the third mating surface 365 is attached to the third guiding-sliding surface 354. A gap is left between the third mating surface 365 and the second guiding sliding surface 353, that is, a gap is also left between the third mating surface 365 and the bottom of the recessed portion. At this time, under the action of the elastic member 340, the second control member 360 is far away from the positioning seat 380, the first conductive sheet 310 is separated from the second conductive sheet, the button 370 extends out of the housing 330, and the control switch 300 is in an off state.

(2) The pressing of the button 370 pushes the first control member 350 and the second control member 360 toward the positioning seat 380, so that the second sliding groove 361 of the second control member 360 is disengaged from the end of the guiding rib 333, and the second control member 360 rotates along the circumferential direction thereof under the elastic force of the elastic member 340 and the guiding action of the first mating surface 363 and the first guiding and sliding surface 352, the third mating surface 365 and the third guiding and sliding surface 354. During the rotation process, the first mating surface 363 slides along the first sliding guide surface 352, the third mating surface 365 slides along the third sliding guide surface 354, the third mating surface 365 slides to the bottom of the recess, and the end of the guiding rib 333 abuts against the first mating surface 363. In this state, the second conductive sheet approaches the first conductive sheet 310, but the second conductive sheet does not contact the first conductive sheet 310, and the second conductive sheet is in the state shown in fig. 11.

(3) The release button 370, under the action of the elastic member 340, the second control member 360 and the first control member 350 are pushed toward the side away from the positioning seat 380, under the guiding action of the guiding rib 333 and the first mating surface 363, the second control member 360 continues to rotate, and the end of the guiding rib 333 moves along the first mating surface 363 toward the second mating surface 364 until the guiding rib 333 is simultaneously attached to the first mating surface 363 and the second mating surface 364, that is, the guiding rib 333 is attached to the junction of the first mating surface 363 and the second mating surface 364. In this state, the second control element 360 continues to rotate relative to the first control element 350, the conductive pin 320 pushes the first conductive plate 310 toward a side away from the positioning seat 380, and the conductive pin 320 of the second conductive plate rotates to a position between the first conductive plate 310 and the positioning seat 380, as shown in fig. 12, the first conductive plate 310 is connected to the second conductive plate, and the control switch 300 is in a connected state. In addition, in the rotating process, the first mating surface 363 of the other mating portion rotates to be attached to the third sliding guide surface 354, and a gap is left between the first mating surface 363 of the other mating portion and the second sliding guide surface 353, that is, a gap is also left between the first mating surface 363 of the other mating portion and the bottom of the recess.

(4) The button 370 is pressed again, so that the second control member 360 moves along the guiding rib 333 through the second matching surface 364, the guiding rib 333 is separated from the second matching surface 364, the second control member 360 continues to rotate under the elastic force of the elastic member 340 and the guiding action of the first matching surface 363 and the third sliding guiding surface 354 of the other matching part, the first matching surface 363 of the other matching part moves to the bottom of the recess, and the end of the guiding rib 333 can contact with the third matching surface 365.

(5) The button 370 is released again, under the action of the elastic member 340, the second control member 360 and the first control member 350 are away from the positioning seat 380 again, under the guidance of the guiding rib 333 and the third matching surface 365, the second control member 360 continues to rotate, the guiding rib 333 moves to another second sliding groove 361 along the third matching surface 365, in this state, the second control member 360 can continue to move towards the side away from the positioning seat 380 along the guiding rib 333 through the second sliding groove 361, so that the first conductive sheet 310 and the second conductive sheet are separated, and the control switch 300 is turned off again, as shown in fig. 13. At this time, in the same state as in (1), except that the engagement portion with which the first projection and the second projection are engaged becomes different due to the rotation of the second control member 360, that is, the engagement portion with which the first projection and the second projection are engaged is another engagement portion.

Through the above process, a complete opening and closing process of the control switch 300 is completed.

Further, the lateral wall of inner chamber 331 is provided with clearance layer 334, and clearance layer 334 sets up along the circumference of inner chamber 331, and in the in-process that operating button 370 made the motion of second control 360, clearance layer 334 can contact with the second conducting strip intermittently, clears up the surface of second conducting strip to prevent that first conducting strip 310 and the poor contact's of second conducting strip problem from appearing in control switch 300 itself.

Wherein the cleaning layer 334 includes, but is not limited to, sponge.

In this embodiment, referring to fig. 14, on a side of the conductive pin 320 for being attached to the first conductive sheet 310, a raised portion 321 is formed in a middle portion of the conductive pin 320 relative to a peripheral edge thereof, a direction of the raised portion is perpendicular to a surface of the conductive pin 320, a sponge layer 322 is covered around the raised portion 321 (i.e., the peripheral edge of the conductive pin 320), and a thickness of the sponge layer 322 is slightly smaller than a thickness of the raised portion 321. Through the design, when the conductive pin 320 of the second conductive sheet just contacts with the first conductive sheet 310, the sponge layer 322 at the periphery of the conductive pin 320 can also clean the first conductive sheet 310, and when the control switch 300 is in the on state, the bulge 321 of the conductive pin 320 contacts with the first conductive sheet 310 to realize conduction.

In general, the control switch 300 is very convenient to use and is very suitable for eliminating test faults in the aging process.

It should be noted that, when the control switch 300 is in the off state, the first conductive plate 310 and the second conductive plate are in the state shown in fig. 11, even if the elastic member 340 fails, the second control member 360 falls toward the positioning seat 380, and the first conductive plate 310 and the second conductive plate are not connected, so that the accidental connection can be avoided.

In summary, the diode burn-in test system 1000 provided by the embodiment of the invention can accurately perform troubleshooting on the test failure of the burn-in device, avoids the blindness of manual inspection, realizes quick prompt on the failure part, greatly reduces the time consumption of the failure troubleshooting process, and is beneficial to efficient development of the burn-in test.

The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A fault removing method for a diode burn-in test is characterized by comprising the following steps:

setting aging voltage;

acquiring actual voltage of each diode and actual current of each constant current loop, and eliminating test faults according to the aging voltage, the actual voltage and the actual current; the test failure comprises: at least one of a mounting error, a contact failure, a voltage error, and a diode damage.

2. The diode burn-in test troubleshooting method of claim 1, further comprising: setting a first current threshold and a first voltage threshold;

and in the process of eliminating the test fault according to the aging voltage, the actual voltage and the actual current, if the actual current of a constant current loop is less than or equal to the first current threshold and the actual voltage is less than or equal to the first voltage threshold from a certain diode in the constant current loop, checking whether the first diode with the actual voltage less than or equal to the first voltage threshold is installed wrongly.

3. The diode burn-in test troubleshooting method of claim 1, further comprising: setting a second voltage threshold;

and in the process of eliminating the test fault according to the aging voltage, the actual voltage and the actual current, if the actual current is normal and the actual voltage of a certain diode in the constant current loop is greater than or equal to the second voltage threshold, checking whether the diode is in poor contact.

4. The diode burn-in test troubleshooting method of claim 1, further comprising: setting a second current threshold and a third voltage threshold;

and in the process of eliminating the test fault according to the aging voltage, the actual voltage and the actual current, if the actual current of all the constant current loops is less than or equal to the second current threshold and the actual voltage of all the diodes is greater than or equal to the third voltage threshold, checking whether the aging voltage is set correctly.

5. The diode burn-in test troubleshooting method of claim 1, further comprising: setting a third current threshold and a fourth voltage threshold;

and in the process of eliminating the test fault according to the aging voltage, the actual voltage and the actual current, if the actual current of a constant current loop is less than or equal to the third current threshold and the actual voltage of a certain diode in the constant current loop is greater than or equal to the fourth voltage threshold, checking whether the diode is in poor contact.

6. The diode burn-in test troubleshooting method of any one of claims 2~5 wherein said diode burn-in test troubleshooting method further comprises:

setting a verification circuit, wherein the verification circuit is connected with a standard diode and a control switch in series, and the standard diode has the same type as a diode for aging test;

when the test fault is detected, the verification circuit is connected in parallel at the diode where the test fault occurs;

after the control switch is communicated, the test fault is checked; and after the test fault is eliminated, the control switch is disconnected, and the verification circuit is detached.

7. A diode burn-in test system for implementing the diode burn-in test troubleshooting method of any one of claims 1~6 comprising: the device comprises a terminal control computer, an MCU circuit, a constant current control loop, a burn-in test loop and a current sampling circuit;

the aging test loop is electrically connected with the constant current control loop, the constant current control loop is electrically connected with the current sampling circuit, the constant current control loop and the current sampling circuit are both electrically connected with the MCU circuit, and the MCU circuit is electrically connected with the terminal control computer;

the aging test loop comprises a plurality of constant current loops which are connected in parallel, a plurality of clamps which are connected in series and used for installing diodes are arranged in each constant current loop, and each constant current loop is also provided with a voltage detection module used for detecting the actual voltage of each diode.

8. The diode burn-in test system of claim 7, wherein in the constant current loop, a first electrical connection is provided at both ends of each of the clamps;

the diode aging test system further comprises: a verification circuit;

the verification circuit is connected with a standard diode and a control switch in series, wherein the standard diode has the same type as a diode for aging test; and the two ends of the verification circuit are provided with second electrical connection parts used for being connected with the first electrical connection parts.

9. The diode burn-in test system of claim 8, wherein the control switch comprises: the shell is provided with a first conducting plate, a second conducting plate, a shell, an elastic piece, a first control piece and a second control piece;

the first control piece is provided with a first sliding groove used for being matched with the guide rib; the second control piece is provided with second sliding grooves used for being matched with the guide ribs, and the plurality of second sliding grooves are distributed along the circumferential direction of the second control piece; the first control element and the second control element are both slidably fitted to the guide rib;

the elastic piece is abutted between the second control piece and the side wall of the inner cavity;

a first bulge and a second bulge are arranged on one side, close to the second control piece, of the first control piece, a concave part is formed between the first bulge and the second bulge, and both sides of the first bulge and the second bulge are respectively provided with a guide sliding surface;

a matching part is arranged between every two adjacent second sliding grooves and comprises a first matching surface, a second matching surface and a third matching surface;

one end of the first matching surface extends to the second sliding groove, and the other end of the first matching surface extends along the circumferential direction of the second control piece and gradually gets away from the first control piece; one end of the second matching surface is connected with one end, far away from the second sliding chute, of the first matching surface and is arranged along the length direction of the second sliding chute, and the other end of the second matching surface extends towards the first control piece; one end of the third matching surface is connected with one end, far away from the first matching surface, of the second matching surface, the other end of the third matching surface extends along the circumferential direction of the second control piece and gradually far away from the first control piece, and one end, far away from the second matching surface, of the third matching surface extends to the other second sliding groove;

the first conducting strips are arranged on one side, away from the first control piece, of the second control piece, each first conducting strip is provided with a connecting part used for being connected with a circuit, and the two first conducting strips are respectively arranged on two sides of the inner cavity; the second conducting plate is arranged on one side, close to the first conducting plate, of the second control piece;

wherein the first control and the second control are configured to: when the first sliding groove and the second sliding groove are matched with the guide rib, the first protrusion and the second protrusion are matched with the matching part, one end of the first matching surface, which is far away from the second matching surface, is attached to a sliding guide surface of the first protrusion, which is far away from the second protrusion, and the third matching surface is attached to a sliding guide surface of the second protrusion, which is close to the first protrusion; pressing the first control piece to separate the second sliding groove from the guide rib, wherein the end part of the guide rib abuts against the first matching surface; releasing the first control piece, rotating the second control piece, abutting the guide rib against the first matching surface and the second matching surface at the same time, attaching the third matching surface to the guide sliding surface of the first protrusion far away from the second protrusion, attaching the other first matching surface to the guide sliding surface of the second protrusion near the first protrusion, and forming a gap between the other first matching surface and the first protrusion, and attaching the second conductive sheet to the first conductive sheet to conduct the first conductive sheets at two sides; pressing the first control piece to separate the second matching surface from the guide rib, wherein the other first matching surface slides along the second protrusion, and the end part of the other first matching surface is abutted against the first protrusion; and releasing the first control piece, rotating the second control piece, matching the guide rib to the other second sliding groove along the third matching surface, matching the first protrusion and the second protrusion with the other matching part, and separating the second conductive sheet from the first conductive sheet.

10. The diode burn-in test system of claim 9, wherein the inner wall of the housing is provided with a cleaning layer disposed circumferentially of the second control member to enable the cleaning layer to intermittently engage the second conductive sheet during movement of the second control member to clean the second conductive sheet.